APPARATUS AND SPOTLIGHTS

Abstract

Apparatus (1) with a lighting source (2), wherein - the apparatus (1) comprises at least one measuring laser (3), - the measuring laser (3) is a semiconductor laser and is designed to generate pulses with a pulse duration of not more than 10 ns, - a wavelength of maximum intensity of a measuring laser radiation (M) generated by the measuring laser (3) is between 400 nm and 485 nm inclusive.

Description

[0001] An apparatus and a spotlight with a measuring laser for distance measurement are specified, whereby the measuring laser emits in the short-wave spectral range.

[0002] The document US 8,619,241 B2 relates to a distance measuring system with a light-emitting diode emitting in the visible spectral range.

[0003] The document DE 10 2016 223 669 A1 describes an operating method for a LiDAR system in which a light source for irradiating a field of view is operated essentially continuously and the irradiation of the field of view is briefly interrupted, the interruption being used as a transmission signal.

[0004] The publication US 2010 / 0 191 418 A1 describes a lighting system with driver assistance capabilities to detect the presence and / or speed of obstacles.

[0005] One task to be solved is to specify an apparatus and a spotlight that work efficiently with a lighting source.

[0006] This object is achieved, inter alia, by an apparatus and a headlight having the features of the independent patent claims. Preferred developments are the subject of the remaining claims.

[0007] The apparatus and spotlight described here utilizes a semiconductor laser that emits primarily in the blue spectral range and operates in pulsed mode. The semiconductor laser can be connected to a white-light-emitting illumination source or be part of this illumination source. With the semiconductor laser, which is operated at least temporarily in pulsed mode, distance measurement can be achieved by measuring the time of flight of laser radiation.

[0008] According to at least one embodiment, the apparatus comprises an illumination source. During operation, the illumination source preferably emits white light and / or near-infrared radiation or colored light.

[0009] As the primary light source, the illumination source preferably comprises a semiconductor light source, such as at least one light-emitting diode or at least one semiconductor laser. The primary light source preferably generates blue light, which is partially converted into secondary radiation. The secondary radiation is, in particular, yellow light.

[0010] According to at least one embodiment, the apparatus comprises a measuring laser. The measuring laser is a semiconductor laser. The measuring laser is configured to generate pulses or pulse trains with a duration of the individual pulses of at most 10 ns, preferably of at most 5 ns, 3 ns, or 2 ns. A wavelength of maximum intensity of a measuring laser radiation generated by the measuring laser is at least 280 nm, 360 nm, 400 nm, or 430 nm, and alternatively or additionally at most 505 nm, 485 nm, or 460 nm. The wavelength of maximum intensity of the measuring laser is preferably between 430 nm and 460 nm.

[0011] In at least one embodiment, the apparatus comprises an illumination source. Furthermore, the apparatus comprises at least one measuring laser. The measuring laser is a semiconductor laser and is configured to generate pulses with a pulse duration of no more than 10 ns. The wavelength of maximum intensity of the measuring laser radiation generated by the measuring laser is between 400 nm and 485 nm. The measuring laser radiation is preferably used for distance measurement using LIDAR, for example, in a car headlight.

[0012] In other words, the device described here is preferably a spotlight for illumination into which a blue-emitting semiconductor laser is integrated as a LIDAR component. LIDAR stands for Light Detection And Ranging, or light-based distance measurement.

[0013] Blue-emitting light-emitting diodes (LEDs) are increasingly being used in lighting components such as automotive headlights. However, implementing a LIDAR in the blue spectral range using LEDs is either impossible or only possible to a very limited extent. Since LEDs rely on spontaneous emission, pulsed operation with the required operating parameters, with pulse durations of a maximum of 10 ns and tuning rates of at least 100 MHz, is only possible to a very limited extent or not at all. Furthermore, LIDAR functionality requires a spectrally narrowband emission to achieve a sufficiently high signal-to-noise ratio (SNR), especially in daylight.

[0014] Another problem with headlights that use phosphors is that the latency times of the excitation states in conventional phosphors are too long, so that the light coming from a phosphor has pulse durations that are too long.

[0015] The device described here makes it possible to integrate a blue-emitting laser component into a headlight as a signal source for a LIDAR system. A headlight component such as a blue-emitting laser diode can be used to excite the phosphor, either as a support or supplement, or as a standalone LIDAR system. Alternatively or additionally, a blue emission from the LIDAR component, i.e., the measuring laser, in a headlight such as a car headlight is superimposed on the preferably white headlight light. The illumination area of ​​the LIDAR component and the headlight are preferably coordinated. If necessary, the color coordinate of the white light source in the headlight is shifted toward lower color temperatures in order to achieve the headlight color coordinates specified by the standards.In other words, the additional blue light from the measuring laser is compensated for by the fact that the illumination source itself emits comparatively red-appearing light.

[0016] In contrast, conventional LIDAR systems, such as those used in motor vehicles, operate in the infrared wavelength range. The emission source is an additional IR laser, designed as an edge emitter or a vertical emitter (VCSEL).

[0017] This allows laser headlights, auxiliary laser headlights, or auxiliary laser components in a headlight to be used as emitters for the LIDAR system described here, which operates in the blue wavelength range. The blue-emitting source can be installed in white-emitting headlights anyway to produce white light by exciting a phosphor and partially converting it. This means that mixed blue-yellow light can be generated. If the primary light source for the phosphor is a laser, high pulse frequencies of 100 MHz and more are feasible.

[0018] It is also possible to integrate a blue-emitting laser component into the headlight or auxiliary headlight as an emitter in order to use it for a LIDAR system.

[0019] For LIDAR functionality, radiation in the blue spectral range is preferred.

[0020] In particular, when using an additional blue-emitting measuring laser, the eye safety of the laser radiation required for operation in the proposed device can be ensured, for example, by the following steps: - High efficiency in detecting blue signals can be achieved with silicon- or SiC-based sensors. The blue measuring laser radiation has a shallow penetration depth in silicon. Therefore, lower laser powers are sufficient compared to infrared-based LIDAR systems. - The device comprises the measuring laser and an optical element in a common housing or casing, with the measuring laser and the optical element being inseparably connected. This configuration ensures that no unscattered laser light can escape. - The optics used distribute the laser light and adapt the light distribution to the light distribution of the headlight. Optionally, optical elements from the headlight's light source can be used.

[0021] Components such as sensors or control circuits based on SiC as a semiconductor can operate at higher temperatures due to SiC's wider band gap. This offers a better signal-to-noise ratio, especially under short-wave radiation such as X-rays, gamma rays, or ultraviolet radiation.

[0022] Examples of optical elements used include diffractive optical elements (DOEs). Meta-optics or multi-lens arrays can also be used. Diffusers can also be employed. Metal lenses, i.e. lenses made of a metamaterial, can also be used. A metamaterial is a material that derives its optical properties from its internal structure rather than its chemical composition, in particular a material that has structures that are smaller than the wavelength of the radiation for which the metal lens is designed. It is also possible to use conventional optical elements such as lenses and / or reflectors. The metal lenses can also comprise a planar support structure, for example a glass wafer onto which a structured surface topography is applied.The structural sizes of the applied structures are preferably in the range of the wavelength of light or below the wavelength of light. These structures can be planarized using a suitable, also transparent material with a different refractive index. Layer stacks of such structures are also possible.

[0023] It is possible that no further eye safety measures are required for the LIDAR application, as this is already ensured by the other components of the headlamp, in particular the laser-based illumination source.

[0024] Preferably, the components measuring laser, an associated capacitor, an associated switching element and / or a control circuit such as an integrated circuit or an ASIC are installed together in a housing in order to keep inductances low at the high frequencies that occur. A corresponding capacitor can, for example, be integrated as a ceramic multilayer in the housing or in a carrier, also referred to as a submount, for the measuring laser. The switching element and / or the control circuit and / or the capacitor can be integrated in a silicon component or an SiC component that is an integral part of the housing. The measuring laser can be implemented as a flip-chip, thereby enabling a wire-free design. Alternatively or additionally, the measuring laser can be mounted on a carrier as a thin-film chip, i.e., without a growth substrate for a semiconductor layer sequence.

[0025] In particular, due to the high optical efficiency of a pure blue LIDAR solution, in contrast to a measuring laser combined with a phosphor, the at least one measuring laser can be operated at lower currents while still providing the same LIDAR performance in the blue spectral range. This enables shorter switching times. This enables a higher data rate and shorter pulses. Furthermore, it can achieve better eye safety or allow for reduced eye safety requirements with equivalent LIDAR system performance. Furthermore, smaller laser chips and smaller housings can be used. Alternatively, higher LIDAR performance in the blue spectral range can be achieved with comparable electrical currents. This enables a better SNR.The higher optical efficiency is primarily due to the fact that in this case, there is no scattering of the blue light, compared to a combination of a blue laser and a phosphor. This enables efficient optics and efficient illumination of a field of view.

[0026] The device and headlight described here are particularly suitable for use in a driver assistance system (ADAS, or Advanced Drive Assistance System). Applications in the LIDAR field and vehicle-to-vehicle communication (V2V, or vehicle-to-vehicle communication) are also possible.

[0027] A complementary system to an IR LIDAR is possible for increased safety, as scanning can be performed in multiple wavelength ranges. This enables redundancy of the overall distance detection system and offers expanded detection capabilities.

[0028] It is possible to detect road conditions, such as surface contours or water coverage. This enables greater comfort, for example, through improved chassis control. Detecting water coverage on a road surface enables increased safety, for example, by detecting potential aquaplaning situations.

[0029] Furthermore, the device and the headlight described here can be used in lane departure warning systems, for distance control and / or for collision warning.

[0030] The blue, relatively short-wavelength emission of the measuring laser has a lower penetration depth in silicon detectors compared to infrared radiation. Due to the lower penetration depth into the silicon, a pixelated detector can achieve a better signal-to-noise ratio for a given pixel size. Alternatively, a smaller pixel size can be used for the same SNR. This results in greater design flexibility on the detector side with regard to signal sharpness, resolution, and installation space.

[0031] Receivers or detectors such as CMOS cameras have a higher sensitivity in the blue spectral range than in the IR range. This results in higher efficiency. This is primarily due to the fact that detectors with high temporal resolution require a thin semiconductor layer sequence. As a result, when using IR radiation, only a portion of the IR radiation is absorbed, while blue light can be absorbed almost 100%. Detection can therefore occur with a lower signal level. Due to the high system efficiency, even lower operating currents are sufficient for operation. With lower operating currents, shorter switching times can be achieved. This increases the possible data rate and / or spatial resolution.

[0032] The device and spotlight described here are less susceptible to interference than IR-based systems. For example, when the sun is low in the sky, there may be overlap between the IR radiation emitted by a conventional LIDAR system and solar emissions. However, solar radiation in this case has a low blue component, as blue light is strongly attenuated by Rayleigh scattering in the atmosphere.

[0033] By combining complementary LIDAR systems, i.e., infrared and blue, a higher level of safety can be achieved. Two differently operating systems, i.e., IR LIDAR and blue LIDAR, offer a higher degree of redundancy. Furthermore, reflection effects are wavelength-dependent. Due to the different signals from the IR LIDAR and the blue LIDAR, additional information can be obtained through differential analysis, for example, regarding road surface conditions.

[0034] The increasing demands on the luminance of headlight light sources necessitate the increased use of lasers for automotive headlights. In this case, the existing laser array for generating white light can be integrated into the LIDAR architecture. The emission of the overall white-emitting LIDAR system, with the primarily blue-emitting measuring laser, contributes to the illumination of a road, for example. Thus, the measuring laser then fulfills two functions: as a signal source for the LIDAR functionality and for illuminating a road, for example, in the visible spectral range. This allows for cost savings.

[0035] If the measuring laser from the headlight is used to generate white light with the help of a phosphor, further measures to ensure eye safety can be eliminated, thus resulting in further cost advantages.

[0036] In summary, the device and headlight described here achieve greater efficiency in the detection of blue light on the detector side compared to the detection of infrared radiation, especially with time-of-flight measurements in cameras or photodiodes. Time-of-flight measurements are also known as time-of-flight (TOF). The dual function—road illumination on the one hand, and distance and depth information on the road on the other—allows for costs to be reduced.

[0037] The lower penetration depth of blue light in materials such as silicon allows for greater selectivity. Different penetration depths and / or reflection coefficients of blue light compared to infrared radiation can ensure robust distance detection and environmental detection in a combined IR-blue system.

[0038] According to at least one embodiment, the illumination range of the illumination source is at least 25 m. This means, for example, that sufficient radiation is still reflected for a human observer from a distance of 25 m to be able to recognize road traffic objects such as pedestrians, cyclists, other vehicles, or parts of the environment such as trees or roadside barriers. Preferably, the illumination range is at least 50 m, 100 m, or 200 m. Alternatively or additionally, the illumination range is a maximum of 350 m.

[0039] According to at least one embodiment, the apparatus comprises at least one sensor and / or at least one electronic unit. The sensor(s) is / are configured to detect a portion of the measuring laser radiation reflected outside the apparatus by at least one external object with a time resolution of at most 10 ns, 5 ns, or 2 ns. The electronic unit measures the time of flight of the reflected and detected portion of the measuring laser radiation, thus determining the distance of the object reflecting the measuring laser radiation from the apparatus.

[0040] According to at least one embodiment, the illumination source comprises one or more phosphors. The at least one phosphor is illuminated by one or more primary light sources. Preferably, the at least one primary light source generates primary radiation, which is blue light. Secondary radiation is generated by the primary radiation. The primary radiation is preferably only partially converted into secondary radiation, so that the illumination source emits mixed radiation composed of primary radiation and secondary radiation. The proportion of primary radiation in the mixed radiation is preferably at least 10% or 20% and / or at most 60% or 50%.

[0041] According to at least one embodiment, the primary light source is formed by the measuring laser or comprises the measuring laser. It is possible for the measuring laser to be combined with other light sources, such as blue-emitting light-emitting diodes or semiconductor lasers, to excite the phosphor.

[0042] According to at least one embodiment, the measuring laser radiation is a portion of the primary radiation transmitted through the phosphor. This portion of the measuring laser radiation can be scattered by the phosphor. This means that the phosphor can serve as a diffuser for the measuring laser radiation.

[0043] According to at least one embodiment, the measuring laser radiation and the mixed radiation illuminate the same or approximately the same solid angle range. This means that the measuring laser radiation is emitted over a comparatively large, preferably contiguous solid angle range. The solid angle range is, for example, at least 0.02 sr or 0.05 sr and / or at most 1 sr. This enables the simultaneous, extensive illumination of a large area, for example, a large section of roadway.

[0044] According to at least one embodiment, the sensor is configured for spatially resolved detection of the reflected measuring laser radiation. For this purpose, the sensor is preferably pixelated. The individual pixels are configured for high temporal resolution. Thus, spatial resolution of the distance system formed by the device is not achieved by the measuring laser, but rather by the sensor.

[0045] According to at least one embodiment, the primary light source is different from the measuring laser. In this case, the measuring laser radiation is preferably guided past the phosphor. This means that, as intended, the measuring laser radiation originating from the measuring laser does not reach the phosphor. The measuring laser radiation and the primary light source can be electrically operated and controlled independently of one another.

[0046] According to at least one embodiment, the primary light source and the measuring laser emit light of the same maximum and / or dominant wavelength. This preferably applies with a tolerance of at most 50 nm, 15 nm, 10 nm, or 5 nm.

[0047] According to at least one embodiment, the mixed radiation is colored light. In this case, the mixed radiation together with the measuring laser radiation preferably represents white light. The mixed radiation together with the measuring laser radiation preferably meets the values ​​required for automotive headlights with regard to the achieved color coordinate and the achievable color rendering.

[0048] According to at least one embodiment, the apparatus comprises one or more imaging optics. The at least one imaging optic is, for example, a lens, such as a converging lens or a lens array. The imaging optics can also be a mirror, such as a movable mirror, also known as a MEMS mirror, to enable scanning with the measuring laser radiation. The imaging optics can be an optical system that combines diffuse, refractive, and reflective components.

[0049] According to at least one embodiment, the imaging optics are arranged downstream of the primary light source and the measuring laser. The imaging optics can form a common cover and radiation surface for the primary light source and the measuring laser.

[0050] According to at least one embodiment, the imaging optics are configured to image the measuring laser radiation in a pattern and / or to scan with the measuring laser radiation. For this purpose, the imaging optics can comprise movable components, such as a movable mirror. It is also possible for the imaging optics to comprise apertures and / or masks, so that different illumination patterns can be generated with the measuring laser radiation, for example, on a roadway or in an environment.

[0051] According to at least one embodiment, the imaging optics are inseparably connected to the measuring laser. This means that during intended use, the measuring laser and the imaging optics do not separate from each other.

[0052] According to at least one embodiment, the apparatus comprises one or more additional lasers. The at least one additional laser emits a different wavelength than the measuring laser. The wavelengths of the measuring laser and the at least one additional laser preferably differ from one another by at least 50 nm, 100 nm, or 200 nm. If several additional lasers are present, these wavelength differences preferably apply in pairs. The apparatus is particularly configured to detect radiation from the additional laser reflected back from an environment, as well as the measuring laser radiation. By combining lasers with different wavelengths, additional information can be obtained from the wavelength dependence of the reflection properties.

[0053] According to at least one embodiment, the apparatus additionally comprises an infrared laser. The infrared laser preferably represents the further laser or one of the further lasers. The infrared laser is preferably a semiconductor laser. The infrared laser is configured to generate pulses with a pulse duration of at most 10 ns, 5 ns, or 2 ns. A wavelength of maximum intensity of infrared radiation generated by the infrared laser is preferably 0.7 µm or 0.8 µm and / or at most 3 µm or 1.7 µm.

[0054] According to at least one embodiment, a pulse emission of the infrared laser is synchronized with a pulse emission of the measuring laser. This can mean that the two lasers emit the pulses simultaneously and in synchronization with each other. Alternatively, it is possible for a predetermined time period or a predetermined minimum distance to exist between the pulse emission of the infrared laser and the measuring laser, so that the infrared radiation and the shortwave radiation are not emitted simultaneously, but rather are emitted at different times.

[0055] According to at least one embodiment, at least one optical element is arranged downstream of the infrared laser and the measuring laser. Alternatively, the infrared laser and the measuring laser can be provided with different optical elements or imaging optics.

[0056] According to at least one embodiment, the infrared laser can also be operated when the measuring laser is switched off. The reverse is also possible.

[0057] According to at least one embodiment, the infrared laser, together with the electronics unit, is configured as a safety circuit for the measuring laser. This means, in particular, that the measuring laser can only be operated if the infrared laser, together with the electronics unit, determines that no person is within the illumination range of the measuring laser. This can provide additional eye safety.

[0058] According to at least one embodiment, the sensor is a silicon photodiode, a silicon photodiode array, or a CMOS camera. Thus, the sensor can have multiple pixels.

[0059] According to at least one embodiment, the sensor is configured for at least two different spectral ranges. This is possible, for example, by optical filters that are connected upstream of the sensor and each of which is only permeable to a specific spectral range. For example, there is a filter that is only permeable in the spectral range of the measuring laser radiation and a filter that is only permeable in the infrared radiation range of the infrared laser.

[0060] According to at least one embodiment, the measuring laser is an edge-emitting semiconductor laser chip. The semiconductor laser chip is, for example, a flip-chip. Alternatively, the electrical contacts of the measuring laser can be located on opposite main sides, allowing contact via bond wires, for example.

[0061] According to at least one embodiment, a capacitor is electrically connected in parallel with the measuring laser. A switching element such as a field-effect transistor (FET) can also be present to control the measuring laser, for example, electrically connected in parallel.

[0062] According to at least one embodiment, the measuring laser, the capacitor, and / or the switching element are mounted on a common carrier such as a submount, preferably mounted without bonding wires. This allows for low inductances to be achieved.

[0063] According to at least one embodiment, the apparatus is a motor vehicle, such as a car, a drone, such as an aerial drone, a watercraft, a robot, an actuator, or a tool. Furthermore, the apparatus can be used in environmental technology, for example, as a sorter in the detection and / or sorting of plastic parts from a water stream or an air stream by comparing the signals from a UV, blue, IR, and / or red-based LIDAR-like system.

[0064] The measuring laser, optionally in conjunction with the illumination source, can support the operator of the device. Alternatively, the device can operate automatically and / or autonomously, and the environment is preferably detected using LIDAR, based in particular on the measuring laser radiation.

[0065] Furthermore, a spotlight is disclosed. The spotlight comprises an illumination source and a measuring laser, as described in connection with the apparatus. Features of the apparatus are therefore also disclosed for the spotlight, and vice versa.

[0066] In at least one embodiment, the spotlight comprises the illumination source and the measuring laser. The illumination source comprises at least one phosphor. The phosphor is excited to generate secondary radiation by a primary light source, which generates blue light as primary radiation during operation. The primary light source is a light-emitting diode or a semiconductor laser. The illumination source emits mixed radiation composed of the primary radiation and the secondary radiation. The measuring laser is a semiconductor laser and is configured to generate pulses with a pulse duration of no more than 10 ns. A wavelength of maximum intensity of a measuring laser radiation generated by the measuring laser is between 400 nm and 485 nm inclusive. An illumination range of the illumination source and optionally a measuring distance using the measuring laser radiation is at least 25 m, 100 m, or 200 m.

[0067] According to at least one embodiment, the primary light source is formed by the measuring laser. The measuring laser radiation is a portion of the primary radiation transmitted through the phosphor. The measuring laser radiation, together with the secondary radiation, is white light.

[0068] Below, an apparatus and a headlight described herein are explained in more detail with reference to the drawings using exemplary embodiments. Like reference numerals indicate like elements in the individual figures. However, they are not drawn to scale. Rather, individual elements may be exaggerated for clarity.

[0069] They show: Fig. 1 to 9 are schematic sectional views of embodiments of apparatuses and headlights described here, Fig. 10 to 12 schematic representations of embodiments of apparatus described here, Fig. 13 to 17 schematic electrical diagrams for measuring lasers for the devices and headlights described here Fig. 18 is a schematic plan view of a circuit arrangement of a semiconductor laser for apparatus and headlights described here, and Fig. 19 to 25 in the figure parts A schematic sectional views in the figure parts B schematic plan views of circuit arrangements of semiconductor lasers for apparatus and headlights described here.

[0070] In Fig. Figure 1 shows an embodiment of an apparatus 1. The apparatus 1 is preferably a motor vehicle headlight 10.

[0071] The device 1 has an illumination source 2. The illumination source 2 emits white light. A measuring laser 3 is integrated into the illumination source 2. During operation, the measuring laser 3 emits a measuring laser radiation M. The measuring laser radiation M is pulsed laser radiation with a pulse duration of no more than 10 ns. The measuring laser radiation M can be divided into individual pulses or into pulse trains, also known as bursts.

[0072] Furthermore, the apparatus 1 comprises a sensor 4. The sensor 4 detects measuring laser radiation M reflected from an object 6. The object 6 is, for example, another road user.

[0073] The device 1 further comprises an electronics unit 5. The measuring laser 3 and the sensor 4, as well as optionally the illumination source 2, are controlled via the electronics unit 5. The electronics unit 5 contains, for example, one or more integrated circuits and can also have memory units as well as data inputs and data outputs.

[0074] The signals from sensor 4 are evaluated via the electronics unit 5. By measuring the time of flight of the measuring laser radiation M to object 6 and back from object 6, the respective distance of device 1 to object 6 is determined in a time-resolved manner.

[0075] The components 2, 3, 4, 5 can be integrated into a common housing 11. Since all components 2, 3, 4, 5 are located in the housing 11, the device 1, in particular the headlight 10, can be handled as a single assembly or as a module. This facilitates assembly or replacement of the headlight 10.

[0076] In the embodiment of the Fig. 2, the device 1 is also designed as a headlight 10, in particular as a motor vehicle headlight. The illumination source 2 is formed from several primary light sources 22, each of which is followed by a phosphor 21. Primary radiation P is emitted from the primary light sources 22, which is partially converted into secondary radiation S in the phosphors 21. Thus, a mixed radiation composed of the primary radiation P and the secondary radiation S is emitted.

[0077] One of the primary light sources 22 simultaneously serves as the measuring laser 3. One of the phosphors 21 is also arranged downstream of the measuring laser 3. The measuring laser radiation M is blue light, which is emitted as a short light pulse, for example as an approximately rectangular light pulse. The secondary radiation S is emitted after excitation by the measuring laser radiation M, but with a slight time delay and over a longer period of time. This is due to the time profiles of the radiation M, P, S to the measuring laser 3 in Fig. 2 symbolizes.

[0078] The primary light sources 22, which are not used as measuring lasers 3, can be constructed differently than the measuring laser 3 itself. Deviating from the illustration in Fig. 2, only a single primary light source 22 can be present, which simultaneously serves as the measuring laser 3, or the measuring laser 3 and only one further primary light source 22 are present.

[0079] If the measuring laser 3 and at least one further primary light source 22 are present, the measuring laser 3 preferably emits the measuring laser radiation M in a time window in which the other primary light sources 22 are switched off. If the measuring laser 3 emits the measuring laser radiation M only at a comparatively low repetition rate, for example, 50 Hz, so that a measurement time for the measuring laser radiation M only accounts for a small time portion, for example, at most 50 x 1 ms per 1 s, the measuring laser 3 can emit continuously in the remaining time portion, in particular with a low optical output power. The same applies to all other embodiments.

[0080] The housing 11 terminates with a single imaging optics 7, which is arranged downstream of all light sources 22, 3. The imaging optics 7 defines an illumination area, also referred to as the field of view.

[0081] In the apparatus 1, as in Fig. 2, for example, it is a low beam or a high beam in a motor vehicle. The headlight can also be an adaptive headlight, or AFS for short. The same is possible for all other embodiments.

[0082] Apparatus 1 of the Fig. 2 can optionally include the sensor 4 and the electronics unit 5 (not shown). The components 4, 5 can be mounted outside or inside the housing 11. This makes it possible for the headlight 10 itself to not include the sensor 4 and optionally also not include the electronics unit 5.

[0083] In Fig. 3 shows that the imaging optics are divided into two optics 7a, 7b. The optics 7a are used for imaging the primary light sources 22, each of which is followed by the phosphor 21. The imaging optics 7b serves as the sole optics for the measuring laser 3. Deviating from the illustration in Fig. 3, it is possible that the imaging optics 7a is arranged downstream of all light sources 22, 3 as well as the imaging optics 7b.

[0084] Otherwise, the embodiment corresponds to the Fig. 3 the Fig. 2.

[0085] The optics 7, 7a, 7b can each be formed by refractive and / or reflective optics.

[0086] In the embodiment of the Fig. 4, no phosphor 21 is arranged downstream of the measuring laser 3. The measuring laser radiation M radiates past the phosphors 21. Thus, the measuring laser 3 is not a component of the illumination source 2, but is independent of the illumination source 2. As in Fig. 2, the imaging optics 7 can be arranged downstream of the light sources 22, 3.

[0087] The mixed radiation P, S together with the measuring laser radiation M preferably forms white light.

[0088] In Fig. Figure 5 illustrates that a separate optics system 7b is provided for the measuring laser 3. The optics system 7b is a lens, such as a converging lens, or a movable mirror, for example, a MEMS mirror.

[0089] Otherwise, the embodiments correspond to the Fig. 4 and Fig. 5 those of the Fig. 2 and Fig. 3.

[0090] In Fig. 6 shows that the apparatus 1 and / or the spotlight 10 additionally comprise an infrared laser 8. In addition, separate optics 7a, 7b, 7c, 7d may be provided for the radiation-emitting components 2, 3, 8 and for the sensor 4.

[0091] In Fig. In contrast, Figure 7 illustrates that the common optics 7a is arranged downstream of the radiation-emitting components 2, 3, 8. The imaging optics 7b is positioned optically upstream of the sensor 4.

[0092] Furthermore, the following apply to the Fig. 6 and Fig. 7 regarding the light sources 2, 3, the statements regarding Fig. 1 and to the Fig. 2 to 5.

[0093] In the Fig. 8 and Fig. Figure 9 illustrates the detection of reflected radiation. The radiation M, P, and S are emitted by the spotlight 10 and partially reflected by the object 6. The sensor 4 of the apparatus 1, which is arranged separately from the spotlight 10, is preceded by a filter 9 in addition to the imaging optics 7.

[0094] Only the measuring laser radiation M passes through the filter 9 to the sensor 4. The radiations P, S are filtered out. This makes it possible for the primary radiation P to have a different wavelength than the measuring laser radiation M in order to enable spectral filtering. Alternatively, the measuring laser radiation M and the primary radiation P can have the same wavelength and filtering occurs temporally. This applies in particular if the primary light source serves as a measuring laser, see for example the Fig. 2 and Fig. 3.

[0095] According to Fig. 9, the headlight 10 emits the infrared radiation IR and the measuring laser radiation M. The white light of the illumination source 2, for example, is not shown.

[0096] The sensor 4 is preferably pixelated and, by means of the filters 8a, 8b, is locally sensitive to the infrared radiation IR and the measuring laser radiation M. Sensitivity separation is thus achieved via the filters 8a, 8b.

[0097] According to the Fig. 8 and Fig. 9, a spatial resolution with regard to the measuring laser radiation M and optionally the infrared radiation R is carried out via the sensor 4. The sensor 4 is pixelated accordingly in order to ensure a spatial assignment of the locally detected radiation M, IR.

[0098] Such pixelated sensors 4 as well as the optional use of the additional infrared laser 8 are also possible in all other embodiments.

[0099] The sensor 4 is, for example, a silicon photodiode, a silicon photodiode array or a CMOS time-of-light camera.

[0100] Deviating from the representation in Fig. 9, it is possible that each of the filters 8a, 8b is assigned its own imaging optics. In this case, there is no common imaging optics 7, which in Fig. 9 is illustrated.

[0101] In Fig. 10 illustrates that the apparatus 1 is a car. The apparatus 1 has several headlights 10 with the light sources 2, 3 and optionally with the infrared laser 8. The sensor 4 can be arranged separately from the headlights 10 or can also be a part of the headlight 10, deviating from Fig. 10.

[0102] According to Fig. 11, the device 1 is a gripper arm or a robot arm. The spotlight 10 and optionally the sensor 4 can be attached to a tip of the gripper arm.

[0103] In the embodiment of the Fig. 12, the apparatus 1 is a flying drone. The apparatus 1 comprises the spotlight 10 and optionally the sensor 4, which, in contrast to the illustration of the Fig. 12 can also be integrated into the headlight 10.

[0104] In the Fig. 13 to 17 are exemplary circuit diagrams for controlling the measuring laser 3. In the Fig. In Figures 13 to 17, a capacitor 31 is electrically connected in parallel with a semiconductor laser diode 30 of the measuring laser 3. Optionally, a further capacitor (not shown) electrically connected in series with the laser diode 30 may be present.

[0105] Furthermore, a switching element 32 is connected in series with the laser diode 30. The switching element 32 is preferably a field-effect transistor, or FET for short, in particular based on SiC, GaN, or Si. If the switching element 32 is connected to a supply voltage V, it is, for example, a p-MOS-FET, see the Fig. 13 and Fig. 15. If the switching element 32 is connected to a ground connection line GND, the switching element 32 is preferably an n-MOS-FET, see the Fig. 14 and Fig. 16.

[0106] In the Fig. 15 and Fig. Figure 16 illustrates that a protection diode 33 can be connected antiparallel to the laser diode 30. The protection diode 33 is a diode for protection against damage caused by electrostatic discharges, or ESD diode for short.

[0107] In Fig. Figure 17 illustrates that a switching element 32b connected in parallel with the switching element 32a connected in series with the laser diode 30 can be provided. The switching element 32b can be used to quickly turn off the laser diode 30 and thus shorten the pulse durations.

[0108] A conductor loop within the circuit arrangement, as in the Fig. 13 to 17, is preferably as small as possible, so that the area and volume are as small as possible. This allows low inductances to be achieved to ensure short switching and control times. Components 30, 31, 32, and optionally 33, are preferably integrated into a common housing (not shown).

[0109] In Fig. Figure 18 shows that a carrier 34 is provided for the measuring laser 3, on which the laser diode 30 and the capacitor 31 are mounted on a common contact surface 35. The switching element 32 and optionally the protective diode 33 are integrated into the carrier 34. The switching element 32 is designed as a FET. The laser diode 30 and the capacitor 31 are preferably electrically connected via several bond wires 37 to ensure low inductances.

[0110] Capacitor 31 is, for example, a silicon chip capacitor or a capacitor of type 0102 or similar. Electrical contact surfaces 35, d, and 35, g, as well as 35, s, GND for drain, gate, and source = GND, may be provided for controlling switching element 32. Corresponding contact surfaces may be provided on a bottom side of carrier 34 (not shown).

[0111] It is possible for a facet of the laser diode 30 to have a facet encapsulation 36, which may be lens-shaped. The facet encapsulation 36 is shown only schematically in a highly simplified manner. For example, the facet encapsulation 36 is designed as described in the publication DE 10 2017 123 798 A1. The disclosure content of this publication is incorporated by reference.

[0112] The carrier 34 is a substrate such as a printed circuit board (PCB) or a metal-core circuit board. The carrier 34 can also be a ceramic substrate with conductive tracks or, for example, an embedded leadframe. Furthermore, the carrier 34 can be a silicon submount.

[0113] Alternatively to the display in Fig. 18 it is possible to make contact without bonding wires in order to further reduce electrical inductances of the supply lines.

[0114] In the Fig. 19 to 25 show further embodiments of circuit arrangements for the measuring laser 3, analogous to Fig. 18. The connection follows the Fig. 13 shown circuit diagram. However, you can also refer to the circuit diagrams of the Fig. 14 to 17. In parts A of the figure, bonding wires are not shown, nor are the contact surfaces, to the extent that they are present in the corresponding parts B of the figure. It is possible that the measuring laser 3 consists only of the laser diode 30 or, as a module, comprises the carrier 34 and all components carried by it.

[0115] According to Fig. 19, a substrate with contact surfaces 35 serves as the carrier 34, for example, a printed circuit board (PCB), a ceramic carrier, or a lead frame. The switching element 32 is a FET and / or an ASIC and is based on Si, GaN, or SiC. Locally hermetic encapsulation of the laser diode 30 can be achieved via the facet encapsulation 36.

[0116] Contact area 35,g for the gate connection, as well as contact area 35,GND,s for the source connection, and contact area 35,V for the supply voltage connection are connected via electrical vias 38 to corresponding contact areas on a carrier underside (not shown). The laser diode 30 is connected via several bond wires 37 to contact area 35,d for the drain connection of the switching element 32. The capacitor 31 is located on contact area 35,V and is also connected via several bond wires 37 to contact area 35,GND,s.

[0117] Deviating from Fig. 19 is Fig. 20 in the case of the capacitor 31 is a flip-chip, so that the capacitor 31 is connected directly to the contact surfaces 35, GND, s and 35, V without bonding wires.

[0118] Deviating from Fig. 19 is in Fig. 21, the contact surface 35, d is arranged in plan view between the contact surfaces 35, g and 35, GND, s. The contact surface 35, d is preferably located on a side of the switching element 32 facing away from the carrier 34.

[0119] The arrangement of the Fig. 22 corresponds to a combination of Fig. 20 and Fig. 21.

[0120] In the embodiment of the Fig. 23, the capacitor 31 is integrated into the carrier 34. For this purpose, the carrier 34 is preferably designed as a multilayer ceramic. Electrical contacting of the capacitor 31 is achieved via vias 38. Otherwise, the example corresponds to the Fig. 23 the Fig. 19.

[0121] According to Fig. 24, the switching element 32 is also integrated in the carrier 34 and connected via the vias 38. Only the contact surfaces 35, d and 35, V are located on the top side of the carrier 34. The remaining contact surfaces not shown are located on the underside of the carrier 34.

[0122] In the embodiment of the Fig. 25, the laser diode 30 is contacted without bonding wire. For this purpose, a through-hole 38 is created in and / or on a semiconductor layer sequence of the laser diode 30, so that the semiconductor layer sequence is electrically connected on two sides. Otherwise, the statements regarding Fig. 24.

[0123] The components shown in the figures preferably follow one another directly in the specified order, unless otherwise indicated. Layers that do not touch in the figures are preferably spaced apart from one another. Where lines are drawn parallel to one another, the corresponding surfaces are preferably also aligned parallel to one another. Likewise, unless otherwise indicated, the relative positions of the drawn components to one another are correctly represented in the figures.

[0124] The invention described here is not limited by the description based on the embodiments.

[0125] Rather, the invention encompasses any new feature and any combination of features, which in particular includes any combination of features in the patent claims, even if this feature or combination itself is not explicitly stated in the patent claims or embodiments. List of reference symbols 1 device 10 headlights 11 housings 2 Lighting source 21 fluorescent 22 Primary light source 3 measuring lasers 30 laser diodes 31 Capacitor 32 switching element 33 Protection diode 34 carriers 35 contact surface 36 facet encapsulation / lens 37 Bonding wire 38 vias 4 Sensor 5 Electronic unit 6 reflective object 7 Imaging optics 8 infrared lasers 9 filters d Drain connection g Gate connection GND ground connection IR infrared radiation M measuring laser radiation P primary radiation S secondary radiation s source connection V supply voltage

Claims

[1] Apparatus (1) with a lighting source (2), wherein - the apparatus (1) comprises at least one measuring laser (3), - the measuring laser (3) is a semiconductor laser and is designed to generate pulses with a pulse duration of not more than 10 ns, - a wavelength of maximum intensity of a measuring laser radiation (M) generated by the measuring laser (3) is between 400 nm and 485 nm inclusive. [2] Apparatus (1) according to the preceding claim, wherein - the illumination source (2) produces white light during operation, - the illumination range of the illumination source (2) is at least 25 m, - the apparatus (1) comprises at least one sensor (4) and an electronic unit (5), - the sensor (4) is designed to detect a portion of the measuring laser radiation (M) reflected outside the apparatus (1) on an external object (6) with a time resolution of at most 5 ns, - the electronic unit (5) is designed to determine a travel time of the reflected and detected portion of the measuring laser radiation (M) and thus a distance of the object (6) reflecting the measuring laser radiation (M) from the apparatus (1), and - the pulse duration is no more than 5 ns. [3] Apparatus (1) according to any one of the preceding claims, wherein - the illumination source (2) comprises at least one phosphor (21), - the phosphor (21) is excited to generate secondary radiation (S) by a primary light source (22) which, during operation, generates blue light as primary radiation (P), - the illumination source (2) emits a mixed radiation composed of the primary radiation (P) and the secondary radiation (S). [4] Apparatus (1) according to the preceding claim, wherein - the primary light source (22) is formed by the measuring laser (3), and - the measuring laser radiation (M) is a portion of the primary radiation (P) transmitted through the phosphor (21). [5] Apparatus (1) according to the preceding claim, wherein - the measuring laser radiation (M) and the mixed radiation illuminate the same solid angle range, and - the sensor (4) is designed for spatially resolved detection of the reflected measuring laser radiation (M). [6] Apparatus (1) according to claim 3, wherein - the primary light source (22) is a semiconductor laser emitting blue light during operation, - the primary light source (22) is different from the measuring laser (3), and - the measuring laser radiation (M) is guided past the phosphor (21). [7] Apparatus (1) according to the preceding claim, wherein - the primary light source (22) and the measuring laser (3) emit light of the same maximum wavelength with a tolerance of no more than 10 nm, - the mixed radiation is colored light, and - the mixed radiation together with the measuring laser radiation (M) is white light. [8] Apparatus (1) according to one of the two preceding claims, wherein - the apparatus (1) comprises an imaging optics (7), and - the imaging optics (7) are arranged downstream of the primary light source (22) and the measuring laser (3). [9] Apparatus (1) according to any one of claims 1 to 7, wherein - the apparatus (1) comprises at least one imaging optic (7), and - the imaging optics (7) are configured to image the measuring laser radiation (M) in a pattern and / or to scan with the measuring laser radiation (M). [10] Apparatus (1) according to one of the two preceding claims, wherein - the imaging optics (7) are inseparably connected to the measuring laser (3), and - the imaging optics (7) comprises a lens, a reflector, a diffractive optical element, a metal lens, a multi-lens field and / or a diffuser. [11] Apparatus (1) according to any one of the preceding claims, wherein - the apparatus (2) additionally comprises an infrared laser (8), - the infrared laser (8) is a semiconductor laser and is designed to generate pulses with a pulse duration of not more than 10 ns, - a wavelength of maximum intensity of infrared radiation (IR) generated by the infrared laser (8) is between 0.7 µm and 3 µm, and - a pulse emission of the infrared laser (8) is synchronized with the measuring laser (3). [12] Apparatus (1) according to the preceding claim, wherein - at least one optical element is arranged downstream of the infrared laser (8) and the measuring laser (3), and - the infrared laser (8) can also be operated when the measuring laser (3) is switched off. [13] Apparatus (1) according to one of the two preceding claims, wherein - the infrared laser (8) together with the electronic unit (5) is set up as a safety circuit for the measuring laser (3), and - the measuring laser (3) can only be operated if the infrared laser (8) together with the electronic unit (5) has determined that there are no persons in the illumination range of the measuring laser (3). [14] Apparatus (1) according to any one of the preceding claims, wherein - the sensor (4) is a Si photodiode, a Si photodiode array or a CMOS camera, and - the sensor (4) is configured for at least two different spectral ranges. [15] Apparatus (1) according to any one of the preceding claims, wherein - the measuring laser (3) is an edge-emitting flip-chip, - a capacitor (31) is electrically connected in parallel to a series circuit comprising the measuring laser (3) and a switching element (32b), and - the measuring laser (3), the capacitor (31) and / or the switching element (32b) are mounted on a common carrier (34) without bonding wires. [16] Apparatus (1) according to any one of the preceding claims, which is a motor vehicle, a drone, a robot, an actuator or a tool. [17] Headlight (10) with a lighting source (2) and with a measuring laser (3), wherein - the illumination source (2) comprises at least one phosphor (21), - the phosphor (21) is excited to generate secondary radiation (S) by a primary light source (22) which, during operation, generates blue light as primary radiation (P), - the primary light source (22) is a light-emitting diode or a semiconductor laser, - the illumination source (2) emits a mixed radiation composed of the primary radiation (P) and the secondary radiation (S), - the measuring laser (3) is a semiconductor laser and is designed to generate pulses with a pulse duration of not more than 10 ns, - a wavelength of maximum intensity of a measuring laser radiation (M) generated by the measuring laser (3) is between 400 nm and 485 nm inclusive, and - the illumination range of the illumination source (2) is at least 25 m. [18] Headlight (1) according to the preceding claim, wherein - the primary light source (22) is formed by the measuring laser (3), - the measuring laser radiation (M) is a portion of the primary radiation (P) transmitted through the phosphor (21), and - the measuring laser radiation (M) together with the secondary radiation (S) is white light.

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