Systems and methods for power supply and high accuracy voltage measurement - Patents.com

Abstract

Exemplary embodiments of the described technology provide a power supply system and method. The exemplary power supply system may include a load circuit comprising power electronics configured to apply DC power to a load. The power supply system may also include a power supply unit connected to drive the load circuit. The power supply unit may include a converter configured to convert input AC power to DC power. The power supply system may also include a controller. The controller may be configured to generate voltage and current control signals to be received as input by the load circuit. The voltage and current control signals may represent voltage and current values ​​to be applied to the load. The controller may also be configured to determine a voltage level to be supplied by the power supply unit to the load circuit. The controller may also be configured to generate a signal to be received by the power supply unit that represents a voltage level to be supplied by the power supply unit to the load circuit. The power supply system may include circuitry for measuring voltage with high accuracy.

Description

[Technical field]

[0001] The present disclosure relates to an electrical power supply system and method, and a voltage measurement system and method. Some embodiments provide a multi-mode DC power supply system and method. Some embodiments provide a high-precision analog voltage measurement system and method. [Background technology]

[0002] DC power supply systems are operable to supply DC power to a variety of loads. Such power supply systems may be laboratory benchtop systems (e.g., suitable for use in a laboratory environment) or may be part of a device for providing power to one or more loads in the device. Some DC power supply systems have a control for setting a desired DC voltage to be applied to the load and a current limiter. The power supply system maintains the DC voltage when a load is connected to the power supply system, except as necessary to prevent the current from exceeding a current limit set by the current limiter.

[0003] Analog-to-digital converters (ADCs) are operable to convert analog signals into digital values. However, many ADCs typically have an effective number of bits (ENOB) that is less than their actual number of bits. This is because there is a trade-off between achieving a high ENOB and achieving a high sampling rate. All else being equal, an ADC designed to provide a perfect ENOB (i.e., ENOB equal to the ADC's actual number of bits) will have a lower sampling rate than a similar ADC designed to provide a lower ENOB. This discrepancy arises because achieving a higher ENOB generally requires a longer conversion time and / or averaging over a larger number of output samples. For example, achieving the perfect ENOB may reduce the output sampling rate to approximately 0.2 samples per second (SPS) for some ADCs.

[0004] What is needed is an improved power supply system and method. Additionally or alternatively, what is needed is an improved voltage measurement system and method. Summary of the Invention

[0005] The present invention has many aspects, including, but not limited to, the following: · Power supply system; · Systems and methods for providing constant power; · Systems and methods for measuring electrical characteristics of devices; · Systems and methods for driving power electronics; Systems and methods for controlling electrical devices; · Systems and methods for measuring analog voltages with high accuracy; · Systems and methods for measuring offset voltage and / or drift voltage of at least one electrical component; Includes systems and methods for reducing noise. The above aspects may be used independently of each other. Additionally or alternatively, two or more of the above aspects may be used together.

[0006] Although the techniques described herein are illustrated using an exemplary application in a power supply system connected to supply power to a load, in some embodiments, the techniques are applied to control the operation of other electric devices. The term "power supply system" is not limited to a system used only to supply power to a load. In some embodiments, the techniques described herein are adapted to control an electric device. In some such embodiments, the techniques described herein provide a user-configurable platform for controlling an electric device. For example, by controlling the amount of power supplied to the electric device, the techniques described herein can control one or more parameters of the electric device, such as the operating temperature, light emission intensity, etc. of the electric device. Such control of the electric device can advantageously be performed in an open-loop configuration without the need for additional feedback sensors (e.g., temperature sensors, light intensity sensors, etc.).

[0007] One aspect of the present invention provides a power supply system. The power supply system may include a load circuit comprising power electronics configured to apply DC power to a load. The power supply system may also include a power supply unit connected to drive the load circuit. The power supply unit may include a converter configured to convert input AC power to DC power. The power supply system may also include a controller. The controller may be configured to generate voltage control signals and current control signals to be received as input by the load circuit. The voltage control signals and current control signals may represent voltage and current values, respectively, to be applied to the load. The controller may also be configured to determine a voltage level to be supplied by the power supply unit to the load circuit. The controller may also be configured to provide a power supply voltage control signal to the power supply unit. The power supply voltage control signal may represent a voltage level that the power supply unit should supply to the load circuit.

[0008] In some embodiments, the voltage level that the power supply unit should supply to the load circuit is greater than the voltage that should be applied across the load by a minimum threshold amount, in some embodiments, the minimum threshold amount is at least 0.8V.

[0009] In some embodiments, the power supply system includes one or both of a voltage sensor configured to measure a voltage drop across the load and a current sensor configured to measure a current passing through the load. The voltage and current control signals may be based at least in part on the measured voltage and / or the measured current.

[0010] In some embodiments, the power electronics comprises a plurality of amplifiers. The plurality of amplifiers may include at least a first amplifier and a second amplifier. The second amplifier may have a greater maximum output current than the first amplifier.

[0011] In some embodiments, the power supply system includes a first relay operable to connect an output of a first amplifier to a load and a second relay operable to connect an output of a second amplifier to the load. The controller may be configured to activate one or both of the first relay and the second relay based on a maximum current passing through the load, the maximum current being less than a maximum output current of the amplifier corresponding to the activated relay.

[0012] In some embodiments, the voltage control signal and the current control signal are determined based at least in part on open-loop control of a performance parameter of the load. In some embodiments, the performance parameter of the load includes one of temperature, light intensity, strain, and stress.

[0013] In some embodiments, the load comprises a dynamically changing load. In some embodiments, the power supply system includes a trained machine learning model that may be trained to optimize the voltage and / or current control signals based in part on the power dissipation characteristics of the load.

[0014] In some embodiments, the trained machine learning model comprises a neural network. In some embodiments, the load circuit is configurable to apply a power in the range of about 1 μW to about 1 MW.

[0015] In some embodiments, the load circuit has a controllable output voltage in the range of 0V to about 36V. In some embodiments, the load circuit has a controllable output current in the range of 0A to about 16A.

[0016] In some embodiments, the controller can be configured to control the load circuit to provide a constant power, a constant current, and / or a constant voltage. In some embodiments, the power supply system comprises a circuit for measuring an analog voltage. The circuit for measuring the analog voltage may comprise at least a first analog-to-digital converter. The first analog-to-digital converter may be configured to receive an input analog voltage signal. The circuit for measuring the analog voltage may also comprise a baseline reference circuit. The baseline reference circuit may be configured to generate a baseline voltage. The baseline reference circuit may be configurable by the controller. The circuit for measuring the analog voltage may also comprise a difference circuit. The difference circuit may be configured to subtract the baseline voltage from the input analog voltage signal.

[0017] In some embodiments, to set the baseline reference circuit, the controller is configured to divide the input analog voltage by a step size of the first analog-to-digital converter, round the result of the division to the nearest integer value, and multiply the nearest integer value by the step size of the first analog-to-digital converter.

[0018] In some embodiments, the baseline reference circuit comprises a programmable voltage source. In some embodiments, the baseline reference circuit receives as an input a bias voltage signal that may be combined with the baseline voltage to mitigate offset or bias voltages introduced by one or more components of the baseline reference circuit.

[0019] In some embodiments, one or both of the baseline reference circuit and the controller are configured to compensate for voltage drift of one or more components of the baseline reference circuit.

[0020] In some embodiments, the voltage drift is caused by a change in temperature of one or more components of the baseline reference circuit. In some embodiments, the baseline reference circuit comprises an analog circuit configured to compensate for voltage drift.

[0021] In some embodiments, the baseline reference circuit comprises one or more filters configured to at least partially suppress noise or other artifacts from the baseline voltage.

[0022] In some embodiments, the difference circuit is configured to amplify the difference between the input analog voltage signal and the baseline voltage. In some embodiments, the difference circuit comprises a differential amplifier.

[0023] In some embodiments, the circuit for measuring the analog voltage comprises a second analog-to-digital converter configured to receive the analog output from the difference circuit and convert the analog output to a corresponding digital value. The controller can be configured to receive the digital value from the second analog-to-digital converter.

[0024] In some embodiments, the controller is configured to divide the digital value received from the second analog-to-digital converter by a gain of the difference circuit to determine a value of the least significant bit and to replace the value of the least significant bit of the input analog voltage signal with the determined value of the least significant bit.

[0025] In some embodiments, the first and second analog-to-digital converters are operated simultaneously. In some embodiments, the first and second analog-to-digital converters each comprise a delta-sigma (ΔΣ) analog-to-digital converter.

[0026] In some embodiments, the first analog-to-digital converter is configured to receive the analog output from the difference circuit and convert the analog output to a corresponding digital value, and the controller is configured to receive the digital value from the first analog-to-digital converter.

[0027] In some embodiments, the power supply system includes a multiplexer controllable to select whether the first analog-to-digital converter receives as an input the input analog voltage signal or the analog output from the difference circuit.

[0028] In some embodiments, the controller is configured to verify whether one or both of the baseline reference circuit and the difference circuit are properly set. In some embodiments, the power system comprises a power supply for the at least one analog component that is different from a power supply for the at least one digital component.

[0029] Another aspect of the invention provides a method for controlling a parameter of a load. The method may include determining a relationship between the parameter of the load and power consumed by the load. The method may also include delivering power to the load and controlling the power applied to the load based on the determined relationship to maintain the parameter of the load within a desired range.

[0030] In some embodiments, the step of determining the relationship between a parameter of the load and the power consumed by the load includes applying a time-varying calibration signal to the load and measuring a change in the parameter when the calibration signal is applied.

[0031] In some embodiments, the calibration signal comprises a time-varying voltage signal. In some embodiments, the calibration signal includes a voltage ramp signal. In some embodiments, power is applied to the load using a power supply system having the functionality or combination of functionality described herein.

[0032] Another aspect of the invention provides a system for measuring an analog voltage. The system may include a controller. The system may also include at least a first analog-to-digital converter. The first analog-to-digital converter may be configured to receive an input analog voltage signal. The system may also include a baseline reference circuit. The baseline reference circuit may be configured to generate a baseline voltage. The baseline reference circuit may be configurable by the controller. The system may also include a difference circuit. The difference circuit may be configured to subtract the baseline voltage from the input analog voltage signal.

[0033] In some embodiments, to set the baseline reference circuit, the controller is configured to divide the input analog voltage by a step size of the first analog-to-digital converter, round the result of the division to the nearest integer value, and multiply the nearest integer value by the step size of the first analog-to-digital converter.

[0034] In some embodiments, the baseline reference circuit comprises a programmable voltage source. In some embodiments, the baseline reference circuit receives as an input a bias voltage signal that may be combined with the baseline voltage to mitigate offset or bias voltages introduced by one or more components of the baseline reference circuit.

[0035] In some embodiments, one or both of the baseline reference circuit and the controller are configured to compensate for voltage drift of one or more components of the baseline reference circuit.

[0036] In some embodiments, the voltage drift is caused by a change in temperature of one or more components of the baseline reference circuit. In some embodiments, the baseline reference circuit comprises an analog circuit configured to compensate for voltage drift.

[0037] In some embodiments, the baseline reference circuit comprises one or more filters configured to at least partially suppress noise or other artifacts from the baseline voltage.

[0038] In some embodiments, the difference circuit is configured to amplify the difference between the input analog voltage signal and the baseline voltage. In some embodiments, the difference circuit comprises a differential amplifier.

[0039] In some embodiments, the system for measuring an analog voltage comprises a second analog-to-digital converter configured to receive the analog output from the difference circuit and convert the analog output to a corresponding digital value. The controller can be configured to receive the digital value from the second analog-to-digital converter.

[0040] In some embodiments, the controller is configured to divide the digital value received from the second analog-to-digital converter by a gain of the difference circuit to determine a value of the least significant bit and to replace the value of the least significant bit of the input analog voltage signal with the determined value of the least significant bit.

[0041] In some embodiments, the first and second analog-to-digital converters are operated simultaneously. In some embodiments, the first and second analog-to-digital converters each comprise a delta-sigma (ΔΣ) analog-to-digital converter.

[0042] In some embodiments, the first analog-to-digital converter is configured to receive the analog output from the difference circuit and convert the analog output to a corresponding digital value. The controller may be configured to receive the digital value from the first analog-to-digital converter.

[0043] In some embodiments, the system for measuring an analog voltage comprises a multiplexer controllable to select whether the first analog-to-digital converter receives as an input the input analog voltage signal or the analog output from the difference circuit.

[0044] In some embodiments, the controller is configured to verify whether one or both of the baseline reference circuit and the difference circuit are properly set. In some embodiments, a system for measuring an analog voltage comprises a power supply for the at least one analog component that is different from a power supply for the at least one digital component.

[0045] Further aspects and example embodiments are illustrated in the accompanying drawings and / or described in the following description. It is emphasized that the invention relates to all combinations of the above features, even if these features are recited in different claims. [Brief description of the drawings]

[0046] The accompanying drawings illustrate non-limiting exemplary embodiments of the present invention. [Figure 1] 1 is a schematic diagram of a power supply system in accordance with an exemplary embodiment of the present technique; [Diagram 2] FIG. 1 is an electrical schematic diagram of an exemplary power supply system. [Figure 2A] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 2B] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 2C] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 2D] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 2E] FIG. 1 is an electrical schematic diagram of an exemplary power supply system. [Diagram 3] 1 is a flowchart illustrating an exemplary method. [Figure 4] 1 is a block diagram of a circuit in accordance with an exemplary embodiment of the present technique; [Diagram 5] FIG. 5 is a schematic diagram of an exemplary embodiment of the circuit of FIG. 4. [Figure 5A] FIG. 5 is a schematic diagram of an exemplary embodiment of the circuit of FIG. 4. [Figure 6] 1 is a flowchart illustrating an exemplary method. [Figure 7] 1 is a graph depicting exemplary data. [Figure 8] 1 is a graph depicting exemplary data. [Figure 9A] FIG. 2 is a schematic diagram of an exemplary circuit. [Figure 9B] FIG. 2 is a schematic diagram of an exemplary circuit. [Figure 10] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 11A] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 11B] FIG. 2 is an electrical diagram of an exemplary circuit. [Figure 11C] FIG. 2 is an electrical diagram of an exemplary circuit. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0047] Throughout the following description, specific details are set forth to provide a more complete understanding of the invention. However, the invention may be practiced without these details. In other instances, well-known elements have not been shown or described in detail to avoid unnecessarily obscuring the invention. Accordingly, the specification and drawings are to be regarded in an illustrative sense rather than a restrictive sense.

[0048] FIG. 1 illustrates generally an electric power supply system 10 operable to supply DC power to a load 12. The power supply system 10 can advantageously operate in different modes. In some examples, the power supply system 10 operates in a constant voltage mode (i.e., a constant voltage is applied across the load 12). In some examples, the power supply system 10 operates in a constant current mode (i.e., a constant current flows through the load 12). In some examples, the power supply system 10 operates in a constant power mode (i.e., a constant amount of power is consumed by the load 12). The operating mode of the power supply system 10 can be selected by a user of the power supply system 10 (e.g., by operating one or more controls of the power supply system, sending commands to the power supply system via an appropriate interface, etc.).

[0049] The power supply system 10 includes a power supply unit 13 that converts input AC power (e.g., a 110V 60 Hz signal, a 220V 50 Hz signal, etc.) from a source such as a power outlet to DC power. The power supply unit 13 may include, for example, a rectifier configured to convert the AC power to DC power. In some embodiments, the power supply unit 13 includes a variable switching power supply. In some embodiments, the power supply unit 13 includes a step-down AC-DC converter. For example, a step-down AC-DC converter may receive an AC voltage of about 110V, 220V, etc. as an input and output a DC voltage in the range of about 0V to about 48V. The output of the power supply unit 13 is connected to power an analog load circuit 14 (e.g., the analog load circuit 14 is driven by the converted DC power).

[0050] The load circuit 14 comprises power electronics (e.g., operational amplifiers, bipolar junction transistors, MOSFETs, etc.) configured to drive the load 12 at a desired voltage and current. The load circuit 14 receives control signals (e.g., voltage signal 17, current signal 18, etc.) from the controller 15 that control the output of the load circuit 14 to drive the load 12. In some embodiments, the control signals represent desired voltage and current values ​​to be provided to the load 12. In some embodiments, the control signals are analog signals. The control signals may be amplified by the power electronics of the load circuit 14 to generate an output signal that is applied to the load 12, for example.

[0051] In some embodiments, load circuit 14 receives input analog signals directly from controller 15. In some embodiments, controller 15 outputs digital values ​​representing desired voltage and current values ​​to be provided to load 12. The digital values ​​may pass through digital-to-analog converters before being input to load circuit 14. In some embodiments, the digital-to-analog converters comprise 18-bit digital-to-analog converters. In some embodiments, the digital-to-analog converters have a resolution in the range of approximately 0.01 mV to 0.5 V. In some embodiments, at least one of the digital-to-analog converters has a resolution of approximately 0.01 mV.

[0052] In some embodiments, the load circuit 14 comprises multiple amplifiers. The multiple amplifiers may be configured as cascaded voltage followers. For purposes described herein, "cascaded voltage followers" means that the output of a first voltage follower is provided as an input to a second voltage follower, and additional voltage followers may be added to increase the maximum amount of current that can be provided (e.g., to a load). In some embodiments, each of the voltage followers comprises a unity gain voltage follower. Such a cascaded voltage follower design increases the current capacity each time an additional voltage follower is added. For example, adding a second voltage follower amplifier may double the current capacity compared to a circuit in which only one voltage follower amplifier is used. A power supply of the type described herein may be constructed to have a desired maximum current output by providing multiple voltage follower amplifiers, each having a sufficient maximum output current rating such that the amplifier(s) are collectively operable (in the case of multiple amplifiers) to provide up to the desired maximum current output.

[0053] Having a load circuit 14 that is analog, as opposed to a digital pulse width modulation circuit, voltage controlled oscillator (VCO) circuit, etc., provides the following: Preventing or reducing back EMF on inductive loads; Less stress is placed on the circuit elements of the power supply system 10; Producing a reduced amount of parasitic electromagnetic noise; - Reducing voltage spikes; Increasing the output dynamic range; Improve output regulation at low voltages (e.g., voltages less than 1.5V); Increasing resolution, Reduce output ripple, Increasing the precision with which small thermal loads (such as heating of micro- or nanostructures) can be controlled; -Other advantages:

[0054] Controller 15 determines the voltage and current values ​​to be applied to load 12 based on desired performance parameters (e.g., that load 12 consumes a constant set power value, that a constant desired voltage is maintained across load 12, that the current drawn by load 12 does not exceed a set amount, etc.). Typically, the desired performance parameters are set by a user. In some examples, the performance parameters may be set autonomously by controller 15 based on known characteristics of load 12.

[0055] A number of sensors 16 provide feedback to the controller 15. As shown in FIG. 1, the power supply system 10 may include a voltage sensor 16A configured to measure a voltage being applied across the load 12, and a current sensor 16B configured to measure a current being drawn by the load 12. Based on measurements made by the one or more sensors 16, the controller 15 may dynamically modify the voltage input signal 17 and the current input signal 18, respectively, being supplied to the load circuit 14. The input signals 17, 18 (e.g., control signals) may be modified based on feedback provided regarding the load 12, for example, to consume a desired amount of power, draw a constant current, have a constant voltage drop, etc.

[0056] Although the sensors 16 are shown as separate components, one or more of the sensors 16 may be part of the controller 15. For example, the controller 15 may include one or more internal analog-to-digital converters (ADCs) that may receive an analog voltage signal, and thus the voltage across the load 12 may be measured using such internal ADCs. In some embodiments, the one or more sensors 16 continuously measure the value or values ​​that they are configured to measure. In some embodiments, the voltage sensor 16A continuously measures voltage. In some embodiments, the current sensor 16B continuously measures current. In some embodiments, the voltage sensor 16A comprises a voltage measurement circuit 50, described elsewhere herein.

[0057] A user may interact with power supply system 10 via input / output ("I / O") unit 19. I / O unit 19 may comprise, for example, one or more input devices (e.g., a touch screen, buttons, keyboard, pointer device, etc.), one or more output devices (e.g., a display, a light indicator, a USB output device, etc.), one or more network connections (e.g., an Internet connection, a connection to other computing devices, a connection to a cloud server, etc.). Parameters such as voltage values, current values, power values, operating modes (e.g., constant power, constant voltage, constant current, constant charge, constant resistance and / or constant load, etc.) may be set by a user via I / O unit 19.

[0058] The power supply unit 13 provides input power to the power electronics of the load circuit 14 (e.g., the output of the power supply unit 13 is connected to the input power node (e.g., VCC input) of the load circuit 14). If the voltage provided by the power supply unit 13 is higher than the output voltage value provided by the load circuit 14 (i.e., the voltage applied to the load 12), the load circuit 14 may reduce the voltage, but power will be dissipated (e.g., by heat) by a component (or components) of the load circuit 14, causing the voltage across the load circuit 14 to drop and reducing the overall efficiency of the power supply system 10. For the power electronics of the load circuit 14 to function properly, it may be necessary or desirable for the voltage provided to the input power node (e.g., VCC) to exceed the desired output voltage of the load circuit 14 by a given amount. For example, the input power node voltage (e.g., VCC) may be at least 0.5V, 1.0V, 1.5V, etc. higher than the output voltage value. To improve efficiency, the controller 15 may configure the power supply unit 13 to provide an input power voltage (e.g., a VCC voltage) that is a required threshold higher (or a set amount higher (e.g., 10% higher than the threshold, 15% higher than the threshold, 20% higher than the threshold, etc.)) than the current desired output voltage value of the load circuit 14. Advantageously, the input power node voltage (e.g., VCC) may be set in an open-loop manner based on the desired output voltage value without the need for feedback. In some embodiments, the input power node voltage (e.g., VCC) is dynamically altered.

[0059] In some embodiments, the negative input power node (e.g., VSS) of the load circuit 14 is grounded. In some embodiments, the power supply unit 13 supplies a negative voltage to the negative input power node (e.g., VSS) of the load circuit 14, the negative voltage having the same magnitude as the positive voltage applied to the positive input power node (e.g., VCC) of the load circuit 14. In some embodiments, a negative voltage may be supplied to the negative input power node (e.g., VSS) when the output voltage of the load circuit 14 is less than 1V.

[0060] The voltage supplied to the negative input power node (e.g., VSS) may be changed in response to the current output voltage of the load circuit 14. For example, the voltage supplied to the negative input power node (e.g., VSS) may be set to be more negative than the current output voltage of the load circuit 14, or to be at least a required threshold amount more negative than the maximum negative limit of the current output voltage of the load circuit 14 (i.e., the required threshold amount is a specific set amount that the voltage supplied to the negative input power node must be more negative than the desired output voltage of the load circuit 14 for the electronic device to function properly). In some embodiments, the voltage supplied to the negative input power node (e.g., VSS) is dynamically changed in response to changes in the current output voltage or output voltage range of the load circuit 14. For example, the voltage supplied to the negative input power node (e.g., VSS) may be more negative than the output voltage of the load circuit 14 by a voltage (e.g., -1V) within a range of about -2V to about -0.8V.

[0061] In some embodiments, controller 15 dynamically varies the voltage to be supplied by power supply unit 13 based on the output voltage value of load circuit 14 and / or voltage input signal 17 and current input signal 18. In some embodiments, controller 15 sets the voltage to be supplied by power supply unit 13 based on the maximum output voltage value provided by load circuit 14 for a particular load 12.

[0062] In some embodiments, controller 15 provides an analog signal to power supply unit 13 to set the voltage provided by power supply unit 13 (e.g., via a digital-to-analog converter (e.g., a 12-bit digital-to-analog converter)). In some embodiments, controller 15 provides a digital signal to power supply unit 13 to set the voltage to be supplied by power supply unit 13.

[0063] FIG. 2 is an electrical schematic diagram illustrating an exemplary embodiment 10 ′ of power supply system 10 . 2, the load circuit 14 comprises a number of operational amplifiers 21. The operational amplifiers 21 receive as inputs a signal 22-1 corresponding to the voltage to be applied to the load 12 and a signal 22-2 corresponding to the current to be drawn by the load 12. The operational amplifiers 21-2 and 21-3 are configured as cascaded voltage followers. A resistor R b prevents racing of the outputs of opamps 21-2 and 21-3. As described elsewhere herein, additional amplifiers configured as unity gain voltage followers may be cascaded with opamps 21-2 and 21-3, or existing amplifiers may be removed to change the current capacity of load circuit 14.

[0064] The power supply system 10' also includes a number of sensors 23. The sensors 23 measure the current passing through the sensors. The measured current may be a feedback parameter taken into account by the controller 15. Each of the sensors 23 may include a corresponding shunt resistor 24 and a voltage measurement device (e.g., an analog-to-digital converter, etc.). A signal (e.g., S0, S1, S2) from each of the shunt resistors 24 may be interfaced with the voltage measurement device. The signal corresponds to the voltage at the high potential side (e.g., V+) of the corresponding shunt resistor 24. The signal may be, for example, I 2 The NI 6111 may be interfaced with a voltage measurement device via a serial connection such as a C connection.

[0065] The resistors 24 may be the same or different for different sensors 23. By changing the resistance of the resistors 24, the sensitivity and / or resolution of the corresponding sensors 23 may be changed. In some embodiments, the sensors 23 are biased with resistors 24 having high resistance (e.g., 1Ω, 10Ω, 10kΩ, 10MΩ, etc.) to measure small currents (e.g., currents less than 100mA). The sensors 23 may be biased with resistors 24 having smaller resistances (e.g., 10mΩ) to measure larger currents (e.g., 8A). The resistors 24 typically comprise high-precision resistors (e.g., having resistance values ​​that vary + / -1% from the nominal value). For smaller current amounts (e.g., less than 100mA), it is preferred that the resistors 24 are made of high-precision resistors.

[0066] In some embodiments, the voltage across the load 12 may be measured by directly inputting both the positive and negative voltage signals (e.g., signals 22-3 and 22-4) on both sides of the load 12 to analog inputs of the controller 15 (e.g., the controller 15 includes an internal analog-to-digital converter). The controller 15 may then internally measure the voltage value across the load 12 directly. For example, the voltage signal 22-4 may be subtracted from the voltage signal 22-3 to determine the voltage across the load 12. In some embodiments, the voltage signal of only one side of the load 12 is input to the controller 15. In some embodiments, the power supply system 10' includes a separate voltage sensor (or multiple voltage sensors) connected to measure the voltage applied to the load 12.

[0067] In some embodiments, signals 22-3 and 22-4 are input to a chip device that may be configured to provide, for example, a voltage measurement. In some embodiments, the chip includes a high resolution analog-to-digital converter (e.g., 16-bit or greater resolution). The output of the chip (e.g., the measured voltage drop) is communicated to a digital device (e.g., a 32-bit or 16-bit digital converter) by a suitable data communication technique (e.g., an I 2The signal may be transmitted using a C bus, a Serial Peripheral Interface (SPI), wirelessly, etc. The chip device or another similar chip device may measure the voltage drop across shunt resistor 24 to measure the current. In some embodiments, the voltage is measured using circuitry 50, as described elsewhere herein. In some embodiments, signals 22-3 and 22-4 are input to circuitry 50.

[0068] A plurality of relays 25 connect the amplifiers 21 and sensors 23 to the load 12. By connecting the outputs of different numbers of amplifiers 21 to the load 12, the maximum amount of current that can be applied to the load 12 can be increased or decreased depending on the connection. The power system 10 may be designed to have more or fewer amplifiers 21 than shown in FIG. 2. The number of relays 25 and / or sensors 23 may be changed based on the number of amplifiers 21. Additionally or alternatively, the manner in which the relays 25 are configured or connected to one another or to other components may be changed.

[0069] In some embodiments, each relay 25 corresponds to a particular current range. Amplifiers 21-0, 21-1, 21-2 may be different amplifiers with different maximum current capacities. Amplifier 21-3 may be the same as amplifier 21-2. By operating relay 25 to connect one of amplifiers 21 (or a set of two or more amplifiers 21 (e.g., amplifiers 21-2 and 21-3)) to load 12, a particular current range to be applied to load 12 may be selected based on which relay(s) 25 and corresponding amplifier(s) 21 are selected.

[0070] In some embodiments, the relay 25 is selected differently based on the mode in which the power supply system 12 is operating. For example, if the power supply system 10 is operating in a constant voltage mode, a relay 25 and amplifier 21 corresponding to a higher current range may be selected to avoid damaging the sensor 23 (e.g., by passing a current higher than the rated current of the particular sensor 23). If the power supply system 10 is operating in a constant current mode, a relay 25 (and amplifier 21) corresponding to a set current value is selected. If the current exceeds the rated limit for the selected relay 25 (and amplifier 21), the power supply system 10 (e.g., controller 15, etc.) may automatically select a relay 25 (and amplifier 21) having a higher rated current. If the power supply system 10 is operating in a constant power mode, a relay 25 (and amplifier 21) may be selected based on the measured current passing through the load 12. In some embodiments, regardless of the mode in which the power supply system 10 is operating, the power supply system 10 may dynamically change which relay 25 (and amplifier 21) to use based on real-time measurements of the current (e.g., when the current is close to the rated capacity, select a relay 25 corresponding to a higher amount of current, when the current is low, select a relay 25 corresponding to a lower amount of current, etc.).

[0071] In some embodiments, each relay 25 connects a corresponding shunt resistor 24 to a voltage measuring device. In some embodiments, at least one sensor 23 is connected to the high-potential side of the load 12 (the V L+ In such an embodiment, the low side of the load 12 (i.e., V L- ) may be grounded. In some embodiments, the sensor 23 may be connected to the high side (V L+ ) and the low side of load 12 (V L- ) are connected to both

[0072] In some embodiments, the power supply system 10 includes a single sensor 23. Such a sensor 23 may include a shunt resistor 24 having a variable resistance. The variable resistance may dynamically change the detection range of such a sensor 23.

[0073] An input signal (e.g., voltage signal 22-1, current signal 22-2, PSU signal 22-5, etc.) may first be amplified by a corresponding amplifier 26. Amplifier 26 may optionally be configured as a unity gain buffer or an isolator.

[0074] In some embodiments, one or more of the input signals (e.g., voltage signal 22-1, current signal 22-2, PSU signal 22-5, etc.) are actively filtered (see, e.g., optional filter 44 in FIG. 2E). Active filtering may reduce or remove noise, such as flicker noise, EMI induced noise, thermal noise, etc., from the corresponding signals. Additionally or alternatively, one or more of the input signals may be pre-amplified (e.g., with amplifier 26). The filtered and / or pre-amplified signal(s) may then be passed through a corresponding amplification circuit comprising one or more amplifiers with a set gain. The one or more amplifiers with a set gain may comprise a low-pass filter. The low-pass filter may comprise, for example, a capacitor electrically connected in parallel with a resistor that sets the gain of the amplifier. For example, the first capacitor may be resistor R f1 and a second capacitor may be connected in parallel with resistor R f2 (eg, forming an integrator circuit). Once the signal has passed through its corresponding amplifier circuit, the signal may be applied, for example, across a load 12.

[0075] In some examples, power supply unit 13 is configured to shut down if PSU signal 22-5 goes to 0V. To prevent power supply unit 13 from shutting down, amplifier 26-0 may add a bias voltage amount to PSU signal 22-5 to ensure that PSU signal 22-5 never goes to 0V. In some embodiments, amplifier 26-0 also ensures that PSU signal 22-5 always has a positive voltage value. The bias voltage amount may be, for example, about 0.1 to about 1V. FIG. 2A shows an example circuit that may be used to add a bias voltage to PSU signal 22-5.

[0076] As shown in Figure 2A, resistor R ref1 and R ref2 is the reference voltage (V ref ) is formed. Resistor R in- and R in+ can be the same. Resistor R f and R a can be the same. Resistor R in- and R in+ is the same, and resistor R f and R a is the same, the output voltage (V out ) can be determined as follows:

[0077]

number

[0078] In such an example, V ref V in By setting it below the lower limit of V out V in is positive and nonzero, regardless of the magnitude of V in and V ref is assumed to be a positive voltage).

[0079] In some embodiments, the power supply unit 13 is electrically isolated from the controller 15. Electrically isolating the power supply unit 13 from the controller 15 may, for example, reduce (or minimize) noise propagation between the controller 15 and the power supply unit 13, improve circuit safety (e.g., a circuit failure on one side does not affect the other side), and / or the like. In some embodiments, an optical isolator electrically isolates the power supply unit 13 from the controller 15. FIG. 2B shows an exemplary circuit having an optical isolator 29 for electrically isolating the power supply unit 13 from the controller 15.

[0080] In the exemplary embodiment shown in FIG. 2, the I / O unit 19 includes a display 27A (eg, an LCD display, an LED display, an OLED display, etc.), a keypad / dial interface 27B, and a network connection 27C to an external computer 27D.

[0081] The first amplifier (e.g., amplifier 21-0) may have a current range of, for example, about 0 to 80 mA. The second amplifier (e.g., amplifier 21-1) may have a current range of, for example, about 70 to 800 mA. The third amplifier (e.g., amplifier 21-2) may have a current range of, for example, about 350 to 8,000 mA or about 700 to 8,000 mA. The fourth amplifier (e.g., amplifier 21-3) may have a current range of, for example, about 350 to 8,000 mA. In some embodiments, the fourth amplifier is the same as the third amplifier. To obtain a higher rated current, additional voltage followers may be cascaded with the third and fourth amplifiers (e.g., amplifiers 21-2 and 21-3). When additional amplifiers are cascaded as described herein, the additional amplifiers may be connected to resistors (resistor R) that connect the outputs of the additional amplifiers to the inputs of the corresponding relays 25. b The resistance of the conductor may be substantially similar (e.g., within 10%) to that of the conductor of the electrode. However, this is not necessary in all cases.

[0082] In some embodiments, additional amplifiers 21 , along with their corresponding relays 25 and sensors 23 , may be connected in parallel with other amplifiers 21 in the load circuit 14 to modify the current capacity of the load circuit 14 .

[0083] In some embodiments, a current limiting circuit (such as, for example, the circuit shown in FIG. 2C) may provide a constant current when the power supply system 10 is operating in a constant current mode. The circuit shown in FIG. 2C may provide a current in a range of, for example, about 0 mA to about 80 mA. A circuit similar to the circuit shown in FIG. 2C may provide a current in a range of about 80 mA to about 800 mA, about 800 mA to about 16 A, etc. In some examples, a circuit similar to the circuit shown in FIG. 2C may provide a current with nanoampere resolution.

[0084] In some embodiments, power supply system 10 has a voltage range of 0 V to 36 V. The voltage resolution may be, for example, about 0.1 mV. In some embodiments, power supply system 10 has a current range of 0 A to 16 A. The current resolution may be, for example, about 0.1 mA.

[0085] In some embodiments, power system 10 is a multi-range power supply. In some embodiments, power system 10 is configurable to provide power from μW to kW (e.g., from about 1 μW to about 1 MW). In some embodiments, a single power system 10 may provide power from μW to kW. In some embodiments, the individual electrical components of power system 10 (e.g., amplifiers 21 (type of amplifier, number of amplifiers, etc.), power supply unit 13, etc.) may be selected to configure power system 10 to provide a desired power range (e.g., μW power, kW power, etc.).

[0086] As described elsewhere herein, the I / O unit 19 may include a network connection to an external computer. The network connection may be wired or wireless. By connecting the power system 10 to a computer, the functionality of the power system 10 may be expanded. For example, the power system 10 may be configured to include additional functionality via a graphic user interface (GUI) running on the computer. In some embodiments, a user may gain complete control of the hardware of the power system 10 (e.g., sensors 16, etc.) via the computer.

[0087] The computer may provide, for example, additional memory and data processing capabilities (e.g., graphical display of data, data logging, programming capabilities, etc.). In some embodiments, power supply system 10 includes a physical interface (e.g., buttons, knobs, touch screen inputs, etc.) that allows user control of the core functions of power supply system 10 (e.g., setting voltage values, power values, current values, etc.). The physical interface may advantageously allow a user to control power supply system 10 independent of an (optional) connection to a computer. In some embodiments, the physical interface includes one or more controls operable to allow a user to change the operating mode of power supply system 10 (e.g., change from a power supply to a multimeter measurement device, from a constant power supply to a constant voltage supply, etc.).

[0088] An exemplary extension feature of the power supply system 10 is to effectively turn the power supply system 10 into an interface for one or more analog sensors (e.g., by connecting an analog sensor to the power supply system 10 instead of the load 12, the output of the one or more analog sensors may be provided to the controller 15 for processing). In some embodiments, the power supply system 10 records measured data (e.g., measured voltage data, measured current data, etc.). The recorded data may be processed in real time or may be stored for later processing. In some examples, a user may activate a sensor 16 (e.g., via a relay 25 shown in FIG. 2) without activating the load circuit 14, thereby effectively turning the power supply system 10 into a precision multimeter. In some examples, a user connects a probe (e.g., a “sense probe”) to the power supply system 10 (e.g., via an input port of the power supply system 10). The sense probe may be connected internally as the load 12 so that voltage and current may be measured.

[0089] In some embodiments, power supply system 10 includes five user-accessible connection points (e.g., two sense connection points, two force connection points or two activation connection points, and one ground connection point). The connection points may be used in various ways to perform various voltage and / or current measurements. For example, a device may be connected between two force connection points that drive a current through the device. Voltage may be measured between the sense connection points. To compensate for voltage losses (e.g., in wiring, PCB traces), voltage may be measured directly between the sense connection points (or force connection points). As shown in FIG. 2D, a differential amplifier (e.g., amplifier 21) that applies a voltage to a load may, in some embodiments, be connected between the output of a digital-to-analog converter (DAC) as well as terminal V to compensate for voltage losses. L+ and V L- For simplicity, the relay 25 and the current sensor 23 are not shown in FIG. in+may be physically connected directly to the output of a digital-to-analog converter (DAC) that generates the signal 22-1 or 22-2. in+ is physically connected to the output of amplifier 26-1 or 26-2. in- In some embodiments, to minimize voltage losses, the input V in+ is physically connected as close as possible to the respective DAC output or output of amplifier 26-1 or 26-2. Similarly, in some embodiments, the input V in- are connected as close as possible to the ground connections of the individual DACs or to a common ground plane. As described elsewhere herein, various connection permutations may be configured by the user using switches, dials, and / or the like.

[0090] Additionally or alternatively, the user may, for example, configure the power supply system 10 as follows: · 4-point and 4-wire probe measurements (4-point or 4-wire probe measurements may be performed by connecting the sample to be measured (e.g., a sheet of material) to the power supply system 10 as a load 12 and applying a constant current to the sample. Two additional sensing probes may be connected to a portion of the sample to measure the voltage drop across the portion of the sample. The voltage may be measured by connecting the sensing probes to a voltage sensing circuit of the power supply system 10 described elsewhere herein. The resistance of the sample (or the portion of the sample between the two sensing probes) may be determined from the measured voltage and the known current applied to the sample.); Cyclic voltammetry, which measures the current-voltage (IV) characteristics of an electrochemical cell (e.g. the voltage drop in the solution is compensated by servo-controlling the applied voltage with a sensing probe); Electrical impedance spectroscopy; · Open circuit voltage monitoring; Precision voltage monitoring and / or precision current monitoring; Battery testing; Can be configured to do other things.

[0091] In some embodiments, power system 10 includes a user-operated switch (e.g., a mechanical or electronic switch) that connects a sensing probe to load circuit 14 and controller 15 (e.g., to sensor 23, relay 25, feedback loop of amplifier 21, etc.). As described elsewhere herein, one sensing probe may, for example, connect the high potential side (V L+ ) node coupling for the load 12, and another sense probe may be connected to the low side (V L- ) at a node coupling. The load circuit 14 (and / or the controller 15) may be configured to compensate for voltage losses along the sensing probe (e.g., voltage losses along a probe connecting the sample to be measured to the “force” terminals of the system 10), resistance of the sensing probe, etc. In some embodiments, the power supply system 10 comprises a plurality of filters that condition the signal received from the sensing probe. In some embodiments, at least one of the plurality of filters comprises electronic circuitry. In some embodiments, at least one of the plurality of filters comprises an analog filter (e.g., a passive analog filter). In some embodiments, at least one of the plurality of filters is implemented on the controller 15. In some embodiments, at least one of the plurality of filters comprises a digital filter. The digital filter may, for example, average the current measurements and / or the voltage measurements between the measurement windows.

[0092] In some examples, the power supply system 10 may control a parameter, such as the temperature of the dynamic load 12, by modifying the power consumed by the load 12. By relating the parameter to be controlled to the power consumed by the load 12, the parameter may advantageously be controlled without the use of one or more external sensors (e.g., temperature sensors) that can directly detect the parameter. This may solve problems such as placing a temperature sensor near micro heating elements, such as heating elements in micro 3D printing, drug delivery systems, drug delivery system manufacturing tools, micro heaters for liquid crystal displays, thermal actuators, Peltier modules, dynamic mechanical analyzers, etc. Examples of dynamic load devices that may be controlled in this manner include: Thermal-based sensors (e.g., plant water condition sensors, infiltration meters, mass flow meters, anemometers, gas monitoring meters, downflow meters including very slow downflow meters); · Thermal actuators (e.g. nylon actuators, shape memory alloy actuators, etc.); · Energy storage devices (e.g. batteries, supercapacitors, etc.); Lighting devices (e.g. LEDs, etc.); · Piezoelectric actuators; Thermal devices such as heating and / or cooling elements; · Ion source (e.g. focused ion beam system); · Electron beam sources (e.g., Scanning Electron Microscope (SEM)); -Others included.

[0093] By managing the control parameter (or parameters) by controlling the power applied to the load 12, the overall performance, cycle life, and / or the like of the load 12 may be improved.

[0094] The relationship of the input power (P) to the primary system with the controlled variable x may be expressed, for example, as follows:

[0095]

number

[0096] Here, F i is a linear function of dx / dt, and G i is a linear function of x, and C i is a constant. At steady state, dx / dt is zero, and therefore the input power (P) is a linear function of x (i.e., the controlled variable). To control x, the input power delivered to the load 12 may be controlled by the controller 15 based on a voltage feedback signal and a current feedback signal (e.g., signals from the voltage sensor 16A and the current sensor 16B), eliminating the need for additional sensors.

[0097] Although a linear relationship is described above, a linear relationship is not required in all cases. As long as power is correlated to the parameter to be controlled, the parameter may be controlled by controlling the power consumed by the load 12.

[0098] FIG. 3 shows an exemplary method 30 for controlling a control parameter such as the temperature of the load 12, the charge stored in the load 12 (e.g., if the load 12 is a battery or other electrical energy storage device), the temperature dissipation or power dissipation of the load 12 (e.g., if the load 12 is a heating or cooling element), the light intensity of the load 12, the strain or stress of the load 12 (e.g., if the load 12 is an actuator).

[0099] In block 31, the power supply system 10 is initialized. The initialization of the power supply system 10 may be performed, for example, by the following steps: · Configuring the sensor 23 (e.g. setting the average reading time, sampling frequency, averaging window, etc.); · configuring the I / O pins (e.g., GPIO pins) of the controller 15; Initializing the digital-to-analog converter; Initializing I / O elements (e.g. displays, LED indicators, dials, buttons, etc.); Initializing memory (e.g. flash memory); Retrieving stored data (e.g. settings, configuration parameters, etc.) from memory; and, otherwise.

[0100] In block 32, a target value is obtained from a user. For example, block 32 may include the following: · Target value for the controlled variable (e.g. target temperature); · The maximum voltage that can be safely applied; Maximum current that can be safely applied: · Operating modes; A measure of accuracy relating to voltage and / or current measurements; -Others:

[0101] In some embodiments, parameters such as control settings, target values, etc. may be saved. Block 32 may retrieve such parameters from memory. In some examples, retrieving such parameters from memory is faster than asking a user for such parameters. In some embodiments, a user may change one or more target values ​​in real time (e.g., via I / O 19). In some examples, a user edits current settings, voltage settings, and / or power settings in real time.

[0102] In block 33, the power supply system 10 applies the calibration signal to the load 12. For example, the power supply system 10 may ramp the power, e.g., non-linearly. Such ramping may last from hundreds of milliseconds to several seconds depending on the characteristics of the load 12. The response of the load 12 to the ramping may be measured by the sensor 16. The controller 15 may determine an optimal or appropriate setting (e.g., voltage and / or current at which the target power is achieved) to minimize the ramping period and thus faster convergence of the target power required to control the parameters as desired. In some embodiments, one or more settings are saved. The settings may be retrieved from memory before the load 12 is started.

[0103] In block 34, the measured response of the load 12 is verified. In some embodiments, the measured response of the load 12 may be compared to an expected response of the load 12. The expected response may be determined, for example, from laboratory experiments. In some embodiments, an external sensor configured to measure a parameter of the load 12 (e.g., temperature) measures the parameter of the load 12 in real time while the calibration signal is applied in block 33. Such measurements may be used to verify the measured response of the load 12. In some embodiments, the measured response of the load 12 is compared to a target value specified by a user.

[0104] In block 35, method 30 determines whether the measured response is acceptable based on the verification performed in block 34. If the measured response is acceptable, method 30 proceeds to block 36. If not, method 30 returns to block 33. If method 30 returns to block 33, the same or a different calibration signal may be applied in block 33.

[0105] At block 36, the power applied to the load 12 is controlled by the controller 15 to maintain a parameter (e.g., temperature) of the load 12 within a desired range. In some embodiments, the power applied to the load 12 is controlled by a PID controller (running on the controller 15) that receives feedback from the sensors 16 (e.g., voltage sensor 16A and / or current sensor 16B or any other sensor).

[0106] In some embodiments, the power supply system 10 includes a trained machine learning module 40 (see, e.g., FIG. 1). The trained machine learning module 40 may include a neural network trained to recognize load characteristics of a particular load. The machine learning module 40 may be trained, for example, using data obtained in a laboratory. Once trained, a load of the type that the machine learning module 40 was trained to recognize may be activated in an open-loop manner (e.g., without requiring feedback) by the load circuit 14 to maintain a parameter (such as temperature) within a desired range.

[0107] In some embodiments, the machine learning module 40 is trained to generate an output indicative of a desired parameter, such as temperature, based on sensor values ​​(e.g., voltage values, current values, etc.) that are input into the machine learning model 40. Advantageously, the machine learning module 40 may enable the controller 15 to dynamically adapt control of the power system 10 based on different loads 12 connected to the power system 10.

[0108] The machine learning module 40 may receive operating parameters of the load as input. For example, the operating parameters may include voltage, current, temperature, force, light intensity, resistance, etc. The machine learning module 40 may also receive target operating parameters (e.g., target voltage, target current, target power, target temperature, etc.) as input. In some examples, information about the load 12 (e.g., device type, model number, etc.) is also provided as input to the machine learning module 40.

[0109] The machine learning module 40 processes the input data, determines characteristics of the load 12 from the input data, and outputs current and / or voltage actuation signals to be applied to the load 12 to achieve user-desired target operating parameters for the load 12.

[0110] In some embodiments, the machine learning module 40 continuously learns (e.g., updates the weights (or other trainable parameters) of the nodes in the neural network) as different loads 12 are connected to the power system 10. A user may optionally enable or disable such continuous learning.

[0111] In some embodiments, the machine learning module 40 is trained to determine characteristics of the load 12 (e.g., determine the IV behavior of the load) based on the measured response to an activation signal applied to the load. The activation signal may be a voltage signal, a current signal, a power signal, and / or the like. In some embodiments, the activation signal causes less than about 100 W to be applied to the load 12. In some embodiments, the activation signal causes less than about 10 W to be applied to the load 12. In some embodiments, the activation signal causes less than about 1 W to be applied to the load 12.

[0112] In some embodiments, the machine learning module 40 and / or the power supply system 10 can determine characteristics of the load 12 (e.g., determine the IV behavior of the load) even when a wake-up signal applied to the load 12 results in a large amount of power (e.g., 1 kW to 1 MW of power) being applied to the load 12. Such loads are typically large battery packs, fuel cells, supercapacitor banks, etc.

[0113] In some embodiments, a digital-to-analog converter, a serial peripheral interface (SPI), an I 2One or more components, such as the C components, may be digitally isolated (e.g., using one or more digital isolators) from the controller 15. Digitally isolating the components may, for example, reduce digital noise propagation onto the analog signals and prevent damage to the controller 15 in the event of an adverse downstream event (e.g., oscillations in one or more amplifiers, short circuit spikes, back EMF from inductive loads, etc.).

[0114] The power consumed by one or more amplifiers 21 may be determined, for example, as follows: P dissp =I load ×(V PSU -V out ) Where: V PSU = m × DAC + V offset Vout=V L+ Here, I load represents the current applied to the load 12, DAC corresponds to the input value of a digital-to-analog converter (DAC) that generates an input signal (e.g., input signal 22-5) for the power supply unit 13, and m and V offset are parameters that are determined during calibration of the power supply unit 13 and the DAC that generates the input signal for the power supply unit 13.

[0115] If the determined power consumption exceeds a desired threshold, one or more amplifiers 21 may be shut down (e.g., to prevent damage to the amplifiers 21). Additionally or alternatively, the system 10 may include one or more temperature sensors disposed in proximity to the corresponding amplifiers 21. For example, a thermistor may be disposed in thermal contact with the amplifiers 21 (e.g., below the amplifiers 21, adjacent to the amplifiers 21, etc.). If the measured temperature exceeds a threshold temperature, the corresponding amplifier 21 may be shut down, one or more additional amplifiers 21 may be activated, and a cooling mechanism (such as a fan) may be turned on or increased.

[0116] In some embodiments, calibration (e.g., of system 10, of individual components (e.g., DACs) of system 10, etc.) is performed intermittently or periodically (e.g., by controller 15, a computer configured to calibrate system 10, etc.). For example, the output from a DAC (e.g., generating signals 22-1 or 22-2) used to set a target voltage or current value may drift due to temperature changes, performance degradation, etc. In some embodiments, when a measurement (e.g., a measurement of a parameter) deviates from a reference value (e.g., a desired value of the parameter) by more than a threshold amount, the component whose value deviates by more than the threshold amount is recalibrated. In some embodiments, controller 15 monitors the measurements and autonomously initiates recalibration of individual components, system 10, etc.

[0117] In some embodiments, for example, as shown in FIG 2E, the controller 15 comprises multiple modules. For example, the controller 15 may comprise a power supply module 15A for controlling the supply of power and a measurement module 15B for controlling the measurement of performance parameters (e.g., voltage across the load 12, current through the load 12, etc.). Additionally or alternatively, as shown in FIG 2E, the system 10 may optionally include the following: · one or more optical isolators 29; · one or more digital isolators 41; · a current limiting module 42 comprising a circuit such as that shown in FIG. 2C; · a signal conditioning module 43 configured to condition an input signal for processing by the controller 15; · Comprising one or more of the one or more optional filters 44. Digital feedback signal 43A may be input to signal conditioning module 43. Digital feedback signal 43A may provide feedback to alter parameters of the conditioning performed by signal conditioning module 43.

[0118] Another aspect of the technology described herein provides systems and methods for high-precision voltage measurement. As described elsewhere herein, the systems and methods for high-precision voltage measurement may be used separately from power supply system 10 and its associated methods (e.g., to measure voltages generally, etc.) or in conjunction with power supply system 10 and its associated methods (e.g., to measure voltages across load 12 with high precision, etc.).

[0119] FIG. 4 is a block diagram of a circuit 50 for converting an analog input voltage signal to a digital value with high accuracy. The circuit 50 converts an input analog voltage signal (V in ), which is received by the controller 52, processed and converted to an N-bit digital value.

[0120] In some embodiments, controller 52 is the same as controller 15. To limit the effects of adverse factors such as noise, flicker, and resolution limits on the value of the least significant bit (or multiple least significant bits) of the digital value, V in A portion of the input voltage may be isolated and measured with greater accuracy by circuit 50. Circuit 50 may provide high accuracy voltage measurements over a wide voltage range. Such high accuracy may advantageously be independent of the voltage range. In some embodiments, circuit 50 measures voltages in the range of 0V to 36V. In some embodiments, circuit 50 measures voltages in the range of 0V to 85V. In some embodiments, circuit 50 measures bipolar voltages (e.g., −36V to 36V, −85V to 85V, etc.). In some embodiments, circuit 50 measures negative voltages (e.g., −36V to 0V, −85V to 0V, etc.).

[0121] V in is received by an analog-to-digital converter (ADC) 53. The ADC 53 converts V inThe ADC 53 has an N-bit ADC configured to sample and convert V into a set of N-bit digital values. The ADC 53 has a step size Δ (i.e., the voltage difference between one digital level and the next digital level). The controller 52 receives a digital signal from the ADC 53, in A digital value corresponding to

[0122] The controller 52 also generates a V in A voltage signal (V baseline ) in accordance with the following: i)V in Divide by the step size Δ of the ADC53. ii) rounding the result to the nearest integer value; iii) Multiplying the nearest integer value by the step size Δ of the ADC53, thereby baseline The value of may be determined.

[0123] In some embodiments, the controller 52 may generate V corresponding to uncertain (or potentially uncertain) bits (e.g., the three least significant bits, the two least significant bits, etc.) of the digital value. in A difference circuit 55 can be used to isolate a portion of V baseline In such an embodiment, the systems and methods described herein may be modified to determine the uncertain bits with greater precision than just the least significant bits.

[0124] Baseline reference circuit 54 includes a programmable voltage source. In some embodiments, baseline reference circuit 54 comprises a precision digital-to-analog converter (DAC) or other voltage generating device. In some embodiments, controller 52 controls V baseline The DAC is controlled to generate V baselineThe value of V may be determined based on the output of ADC 53. In some embodiments, the output of the DAC may be conditioned. For example, the output of the DAC may be amplified to minimize the effects of noise, etc. In such an embodiment, controller 52 may adjust V baseline The DAC may be controlled to generate a voltage signal equal to divided by the gain of the regulation amplifier.

[0125] In some embodiments, the baseline reference circuit 54 is baseline The bias voltage signal (V b ) as input. V b is set to V to nullify any offset or bias voltage that may be introduced by one or more components of the baseline reference circuit 54. baseline In some embodiments, V b is fixed. In some embodiments, V b may be dynamically changed in real time based on varying offsets or varying bias voltages that may be introduced by one or more components of baseline reference circuit 54. In some embodiments, V b is altered to null out offset or bias voltages introduced by one or more of the components that make up a particular baseline reference circuit 54. In some embodiments, controller 52 adjusts V (e.g., based on a measured offset voltage generated when the DAC of baseline reference circuit 54 was set to zero). b Set the value of .

[0126] In some embodiments, the baseline reference circuit 54 and / or the controller 52 are configured to compensate for potential voltage drift caused by changes in temperature of one or more components (e.g., a DAC) of the baseline reference circuit 54. In some embodiments, the baseline reference circuit 54 comprises analog circuitry configured to compensate for voltage drift caused by temperature changes. In some embodiments, the baseline reference circuit 54 comprises digital circuitry configured to compensate for voltage drift caused by temperature changes. In some embodiments, the baseline reference circuit 54 comprises both analog and digital components configured to compensate for voltage drift caused by temperature changes. In some embodiments, the controller 52 controls one or more components (e.g., a DAC) of the baseline reference circuit 54 to compensate for voltage drift caused by temperature changes.

[0127] In some embodiments, the analog or digital circuitry configured to compensate for voltage drift comprises a temperature sensor. Such a temperature sensor may be positioned to detect the temperature of a component (e.g., a DAC or other voltage generating device) of the baseline reference circuit 54. For example, the output of the temperature sensor may be used to look up or calculate a temperature compensation coefficient. As another example, the output of the temperature sensor may be provided as an input to a circuit that outputs a temperature compensation voltage based on an input temperature signal. The temperature compensation coefficient or voltage may be received by the baseline reference circuit 54 and / or the controller 52 and used to calculate V to compensate for voltage drift caused by the detected temperature change. baseline or V b can be used to change

[0128] In some embodiments, the baseline reference circuit 54 is baseline The signal may include one or more filters configured to remove (or suppress) noise and / or other artifacts from the signal.

[0129] The difference circuit 15 has V in and V baseline , and V , which corresponds to the least significant bit (or multiple least significant bits as described elsewhere herein) of the digital value output by ADC 53. in For example, the difference circuit 55 separates a portion of V in From V baseline and may amplify the difference. In some embodiments, difference circuit 55 comprises a differential amplifier.

[0130] The amplified difference may be input to ADC 56, and controller 52 may receive the digital value from ADC 56. To determine the actual value of the least significant bit, controller 52 may, for example, divide the digital value received from ADC 56 by the gain of difference circuit 55. Controller 52 then replaces the value of the least significant bit from ADC 53 with the newly determined value of the least significant bit (using the value from ADC 56) to obtain V in It is possible to generate a more accurate digital value of

[0131] Preferably, ADC 53 and ADC 56 operate simultaneously. In some embodiments, ADC53 and ADC56 are identical ADCs configured in the same way. In some embodiments, ADC53 and ADC56 may be replaced by a single ADC. For example, a single ADC may have V in A multiplexer may be used to select whether to receive the output signal of the differential circuit 55 or the output signal of the differential circuit 55.

[0132] In the currently preferred embodiment, ADCs 53 and 56 comprise delta-sigma (ΔΣ) ADCs. In some embodiments, controller 52 verifies that baseline reference circuit 54 and / or differencing circuit 55 are set properly. For example, if the value determined by ADC 56 is greater than the value determined by ADC 53 multiplied by the gain of differencing circuit 55, then one or both of baseline reference circuit 54 and differencing circuit 55 are not set properly. In such a case, controller 52 may wait until baseline reference circuit 54 and / or differencing circuit 55 are set properly before processing, or may reconfigure baseline reference circuit 54 and / or differencing circuit 55, etc.

[0133] In some embodiments, the reference voltage (V ref ) is used to calibrate the baseline reference circuit 54 and / or the difference circuit 55. For example, a DAC (or other voltage generating device) in the baseline reference circuit 54 may be controlled to generate V ref Generate a voltage intended to match the value of V and the actual voltage generated by the DAC (or other voltage generating device) V ref By determining the difference between V and V, a relationship (e.g., a linear relationship, a stepped linear relationship, a relationship including a higher order curve, etc.) between the input and the output can be determined for baseline reference circuit 54 and / or difference circuit 55 to compensate for drift or offset introduced by baseline reference circuit 54 and / or difference circuit 55. In some embodiments, multiple different reference voltages are used to increase the accuracy of the determined relationship. As an example, V ref can be 0 V and 2.5 V. In some embodiments, more than three different reference voltages are used.

[0134] As another example, the DAC (or other voltage generating device) of baseline reference circuit 54 may be ref can be controlled to produce a voltage that matches V refBased on the input value to the DAC (or other voltage generating device) that is required to match, a relationship between the input and output can be determined for baseline reference circuit 54 and / or difference circuit 55 to compensate for any drift or offset introduced by baseline reference circuit 54 and / or difference circuit 55.

[0135] V ref may be introduced using a switch, such as, for example, a relay (see, for example, relay 65 shown in FIG. 5A), a multiplexer (e.g., an analog multiplexer), and / or the like. Once calibration is complete, the switch may be, for example, in may be connected to the difference circuit 55.

[0136] In some embodiments, such calibration is performed intermittently or periodically. In some embodiments, V ref is used, for example, to determine the relationship (eg, a linear relationship) between the input and output of the DAC of baseline reference circuit 54.

[0137] In some embodiments, V ref is generated by an electrical component capable of generating a stable voltage with an accuracy of at least five decimal places. ref is generated by an electrical component capable of generating a stable voltage accurate to at least three decimal places. In some embodiments, the voltage drift of such an electrical component may be less than about 10 ppm / °C.

[0138] In some embodiments, to reduce noise, the analog components are powered from a power supply that is different from the power supply that powers the digital components of circuit 50. The different power supplies may be electrically isolated from one another by isolated ground planes. In some such embodiments, circuit 50 also includes isolation components (e.g., I 2 C isolator, SPI isolator, etc.

[0139] FIG. 5 is an electrical schematic diagram of an exemplary embodiment of a circuit 50. 5, the baseline reference circuit 54 may include a DAC 60 and an amplifier 61. a ,R b sets the gain of amplifier 61. In some embodiments, the gain of amplifier 61 is 2. In some embodiments, the gain of amplifier 61 is greater than 2. In some embodiments, the gain of amplifier 61 is less than 2.

[0140] The difference circuit 55 may include an amplifier 62. c and R d sets the gain of amplifier 62. In some embodiments, the gain of amplifier 62 is less than 100. In some embodiments, the gain of amplifier 62 is less than 50. In some embodiments, the gain of amplifier 62 is set such that the gain multiplied by the step size Δ of ADC 53 does not saturate amplifier 62.

[0141] FIG. 6 is a block diagram illustrating an exemplary method 70 for converting an analog signal to a digital value with high precision. In block 71, an analog signal (e.g., V in ) may be converted to a digital value (or set of digital values) using an ADC (e.g., ADC 53). The digital value may be provided to a controller (e.g., controller 52).

[0142] Based on the digital value or values, a baseline voltage (e.g., V) is determined to isolate a portion of the analog signal that corresponds to the least significant bit. baseline ) may be determined in block 72. In block 72, a circuit (e.g., baseline circuit 54) may be configured by the controller to generate a baseline voltage.

[0143] A portion of the analog signal corresponding to the least significant bit is separated from the input analog signal in block 73. As described elsewhere herein, block 73 may include subtracting a baseline voltage from the input analog signal. Block 73 may further include amplifying the portion of the analog signal corresponding to the least significant bit.

[0144] In block 74, a portion of the analog signal corresponding to the least significant bit is converted (e.g., using ADC 56) to a digital value (or set of digital values). Such digital value(s) is used by the controller in block 75 to replace the least significant bits of the digital value from block 71, resulting in a more precise digital value corresponding to the analog signal.

[0145] 7 is a graphical illustration of example data measuring the voltage of an AA battery using a 20-bit ΔΣ ADC with a conversion period of 540 μs and an output average of 1 compared to measurements made using the systems and methods described herein. Using only the 20-bit ΔΣ ADC, the peak-to-peak noise is about 8.98 mV (see, e.g., data point 81). Using the systems and methods described herein, the peak-to-peak noise is about 142 μV (see, e.g., data point 82).

[0146] FIG. 8 is a graph of peak-to-peak noise measured versus the gain of the difference circuit 15. In some embodiments, ADC53 and ADC56 comprise ADCs (e.g., bipolar ADCs) that can be configured to measure both positive and negative voltages. In some embodiments, ADC53 and ADC56 are configured to measure negative voltages.

[0147] Although ADC53 and 56 cannot measure negative voltages, they are still able to measure V inIf at least a portion of comprises a negative voltage, circuit 50 may include circuit 90 configured to convert the negative voltage to a positive voltage that can be measured by ADCs 53 and 56.

[0148] In some embodiments, the circuit 90 has as input V in Receive V in Outputs the absolute value of V in The circuit has a non-negative output of V in The absolute value of V may then be input to the ADC 53 and the difference circuit 55. in FIG. 9 is a schematic diagram illustrating an exemplary embodiment of a circuit 90 that outputs the absolute value of

[0149] In some embodiments, the circuit 90 comprises an amplifier and a voltage divider. An example of such a circuit 90 is shown in FIG. sense may be provided as an input to ADC 53 and differencing circuit 55. V high V in contains a positive voltage equal to or greater than the magnitude of the most negative expected value of V. For example, in If the most negative possible value of is -36V, then V high can be set to +36V. In such a case, V sense has a value that is within the range of positive voltages (in this example, 0 to 36 volts). sense The value of V (for example, from just over 18 volts to 36 volts in this example) in corresponds to a positive value of V below the midpoint of the range sense The voltage at (for example, in this example, from 0 volts to just under 18 volts) is V in corresponds to negative values ​​of , and is at the midpoint of the range V sense The value of (for example, 18 volts in this example) is V in = 0V. The polarity can be added to the final measurement by the controller 52. Advantageously, a negative input voltage V in and the converted positive voltage V sense The relationship between may be a linear relationship.

[0150] The circuit 90 optionally includes a V in 5. The controller 52 may include a circuit 92 that determines whether a portion of V is negative (see, e.g., FIG. 6A). The output of the circuit 92 may be input to the controller 52. In some embodiments, the output of the circuit 92 may be, for example, in 5. The input of ADC 53 and difference circuit 55 may be used by controller 52 to raise a flag indicating that V is negative. Based on the raised flag, the appropriate polarity may be added to the output of ADC 53 and / or 56. In some embodiments, circuit 50 may couple the inputs of ADC 53 and difference circuit 55 to V in to the output of circuit 90 (for example, V in is negative), or vice versa (e.g., V in is positive). Such a switch may be controlled by controller 52. In some embodiments, controller 52 controls such a switch based on the output of circuit 92. Resistor Rp is not required in all cases.

[0151] In some embodiments, the output of circuit 90 is input continuously to ADC 53 and differencing circuit 55 . In some embodiments, the systems and / or methods described herein are configured to measure current with high accuracy. For example, the systems and methods described herein may be used to measure the voltage drop across a resistor (or other electrical component) having a known resistance or impedance. The current may be determined based on the measured voltage drop and the known resistance or impedance.

[0152] Another aspect of the techniques described herein provides an exemplary circuit for measuring the power applied to a load (e.g., load 12). In some embodiments, the power applied to the load may be measured using a multiplier circuit, such as the exemplary circuit 100 shown in FIG.

[0153] Circuit 100 receives as inputs signals 101A and 101B corresponding to the positive and negative polarities, respectively, of a measured current passing through load 12, and as inputs signals 102A and 102B corresponding to the positive and negative polarities, respectively, of a measured voltage across load 12 (e.g., a voltage measured directly, a voltage measured via a voltage follower, etc.). In some embodiments, one or both of negative polarity signals 101B and 102B are electrically grounded. In some embodiments, one or both of positive polarity signals 101A and 102A are electrically grounded.

[0154] Circuit 100 multiplies the input current signal by the input voltage signal to generate an output measured power signal 103. Measured power signal 103 represents a measurement of the power being applied to load 12. The current and voltage signals may be amplified or attenuated by amplifier subcircuits 104 and 105, respectively. Amplifier subcircuit 106 may modify a multiplication product signal (e.g., signal 107) for output measured power signal 103 to match the actual power applied to load 12 with a high level of accuracy (e.g., within a range of about ±0.0001 W to about ±0.01 W).

[0155] Optionally, the circuit 100 may receive as an input an offset voltage signal 108. The offset voltage signal 108 may be included to at least partially remove an offset voltage introduced by one or more components of the circuit 100.

[0156] Another aspect of the technology described herein provides an example circuit for applying or providing constant power to a load (eg, load 12). 11A illustrates an exemplary circuit 110 for providing constant power to a load 12. The circuit 110 includes an error amplifier circuit. The circuit 110 receives as inputs a signal 111 representing a desired or set or target value of power to be applied to the load 12 and a signal 112 representing a measured power being applied to the load 12. In some embodiments, the signal 112 corresponds to an output measured power signal 103 from the circuit 100 described elsewhere herein. The input signal 111 may be, for example, from the controller 15. The N-channel MOSFET 113 may, for example, modify the current applied to the load 12. Noise at an output stage of the amplifier 114 of the circuit 110 may be at least partially filtered out. For example, the circuit 110 may optionally include a capacitor 115 for at least partially filtering out noise present at the output stage.

[0157] 11B illustrates an exemplary circuit 120 for providing constant power to a load 12. The circuit 120 includes an amplifier subcircuit 121 that maintains the power applied to the load 12 constant at a desired value set by the input signal 111. The amplifier subcircuit 121 may control a current passing through the load 12 to maintain the power applied to the load 12 constant at a desired value. The P-channel MOSFET 122 may, for example, vary the current applied to the load 12. The input signal 123 corresponds to a voltage value (e.g., a voltage signal provided by a power supply component). The input signal 123 may be constant. The input signal 123 may be the same as or different from VCC. In some embodiments, the input signal 123 is less than VCC. In some embodiments, the input signal 123 is higher than VCC.

[0158] Amplifier subcircuit 124 comprises a differential amplifier configured to determine the difference between input signal 123 and input signal 112. Amplifier subcircuit 124 may be replaced with another electrical component or circuit configured to determine the difference between input signal 123 and input signal 112. The difference between input signal 123 and input signal 112 may then be provided to, for example, P-channel MOSFET 122 (or other desired component).

[0159] 11C illustrates an exemplary circuit 130 for providing constant power to a load 12. The circuit 130 provides constant power by controlling the voltage applied across the load 12. An output voltage signal 131 may be generated, for example, by a voltage applied to an input (e.g., a positive input (e.g., V L+ )).

[0160] It is emphasized that any aspect and / or feature of the technology described herein may be a single aspect and / or feature (e.g., used individually). Additionally or alternatively, two or more aspects and / or features may be combined together.

[0161] The techniques described herein may be used to control power (e.g., provide constant power) in either or both the analog and digital domains. For example, an analog circuit may provide constant power while a desired power level (e.g., signal 111) may be set and / or controlled digitally (e.g., via feedback control).

[0162] When a component (e.g., a software module, processor, assembly, device, circuit, etc.) is referenced herein, unless otherwise indicated, a reference to that component (including a reference to a "means") should be interpreted as including any component that performs the function of the described component (i.e., is functionally equivalent), including components that are not structurally equivalent to the disclosed structures that perform that function in the illustrated exemplary embodiments of the invention, as equivalents of that component.

[0163] Embodiments of the present invention may be implemented using specially designed hardware, configurable hardware, programmable data processors configured by provision of software (which may optionally include "firmware") executable on a data processor, or special purpose computers or data processors that are specially programmed, configured, or constructed to perform one or more steps of the methods detailed herein and / or a combination of two or more of these. Examples of specially designed hardware are logic circuits, application specific integrated circuits ("ASICs"), large scale integrated circuits ("LSIs"), very large scale integrated circuits ("VLSIs"), and the like. Examples of configurable hardware are one or more programmable logic devices, such as programmable array logic ("PALs"), programmable logic arrays ("PLAs"), and field programmable gate arrays ("FPGAs"). Examples of programmable data processors are microprocessors, digital signal processors ("DSPs"), embedded processors, graphics processors, mathematical coprocessors, general purpose computers, server computers, cloud computers, mainframe computers, computer workstations, and the like. For example, one or more data processors in control circuitry for a device may perform methods as described herein by executing software instructions in program memory accessible to the processors.

[0164] Processing may be centralized or distributed. When processing is distributed, information including software and / or data may be maintained centrally or distributed. Such information may be exchanged between different functional units over a communications network such as a local area network (LAN), a wide area network (WAN), or the Internet, over wired or wireless data links, electromagnetic signals, or other data communications channels.

[0165] In some embodiments, the invention may be partially implemented in software. For greater clarity, "software" includes any instructions executed on a processor, and may include (but is not limited to) firmware, resident software, microcode, code for configuring configurable logic circuits, applications, apps, etc. Both the processing hardware and the software may be centralized or distributed (or a combination thereof), in whole or in part, as known to those skilled in the art. For example, the software and other modules may be accessible via local memory, over a network, via a browser or other application in a distributed computing context, or via other means suitable for the purposes described above.

[0166] The software and other modules may reside on servers, workstations, personal computers, tablet computers, and other devices suitable for the purposes described herein.

[0167] Interpretation of Terms Throughout this specification and claims, unless the context clearly requires otherwise, "comprise", "comprising" and the like shall be construed in their inclusive sense, i.e. "including but not limited to", as opposed to their exclusive or exhaustive sense; "Connected," "coupled," or any variation thereof means any direct or indirect connection or coupling between two or more elements, where the coupling or connection between the elements may be physical, logical, or a combination thereof; When used to describe this specification, the words "herein," "above," "below," and words of similar import shall refer to this specification as a whole and not to any particular portions of this specification; "Or" referring to a list of two or more items covers all of the following interpretations of that word: any of the items in that list, all of the items in that list, and any combination of the items in that list; · The singular forms "a", "an" and "the" include any appropriate plural references. These terms ("a", "an" and "the") refer to one or more unless otherwise specified; "And / or" is used to indicate that one or both stated instances may occur, e.g., A and / or B includes both (A and B) and (A or B); "About" when applied to a numerical value means the numerical value ±10%; When a feature is described as being "optionally" or "optionally" present, or is described as being present "in some embodiments," the disclosure is intended to encompass embodiments in which the feature is present, and other embodiments in which the feature is not necessarily present, and other embodiments in which the feature is excluded. Furthermore, when any combination of features is described in this application, this statement is intended to serve as a predicate for the use of exclusive terminology, such as "solely," "only," and the like with respect to the combination of features, and for the use of "negative" limitation(s) to exclude the presence of other features; "First" and "second" are used for illustrative purposes and cannot be understood as indicating or implying a relative importance or as indicating the number of technical features indicated.

[0168] The directional terms used in this specification and any appended claims, such as "longitudinal," "lateral," "horizontal," "upper," "lower," "front," "rear," "inside," "outside," "left," "right," "front," "rear," "top," "bottom," "lower," "above," "below," and the like, if any, depend on the particular orientation of the device being described and illustrated. The subject matter described herein may assume various alternative orientations. Accordingly, these directional terms are not precisely defined and should not be narrowly interpreted.

[0169] Embodiments of the present invention may be implemented using specially designed hardware, configurable hardware, programmable data processors configured by provision of software (which may optionally include "firmware") executable on a data processor, or special purpose computers or data processors that are specially programmed, configured, or constructed to perform one or more steps of the methods detailed herein and / or a combination of two or more of these. Examples of specially designed hardware are logic circuits, application specific integrated circuits ("ASICs"), large scale integrated circuits ("LSIs"), very large scale integrated circuits ("VLSIs"), and the like. Examples of configurable hardware are one or more programmable logic devices, such as programmable array logic ("PALs"), programmable logic arrays ("PLAs"), and field programmable gate arrays ("FPGAs"). Examples of programmable data processors are microprocessors, digital signal processors ("DSPs"), embedded processors, graphics processors, mathematical coprocessors, general purpose computers, server computers, cloud computers, mainframe computers, computer workstations, and the like. For example, one or more data processors in control circuitry for a device may perform methods as described herein by executing software instructions in program memory accessible to the processors.

[0170] Processing may be centralized or distributed. When processing is distributed, information including software and / or data may be maintained centrally or distributed. Such information may be exchanged between different functional units over a communications network such as a local area network (LAN), a wide area network (WAN), or the Internet, over wired or wireless data links, electromagnetic signals, or other data communications channels.

[0171] For example, while processes or blocks are presented in a given order, alternative examples may perform routines having steps or employ systems having blocks in a different order, and some processes or blocks may be deleted, moved, added, subdivided, combined, and / or modified to provide alternative or subcombinations. Each of these processes or blocks may be implemented in a variety of different ways. Also, while processes or blocks are at times shown as being performed in series, these processes or blocks may instead be performed in parallel, or may be performed at different times.

[0172] In addition, while elements are at times shown as being performed sequentially, they may instead be performed simultaneously or in different orders, and it is therefore intended that the following claims be construed to include all such variations that are within their intended scope.

[0173] In some embodiments, the invention may be implemented at least partially in software. For greater clarity, "software" includes any instructions executed on a processor, and may include (but is not limited to) firmware, resident software, microcode, etc. Both the processing hardware and software may be, in whole or in part, centralized or distributed (or a combination thereof), as known to those skilled in the art. For example, the software and other modules may be accessible via local memory, over a network, via a browser or other application in a distributed computing context, or via other means suitable for the purposes described above.

[0174] Where a component (e.g., a software module, processor, assembly, device, circuit, etc.) is referenced above, unless otherwise indicated, a reference to that component (including a reference to a "means") should be interpreted as including any component that performs the function of the described component (i.e., is functionally equivalent) as an equivalent of that component, including components that are not structurally equivalent to the disclosed structures that perform that function in the illustrated exemplary embodiments of the invention.

[0175] Specific examples of systems, methods, and devices are described herein for illustrative purposes. These are merely examples. The techniques provided herein may be applied to systems other than the exemplary systems described above. Many changes, modifications, additions, omissions, and substitutions are possible within the scope of the practice of the invention. The invention includes variations of the described embodiments that are apparent to those skilled in the art, including variations obtained by replacing features, elements, and / or operations with equivalent features, elements, and / or operations, mixing and matching features, elements, and / or operations from different embodiments, combining features, elements, and / or operations from the embodiments described herein with features, elements, and / or operations of other technologies, and / or omitting to combine features, elements, and / or operations from the described embodiments.

[0176] Various features are described herein as being present in "some embodiments." Such features are not required and may not be present in all embodiments. An embodiment of the invention may include zero, any one, or any combination of two or more of such features. This is limited only to the extent that certain of such features are incompatible with other of such features, in the sense that one of ordinary skill in the art would be unable to construct a practical embodiment combining such incompatible features. Thus, a statement that "some embodiments" have feature A and "some embodiments" have feature B should be interpreted as an explicit indication that the inventors also contemplate embodiments combining features A and B (unless the description states otherwise or features A and B are essentially incompatible).

[0177] When a range of values ​​is described, the described range includes all subranges of that range. The description of a range is intended to support the endpoints of the range, as well as any intervening values ​​to the tenth of the unit of the lower limit of the range, and any subrange or set of subranges of the range, unless the context clearly dictates otherwise or any portion(s) of the described range are specifically excluded. When a described range includes one or both endpoints of the range, ranges excluding either or both of those included endpoints are also included in the invention.

[0178] Certain numerical values ​​described herein are preceded by "about." In this context, "about" provides literal support for the exact numerical value it precedes, the exact numerical value ±5%, and all other numerical values ​​that are close to or approximately equal to that numerical value. Unless otherwise indicated, a particular numerical value is included "about" a specifically recited numerical value if, in the context in which the specifically recited numerical value is presented, the particular numerical value provides a substantial equivalent to the specifically recited numerical value. For example, a statement that something has a numerical value of "about 10" would be understood to mean the following set of statements: In some embodiments, the number is 10; In some embodiments, the numbers should be construed as a set of statements that are in the range of 9.5 to 10.5. Where a person of ordinary skill in the art would understand from the context that a value within a range is substantially equivalent to 10, it is understood that the value within the range will provide substantially the same results as the value 10, and therefore "about 10" should also be used to refer to any number of values ​​within the range, such as: In some embodiments, the numerical value is in the range C to D, including where C and D are the lower and upper limits, respectively, of a range that includes all values ​​that provide a value substantially equivalent to the value 10.

[0179] Specific examples of systems, methods, and devices are described herein for illustrative purposes. These are merely examples. The techniques provided herein may be applied to systems other than the exemplary systems described above. Many changes, modifications, additions, omissions, and substitutions are possible within the scope of the practice of the invention. The invention includes variations of the described embodiments that are apparent to those skilled in the art, including variations obtained by replacing features, elements, and / or operations with equivalent features, elements, and / or operations, mixing and matching features, elements, and / or operations from different embodiments, combining features, elements, and / or operations from the embodiments described herein with features, elements, and / or operations of other technologies, and / or omitting to combine features, elements, and / or operations from the described embodiments.

[0180] As will be apparent to one of ordinary skill in the art upon understanding this disclosure, each of the individual embodiments described and illustrated herein has separate components and features which may be readily separated from or combined with the features of any other described embodiment(s) without departing from the scope of the invention.

[0181] Any aspect discussed above with respect to the apparatus may also be applied to the method, and vice versa. Any recited method may be carried out in the order of events recited or in any other order that is logically possible. For example, while processes or blocks are presented in a given order, alternative examples may perform routines having steps or employ systems having blocks in a different order, and some processes or blocks may be deleted, moved, added, subdivided, combined, and / or modified to provide alternative or subcombinations. Each of these processes or blocks may be implemented in a variety of different ways. Also, while processes or blocks are at times shown as being performed in series, these processes or blocks may instead be performed in parallel, simultaneously, or at different times.

[0182] Various features are described herein as being present in "some embodiments." Such features are not required and may not be present in all embodiments. An embodiment of the invention may include zero, any one, or any combination of two or more of such features. All possible combinations of such features are contemplated by the present disclosure, even if such features are shown in different drawings and / or described in different sections or paragraphs. This is limited only to the extent that certain of such features are incompatible with other of such features, in the sense that a person skilled in the art would not be able to construct a practical embodiment combining such incompatible features. Thus, a description that "some embodiments" have feature A and "some embodiments" have feature B should be interpreted as explicitly indicating that the inventors also contemplate embodiments combining features A and B (unless the description states otherwise or features A and B are essentially compatible). This is true even if features A and B are shown in different drawings and / or mentioned in different paragraphs, sections, or sentences.

[0183] Accordingly, it is intended that the following appended claims and any claims introduced hereinafter be interpreted to include all such modifications, permutations, additions, omissions, and subcombinations as may reasonably be inferred. The claims should not be limited by the preferred embodiments described in the examples, but should be accorded the broadest interpretation consistent with the description as a whole.

Claims

1. 1. A power supply system, comprising: a load circuit comprising power electronics configured to apply DC power to the load; a power supply unit connected to power the load circuit, the power supply unit comprising a converter configured to convert input AC power to DC power; a controller, the controller comprising: generating voltage and current control signals to be received as inputs by the load circuit, the voltage and current control signals representing voltage and current values, respectively, to be applied to the load; determining a voltage level to be supplied by the power supply unit to the load circuit; A system configured to provide a power supply voltage control signal to the power supply unit, the power supply voltage control signal representing the voltage level that the power supply unit should provide to the load circuit.

2. 2. The system of claim 1, wherein the voltage level to be supplied by the power supply unit to the load circuit is greater than the voltage to be applied across the load by a minimum threshold amount.

3. The system of claim 2 , wherein the minimum threshold amount is at least 0.8V.

4. 2. The system of claim 1, wherein the system includes one or both of a voltage sensor configured to measure a voltage drop across the load and a current sensor configured to measure a current passing through the load, and the voltage control signal and the current control signal are based at least in part on the measured voltage and / or the measured current.

5. 10. The system of claim 1, wherein the power electronics comprises a plurality of amplifiers, the plurality of amplifiers comprising at least a first amplifier and a second amplifier, the second amplifier having a greater maximum output current than the first amplifier.

6. The system includes a first relay operable to connect the output of the first amplifier to the load; a second relay operable to connect the output of the second amplifier to the load; 6. The system of claim 5, wherein the controller is configured to activate one or both of the first relay and the second relay based on a maximum current passing through the load, the maximum current being less than the maximum output current of an amplifier corresponding to the activated relay.

7. The system of claim 1 , wherein the voltage control signal and the current control signal are determined at least in part based on open-loop control of a performance parameter of the load.

8. The system of claim 7 , wherein the performance parameter of the load comprises one of temperature, light intensity, strain, and stress.

9. The system of claim 7 , wherein the load comprises a dynamically changing load.

10. 10. The system of claim 1, further comprising a trained machine learning model, the machine learning model trained to optimize the voltage control signal and / or the current control signal based in part on a power dissipation characteristic of the load.

11. The system of claim 10 , wherein the trained machine learning model comprises a neural network.

12. 10. The system of claim 1, wherein the load circuit is configurable to apply a power in a range from about 1 μW to about 1 MW.

13. 10. The system of claim 1, wherein the load circuit has a controllable output voltage in the range of 0V to approximately 36V.

14. 10. The system of claim 1, wherein the load circuit has a controllable output current in the range of 0 A to approximately 16 A.

15. The system of claim 1 , wherein the controller is configurable to control the load circuit to provide a constant power, a constant current, and / or a constant voltage.

16. The system includes a circuit for measuring an analog voltage, the circuit comprising: at least a first analog-to-digital converter configured to receive an input analog voltage signal; a baseline reference circuit configured to generate a baseline voltage, the baseline reference circuit being configurable by the controller; and and a difference circuit configured to subtract the baseline voltage from the input analog voltage signal.

17. To set the baseline reference circuit, the controller: Dividing an input analog voltage by a step size of the first analog-to-digital converter; Round the result of the division to the nearest integer value, 17. The system of claim 16, configured to multiply the nearest integer value by the step size of the first analog-to-digital converter.

18. 17. The system of claim 16, wherein the baseline reference circuit comprises a programmable voltage source.

19. 17. The system of claim 16, wherein the baseline reference circuit receives as an input a bias voltage signal, the bias voltage signal capable of being combined with the baseline voltage to mitigate offset or bias voltages introduced by one or more components of the baseline reference circuit.

20. 17. The system of claim 16, wherein one or both of the baseline reference circuit and the controller are configured to compensate for voltage drift of one or more components of the baseline reference circuit.

21. 21. The system of claim 20, wherein the voltage drift is caused by a change in temperature of the one or more components of the baseline reference circuit.

22. 21. The system of claim 20, wherein the baseline reference circuit comprises an analog circuit configured to compensate for the voltage drift.

23. 17. The system of claim 16, wherein the baseline reference circuit comprises one or more filters configured to at least partially suppress noise or other artifacts from the baseline voltage.

24. 17. The system of claim 16, wherein the difference circuit is configured to amplify the difference between the input analog voltage signal and the baseline voltage.

25. 17. The system of claim 16, wherein the difference circuit comprises a differential amplifier.

26. 17. The system of claim 16, wherein the circuit for measuring an analog voltage comprises a second analog-to-digital converter configured to receive an analog output from the difference circuit and convert the analog output to a corresponding digital value, and the controller configured to receive the digital value from the second analog-to-digital converter.

27. The controller Dividing the digital value received from the second analog-to-digital converter by a gain of the difference circuit to determine a value of a least significant bit; 27. The system of claim 26, configured to replace a value of a least significant bit of the input analog voltage signal with the determined value of the least significant bit.

28. 27. The system of claim 26, wherein the first and second analog-to-digital converters are operated simultaneously.

29. 27. The system of claim 26, wherein the first and second analog-to-digital converters each comprise a delta-sigma (ΔΣ) analog-to-digital converter.

30. 17. The system of claim 16, wherein the first analog-to-digital converter is configured to receive an analog output from the difference circuit and convert the analog output to a corresponding digital value, and the controller is configured to receive the digital value from the first analog-to-digital converter.

31. 31. The system of claim 30, wherein the first analog-to-digital converter comprises a multiplexer controllable to select whether to receive as an input the input analog voltage signal or the analog output from the difference circuit.

32. 17. The system of claim 16, wherein the controller is configured to verify whether one or both of the baseline reference circuit and the difference circuit are properly configured.

33. 17. The system of claim 16, comprising a power supply for at least one analog component that is different from a power supply for at least one digital component.

34. 1. A method for controlling a parameter of a load, comprising: determining a relationship between the parameter of the load and the power consumed by the load; delivering power to the load and controlling the power applied to the load based on the determined relationship to maintain the parameter of the load within a desired range.

35. 35. The method of claim 34, wherein determining the relationship between the parameter of the load and the power consumed by the load comprises applying a time-varying calibration signal to the load and measuring a change in the parameter as the calibration signal is applied.

36. 36. The method of claim 35, wherein the calibration signal comprises a time-varying voltage signal.

37. 37. The method of claim 36, wherein the calibration signal comprises a voltage ramp signal.

38. 38. The method of any one of claims 34 to 37, wherein power is applied to the load using a system according to claim 1.

39. 1. A system for measuring analog voltages, comprising: A controller; at least a first analog-to-digital converter configured to receive an input analog voltage signal; a baseline reference circuit configured to generate a baseline voltage, the baseline reference circuit being configurable by the controller; and a difference circuit configured to subtract the baseline voltage from the input analog voltage signal.

40. To set the baseline reference circuit, the controller: Dividing an input analog voltage by a step size of the first analog-to-digital converter; Round the result of the division to the nearest integer value, 40. The system of claim 39, configured to multiply the nearest integer value by the step size of the first analog-to-digital converter.

41. 40. The system of claim 39, wherein the baseline reference circuit comprises a programmable voltage source.

42. 40. The system of claim 39, wherein the baseline reference circuit receives as an input a bias voltage signal, the bias voltage signal capable of being combined with the baseline voltage to mitigate offset or bias voltages introduced by one or more components of the baseline reference circuit.

43. 40. The system of claim 39, wherein one or both of the baseline reference circuit and the controller are configured to compensate for voltage drift of one or more components of the baseline reference circuit.

44. 44. The system of claim 43, wherein the voltage drift is caused by a change in temperature of the one or more components of the baseline reference circuit.

45. 44. The system of claim 43, wherein the baseline reference circuit comprises an analog circuit configured to compensate for the voltage drift.

46. 40. The system of claim 39, wherein the baseline reference circuit comprises one or more filters configured to at least partially suppress noise or other artifacts from the baseline voltage.

47. 40. The system of claim 39, wherein the difference circuit is configured to amplify the difference between the input analog voltage signal and the baseline voltage.

48. 40. The system of claim 39, wherein the difference circuit comprises a differential amplifier.

49. 40. The system of claim 39, wherein the system comprises a second analog-to-digital converter configured to receive an analog output from the difference circuit and convert the analog output to a corresponding digital value, and the controller configured to receive the digital value from the second analog-to-digital converter.

50. The controller Dividing the digital value received from the second analog-to-digital converter by a gain of the difference circuit to determine a value of a least significant bit; 50. The system of claim 49, configured to replace a value of a least significant bit of the input analog voltage signal with the determined value of the least significant bit.

51. 50. The system of claim 49, wherein the first and second analog-to-digital converters are operated simultaneously.

52. 50. The system of claim 49, wherein the first and second analog-to-digital converters each comprise a delta-sigma (ΔΣ) analog-to-digital converter.

53. 40. The system of claim 39, wherein the first analog-to-digital converter is configured to receive an analog output from the difference circuit and convert the analog output to a corresponding digital value, and the controller is configured to receive the digital value from the first analog-to-digital converter.

54. 54. The system of claim 53, wherein the first analog-to-digital converter comprises a multiplexer controllable to select as an input whether to receive the input analog voltage signal or the analog output from the difference circuit.

55. 40. The system of claim 39, wherein the controller is configured to verify whether one or both of the baseline reference circuit and the difference circuit are properly configured.

56. 40. The system of claim 39, comprising a power supply for at least one analog component that is different from a power supply for at least one digital component.

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