OCT-SPECKLE VELOCITY MEASUREMENT
DE23771572T1Undetermined Publication Date: 2025-03-27TOPCON CORPORATION
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Patent Information
- Application Number
- DE112023771572
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-03-14
- Filing Date
- 2023-03-14
- Publication Date
- 2025-03-27
Abstract
Method comprising: Acquiring optical coherence tomography (OCT) data from an object; Generating a first set of structural OCT images of a first location of the object based on the acquired OCT data; Extracting flow information from individual structural OCT images; and generating a first time-series flow profile for the first location of the object, wherein the first flow profile is a relationship between the extracted flow information and a time point of the acquired OCT data from which the corresponding individual structural OCT image was generated.
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