OCT-SPECKLE VELOCITY MEASUREMENT

DE23771572T1Undetermined Publication Date: 2025-03-27TOPCON CORPORATION
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Patent Information

Application Number
DE112023771572
Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-03-14
Filing Date
2023-03-14
Publication Date
2025-03-27
Patent Text Reader

Abstract

Method comprising: Acquiring optical coherence tomography (OCT) data from an object; Generating a first set of structural OCT images of a first location of the object based on the acquired OCT data; Extracting flow information from individual structural OCT images; and generating a first time-series flow profile for the first location of the object, wherein the first flow profile is a relationship between the extracted flow information and a time point of the acquired OCT data from which the corresponding individual structural OCT image was generated.
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