Test contactor for testing an electrically conductive test element, method for manufacturing a test contactor for testing an electrically conductive test element, and use of a support element for a test contactor

Abstract

The present invention relates to a test contactor (1) for testing an electrically conductive test element (10), a method for manufacturing a test contactor (1) for testing an electrically conductive test element (10), and the use of a support element (110) for a test contactor (1), wherein the test contactor (1) comprises: - an insertion section (20) comprising a test area (5) to which the electrically conductive test element (10) can be attached, and which includes contact elements (8) designed to electrically contact the electrically conductive test element (10) in the test state of the test contactor (1); - a pressure section (80) which is pivotably mounted on the insertion section (20) and which is designed to press the electrically conductive test element (10) against the multiple contact elements (8) in the test state of the test contactor (1), and - a support element (110) which is detachably connected to the insert section (20), -- wherein the support element (110) is configured to form a protection for the contact elements (8) in a transport state of the test contactor (1) in which the support element (110) is connected to the insertion section (20).

Description

[0001] The present invention relates to a test contactor for testing an electrically conductive test element, a method for manufacturing a test contactor for testing an electrically conductive test element, and the use of a support element for a test contactor.

[0002] Conventional test contactor systems essentially consist of a test contactor and a printed circuit board (PCB) and are used to test chips, such as computing chips that can be used as CPU cores. A chip is inserted into the open test contactor, and then the test contactor is closed. The test contactor is mounted on a PCB, so that when the test contactor is closed, its cover exerts pressure on the chip, ensuring reliable contact between the chip and the test contactor's spring-loaded contact pins. The chip then transmits this pressure to the PCB via the spring-loaded contact pins, thus ensuring reliable contact between the pins and the PCB. This process subjects the PCB to pressure and / or bending stresses from the contact elements.

[0003] It is known in the prior art to attach a stiffening element to a test contactor in the test state for this reason, in order to support the circuit board on which the spring contact pins press in the test state.

[0004] It is therefore an object of the present invention to provide an improved test contactor which in particular has an improved service life.

[0005] Furthermore, it is an object of the present invention to provide a method for manufacturing an improved test contactor, which in particular has an improved service life, as well as to provide a use of a support element for improving a test contactor, in particular for improving the service life of a test contactor.

[0006] The aforementioned problems are solved by the subject matter of the independent claims; preferred embodiments are the subject matter of the dependent claims.

[0007] One aspect of the invention relates to a test contactor for testing an electrically conductive test element, wherein the test contactor comprises: - an insert section comprising a test area to which the electrically conductive test element can be attached, and which includes contact elements designed to electrically contact the electrically conductive test element in the test state of the test contactor; - a pressure section which is pivotably mounted on the insertion section and which is designed to press the electrically conductive test element against the multiple contact elements in the test state of the test contactor, and - a support element which is detachably connected to the insert section, -- wherein the support element is designed to provide protection for the contact elements in a transport state of the test contactor in which the support element is connected to the insertion section.

[0008] By designing the support element to provide protection for the contact elements in the transport state of the test contactor, the service life of the contact elements can be advantageously improved, and furthermore, the service life of the test contactor can be advantageously improved, so that in particular an improved test contactor is provided.

[0009] The protection provided by the support element connected to the insert section includes, in particular, at least restricted or prevented access to the contact elements, especially restricted or prevented access to the contact elements essentially from below the insert section.

[0010] The support element can be reversibly and detachably connected to the insert section. For example, the support element and / or the insert section can have fasteners for a reversibly detachable connection of the support element to the insert section; in particular, the support element and the insert section can have mutually complementary fasteners for a reversibly detachable connection of the support element to the insert section. The fastener(s) for connecting the support element to the insert section can be, in particular, positive-locking and / or friction-locking fasteners.

[0011] This allows the support element to be advantageously reused to protect contact elements during transport of the test contactor, for example, for multiple transports that do not necessarily follow each other immediately, and between which the test contactor is also used in the test state. Furthermore, the support element can advantageously be reused both to support a printed circuit board during the test state of the test contactor and to protect contact elements. Thus, the support element is advantageously designed with multiple functions, each of which improves the service life of the test contactor as well as the service life of the elements used for testing the test contactor.

[0012] The transport state of the test contactor is, in particular, a state in which the support element is arranged on the test contactor, and in which, in particular, the support element is connected to the insertion section, especially from below in an up-down direction of the test contactor. The transport state of the test contactor is further configured, in particular, by the fact that no printed circuit board is arranged between the insertion section and the support element, or that no printed circuit board is arranged on the test contactor. To ensure safe transport of the test contactor in the transport state, the transport state can, in particular, include a closed state of the test contactor, i.e., a state in which the pressure section is pivoted towards the insertion section, in particular pivoted such that a clamping means and a complementary clamping means of the pressure section and the insertion section are in mutual engagement.

[0013] This allows the contact elements to be advantageously protected in the transport state by the support element and the pressure section, in particular essentially from above by the pressure section and especially essentially from below by the support element.

[0014] Alternatively, the transport of the test contactor may also involve an open state of the test contactor, for example, in an open state, stacked in a packaging medium.

[0015] This allows the contact elements to be advantageously protected by the support element during transport, in particular primarily from below.

[0016] The test state of the test contactor is, in particular, a state in which the support element is arranged on the test contactor, and in which, in particular, the support element is connected to the insert section, especially from below in an top-bottom direction. The test state of the test contactor is further configured, in particular, by the fact that a test element is attached to the insert section, especially to the test area of ​​the insert section, that the test contactor is in the closed state, and that, optionally, a printed circuit board is arranged between the insert section and the support element.

[0017] This allows the support element to advantageously protect contact elements in the transport state of the test contactor and, in particular, to support a printed circuit board in the test state of the test contactor, so that the support element advantageously has several integral functions that improve the service life of the test contactor, the contact elements and the printed circuit board.

[0018] The multiple contact elements can be arranged on the insertion section, in particular with an extension essentially parallel to an up-down direction. The multiple contact elements can, in particular, be arranged at least partially within the insertion section.

[0019] The multiple contact elements can be arranged in such a way as to be configured, in the test state of the test contactor, to electrically connect a test element located above the insertion section to a printed circuit board, in particular to a printed circuit board located below the insertion section.

[0020] The multiple contact elements can be arranged on the insertion section in such a way that the multiple contact elements are configured to electrically connect a test element adjacent to the insertion section at least partially from above with a printed circuit board, in particular with a printed circuit board adjacent to the insertion section at least partially from below, in the test state.

[0021] In further exemplary embodiments, the contact elements of the multiple contact elements can protrude from the insertion section on one or both sides, in particular projecting from the insertion section on one or both sides essentially parallel to the top-bottom direction. This advantageously ensures reliable electrically conductive contact between the test element mounted in the test area and a printed circuit board arranged on the test contactor, which is located, in particular, below the insertion section.

[0022] The contact elements of the multiple contact elements can in particular be spring contact elements, for example elastically restorable spring contact elements.

[0023] The aforementioned design of the contact elements and their arrangement on the insertion section advantageously ensures a safe, electrically conductive contact of a test element in the test state.

[0024] The insertion section of the test contactor can in particular include a frame section that accommodates an insert which includes the several contact elements designed to electrically contact the electrically conductive test element in the test state of the test contactor.

[0025] The pressure section of the test contactor can be pivotally mounted, particularly on the frame section.

[0026] The support element can be connected to the frame section of the insert section, in particular by means of one or more fastening means, and in particular by means of a reversible detachable connection.

[0027] Fasteners may include, for example, one or more screw connections, one or more retractable clips, and / or one or more friction-fit bolts.

[0028] By mounting the pressure section, in particular on the frame section, and by making the support element connectable to the frame section, a force transmission advantageously guided around the contact elements, i.e., a force flow not guided through the contact elements, can be ensured, particularly in the closed transport state of the test contactor.

[0029] In the following sections, various terms will be used repeatedly, the understanding of which should be facilitated by the definitions below.

[0030] Electrically conductive test element: The electrically conductive test element, as used here, is a test element that is tested by making electrical contact with it, for example, by connecting it to one or more printed circuit boards. The test element could, for example, be a computing chip that can be used as a CPU core or similar. When only the term "test element" is used here, it also refers to the electrically conductive test element.

[0031] A printed circuit board, as described herein in particular as a circuit board suitable for electrically conductive contacting of the test element, has, in particular, fixing and / or positioning means for attachment to the test contactor, for example, for attachment to the insertion section of the test contactor. The fixing and / or positioning means may, for example, include receiving holes or elements engaging in receiving holes for attachment to the test contactor or for attachment to the insertion section of the test contactor. The circuit board may, in particular, be a PCB (printed circuit board).

[0032] If a direction or angle is given with the addition of "essentially" or "approximately" or "about", this addition is generally intended to refer to a deviation from the direction or angle in question in the range of 0° to 5°.

[0033] If a spatial measure, spatial ratio or other ratio is given with the addition of "essentially" or "approximately" or "about", this addition is intended to indicate, in particular, a deviation from the measure or ratio in question in the range of 0% to 10%.

[0034] The "top-bottom direction," as used here, describes a direction in which the insert section and the support element, and, in the test state, additionally the test element and / or the printed circuit board, are related to each other, and especially also to the test contactor. If the insert section or the test contactor is positioned in its usual operating position on a substantially flat work surface, the top-bottom direction points essentially vertically. It is understood that if the insert section or the test contactor is placed at an angle on the work surface, the top-bottom direction will deviate accordingly from the vertical direction. Where a vertical direction is subsequently mentioned, as with reference to the figures, this can also correspond to the top-bottom direction.

[0035] In preferred embodiments of the test contactor for testing an electrically conductive test element, the support element can be designed to support the circuit board in a test state of the test contactor in which a circuit board for electrically conductive contacting of the contact elements is arranged sandwich-like between the support element and the insertion section.

[0036] In the test condition in which the printed circuit board is arranged sandwich-like between the support element and the insertion section, the support element can be designed in particular to support the printed circuit board against pressure applied by means of the contact elements and / or to support the printed circuit board against a bending load applied by means of the contact elements, and / or to stiffen the printed circuit board.

[0037] The support element can be configured, particularly in the test state, to support the printed circuit board (PCB) by having a plurality of contact surfaces facing the PCB, which reduce or prevent deformation of the PCB in the area of ​​these contact surfaces. The contact surfaces can be formed, in particular, by one or more projecting sections of the support element, especially those projecting upwards in a top-bottom direction.

[0038] This means that the support element advantageously provides a protective function for the contact elements in the transport state and integrally a supporting function for the circuit board in the test state, thereby advantageously improving the service life of the contact elements and the circuit board, and furthermore advantageously improving the service life of the test contactor, and in particular the repeatability of tests with the test contactor.

[0039] In preferred embodiments of the test contactor for testing an electrically conductive test element, the support element can have projecting and recessed sections on a side facing the insertion section, wherein the support element, together with the insertion section, forms one or more cavities in the area of ​​the contact elements in the transport state through the projecting and recessed sections, wherein the one or more cavities are at least partially bounded by at least one of the support element and the insertion section.

[0040] A cavity of one or more cavities can be bounded downwards in an up-down direction, in particular essentially by a recessed section, laterally, i.e. essentially perpendicular to the up-down direction, in particular essentially by one or more projecting section(s), and / or upwards in an up-down direction, in particular essentially by the insert section.

[0041] The formation of one or more cavities advantageously makes access to the contact elements more difficult or impossible. This can advantageously reduce the likelihood of the contact elements being touched and potentially damaged during handling of the test contactor, particularly before, during, and / or after transport, especially by an operator of the test contactor or by a tool used by the operator. Furthermore, it can advantageously reduce the likelihood of small parts or dirt coming into contact with the contact elements during transport and potentially damaging them.

[0042] In preferred embodiments of the test contactor for testing an electrically conductive test element, the projection sections of the support element can, in the test state of the test contactor, align with a section of the insertion section in which no contact elements are arranged, in particular align substantially in the top-bottom direction.

[0043] In other words, the one or more protruding section(s) can be arranged on the support element in such a way that the contact surfaces provided for the printed circuit board do not align with the contact elements in a substantially top-bottom direction.

[0044] This advantageously allows the contact elements to be protected during transport and the printed circuit board to be supported during testing, particularly without imposing an additional load on the contact elements during transport or testing. Thus, the projecting sections designed in this way can advantageously improve the service life of the printed circuit board, the service life of the contact elements, and, in particular, the service life of the test contactor, thereby improving the repeatability of tests with the test contactor.

[0045] In preferred embodiments of the test contactor for testing an electrically conductive test element, the cavity or cavities can be subdivided or separated from each other at least section by a projection section.

[0046] For example, the projecting and recessed sections can be arranged alternately on the support element to form correspondingly alternating cavities.

[0047] By dividing one or more cavities with a projecting section, the support of the printed circuit board (PCB) can be advantageously improved, particularly its resistance to bending loads. This, in turn, advantageously reduces the deflection of the PCB. Furthermore, by reducing the deflection of the PCB, the contacting of the PCB by the contact elements during the test state of the test contactor can be advantageously improved.

[0048] Furthermore, the protection provided by the cavity(s) can be improved by subdividing one or more cavities with a projecting section, as comparatively small cavities are formed, which advantageously reduces the probability of the contact elements being touched by an operator, by an operator's tool, and / or by dirt.

[0049] A plurality of projecting sections can, for example, be arranged at intervals along the longitudinal and / or lateral direction on the support element, wherein a recessed section is arranged between each pair of adjacent projecting sections, and a cavity is formed in the area of ​​the recessed section, particularly in its upward direction. The cavity formed by the recessed section can, accordingly, be separated from another cavity by a projecting section in at least one direction, both longitudinally and laterally.

[0050] In preferred embodiments of the test contactor for testing an electrically conductive test element, the support element can have a substantially step-shaped contour at two mutually spaced locations. and the insert section may preferably have at least partially complementary step-shaped contours which, in the transport state, engage with the essentially step-shaped contours of the support element at the two mutually spaced points, in particular in a form-fitting manner.

[0051] The transport state refers in particular to a transport state of the test contactor in which the support element is connected to the insertion section without a printed circuit board being arranged between the support element and the insertion section.

[0052] The stepped contours of the support element can be arranged, in particular, on a side of the support element facing the insertion section, especially in the transport state, and in particular on an upper side of the support element in the top-bottom direction.

[0053] The complementary step-shaped contours of the insert section can be arranged, in particular, on a side of the support element facing the support element, especially in the transport state, and in particular on a lower side of the insert section in the top-bottom direction.

[0054] The stepped contours and the complementary stepped contours can, in particular, have a step essentially in the top-bottom direction.

[0055] The spaced-apart, stepped contours of the support element advantageously allow for easy positioning of the support element relative to the insert section, especially before the support element is connected to the insert section by means of one or more fasteners.

[0056] Furthermore, the stepped contours of the support element, through the stepped, and in particular positive-locking, engagement, essentially in the top-bottom direction, enable the contact elements to be particularly well protected, especially since the height of the cavities, essentially in the top-bottom direction, can be advantageously reduced by the stepped engagement. This advantageously reduces the probability of the contact elements being touched by an operator, by an operator's tool, and / or by dirt, and accordingly improves the service life of the contact elements and, consequently, the service life of the test contactor.

[0057] The mutual engagement of the stepped contours and the complementary stepped contours is such that one of the support elements and the insert section is at least partially contained within the other of the support element and the insert section. This allows the cavities to be further advantageously reduced in size and their boundaries improved, thus ensuring enhanced protection for the contact elements.

[0058] In preferred embodiments of the test contactor for testing an electrically conductive test element, the support element can be essentially plate-shaped and have a plurality of fastening means for reversible attachment to the insert section.

[0059] The fastening elements of the majority of fasteners can be distributed along the support element. For example, the fastening elements of the majority of fasteners can be arranged at least partially at opposite ends of the support element, for example, at ends of the support element that are opposite each other in the width direction and / or in the length direction.

[0060] In other words, the fastening means of the support element can be arranged particularly on the outer areas of the support element in the longitudinal and / or lateral direction.

[0061] For example, the projecting section(s) can be arranged or formed substantially centrally on the support element in the longitudinal or lateral direction, in particular along a row, for example along a row interrupted by recessed sections. The fastening means can be arranged, in particular, on the outside of the support element, i.e., spaced apart in the longitudinal and / or lateral direction from the substantially centrally arranged projecting sections.

[0062] The fasteners can be at least partially integrated into the support element. The support element can have hollow forms on its lower side (in the top-bottom direction), each of which can accommodate a fastener. The fasteners can be integrated into the support element in such a way that, during testing, none of the fasteners protrude downwards from the support element. This allows the test contactor to be advantageously positioned flat and, in particular, securely on a work surface.

[0063] In exemplary embodiments, the fastening elements can be arranged or received in the support element in a captive manner, in particular by means of a locking device. The locking device can, for example, comprise a projection, a retaining ring, a locking pin, or the like. The locking device can extend at least partially into a cavity of the support element in which a fastening element is received.

[0064] The fastening means, and in particular the arrangement of the fastening means as described above, advantageously allow the support element to be securely and easily connected to the insert section in both transport and testing conditions. Furthermore, the fastening means advantageously enable a rigid configuration of the test contactor in both the testing and transport conditions, thus advantageously improving the service life of the test contactor and the service life of the elements arranged on the test contactor.

[0065] In preferred embodiments of the test contactor for testing an electrically conductive test element, the contact elements can project at least partially from the insertion section towards the support element, and furthermore, in particular, project into one or more cavities, especially into cavities separated from each other at least in the longitudinal direction or in the width direction.

[0066] The contact elements can, particularly in the transport state where no circuit board is arranged below the insertion section, protrude at least partially from the insertion section towards the support element.

[0067] This advantageously ensures a safe and repeatable contact of the circuit board in the test state, whereby the contact elements are advantageously protected by the support element or can be protected by the support element if no circuit board is arranged below the insertion section.

[0068] In preferred embodiments of the test contactor for testing an electrically conductive test element, the insert section can be formed in multiple parts, such that the insert section has a frame section on which the pressure section is pivotably mounted, and has an insert which comprises the contact elements and which can be attached to the frame section. wherein the insert can be formed in multiple parts, and in particular has an insert element which can be attached to a base section by means of a fastening means with one translational degree of freedom, wherein the fastening means can be arranged in a loss-proof manner, in particular by means of the support element, on the base section of the insert section.

[0069] The test contactor is advantageously adjustable for specific test elements due to its multi-part insert section, which in particular includes an insert containing the contact elements and which can be attached to the frame section, especially in a reversibly detachable manner. Furthermore, the pressure applied to the circuit board by means of the contact elements arranged in the insert, as well as the simultaneous support of the circuit board provided by the support element, are advantageously adjustable. The test contactor can also advantageously improve the repeatability of the tests.

[0070] The insert element can, in particular, have one translational degree of freedom essentially in the up-down direction. Furthermore, the insert element can, in particular, have one translational degree of freedom limited by the fastening means.

[0071] Due to the translational degree of freedom of the insert element, it can advantageously reduce high initial pressure on the contact elements when the test contactor transitions to the closed state, particularly when a test element is attached to the test area. This can advantageously improve the service life of the contact elements and, consequently, the service life of the test contactor.

[0072] In exemplary embodiments, the insert can include a preloading device that preloads the insert element along its translational degree of freedom, particularly in the up-down direction, away from the base section, thus preloading it towards the test element in the test state. This allows for a further advantageous reduction of the high initial pressure on the contact elements and, consequently, a further improvement in the service life of the contact elements and, accordingly, that of the test contactor.

[0073] The fastening element can be arranged, at least partially, in an opening of the base section of the insert to positively secure the insert element to the base section. The support element can be designed, for example, by means of a projecting section, to essentially delimit the opening of the base section from below in a top-bottom direction, such that the fastening element is securely positioned within the opening of the base section.

[0074] This can be particularly advantageous in preventing the loss of the fastening element, for example during transport of the test contactor.

[0075] The insert element, by means of the translational degree of freedom essentially in the top-bottom direction, further advantageously enables the contact elements to be supported at least sectionally and, in particular, to be protected, thereby advantageously increasing the service life of the contact elements, and depending on the application or the test contactor.

[0076] Another aspect of the invention relates to a method for manufacturing a test contactor for testing an electrically conductive test element, wherein the method comprises the steps: - Providing an insert section with a pressure section which is pivotably mounted on the insert section, -- wherein the insertion section comprises a test area to which the electrically conductive test element can be attached, and which includes contact elements designed to electrically contact the electrically conductive test element in the test state of the test contactor, -- wherein the pressure section is designed to press the electrically conductive test element against the multiple contact elements in the test state of the test contactor, and - Providing a support element; and - Connecting the support element to the insert section in such a way that the support element forms a protection for the contact elements.

[0077] The provided support element can have, in particular, projecting and receding sections on one side, in particular several projecting and receding sections, in particular several alternating projecting and receding sections.

[0078] In the connected state of the support element with the insert section, one or more cavities may be formed to protect the contact elements, in particular, which are at least partially enclosed by the support element and / or at least partially by the insert section.

[0079] The test contactor, its exemplary, preferred and alternative embodiments, and their effects, relate equally to the method for manufacturing a test contactor, and vice versa.

[0080] Another aspect of the invention relates to the use of a support element for a test contactor for testing an electrically conductive test element to protect contact elements of the test contactor during transport.

[0081] The use of the support element for a test contactor for testing an electrically conductive test element to protect contact elements of the test contactor during transport may in particular include the following step: - Connecting the support element to the test contactor without an intermediate circuit board.

[0082] In other words, the use of the support element can specifically include the following step: - Connecting the support element to the test contactor, in particular to an insertion section of the test contactor which includes a test area for a test element and which includes several contact elements which are designed to electrically contact the test element in the test state, without a printed circuit board arranged between the insertion section and the support element.

[0083] The support element used for the test contactor in this way describes in particular the use of a test contactor in the transport state.

[0084] The use of the support element may include, in particular, the following steps, especially in this order: - Detaching the support element from the test contactor; - Arranging a printed circuit board at the test contactor; and - Connecting the support element to the test contactor in such a way that the printed circuit board is supported by the support element in a test state of the test contactor.

[0085] The support element used for the test contactor in this way describes in particular the use of a test contactor in the test state, and can in particular start from the transport state in which the support element is connected to the test contactor or to the insertion section of the test contactor with the step of detaching the support element from the test contactor.

[0086] The test contactor, the method for manufacturing a test contactor, their exemplary, preferred and alternative embodiments, and their effects, relate equally to the use of a support element, and vice versa.

[0087] By manufacturing and using the support element, wherein, during transport, the support element is connected to the test contactor or the insertion section of the test contactor, particularly without a printed circuit board being arranged between the insertion section and the support element, and wherein, during testing, the support element can be connected to the test contactor or the insertion section in such a way that the support element supports the printed circuit board, particularly from below, a functionally integrated support element can advantageously be provided. The functionally integrated support element makes it possible, in particular, to improve the service life of the contact elements, the service life of the printed circuit board, and, furthermore, the service life of the test contactor, and thereby, in turn, to improve the repeatability of the tests performed by the test contactor.

[0088] The insert section may in particular be made of or consist of a plastic, in particular a thermoplastic plastic.

[0089] In particular, the insert element, the base section, and / or the fastening means of the insert may be made of or consist of a plastic, in particular a thermoplastic plastic.

[0090] The insert, and in particular the insert element, the base section, and / or the fastening element, can be manufactured easily and cost-effectively from plastic, and especially from thermoplastic plastic, and furthermore exhibit suitable elastic deformability. Moreover, the insert is advantageously designed essentially as an insulator, apart from the contact elements arranged in or on the insert, so that targeted electrically conductive contact of the test element can be ensured.

[0091] In exemplary embodiments, the insert, and in particular the insert element, the base section, and / or the fastening means, may comprise or consist of polyethylene (PE), polypropylene (PP), polycarbonate (PC), polyamide (PA), and / or polyetheretherketone (PEEK).

[0092] If the insert, and in particular the insert element, the base section, and / or the fastening element, contains or consists of polyetheretherketone, the insert is advantageously heat-resistant in addition to being particularly easy to manufacture, for example by injection molding. This heat resistance advantageously allows for a large number of consecutive or continuous tests to be performed on the test contactor, with the test being advantageously repeatable.

[0093] The following describes embodiments of the invention in more detail with reference to the accompanying figures. It is understood that the present invention is not limited to these embodiments and that individual features of the embodiments can be combined to form further embodiments within the scope of the accompanying claims.

[0094] It shows: Fig. 1 a test contactor according to an embodiment, in an open state; Fig. 2 a test contactor according to an embodiment, in an open state; Fig. 3 a test contactor according to an embodiment, with arranged test elements, in an open state; Fig. 4 a test contactor according to an embodiment, in the closed state; Fig. 5 a sectional view of a test contactor according to an embodiment, in the closed state; Fig. 6 Another sectional view of a test contactor according to an embodiment, in the closed state; Fig. 7 Another sectional view of a test contactor according to an embodiment, in the closed state; Fig. 8a an application according to an embodiment; Fig. 8b a sectional view of an insert according to an embodiment; Fig. 9a a fastening device according to an embodiment; Fig. 9b and Fig. 9c a further sectional view of an insert according to an embodiment; Fig. 10 an exploded view of an insert according to an embodiment; Fig. 11a, Fig. 11b and Fig. 11c an application according to an embodiment, with a coding; Fig. 12 a test contactor according to an embodiment, in the closed state; Fig. 13 a sectional view of a test contactor according to an embodiment, in the closed state; Fig. 14a and Fig. 14b a pressure section according to one embodiment; Fig. 14c a pivot joint according to one embodiment; Fig. 15 a sectional view of a test contactor according to an embodiment, in the closed state; Fig. 16 Another sectional view of a test contactor according to an embodiment, in the closed state; Fig. 17a a support element according to one embodiment; Fig. 17b and Fig. 17c a sectional view of a support element according to one embodiment; Fig. 18a and Fig. 18b a flowchart of a use of an insert according to an embodiment; Fig. 19 a flowchart of a process for manufacturing a test contactor; Fig. 20a and Fig. 20b a flowchart of a use of a support element according to an embodiment; and Fig. 21 a flowchart of a process for manufacturing a test contactor.

[0095] Fig. Figure 1 shows a test contactor 1 according to an embodiment, in an open state of the test contactor 1.

[0096] Fig. Figure 2 shows a test contactor 1 according to an embodiment, in an open state of the test contactor 1. The in Fig. The test contactor 1 shown in Figure 2 can in particular be essentially the same as the test contactor 1 as shown in Figure 2. Fig. 1 shown, correspond, where the in Fig. The test contactor 1 shown in 2 is shown enlarged in contrast.

[0097] Fig. Figure 3 shows a test contactor 1 according to an embodiment, with attached test elements 10, in an open state. The in Fig. The test contactor 1 shown in Figure 3 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 1 and Fig. 2 shown, correspond, whereby in comparison to the one in Fig. 3 Test contactor 1 shown additionally has test elements 10 attached, and in particular a circuit board 2 is arranged on the test contactor 1.

[0098] Fig. Figure 4 shows a test contactor 1 according to one embodiment, in the closed state. The in Fig. The test contactor 1 shown in Figure 4 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. In Figure 4, a printed circuit board 2 is arranged on the test contactor 1, and the test contactor 1 is shown in the closed state. This contrasts with the illustrations in the Fig. 1, Fig. 2 and Fig. 3. The pressure section 80 of the test contactor 1 and the insertion section 20 of the test contactor 1 are pivoted relative to each other. The pressure section 80 can, in particular, be pivoted such that it is configured to press a test element 10 arranged on the test contactor 1, or more specifically on the insertion section 20, against contact elements 8 which are arranged in the insertion section 20.

[0099] The closed state, as in Fig. As shown by way of example in Figure 4, the clamping element can be fixed in particular by means of a clamping element 100 which engages with a complementary clamping element 32, in particular in a reversibly releasable manner. One of the clamping element 100 and the complementary clamping element 32 can be arranged on the pressure section 80, and the other of the clamping element 100 and the complementary clamping element 32 can be arranged on the insertion section 20, in particular on the frame section 30 of the insertion section 20.

[0100] The clamping means 100 can, in particular, comprise an elastically restoring hook configured to engage a projection of the complementary clamping means 32 when the test contactor 1 is closed, and especially when the test contactor 1 is in test mode. The clamping means 100 is, in particular, elastically restorable and actuated, for example, by an operator or a tool, so that the test contactor 1 can be reversibly moved into an open and a closed state, or, in particular, into a test state.

[0101] Fig. Figure 5 shows a sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the width direction B, B' and in the length direction L, L'. The Fig. The test contactor 1 shown in Figure 5 can in particular be essentially the same as the test contactor 1 as shown in Figure 5. Fig. 4 shown, correspond, where the test contactor 1 is in Fig. 5 is shown in a cross-sectional view. Furthermore, the test contactor 1 can be in Fig. 5 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. In the 5 shown test contactor 1, in particular a printed circuit board 2 is arranged on the test contactor 1, and the test contactor 1 is shown in the closed state.

[0102] Fig. Figure 6 shows another sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the width direction B, B' and in the length direction L, L'. The Fig. The test contactor 1 shown in Figure 6 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4 and Fig. 5 shown, correspond, where the test contactor 1 is in Fig. 6 in the width direction B is cut at a different location than the test contactor 1 in Fig. 5. Furthermore, the test contactor 1 can be in Fig. 6 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. In 6, the test contactor 1 is shown, in particular a printed circuit board 2 is arranged on the test contactor 1, and the test contactor 1 is shown in the closed state.

[0103] Fig. Figure 7 shows another sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the width direction B, B' and in the length direction L, L'. The Fig. The test contactor 1 shown in section 7 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4, Fig. 5 and Fig. 6 shown, correspond, where the test contactor 1 is in Fig. 7 is cut in the lateral direction B at a different point than the test contactor 1 in the Fig. 5 and Fig. 6. Furthermore, the test contactor 1 can be in Fig. 7 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. In the 7 shown test contactor 1, in particular a printed circuit board 2 is arranged on the test contactor 1, and the test contactor 1 is shown in the closed state.

[0104] Fig. Figure 8a shows an insert 40 according to one embodiment, wherein the insert 40 may correspond to the insert 40 as in a test contactor 1 in one of the Fig. 1 to 7 shown or arranged.

[0105] Fig. Figure 8b shows a sectional view of an insert 40 according to an embodiment, wherein the one shown is in Fig. 8b shown use 40 in particular the one in Fig. 8a shown deployment 40 can correspond.

[0106] Fig. Figure 9a shows a fastening means 42 according to one embodiment, wherein the fastening means 42 can correspond to the fastening means 42 as in an insert 40 or in a test contactor 1 in one of the Fig. 1 to 8a and 8b shown or arranged.

[0107] Fig. 9b and Fig. Figure 9c shows a further sectional view of an insert 40 according to the embodiment, wherein the insert is located in the Fig. 9b and Fig. 9c shown use 40 especially the one in Fig. 8a can correspond to the use shown in 40, and in particular can have a fastening means 42, as shown in Fig. 9a shown. The sectional views of the Fig. 9b and Fig. Figure 9c each shows a section with a cutting plane that essentially extends in the width direction B and in the length direction L.

[0108] Fig. Figure 10 shows an exploded view of an insert 40 according to an embodiment, wherein the in Fig. 10 shown deployment 40 especially the one in the Fig. 8a, Fig. 9b and Fig. 9c can correspond to the use shown in 40, and in particular can have a fastening means 42, as shown in Fig. 9a shown.

[0109] Fig. 11a, Fig. 11b and Fig. Figure 11c shows an insert 40 according to an embodiment, with a coding, in particular with at least one pin 68, which is arranged in an opening or in a coding opening 67 of the insert 40. The one in the Fig. 11a, Fig. 11b and Fig. 11c can in particular essentially correspond to the use of 40, as in the Fig. 8a, Fig. 9b, Fig. 9c and Fig. 10 correspond to the insert 40 shown, and in particular have at least one pin 68 which is arranged in one or more coding openings 67.

[0110] Fig. Figure 12 shows a test contactor 1 according to an embodiment, in the closed state. The in Fig. The test contactor 1 shown in Figure 12 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4, Fig. 5, Fig. 6 and Fig. 7 shown, correspond, where the test contactor 1 is in Fig. 12, in particular, is shown from its rear. Furthermore, the test contactor 1 can be in Fig. 12 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. 12. Test contactor 1 shown, in particular a printed circuit board 2 is arranged on the test contactor 1, and the test contactor 1 is shown in the closed state.

[0111] Fig. Figure 13 shows a sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the width direction B, B' and in the height direction H, H'. The Fig. The test contactor 1 shown in Figure 13 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4, Fig. 5, Fig. 6, Fig. 7 and Fig. 12 shown, correspond, where the test contactor 1 is in Fig. 13, in particular from its back and in cross-sectional view. Furthermore, the test contactor 1 can be found in Fig. 13 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, correspond, where at the in Fig. 13 shows that a printed circuit board 2 is arranged on the test contactor 1, and that the test contactor 1 is shown in the closed state.

[0112] Fig. 14a and Fig. Figure 14b shows a pressure section 80 according to an embodiment, wherein the pressure section is located in the Fig. 14a and Fig. 14b shows print section 80, in particular the one described in the Fig. The pressure section 80 shown in Figures 1 to 7, 12 and 13 may correspond to this. For clarity, pressure section 80 is shown in each case specifically without the swivel joint 90.

[0113] Fig. Figure 14c shows a pivot joint 90 according to one embodiment, wherein the Fig. The swivel joint 90 shown in 14c, in particular the one shown in the Fig. 1 to 7, 12 and 13 can correspond to the swivel joint 90 arranged on the test contactor 1.

[0114] Fig. Figure 15 shows a sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the vertical direction H, H' and in the longitudinal direction L, L'. The Fig. The test contactor 1 shown in Figure 15 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4, Fig. 5, Fig. 6, Fig. 7, Fig. 12 and Fig. 13 shown, correspond, where the pressure section 80 of the in Fig. The test contactor 1 shown in Figure 15 is not shown, at least partially, for clarity. Furthermore, the test contactor 1 can be found in Fig. 15 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, corresponding to the test contactor 1 in the closed state, and the printing section 80 is at least partially omitted for clarity.

[0115] The in Fig. The representation of the test contactor 1 shown in Figure 15 can in particular correspond to a transport state of the test contactor 1 in which no printed circuit board 2 is arranged between the insertion section 20 and the support element 110.

[0116] Fig. Figure 16 shows another sectional view of a test contactor 1 according to an embodiment, in the closed state. The sectional view represents a section with a cutting plane that extends essentially in the vertical direction H, H' and in the longitudinal direction L, L'. The Fig. The test contactor 1 shown in Figure 16 can in particular be essentially the same as the test contactor 1, as shown in the Fig. 4, Fig. 5, Fig. 6, Fig. 7, Fig. 12, Fig. 13 and Fig. 15 shown, correspond. Furthermore, the test contactor 1 can be in Fig. 16 essentially the test contactor 1, as in the Fig. 1, Fig. 2 and Fig. 3 shown, corresponding to the test contactor 1 in the closed state, and wherein a circuit board 2 is arranged at the test contactor 1.

[0117] Compared to test contactor 1, as in Fig. As shown in 15, it is at test contactor 1, as in Fig. Figure 16 shows, in particular a printed circuit board 2 arranged at the test contactor 1. The printed circuit board 2 is arranged in a sandwich-like manner between the insert section 20 and the support element 110. Fig. 16 can in particular represent a test state of the test contactor 1.

[0118] Fig. Figure 17a shows a support element 110 according to one embodiment.

[0119] Fig. 17b and Fig. Figure 17c shows a sectional view of a support element 110 according to an embodiment, wherein the support element 110 is in particular the one shown in Fig. The support element 110 shown in 17a can correspond to the one shown in the Fig. 17a, Fig. 17b and Fig. The support elements 110 shown in 17c can in particular correspond to the respective support elements 110 as shown in the Fig. 1 to 7, 12, 13, 15 and 16 shown or arranged on the test contactors 1 shown there.

[0120] The one in the Fig. The test contactor 1 shown in Figures 1 to 7, 12, 13, 15, 16 and 17 represents an exemplary test contactor 1, which in particular has an insertion section 20 and a pressure section 80, wherein the insertion section 20 and the pressure section 80 are pivotably mounted relative to each other, in particular by means of an exemplary pivot joint 90 or by means of several pivot joints 90.

[0121] The one in the Fig. The test contactor 1 shown in Figures 1 to 7, 12, 13, 15, 16 and 17 has several test areas 5, which are only partially indicated with reference symbols in the figures for clarity. The insert section 20 has, in particular, a corresponding plurality of inserts 40, such that each insert 40 has a test area 5 to which a test element 10 can be attached.

[0122] The test element 10 can in particular be inserted into or attached to the insert 40, in particular being inserted into or attached to the insert 40 in such a way that the test element 10 is electrically conductively contacted with the contact elements 8, which are arranged at least partially in the insert 40, in the test state of the test contactor 1.

[0123] It is understood that although the test contactor 1 has, by way of example, a plurality of test areas 5 and inserts 40, for the electrically conductive contacting of a corresponding plurality of test elements 10, the test contactor 1 is not limited to this.In further exemplary embodiments, the test contactor 1 can have a plurality of test areas 5 and inserts 40 that differs from those shown in the figures, and / or a plurality of pressure elements 81 that differs from those shown in the figures, and / or a plurality of support elements 110 that differs from those shown in the figures, for example, a single insert 40 which accordingly has a single test area 5, and / or a single pressure element 81 which extends in the width direction B, B', for example, with substantially the same dimension as the insert 40 and / or as the test area 5 provided by the insert 40 for arranging a test element 10 on it, and / or the test contactor 1 can have a single support element 110.

[0124] Although the test contactor 1 therefore advantageously enables the simultaneous testing of a plurality of test elements 10, which may, for example, be arranged on a test module 12, another exemplary test contactor 1 can only test one, two, three, four, five, six, seven, eight, or a plurality of test elements 10 other than the one shown, simultaneously, in particular by means of a corresponding number of inserts 40, which in turn provide a corresponding number of test areas 5.

[0125] Accordingly, the inserts 40, which the insertion section 20 has and which are arranged in particular on the frame section 30 of the insertion section 20, can be configured, in particular, to each form or have a test area 5 for a single test element 10. This advantageously ensures test element-specific testing by the test contactor 1.

[0126] The inserts 40 can be attached to the frame section 30 in a reversibly detachable manner, for example by means of screws, retractable clips, or similar.

[0127] The longitudinal direction L and the lateral direction B define, in particular, a substantially horizontal plane in which the test contactor 1, and especially the insertion section 20 of the test contactor 1, can be set up or positioned. This substantially horizontal plane can, in particular, correspond to a work surface during typical use of the test contactor 1.

[0128] The vertical direction H represents a direction essentially perpendicular to the horizontal plane spanned by the longitudinal direction L and the lateral direction B. The vertical direction H corresponds in particular to an up-down direction in a typical use of the test contactor 1, and in particular to an up-down direction in a typical use of the insert section 20 of the test contactor 1, and furthermore in particular to an up-down direction in a typical use of the insert 40 of the insert section 20.

[0129] If test contactor 1 is in a closed state, as for example in the Fig. As shown in Figures 4 to 7, 12, 13, 15 and 16, the width direction B' of the pressure section 80 coincides with the width direction B of the test contactor 1, the length direction L' of the pressure section 80 coincides with the length direction L of the test contactor 1, and the height direction H' of the pressure section 80, or the thickness direction of the pressure section 80, coincides with the height direction H, or top-bottom direction, of the test contactor 1, or is at least substantially parallel to each other. The width direction B of the test contactor 1 is, in particular, essentially parallel to the width direction B' of the pressure section 80, regardless of whether the test contactor 1 is in the open or closed state.

[0130] The respective directions are shown without a specific origin and serve to represent a relative position of the parts and sections of the test contactor 1 to each other.

[0131] The latitude direction B, the longitude direction L and the height direction H or the up-down direction H form in particular a right-handed system.

[0132] The width direction B' of the pressure section 80, the length direction L' of the pressure section 80 and the height direction H' of the pressure section 80 or the thickness direction H' of the pressure section 80 form in particular a right-handed system.

[0133] The longitudinal direction L' of the pressure section 80 and the lateral direction B' of the pressure section 80 define, in particular, a plane which, in the closed state of the test contactor 1, is essentially parallel to the plane defined by the lateral direction B and the longitudinal direction L of the test contactor 1. In the open state of the test contactor 1, as exemplified in the Fig. As shown in Figures 1 to 3, the height direction H' and the thickness direction H' of the pressure section 80 are essentially perpendicular to the plane spanned by the longitudinal direction L' and the lateral direction B' of the test contactor 1. In particular, the height direction H' and the thickness direction H' of the pressure section 80 represent a direction along the thickness of the pressure section 80.

[0134] The pressure section 80 is pivotally mounted relative to the insertion section 20, in particular by means of one or more pivot joints 90. The pivot joint 90, as exemplified in the Fig. 1 to 7, 12, 13, 15, 16 and furthermore in particular in Fig. As shown in Figure 14c, it can in particular have a single rotational degree of freedom. This degree of freedom is provided by the pivot joint 90 for the pressure section 80, for pivoting relative to the insertion section 20.

[0135] This advantageously ensures a targeted and repeatable transition between the open state and the closed state, and in particular between the open state and the test state of the test contactor 1.

[0136] In further exemplary embodiments, and as shown in the figures, the test contactor 1 can comprise a plurality of pivot joints 90 by means of which the pressure section 80 is pivotably mounted relative to the insertion section 20. In particular, the test contactor 1 can comprise two pivot joints 90, which are spaced apart from each other in a direction parallel to the pivot axis SA. This ensures and improves the pivoting movement of the pressure section 80 and, consequently, a targeted and repeatable transition between the open and closed states.

[0137] The pivot axis SA of a respective pivot joint 90 is defined, in particular, essentially by an axial element 92 of the pivot joint 90. A restoring means 94 can, in particular, be arranged on the axial element 92. Specifically, a restoring means 94 can be arranged around the axial element 92, and by its arrangement on or around the axial element 92, form a pivot axis SA about which the pressure section 80 can pivot relative to the insertion section 20.

[0138] As in the Fig. 1 to 7, 12, 13, 15, 16 and furthermore especially in the Fig. 14a and Fig. As shown in Figure 14b, in particular the pressure section 80 has a fastening area 86 for fastening the axial element 92.

[0139] The fastening area 86 is formed in the longitudinal direction L' of the pressure section 80, particularly on a rear end face of the pressure section 80. The fastening area 86 has, in particular, an opening 87 which extends continuously through the pressure section 80 in the thickness direction H' of the pressure section 80. Adjacent to the opening 87, which extends through the pressure section 80 in the thickness direction H', on both sides in the width direction B' of the pressure section 80, is a cavity that is bounded or limited on one side in the thickness direction H' of the pressure section 80. This cavity is bounded or limited on one side in the thickness direction H' of the pressure section 80 by the first stop 88, which adjoins the opening 87 on one side in the width direction B', and by the second stop 89, which adjoins the opening 87 on the other side in the width direction B'.

[0140] As in the Fig. 1 to 7, 12, 13, 15, 16 and furthermore especially in the Fig. 14a and Fig. As shown in 14b, the first stop 88 and the second stop 89 can be arranged opposite each other essentially in the thickness direction H' of the pressure section 80.

[0141] As through the Fig. 1 to 7, 12, 13, 15, 16 shown and especially by the Fig. 14a and Fig. As illustrated in Figure 14b, the first stop 88 for an axial element 92 arranged at the mounting area 86 can form a stop in the thickness direction H' of the pressure section 80, and the second stop 89 for an axial element 92 arranged at the mounting area 86 can form a stop against the thickness direction H' of the pressure section 80.

[0142] This allows the swivel joint 90 to be advantageously mounted on the pressure section 80 without preload.

[0143] For example, the pivot joint 90 can be arranged or positioned in the area of ​​the opening 87 of the mounting area 86 such that the axial extent of the axial element 92 is approximately aligned with the thickness direction H' of the pressure section 80. The pivot joint 90 can then be rotated substantially about a direction parallel to the longitudinal direction L' of the pressure section 80. In particular, the pivot joint 90 can be rotated such that the axial element 92 abuts the first stop 88 and the second stop 89 in the thickness direction H' of the pressure section 80, or contacts one or both stops of the first and second stops 88, 89.In other words, the rotation of the pivot joint 90 relates in particular to a rotation of the pivot joint 90, wherein the axial extent of the axial element 92 of the pivot joint 90 is transformed or rotated from a state in which it is oriented substantially along the thickness direction H' to a state in which it is oriented substantially parallel to the width direction B' of the pressure section 80.

[0144] It is understood that, depending on the dimensions of the axial element 92 and the dimensions of the continuous opening 87 in the width direction B', the pivot joint 90 does not initially have to be aligned exactly with the thickness direction H' of the pressure section 80. For example, the pivot joint 90 can instead be arranged rotated in the continuous opening 87, for example already towards the target position in the mounting area 86, in particular towards the two stops 88, 89.

[0145] In exemplary embodiments, the rotation of the pivot joint 90 can be effected such that a second spring arm (not shown) of the return element 94 of the pivot joint 90 engages in the spring arm receptacle 85 of the pressure section 80. The second spring arm comprises, in particular, a means engaging in the spring arm receptacle 85, which comes to rest against the pressure section 80 within the spring arm receptacle 85. The second spring arm of the return element 94 of the pivot joint 90 can, in particular, be arranged projecting substantially tangentially from the axial element 92.Furthermore, the second spring arm of the restoring means 94 can be designed in such a complementary manner with the spring arm receptacle 85 that the second spring arm does not exert any force on the pressure section 80 in the open state of the test contactor 1, and in particular exerts an increasing force on the pressure section 80 during the transition to the closed state, i.e. an increasing force which is directed against the closing movement of the test contactor 1 or the pivoting movement towards the closed state of the test contactor 1.

[0146] The spring arm receptacle 85 can be arranged or formed in the thickness direction H' of the pressure section 80, particularly on a side of the pressure section 80 facing the test element 10 in the test state of the test contactor 1. Furthermore, the spring arm receptacle 85 can be closed or have a stop on a side of the pressure section 80 facing away from the test element 10 in the test state of the test contactor 1, in the thickness direction H' of the pressure section 80, for engaging the second spring arm of the return element 94, particularly when pivoting the pressure section 80 into the closed state of the test contactor 1.

[0147] The test contactor 1 can include one or more swivel joints 90 for pivotable mounting of the pressure section 80 relative to the insertion section 20. As shown in the Fig. Figures 1 to 7, 12, 13, 15 and 16 show that if the test contactor 1 comprises several pivot joints 90, the pivot joints 90 of the multiple pivot joints 90 can be spaced apart from each other essentially in a direction parallel to the pivot axis SA. This advantageously ensures a particularly stable and repeatable pivoting of the pressure section 80 relative to the insertion section 20.

[0148] As in the Fig. As shown in Figures 1 to 7, 12, 13, 15 and 16, the insert section 20 can, in particular, comprise a mounting area 22 for the base 98 of the pivot joint 90. Specifically, the frame section 30 of the insert section 20 can comprise the mounting area 22 for the base 98. Furthermore, the insert section 20 and the frame section 30 can, in particular, each comprise a mounting area 22 for each pivot joint 90.

[0149] The base 98 has, in particular, a receptacle for the axial element 92. As shown in the Fig. 1 to 7, 12, 13, 15 and 16 shown and in Fig. As illustrated in Figure 14c, the base 98 can, in particular, have a two-armed receptacle for the axial element 92. The two-armed receptacle comprises, in particular, two opposing holes designed to receive the axial element 92 along its axial extent. The axial extent of the axial element 92, with the restoring means 94 arranged thereon or around it, essentially defines the pivot axis SA, such that the pivot axis SA is essentially parallel to the axis of the axial extent of the axial element 92, and in particular is essentially coaxial with the axial element 92 arranged on the base 98.

[0150] In exemplary embodiments, one or both of the two opposing holes of the two-armed receptacle of the base 98 can be frictionally connected to the axial element 92. This allows the axial element 92 to be advantageously positioned precisely relative to the base 98. Furthermore, the assembly of the swivel joint 90 can be facilitated, since the axial element 92 is advantageously prevented from detaching from the base 98.

[0151] In further exemplary embodiments, the two opposing holes of the two-armed receptacle of the base 98 can form a clearance fit or transition fit with the axial element 92. This allows the axial element 92 and the restoring means 94 to be advantageously and easily attached to the base 98.

[0152] As in the Fig. 12, Fig. 14c and Fig. As shown in Figure 15, the base 98 can, in particular, have a receptacle for a first spring arm 96 of the restoring element 94. The receptacle of the base 98 for the first spring arm 96 can be an opening that extends through the entire base in the vertical direction H, or it can be an opening that does not extend completely through the base 98 in the vertical direction H. By means of the opening for the first spring arm 96 of the restoring element 94, the restoring element 94 can be easily positioned on the base 98 before the axial element 92 is pushed through the restoring element 94 and received by the receptacle of the base 98, which in particular has two arms.

[0153] Furthermore, the mounting of the base 98 for the first spring arm 96 of the return element 94 advantageously allows for adjustment of the direction in which the second spring arm of the return element 94 (not shown in the figures) projects from the return element 94 or from the axial element 92 when mounted on the pressure section 80. This facilitates easy adjustment of the mounting of the pivot joint 90 on the pressure section 80, whereby the second spring arm of the return element 94 is inserted into the spring arm receptacle 85. Furthermore, the mounting is adjustable so that the pivot joint 90 with the axial element 92 can be advantageously attached without preload to the mounting area 86 of the pressure section 80, and the base 98, particularly after the axial element 92 has been attached to the pressure section 80, can be attached without preload to the mounting area 22 of the insert section 20 or the frame section 30.In particular, the base 98 can be attached without preload to the mounting area 22 of the insert section 20 or the frame section 30, especially in a relative position between pressure section 80 and insert section 20 or frame section 30, which corresponds to the open state of the test contactor 1.

[0154] A maximum open position of the open state between pressure section 80 and insertion section 20 or between pressure section 80 and frame section 30 can be set, for example, by a mutual stop between pressure section 80 and insertion section 20 or between pressure section 80 and frame section 30.

[0155] As in the Fig. 12 and Fig. As shown in Figure 13, the fastening area 22 for the base 98 can, in particular, have a step 23, especially if the fastening area 22 has a step 23 on both sides in the width direction B. The step 23 or the step 23 on both sides comprises, in particular, a section set back in the height direction H, through which the base 98 can be arranged at least partially in a form-fitting manner on the fastening area 22, especially if it can be arranged in a form-fitting manner on one side in the longitudinal direction L, and / or in a form-fitting manner on both sides in the width direction B.

[0156] This advantageously facilitates and improves the positioning of the base 98 for assembly, especially for pre-tension-free assembly, on the fastening area 22 for the base 98.

[0157] As in Fig. As illustrated in Figure 13, the fastening area 22 for the base 98 and the base 98 can include corresponding fixing means to ensure simple and, in particular, pre-tension-free fixing of the base 98 to the fastening area 22 for the base 22.

[0158] The mounting area 22 for the base 98 and the base 98 itself can, in exemplary embodiments, be fixed by positive locking and / or friction locking, for example by means of screws, by means of self-retaining clips, by means of cotter pins, by means of frictionally engaging bolts, by means of a bayonet fitting, or similar. In alternative embodiments, the mounting area 22 for the base 98 and the base 98 itself can be fixed by material locking, for example by means of gluing or welding, or similar.

[0159] In exemplary embodiments, and as in Fig. As illustrated in Figure 13, the base 98 can be fixed to the mounting area 22 for the base 98, in particular by means of one or more screws. If the mounting area 22 has the step 23, or the step 23 on both sides in the width direction B, a single screw or other single fixing means may advantageously suffice to fix the base 98 to the mounting area 22 for the base 98, since the positive locking advantageously limits or prevents rotation of the base 98 relative to the mounting area 22 for the base 98. If the base 98 is fixed by means of several fixing means, for example by means of several fixing means spaced apart from each other in the width direction B, for example by means of two screws spaced apart from each other in the width direction B, rotation of the base 98 relative to the mounting area 22 for the base 98 can advantageously be prevented.This makes it advantageous to adjust the pivot axis SA of the printing section 80 relative to the insertion section 20, and to adjust testing using the test contactor 1 with advantageous repeatability.

[0160] By pivoting the second spring arm (not shown) of the restoring means 94 with the pressure section 80, when pivoting the pressure section 80 into the closed state of the test contactor 1, relative to the first spring arm 96 of the restoring means 94, which is fixed in particular on the base 98 and / or on the mounting area 22 of the insertion section 20 or the frame section 30, a restoring force can advantageously be provided by the restoring means 94, which increases with increasing pivoting of the pressure section 80 into the closed position of the test contactor 1.

[0161] The restoring means 94 can in particular comprise a spring, such as a coil spring, which is arranged around the axial element 92. The spring can in particular comprise a first spring arm 96 and a second spring arm (not shown), each of which projects or extends substantially tangentially from the axial element 92. The first spring arm 96 is in particular a spring arm 96 facing the insertion section 20 or the frame section 30, which is configured to come into contact with or be received in the insertion section 20 or the frame section 30, and which is in particular configured to be fixed to the insertion section 20.The second spring arm is in particular a spring arm facing the pressure section 80, which is designed, in particular in the area of ​​the spring arm receptacle 85, to come into contact with the pressure section 80 or to be received therein, in order to move with the pressure section 80 in accordance with the in particular pivoted position of the pressure section 80.

[0162] The restoring means 94 advantageously allows a predetermined force to be set for bringing the test contactor 1 into the closed state, and in particular into the test state, which further advantageously prevents the test contactor 1 from accidentally or unintentionally closing, thereby in turn advantageously protecting the contact elements 8.

[0163] It is understood that the fastening areas 22, 86 for the pivot joint 90 can be configured, in particular in reverse, on the pressure section 80 and on the insertion section 20 or frame section 30. It is further understood that the pressure section 80 and the insertion section 20 can be connected by means of other pivot joints, in particular by means of other returnable pivot joints, than the one described in particular in Fig. The swivel joint shown in 14c can be pivotally coupled to each other at 90 degrees.

[0164] The swivel joint 90, which is particularly capable of self-returning, as in particular in Fig. Figure 14c illustrates, but advantageously allows for preload-free mounting on the test contactor 1, in particular on the pressure section 80 and on the insertion section 20.

[0165] As in the Fig. 1, Fig. 2, Fig. 3, Fig. 4, Fig. 12, Fig. 13, Fig. 14a and Fig. As shown in Figure 14b, in exemplary embodiments, one of the insertion section 20 and the pressure section 80, in particular one of the frame section 30 and the pressure section 80, can have a projection 24 which is configured to engage in a groove 84 of the other of the insertion section 20 or frame section 30 and the pressure section 80. The engagement of the projection 24 in the groove 84 can, in particular, include engagement both in the open state and in the closed state of the test contactor 1.

[0166] The projection 24 can, in particular, project substantially in the vertical direction H of the insertion section 20, especially towards the pressure section 80, if the projection 24 is arranged or formed on the insertion section 20 or on the frame section 30. The projection 24 can be formed integrally with the insertion section 20, the frame section 30, or the pressure section 80, or can, in particular, comprise a bolt or a similar pin-shaped element.

[0167] The groove 84 can, in particular, comprise an opening facing the hinge joint 90 in the longitudinal direction L, L' on the insertion section 20 or on the pressure section 80. The groove 84 can extend substantially in the vertical direction H of the insertion section 20 if the groove 84 is arranged or formed on the insertion section 20, or it can extend substantially in the thickness direction H' of the pressure section 80 if the groove 84 is arranged or formed on the pressure section 80.

[0168] The projection 24 and the groove 84 can be arranged or configured to be spaced apart from a hinge joint 90, particularly in a direction that is essentially parallel to the pivot axis SA. In exemplary embodiments, the projection 24 and the groove 84 can be arranged between two pivot joints 90, particularly in a direction that is essentially parallel to the pivot axis SA of several pivot joints 90.

[0169] The projection 24 and the groove 84, through their mutual engagement, facilitate the assembly of the test contactor 1, for example, by allowing the pressure section 80, with the pivot joint(s) 90 attached to the pressure section 80 without preload, to be positioned on the insertion section 20 or on the frame section 30 of the insertion section 20 such that the projection 24 and the groove 84 engage. Subsequently, the base 98 of one or more pivot joints 90 can be easily attached to the mounting area 22 for the base 98.

[0170] The projection 24 and the groove 84 therefore advantageously provide an assembly aid, in particular an assembly guide.

[0171] Furthermore, in the exemplary case of a test contactor 1 with a single pivot joint 90, the projection 24 and the groove 84 can advantageously form a pivot guide, which in turn advantageously improves the repeatability of the tests carried out with the test contactor 1.

[0172] As in the Fig. 1, Fig. 2, Fig. 3, Fig. 5, Fig. 6, Fig. 7, Fig. 15 and Fig. As shown in Figure 16, the pressure section 80 can, in particular, have one or more pressure elements 81, which are attached to the pressure section 80 by means of one or more fixing means 83. The fixing means 83 advantageously allow the pressure element 81 to be inclined relative to the insertion section 20 when transitioning to the closed state and, in particular, to the test state, for example, to ensure uniform and, in particular, planar contact of a test element 10 arranged on the test area 5. The pressure element 81 can, in particular, be pre-tensioned towards the fixing means 83 by means of one or more pre-tensioning means 82 of the pressure section 80, so that the pressure element 81 reliably assumes an orientation or inclination specified by the fixing means 83.

[0173] This advantageously ensures uniform contact, particularly protecting contact elements 8, through the pressure section 80.

[0174] In alternative embodiments, the pressure section 80 can be formed essentially in one piece, and in particular in one piece with a pressure element 81 that projects towards the test element 10 in the test state. This makes the pressure section 80 advantageously easy to manufacture.

[0175] As in the Fig. As shown in Figures 1 to 3, 5, 6, 7, 12, 13, 15 and 16, the insert section 20 can comprise one or more inserts 40 which can be attached to a frame section 30, in particular detachably attached.

[0176] What next in the Fig. 5 and Fig. As illustrated in Figure 15, the insert 40 comprises a plurality of contact elements 8, which, without being limited to this, can be designed in particular as spring contact pins. The contact elements 8 of an insert 40 are configured to electrically contact a test element 10 in the test state of the test contactor 1. The electrically conductive contact can be established by the contact elements 8, for example, with a test station or with a printed circuit board 2.

[0177] In Fig. 3. Five test elements 10 are shown as examples, one test element 10 is shown partially, and one insertion 40 is shown to which no test element 10 is arranged or attached.

[0178] As exemplified in the sectional views in the Fig. 5, Fig. 6, Fig. 7, Fig. 15 and Fig. As illustrated in Figure 16, the insert 40 can have a test area 5 on its upper side in the vertical direction H, where the test element 10 can be positioned to make electrically conductive contact with the contact elements 8, which are arranged on or in the insert 40. The test area 5 can, in particular, be a region bounded in the vertical direction H, H' between the insert 40 and the pressure section 80 or between the insert 40 and the pressure element 81, where the test element 10 can be positioned and, in particular, inserted.

[0179] In the test state of the test contactor 1, in particular when the clamping means 100 is engaged with the complementary clamping means 32, the test contactor 1 is designed to press the test element 10 against the insert 40 by means of the pressure section 80, in particular by means of the pre-tensioned pressure element 81, in particular against the contact elements 8 of the insert 40, so that the test element 10 is or becomes electrically conductively contacted with the contact elements 8.

[0180] As especially in the Fig. 5, Fig. 6, Fig. 7, Fig. 8a, Fig. 8b, Fig. 9b, Fig. 9c, Fig. 10, Fig. 11a, Fig. 11b, Fig. 11c, Fig. 15 and Fig. As shown in Figure 16, the insert 40 can in particular be designed in multiple parts and may have at least one insert element 50, one or more fastening means 42, and a base section 60.

[0181] The insert element 50 can be attached to the base section 60, in particular by means of one or more fastening means 42. The fastening means 42 can in particular be an elastically resilient fastening means 42.

[0182] The base section 60, as in particular in Fig. As illustrated in 15, it can be attached to the frame section 30 of the insert section 20 by means of a connecting means 69, in particular it can be detachably attached.

[0183] The insert element 50 is, in particular, a part of the insert 40 facing the test element 10 in the test state of the test contactor, i.e., in particular, an upper part of the insert 40 in the top-bottom direction H. The base section 60 is, in particular, a part of the insert 40 facing away from the test element 10 in the test state of the test contactor, i.e., in particular, a lower part of the insert 40 in the top-bottom direction H.

[0184] The base section 60 can be configured, in particular, to receive the insert element 50 section by section. The base section 60 can, for example, be trough-shaped. The base section 60 can be configured, in particular, to receive the insert element 50 between opposing side surfaces 57 of the base section 60, especially side surfaces 57 of the base section 60 that are essentially opposed to each other in the longitudinal direction L and / or essentially in the lateral direction B, at least section by section.

[0185] The insert element 50 can, for example, be trough-shaped, in particular be trough-shaped complementarily to the base section 60, in particular such that the mutually facing side surfaces 55, 57 of the insert element 50 and the base section 60 adjoin each other, and, for example, have a spacing in the adjacent direction of less than about 2 mm, in particular of less than about 1.4 mm, and furthermore, in particular of less than about 1 mm, for example, in the range of about 0 mm to about 2 mm, in particular in the range of about 0.2 mm to about 1.4 mm, and furthermore, in particular in the range of about 0.2 mm to about 1 mm.

[0186] Thus, the insert element 50 can advantageously be guided through the base section 60, in particular essentially in the top-bottom direction H. This allows the insert element 50 to advantageously form a guide for the contact elements 8 that is movable in the top-bottom direction H, and accordingly a support and / or protection for the contact elements 8.

[0187] As particularly through the Fig. 8a, Fig. 8b, Fig. 9a, Fig. 9b, Fig. 9c and Fig. As illustrated in Figure 10, the insert 40 can, in particular, have an elastically resilient fastening element 42. Specifically, the insert 40 can have only a single fastening element 42 to attach the insert 50 to the base section 60. This makes it advantageously easy to mount and dismount the insert 50 on the base section.

[0188] The insert element 50 can, in particular, comprise several holes 51 configured to partially surround the contact elements 8, especially to partially surround an upper end of the contact elements 8. The base section 60 can, in particular, comprise several holes 61 configured to receive the contact elements 8. The holes 61 of the base section 60 and the holes 51 of the insert element 50 are, in particular, arranged or configured to be substantially aligned with each other in the top-bottom direction H.

[0189] The holes 51, 61 in the insert element 50 and the base section 60 advantageously support and, in particular, protect the contact elements 8, thus advantageously improving the service life of the contact elements 8 and, consequently, of the test contactor 1. The holes 51, 61 can, in particular, be arranged or formed continuously in the insert element 50 or in the base section 60, and, in particular, extend substantially parallel to the top-bottom direction.

[0190] As through the Fig. 8b, Fig. 9b, Fig. 9c and Fig. As illustrated in Figure 10, the insert element 50 can have a translational degree of freedom, essentially in the up-down direction H, relative to the base section 60 by means of the fastening means 42. The translational degree of freedom, essentially in the up-down direction H, can be limited, in particular, by means of the fastening means 42, as shown in the example in Figure 10. Fig. The limit position shown in 9b is illustrated, in which a stop section 47 of the fastening means 42 is in contact with or abuts a complementary stop 63 of the base section 60.

[0191] The fastening element 42 can, in particular, have a substantially circular stop section 47, from which an engagement section 43 extends in the top-bottom direction H. The stop section 47 can, in particular, have a larger cross-section or diameter than an opening 62 of the base section 60 in the region of the complementary stop 63 of the base section 60. In other words, the complementary stop 63 of the base section 60 can, in particular, provide a positive fit for the stop section 47 of the fastening element 42, especially a positive fit substantially in the top-bottom direction H, so that the translational degree of freedom of the insert element 50 is advantageously limited.

[0192] The insert element 50 can in particular have a shoulder 56 in order to engage with the engagement section 43 of the fastening means 42 in a state attached to the base section 60.

[0193] In exemplary embodiments, the insert element 50 can in particular have a collar 54 which extends substantially in a hollow cylindrical shape in the top-bottom direction H, and in particular extends substantially downwards in the top-bottom direction H from the insert element 50. The collar 54 can in particular have a smaller outer diameter than the inner diameter of the opening 62 of the base section 60 in the region of the complementary stop 63 of the base section 60. This makes it advantageously easy to pre-assemble the insert element 50 with the collar 54 on the base section 60, which further facilitates connection with the fastening means 42.

[0194] The collar 54 can in particular have the shoulder 56 for the engagement of the engagement section 43 of the fastening means 42.

[0195] In exemplary embodiments, the shoulder 56 can be arranged or formed in a central section of the collar 54 along the top-bottom direction H. This allows the fastening element 42 to advantageously engage in the insert element 50, and in particular in the collar 54 of the insert element 50, without projecting upwards from the collar 54 in the top-bottom direction H, thereby ensuring an advantageously large test area 5 for a test element 10.

[0196] The fastening element 42 can be rotatably engaged with the insert element 50, i.e., rotatably about the central axis of the opening 52 of the insert element 50. This advantageously simplifies the connection of the insert element 50 with the fastening element 42. In other words, the connection between the insert element 50 and the fastening element 42 can, in particular, have one rotational degree of freedom, specifically one rotational degree of freedom substantially about the central axis z of the opening 52 of the insert element 50.

[0197] The rotational degree of freedom of the insert element 50 relative to the fastening element 42 can be restricted or blocked, at least for the insert element 50 or only for the insert element 50, particularly by mutually facing side surfaces 55, 57 of the insert element 50 and the base section 60. This allows the fastening element 42 and its connection with the insert element 50 to be advantageously designed simply, wherein the fastening element 42 forms a limitation of one translational degree of freedom of the insert element 50, and the base section 60, advantageously independently, forms a limitation of one rotational degree of freedom of the insert element 50.

[0198] The insert element 50 and / or the base section 60 can have an opening 52, 62, which is arranged or formed essentially at the geometric center Z of the insert element 50 or the base section 60, respectively. This allows the insert element 50 to be advantageously guided uniformly through the fastening means 42 and the adjacent side surfaces 57 of the base section 60, in particular essentially in the top-bottom direction H.

[0199] The fastening means 42 can in particular have several spring arms 44 which extend essentially in the top-bottom direction H from the stop section 47 of the fastening means 42, for example two, three, four, five, six, or more spring arms 44.

[0200] The spring arms 44 each have a projection 45 that extends essentially perpendicularly outwards from the central axis z, in particular to engage with the shoulder 56 of the insert element 50. In the engaged state of the respective spring arm 44, the spring arm 44 is in a relaxed or elastically restored state. By deforming the spring arms 44 towards the central axis z, the fastening element 42 can be detached from the insert element 50.

[0201] The spring arms 44 of the fastening means 42 can be separated from one another, in particular by a recess 46, wherein the recess 46 separates the spring arms 44 substantially along the top-bottom direction H. The recess 46 can additionally or alternatively include a central hole through the fastening means 42, so that the spring arms 44 are arranged at least partially opposite one another, particularly with respect to a central axis z through the hole or through the recess 46.

[0202] In exemplary embodiments, the fastening means 42 can in particular comprise exactly two opposing spring arms 44, whereby the fastening means 42 can advantageously be easily connected to and detached from the insert element 50.

[0203] As especially in the Fig. 6 and Fig. As shown in Figure 10, the use of 40 can include one or more prestressing devices 58.

[0204] The prestressing device(s) 58 can be arranged or received at least partially in the base section 60 of the insert. Furthermore, the prestressing device(s) 58 can be configured, in particular, to prestress the insert element 50 away from the base section 60, i.e., to prestress the insert element 50 essentially upwards in a top-bottom direction. The prestressing device(s) 58 can be configured, in particular, to prestress the insert element 50 upwards or towards the test element 10 in the test condition such that the insert element 50, in the open state, is in the upper limit position defined by the fastening device 42, as is particularly evident in Fig. 9b is shown, arranged.

[0205] This allows the contact elements 8 to be advantageously supported and protected by the insert element 50 in the open state of the test contactor 1, for example by the holes 51 of the insert element 50 surrounding the contact elements 8 at least partially, and / or by the insert element 50 projecting upwards further than the upper ends of the contact elements 8 arranged on the insert 40.

[0206] When the test contactor 1 is pivoted from the open state to the closed state or to the test position, the test element 10, pressed by the pressure section 80 or the pressure element 81 of the pressure section 80, advantageously first comes into contact with the insert element 50. Only through further pressure towards the closed state or to the test position does the test element 10, by pressing the pressure section 80 or the pressure element 81, come into contact with the contact elements 8. This advantageously reduces the initial pressure on the contact elements 8. Furthermore, accidental or unintentional direct contact with the contact elements 8 in the open state of the test contactor 1 is advantageously prevented, and the contact elements 8 are thus protected.

[0207] The preloading means 58 can, in particular, be elastically restorable preloading means 58 and, for example, comprise one or more springs, especially coil springs, and / or one or more elastomeric elements. In exemplary embodiments, the preloading means 58 can be arranged distributed around the geometric center Z of the insert 40 or around the geometric center Z of the insert element 50.

[0208] This allows the insert element 50 to be advantageously arranged on the insert 40 facing the test element 10 with preload, in particular to be arranged on the insert 40 with preload uniformly facing the test element 10.

[0209] As especially in the Fig. 8a, Fig. 8b, Fig. 10, Fig. 11a, Fig. 11b and Fig. As shown in Figure 11c, the insert 40 can comprise several openings 67 or coding openings 67. The coding openings 67 are designed in particular to be fitted with at least one pin 68, especially such that the at least one pin 68 is partially received in a coding opening 67 and partially projects upwards in the top-bottom direction H, in particular facing the test element 10 in the test state.

[0210] By installing or arranging one or more pins 68 in the multiple coding openings 67, the insert 40, and in particular the insertion section 20, can have a test element-specific coding. In other words, the coding is formed by one or more projections or by a coding pattern of projections formed by the one or more pins 68 arranged in the coding openings 67.

[0211] The Fig. 11a, Fig. 11b and Fig. Figure 11c shows exemplary codings or coding patterns using a pin 68 arranged in a coding opening 67. The ones in the Fig. 11a, Fig. The exemplary codings shown in 11b and 11c can be combined with each other to form further codings or coding patterns. In particular, more than one pin 68, and especially different pins 68, can be arranged in the coding openings 67.

[0212] In Fig. Figure 3 shows examples of some codings 14 or coding recesses 14 of a test element 10 or of a test module 12, on which several test elements 10 are arranged. For clarity, only some of the codings 14 or coding recesses 14 in the figures are labeled with reference symbols.

[0213] What's next in Fig. As shown by way of example in Figure 3, the coding openings 67 of the inserts 40 can be fitted with a pin 68, in particular with different pins 68. By fitting several coding openings 67 with different pins 68, for example by means of pins 68 of different cross-sections or diameters, the insert 40 or the insertion section 20 can have a coding for a test element 10 or a test module 12 on which several test elements 10 are arranged. By means of the different pins 68, the insert 40 or the insertion section 40 can have a coding for a test element 10 or for a test module 12 which prevents the attachment or insertion of a test element 10 or test module 12 in a twisted position in the plane, i.e., for example, prevents it from being rotated by 180° about a substantially parallel to the vertical direction H, and / or which prevents the attachment or insertion of a test element 10 or test module 12 in a twisted position in the plane.Test module 12 is prevented from being turned upside down, i.e., rotated by 180° to be essentially parallel to the width direction B.

[0214] This advantageously prevents incorrect insertion of test elements 10 and / or test modules 12, thereby further improving the test accuracy of the test contactor 1 and the durability of the contact elements 8, and correspondingly of the test contactor 1, since a potentially undesirable or even harmful insertion and contacting of the contact elements 8 by the protruding pins 68 is prevented.

[0215] The coding openings 67 can in particular be arranged on a coding section 66 of the base section 60, in particular on coding sections 66 of the base section 60 that are essentially opposite each other in the longitudinal direction L.

[0216] In exemplary embodiments, the coding openings 67 can be arranged or designed asymmetrically with respect to a parallel to the width direction B on the insert 40, i.e., asymmetrically with respect to a mirror axis parallel to the width direction B and passing through the center Z.

[0217] This allows a coding to be advantageously provided by a single pin 68, which prevents the attachment or insertion of a test element 10 or test module 12 upside down, i.e., which prevents the attachment or insertion of a test element 10 or test module 12, for example, rotated by 180° about an essentially parallel to the width direction B.

[0218] In further exemplary embodiments, the coding openings 67 can be arranged or formed asymmetrically with respect to a point symmetry on the insert 40, i.e., asymmetrically with respect to an axis of symmetry running along the central axis z or asymmetrically with respect to a point conceived on the central axis z that lies in a plane of the coding sections 66 of the base section 60.

[0219] For example, the insert 40 can include coding sections 66 opposite each other in the longitudinal direction L, an even number of coding openings 67 on one side, and an odd number of coding openings 67 on the other side.

[0220] By appropriately asymmetrically placing or arranging pins 68 in the coding openings 67 which are arranged or formed asymmetrically with respect to point symmetry, it is advantageous to prevent the attachment or insertion of a test element 10 or test module 12 in a twisted position in the plane, i.e., for example, to prevent the attachment or insertion of a test element 10 or test module 12 rotated by 180° about a substantially parallel to the height direction H.

[0221] In exemplary embodiments, pairs of coding openings 67 arranged opposite each other in the longitudinal direction L can have the same cross-section or diameter. This advantageously ensures the simple formation of a coding pattern or a coding facing the test element 10, for which, for example, one pin 68 or a plurality of pins 68 of the same predetermined diameter or cross-section suffices.

[0222] In further exemplary embodiments, coding openings 67, which are arranged on the same coding section 66, i.e., are not arranged opposite each other in the longitudinal direction L, can have different cross-sections or diameters. This advantageously enables the reliable formation of a coding pattern or a coding facing the test element 10, which prevents incorrect arrangement or insertion of a test element 10 or test module 12.

[0223] As through the Fig. 8a, Fig. 8b, Fig. 10, Fig. 11a, Fig. 11b and Fig. As further shown in Figure 11c, the insert 40 can, in particular, have fixing means 70, especially if the base section 60 of the insert 40 is formed in multiple parts, and in particular has a base section 64 extending upwards and downwards in the direction H and a base section 65 extending downwards in the direction H. The fixing means 70 can, but are not limited to, include in particular holes, positioning means such as bolts, and screw connections.

[0224] This allows the upper and lower base sections 64, 65 to be easily manufactured, and in particular the opening 62 in the base section 60 for the upper and lower base sections 64, 65 to be easily introduced or manufactured.

[0225] In alternative embodiments, the base section 60 can be formed essentially in one piece. This advantageously allows for precise and, in particular, simple production of a continuous alignment of the holes 61 for receiving the contact elements 8.

[0226] As in the Fig. 1, Fig. 2, Fig. 4, Fig. 5, Fig. 6, Fig. 7, Fig. 12, Fig. 13, Fig. 15 and Fig. As shown in Figure 16, the test contactor 1 can in particular comprise a support element 110, especially a support element 110 as shown in the Fig. 17a, Fig. 17b and Fig. 17c shown.

[0227] The test contactor 1 can, in particular in the transport state of the test contactor 1, in the open state of the test contactor 1, in the closed state of the test contactor 1, and / or in the test state of the test contactor 1, comprise one or more support elements 110.

[0228] The transport state of the test contactor 1 is, in particular, a state in which the support element 110 is arranged on the test contactor 1, and in particular in which the support element 110 is connected to the insertion section 20, especially from below in the top-bottom direction H. The transport state of the test contactor 1 is furthermore, in particular, configured in such a way that no printed circuit board 2 is arranged between the insertion section 20 and the support element 110, or no printed circuit board 2 is arranged on the test contactor 1.To ensure safe transport of the test contactor 1 in the transport state, the transport state can in particular include a closed state of the test contactor 1, i.e. a state in which the pressure section 80 is pivoted towards the insertion section 20, in particular pivoted such that the clamping means 100 and the complementary clamping means 32 of the pressure section 80 and the insertion section 20 are engaged.

[0229] Alternatively, the test contactor 1 can also be transported in the open state, for example stacked in the open state.

[0230] The test state of the test contactor 1 is, in particular, a state in which the support element 110 is arranged on the test contactor 1, and in particular in which the support element 110 is connected to the insertion section 20, especially from below in the top-bottom direction H. The test state of the test contactor 1 is furthermore, in particular, configured in such a way that a test element 10 is arranged on the insertion section 20, the test contactor 1 is in the closed state, and optionally a printed circuit board 2 is arranged between the insertion section 20 and the support element 110.

[0231] The support element 110 can comprise one or more projecting sections 112, which extend from a side of the support element 110 facing the insertion section 20, essentially in the top-bottom direction H. The projecting section(s) 112 can be arranged or formed in the longitudinal direction L, particularly centrally, on the support element 110. On the outer side in the longitudinal direction L, the support element 110 can, in particular, have one or more fastening means 115, which, for example, can be at least partially received in the support element 110. The fastening means 115 can, in particular, be received in the support element 110 such that, in the test condition, none of the fastening means 115 projects downwards in the top-bottom direction H from the support element 110. This advantageously allows the test contactor 1 to be positioned securely on a work surface.

[0232] The support element 110 can comprise one or more recessed sections 114, which are recessed on a side of the support element 110 facing the insertion section 20, essentially in the top-bottom direction H, and in particular recessed relative to the one or more projecting section(s) 112.

[0233] Projecting sections 112 and recessed sections 114 can, in exemplary embodiments, be configured in an alternating fashion. Accordingly, the support element 110 can provide one or more cavities 116, particularly between the projecting sections 112, and especially on a side facing the insertion section 20 or the insert 40 of the insertion section 20. The cavities 116 are areas bounded, in particular from below, essentially in the top-bottom direction H by the support element 110, especially by the recessed section(s) 114. In other words, the cavities 116 are areas protected, in particular by the support element 110. Optionally, the cavities 116 can also be bounded, in particular laterally, essentially in the longitudinal direction L and / or in the lateral direction B, by the support element 110, especially by the projecting section(s) 112.

[0234] The alternating arrangement of the projecting sections 112 and the recessed sections 114 advantageously creates a labyrinthine protective barrier on the lower side of the insert section 20 or the insert 40 in the top-bottom direction H. This labyrinthine barrier is configured in particular to prevent direct access to the contact elements 8 from below, and especially to make direct access to the contact elements 8 from a downward angle more difficult or impossible.

[0235] In exemplary embodiments, the projecting sections 112 can be arranged on the support element 110 such that they do not align with the contact elements 8 in the top-bottom direction H. In particular, the projecting sections 112 can be arranged on the support element 110 such that they abut an alignment of the contact elements 8 in the top-bottom direction H in the longitudinal direction L and / or in the lateral direction B.

[0236] This advantageously prevents the contact elements 8 from being pressed by the support element 110 during transport. Furthermore, during testing, it advantageously ensures support for the insert 40, and in particular for a printed circuit board 2 arranged below the insert 40, which is pressed by the contact elements 8 during testing and may be subjected to bending stress and, in particular, bent. Thus, the support element 110 is advantageously functionally integrated and can advantageously improve the service life of the contact elements 8, the printed circuit board 2, and especially the test contactor 1.

[0237] The support element 110 can have one or more stepped contours 118, in particular at at least two spaced-apart locations of the support element 110, especially on two longitudinally L outer sections of the support element 110. The stepped contour(s) 118 can project towards the insertion section 20, in particular on a side facing the insertion section 20 in the transport and test conditions. The insertion section 20, and in particular the frame section 30 of the insertion section 20, can have stepped sections 34 complementary to the one or more stepped contours 118, in particular on a top-bottom H lower side of the insertion section 20.

[0238] The one or more stepped contours 118 together with the stepped sections 34 advantageously enable a positive locking and therefore particularly secure positioning of the support element 110 relative to the insertion section 20 during assembly, and accordingly facilitates the assembly of the test contactor 1 for the transport condition.

[0239] The support element 110 can further comprise one or more fastening means 115 for attachment to the insert section 20, in particular for attachment to the frame section 30 of the insert section 20. The fastening means 115 can, for example, comprise a screw connection, a retractable clip, and / or a friction-fit bolt. The fastening means 115 can, in particular, be at least partially incorporated in the support element 110 and, in particular, be arranged in the top-bottom direction H below the stepped contours 118. In exemplary embodiments, the fastening means 115 can be arranged in the support element 110 in a captive manner, for example by means of a projection, a retaining ring, a locking pin, or the like.

[0240] Fig. 18a and Fig. Figure 18b shows a flowchart of a use of an insert 40 according to one embodiment.

[0241] The use of an insert 40, as exemplified in the flowchart in Fig. As set out in 18a, this may in particular include the following steps: S10: Deployment of Unit 40; S20: Detaching the fastener 42 from the insert element 50; and S30: Removing the insert element 50 from the base section 60.

[0242] Steps S10, S20, and S30 can be performed in precisely this order. The use of insert 40 can refer specifically to an insert 40 as described herein and as particularly relevant in connection with the Fig. 1, Fig. 2, Fig. 3, Fig. 5, Fig. 6, Fig. 7, Fig. 8a, Fig. 8b, Fig. 9a, Fig. 9b, Fig. 9c, Fig. 10, Fig. 11a, Fig. 11b, Fig. 11c, Fig. 15 and Fig. 16 shown and described.

[0243] Following step S30, insert 40 can be used, for example: - include a step of adjusting and / or setting and / or replacing one or more preload devices 58; and / or - include a step of adjusting and / or setting and / or replacing one or more contact elements 8.

[0244] Furthermore, the use of the insert 40 may include a step of attaching another insert element 50 to the base section 60 by means of the fastening means 42, or a step of reattaching the insert element 50 to the base section 60 by means of the fastening means 42.

[0245] This makes the use of 40 advantageously adjustable for a test element 10 in an application-specific manner, advantageously adjustable for a specific test, for example for a test with predetermined force and / or pressure profile, and advantageously allows one or more contact elements 8 to be easily exchanged.

[0246] The use of an insert 40, as exemplified in the flowchart in Fig. As set forth in 18b, the following steps may in particular include: S110: Deployment of Unit 40; and S120: Arranging one or more pins 68 in at least one opening 67 of the plurality of openings 67 to form a coding facing the test element 10 in the test state.

[0247] Steps S110 and S120 can be performed in precisely this order. The use of insert 40 can refer specifically to an insert 40 as described herein and as particularly relevant in connection with the Fig. 1, Fig. 2, Fig. 3, Fig. 5, Fig. 6, Fig. 7, Fig. 8a, Fig. 8b, Fig. 9a, Fig. 9b, Fig. 9c, Fig. 10, Fig. 11a, Fig. 11b, Fig. 11c, Fig. 15, Fig. 16 and Fig. 18a shown and described.

[0248] Following step S120, insert 40 can be used, for example: - a step of removing one or more of the pins 68 from at least one opening 67 of the plurality of openings 67, to form a further coding facing the test element 10 in the test state, which is different from the previous coding; and / or - a step of arranging one or more of the pins 68 in at least one opening 67 of the plurality of openings 67, to form a further coding facing the test element 10 in the test state, which is different from the previous coding.

[0249] This makes the insert section 20 or the insert 40 advantageously adjustable for a test element 10 or for a test module 12, whereby it is advantageously possible to prevent an incorrect arrangement of the test element 10 or the test module 12, which has a predetermined coding by means of one or more coding recesses 14, on the insert section 20 or on the insert 40.

[0250] Fig. Figure 19 shows a flowchart of a process for manufacturing a test contactor 1.

[0251] The procedure for manufacturing a test contactor 1, as exemplified in the flowchart in Fig. 19, as reproduced, may in particular include the following steps: S210: Providing an insertion section 20 with a pressure section 80 which is pivotably mounted on the insertion section 20, wherein the insertion section 20 comprises a test area 5 to which the electrically conductive test element 10 can be attached, and which comprises contact elements 8 which are designed to electrically contact the electrically conductive test element 10 in the test state of the test contactor 1, wherein the pressure section 80 is designed to press the electrically conductive test element 10 against the multiple contact elements 8 in the test state of the test contactor 1; S220: Providing a support element 110; and S230: Connecting the support element 110 to the insert section 20 in such a way that the support element 110 forms a protection for the contact elements 8.

[0252] Steps S210, S220, and S230 can be performed in precisely this order. The fabrication of test contactor 1 can refer specifically to a test contactor 1 as described herein and as particularly evident in connection with the Fig. Items 1 to 7, 12, 13, 15 and 16 are shown and described.

[0253] Step S230 of connecting the support element 110 with the insert section 20 can be carried out in particular such that no printed circuit board 2 is arranged between insert section 20 and support element 110, or such that no printed circuit board 2 is arranged contacting the contact elements 8 at the test contactor 1.

[0254] The test contactor 1 produced in this way represents, in particular, a test contactor 1 in its transport state. The transport state can, in particular, be a closed state of the test contactor 1. The transport state of the test contactor 1 can also be a state of the test contactor 1 in which no test element 10 is arranged on the insertion section 20 and / or no printed circuit board 2 is arranged on the insertion section 20.

[0255] The transport state of the test contactor 1, wherein the support element 110 is connected to the insertion section 20, in particular from below in the top-bottom direction H, advantageously represents a state in which the contact elements 8 are protected. The contact elements 8 are protected in such a way that direct access to the contact elements 8, particularly from below, is prevented by the support element 110.

[0256] The connection of the support element 110 to the insertion section 20 in such a way that the contact elements 8 are protected, in particular in the top-bottom direction H from below, need not include a hermetic shielding of the contact elements 8, but in particular includes preventing direct access essentially from below, for example by the hand of a user, or by a tool commonly used for handling test contactors.

[0257] This advantageously protects the contact elements 8. In conjunction with the insert 40 and the insert element 50, which is pre-tensioned upwards in the top-bottom direction H, and / or in conjunction with the closed state of the test contactor 1, wherein the clamping means 100 is engaged with the complementary clamping means 32, the contact elements 8 can also advantageously be protected at the top, and the test contactor 1 can be configured to be advantageously durable.

[0258] Following step S230, the test contactor 1 can be used, in particular, by releasing the support element 110, arranging a printed circuit board 2 on the insertion section 20 such that it makes electrically conductive contact with the contact elements 8, and connecting the support element 110 to the insertion section 20 such that the printed circuit board 2 is supported by the support element 110. This advantageously prepares the test contactor 1 for use in a test with a test element 10 or test module 12 arranged or to be arranged on the insertion section 20, thereby advantageously improving the durability of the printed circuit board 2 and the repeatability of the tests performed with the test contactor 1.

[0259] Fig. 20a and Fig. Figure 20b shows a flowchart of a use of a support element 110 according to one embodiment.

[0260] The use of a support element 110, as exemplified in the flowchart in Fig. 20a, relates in particular to the use of a support element 110 for a test contactor 1 for testing an electrically conductive test element 10 for protecting contact elements 8 of the test contactor 1 during transport.

[0261] The use of support element 110, as in Fig. 20a, as exemplified, may in particular include the following step: S310: Connecting the support element 110 to the test contactor 1 without an intermediate circuit board 2.

[0262] The use of the support element 110 may relate in particular to a test contactor 1 and / or a support element 110, as described herein and as particularly in connection with the Fig. Items 1 to 7, 12, 13, 15, 16 and 19 are shown and described.

[0263] The support element 110 allows the contact elements 8 to be advantageously protected, in particular by connecting the support element 110 from below in the top-bottom direction H with the insert section 20, and in particular essentially from below, thereby further advantageously improving the durability of the contact elements 8 and, accordingly, of the test contactor 1.

[0264] The use of a support element 110, as exemplified in the flowchart in Fig. 20b, may in particular include the following steps: S410: Detaching the support element 110 from the test contactor 1; S420: Positioning a printed circuit board 2 at the test contactor 1; and S430: Connecting the support element 110 to the test contactor 1, such that the circuit board 2 is supported by the support element 110 in a test state of the test contactor 1.

[0265] Steps S410, S420, and S430 can be performed in precisely this order. The use of the support element 110 can refer in particular to an insert 40, as described herein and especially in connection with the Fig. 1 to 7, 12, 13, 15, 16, 19 and 20a are shown and described.

[0266] As shown in the flowcharts in the Fig. 20a and Fig. As highlighted in 20b, the present support element 110 is advantageously designed to be functionally integral both for protecting contact elements 8, particularly in the transport state of the test contactor 1, and for supporting a printed circuit board 2, particularly in the test state of the test contactor 1, wherein a pressure section 80 presses a test element 10 against the contact elements 8, and the contact elements 8 in turn presses against the printed circuit board 2.

[0267] Furthermore, the present support element 110 facilitates the assembly of the test contactor 1 into the test state, since all necessary fastening elements 115 for connecting the support element 110 to the insert section 20 can already be present for connecting the support element 110 in the transport state. Accordingly, loose assembly parts or loose fastening elements 115 can be advantageously avoided.

[0268] Fig. Figure 21 shows a flowchart of a process for manufacturing a test contactor 1.

[0269] The procedure for manufacturing a test contactor 1, as exemplified in the flowchart in Fig. 21, as reproduced, may in particular include the following steps: S510: Providing an insert section 20; S520: Providing a print section 80; S530: Providing at least one pivot joint 90, which comprises an axial element 92, a restoring means 94 and a base 98, wherein the at least one pivot joint 90 is configured to pivotally couple the pressure section 80 to the insert section 20 in a restorable manner, and wherein one of the insert section 20 and the pressure section 80 has at least one mounting area 22, 86 for the axial element 92 of the at least one pivot joint 90, and wherein the other of the insert section 20 and the pressure section 80 has at least one mounting area 22, 86 for the arrangement of the base 98 of the at least one pivot joint 90, the mounting area 22, 86 having two stops 88, 89 for the axial element 92, which are located in the thickness direction H of one of the pressure section 80 and the insert section 20 on opposite sides of the pressure section 80 or insert section 80. 20 are arranged, with the fastening areas 22,86 of the pressure section 80 and the insertion section 20, the axial element 92 and the base 98 are designed in such a way that the axial element 92 and the base 98 can be mounted on the respective fastening area 22, 86 without preload; S540: Arranging the axial element 92 of the at least one pivot joint 90 in the at least one mounting area 22, 86 of the insertion section 20 and the pressure section 80; and S550: Arranging the base 98 of at least one pivot joint 90 on or in the mounting area 22, 86 of the other of the insertion section 20 and the pressure section 80.

[0270] Steps S530, S540 and S550 may alternatively include, in particular: - Providing at least one pivot joint 90, which comprises an axial element 92, a restoring means 94 and a base 98, wherein the at least one pivot joint 90 is configured to pivotally couple the pressure section 80 to the insertion section 20 in a restorable manner, and wherein one of the insertion section 20 and the pressure section 80 has at least one fastening area 22, 86 for the axial element 92 of the at least one pivot joint 90, and wherein the other of the insertion section 20 and the pressure section 80 has at least one fastening area 22, 86 for the arrangement of the base 98 of the at least one pivot joint 90, - preload-free arrangement of the axial element 92 of the at least one pivot joint 90 in the at least one fastening area 22, 86 of the one of the insertion section 20 and the pressure section 80; and - pre-tension-free arrangement of the base 98 of at least one pivot joint 90 on or in the fastening area 22, 86 of the other of the insertion section 20 and the pressure section 80.

[0271] Steps S510, S520, S530, S540, and S550 can be performed in whole or in part, and in particular in this exact order. The fabrication of test contactor 1 can refer in particular to a test contactor 1 as described herein and as particularly in connection with the Fig. 1 to 7, 12, 13, 15, 16, 19, 20a and 20b are shown and described.

[0272] The test contactor 1 produced in this way is, in particular, a test contactor 1 which can advantageously be mounted without preload. In other words, the test contactor 1 produced in this way is, in particular, an easily mountable test contactor 1, especially an easily mountable, restorable test contactor 1, and especially one that protects contact elements 8. Reference symbol list 1 test contactor 2 circuit boards 5 Test area 8 Contact element 10 Test Element 12 Test module 14 Coding or coding exclusion (of the test element) 20 Insert section 22 Mounting area (of the insert section) Level 23 24 mm projection (of the insert section) 30 Frame section 32 complementary clamping device 34 complementary step-like section 40 deployment 42 Fasteners 43 Intervention section 44 Spring arm (of the fastening device) 45 Projection (of the fastener) 46 Exclusion 47 Stop section 50 insert element 51 holes (of the insert element) 52 Opening (of the insert element) 54 collars 55 Side surface (of the insert element) 56 Shoulder 57 Side surface (of the base section) 58 Pre-tensioning devices (of the application) 60 Basic section 61 holes (of the base section) 62 Opening (of the base section) 63 complementary attack (of the base section) 64 upper base section 65 lower base section 66 Coding section 67 Coding opening 68 pens 69 Connecting devices 70 Fixatives 80 Print section 81 Pressure element 82 Pre-tensioning devices (of the compression section) 83 Fixatives 84 Nut 85 Spring arm mount 86 Mounting area (of the pressure section) 87 Opening (of the mounting area) 88 first attack 89 second attack 90° swivel joint 92 Axial element 94 reserve funds 96 first spring arm (of the return mechanism) 98 sockets 100 clamping devices 110 support element 112 Lead section 114 Return section 115 Fasteners (of the support element) 116 Cavity 118 stepped contour B Latitude direction B' Latitude direction (of the print section) H Vertical direction or up-down direction H' Height direction (of the pressure section) or thickness direction (of the pressure section) L Longitudinal direction L' Longitudinal direction (of the pressure section) SA swivel axis S10-S30 Steps for using an insert S110-S120 Steps for using an insert S210-S230 Steps of a procedure for manufacturing a test contactor S310 Step to using a support element S410-S430 Steps for using a support element S510-S550 Steps of a procedure for manufacturing a test contactor z central axis Z Center

Claims

[1] Test contactor (1) for testing an electrically conductive test element (10), the test contactor (1) comprising: - an insertion section (20) comprising a test area (5) to which the electrically conductive test element (10) can be attached, and which comprises contact elements (8) designed to electrically conductively contact the electrically conductive test element (10) in the test state of the test contactor (1); - a pressure section (80) which is pivotally mounted on the insertion section (20) and which is designed to press the electrically conductive test element (10) against the plurality of contact elements (8) in the test state of the test contactor (1), and - a support element (110) which is detachably connected to the insert section (20), -- wherein the support element (110) is designed to form a protection for the contact elements (8) in a transport state of the test contactor (1), in which the support element (110) is connected to the insertion section (20). [2] Test contactor (1) for testing an electrically conductive test element (10) according to claim 1, wherein the support element (110) is designed to support the circuit board (2) in a test state of the test contactor (1) in which a circuit board (2) for electrically conductively contacting the contact elements (8) is sandwiched between the support element (110) and the insertion section (20). [3] Test contactor (1) for testing an electrically conductive test element (10) according to claim 1 or 2, wherein the support element (110) has projection and recessed sections (112; 114) on a side facing the insertion section (20), wherein the support element (110) forms one or more cavities (116) in the region of the contact elements (8) by means of the projection and recessed sections (112; 114) together with the insertion section (20) in the transport state, wherein the one or more cavities (116) are delimited at least in sections by at least one of the support element (110) and the insertion section (20). [4] Test contactor (1) for testing an electrically conductive test element (10) according to claim 3, wherein the projection section(s) (112) of the support element (110) are aligned in the test state of the test contactor with a section of the insertion section (20) in which no contact elements (8) are arranged. [5] Test contactor (1) for testing an electrically conductive test element (10) according to claim 3 or 4, wherein the hollow space(s) (116) are at least partially divided or separated from one another by a projection portion (112). [6] Test contactor (1) for testing an electrically conductive test element (10) according to one of the preceding claims, wherein the support element (110) has a substantially step-shaped contour (118) at two mutually spaced locations, wherein the insertion section (20) preferably has at least partially complementary step-shaped contours (34) which, in the transport state, engage with the substantially step-shaped contours (118) of the support element (110) at the two mutually spaced locations. [7] Test contactor (1) for testing an electrically conductive test element (10) according to one of the preceding claims, wherein the support element (110) is substantially plate-shaped and has a plurality of fastening means (115) for reversible fastening to the insertion section (20). [8] Test contactor (1) for testing an electrically conductive test element (10) according to one of the preceding claims, wherein the contact elements (8) protrude at least partially from the insertion section (20) towards the support element (110). [9] Test contactor (1) for testing an electrically conductive test element (10) according to one of the preceding claims, wherein the insertion section (20) is formed in several pieces, such that the insertion section (20) has a frame section (30) on which the pressure section (80) is pivotally mounted, and has an insert (40) which comprises the contact elements (8) and which is fastened to the frame section (30), wherein the insert (40) is formed in several pieces and has an insert element (50) which is fastened to a base section (60) by means of a fastening means (42) with a translational degree of freedom, wherein the fastening means (42) is arranged captively on the base section (60) of the insert (40) of the insertion section (20) by the support element (110). [10] Method for producing a test contactor (1) for testing an electrically conductive test element (10), comprising the steps: - providing an insertion section (20) with a pressure section (80) which is pivotally mounted on the insertion section (20), -- wherein the insertion section (20) comprises a test area (5) to which the electrically conductive test element (10) can be attached, and which comprises contact elements (8) which are designed to electrically conductively contact the electrically conductive test element (10) in the test state of the test contactor (1), -- wherein the pressure section (80) is designed to press the electrically conductive test element (10) against the plurality of contact elements (8) in the test state of the test contactor, and - providing a support element (110); and - Connecting the support element (110) to the insert section (20) such that the support element (110) forms a protection for the contact elements (8). [11] Use of a support element (110) for a test contactor (1) for testing an electrically conductive test element (10) for protecting contact elements (8) of the test contactor (1) during transport. [12] Use of the support element (110) according to claim 11, comprising the steps: - Detaching the support element (110) from the test contactor (1); - arranging a printed circuit board (2) on the test contactor (1); and - Connecting the support element (110) to the test contactor (1) such that the circuit board (2) is supported by the support element (110) in a test state of the test contactor (1).

Images