Integrated Circuit Test Equipment (MS8000D)
CN310012837SActive Publication Date: 2026-06-02NANJING MACROTEST SEMICON TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- NANJING MACROTEST SEMICON TECH CO LTD
- Filing Date
- 2026-01-21
- Publication Date
- 2026-06-02
Smart Images
Figure 000008_ABST
Abstract
1. Name of the product in this design: Integrated Circuit Testing Device (MS8000D). 2. Purpose of this design: To test various integrated circuits to obtain various parameters. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1. 5. Other situations requiring explanation: The enlarged view of part A is a partial enlarged view of point A in the bottom view.
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