TEST ARRANGEMENT AND METHOD FOR DETERMINING AN OPTIMIZED DISTANCE BETWEEN A TEST OBJECT AND AN ANTENNA OF A TEST ARRANGEMENT

Abstract

Shown are a method and a test setup for determining an optimized distance between a test object and an antenna of a test setup.The method involves obtaining initial measurement data, wherein the initial measurement data represent a plurality of far-field measurement results characterizing the test object for a set of frequencies, or wherein the initial measurement data are based on a plurality of far-field measurement results characterizing the test object for a set of frequencies; obtaining second measurement data, wherein the second measurement data represent a plurality of near-field measurement results characterizing the test object for the set of frequencies, or wherein the second measurement data are based on a plurality of near-field measurement results characterizing the test object for the set of frequencies, with at least two of the near-field measurement results being acquired at different distances between the test object and an antenna of the test setup; and determining the optimized distance between the test object and the antenna of the test setup based on the initial and second measurement data.

Description

Technical field

[0001] Exemplary embodiments according to the invention relate to a test setup and a method for determining an optimized distance between a test object and an antenna of a test setup, in particular using near-field and far-field measurement data.

[0002] Exemplary embodiments according to the invention relate to a procedure and an algorithm for defining an optimal (or optimized) distance between a device under test (DUT) and a measuring antenna on an over-the-air (OTA) connector. Background of the invention

[0003] With advances in wireless communication and the increasing use of wireless devices, devices that emit and / or receive electromagnetic fields must be tested accurately and efficiently. The electromagnetic field of a device under test (DUT) has a near field and a far field. The near field of a DUT can be influenced by many factors, such as resonance effects, emitted and / or received wavelengths, antenna design, and the materials (e.g., metal) of a test setup. Consequently, near-field testing can depend significantly on the distance between the DUT and an antenna of the test setup. Determining an optimized distance through simulations requires consideration of many parameters and can be very time-consuming.

[0004] Therefore, there is a need for a test setup that offers a compromise between test accuracy, test complexity, and test efficiency. Brief description of the invention

[0005] One embodiment of the invention relates to a method for determining an optimized (for example, usable or even optimal or ideal) distance between a test object (for example, an antenna-in-package) and an antenna of a test arrangement, wherein the method comprises obtaining initial measurement data (for example, reference far-field data),where the first measurement data represent a plurality of far-field measurement results (for example, power measurement results and / or gain measurement results and / or gain stage measurement results and / or gain compression measurement results and / or phase shift measurement results and / or measurement results for the difference value in a frequency range and / or error vector size measurement results and / or insulation measurement results and / or radiated emissions measurement results and / or adjacent channel power ratio measurement results and / or IP3 measurement results and / or noise figure measurement results) (for example, based on a measurement at a distance between the test object and a measuring antenna that is greater than the Fraunhofer distance (d, F =2D 2 / λ, where D is the largest dimension of a radiator or a diameter of a sphere enclosing the radiator or antenna, and where λ is a wavelength used, for example, a smallest wavelength used, a largest wavelength used, an average wavelength used, or a wavelength at an average frequency used; for example, greater than 10 mm), which characterize the test object for a set of frequencies (for example, for a plurality of frequencies) (which, for example, have ten, eleven, or twelve frequencies) (for example, in a frequency range from 24 GHz to 53 GHz), or wherein the first measurement data are based on a plurality of far-field measurement results that characterize the test object for a set of frequencies. The method further involves obtaining second measurement data (for example, measurement data for different distances x,for the near-field conditions between the test object and the antenna of the test setup) (for example, generated by the antenna of a test setup), wherein the second set of measurement data represents a plurality of near-field measurement results (for example, a plurality of sets of near-field measurement results associated with different distances) (for example, measured at distances between the test object and an antenna of the measurement setup that lies within the "Fraunhofer distance"), which characterize the text object for the set of frequencies (where the antenna of the measurement setup used to obtain the near-field measurement results may be different from, or identical to, the measurement antenna used to obtain the far-field measurement results).or wherein the second set of measurement data is based on a plurality of near-field measurement results (or a plurality of sets of near-field measurement results associated with different distances) (for example, measured at distances between the test object and an antenna of the measurement setup located within the "Fraunhofer distance") that characterize the text object for the set of frequencies. At least two of the near-field measurement results (or at least two sets of near-field measurement results) are acquired at different distances (in 1 mm increments) (in a range of 20 mm to 40 mm) between the test object and an antenna of the test setup (where the antenna of the test setup may be identical to the measurement antenna used to obtain the far-field measurement results, or may be different from the antenna).which is used to obtain the far-field measurement results). The method involves determining the optimized distance between the test object and the antenna of the test setup based on the first and second measurement data (for example, based on a comparison between the first and second measurement data) (for example, taking into account measurement data at different frequencies).

[0006] It was found that the initial measurement data, obtained from far-field measurements, is less affected by factors that cause the measurements to depend so heavily on the distance between the test object and the antenna of the test setup. For example, resonance effects are less pronounced, so initial measurement data provides a less distorted reference for the test object. It was recognized that resonance effects are related to the wavelength of the near field. Obtaining initial measurement data that represents or is based on a range of frequencies therefore provides a reference that allows for covering more frequencies, thus increasing the chance of determining an optimal distance that is less affected by resonance effects.The second set of measurements is obtained from the near field for the set of frequencies. This set of frequencies can be used as a common link between the first and second measurement results, allowing comparison of the far-field measurement reference with the second set of measurements, which represent or are based on near-field measurements. It was recognized that if at least two near-field measurement results are acquired at different distances between the test object and an antenna of the test setup, comparable first and second measurement data for the frequency sets can be obtained for each distance. In this way, the far-field measurement reference enables the determination of an optimized distance from the two (or more) distances for near-field measurements.

[0007] Since the optimized distance can be determined from measurements of the test setup rather than through other means such as simulations, it can be determined without having to consider potential external factors that might have influenced the near-field measurement. This method therefore reduces or eliminates the need for complex and resource-intensive simulations of a standing wave effect to define an optimized distance between the test object (e.g., an AiP-DUT antenna array) and the OTA measurement antenna. The method is less dependent on the test setup and can therefore be used with different types and models of test setups. This allows the test to be performed by different users (e.g., with a different or new test setup) without having to determine device-specific characteristics that could affect the near field.Near-field testing allows for a more compact test setup and facilitates cost-effective and / or high-volume OTA testing at multiple locations. Because the test setup itself can perform the measurements, the procedure can be implemented with many existing test setups or by adding a test setup (e.g., one that includes a table to support the antenna) to an existing setup. Specific handling models, which can be used in high-volume production testing, measure at short distances (e.g., less than 40 mm or less than 30 mm, depending on the specific handling model used in high-volume production) and can be used more reliably at the optimized distance, thus simplifying testing in high-volume production environments.At such short distances, a user might, for example, have an antenna array transmitting at a specific frequency and a measurement antenna with metal components receiving (or vice versa). In this case, at certain distances between, for example, an antenna-in-package-device-under-test (AiP-DUT) antenna / antenna array and the measurement antenna, a resonant wave can occur, reducing the measured power at those frequencies. By determining an optimized distance, standing waves can be reduced or avoided during testing using such metallic components and frequencies. The method is compatible with high frequencies such as the 5G frequency bands and can therefore improve testing for new 5G-compatible devices.

[0008] The present disclosure proposes, for example, a method (such as a procedure and / or an algorithm) for determining or ascertaining an ideal or optimized distance between, for example, an antenna-in-package antenna array and a measuring antenna in, for example, a radiating near-field connector for over-the-air (OTA) testing with automated testing equipment (ATE). Such an ideal or optimized distance depends, for example, on the characteristics of an AiP antenna array or a (measurement) antenna and, for example, on a test program, in particular the specific frequencies to be tested. The present disclosure can be implemented, for example, in the form of a hardware setup (such as a test arrangement or a test device thereof) and an algorithm for automatically ascertaining this optimized distance.The method (e.g., the procedure / algorithm) is, for example, one of the critical parts for the successful design and implementation of a radiating near-field socket (e.g., device socket) or a change set (e.g., a test fixture), for example, for cost-effective, high-volume over-the-air (OTA) testing at multiple locations. This procedure or method can, for example, be independent of the ATE platform.The method can be implemented, for example, to perform a measurement with an entire application setup including the test object (e.g., DUT AiP, OTA measuring antenna) and a test program (e.g., a target test program (e.g., with multiple test frequencies)) in order to automatically determine, for example, an optimized distance between the AiP-DUT antenna group and the OTA measuring antenna, which, for example, lies within a maximum limit defined by the handling mechanism.

[0009] According to one embodiment, determining the optimized distance involves comparing one or more values ​​of the second measurement data (for example, a first set of values) obtained for or associated with a first distance between the test object and the antenna of the measurement setup (for example, measurement data associated with different frequencies) with one or more corresponding values ​​of the first measurement data (for example, a set of far-field measurement data associated with different frequencies) to obtain a first comparison result (for example, a correlation value describing a similarity between the second measurement data obtained for the first distance and the first measurement data);and comparing one or more values ​​of the second set of measurement data (for example, a second set of values) obtained for a second distance between the device under test and the antenna of the measuring arrangement, or associated with a second distance between the device under test and the antenna of the measuring arrangement (for example, measurement data associated with different frequencies), with one or more corresponding values ​​of the first set of measurement data (for example, a set of far-field measurement data associated with different frequencies) in order to obtain a second comparison result (for example, a correlation value describing a similarity between the second set of measurement data obtained for the second distance and the first set of measurement data);and determining the optimized distance based on the first comparison result and the second comparison result (for example, comparing (for example, forming a scalar difference or forming a difference vector and determining a norm or the difference vector or determining a correlation) for each distance (and optionally for each frequency) of one or more values ​​of the first measurement data or one or more values ​​derived from the first measurement data with one or more values ​​of the second measurement data or one or more values ​​derived from the second measurement data).

[0010] The procedure therefore allows for the improvement of test parameters with respect to the reception of the test object. The first comparison result enables the evaluation of the quality of the near-field measurement results at the first distance by using the far-field measurement from a reference point. The first comparison result thus contains information that allows one to determine how far the near-field measurement at the first distance deviates from the far-field measurement. Similarly, the second comparison result contains information that allows one to determine how far the near-field measurement at the second distance deviates from the far-field measurement. Since the first and second measurements are related to the first and second distances, the first and second comparison results can be used to determine which of the first and second distances exhibits the smallest deviation from the reference and is therefore better suited as the optimized distance.The optimized distance thus determined makes it possible to avoid or reduce resonance effects.

[0011] According to one embodiment, the first and second measurement data, or at least one or more values ​​of the first and second measurement data, are obtained on the basis of a wireless transmission of a signal by the test object, or are obtained when the test object wirelessly transmits a signal (for example, to the test setup or another test setup for the first and / or second measurements; for example, to the antenna of the test device).

[0012] The method can therefore determine the optimized distance based on the transmission characteristics of the test object. The method can be performed using first and second measurement data obtained via wireless transmission. Therefore, the method does not require measurements to be taken during the procedure itself, but can be based on far-field measurement results obtained at an earlier time (for example, on the same test setup or a different one). However, the method can also be used directly during (or shortly after) the measurement of the first and / or second data points.

[0013] According to one embodiment, the one or more values ​​of the first measurement data have at least one of the following values: a power value (for example, in milliwatts or dBm; for example, determined by evaluating a signal received from the antenna of the measurement setup), a gain value (for example, in decibel units; for example, determined by evaluating a signal received from the antenna of the measurement setup), a gain level value (for example, in decibel units; for example, determined by evaluating a signal received from the antenna of the measurement setup), a gain compression value (for example, a 1 dB compression point (P1db); for example, determined by evaluating a signal received from the antenna of the measurement setup), a phase shift value (for example, in degree units,for example, phase shift during beamforming (determined, for example, by evaluating a signal received from the antenna of the measurement setup), a gain difference value in a frequency range (determined, for example, by evaluating a signal received from the antenna of the measurement setup), an error vector magnitude value (for example, in dBc units; determined, for example, by evaluating a signal received from the antenna of the measurement setup), an isolation value (for example, the degree of isolation between different polarization directions; determined, for example, by evaluating one or more signals received from the antenna of the measurement setup).a disturbance value (for example, to specify interference radiation; for example, determined using an evaluation of a signal received by the antenna of the measurement setup) and an adjacent channel power ratio value (for example, determined using an evaluation of a signal received by the antenna of the measurement setup), wherein one or more values ​​of the second measurement data have at least one of the following values: a power value (for example, in milliwatts or dBm), a gain value (for example, in decibel units), a gain step value (for example, in decibel units), a gain compression value (for example, 1 dB compression point (P1db)), a phase shift value (for example, in degree units, for example, phase shift during beamforming), a gain difference value in a frequency domain, an error vector magnitude value (for example, in dBc units),an isolation value (for example, the degree of isolation between different polarization directions), an interference value (for example, to indicate interference radiation), and an adjacent channel power ratio (or any other metric measurable using an antenna).

[0014] These values ​​can reflect resonance effects and therefore form a basis for determining the optimized distance for sending the test object. The method is thus compatible with a multiple of measurable parameters. Since resonance effects can manifest as deviations in more than one measurable parameter, the optimized distance can be determined by measuring one parameter (for example, a parameter strongly influenced by resonance effects and / or a parameter that the test setup can measure with high accuracy), and the optimized distance can then be used to measure another parameter in further tests.

[0015] According to one embodiment, the first and second measurement data, or at least one or more values ​​of the first and second measurement data, are obtained on the basis of a wireless reception of a signal by the test object, or are obtained when the test object wirelessly receives a signal (for example, from the test setup or another test setup for the first and / or second measurements; for example, from the antenna of the test setup).

[0016] The first and second measurement data can therefore be obtained during or before the procedure. Since the values ​​are measured by the test setup, the optimized distance determined from these values ​​is well suited for future measurements of these values.

[0017] According to one embodiment, the one or more values ​​of the first measurement data have at least one of the following values: a power value (for example, in milliwatts or dBm; for example, measured by the device under test or by test equipment connected to the device under test), a gain value (for example, in decibel units; for example, measured by the device under test or by test equipment connected to the device under test), a gain level value (for example, in decibel units; for example, measured by the device under test or by test equipment connected to the device under test), a third-order intercept point value (for example, in dBm units; for example, measured by the device under test or by test equipment connected to the device under test), a phase shift value (for example, in degree units; for example, phase shift during beam shaping;for example, measured by the test object or by test equipment connected to the test object), a gain difference value in a frequency range (for example, in decibel units; for example, measured by the test object or by test equipment connected to the test object), an error vector magnitude value (for example, in dBc units; for example, measured by the test object or by test equipment connected to the test object), an isolation value (for example, degree of isolation between different polarization directions;for example, measured by the device under test or by test equipment connected to the device under test), and a noise figure value (for example, measured by the device under test or by test equipment connected to the device under test), and wherein one or more values ​​of the second measurement data include at least one of the following: a power value (for example, in milliwatts or dBm), a gain value (for example, in decibel units), a third-order intercept point value, a phase shift value (for example, in degree units, for example, phase shift during beamforming), a gain difference value in a frequency domain, an error vector magnitude value (for example, in dBc units), an isolation value (for example, degree of isolation between different polarization directions), and a noise figure value (or any other metric measurable using an antenna).

[0018] The values ​​allow the determination of the optimized distance based on parameters relating to the reception of the test object. The optimized distance can, for example, be used to test the reception of the test object. The method is compatible with multiple measurable parameters. Since resonance effects can manifest as deviations in more than one measurable parameter, the optimized distance can be determined by measuring one parameter (for example, a parameter strongly affected by resonance effects and / or a parameter that the test setup can measure with high accuracy), and then the optimized distance can be used to measure another parameter.

[0019] According to one embodiment, the second set of measurement data includes a second set of near-field measurement results associated with a first distance between the test object and the antenna of the test setup (for example, obtained for the first distance between the test object and the antenna of the test setup) (where, for example, the values ​​of the first set of near-field measurement results are associated with different frequencies, for example, determined for different frequencies), and wherein the second set of measurement data includes a second set of near-field measurement results associated with a second distance between the test object and the antenna of the test setup (for example, obtained for the second distance between the test object and the antenna of the test setup) (where, for example, the values ​​of the second set of near-field measurement results are associated with the different frequencies,for example, determined for the different frequencies), (where, for example, the values ​​of the first set of near-field measurement results may correspond to the values ​​of the second set of near-field measurement results, except that the values ​​of the first set of measurement results are determined for the first distance and the values ​​of the second set of near-field measurement results are determined for the second distance), wherein the optimized distance is determined as a function of deviations between the sets of near-field measurement results and a (corresponding) set of far-field measurement results (contained in the first measurement data) (where the set of far-field measurement results may be considered as reference far-field data).

[0020] Thus, the first set of near-field measurement results refers to the first distance, and the second set refers to the second distance. Each set of values ​​defines a quantity accessible to statistical processing, allowing the deviations determined for each set to ascertain the extent to which the near-field measurements were influenced by resonance effects, such that they deviate from an unaffected value. Based on the deviations determined for each set, distances that are less affected, or not affected at all, by resonance effects can therefore be identified, thus facilitating the determination of the optimized distance.

[0021] According to one embodiment, the optimized distance is determined using a plurality of far-field measurement results associated with different frequencies (for example, the set of frequencies) and corresponding near-field measurement results (which are also associated with the different frequencies, for example, the set of frequencies).

[0022] The corresponding frequencies provide a more precise link for comparing far-field and near-field measurement results. Since near- and far-field measurement results can be associated with the same set of frequencies, a comparison between them is more accurate.

[0023] According to one embodiment, determining the optimized distance involves averaging (for example, without weighting or with weighting) a difference between a plurality of far-field measurement results associated with different frequencies (for example, the set of frequencies) and corresponding near-field measurement results (which are also associated with the different frequencies, for example, the set of frequencies).

[0024] Averaging the difference between the majority of far-field measurements and the corresponding near-field measurements provides a measure of the deviation between the near-field and far-field measurement values. Since this deviation can be caused by resonance effects, the mean of the differences can indicate the extent of these resonance effects at each distance. A weighted mean allows the contribution of significant deviations to the mean to be increased or decreased, which can facilitate the identification of deviations or reduce the effects of random variations.

[0025] According to one embodiment, the optimized distance is determined such that a difference between a far-field measurement result and a corresponding near-field measurement result is less than a predetermined maximum deviation for all frequencies of the set of frequencies, or wherein the optimized distance is determined such that a difference between a far-field measurement result and a corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies of the set of frequencies.

[0026] A predetermined maximum deviation provides a threshold for determining the magnitude of differences between near- and far-field measurement results. If a difference smaller than the predetermined maximum deviation is determined for more than one optimized distance, the procedure may include additional selection criteria, or the user may, for example, select a distance that better suits the test parameters (or the test setup's capabilities). Furthermore, a plurality of distances exhibiting a difference smaller than the predetermined maximum deviation may indicate a test system with overall low resonance effects, potentially leading to more reproducible results.Few or no intervals with a difference smaller than the predetermined maximum deviation may indicate that there are many resonance effects, which may warn the user of a risk of less reproducible results and suggest an adjustment of the test parameters.

[0027] According to one embodiment, the optimized distance is determined such that a near-field measurement result or a difference between a far-field measurement result and a corresponding near-field measurement does not exhibit a resonance effect (for example, beyond a predetermined maximum deviation) for all frequencies of the set of frequencies (where, for example, the presence of a resonance effect can be detected by comparing near-field measurement results for a given frequency and for a plurality of distances with a mean value of the near-field measurement results for the given frequency and for the plurality of distances, whereby a deviation from the mean value that is greater than a predetermined threshold can be detected as a resonance effect) (for example, avoiding a distance at which a significant resonance effect occurs that significantly degrades a near-field measurement result at at least one frequency of the set of frequencies).

[0028] Determining an optimized distance based on resonance effects also provides indicators that can be identified. For example, resonance effects can be defined by a periodicity (dependent on the wavelength) and a pronounced formation of minima and maxima depending on measured values. Resonance effects can also be determined based on the direction (e.g., sign) or degree (e.g., magnitude) of the deviation. These additional indicators can improve the identification of resonance effects and thus the determination of distances optimized for minimal or no resonance effects.

[0029] According to one embodiment, the method involves determining a single distance as an optimized distance that is used for all frequencies of the set of frequencies (and that yields acceptable near-field measurement results for all frequencies of the set of frequencies).

[0030] A single optimized distance can simplify testing automation (e.g., eliminating the need for selection parameters or user input). Using a single distance instead of multiple distances (e.g., for specific frequency bands) improves test efficiency and comparability. Because the single optimized distance is determined for the set of frequencies, there is less risk of measurements exhibiting asymmetrical behavior across that frequency range.

[0031] According to one embodiment, the method involves using a production test test program to obtain the initial measurement data.

[0032] A production test program can automate the determination of the optimized distance and can be used to perform further measurements using this optimized distance. This allows for more efficient testing. Furthermore, tests can be performed more reliably and reproducibly by different users, thus reducing the risk of user error.

[0033] According to one embodiment, the method involves executing a production test program that controls testing of the test object (and preferably outputs one or more measurement result values ​​per frequency) for a plurality of test frequencies and for a plurality of distances (for example, between the test object and the antenna of the test setup) in order to obtain the second set of measurement data. For example, the production test program can be executed for each distance between the test object and the antenna of the test setup (for example, the distance between the AiP-DUT antenna array and the OTA measurement antenna), which is defined by a linear stage (for example, from 20 mm to 40 mm in 1 mm increments).The results (e.g., measurement results) of each test (e.g., each run, for example, a test for each distance) can be stored, including, for example, the results (e.g., measurement results) for different measured frequencies (e.g., frequencies of a set of frequencies).

[0034] Such a production test program transfers the previously described advantages in terms of efficiency, reliability and reproducibility of the test to the process of performing the measurements to obtain the second measurement data.

[0035] According to one embodiment, the method involves using a production test program that is repeated one or more times with a modified distance between the test object and the antenna of the test setup to determine the optimized distance, or wherein the method involves using a production test program that is supplemented by a functionality to effect a repetition (for example, of a test sequence) and a modification of a distance between the test object and the antenna of the test setup to determine the optimized distance.For example, after completion of measurements for a final distance (e.g., at the end of an entire measurement cycle), results (e.g., measurement results or values ​​based thereon) for each distance value can be compared with each other, for example, to determine or identify one or more common distance values ​​for all measured frequencies (e.g., the set of frequencies) that do not encounter a resonance situation (e.g., exhibit resonance effects or a standing wave).

[0036] The production test program therefore supports controlling the modification of the distance, which can be carried out more efficiently. Since the second set of measurement data forms a basis for determining the optimized distance and for potential further tests with this optimized distance, the accuracy of these further tests can be improved.

[0037] According to one embodiment, the method involves varying the distance between the test object and the antenna of the test setup between measurements, which are used to obtain the near-field measurement result (where the distance is varied, for example, using an actuator (for example, an electrical actuator) that can vary the position of the antenna of the test setup; wherein the method includes, for example, generating control signals for an actuator that varies the position of the antenna of the test setup).

[0038] Using an actuator allows for a simple design that requires only one antenna, which can be controlled by the actuator to achieve the different distances. Such an actuator can be added (for example, in the form of a test device) to existing test setups, thus improving the compatibility of the method disclosed herein.

[0039] According to one embodiment, the method involves varying the distance between the test object and the antenna of the test arrangement in steps (for example, in equal and / or fixed steps).

[0040] Varying the distance in steps allows for an efficient and reproducible arrangement of the antenna at the intervals required for the second set of measurements. A step-by-step approach is compatible with repeating a test program and facilitates determining whether testing has been performed for all desired distances.

[0041] According to one embodiment, the method includes determining which subset of the second measurement data from a plurality of subsets of the second measurement data, which are (each) connected by different distances, has a maximum similarity to the first measurement data, and wherein the method includes determining the optimized distance based thereon.

[0042] Maximum similarity is a criterion that can be defined in various mathematical algorithms and processes (for example, processes for fitting measured values, using metrics to determine a difference between measured values, determining a variance, applying distance- and / or frequency-specific weights, determining similarity across a frequency range), thus enabling a criterion that can be adapted and efficiently executed by a program. Furthermore, distances with little or no resonance effects tend to exhibit a greater degree of similarity to the initial measurement data and can therefore be used as an indicator of the optimized distance.

[0043] According to one embodiment, the method further includes determining distances with standing wave behavior (for example, at local maxima of a S 11 -scattering parameters and / or local minima of an S 21-scattering parameters) for each frequency of the set of frequencies, where the optimized distance is determined from distances with no or the lowest standing wave behavior.

[0044] Furthermore, determining distances based on standing wave behavior provides indicators that allow for testing the optimal spacing. For example, scattering parameters can exhibit local maxima or minima that depend on the presence of a standing wave. Identifying such local maxima or minima can therefore form a basis for determining standing waves and thus the optimal spacing (with low or no standing waves).

[0045] According to one embodiment, the method further comprises generating a control signal for controlling the movements of a table (for example, a linear table; for example, with a motor) that holds the antenna of the test setup, wherein the control signal causes the table to move to at least two of the different distances (for example, by causing the motor to start). Alternatively, the movement of the table can also be controlled manually.

[0046] The control signal enables the control of the table's movement and thus the distance between the test object and the antenna of the test setup. The control signal can be used directly with a linear table or a motor, which simplifies and speeds up the measurement of the second set of data.

[0047] One embodiment of the invention relates to a method for testing a plurality of test objects, wherein the method comprises determining an optimized distance between the test object and an antenna of the test arrangement using a method disclosed herein, wherein the optimized distance is determined using a production test test program that is repeated one or more times with a modified distance between the test object and the antenna of the test arrangement to determine the optimized distance, or wherein the optimized distance is determined using a production test test program that is supplemented by a functionality for causing a repetition (for example, of a test sequence) and a modification of a distance between the test object and the antenna of the test arrangement to determine the optimized distance;and wherein the method comprises testing a plurality of test objects using the production test program, wherein a distance between the test objects is kept constant at the previously determined optimized distance.

[0048] This method automates the steps for determining the optimized distance, modifying the distance, and testing multiple objects. Therefore, the production test program can determine the optimized distance using an initial test object and subsequently test further objects using this optimized distance. Because the optimized distance is determined in a near field, multiple objects can also be tested in the near field, facilitating the testing of large quantities (for example, due to a more compact setup) and enabling the use of handling models employed for near-field testing of large quantities.

[0049] One embodiment of the invention relates to a computer program for carrying out the method described herein when the computer program is executed on a computer (or a computer program product that includes instructions to cause one or more processors to carry out a method described herein).

[0050] The program can be run on different test setups (for example, new or existing ones, or by different users), which increases compatibility with available test setups. Furthermore, the computer program can realize the advantages of the method disclosed herein.

[0051] One embodiment of the invention relates to a test setup (for example, a test system or automated test equipment) for determining an optimized distance between a test object (for example, an antenna in package) and an antenna of a test device, wherein the test setup is configured to obtain initial measurement data (for example, reference far-field data) (for example, the test setup can determine the initial measurement data itself or can receive the initial measurement data from an external source, for example, when the far-field measurements are performed in a different measurement environment).where the first measurement data represent a plurality of far-field measurement results (for example, power measurement results and / or gain measurement results and / or gain stage measurement results and / or gain compression measurement results and / or phase shift measurement results and / or measurement results for the difference value in a frequency range and / or error vector size measurement results and / or insulation measurement results and / or radiated emissions measurement results and / or adjacent channel power ratio measurement results and / or IP3 measurement results and / or noise figure measurement results) (for example, based on a measurement at a distance between the test object and a measuring antenna that is greater than the Fraunhofer distance (d, F =2D 2 / λ, where D is the largest dimension of a radiator or a diameter of a sphere enclosing the radiator or antenna, and where λ is a wavelength used, for example, a smallest wavelength used, a largest wavelength used, an average wavelength used, or a wavelength at an average frequency used; for example, greater than 10 mm), characterizing the test object for a set of frequencies (for example, a plurality of frequencies) (which has, for example, ten, eleven, or twelve frequencies) (for example, in a frequency range from 24 GHz to 53 GHz), or wherein the first measurement data are based on a plurality of far-field measurement results characterizing the test object for a set of frequencies, the test setup being configured to obtain second measurement data (for example, measurement data for different distances x,to obtain the near-field conditions between the test object and the antenna of the test setup (for example, generated by the antenna of a test setup), wherein the second set of measurement data represents a plurality of near-field measurement results (for example, a plurality of sets of near-field measurement results associated with different distances) (for example, measured at distances between the test object and an antenna of the measurement setup that lies within the "Fraunhofer distance"), which characterize the text object for the set of frequencies, (where the antenna of the measurement setup used to obtain the near-field measurement results may be different from, or identical to, the measurement antenna used to obtain the far-field measurement results).or wherein the second set of measurement data is based on a plurality of near-field measurement results (or a plurality of sets of near-field measurement results associated with different distances) (for example, measured in distances between the test object and an antenna of the measurement setup located within the "Fraunhofer distance") that characterize the text object for the set of frequencies, wherein at least two of the near-field measurement results (or at least two sets of near-field measurement results) are acquired at different distances (in 1 mm increments) (in a range of 20 mm to 40 mm) between the test object and an antenna of the test setup (where the antenna of the measurement setup may be identical to or different from the measuring antenna used to obtain the far-field measurement results), and wherein the test setup is configured toto determine the optimized distance between the test object and the antenna of the test setup based on the first and second measurement data (for example, based on a comparison between the first and second measurement data) (for example, taking into account measurement data at different frequencies).

[0052] Thus, a test setup can be provided that can solve the aforementioned problems and offer the advantages described here.

[0053] According to one embodiment, the test setup further comprises a device socket configured to receive the test object, wherein the test setup is configured to perform a plurality of tests when the test object is positioned in the device socket in order to obtain the near-field measurement results for the set of frequencies, wherein at least two of the tests are performed at different distances between the test object and the antenna of the test setup in order to obtain near-field measurement results for the at least two different distances.

[0054] The socket allows for the insertion and positioning of the test object, enabling accurate and efficient acquisition of near-field measurement results. Furthermore, the socket facilitates communication between the test object and the test setup (e.g., a signal source and / or a signal receiver thereof) to control the test object (e.g., for the emission of electromagnetic waves by the test object) and / or to receive signals from the test object (e.g., regarding electromagnetic waves received by the test object).

[0055] According to one embodiment, the test setup further comprises a table (for example, a linear table; for example, with a motor) that supports the antenna of the test setup and is configured to move (for example, by operating the motor) to at least two different distances relative to the device socket. For example, a linear table may be equipped with a motor controlled by the test setup (for example, an ATE measurement system) that is configured to move the antenna relative to the device under test and / or the device socket (for example, configured to move an antenna spacing relative to an AiP-DUT antenna array). The test setup may include a control circuit (for example, an auxiliary circuit) for controlling the table (for example, the table's motor).The test setup can be configured to supply power to the motor (for example, via the control circuit or a separate power circuit). For instance, an auxiliary circuit (such as a standard integrated circuit for motor control) can be implemented on the support structure (such as a test object fixture or a loadboard) to control the motor. The test setup can include digital channels / resources for controlling or programming a motor control circuit and / or power supply channels / resources configured to power the motor. That is, digital channels / resources, such as those of an ATE system, can be used to program an integrated circuit for motor control, and / or power supply channels / resources, such as those of an ATE system, can be used to supply the motor with the required current.

[0056] The table facilitates antenna positioning for measurements at varying distances and enables the positioning of the test object (and optionally additional test objects) at a specific, optimized distance. A motor controlled by the test setup can simplify the automation of distance modification and thus facilitate measurements in the near and / or far field.

[0057] According to one embodiment, the test setup further includes a far-field test device configured to perform a test of the test object at the set of frequencies in a far-field state (for example, at a sufficiently large distance between the antenna of the test setup and the test object) in order to obtain the first measurement data.

[0058] The far-field test setup allows for the determination of initial measurement data, which serve as reference data. The test device can be mounted onto an existing test setup, thus improving the compatibility of the test setups with the procedure described here.

[0059] According to one embodiment, the test setup further includes a data interface (for example, for user input or data input) configured to receive the first measurement data and / or the second measurement data (which, for example, were determined on a device other than the test setup).

[0060] The data interface allows the measurements of the first and / or second measurement data to be carried out at a different time and / or with a different test setup. Therefore, the measurements can be planned and carried out more flexibly (for example, by a manufacturer of the test object), which increases the efficiency of the procedure and subsequent tests.

[0061] According to one embodiment, the test setup is configured to perform a method disclosed herein.

[0062] Thus, the test setup can solve problems and offer advantages, as described here in connection with the procedure. Brief description of the drawings

[0063] The drawings are not necessarily to scale, as the focus is generally on illustrating the principles of the invention. The following description presents different embodiments of the invention with reference to the following drawings. Fig. Figure 1 shows a perspective view of an example of a test setup with one test object. Fig. 2 shows a perspective view of a close-up of the in Fig. 1. The test setup and test object shown. Fig. Figure 3 shows a perspective view of an example of a test object relative to an antenna of a test setup. Fig. Figure 4 shows a perspective view of the back side of the [unclear text]. Fig. 1 and Fig. 2. Test setup shown. Fig. Figure 5 shows a perspective view of an example of a test setup. Fig. Figure 6a shows a schematic view of electromagnetic waves emitted by a point source and received by a receiving antenna of length D. Fig. Figure 6b shows a schematic view of an example of different electromagnetic fields around an antenna. Fig. Figure 6c shows a top view of an example of a test object. Fig. Figure 7 shows a schematic view of an example of different electromagnetic field regions around an antenna under test. Fig. Figure 8 shows a flowchart of a procedure for determining an optimized distance between a test object and an antenna of a test setup. Fig. Figure 9 shows a flowchart of an exemplary procedure for controlling a distance between a test object and an antenna. Fig. Figure 10a shows results of simulations of transmitting scattering parameters S11 and S21 for different separation distances between the test object and the antenna. Fig. Figure 10b shows results of a phase difference between the simulated S21 transmission phase and a linear phase for different separation distances between the test object and the antenna. Fig. Figure 11a shows an example of first measurement data and a second measurement. Fig. Figure 11b shows a selection of values ​​from the first and second measurement data, which are in Fig. 11a are shown. Fig. 12a shows quantities that correspond to the first and second measurement data from Fig. 11a are connected. Fig. 12b shows an example of deviations for the quantities of Fig. 12a. Fig. Figure 13 shows a flowchart of an exemplary procedure for testing a plurality of test objects. Fig. Figure 14a shows a schematic view of an example of a test object. Fig. Figure 14b shows a schematic view of another example of a test object. Detailed description of the exemplary implementations

[0064] Identical or equivalent elements, or elements with the same or equivalent functionality, are designated by the same or equivalent reference symbols in the following description, even if they are contained in different figures.

[0065] The following description presents a number of details to provide a more comprehensive explanation of embodiments of the present invention. However, it is clear to a person skilled in the art that embodiments of the present invention can be implemented without these specific details. In other cases, known structures and devices are shown in block diagrams rather than in detail to avoid obscuring embodiments of the present invention. Furthermore, features of the different embodiments described herein can be combined unless expressly stated otherwise.

[0066] The following are examples of a test setup for determining an optimized distance between a test object and an antenna of a test setup. Subsequently, a method for determining the optimized distance (for example, using such a test setup) is described.

[0067] Fig. Figure 1 shows a perspective view of an example of a test setup 120 with a test object 110.

[0068] The test setup 120 can include a support structure 126 (which, for example, includes a printed circuit board, such as a printed circuit board test holder). The test setup 120 can include a signal source and / or a signal receiver 129 configured to transmit signals to an antenna 122 (for example, an OTA measurement antenna) of the test setup 120 and / or to receive signals from the antenna 122 of the test setup 120. The test setup 120 can be automatic testing equipment (ATE).

[0069] The test setup 120 can have a device socket 128 for inserting (for example, configured to receive) the test object 110. The test setup 120 can be configured to perform a plurality of tests when the test object 110 is positioned in the device socket 128 in order to obtain far-field and / or near-field measurement results for a set of frequencies. At least two of the near-field tests can be performed at different distances between the test object 110 and the antenna 122 of the test setup in order to obtain near-field measurement results for at least two different distances.

[0070] Fig. 2 shows a perspective view of a close-up of the in Fig. 1. The test setup 120 and the test object 110 are shown.

[0071] The test setup 120 includes an antenna 122 (for example, a measuring field) which can be configured to detect an electromagnetic field emitted by the test object 110 and / or to emit an electromagnetic field to be received by the test object 110.

[0072] The antenna 122 can be connected (or connectable) to the terminals of the signal source and / or signal receiver 129 via coaxial cable 129a, b (for example, directly or indirectly via the support structure 126). The device socket 128 can be coupled to the signal source and / or signal receiver 129 (for example, directly or indirectly via the support structure 126). Thus, when the device under test 110 is inserted into the device socket 128, the signal source and / or signal receiver 129 can be configured to receive signals from the device under test 110 (where, for example, the device under test 110 generates the signal in response to receiving an electromagnetic field from the antenna 122) and / or to send signals to the device under test 110 (which, for example, can cause the device under test 110 to generate a signal to be received by the antenna 122).Furthermore, the signal source and / or signal receiver 129 can be configured to receive signals from the antenna 122 (where, for example, the antenna 122 generates the signal in response to receiving an electromagnetic field from the test object) and / or to send signals to the antenna 122 (which, for example, can cause the antenna 112 to generate a signal to be received by the test object 110).

[0073] The in Fig. The antenna 122 shown in Figure 2 is implemented (for example, manufactured, provided) on a printed circuit board (PCB) that is coupled to the coaxial cables 129a, b. The PCB can, for example, be the antenna 122 itself or include the antenna 122. For example, the antenna 122 can be formed by at least one circuit printed on the PCB or by a circuit arrangement mounted on the PCB (for example, in the form of one or more electrical components such as a chip mounted on the PCB). The antenna 122 can include the PCB and may optionally include other components (for example, a holding frame for handling). However, the antenna 122 can also be constructed differently.For example, the antenna 122 can have an antenna housing (for example made of metal) in which a waveguide (for example with a double-rib structure or a quadruple-rib structure) is formed, which is coupled to an opening (for example a radiating opening, for example with a circularly polarizing antenna structure) of the antenna housing.

[0074] The test setup 120 can include a test fixture 140, which includes the antenna 122 and a support structure 142 for holding the antenna 142. The test fixture 140 (or the test setup 120) can include a (for example, linear) table 144 configured to be movable relative to the device socket 128 (for example, in a direction along a main lobe of the test object 110 in the device socket 128, for example, in a direction perpendicular to a radiating surface of the test object 110 in the device socket 128, for example, perpendicular to the support structure 126). The test fixture 140 can include a motor 146 configured to move the table 144 (for example, using a spindle system mounted on a shaft rotatable by the motor 146). Alternatively, the test device 140 can be configured to move the device socket 128 relative to the support structure 126.The test device 140 has electrical connections 148 (for example, a motor control cable) for coupling the motor 146 to the signal source and / or signal receiver 129 or a computer (for example, an ATE system connected, for example, to the signal source and / or signal receiver 229).

[0075] The method may include generating (for example by the signal source and / or signal receiver 229 or the computer) a control signal to control movements of the table 144, which holds the antenna 142 of the test arrangement 120, wherein the control signal causes the table 144 to move to at least two of the different distances (for example by causing the motor 146 to drive).

[0076] Alternatively or additionally, the test device 140 can have a plurality of antennas arranged at different distances relative to the device socket 128. The plurality of antennas can enable measurements at different distances with little or no movement of the state 144.

[0077] Fig. Figure 3 shows a perspective view of an example of a test object 310 relative to an antenna 322 of a test setup. The test object 310 can be any test object disclosed herein (for example, test object 110 or 510). The antenna 322 can be any antenna of a test setup disclosed herein (for example, test setup 120 or 520).

[0078] The test object 310 (for example, the test object array) can be (or include) an antenna-in-package (AiP). The test object 310 can include at least one antenna, an antenna array (capable, for example, of beamforming), or a circularly polarized antenna structure. The test object 310 can be configured to receive and / or transmit signals in 5G (NR) frequency bands. For example, the test object 310 can be configured to transmit and / or receive signals in Frequency Range 2 (FR2), for example, between 24 GHz and 53 GHz. The test object 310 can be an antenna device used in applications such as a mobile phone, a car, a television, or a computer. The test object 310 can have a first connection 312 which is coupled or can be coupled to a signal source and / or a signal receiver (for example, a signal source and / or a signal receiver 129).

[0079] The antenna 122 (for example, a measurement array) (which is part of a test setup such as automatic test equipment (ATE)) can be configured to detect an electromagnetic field emitted by the test object 110 and / or to emit an electromagnetic field that can be received by the test object 110. The antenna 122 can have a second terminal 124 for a signal source and / or a signal receiver (for example, a signal source and / or a signal receiver 129).

[0080] Fig. Figure 14a shows a schematic view of an example of a test object 1410a.

[0081] The test object 1410a, for example, comprises a transmitter / receiver 1416 (e.g., a 5G transmitter / receiver) and a receiver 1417a (i.e., a 5G receiver). For transmission, the transmitter / receiver 1416 can be configured to generate a radio frequency (RF) signal based on a baseband signal 1415a and to provide the RF signal to the receiver 1417a. The receiver 1417a can have or be coupled with one or more antennas, which can transmit a wireless signal based on the RF signal. For reception, a wireless signal received by the one or more antennas can be converted at the receiver 1417a into an RF signal, which is then provided to the transmitter / receiver 1416.

[0082] Fig. Figure 14b shows a schematic view of another example of a test object 1410b.

[0083] The test object 1410b, for example, comprises an intermediate frequency (IF) transmitter / receiver 1418a, a high frequency (RF) transmitter / receiver (TRX) 1418b, and a receiver 1417b (for example, a 5G receiver). For transmission, the IF transmitter / receiver 1418a can generate an IF signal based on a baseband signal 1415b and forward the RF signal to the RF transmitter / receiver 1418b, which can generate an RF signal based on the IF signal. The receiver 1417b can have or be coupled to one or more antennas with which a wireless signal based on the RF signal can be transmitted. For reception, the transmitter / receiver 1418b can be configured to generate an RF signal based on a wireless signal received by one or more antennas and to forward the RF signal to the IF receiver 1418a.The IF receiver 1418a can be configured to generate a baseband 1415b signal based on the IF signal.

[0084] The in Fig. The test objects 1410a, b shown in Figures 14a, b are examples of components that contribute to signal processing, each of which can contribute to and influence the transmission and / or reception of the test object 1410a, b. Testing the test object 1410a, b can make it possible to determine functional deviations of the object and / or defects of the test object. Such testing can be improved by the method and test setup disclosed herein, for example, with regard to accuracy (e.g., by determining an optimized distance with fewer or no resonance effects) and test efficiency (e.g., by enabling the use of near-field test setups in mass production testing).

[0085] Fig. Figure 4 shows a perspective view of the back side of the [unclear text]. Fig. 1 and Fig. 2. Test setup shown: 120.

[0086] The test device 140 can include a sensor 150 configured to detect a predefined position of the table 144. The sensor 150 can, for example, include a switch (e.g., for resetting) that detects physical contact between a reference structure 152 of the test device 140 and the switch (e.g., signals to the signal source and / or signal receiver 129 or a computer). The predefined position of the table 144 can be used as a reference point (e.g., start or end point) for moving the table 144. This means that the switch (for resetting) serves, for example, as a reference point for the (linear) table 144. For example, a dimensional measurement is taken at this reset point of the distance between the test object 110 (for example, the AiP-DUT antenna group) and the device socket 128 (for example, the ATE-OTA socket) and the antenna 122 (for example, the measuring antenna).

[0087] Fig. Figure 5 shows a perspective view of an example of a test setup 520, which can replace any test setup disclosed herein (such as test setup 120). Test setup 520 can, for example, be a far-field test setup.

[0088] The test setup 520 includes an antenna 522 configured to detect and / or emit electromagnetic fields. The in Fig. Antenna 522, as shown in Figure 5, can have a frequency range of 18.0 to 54.0 GHz, a gain of typically 15 dBi, dual polarization, a 3 dB radiation angle of 54 to 21 degrees, cross-polarization isolation of typically 30 dB (minimum 20 dB), terminal-to-terminal isolation of typically 35 dB (minimum 25 dB), a voltage standing wave ratio (VSWR) of typically 1.5:1 and maximum 2.0:1, a 2.4 mm or 1.85 mm connector, and a power handling of maximum 10 W continuous wave (CW) (2.4 mm connector) or maximum 5 W CW (1.85 mm connector). The antenna may be made of or incorporate aluminum. The antenna's dimensions could be, for example, 33.4 mm x 33.4 mm x 61.5 mm. The net weight of the antenna could be, for example, approximately 0.07 kg.

[0089] The test setup 520 can include a support structure 526 (e.g., the support structure 126). The test setup 520 can include a signal source and / or a signal receiver 529 (e.g., the signal source and / or signal receiver 129) configured to transmit signals to the antenna 522 (e.g., the antenna 122) and / or to receive signals from the antenna 522. The antenna 522 can be connected (or connectable) to terminals of the signal source and / or signal receiver 529 via coaxial cables 529a, b (e.g., directly or indirectly via the support structure 526).

[0090] The test setup 520 can have a device socket 528 (such as device socket 128) for inserting (for example, configured to receive) the test object 510 (such as test object 110). The test setup 520 can be configured to perform a plurality of tests when the test object 510 is positioned in the device socket 528 in order to obtain the far-field measurement results and / or near-field measurement results for the set of frequencies.

[0091] The device socket 528 can be coupled to the signal source and / or signal receiver 529. When the device under test 510 is inserted into the device socket 528, the signal source and / or signal receiver 529 can thus be configured to receive signals from the device under test 510 and / or to send signals to the device under test 510.

[0092] The test setup 520 can include a test device 540, which comprises the antenna 522 and a support structure 542 for holding the antenna 542. The support structure 542 can be (detachably) attached to at least one element of the group comprising the support structure 526, the device socket 528, and the signal source and / or signal receiver 529. The support structure 542 can be height-adjustable or fixed. The test device 540 can have a set of (e.g., interchangeable) support structures 542, each of which is configured to position the antenna 522 at a different distance (e.g., at a different height) relative to the device socket 528.

[0093] The antenna 522 can be arranged (for example, by means of the holding arrangement 542) in such a way that it enables the measurement of a far field of the test object 510. In the Fig. In the example shown in Figure 5, the antenna is positioned at a distance of 25 cm from the test object 510. However, longer or shorter distances (e.g., 10 mm) are also possible. For example, the distance between the antenna 522 and the test object 510 can be greater than the Fraunhofer distance.

[0094] The Fraunhofer distance is given by the equation d F =2D 2 / λ is defined, where D is a largest dimension of a radiator or a diameter of a sphere enclosing a radiator or antenna, and where λ is a wavelength used, for example a smallest wavelength used or a largest wavelength used or an average wavelength used or a wavelength at an average frequency used.

[0095] Fig. Figure 6a shows a schematic view of electromagnetic waves emitted by a point source 630 and received by a receiving antenna 632 of length D. It should be noted that the same principle applies when the receiving antenna 632 emits electromagnetic waves that are received by the point source 630. In the context of Fig. In 6a-c the term ‘antenna’ is used for any object that emits (or receives) an electromagnetic field, not just for an antenna of a test setup.

[0096] Due to its limited size, the receiving antenna 632 cannot receive an electromagnetic wave emitted by the source 630 in its entirety (that is, an entire spherical wavefront), but essentially only a section of it covered by its largest dimension, that is, the length D. This aspect is in Fig. 6a visualized in the form of waves that are cropped to a vertical length D.

[0097] As in Fig. As can be seen in Figure 6a, the wavefront of the first wave 634a, which is located close to the point source 630, exhibits a large curvature (i.e., a small radius, for example, less planar), while the wavefront of a second wave 634b, which is farther from the point source 630 than the first wave 634a, exhibits a smaller curvature (i.e., a larger radius, for example, more planar). The curvature causes a phase difference Δϕ of an electromagnetic wave that is received along the length D of the receiving antenna 632. With increasing distance, the curvature of the wavefront and the phase difference Δϕ decrease (for example, exhibiting a more planar shape). At the Fraunhofer distance d F =2D 2The phase difference varies by no more than π / 8 radians. That is, the physical significance of this distance is that a radiating point source at a distance of 2D 2 / λ or more would produce a spherical wavefront to a receiving antenna of length D, such that the phase would vary by no more than π / 8 radians over the entire length D.

[0098] Fig. Figure 6b shows a schematic view of an example of different electromagnetic fields around an antenna.

[0099] An area located at a distance below the Fraunhofer distance R0=d F =2D 2 / λ can be defined as a near field that lies within a Fresnel region (or radiating near field) with a radius R0 smaller than the Fraunhofer distance R0=d F =2D 2 / λ and greater than R=0.62·(D 3 / λ) 0,5 and a (reactive) near field for a distance smaller than R=0.62·(D 3 / λ) 0,5 can be divided.

[0100] Fig. Figure 6c shows a top view of an example of a test object 610. The in Fig. The test object 610 shown in Figure 6c can be implemented as any test object disclosed herein and used in any test setup disclosed herein.

[0101] The test object 610 has an antenna group 613, which comprises four individual antennas 614a, b, c, d. The largest dimension D sa The diameter of a single antenna 614a-d is approximately 4.4 mm and the largest dimension D aa The diameter of antenna group 613 is approximately 23.1 mm. A wavelength λ0 (measured in mm) in air can be determined using the following formula: λ0≈300F(GHz)×εR(mm) with a relative permittivity ε r =1.00059 (of air at 1 atm).

[0102] For an example frequency of 24 GHz, a wavelength can be determined as λ0(24 GHz)=12.45 mm

[0103] With the largest dimensions of the antenna group 613 (for example, 23.1 mm) and the individual antenna 614a (for example, 4.1 mm) in Fig. 6c and a wavelength of 12.45 mm allow the Fraunhofer distances (and thus a lower threshold for the far field) to be calculated as Far field≈2×D2λ0(24 GHz)≈2×(23.1)212.45≈85.7 mm for antenna group 613 and Far field≈2×D2λ0(24 GHz)≈2×(4.4)212.45≈3.1 mm for each of the individual antennas 614a, b, c, d.

[0104] It should be noted that examples of a distance defining near-field and far-field regions have been described previously, with such a distance being exemplified by Fraunhofer spacing at 24 GHz. Other definitions for the distance used to separate the near and far fields, as well as other parameters that define the distance (e.g., antenna dimensions and frequencies), can also be used.

[0105] Fig. Figure 7 shows a schematic view of an example of different electromagnetic field regions around a test antenna (antenna under test, AUT) 730.

[0106] The parameter D can be defined as the diameter of a sphere that encloses the test antenna 630.

[0107] As in Fig. As can be seen in Figure 7, a reactive near field can be defined up to a distance of λ / 2π. A radiating near field (or Fresnel region) can be defined up to a distance of 2D. 2 / λ (or Fraunhofer distance). A region with a distance greater than the Fraunhofer distance 2D. 2 / λ can be defined as the far field (or the Fraunhofer distance). In the far field, the angular deviation is less dependent on distance, and the waves are locally flatter. In the reactive near field, non-radiating fields dominate.

[0108] Compared to the near field, the far field is typically a better area for over-the-air (OTA) testing. However, due to mechanical requirements, integrating multiple sites into a standard test cell can be challenging (low number of multi-site setups). Commercial handling equipment may not have enough space to accommodate such a large mechanical setup, for example. A commercial handling device might only provide 5 cm of clearance between a test object and a measuring antenna. Achieving a distance of 30 cm (for far-field testing) might require a completely new or significantly modified handling device design. Isolation between adjacent far-field setups can also be challenging, particularly in a multi-site configuration.For example, a small anechoic chamber must be created for each location, which limits the number of possible locations for a test cell (e.g., to only two locations instead of the usual eight). This means that the near field may not be a good area for OTA testing (compared to the far field). However, the mechanical dimensions can facilitate the integration of multiple locations into a standard test cell (high number of multiple locations).

[0109] Fig. Figure 8 shows a flowchart 800 of a procedure for determining an optimized distance between a test object and an antenna of a test setup.

[0110] The procedure is described below, especially in relation to the in Fig. 1 and Fig. The test setup 120 shown in Figure 2 is described. However, any test setup disclosed herein (such as test setups 120 and 520) (alone or in combination with other test setups) can be used to carry out any procedure used herein.

[0111] The procedure involves, at step 802, obtaining initial measurement data, wherein the initial measurement data represent a plurality of far-field measurement results that characterize the test object 110 for a set of frequencies, or wherein the initial measurement data are based on a plurality of far-field measurement results that characterize the test object 110 for a set of frequencies.

[0112] The procedure includes in step 804 the acquisition of second measurement data, wherein the second measurement data represent a plurality of near-field measurement results that characterize the test object for the set of frequencies, wherein the second measurement data are based on a plurality of near-field measurement results that characterize the test object for the set of frequencies, wherein at least two of the near-field measurement results are acquired at different distances between the test object and an antenna of the test arrangement.

[0113] The procedure involves, in step 806, determining the optimized distance between the test object and the antenna of the test setup based on the first and second measurement data.

[0114] The method can involve determining a single optimized distance that is used for all frequencies in the set of frequencies. Alternatively, the method can involve determining more than one optimized distance (for example, one that is used for all frequencies in the set of frequencies or for a subset of the set of frequencies).

[0115] The first measurement data can be obtained using measurements performed by the test setup 120. For example, the table 144 can be positioned such that the antenna 122 is located at a distance (for example, at the Fraunhofer distance, a multiple of the Fraunhofer distance, or a predefined distance such as 10 cm, 20 cm, or 25 cm) such that it is in the far field of the test object 110. The table 144 can be moved to the desired distance by operating the motor 146 or manually. The table 144 can be positioned at the desired distance by selecting a support structure 126 at the (target) distance from the set of support structures 542 and mounting the selected support structure 126 onto the support structure 126.The test device 140 can have a plurality of antennas arranged at different distances relative to the device socket 128, wherein the measurements for the first measurement data are carried out by controlling (for example, causing the emission of electromagnetic waves from and / or reading of received electromagnetic waves from) one antenna of the plurality of antennas at a (target) distance to the test object 110.

[0116] The initial measurement data can be obtained by measurements performed by a separate test setup, distinct from the test setup (e.g., test setup 120) that performs near-field measurements of the test object 110. For example, measurements to generate the initial measurement data can be performed at a manufacturing site of the test object 110, with the test object and the initial measurement data then being made available to test setup 120 (or a device controlling test setup 120) for carrying out the method disclosed herein. For this purpose, test setup 120 can have a data interface configured to receive the initial measurement data and / or the second measurement data.For example, the first and / or second measurement data can be received via an internet connection or a storage device (such as a compact disk or a flash drive), and a program configured to perform any method disclosed herein can be compatible with the first and / or second measurement data and / or allow their import.

[0117] The in Fig. The test setup 520 shown in Figure 5 can be used to perform measurements for the first and second measurement data. However, the test setup 520 can also be used to perform measurements only for the first measurement data (or only for the second measurement data).

[0118] The test setup 520 can form a far-field test device. Alternatively, a part of the test setup 520 can form a far-field test device. For example, the test device 540 can form the far-field test device, wherein the test device 540 comprises an antenna 522 and a support structure 542 suitable (e.g., dimensioned) for far-field measurements. In such a case, the test device 540 can be arranged on a support structure (e.g., the support structure 126 or 526) of the test setup (e.g., instead of or in addition to a support structure for holding an antenna for near-field measurements).

[0119] The procedure may involve the use of a production test program to obtain the initial measurement data. The production test program may define the set of frequencies or include an algorithm for determining the set of frequencies based on user input. The production test program may define a distance for the far-field measurement. The production test program may include instructions for controlling an actuator (for example, the motor 146) of the test setup 120 to move the antenna 122 to the distance for the far-field measurement. The test setup (for example, test setup 120 or 520) may include a computer for executing the production test program or be communicatively coupled to a computer for executing the production test program. Such a computer program may be provided to a manufacturer of the device under test to facilitate reproducible and consistent measurements.

[0120] The set of frequencies can define two or more frequencies, such as three, four, five, six, twelve, or more. At least some frequencies within the set can be separated by equal frequency or wavelength intervals. The set of frequencies can cover one or more frequency bands of 5G technology. For example, the set of frequencies can define twelve frequencies (e.g., with an equal frequency interval of approximately 2.6 GHz) covering a range from 24 GHz to 53 GHz. In such a case, the set of frequencies can be defined as twelve frequencies f1 to f12, such as f1 = 24 GHz, f2 ≈ 26.6 GHz, f3 ≈ 29.3 GHz, f4 ≈ 31.9 GHz, f5 ≈ 34.5 GHz, f6 ≈ 37.2 GHz, f7 ≈ 39.8 GHz, f8 ≈ 42.5 GHz, f9 ≈ 45.1 GHz, f10 = 47.7 GHz, f11 ≈ 50.4 GHz, and f12 = 53 GHz. Alternatively, the set of frequencies can also be defined in other step sizes, such as 1 GHz steps.Alternatively, the set of frequencies can be defined in unequal (for example, arbitrary, increasing or decreasing) step sizes.

[0121] The majority of far-field measurement results may include at least one of the following: power measurement results (e.g., from transmitting and / or receiving the device under test), gain measurement results (e.g., from transmitting and / or receiving the device under test), gain stage measurement results (e.g., from transmitting and / or receiving the device under test), gain compression measurement results, phase shift measurement results (e.g., from transmitting and / or receiving the beamforming of the device under test), difference value measurement results in a frequency range (e.g., from transmitting and / or receiving the device under test), error vector size measurement results (e.g., from transmitting and / or receiving the device under test), isolation measurement results (e.g., from transmitting and / or receiving the device under test), radiated emissions measurement results, adjacent channel power ratio measurement results, IP3 measurement results, noise figure measurement results.

[0122] The initial measurement data represent a plurality of far-field measurement results that characterize the test object for a set of frequencies (for example, in the form of directly measured calibrated units or arbitrary units), or are based on a plurality of far-field measurement results that characterize the test object for a set of frequencies (for example, after they have been further processed, such as by subjecting them to at least one of the following procedures: filtering, rescaling, noise removal, transforming, convolution, clipping, and compression).

[0123] The first measurement data, or at least one or more values ​​of the first measurement data, can be obtained on the basis of a wireless transmission of a signal by the test object 110, or will be obtained if the test object 110 wirelessly transmits a signal (for example, to the test setup 120 or another test setup for the first measurement; for example, to the antenna 122 of the test setup 120).

[0124] The second set of measurement data can be obtained for different distances x, for which near-field conditions apply between the test object and the antenna of the test setup (for example, a threshold between the far field and the near field, such as the Fraunhofer distance 2D). 2 / λ).

[0125] The second set of measurement data may include a first set of near-field measurement results associated with a first distance between the test object 110 and the antenna 122 of the test arrangement 122 (for example, for the first distance between the test object 110 and the antenna 122 of the test arrangement 120) (where, for example, the values ​​of the first set of near-field measurement results are associated with different frequencies, for example, determined for different frequencies).The second set of measurement data may include a second set of near-field measurement results associated with a second distance between the test object 110 and the antenna 122 of the test arrangement 120 (for example, obtained for the first distance between the test object 110 and the antenna 122 of the test arrangement 120) (where, for example, the values ​​of the second set of near-field measurement results are associated with the different frequencies, for example, for which different frequencies were determined).

[0126] The values ​​of the first set of near-field measurement results can correspond to the values ​​of the second set of near-field measurement result values ​​(which are measured, for example, for at least substantially the same frequencies or a subset of frequencies), except that the values ​​of the first set of measurement result values ​​are determined for the first distance and that the values ​​of the second set of near-field measurement result values ​​are determined for the second distance.

[0127] The second set of measurement data can have one or more values, where the one or more values ​​of the second set of measurement data include at least one of the following: a power value (for example, in milliwatts or dBm), a gain value (for example, in decibel units), a gain step value (for example, in decibel units), a gain compression value (for example, 1 dB compression point (P1db)), a phase shift value (for example, in degree units, for example, phase shift during beamforming), a gain difference value in a frequency range, an error vector magnitude value (for example, in dBc units), an isolation value (for example, degree of isolation between different polarization directions), a disturbance value (for example, to indicate interference radiation), and an adjacent channel power ratio value.

[0128] The second measurement data, or at least one or more values ​​of the second measurement data, can be obtained on the basis of a wireless transmission of a signal by the test object 110, or are obtained when the test object 110 wirelessly transmits a signal (for example, to the test arrangement 120 for the second measurement; for example, to the antenna 122 of the test arrangement 120).

[0129] The method may include executing a production test program that controls testing of the test object 110 (and preferably outputs one or more measurement result values ​​per frequency) for a plurality of test frequencies and for a plurality of distances (for example, between the test object 110 and the antenna 112 of the test arrangement 120) in order to obtain the second set of measurement data. The production test program may assign the predetermined values ​​for the plurality of test frequencies and / or for the plurality of distances to different types of test objects 110 (for example, from different manufacturers or different production lines of a manufacturer).The production test program can be configured to identify a test object 110 based on user input, a schedule, or an optical sensor, and to set the predetermined values ​​for the majority of test frequencies and / or for the majority of distances based on the identified test object 110. At least one of the majority of test frequencies and one of the majority of distances can be set by a user.

[0130] The method may involve using a production test test program that is repeated one or more times with a modified distance between the test object 110 and the antenna 122 of the test setup 120. The method may also involve using a production test test program that is supplemented by functionality for performing a repetition (e.g., of a test sequence) and modifying a distance between the test object 110 and the antenna 122 of the test setup 120. For example, the production test test program may trigger a function to modify the distance and then trigger a function to test at a set of frequencies (where the set of frequencies may be identical or may change, for example, based on the distance).

[0131] The method can involve varying the distance between the test object 110 and the antenna 122 of the test setup 120 between measurements used to obtain the near-field measurement result (where the distance is varied, for example, using an actuator (e.g., an electrical actuator, such as the motor 146) that can vary the position of the antenna 122 of the test setup 120). The method can involve generating control signals for an actuator (e.g., a motor 146) that varies the position of the antenna 122 of the test setup 120. The method can involve varying the distance between the test object and the antenna of the test setup in steps (e.g., in equal and / or fixed steps or varying step sizes).

[0132] The method may include generating a control signal to control movements of the table 144 (for example, a linear table; for example, with a motor) which holds the antenna 122 of the test arrangement 120, wherein the control signal causes the table to move to at least two of the different distances (for example, by causing the motor 146 to drive).

[0133] The method can include generating a control signal to move the table 144 to a predefined initial position (for example, using a signal from sensor 150; using a reset signal from a switch). The method can further include generating a control signal to move the table 144 from the predefined initial position by a distance increment.

[0134] Fig. Figure 9 shows a flowchart 960 of an exemplary method for controlling a distance between a test object 110 and an antenna 120 of the test setup 120. However, each of the steps of the method can be used with any other test setup and / or any other test object disclosed herein.

[0135] The procedure may include, in step 961, triggering a reset of the position of a table (for example, table 144) that holds the antenna 122. The procedure may also include resetting a table to a predefined starting position (for example, resetting a linear table to a defined starting position). The reset may be triggered by at least one element of the group comprising user input, a production test program, a switch of the test setup, and one or more sensors, which detects that one or more criteria are met (for example, the insertion of the test object 110 into the device socket 128 and / or the coupling of the test device 140 with the support structure 126).

[0136] The procedure can, at step 962, involve moving table 144 to a predefined position x. min exhibit (for example, moving a linear table to x) minThe procedure can involve reducing the distance between the test object 110 and the antenna 122 (or the table 144) until a criterion is met. The criterion can be that the table 144 stops (for example, because it is moved to an end stop) or that the sensor 150 detects a predefined position (for example, contact between the reference structure 152 and the switch of the sensor 150). The predefined position can be the position at which the criterion is met or it can be a position offset from the position at which the criterion is met. For example, the table 144 can be moved to an end stop (for example, downwards) and then by a predetermined increment (for example, upwards) to the predefined position x. mincan be moved. In another example, the table 144 can be moved (for example downwards) until the sensor 150 makes contact with the reference structure 152, which is the predefined position x. min defined, detected. In another example, the table 144 can be moved (for example downwards) until the sensor 150 detects a contact between the reference structure 152 and the switch of the sensor 150, whereupon the table 144 is subsequently moved by a predetermined increment (for example upwards) or until the sensor 150 no longer detects a contact between the reference structure 152 and the switch of the sensor 150.

[0137] The procedure can include setting a parameter p at step 963. x (which can be the distance x or a parameter representative of the distance x or of the position of the table 144) to a value p x,min (the predefined position x minor can be representative of them). The parameter p x can be measured at a distance (for example, in millimeters) in a position of a movable element (for example, a shaft rotatable by the motor 135) of the motor 135 or another parameter that specifies the position of the table 144 (or the position of the antenna 122).

[0138] The procedure can, at step 964, include executing a test program for the set of frequencies to be tested and logging (for example, at least one of the elements of the group that scale, process, and store) the results. The test program can include any method disclosed herein for testing the near field of the test object 110.

[0139] The procedure can be used to set the parameter p at step 965. x exhibit a new value that is a sum of the previous value p x and a value p x,stepis the one that represents a step (interval) or a distance difference x step can be representative. The value p x,step (and / or x) step ) can be a constant (e.g., predetermined) value or vary with each step. For example, the value p can be x,step depend on at least one element of the group that defines the distance x, the parameter p x and a gradient of x or p x,step includes the value p x,step For example, it can define or correspond to a step interval between 0.1 and 2.0 mm (e.g., 1 mm).

[0140] The procedure may include a comparison at step 966 to see if the (new) parameter p x a threshold p x,max exceeds a threshold distance x max can be or represent. The threshold distance x maxcan be at least one element of the group that includes a maximum distance to which the table 144 can be moved, a predetermined threshold, a distance that defines a transition between the near and far fields (for example, the Fraunhofer distance), and a threshold associated with the test object 110. The predetermined threshold (and thus, for example, the threshold distance x) maxThe predetermined threshold can be defined based on one or more geometric properties of a predetermined test setup, such as a test setup to be used for subsequent measurements (e.g., using the optimized distance). The predetermined threshold can, for example, be based on a maximum distance (e.g., between the test object 110 and an antenna of the test setup) permitted by the test setup. The predetermined test setup (e.g., for the subsequent measurements) can be a commercial handling device or a mass-produced handling device.The handling device may, for example, have a coupling mechanism (e.g., with clamps) configured to couple to a socket (e.g., any device socket disclosed herein) or a support structure (e.g., any support structure disclosed herein) in order to position the handling device's antenna at a predefined distance relative to a test object (e.g., any test object disclosed herein). The predefined distance between the handling device's antenna and the test object may, for example, be between 4 cm and 6 cm, or around 5 cm. The predetermined threshold (and thus, for example, the threshold distance x) max) can be the predetermined distance of the handling device. However, the predetermined distance can be defined based on the predefined distance to account for one or more factors, such as the thickness of the handling device's antenna and / or the thickness of the test object. For example, the predefined distance between the handling device's antenna and the socket might be 5 cm, the thickness of the handling device's antenna might be 0.1 cm, and the thickness of the test object might be 0.2 cm. In such a case, the predetermined threshold (and thus, for example, the threshold distance x) can be max ) 5 cm - 0.1 cm - 0.2 cm = 4.7 cm. That is, the predetermined threshold (and thus, for example, the threshold distance x) max) can be a maximum distance permitted by a commercial handling device, for example, for a standard (e.g., unmodified) integration of an over-the-air (OTA) test setup. This distance (e.g., the threshold distance x) max ) can be, for example, 5 cm or 4 cm (or a range between 4 cm and 5 cm), depending on several factors, such as the thickness of the measuring antenna and the thickness of the package of the test object. Step 966 can essentially be used to check whether the table 144 has reached a final distance of a distance range under test.

[0141] If comparison step 966 results in the parameter p being x the threshold p x,max If the value is not exceeded, the procedure can also, at step 967, move the table 144 (for example upwards) by the step x. step(for example, within a range of 0.1 mm to 2.0 mm, for example, 1 mm), which corresponds to the value p x,step The procedure can then repeat steps 964, 965, and 966 as previously described.

[0142] If comparison step 966 results in the parameter p being... x the threshold p x,max If the time limit is exceeded, the procedure may include the completion of the second set of measurement data (for example, the near-field measurement data) at step 967. The second set of measurement data can be generated after measuring the near field at the last distance (for example, based on temporary data) or continuously during measurements at each distance.

[0143] An example of near-field measurement values ​​determined for different distances is in relation to Fig. 10a, b described. An example of determining an optimized distance, as described in [reference], follows. Fig. 9 shown, described.

[0144] Fig. Figure 10a shows results of a simulation of scattering parameters S 11 (Reflection) and S 21 (Transmit) for different separation distances between the test object 110, which also corresponds to connection 1 in terms of scattering parameters, and the antenna 122, which also corresponds to connection 2 in terms of scattering parameters.

[0145] The simulations were performed for a simple case in which the test object was used, for example, as a patch antenna (e.g., test object 310 in Fig. 3) is executed and the antenna 12 is used, for example, as a measuring field (for example, the antenna 322 in Fig. 3) is performed. The simulations are carried out with an exemplary wavelength of 12.49 mm, which corresponds to 24 GHz (that is, a lower end of the FR2 frequency range).

[0146] The in Fig. The simulation results shown in Figure 10a illustrate, for example, the standing wave behavior for the simple case of a patch antenna. Ideally, at certain distances between the test object (e.g., the AiP-DUT antenna array) and antenna 12 (e.g., the OTA measurement antenna), resonance can occur. This resonance leads to variations at different distances. Such resonance can, for example, exhibit a periodicity of half the wavelength (e.g., approximately 6.2 mm) of the transmitted wavelength (e.g., 12.45 mm). Fig. Figure 10a shows simulation results for a single wavelength (or frequency) to illustrate resonance effects. The method disclosed here is carried out for a set of frequencies and thus for more than one frequency.

[0147] Fig. Figure 10b shows the results of the phase difference between the simulated S 21-Transmission phase and a linear phase for different separation distances between the test object 110 and the antenna 122.

[0148] The in Fig. The phase results shown in Figure 10b demonstrate the variation for different distances compared to an expected linear phase variation with multiple resonance points, where the periodicity of the resonances in the phase difference also corresponds to half the transmitted wavelength.

[0149] When performing measurements in the near field, pronounced resonance effects can reduce measurement accuracy. In the Fig. The sending of the parameters S differs from the example shown in 10a. 21 and S 11The resonances are more pronounced at a distance of approximately 12 mm than at a distance of 15 mm, where they are less so. Therefore, measurement accuracy can be improved by selecting distances that reduce or even eliminate resonance effects. The method disclosed here involves determining such an optimized (e.g., readily usable, optimal, or ideal) distance based on the first and second measurement data.

[0150] The optimized distance can be determined using a plurality of far-field measurement results associated with different frequencies (e.g., a set of frequencies) and corresponding near-field measurement results (also associated with different frequencies, e.g., a set of frequencies). Determining the optimized distance can involve averaging (e.g., with or without weighting) the difference between a plurality of far-field measurement results associated with different frequencies (e.g., a set of frequencies) and corresponding near-field measurement results (also associated with different frequencies, e.g., a set of frequencies).

[0151] According to Fig. Figure 9 provides an example for determining the optimized distance in one step by comparing the measurement data for each distance x with reference far-field data and determining a distance x with the best correlation between the first and second measurement data. Fig. Figure 9 shows an example of a method for obtaining the second measurement and an example of determining the optimized distance. However, any other method disclosed herein for obtaining the second measurement can be combined with any example disclosed herein for determining the optimized distance.

[0152] That in relation to Fig. The method described in section 9 can, for example, be used as an algorithm to determine a distance between the test object 110 and the antenna 112 of the test setup 120 (for example, an optimized or ideal distance between the DUT AiP and the measuring antenna) of a minimum distance x. minup to a maximum distance x max with a step size x step to determine. x is, for example, the current distance between the test object 110 (e.g., a DUT AiP) and the antenna 122 of the test setup 120 (e.g., an ATE measuring antenna). A "golden object" (i.e., the test object being measured for reference data) can, for example, be measured before or after in the far field.

[0153] Fig. Figure 11a shows an example of first measurement data 970 and second measurement data 974. This is in Fig. Example 11a shows values ​​of radiated power P out of a test object (for example, any test object disclosed here). Alternatively or additionally, any other metric (or value) described here can be used.

[0154] The first measurement data 970 includes a first value 972a, measured in the far field at a first frequency from a set of frequencies and represented as a horizontal dashed line. The first measurement data 970 includes a second value 972b, measured in the far field at a second frequency from the set of frequencies and represented as a horizontal solid line. The set of frequencies may include more than the first and second frequencies. It should be noted that the first and second values ​​972a and b are represented as horizontal lines to facilitate comparison with the values ​​of the second measurement data 974 and are not to be understood as constant values ​​for all distances.

[0155] The second set of measurement data 974 shows an initial set of values ​​976a-l (in Fig. 11a with circles) which are for a plurality of distances (in the example of Fig. 11 total of twelve distances) between the test object 110 and the antenna 122 of the measuring arrangement 120 are obtained or are associated with the majority of distances between the test object 110 and the antenna 122 of the measuring arrangement 120 (for example, taking into account a rescaling) and are measured at the first frequency of a set of frequencies.

[0156] The second set of measurement data 974 shows a second set of values ​​978a-d (in Fig. 11a with circles) which are for the majority of distances (in the example of Fig. 11 total of twelve distances) between the test object 110 and the antenna 122 of the measuring arrangement 120 are obtained or are associated with the majority of distances between the test object 110 and the antenna 122 of the measuring arrangement 120 (for example, taking into account a rescaling) and are measured at the second frequency of a set of frequencies.

[0157] The first and / or second measurement data 974 may contain values ​​obtained through direct measurement or values ​​related to those obtained through measurement. For example, the first and second measurement data 974 may be rescaled (e.g., to account for attenuation at larger distances) or otherwise processed (e.g., filtered, denoised, or compressed).

[0158] Fig. 11b shows a selection of values ​​from the in Fig. Figure 11a shows the first and second measurement data. The selection of values ​​makes it possible to describe the procedure described here using only two frequencies and two intervals for better understanding.

[0159] The second measurement data shows a value of 976g (in Fig. 11b shown as circles) which is obtained for a first distance and a value 976i at a second distance between the test object 122 and the antenna 122 of the measuring arrangement 120 or is connected with the first and second distances between the test object 110 and the antenna 122 of the measuring arrangement 120, measured at the first frequency

[0160] The second measurement data shows a value of 978g (in Fig. 11b represented as squares) which is obtained for the first distance and a value 978i at a second distance between the test object 122 and the antenna 122 of the measuring arrangement 120 or is connected with the first and second distance between the test object 110 and the antenna 122 of the measuring arrangement 120, measured at the second frequency.

[0161] Determining the optimized distance can involve comparing the value 976g of the second set of measurements (for example, a value from a first set of values) obtained for the first distance (for example, measurements associated with the first frequency) with one or more corresponding values ​​972a of the first set of measurements 970 to obtain an initial comparison result. This initial comparison result can describe a similarity between the second set of measurements (for example, the value 976g) obtained for the first distance and the first set of measurements 970. In the Fig. In the example shown in Figure 11b, the first comparison result is a difference 980g between the value 978g and the first value 972a, which is measured in the far field at a first frequency. Alternatively, other similarity measures can be used, for example, a square root of the distance or a comparison with a (fixed or variable) threshold. It should be noted that a corresponding value 972a of the first measurement data 970 is not limited to an identical frequency. One or more corresponding values ​​972a of the first measurement data 970 can be one or more nearest frequencies or one or more frequencies within a threshold.

[0162] Determining the optimized distance may further involve comparing the value 976i of the second measurement data (for example, a value from a second set of values) obtained for the second distance with one or more corresponding values ​​972a of the first measurement data to obtain a second comparison result (for example, a difference 980i).

[0163] Determining the optimized distance can involve determining the optimized distance based on the first comparison result and the second comparison result. For example, the optimized distance can be determined as the distance with the smallest comparison result. In the Fig. In the example shown in 11b, the optimized distance can be determined as the distance associated with the value 976g (or the first comparison result 980g), since the difference 980g of the first comparison result is smaller than the difference 980i of the second comparison result.

[0164] The example described above uses values ​​from the second measurement data point 974, which are only obtained at the first frequency. The method can use values ​​obtained for more than one frequency.

[0165] The procedure may include determining a first comparison result, which is associated with the first distance (for example, the difference 980g determined for the first frequency and a difference 981g determined for the second frequency) and the second distance (for example, the difference 980i determined for the first frequency and a difference 981i determined for the second frequency) which are determined from the second measurement data 974 obtained for the first frequency and the second frequency.

[0166] Determining the optimized distance can involve determining the optimized distance based on the first and second comparison results. Using the example of the differences 980g, 980i, 981g, 98i between the values ​​of the second measurement data 974 and the first measurement result 972, a measure can be formed for each of the first and second distances that represents a combination of the respective differences (for example, a sum, arithmetic mean, geometric mean, or harmonic mean of the differences), and the resulting measure can be compared for each distance. For example, the first comparison result might be a sum of the differences 980g and 978g, and the second comparison result might be a sum of the differences 980i and 976i. In the Fig. In the example shown in Figure 11b, the sum of the differences 980g and 978g is smaller than the sum of the differences 980i and 976i. Therefore, the distance associated with the values ​​976g and 978g can be determined as the optimized distance.

[0167] In the Fig. In the example shown in Figure 11b, the optimized distance was determined based on values ​​from the second measurement data set, 974, which are associated with only two distances. Alternatively, more than two distances (for example, three, four, five, or more) can also be used. Fig. For example, 11a, the second measurement data 974 of all twelve distances can be used.

[0168] In the Fig. In the example shown in 11a and b, the first and second measurement data are determined only for a first and second frequency. However, more than two frequencies (for example, three, four, five or more) can also be used.

[0169] Fig. 12a shows the quantities 982a-l, which correspond to the first and second measurement data from Fig. 11a are connected.

[0170] The second set of measurement data 974 can include a first set 982a of near-field measurement results associated with a first distance between the test object 110 and the antenna 122 of the test setup 120 (for example, for the first distance between the test object 110 and the antenna 122 of the test setup 120). For example, the values ​​of the first set 982a of near-field measurement results are associated with different frequencies (for example, the first and second frequencies).

[0171] The second set of measurement data 974 includes a second set 982b of near-field measurement results, which are associated with a second distance between the test object 110 and the antenna 122 of the test setup 120 (for example, for the second distance between the test object 110 and the antenna 122 of the test setup 120). For example, the values ​​of the second set 982b of near-field measurement results are associated with the different frequencies (for example, the first and second frequencies).

[0172] The values ​​of the first set 982a of near-field measurement results can correspond to the values ​​of the second set 982b of near-field measurement result values, except that the values ​​of the first set 982a are determined from measurement result values ​​for the first distance and the values ​​of the second set 982b are determined from near-field measurement result values ​​for the second distance. As in Fig. As can be seen in 12a, the second measurement data 974 can show more than two quantities 982. With regard to Fig. However, section 12a describes examples of the procedure in which only the first and second sets 982a, b are used.

[0173] The optimized distance can be determined depending on deviations between the sets 982a, b of near-field measurement results and a (corresponding) set of far-field measurement results (contained in the initial measurement data). The set of far-field measurement results can be considered as reference far-field data. The set of far-field measurement results can have one or more values ​​for each frequency of the set of frequencies (where Fig. 12a shows, for example, the value 972a for the first frequency and the value 972b for the second frequency).

[0174] The deviation can be determined, for example, as an unsigned (or absolute) deviation (e.g., as the sum of absolute differences between the near-field and far-field measurement results), as a signed deviation (e.g., as the sum of differences between the near-field and far-field measurement results), and as a quadratic deviation (e.g., as the sum of the squares of the differences between the near-field and far-field measurement results). Alternatively or additionally, the optimized distance can be determined as a function of a deviation between the quantities 982a, b of near-field measurement results and a mean value of the quantities 982a, b of near-field measurement results.

[0175] Fig. Figure 12b shows an example of deviations (represented as triangles) that apply to sets 982a-l from Fig. 12a will be determined.

[0176] The deviation determined for the first quantity 982a is larger than for the second quantity 982b. Therefore, if only the first and second quantities 982a and 982b are used, the optimized distance can be the one associated with the second quantity 982b, since it has a smaller deviation.

[0177] When all twelve quantities of 982a-l are used, more intervals are available for determining the optimized distance. In the Fig. In the example shown in Figure 12b, the deviation for quantity 982l is the smallest of the quantities 982a-l. Therefore, the distance associated with quantity 982l can be determined as the optimized distance. However, other factors can also be taken into account. For example, the deviations or the values ​​used to determine the deviations can be modified. For instance, the deviations can be scaled according to the associated distance (for example, the deviations of quantities 982a-l can be multiplied by a scaling factor that depends on the respective distance, for example, if smaller or larger distances are preferred).

[0178] The optimized distance can be determined such that the difference between a far-field measurement result and a corresponding near-field measurement result is less than a predetermined maximum deviation for all frequencies in the set of frequencies, or such that the difference between a far-field measurement result and a corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies in the set of frequencies. If, for a plurality of distances, it is determined that the difference is less than (or equal to) the predetermined maximum deviation for all frequencies in the set of frequencies, the plurality of distances may be suitable for further testing. The plurality of distances can be provided to a user (for example, for selection of a distance).If no distance is determined to have a difference less than (or equal to) the specified maximum deviation for all frequencies in the set of frequencies, an output can be generated indicating that no distance meets this requirement.

[0179] The optimized distance can be determined in such a way that a near-field measurement result or a difference between a far-field measurement result and a corresponding near-field measurement does not show a resonance effect (for example, beyond a predetermined maximum deviation) for all frequencies of the set of frequencies.

[0180] The presence of a resonance effect can be detected by comparing near-field measurement results for a given frequency and a plurality of distances with an average of the near-field measurement results for the given frequency and plurality of distances, whereby a deviation from the average value that is greater than a predetermined threshold can be identified as a resonance effect. The method can include avoiding a distance at which a significant resonance effect occurs (which, for example, exceeds a threshold) that substantially degrades a near-field measurement result at at least one frequency of the set of frequencies.

[0181] The method can involve determining one or more distances with a resonance effect. The method can involve fitting near-field measurement results of the same frequency to a comparison function (which is determined, for example, based on at least one element of the group comprising a predetermined function and one or more values ​​of the near-field measurement result of the same frequency, and an average of one or more values ​​of the near-field measurement result of the same frequency) and determining distances at which the near-field measurement result satisfies a deviation criterion from the fitted near-field measurement result, such as an absolute or relative deviation.The method can involve determining one or more periodic patterns in the near-field measurement result (for example, using a Fourier transform and / or the wavelength used for the near-field measurement result) and determining local extrema (for example, local maxima and / or local minima). Determining one or more distances exhibiting a resonance effect can be based on a specific value type in the near-field measurement result. For example, in measurements of the radiated power of the device under test, resonance effects can be identified as local minima, while in measurements of the reflected power of the device under test, resonance effects can be identified as local maxima. In measurements of a phase difference, for example, resonance effects can be identified as a maximum or minimum with the largest absolute value (for example, within a specific pattern period).

[0182] The method can involve assigning a resonance indicator to one or more distances with respect to a resonance effect. The method can also involve assigning no resonance indicator to a distance that has no resonance effect, or assigning a resonance indicator indicating that the distance has no resonance effect to a distance that has no resonance effect. The resonance indicator can indicate that a resonance has been determined for the assigned distance. The resonance indicator can specify a measure (or degree) of the resonance effect (for example, based on a deviation or an absolute value of the near-field measurement result).The method can involve determining the optimized distance as a distance with no resonance effect or with the least resonance effect (for example, based on the resonance indicator for each of the distances, for example, based on a sum of the measure (or degree) of the resonance effect for each distance).

[0183] The described method enables the determination of an optimized distance for testing a test object 110. The optimized distance can then be used to test further test objects (for example, for test objects of the same (or at least similar) type, for example, for test objects that have the same (or at least a similar) near field and / or far field).

[0184] Fig.Figure 13 shows a flowchart 1390 of an exemplary procedure for testing a plurality of test objects. The procedure can be used with any test object 110 and any test setup disclosed herein.

[0185] The method includes, in step 1391, determining an optimized distance between the test object 110 and an antenna 122 of the test arrangement 120 using a method described herein, wherein the optimized distance is determined using a production test test program that is repeated one or more times with a modified distance between the test object 110 and the antenna 122 of the test arrangement 120 to determine the optimized distance, or wherein the optimized distance is determined using a production test test program that is supplemented by a functionality to cause a repetition (for example, of a test sequence) and a modification of a distance between the test object and the antenna of the test arrangement to determine the optimized distance.

[0186] The procedure involves testing a plurality of test objects using the production test program at step 1392, whereby a distance between the test objects is kept constant at the previously determined optimized distance. Implementation alternatives

[0187] Although some aspects have been described in connection with a device, it is clear that these aspects also constitute a description of the corresponding process, where a block or device corresponds to a process step or a feature of a process step. Similarly, aspects described in connection with a process step also constitute a description of a corresponding block, element, or feature of a corresponding device.

[0188] Depending on specific implementation requirements, embodiments of the invention can be implemented in hardware or software. The implementation can be carried out using a digital storage medium, for example a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM, or flash memory, on which electrically readable control signals are stored that can interact with a programmable computer program to execute the respective method.

[0189] Some embodiments according to the invention include a data carrier with electronically readable control signals that can work together with a programmable computer system, so that one of the methods described herein is carried out.

[0190] In general, embodiments of the present invention can be implemented as a computer program product comprising program code, wherein the program code is functional for executing one of the methods when the computer program product runs on a computer. The program code can, for example, be stored on a machine-readable medium.

[0191] Other embodiments include the computer program for executing one of the methods described herein, stored on a machine-readable medium.

[0192] That is to say, an embodiment of the method according to the invention is thus a computer program with program code for executing one of the methods described herein when the computer program is running on a computer.

[0193] Another embodiment of the method according to the invention is thus a data carrier (or a digital storage medium or a computer-readable medium) on which the computer program for executing one of the methods described herein is recorded. The data carrier, the digital storage medium, or the recorded medium is typically physical and / or non-volatile.

[0194] Another embodiment of the method according to the invention is therefore a data stream or a sequence of signals for representing the computer program for executing one of the methods described herein. The data stream or sequence of signals can, for example, be configured to be transmitted via a data communication connection, such as the Internet.

[0195] Another embodiment includes a processing means, for example a computer or a programmable logic module, configured or adapted to perform one of the methods described herein.

[0196] Another embodiment includes a computer on which the computer program for executing one of the methods described here is installed.

[0197] Another embodiment of the invention comprises a device or system configured for transmitting (for example, electronically or optically) a computer program for executing one of the methods described herein to a receiver. The receiver can be, for example, a computer, a mobile device, a storage device, or the like. The device or system can, for example, include a file server for transmitting the computer program to a receiver.

[0198] In some embodiments, a programmable logic device (for example, a field-programmable gate array) can be used to perform some or all of the functionalities of the methods described here. In some embodiments, a field-programmable gate array can work in conjunction with a microprocessor to perform one of the methods described here. Generally, the methods are performed by any hardware device.

[0199] The device described here can be implemented using a hardware device, a computer, or a combination of a hardware device and a computer.

[0200] The device described herein, or any components thereof, may be implemented at least partially in hardware and / or software.

[0201] The procedures described here can be carried out using a hardware device, using a computer, or using a combination of a hardware device and a computer.

[0202] The embodiments described above serve only to illustrate the principles of the present invention. It should be noted that modifications and variations of the arrangements and details described herein are obvious to a person skilled in the art. Therefore, the intention is to limit the scope of the invention through the scope of the pending claims, and not through the specific details presented here to describe and explain the embodiments.

Claims

[1] Method (800) for determining an optimized distance between a test object (110; 310; 510; 1310a; 1310b) and an antenna (122; 322; 522) of a test setup (120; 520), the method comprising the following steps: Obtained (802) from initial measurement data (970), wherein the initial measurement data (970) represent a plurality of far-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for a set of frequencies, or wherein the initial measurement data (970) are based on a plurality of far-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for a set of frequencies; Obtained (804) from second measurement data (974), wherein the second measurement data (974) represent a plurality of near-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for the set of frequencies, or wherein the second measurement data (974) are based on a plurality of near-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for the set of frequencies; wherein at least two of the near-field measurement results are recorded at different distances between the test object (110; 310; 510; 1310a; 1310b) and an antenna (122; 322; 522) of the test setup (120; 520); and Determine (806) the optimized distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) based on the first and second measurement data (974). [2] Method (800) according to claim 1, wherein determining the optimized distance comprises the following steps: Comparing one or more values ​​of the second measurement data (974), obtained for or associated with a first distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the measurement setup, with one or more corresponding values ​​of the first measurement data (970) to obtain a first comparison result; and Comparing one or more values ​​of the second measurement data (974), obtained for a second distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the measurement setup, or associated with a second distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the measurement setup, with one or more corresponding values ​​of the first measurement data (970) to obtain a second comparison result; and Determining the optimized distance based on the first comparison result and the second comparison result. [3] Method (800) according to claim 2, wherein the first and second measurement data (974) or at least one or more values ​​of the first and second measurement data (974) are obtained on the basis of a wireless transmission of a signal by the test object (110; 310; 510; 1310a; 1310b) or are obtained when the test object (110; 310; 510; 1310a; 1310b) wirelessly transmits a signal. [4] Method (800) according to claim 2 or 3, wherein one or more values ​​of the first measurement data (970) have at least one of the following values: a power value, a gain value, a gain stage value, a gain compression value, a phase shift value, a gain difference value in a frequency domain, an error vector magnitude value, an isolation value, a noise value, and a neighboring channel power ratio value; and wherein one or more values ​​of the second measurement data (974) include at least one of the following: a power value, a gain value, a gain stage value, a gain compression value, a phase shift value, a gain difference value in a frequency domain, an error vector size value, an isolation value, a disturbance value and a neighboring channel power ratio value. [5] Method (800) according to one of claims 2, 3 or 4, wherein the first and second measurement data (974) or at least one or more values ​​of the first and second measurement data (974) are obtained on the basis of a wireless reception of a signal by the test object (110; 310; 510; 1310a; 1310b) or are obtained when the test object (110; 310; 510; 1310a; 1310b) wirelessly receives a signal. [6] Method (800) according to any one of claims 2 to 5, wherein one or more values ​​of the first measurement data (970) have at least one of the following values: a power, a gain value, a gain stage value, a third-order intercept point value, a phase shift value, a gain difference value in a frequency domain, an error vector magnitude value, an isolation value, and a noise figure value, and where one or more of the values ​​of the second measurement data (974) must have at least one of the following values: a power value, a gain value, a third-order interception point value, a phase shift value, a gain difference value in a frequency range, an error vector size value, an isolation value, and a noise figure value. [7] Method (800) according to any one of claims 2 to 6, wherein the second measurement data (974) include a first set (982a) of near-field measurement result values ​​associated with a first distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test arrangement (120; 520), and wherein the second measurement data (974) include a second set (982b) of near-field measurement result values ​​associated with a second distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520), where the optimized distance is determined depending on deviations between the sets of near-field measurement results and a set of far-field measurement results. [8] Method (800) according to any one of claims 1 to 7, wherein the optimized distance is determined using a plurality of far-field measurement results associated with different frequencies and corresponding near-field measurement results. [9] Method (800) according to any one of claims 1 to 8, wherein determining the optimized distance comprises averaging a difference between a plurality of far-field measurement results associated with different frequencies and corresponding near-field measurement results. [10] Method (800) according to any one of claims 1 to 9, wherein the optimized distance is determined such that a difference between a far-field measurement result and a corresponding near-field measurement result is smaller than a predetermined maximum deviation for all frequencies of the set of frequencies, or where the optimized distance is determined such that a difference between a far-field measurement result and a corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies of the set of frequencies. [11] Method (800) according to any one of claims 1 to 10, wherein the optimized distance is determined such that a near-field measurement result or a difference between a far-field measurement result and a corresponding near-field measurement does not show a resonance effect for all frequencies of the set of frequencies. [12] Method (800) according to any one of claims 1 to 11, wherein the method comprises determining a single distance as an optimized distance which is used for all frequencies of the set of frequencies. [13] Method (800) according to any one of claims 1 to 12, wherein the method comprises the use of a production test test program to obtain the first measurement data (970). [14] Method (800) according to any one of claims 1 to 13, wherein the method comprises executing a production test program which controls testing the test object (110; 310; 510; 1310a; 1310b) for a plurality of test frequencies for a plurality of distances in order to obtain the second measurement data (974). [15] Method (800) according to any one of claims 1 to 14, wherein the method comprises the use of a production test test program that is repeated one or more times with a modified distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) to determine the optimized distance, or wherein the method includes the use of a production test test program which is supplemented by a functionality to effect a repetition and modification of a distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test arrangement (120; 520) in order to determine the optimized distance. [16] Method (800) according to any one of claims 1 to 15, wherein the method comprises varying a distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test arrangement (120; 520) between the measurements used to obtain the near field measurement result. [17] Method (800) according to any one of claims 1 to 16, wherein the method comprises varying the distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test arrangement (120; 520) in steps. [18] Method (800) according to any one of claims 1 to 17, wherein the method includes determining which subset of the second measurement data (974) from a plurality of subsets of the second measurement data (974) connected by different distances has a maximum similarity to the first measurement data (970), and wherein the method involves determining the optimized distance on this basis. [19] Method (800) according to any one of claims 1 to 18, further comprising the following step: Determining distances with a standing wave behavior for each frequency of the set of frequencies, wherein the optimized distance is determined from distances with no or the lowest standing wave behavior. [20] A method according to any of the preceding claims, further comprising the following step: Generating a control signal to control movements of a table supporting the antenna (122; 322; 522) of the test arrangement (120; 520), wherein the control signal causes the table to move at least two of the different distances. [21] Method (1390) for testing a plurality of test objects, wherein the method comprises determining an optimized distance between the test object (110; 310; 510; 1310a; 1310b) and an antenna (122; 322; 522) of the test arrangement (120; 520) using a method according to one of claims 1 to 20, wherein the optimized distance is determined using a production test test program that is repeated one or more times with a modified distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) to determine the optimized distance, or wherein the optimized distance is determined using a production test test program which is supplemented by a functionality to cause a repetition and modification of a distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) in order to determine the optimized distance. wherein the method involves testing a plurality of test objects using the production test program, wherein a distance between the test object (110; 310; 510; 1310a; 1310b) is kept constant at the previously determined optimized distance. [22] Computer program for carrying out the method according to any one of claims 1 to 21 when the computer program is executed on a computer. [23] Test setup (120; 520) for determining an optimized distance between a test object (110; 310; 510; 1310a; 1310b) and an antenna (122; 322; 522) of a test setup (140; 540), wherein the test setup (120; 520) is configured to obtain initial measurement data (970), wherein the initial measurement data (970) represent a plurality of far-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for a set of frequencies, or wherein the initial measurement data (970) are based on a plurality of far-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for a set of frequencies; wherein the test setup (120; 520) is configured to obtain second measurement data (974), wherein the second measurement data (974) represent a plurality of near-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for the set of frequencies, or wherein the second measurement data (974) are based on a plurality of near-field measurement results that characterize the test object (110; 310; 510; 1310a; 1310b) for the set of frequencies; wherein at least two of the near-field measurement results are recorded at different distances between the test object (110; 310; 510; 1310a; 1310b) and an antenna (122; 322; 522) of the test setup (120; 520); and wherein the test setup (120; 520) is configured to determine the optimized distance between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) based on the first and second measurement data (974). [24] Test setup (120; 520) according to claim 23, further comprising the following feature: a device socket (128) configured to receive the test object (110; 310; 510; 1310a; 1310b); wherein the test setup (120; 520) is configured to perform a plurality of tests when the test object (110; 310; 510; 1310a; 1310b) is positioned in the device socket (128) to obtain the near-field measurement results for the set of frequencies, wherein at least two of the tests are carried out at different distances between the test object (110; 310; 510; 1310a; 1310b) and the antenna (122; 322; 522) of the test setup (120; 520) in order to obtain near-field measurement results for the at least two different distances. [25] Test setup (120; 520) according to claim 23 or 24, further comprising the following feature: a table that supports the antenna (122; 322; 522) of the test setup (120; 520) and is configured to move at least two different distances relative to the device socket (128). [26] Test arrangement (120; 520) according to one of claims 23 to 25, which further comprises the following feature: a far-field test device (140; 540) configured to perform a test of the test object (110; 310; 510; 1310a; 1310b) at the set of frequencies in a far-field state in order to obtain the first measurement data (970). [27] Test arrangement (120; 520) according to one of claims 23 to 26, which further comprises the following feature: a data interface configured to receive the first measurement data (970) and / or second measurement data (974). [28] Test setup (120; 520) according to one of claims 23 to 27, wherein the test setup (120; 520) is configured to perform a method according to one of claims 1 to 21.

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