High frequency test shrapnel slot (DDR5)

CN309086179SActive Publication Date: 2025-01-24SHENZHEN SIREDA TECH CO LTD
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Patent Information

Application Number
CN202430302579.1
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-05-21
Publication Date
2025-01-24
Estimated Expiration
2039-05-21

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Abstract

1. The name of this design product: High-frequency test shrapnel slot (DDR5). 2. The purpose of this design product: used to fix and test memory sticks. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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