Two-dimensional scanning galvanometer (LHP33)
CN310075777SActive Publication Date: 2026-07-07SHENZHEN ZBTK TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHENZHEN ZBTK TECH CO LTD
- Filing Date
- 2026-01-14
- Publication Date
- 2026-07-07
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Figure 000007_ABST
Abstract
1. Name of the designed product: two-dimensional scanning galvanometer (LHP33). 2. Use of the designed product: device for two-dimensional optical scanning. 3. Design points of the designed product: in shape. 4. Picture or photo best indicating the design points: design 1 perspective view. 5. Design 1 is designated as the basic design. 6. Other circumstances needing explanation: the designed product contains similar designs, in which design 1 is the basic design and design 2 is the similar design of design 1.
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