Control device, optical sensor, control method, and control program

By monitoring the change width of the distance correction amount of the photoelectric sensor and dynamically update the stored parameters, the problem of the reduction in accuracy during use of the photoelectric sensor is solved, and the accuracy and stability of distance detection are achieved.

JP2025048694AActive Publication Date: 2025-04-03DENSO CORP
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Patent Information

Application Number
JP2023219876
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-09-21
Filing Date
2023-12-26
Publication Date
2025-04-03
Estimated Expiration
2043-12-26

AI Technical Summary

Technical Problem

When detecting distances of existing photoelectric sensors, the error is mainly caused by the control unit processing delay and aging of sensor components, resulting in a decrease in detection accuracy, and traditional temperature correction methods cannot effectively deal with these changes.

Method used

A controller is adopted to monitor the change width of the temperature-dependent parameters of the distance correction amount, and update the stored parameters as the correction parameters. When the change width exceeds the allowable range, data correction is performed to ensure the accuracy of distance detection.

Benefits of technology

By dynamically updating the correction parameters, we can effectively deal with the problem of degradation of the accuracy of the photoelectric sensor during use, ensuring the accuracy and stability of distance detection.

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Abstract

To provide a control device for securing distance detection accuracy by an optical sensor.SOLUTION: The control device has a processor for controlling an optical sensor outputting detection data obtained by receiving a reflected beam of a projected beam projected to a detection area from a target and by detecting a distance to the target. The processor is configured to execute: monitoring, in a correction model M for correcting the detection data of the distance in a temperature-dependent manner, a variation width δM of a correction parameter Mp for defining the degree of temperature dependence with respect to a correction amount ΔL of the distance, thereby updating a storage parameter Mpm stored as correction parameter in a memory when the variation width δM falls out of an allowable range; and correcting the detection data by the correction amount ΔL adjusted according to a temperature in each detection of the distance in accordance with the correction model M provided in response to the latest storage parameter Mpm.SELECTED DRAWING: Figure 5
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Description

[Technical field]

[0001] The present disclosure relates to a technique for controlling an optical sensor. [Background technology]

[0002] The optical sensor disclosed in Patent Document 1 is controlled so as to detect the distance to the target by receiving a reflected beam from the target in response to a projected beam projected onto a detection area. As one type of such control technology, Patent Document 1 proposes correcting a measurement time equivalent to a detection distance by using a delay time caused by processing in a control unit as a correction amount. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent No. 6449545 Summary of the Invention [Problem to be solved by the invention]

[0004] However, in the optical sensor disclosed in Patent Document 1, the delay time corresponding to the temperature extracted by another optical sensor in the same moving object is extracted according to a map prepared in advance. However, the error occurring in the measurement time equivalent to the detection distance is caused not only by the delay time caused by the processing in the control unit, but also by, for example, aging of the sensor elements constituting the optical sensor and the abnormality caused by the aging. Therefore, in the optical sensor disclosed in Patent Document 1, even if the error changes over time, there is a concern that the detection accuracy of the distance corresponding to the measurement time, which is always corrected according to the unchanging map, will decrease.

[0005] An object of the present disclosure is to provide a control device that ensures the accuracy of distance detection by an optical sensor. Another object of the present disclosure is to provide an optical sensor equipped with a control device that ensures the accuracy of distance detection. Yet another object of the present disclosure is to provide a control method that ensures the accuracy of distance detection by an optical sensor. Yet another object of the present disclosure is to provide a control program that ensures the accuracy of distance detection by an optical sensor. [Means for solving the problem]

[0006] The technical means of the present disclosure for solving the problems will be described below. Note that the claims and the reference characters in parentheses in this section indicate the corresponding relationship with the specific means described in the embodiments described later in detail, and do not limit the technical scope of the present disclosure.

[0007] A first aspect of the present disclosure is A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor a correction model (M) for correcting the distance detection data depending on temperature (T), monitoring a fluctuation range (ΔM) of a correction parameter (Mp) that specifies the temperature dependency of a distance correction amount (ΔL), and updating a stored parameter (Mpm) stored in a storage medium (51a) as a correction parameter when the fluctuation range falls outside a permissible range; and correcting the detection data by a correction amount corresponding to the temperature for each distance detection in accordance with a correction model provided according to the latest stored parameters.

[0008] A second aspect of the present disclosure is A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: a correction model (M) for correcting the distance detection data depending on temperature (T), monitoring a fluctuation range (ΔM) of a correction parameter (Mp) that specifies the temperature dependency of a distance correction amount (ΔL), and updating a stored parameter (Mpm) stored in a storage medium (51a) as a correction parameter when the fluctuation range falls outside a permissible range; and correcting the detection data with a correction amount corresponding to the temperature for each distance detection in accordance with a correction model provided in response to the latest stored parameters.

[0009] A third aspect of the present disclosure is A control program including instructions to be executed by a processor (51b) and stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data indicating a distance (L) to the target, a correction model (M) for correcting the distance detection data depending on temperature (T), monitoring a fluctuation range (ΔM) of a correction parameter (Mp) that specifies the temperature dependency of a distance correction amount (ΔL), and updating a stored parameter (Mpm) stored in a storage medium (51a) as a correction parameter when the fluctuation range falls outside a permissible range; and correcting the detection data with a correction amount corresponding to the temperature for each distance detection in accordance with a correction model provided in response to the latest stored parameters.

[0010] According to the first to third aspects, in the correction model for correcting the distance detection data depending on temperature, the fluctuation range of the correction parameter that specifies the temperature dependency on the distance correction amount is monitored. If the fluctuation range of the correction parameter falls outside the allowable range, the stored parameters stored in the storage medium as the correction parameters are updated. Therefore, according to the correction model given according to the latest stored parameters, the detection data is corrected by the correction amount according to the temperature at each distance detection, so that it is possible to output detection data that ensures the detection accuracy of the distance regardless of the passage of time.

[0011] A fourth aspect of the present disclosure is A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor In a correction model (M) for correcting the distance detection data depending on temperature (T), a fluctuation range (δM) of a correction parameter (Mp) that specifies the dependency of temperature on a distance correction amount (ΔL) is monitored, and a failure indicator (Ir) correlated with the fluctuation range (δM); The optical sensor is configured to determine a state in which the failure indicator falls outside the allowable range as a failure state, and to output failure notification information notifying the failure state.

[0012] A fifth aspect of the present disclosure is a method for manufacturing a semiconductor device comprising: A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that specifies the degree of temperature dependency of a distance correction amount (ΔL) in a correction model (M) for correcting the distance detection data depending on temperature (T); The method includes determining a state of the optical sensor in which the failure indicator is outside the allowable range as a failure state, and outputting failure notification information notifying the failure state.

[0013] A sixth aspect of the present disclosure is a method for manufacturing a semiconductor device comprising: A control program including instructions to be executed by a processor (51b) and stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data indicating a distance (L) to the target, monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that specifies the degree of temperature dependency of a distance correction amount (ΔL) in a correction model (M) for correcting the distance detection data depending on temperature (T); and outputting fault notification information notifying the optical sensor of the fault state when the fault indicator is outside the tolerance range.

[0014] Thus, according to the fourth to sixth aspects, in the correction model for correcting the distance detection data depending on temperature, the failure indicator correlated with the fluctuation range of the correction parameter that specifies the dependency of the distance correction amount on temperature is monitored. Then, the state of the optical sensor in which the failure indicator is out of the allowable range is regarded as a failure state, and failure notification information that notifies the failure state is output. In this way, since the optical sensor can accurately notify the failure state by the failure notification information, conversely, under a normal state without such notification, the detection data is corrected according to the temperature at each distance detection according to the correction model, and it becomes possible to output detection data with the distance detection accuracy ensured.

[0015] A seventh aspect of the present disclosure is a method for manufacturing a semiconductor device comprising: A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that specifies the degree of temperature dependency of a distance correction amount (ΔL) in a correction model (M) for correcting the distance detection data depending on temperature (T); The state of the optical sensor where the failure indicator falls outside the allowable range is determined to be a failure state, and the control parameters for controlling the optical sensor are adjusted to the recovery side of the failure state.

[0016] An eighth aspect of the present disclosure is a method for manufacturing a semiconductor device comprising: A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that specifies the degree of temperature dependency of a distance correction amount (ΔL) in a correction model (M) for correcting the distance detection data depending on temperature (T); The method includes determining a state of the optical sensor in which the failure indicator falls outside the allowable range as a failure state, and adjusting a control parameter for controlling the optical sensor to a recovery side from the failure state.

[0017] A ninth aspect of the present disclosure is a method for manufacturing a semiconductor device comprising: A control program including instructions to be executed by a processor (51b) and stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data indicating a distance (L) to the target, monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that specifies the degree of temperature dependency of a distance correction amount (ΔL) in a correction model (M) for correcting the distance detection data depending on temperature (T); The instruction to set the state of the optical sensor where the failure indicator falls outside the allowable range as a failure state, and to adjust the control parameters for controlling the optical sensor to a recovery side from the failure state, is included.

[0018] Thus, according to the seventh to ninth aspects, in the correction model for correcting the distance detection data depending on temperature, the failure indicator correlated with the fluctuation range of the correction parameter that specifies the temperature dependency on the distance correction amount is monitored. Then, the state of the optical sensor in which the failure indicator is out of the allowable range is regarded as a failure state, and the control parameter for controlling the optical sensor is adjusted to the recovery side of the failure state. In this way, in the optical sensor, since the failure state can be recovered by adjusting the control parameter, under the recovery state, the detection data is corrected according to the temperature at each distance detection according to the correction model, and it becomes possible to output the detection data with the distance detection accuracy secured.

[0019] A tenth aspect of the present disclosure is An optical sensor that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, A control unit (51) including the control device of the first, fourth, or seventh aspect and configured to generate detection data; a light projection unit (21) that projects a light projection beam according to the control of the control unit; The optical fiber includes a light receiving section (41) that receives the reflected beam under the control of the control section.

[0020] The optical sensor of the tenth aspect can achieve the same operational effect based on the same principle as the control device of the first, fourth or seventh aspect. [Brief description of the drawings]

[0021] [Figure 1] 1 is a cross-sectional view showing an overall configuration of an optical sensor according to a first embodiment. [Diagram 2] FIG. 2 is a block diagram showing a functional configuration of an optical sensor according to the first embodiment. [Diagram 3] FIG. 2 is a schematic diagram showing a floodlight source unit according to the first embodiment. [Figure 4] FIG. 2 is a schematic diagram showing a light receiving and detecting unit according to the first embodiment. [Diagram 5] 4 is a flowchart showing a control flow according to the first embodiment. [Figure 6] 4 is a time chart for explaining a control flow according to the first embodiment. [Figure 7] FIG. 4 is a characteristic diagram for explaining a control flow according to the first embodiment. [Figure 8] FIG. 4 is a characteristic diagram for explaining a control flow according to the first embodiment. [Figure 9] FIG. 4 is a characteristic diagram for explaining a control flow according to the first embodiment. [Figure 10] FIG. 3 is a cross-sectional view showing a modification of FIG. 2. [Figure 11] FIG. 4 is a characteristic diagram for explaining a control flow according to the first embodiment. [Figure 12] FIG. 11 is a characteristic diagram for explaining a control flow according to the second embodiment. [Figure 13] FIG. 11 is a characteristic diagram for explaining a control flow according to the third embodiment. [Figure 14] FIG. 13 is a characteristic diagram for explaining a control flow according to the fourth embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0022] Hereinafter, multiple embodiments of the present disclosure will be described with reference to the drawings. In addition, by assigning the same reference numerals to corresponding components in each embodiment, duplicated descriptions may be omitted. In addition, when only a part of the configuration is described in each embodiment, the configuration of the other embodiment described above can be applied to the other parts of the configuration. Furthermore, in addition to the combination of configurations explicitly stated in the description of each embodiment, configurations of multiple embodiments can be partially combined together even if not explicitly stated, as long as there is no particular problem with the combination.

[0023] First embodiment As shown in FIG. 1, the optical sensor 10 according to the first embodiment of the present disclosure is a LiDAR (Light Detection and Ranging / Laser Imaging Detection and Ranging) that is configured to be mountable on a moving body 1 and optically detects the outside world of the moving body 1. The moving body 1 to which the optical sensor 10 is applied is, for example, an automobile or the like that is capable of at least one of manual driving, automatic driving, and remote driving. In the following description, unless otherwise noted, the directions indicated by front, rear, up, down, left, and right are defined based on the moving body 1 on a horizontal plane. In addition, in the following description, the horizontal direction and the vertical direction respectively mean the parallel direction and the perpendicular direction to the horizontal plane of the moving body 1 on the horizontal plane. However, in FIG. 1, the left side of the dashed dotted line (the side of the cover panel 12 described later) along the vertical direction actually shows a cross section perpendicular to the right side of the dashed dotted line (the side of each part 21, 41 described later).

[0024] The optical sensor 10 is disposed in at least one location on the moving body 1, such as the front, left and right side portions, rear portion, or upper roof. As shown in Figs. 1 and 2, the optical sensor 10 projects a projecting beam PB toward a detection area DA in the outside world that corresponds to the location of the optical sensor 10 on the moving body 1. The optical sensor 10 detects, as a reflected beam RB, the return light that is returned when the projecting beam PB is reflected by a target Xt in the detection area DA in the outside world. For the projecting beam PB that thus becomes the reflected beam RB, light in the near-infrared range that is difficult for humans to see is selected.

[0025] The optical sensor 10 detects a target Xt present in a detection area DA in the outside world by receiving the reflected beam RB reflected by the projected beam PB. The detection of such an outside target Xt is, for example, one or more types of detection including at least the distance L among the distance L from the optical sensor 10 to the target Xt, the direction in which the target Xt exists, and the reflection intensity of the reflected beam RB from the target Xt. The target Xt that is a representative detection target in the optical sensor 10 applied to the moving body 1 may be at least one of moving objects such as pedestrians, cyclists, animals other than humans, and other vehicles. The target Xt that is a representative detection target in the optical sensor 10 applied to the moving body 1 may be at least one of stationary objects such as guardrails, road signs, roadside structures, and fallen objects on the road.

[0026] As shown in Fig. 1, the optical sensor 10 includes a housing 11, a light projecting unit 21, a scanning unit 31, a light receiving unit 41, and a control unit 51. The light-shielding housing 11 is formed in a box shape from, for example, metal or resin. The housing 11 houses the light projecting unit 21, the scanning unit 31, the light receiving unit 41, and the control unit 51 inside. An opening penetrating the inside and outside of the housing 11 is closed by a cover panel 12. The light-transmitting cover panel 12 is formed from, for example, resin or glass, and separates the inside and outside of the housing 11.

[0027] As shown in Figs. 1 and 2, the light projecting section 21 has a light projecting light source unit 22 and a light projecting lens unit 26. As shown in Fig. 3, the light projecting light source unit 22 is constructed by mounting a plurality of light source elements 24 in an array on a substrate. Each light source element 24 is a laser diode arranged in a single row (example of Fig. 3) or in multiple rows (not shown) along the vertical direction. Each light source element 24 generates a pulsed laser light that becomes a part of the light projecting beam PB according to a control signal from the control section 51. Each light source element 24 may be an edge emitter laser or a vertical cavity surface emitting laser (VCSEL).

[0028] The light projecting light source unit 22 has a light source window 25 formed on one side of the substrate, the light source window 25 being quasi-defined as a rectangular contour that is long along the vertical direction and short along the horizontal direction. The light source window 25 is configured as a collection of laser oscillation apertures in each light source element 24. The laser light projected from the laser oscillation apertures of each light source element 24 is projected from the light source window 25 as a light projecting beam PB that is quasi-represented as a line beam long along the vertical direction at least in the detection area DA of the outside world.

[0029] As shown in FIG. 1, the light projecting lens unit 26 is constructed in a structure in which at least one light projecting lens 27 is held by a lens barrel 28. The light-transmitting light projecting lens 27 is formed mainly of a base material such as resin or glass into a lens shape according to the optical action to be performed. The light projecting lens 27 performs at least one optical action, such as focusing, collimation, and shaping, on the light projecting beam PB from the light projecting light source unit 22. The light projecting lens 27 is positioned within a light-shielding lens barrel 28 made of, for example, metal or resin. The light projecting lens unit 26 thus configured is aligned with the light projecting light source unit 22 to form a light projecting optical axis PO that guides the light projecting beam PB toward the scanning unit 31.

[0030] 1 and 2, the scanning unit 31 has a scanning mirror 32 and a scanning motor 35. The scanning mirror 32 is constructed in the form of a plate having a reflective film deposited on a reflective surface 33, which is one side of a base material. The scanning mirror 32 is supported by the housing unit 11 so as to be rotatable about a rotation center line along the vertical direction. The scanning mirror 32 oscillates within a driving range that is limited by a mechanical or electrical stopper.

[0031] The scanning motor 35 is, for example, a voice coil motor, a brushed DC motor, or a stepping motor. An output shaft of the scanning motor 35 is directly coupled to the scanning mirror 32, or indirectly coupled via a driving mechanism such as a reducer. The scanning motor 35 is held by the housing unit 11 so as to be able to rotate the scanning mirror 32 together with the output shaft. The scanning motor 35 rotates (i.e., swings) the scanning mirror 32 within a finite driving range in accordance with a control signal from the control unit 51.

[0032] The scanning mirror 32 reflects the projected light beam PB incident from the light projector 21 by the reflecting surface 33 and projects the light onto the detection area DA through the cover panel 12, thereby scanning the area DA in accordance with the rotation angle of the scanning motor 35. At this time, scanning of the detection area DA by the projected light beam PB is substantially limited to scanning in the horizontal direction in this embodiment according to the rotational drive of the scanning mirror 32.

[0033] The scanning mirror 32 reflects the reflected beam RB, which is incident from the target Xt in the detection area DA through the cover panel 12, toward the light receiving unit 41 side by the reflecting surface 33 in accordance with the rotation angle of the scanning motor 35. At this time, the speeds of the projected beam PB and the reflected beam RB are sufficiently high compared to the rotational speed of the scanning mirror 32. As a result, the reflected beam RB is reflected by the scanning mirror 32, whose angle with respect to the projected beam PB can be assumed to be substantially the same as the rotation angle, and is guided toward the light receiving unit 41 side in the opposite direction to the projected beam PB.

[0034] The light receiving section 41 has a light receiving lens unit 42 and a light receiving detection unit 45. As shown in FIG. 1, the light receiving lens unit 42 is constructed in a structure in which at least one light receiving lens 43 is held by a lens barrel 44. The light transmitting light receiving lens 43 is formed in a lens shape according to the optical action to be exerted, mainly made of a base material such as resin or glass. The light receiving lens 43 exerts an optical action so as to form an image of the reflected beam RB from the scanning mirror 32 on the light receiving detection unit 45. The light receiving lens 43 is positioned in a light blocking lens barrel 44 formed of, for example, metal or resin. The light receiving lens unit 42 configured in this way is aligned with the light receiving detection unit 45, so that a light receiving optical axis RO that guides the reflected beam RB from the scanning section 31 to the unit 45 side is formed vertically shifted from the light projection optical axis PO of the light projection lens unit 26.

[0035] As shown in FIG. 4, the light receiving and detecting unit 45 is constructed by mounting a plurality of light receiving pixels 46 in an array on a substrate. The light receiving pixels 46 are arranged at least along the vertical direction. The light receiving and detecting unit 45 has a light receiving surface 450 on one side of the substrate, the light receiving surface 450 having a rectangular contour with a long side along the vertical direction and a short side along the horizontal direction. The light receiving surface 450 is configured as a collection of the incident surfaces of the light receiving pixels 46. Here, each of the light receiving pixels 46 is further configured from a plurality of light receiving elements 460, such as single photon avalanche diodes. Each of the light receiving pixels 46 receives the reflected beam RB incident on the light receiving surface 450 from the light receiving lens unit 42 as shown in FIG. 1.

[0036] 1 and 2, the light receiving and detecting unit 45 is provided with an output circuit 47. The output circuit 47 executes sampling processing for each scanning line according to the rotation angle of the scanning mirror 32, which is synchronized with the light projection period of the light projecting beam PB by the light projecting light source unit 22, for each detection cycle in accordance with a control signal from the control unit 51. At this time, the output circuit 47 generates a detection signal by combining response outputs from the light receiving elements 460 of each light receiving pixel 46 for each detection cycle. The detection signals thus generated are output from the output circuit 47 to the control unit 51 for each scanning line.

[0037] The control unit 51 is configured from a control device including at least one dedicated computer mounted on a board. The dedicated computer constituting the control device as the control unit 51 may be a sensor ECU (Electronic Control Unit) specialized for controlling the optical sensor 10, in which case the sensor ECU is housed in the housing unit 11 (example of FIG. 1). The dedicated computer constituting the control device as the control unit 51 may be a driving control ECU specialized for controlling the driving of the moving object 1, in which case the driving control ECU is disposed outside the housing unit 11 in the moving object 1 (not shown).

[0038] The dedicated computer constituting the control device as the control unit 51 has at least one memory 51a and one processor 51b as shown in Fig. 1. The memory 51a is at least one type of non-transitory tangible storage medium, such as a semiconductor memory, a magnetic medium, or an optical medium, that non-temporarily stores computer-readable programs and data. The processor 51b includes at least one type of core, such as a central processing unit (CPU), a graphics processing unit (GPU), a reduced instruction set computer (RISC)-CPU, a data flow processor (DFP), or a graph streaming processor (GSP).

[0039] The control unit 51 thus configured is connected to the light projecting light source unit 22, the scanning motor 35, and the light receiving and detecting unit 45. The control unit 51 controls the light projecting light source unit 22 so as to generate a light projecting beam PB for each light projecting cycle. At the same time, the control unit 51 controls the scanning motor 35 so as to control the scanning and reflection by the scanning mirror 32 synchronized with the light projecting cycle by the light projecting light source unit 22. Furthermore, the control unit 51 processes a detection signal output from the output circuit 47 of the light receiving and detecting unit 45, which is controlled in accordance with the light projected by the light projecting light source unit 22 and the scanning and reflection by the scanning mirror 32. In this way, the control unit 51 generates detection data that at least detects the distance L to the target Xt in the detection area DA.

[0040] To specifically realize such control, the processor 51b executes a plurality of instructions included in a control program stored in the memory 51a. In this way, the control unit 51 constructs a plurality of functional blocks for controlling the optical sensor 10. The plurality of functional blocks thus constructed by the control unit 51 include an update block 100 and a detection block 120, as shown in FIG.

[0041] The control method in which the control unit 51 controls the optical sensor 10 by cooperation of these blocks 100 and 120 is executed according to the control flow shown in Fig. 5. This control flow is repeatedly executed for each detection cycle during the movement of the moving object 1. Note that each "S" in the control flow represents multiple steps executed by multiple commands included in the control program.

[0042] In S10 shown in FIG. 5, the update block 100 (see FIG. 2) judges whether or not the current detection cycle satisfies the condition of the monitoring period Pm. Here, the monitoring period Pm is a period for monitoring the fluctuation width ΔM of the correction parameter Mp in the correction model M described later. The monitoring period Pm is set to the stop period Ps shown in FIG. 6 as a period during which at least the moving body 1 is stopped. The monitoring period Pm may be set to a stop period Ps with further conditions, such as stopping in a parking lot. The stop of the moving body 1, which is a trigger for setting such a stop period Ps, may be recognized based on the detection result of the running speed by, for example, a speed sensor mounted on the moving body 1. The stop of the moving body 1 may be recognized based on the detection result of the road surface by, for example, the optical sensor 10, other LiDAR, or a camera mounted on the moving body 1. The stop of the moving body 1 may be recognized by fusing the detection results of the running speed and the road surface. 6, an example of the time transition of the operating state of the optical sensor 10 is diagrammatically illustrated with the temperature T° C. (particularly the temperature Ta described below) serving as one state index of the optical sensor 10 being plotted on the vertical axis.

[0043] The monitoring period Pm may be set when the activation monitoring condition is satisfied during the activation period Pss in FIG. 6 during which the optical sensor 10 is activated during such a stop period Ps of the moving object 1. Here, the activation monitoring condition may be specified so as to be satisfied every time a set time has elapsed since the activation period Pss was set to the monitoring period Pm in the past. The activation monitoring condition may be specified so as to be satisfied every time the number of occurrences of the activation period Pss reaches a set number of times since the activation period Pss was set to the monitoring period Pm in the past. Note that the activation of the optical sensor 10 refers to at least one of simultaneous activation of the moving object 1 and the optical sensor 10 in response to an activation command from a user, and automatic activation of the optical sensor 10 by waking up the moving object 1 in sleep mode, for example, at night, in response to a user command.

[0044] The monitoring period Pm may be set when the steady monitoring condition is satisfied during the stationary period Psr in Fig. 6 during which the operation of the optical sensor 10 becomes stable and the optical sensor 10 is in a steady state after the start-up period Pss during the stop period Ps of the moving body 1. Here, the steady monitoring condition may be specified so as to be satisfied every time a set time has elapsed since the stationary period Psr was set to the monitoring period Pm in the past. The steady monitoring condition may be specified so as to be satisfied every time the number of occurrences of the stationary period Psr reaches a set number of times since the stationary period Psr was set to the monitoring period Pm in the past.

[0045] As shown in Fig. 5, if a positive determination is made in S10, S20 is executed. In S20, the update block 100 monitors a correction model M (see Figs. 7 and 8 described later in detail) that calculates a correction amount ΔL for correcting the detection data of the distance L depending on the temperature T. At this time, in S20, a fluctuation width ΔM of a correction parameter Mp that specifies the dependency of the correction amount ΔL of the distance L on the temperature T in the correction model M is monitored. Here, the correction amount ΔL is defined as a positive / negative detection deviation amount that depends on the temperature T with respect to the detected distance L. In addition, as the temperature T, the temperatures Ta, Tb, and Tc (see numbers 1 and 5 described later) of each of the specific sensor elements that constitute the optical sensor 10 are focused on.

[0046] Specifically, in S20, when the current detection cycle corresponds to the startup period Pss set in the monitoring period Pm of the stop period Ps, the startup parameter Mps is monitored as a correction parameter Mp that gives a correction model M for the startup period Pss as shown in Fig. 7. In this case, the startup parameter Mps is assumed to depend on the detected deviation amount of the distance L for each of the temperatures Ta, Tb, and Tc for each of a specific number of sensor elements constituting the optical sensor 10, and coefficient parameters As, Bs, and Cs that represent the degree of dependency on these temperatures Ta, Tb, and Tc are assumed according to Equation 1. The startup parameter Mps further assumes a constant parameter Ds common to the temperatures Ta, Tb, and Tc according to Equation 1.

number

[0047] In the above formula 1, the functions Ga, Gb, and Gc are defined as polynomials or monomials with degrees of 1 or more for the corresponding temperatures Ta, Tb, and Tc, respectively, and with no constant terms. Therefore, in each term of the polynomial or monomial constituting the function Ga, a coefficient according to the exponent of the temperature Ta is specified as a parameter As. Thus, particularly in the case of a polynomial, an individual parameter As is specified for each exponent of the temperature Ta in each term. The relationship between the parameters Bs and Cs and the corresponding functions Gb and Gc is specified in accordance with the relationship between the parameter As and the function Ga.

[0048] In this way, the parameters As, Bs, Cs, and Ds assumed for the startup parameter Mps are stored in the memory 51a as initial values ​​at the time of shipment of the optical sensor 10 or updated values ​​during the startup period Pss, which will be described later. Therefore, the stored values ​​of the parameters As, Bs, Cs, and Ds are defined as stored parameters Mpm related to the startup parameter Mps, as shown in FIG.

[0049] Here, the sensor element corresponding to temperature Ta is the light projecting light source unit 22. The temperature Ta of the light projecting light source unit 22 is actually measured by a temperature sensor 29 (see FIG. 3) on the same board as each light source element 24. On the other hand, the sensor element corresponding to temperature Tb is the light receiving and detecting unit 45. Since the temperature Tb of the light receiving and detecting unit 45 correlates with the temperature Ta of the light projecting light source unit 22, it is estimated according to the function Fb of the equation 2. Furthermore, the sensor element corresponding to temperature Tc is the control device as the control unit 51, or the mounting board thereof. Since the temperature Tc of the control device or the mounting board correlates with the temperature Ta of the light projecting light source unit 22, it is estimated according to the function Fc of the equation 3.

number

number

[0050] If the current detection cycle corresponds to the startup period Pss set in the monitoring period Pm, in S20 the update block 100 changes the temperatures Ta, Tb, and Tc for each sensor element to a trial temperature Tt shown in Fig. 9. At this time, the change points of the temperatures Ta, Tb, and Tc as the trial temperature Tt are set at multiple points so that the temperatures Ta, Tb, and Tc correspond to each other one by one based on the correlation of equations 2 and 3. Therefore, the update block 100 may directly set multiple change points of the temperature Ta by controlling the light emission of each light source element 24 of the light projecting light source unit 22 to adjust the light emission power, and may also indirectly set multiple change points of the temperatures Tb and Tc according to equations 2 and 3. Alternatively, the update block 100 may indirectly set multiple change points of the temperature Ta correlated with the ambient temperature Ti in the housing 11 according to the function Fa of Equation 4 and multiple change points of the temperatures Tb and Tc according to Equations 2 and 3 by adjusting the ambient temperature Ti in the housing 11 using a temperature adjustment unit 61 additionally connected to the control unit 51 as shown in a modified example in Fig. 10. Here, the temperature adjustment unit 61 is composed of at least one type of unit, for example, a heater unit, a cooling unit, etc.

number

[0051] If the current detection cycle corresponds to the startup period Pss set in the monitoring period Pm, in S20, the update block 100 acquires the distance L detected by the optical sensor 10 for each corresponding change point (hereinafter, referred to as each corresponding change point) between the temperatures Ta, Tb, and Tc as the trial temperature Tt as the trial distance Lt as shown in Fig. 9. At this time, as the trial distance Lt for each corresponding change point of the temperatures Ta, Tb, and Tc, the optical sensor 10 of the stationary moving body 1 may detect the distance L to the target Xt by receiving a reflected beam RB from a stationary (stopped) target Xt such as a structure or a stopped vehicle by the optical sensor 10 of the stationary moving body 1. Here, the stationary state of the target Xt may be recognized based on the detection result of the target Xt by, for example, the optical sensor 10, other LiDAR, or a camera mounted on the moving body 1.

[0052] Therefore, the update block 100 in S20 of the startup period Pss acquires the startup parameters Mps, which give the correction model M so as to interpolate the detected deviation amount of the trial distance Lt acquired at each corresponding change point between the temperatures Ta, Tb, and Tc for the trial distance Lt acquired at a specific reference corresponding change point between the temperatures Ta, Tb, and Tc, as shown in FIG. 7, as the trial parameters Mpt, for example, by regression analysis. At this time, the startup parameters Mps acquired as the trial parameters Mpt are assumed to be the parameters As, Bs, Cs, and Ds according to the formula 1. In addition, in FIG. 7 and FIG. 9, the temperature Ta corresponding to the temperatures Tb and Tc according to the formulas 2 and 3 is set as the horizontal axis of the temperatures T and Tt, and an example of the correction model M with the startup parameters Mps and the distance detection in the startup period Pss are respectively illustrated. In addition, in FIG. 7 and FIG. 9, each corresponding change point between the temperatures Ta, Tb, and Tc is indicated by a black circle, and the temperature Ta at the reference corresponding change point, which is the reference for the detected deviation amount, is indicated by the symbol T0s.

[0053] If the current detection cycle corresponds to the startup period Pss set in the monitoring period Pm, in S20 the update block 100 reads out from the memory 51a each of the parameters As, Bs, and Cs, which are the latest stored parameters Mpm for the startup parameters Mps. In S20 during the startup period Pss, the update block 100 focuses on the difference between the trial parameters Mpt acquired in the current detection cycle for the startup parameters Mps and the latest stored parameters Mpm read out for the startup parameters Mps as a fluctuation range ΔM, and monitors the coefficient parameters As, Bs, and Cs corresponding to each sensor element. At this time, in the function Ga of the above formula 1, the fluctuation range ΔM is monitored for each of the coefficient parameters As of each term with different exponents of the temperature Ta in the polynomial, or for the coefficient parameter As corresponding to the exponent of the temperature Ta alone in the monomial. Similarly, in the functions Gb and Gc of the above-mentioned equation (1), the fluctuation range ΔM is monitored for each of the coefficient parameters Bs and Cs of the terms having different exponents of the corresponding temperatures Tb and Tc in the polynomial, or for each of the coefficient parameters Bs and Cs alone corresponding to the exponents of the corresponding temperatures Tb and Tc in the monomial.

[0054] By such monitoring, in S20 of the startup period Pss, when the fluctuation range ΔM corresponding to at least one sensor element among the fluctuation ranges ΔM for the coefficient parameters As, Bs, Cs increases beyond the preset allowable range, the stored parameters Mpm related to the startup parameters Mps are updated in the memory 51a as shown in Fig. 5. In the update related to the startup parameters Mps at this time, learning of the stored parameters Mpm using the trial parameters Mpt is performed for each of the coefficient parameters As, Bs, Cs for each sensor element. At the same time, in the update related to the startup parameters Mps, learning of the stored parameters Mpm using the trial parameters Mpt is also performed simultaneously for the constant parameter Ds.

[0055] On the other hand, in S20, when the current detection cycle corresponds to the stationary period Psr set in the monitoring period Pm of the stop period Ps, the stationary parameter Mpr is monitored as the correction parameter Mp that gives the correction model M of the stationary period Psr as shown in Fig. 8. In this case, the stationary parameter Mpr is assumed to depend on the temperature Ta, Tb, Tc of each of the multiple sensor elements as in the case of the startup period Pss, and the coefficient parameters Ar, Br, Cr that express the degree of dependency on these temperatures Ta, Tb, Tc are assumed according to Equation 5. The stationary parameter Mpr further assumes a constant parameter Dr common to the temperatures Ta, Tb, Tc according to Equation 5. Here, since the optical sensor 10 is in a stationary state during the running period Pd of the moving object 1 that has left the stop period Ps and started running as shown in Fig. 6, the stationary parameter Mpr is also assumed and monitored as the correction parameter Mp that gives the correction model M of the stationary period Pdr in the stationary state.

number

[0056] In the above formula 5, the functions Ha, Hb, and Hc are defined as polynomials or monomials with degrees of 1 or more for the corresponding temperatures Ta, Tb, and Tc, respectively, and with no constant terms. Therefore, in each term or monomials of the polynomials constituting the function Ha, a coefficient according to the exponent of the temperature Ta is specified as a parameter Ar. Thus, particularly in the case of polynomials, an individual parameter Ar is specified for each exponent of the temperature Ta in each term. The relationship between the parameters Br and Cr and the corresponding functions Hb and Hc is specified in accordance with the relationship between the parameter Ar and the function Ha.

[0057] In this way, the parameters Ar, Br, Cr, and Dr assumed for the steady-state parameters Mpr are stored in the memory 51a as initial values ​​at the time of shipment of the optical sensor 10 or updated values ​​during the steady-state period Psr, which will be described later. Therefore, the stored values ​​of the parameters Ar, Br, Cr, and Dr are defined as stored parameters Mpm related to the steady-state parameters Mpr, as shown in FIG.

[0058] If the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm, in S20 the update block 100 changes the temperatures Ta, Tb, and Tc of each sensor element to a trial temperature Tt shown in Fig. 11. At this time, the method of changing the temperatures Ta, Tb, and Tc as the trial temperature Tt is similar to that in the case of the startup period Pss.

[0059] If the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm, in S20, the update block 100 acquires the distance L detected by the optical sensor 10 for each corresponding change point between the temperatures Ta, Tb, and Tc, which are the trial temperature Tt, as the trial distance Lt, as shown in Fig. 11. At this time, as the trial distance Lt for each corresponding change point of the temperatures Ta, Tb, and Tc, it is preferable to detect the distance L to the stationary target Xt, similar to the case of the startup period Pss. Here, the stationary state of the target Xt may be recognized based on the detection result of the target Xt by, for example, the optical sensor 10, other LiDAR, or a camera mounted on the moving body 1.

[0060] Therefore, the update block 100 in S20 of the stationary period Psr acquires, as trial parameters Mpt, for example by regression analysis, stationary parameters Mpr that give a correction model M so as to interpolate the detected deviation amount of the trial distance Lt acquired for each corresponding change point among the temperatures Ta, Tb, and Tc for the trial distance Lt acquired at a specific reference corresponding change point among the temperatures Ta, Tb, and Tc, as shown in Fig. 8. At this time, the stationary parameters Mpr acquired as the trial parameters Mpt are assumed to be the parameters Ar, Br, Cr, and Dr according to Equation 5. In addition, in Figs. 8 and 11, an example of the correction model M with the stationary parameters Mpr and the distance detection in the stationary period Psr is shown, with the temperature Ta corresponding to the temperatures Tb and Tc being the horizontal axis of the temperatures T and Tt according to Equations 2 and 3, respectively. 8 and 11, the corresponding change points are indicated by black circles in accordance with the start-up periods Pss in FIGS. 7 and 9, while the temperature Ta different from the start-up periods Pss is indicated by the symbol T0r as a reference corresponding change point.

[0061] If the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm, in S20 the update block 100 reads out each parameter Ar, Br, Cr, which is the latest stored parameter Mpm for the steady parameter Mpr, from the memory 51a. In S20 of the steady period Psr, the update block 100 focuses on the difference between the trial parameter Mpt acquired in the current detection cycle for the steady parameter Mpr and the latest stored parameter Mpm read out for the steady parameter Mpr as a fluctuation range δM, and monitors the coefficient parameters Ar, Br, Cr corresponding to each sensor element. At this time, in the function Ha of the above formula 5, the fluctuation range δM is monitored for each coefficient parameter Ar of each term with different exponents of the temperature Ta in a polynomial, or for the coefficient parameter Ar corresponding to the exponent of the temperature Ta alone in a monomial. Similarly, in the functions Hb and Hc of the above-mentioned equation (5), the fluctuation range ΔM is monitored for each of the coefficient parameters Br and Cr of the terms having different exponents of the corresponding temperatures Tb and Tc in the polynomial, or for each of the coefficient parameters Br and Cr corresponding to the exponents of the corresponding temperatures Tb and Tc in the monomial.

[0062] By such monitoring, in S20 of the steady-state period Psr, when the fluctuation range ΔM corresponding to at least one sensor element among the fluctuation ranges ΔM for the coefficient parameters Ar, Br, Cr increases beyond the preset allowable range, the stored parameters Mpm for the steady-state parameters Mpr are updated in the memory 51a as shown in Fig. 5. In the update for the steady-state parameters Mpr at this time, learning of the stored parameters Mpm using the trial parameters Mpt is performed for each of the coefficient parameters Ar, Br, Cr for each sensor element. At the same time, in the update for the steady-state parameters Mpr, learning of the stored parameters Mpm using the trial parameters Mpt is also performed simultaneously for the constant parameters Dr.

[0063] 5, if a positive determination is made in S10, the current execution of the control flow ends with the completion of execution of S20. On the other hand, if a negative determination is made in S10, S30 and S40 are executed in sequence. First, in S30, the detection block 120 (see FIG. 2) controls the light projecting light source unit 22, the scanning motor 35, and the light receiving detection unit 45 to generate detection data for the current detection cycle.

[0064] Next, in S40, the detection block 120 corrects the distance L of the detection data to be output by a correction amount ΔL according to the current temperature Tp, which is the temperature T in the current detection cycle, in accordance with the correction model M given according to the latest stored parameters Mpm. Specifically, the temperatures Ta, Tb, and Tc of each sensor element are acquired as the current temperature Tp at this time. Therefore, it is preferable that the temperature Ta is actually measured by the temperature sensor 29, and the temperatures Tb and Tc are estimated according to the equations 2 and 3.

[0065] Therefore, in S40, when the current detection cycle corresponds to a startup period Pss that is not set as a monitoring period Pm within a stop period Ps, the detection block 120 reads out from the memory 51a the stored parameters Mpm related to the startup parameters Mps of Equation 1. As a result, during the startup period Pss, the correction model M including the startup parameters Mps is selected as the input target for the current temperature Tp, and the detection data corrected according to the correction model M is output.

[0066] On the other hand, in S40, when the current detection cycle corresponds to a steady period Psr that is not set as the monitoring period Pm in the stop period Ps, the detection block 120 reads out from the memory 51a the stored parameters Mpm related to the steady parameters Mpr of Equation 5. As a result, in the steady period Psr, a correction model M including the steady parameters Mpr is selected as an input target for the current temperature Tp, and detection data after correction according to the correction model M is output. In this embodiment, the output of such corrected detection data according to the steady period Psr in the stop period Ps is also performed in S40 when the current detection cycle corresponds to a steady period Pdr (see FIG. 6) that substantially coincides with the running period Pd of the moving body 1 that has left the stop period Ps.

[0067] In either case, the output of the detection data in S40 may be storing the detection data in the memory 51a. The output of the detection data in S40 may be providing the detection data to a driving control ECU or the like. The output of the detection data in S40 may be transmitting the detection data to an external center through a communication unit of the moving object 1.

[0068] When the execution of S40 is completed, the current execution of the control flow is terminated. Therefore, by repeating the control flow outside the monitoring period Pm, the detection data is corrected by the correction amount ΔL according to the temperature T for each detection cycle of the distance L.

[0069] (Action and effect) The effects of the first embodiment described above will now be described.

[0070] According to the first embodiment, in the correction model M for correcting the detection data of the distance L depending on the temperature T, the fluctuation range ΔM of the correction parameter Mp that specifies the dependency of the temperature T on the correction amount ΔL of the distance L is monitored. Therefore, when the fluctuation range ΔM of the correction parameter Mp falls outside the allowable range, the stored parameter Mpm stored in the memory 51a as the correction parameter Mp is updated. Therefore, according to the correction model M given according to the latest stored parameter Mpm, the detection data is corrected by the correction amount ΔL that matches the current temperature Tp each time the distance L is detected, and thus it is possible to output detection data that ensures the detection accuracy of the distance L regardless of the passage of time.

[0071] According to the first embodiment, the trial temperature Tt is changed during the monitoring period Pm in which the fluctuation range ΔM of the correction parameter Mp is monitored. Therefore, the fluctuation range ΔM, which is the difference between the trial parameter Mpt as the correction parameter Mp that provides the correction model M according to the trial distance Lt detected by the optical sensor 10 for each change point of the trial temperature Tt during the monitoring period Pm, and the stored parameter Mpm, is monitored. According to this, the trial parameter Mpt when the monitored fluctuation range ΔM falls outside the allowable range can be accurately determined based on the trial distance Lt at multiple temperature points and used to update the stored parameter Mpm. Therefore, the detection data is corrected according to the correction model M that is provided according to the updated stored parameter Mpm, making it possible to output detection data with improved detection accuracy of the distance L.

[0072] According to the first embodiment, during the monitoring period Pm set while the moving body 1 is stopped, the trial temperature Tt is changed, and the trial distance Lt to the stationary target Xt is detected by the optical sensor 10 for each change point of the trial temperature Tt. This makes it possible to effectively utilize the stationary target Xt, in which the distance L is substantially unchanged with respect to the stationary moving body 1, and to accurately monitor the fluctuation range ΔM occurring in the correction parameter Mp of the correction model M based on the trial distance Lt at multiple temperature points. Therefore, by correcting the detection data according to the correction model M including the correction parameter Mp when the monitored fluctuation range ΔM falls outside the allowable range as the latest stored parameter Mpm, it becomes possible to output detection data that ensures high detection accuracy of the distance L.

[0073] According to the first embodiment, the temperatures Ta, Tb, and Tc of each sensor element constituting the optical sensor 10 are changed as a trial temperature Tt during the monitoring period Pm. Then, the fluctuation width ΔM, which is the difference between the trial parameter Mpt that gives the correction model M according to the trial distance Lt detected by the optical sensor 10 for each change point of the trial temperature Tt during the monitoring period Pm and the stored parameter Mpm, is monitored for each sensor element. Therefore, when the fluctuation width ΔM corresponding to at least one sensor element falls outside the allowable range, the learning of the stored parameter Mpm by the trial parameter Mpt is performed for each sensor element, so that the detection data can be accurately corrected according to the correction model M including the learned stored parameter Mpm. Therefore, it is possible to output detection data that ensures high detection accuracy of the distance L.

[0074] According to the first embodiment, during the steady state period Psr in which the optical sensor 10 becomes steady after the startup period Pss in which the optical sensor 10 is started, the fluctuation range ΔM of the steady state parameters Mpr as the correction parameters Mp that give the correction model M is monitored. Therefore, when the fluctuation range ΔM monitored during the steady state period Psr falls outside the allowable range, the stored parameters Mpm are updated with respect to the steady state parameters Mpr. Therefore, by selecting the correction model M given according to the latest stored parameters Mpm related to the steady state parameters Mpr, it is possible to realize correction of the detection data suitable for the steady state periods Psr, Pdr in which the state of the optical sensor 10 becomes steady, and to improve the detection accuracy of the distance L.

[0075] Moreover, according to the first embodiment, during the startup period Pss when the optical sensor 10 is started, the fluctuation range δM of the startup parameters Mps as the correction parameters Mp that give the correction model M is monitored. Therefore, when the fluctuation range δM monitored during the startup period Pss falls outside the allowable range, the stored parameters Mpm are updated with respect to the startup parameters Mps. Therefore, during the startup period Pss, the correction model M according to the latest stored parameters Mpm related to the startup parameters Mps is selected, thereby realizing a correction for the detection data specific to the startup period Pss when the state of the optical sensor 10 changes from moment to moment, and making it possible to improve the detection accuracy of the distance L.

[0076] Second Embodiment The second embodiment is a modification of the first embodiment.

[0077] As shown in Fig. 12, in the control flow of the second embodiment, S2020 is executed instead of S20. Specifically, in S2020, when the current detection cycle corresponds to the startup period Pss set in the monitoring period Pm, the update block 100 updates the stored parameter Mpm related to the startup parameter Mps as the correction parameter Mp when the fluctuation range δM corresponding to at least one sensor element among the fluctuation ranges δM for the coefficient parameters As, Bs, and Cs falls outside the preset allowable range, which is the same as S20. However, in updating the startup parameter Mps in S2020, the parameter corresponding to the sensor element whose fluctuation range δM is outside the allowable range among the coefficient parameters As, Bs, and Cs is forcibly set to zero (0) as a failure parameter for any index of the corresponding temperature among the temperatures Ta, Tb, and Tc.

[0078] Therefore, in S2020, for normal parameters other than the fault parameter updated to zero among the coefficient parameters As, Bs, and Cs, acquisition of the trial parameter Mpt by, for example, regression analysis is re-executed, and the stored parameter Mpm is learned from the re-execution result. At this time, for the constant parameter Ds, the stored parameter Mpm is also learned from the trial parameter Mpt whose acquisition is re-executed. Note that the fault parameter forcibly set to zero in relation to the startup parameter Mps remains at zero, and acquisition of the trial parameter Mpt, monitoring of the fluctuation range ΔM, and update of the stored parameter Mpm are skipped until maintenance of the optical sensor 10 is performed.

[0079] Similarly, in S2020, when the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm, the update block 100 updates the stored parameters Mpm related to the steady parameters Mpr as the correction parameters Mp when the fluctuation range δM corresponding to at least one sensor element among the fluctuation ranges δM for the coefficient parameters Ar, Br, Cr falls outside the preset allowable range, as in S20. However, in updating the steady parameters Mpr in S2020, the parameters among the coefficient parameters Ar, Br, Cr corresponding to the sensor element whose fluctuation range δM falls outside the allowable range are forcibly set to zero (0) as failure parameters for any index of the corresponding temperature among the temperatures Ta, Tb, Tc.

[0080] Therefore, in S2020, for the normal parameters other than the fault parameter updated to zero among the coefficient parameters Ar, Br, and Cr, acquisition of the trial parameter Mpt by, for example, regression analysis is re-executed, and the stored parameter Mpm is learned from the re-execution result. At this time, for the constant parameter Dr, the stored parameter Mpm is also learned from the trial parameter Mpt whose acquisition is re-executed. Note that, for the fault parameter forcibly set to zero with respect to the steady-state parameter Mpr, the acquisition of the trial parameter Mpt, the monitoring of the fluctuation range ΔM, and the update of the stored parameter Mpm are skipped while keeping the value at zero until the optical sensor 10 is maintained.

[0081] According to the second embodiment described above, the fault parameters, which are the stored parameters Mpm, of the sensor element whose fluctuation range ΔM falls outside the allowable range are updated to zero. This allows the correction model M to be updated so as to be defined by the stored parameters Mpm of the normal sensor element together with the zero-value fault parameters. Therefore, by correcting the detection data according to the updated correction model M, it becomes possible to output detection data in which the decrease in detection accuracy of the distance L is suppressed.

[0082] Third embodiment The third embodiment is a modification of the first embodiment.

[0083] 13, in the control flow of the third embodiment, S3010 and S3020 are executed instead of S10 and S20. Specifically, in S3010, the update block 100 skips the determination of whether the startup monitoring condition is satisfied during the startup period Pss, and sets the steady period Psr to the monitoring period Pm only when the steady monitoring condition is satisfied. Accordingly, in S3020, the update block 100 skips the acquisition of the trial parameter Mpt, the monitoring of the fluctuation range ΔM, and the update of the stored parameter Mpm for the startup parameter Mps as the correction parameter M.

[0084] Furthermore, in S3020, when the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm, the update block 100 focuses on the fluctuation range δM of the coefficient parameters Ar, Br, and Cr corresponding to each sensor element for the steady parameter Mpr as the correction parameter M, similar to S20. However, in S3020, the update block 100 monitors the failure indicator Ir correlated with the fluctuation range δM for the steady parameter Mpr for each of the coefficient parameters Ar, Br, and Cr corresponding to each sensor element. That is, in the steady period Psr as the monitoring period Pm in the third embodiment, the failure indicator Ir correlated with the fluctuation range δM of the steady parameter Mpr as the correction parameter Mp is monitored for each sensor element.

[0085] At this time, in S3020, in the function Ha of Equation 5 described in the first embodiment, a failure probability correlating with the fluctuation range ΔM is assumed by the function I_n of Equation 6 for each coefficient parameter Ar of each term having a different exponent n (n: index identifying the exponent) of the temperature Ta in a polynomial, or for a single coefficient parameter Ar corresponding to the exponent n of the temperature Ta in a monomial. Here, the failure probability function I_n is defined so as to represent a state in which the probability that the corresponding sensor element has failed due to, for example, aging deterioration increases as the fluctuation range ΔM of the coefficient parameter Ar increases.

number

[0086] In S3020, when the function Ha of Equation 5 is a polynomial, the calculated value by the failure probability function I_n for each coefficient parameter Ar with different exponent n of the temperature Ta is treated as a plurality of variables in the index function I_N of Equation 6 (e.g., weighted average function, etc.), and the failure indicator Ir of the sensor element corresponding to the coefficient parameter Ar of each exponent n is monitored according to the index function I_N. Alternatively, when the function Ha of Equation 5 is a monomial, the calculated value by the failure probability function I_n for the coefficient parameter Ar according to the exponent n of the temperature Ta alone is treated as a single variable in the index function I_N of Equation 6 (e.g., proportional function with a proportionality coefficient of 1, etc.), and the failure indicator Ir of the sensor element corresponding to the single coefficient parameter Ar is monitored according to the index function I_N. In either case, the index function I_N giving the failure indicator Ir is defined so that the calculated value increases following an increase in the failure probability by the function I_n. Similarly, in the functions Hb and Hc of the formula 5 described in the first embodiment, the failure indicator Ir is monitored from the failure probability correlated with the fluctuation range ΔM for each of the coefficient parameters Br and Cr of the terms having different exponents n of the corresponding temperatures Tb and Tc in the polynomial, or for each of the coefficient parameters Br and Cr corresponding to the exponents n of the corresponding temperatures Tb and Tc in the monomial.

[0087] By such monitoring, in S3020, when the failure indicator Ir corresponding to at least one sensor element among the failure indicators Ir for each of the coefficient parameters Ar, Br, Cr increases beyond a preset allowable range, the update block 100 executes fail-safe processing. In detail, the fail-safe processing in S3020 includes a notification processing and a control adjustment processing. In the notification processing in S3020, data representing failure notification information for notifying the state of the sensor element in the optical sensor 10 whose failure indicator Ir has fallen outside the allowable range as a failure state to the mobile body 1 on which the sensor is mounted is diagnostically output from the control unit 51.

[0088] In the control adjustment process of S3020 together with such a notification process, the control parameters for controlling the sensor element of the optical sensor 10 whose failure indicator Ir has fallen outside the allowable range are adjusted to the recovery side for recovering the failure state of the sensor element that is out of the allowable range. At this time, when the failure indicator Ir corresponding to a different index n or a single coefficient parameter Ar falls outside the allowable range, the control parameters of the light source elements 24 of the light projecting light source units 22 of the light projecting section 21 that are determined to be in a failed state may be adjusted, for example, by increasing or decreasing the light emission power to the recovery side of the failed state.

[0089] In addition, at this time, when the failure indicator Ir corresponding to a different index n or a single coefficient parameter Br falls outside the allowable range, the light receiving detection unit 45 of the light receiving section 41 determined to be a sensor element in a faulty state may be adjusted, for example, by increasing or decreasing the light receiving sensitivity of the light receiving element 460 to the recovery side of the faulty state as a control parameter of each light receiving pixel 46 by the output circuit 47. When the failure indicator Ir corresponding to a different index n or a single coefficient parameter Br falls outside the allowable range, the light receiving detection unit 45 of the light receiving section 41 determined to be a sensor element in a faulty state may be adjusted, for example, by increasing the number of pixels 46 assigned (i.e., expanding the light receiving area for each scanning line) or by shifting the range of the assignment to increase or decrease the sensitivity of the entire light receiving area to the recovery side of the faulty state. Furthermore, if the failure indicator Ir corresponding to a different index n or a single coefficient parameter Cr falls outside the acceptable range, when the control unit 51 determines that the sensor element is in a faulty state, the control adjustment process may be skipped and the notification process may be performed alone.

[0090] (Action and effect) The effects of the third embodiment described above will be described below.

[0091] According to the third embodiment, in a correction model M for correcting the detection data of the distance L depending on the temperature T, a failure indicator Ir correlated with a fluctuation width ΔM of a correction parameter Mp that specifies the dependency of the correction amount ΔL of the distance L on the temperature T is monitored. Then, a state of the optical sensor 10 in which the failure indicator Ir is outside the allowable range is regarded as a failure state, and failure notification information notifying the failure state is output. In this way, since the optical sensor 10 can accurately notify the failure state by the failure notification information, conversely, in a normal state without such notification, the detection data is corrected according to the current temperature Tp at each detection of the distance L according to the correction model M, and it becomes possible to output detection data with the detection accuracy of the distance L ensured.

[0092] Moreover, according to the third embodiment, the state of the optical sensor 10 where the failure indicator Ir falls outside the allowable range is regarded as a failure state, and the control parameters for controlling the optical sensor 10 are adjusted to recover from the failure state. In this way, in the optical sensor 10, recovery from the failure state can be achieved by adjusting the control parameters, so that under this recovery, it can be said that it is possible to output detection data with the detection accuracy of the distance L ensured by correcting the detection data in accordance with the current temperature Tp at each detection of the distance L according to the correction model M.

[0093] According to the third embodiment, the trial temperature Tt is changed during the monitoring period Pm in which the failure indicator Ir correlated with the fluctuation range ΔM of the correction parameter Mp is monitored. Therefore, the difference between the trial parameter Mpt as the correction parameter Mp that gives the correction model M according to the trial distance Lt detected by the optical sensor 10 for each change point of the trial temperature Tt during the monitoring period Pm and the stored parameter Mpm is focused on as the fluctuation range ΔM. According to this, when the failure indicator Ir monitored in correlation with the fluctuation range ΔM falls outside the allowable range, it is possible to appropriately determine whether or not to output the failure notification information in consideration of the fluctuation of the trial parameter Mpt based on the trial distance Lt at multiple temperature points. Therefore, since the failure state can be accurately notified by the failure notification information, conversely, under a normal state, the detection data is corrected according to the correction model M, so that it is possible to output detection data in which the detection accuracy of the distance L is ensured.

[0094] According to the third embodiment, during the monitoring period Pm set while the moving body 1 is stopped, the trial temperature Tt is changed, and the trial distance Lt to the stationary target Xt is detected by the optical sensor 10 for each change point of the trial temperature Tt. This makes effective use of the stationary target Xt, in which the distance L is substantially unchanged relative to the stopped moving body 1, to accurately grasp the fluctuation width ΔM occurring in the correction parameter Mp of the correction model M based on the trial distance Lt at multiple temperature points and reflect it in the failure indicator Ir. Therefore, when the monitored failure indicator Ir falls within the allowable range, the detection data is corrected according to the correction model M including the normal correction parameter Mp, so that it is possible to output detection data in which the detection accuracy of the distance L is ensured.

[0095] According to the third embodiment, the temperatures Ta, Tb, and Tc of each sensor element constituting the optical sensor 10 are changed as a trial temperature Tt during a monitoring period Pm. During the monitoring period Pm, a failure indicator Ir correlated with a fluctuation width ΔM, which is a difference between a trial parameter Mpt that gives a correction model M according to a trial distance Lt detected by the optical sensor 10 at each change point of the trial temperature Tt and a stored parameter Mpm, is monitored for each sensor element. Therefore, when the failure indicator Ir corresponding to at least one sensor element falls outside the allowable range, it is possible to accurately determine whether or not to output failure notification information by focusing on the fluctuation of the trial parameter Mpt based on the trial distance Lt at multiple temperature points for each sensor element. Therefore, since a sensor element in a faulty state can be accurately notified by the fault notification information, conversely, under a normal state, the detection data is corrected according to the correction model M, and detection data in which the detection accuracy of the distance L can be ensured can be output.

[0096] (Fourth embodiment) The fourth embodiment is a modified example in which the third embodiment is combined with the second embodiment.

[0097] As shown in FIG. 14, in the control flow of the fourth embodiment, S4020 is executed instead of S3020. Specifically, in S4020, the update block 100 performs a notification process as a fail-safe process when the current detection cycle corresponds to the steady period Psr set in the monitoring period Pm and the failure indicator Ir corresponding to at least one sensor element among the failure indicators Ir for each of the coefficient parameters Ar, Br, Cr falls outside the preset allowable range. However, in the fail-safe process in S4020, the update process of the steady parameter Mpr, which is a part of the second embodiment, is performed together with the notification process. That is, in the update process of S4020, the parameters corresponding to the sensor element whose failure indicator Ir correlated with the fluctuation width ΔM among the coefficient parameters Ar, Br, Cr falls outside the allowable range are forcibly set to zero (0) as failure parameters for any index of the corresponding temperature among the temperatures Ta, Tb, Tc.

[0098] Therefore, in the update process of S4020, for normal parameters other than the fault parameter updated to zero among the coefficient parameters Ar, Br, and Cr, acquisition of the trial parameter Mpt by, for example, regression analysis is re-executed, and the stored parameter Mpm is learned from the re-execution result. At this time, for the constant parameter Dr, the stored parameter Mpm is also learned from the trial parameter Mpt whose acquisition is re-executed. Note that for the fault parameter forcibly set to zero in the steady-state parameter Mpr, the acquisition of the trial parameter Mpt, the monitoring of the fault indicator Ir, and the update of the stored parameter Mpm are skipped while keeping the value at zero until the optical sensor 10 is maintained.

[0099] According to the fourth embodiment described above, the fault parameters, which are the stored parameters Mpm, of the sensor element whose fault indicator Ir falls outside the allowable range are updated to zero. As a result, the correction model M can be updated so as to be defined by the stored parameters Mpm of the normal sensor element together with the zero-value fault parameters. Therefore, even after a sensor element in a faulty state is notified by fault notification information, the detection data is corrected according to the updated correction model M, making it possible to output detection data in which a decrease in the detection accuracy of the distance L is suppressed.

[0100] (Other embodiments) Although several embodiments have been described above, the present disclosure should not be construed as being limited to those embodiments, and can be applied to various embodiments within the scope not departing from the gist of the present disclosure.

[0101] In the modifications of the first to fourth embodiments, the dedicated computer constituting the control device as the control unit 51 may have at least one of a digital circuit and an analog circuit as a processor. Here, the digital circuit is at least one of ASIC (Application Specific Integrated Circuit), FPGA (Field Programmable Gate Array), SOC (System on a Chip), PGA (Programmable Gate Array), CPLD (Complex Programmable Logic Device), etc. In addition, such a digital circuit may have a memory that stores a program.

[0102] In S10 in the control flow of the modified examples of the first and second embodiments, the determination of the startup period Pss set in the monitoring period Pm may be omitted, and thus the updating by monitoring of the startup parameter Mps in S20 and S2020 may be omitted. In S40 of the control flow to which the modified example of the first and second embodiments that omits the startup period determination and update is applied, the correction by reading out the stored parameter Mpm related to the startup parameter Mps may be omitted. In S40 of the control flow to which the modified example of the first and second embodiments that omits the startup period determination and update is applied, instead of the correction by reading out the stored parameter Mpm related to the startup parameter Mps, the stored parameter Mpm related to the steady-state parameter Mpr may be read and corrected.

[0103] In S10 in the control flow of the modified example of the first and second embodiments, the determination of the steady period Psr set in the monitoring period Pm may be omitted, and thus the update by monitoring of the steady parameters Mpr in S20 and S2020 may be omitted. In S40 of the control flow to which the modified example of the first and second embodiments that omits the steady period determination and update is applied, the correction by reading out the stored parameters Mpm related to the steady parameters Mpr may be omitted.

[0104] In S20 and S2020 of the control flow of the modification of the first and second embodiments, one or two of the coefficient parameters As, Bs, and Cs may be unexpected as the startup parameters Mps during the startup period Pss set in the monitoring period Pm. In S20 and S2020 of the control flow to which a modification of such unexpected startup parameters Mps is applied to the first and second embodiments, the stored parameters Mpm for at least one of the coefficient parameters As, Bs, and Cs expected as the startup parameters Mps may be updated according to the fluctuation width ΔM that is the difference from the trial parameters Mpt. Furthermore, in S40 of the control flow to which a modification of the unexpected startup parameters Mps is applied, at least one of the temperatures Ta, Tb, and Tc may be obtained as the current temperature Tp corresponding to at least one of the coefficient parameters As, Bs, and Cs expected as the startup parameters Mps, and the stored parameters Mpm for the startup parameters Mps may be read out and corrected.

[0105] In S20, S2020, S3020, and S4020 in the control flow of the modified examples of the first to fourth embodiments, one or two of the coefficient parameters Ar, Br, and Cr may be unexpected as the steady-state parameters Mpr in the steady-state period Psr set in the monitoring period Pm. In S20, S2020, S3020, and S4020 in the control flow to which a modified example of such unexpected steady-state parameters Mpr is applied in the first to fourth embodiments, the stored parameters Mpm for at least one of the coefficient parameters Ar, Br, and Cr expected as the steady-state parameters Mpr may be updated according to the fluctuation width ΔM that is the difference from the trial parameters Mpt. Furthermore, in S40 in the control flow to which a modified example of the unexpected steady-state parameters Mpr is applied, at least one of the temperatures Ta, Tb, and Tc may be obtained as the current temperature Tp corresponding to at least one of the coefficient parameters Ar, Br, and Cr expected as the steady-state parameters Mpr, and the stored parameters Mpm for the steady-state parameters Mpr may be read out and corrected.

[0106] In S20 and S2020 in the control flows of the modified examples related to the first and second embodiments, the distance L to a specific reflector in the housing unit 11 may be detected as the trial distance Lt, instead of the distance L to the stationary target Xt, during the startup period Pss set to the monitoring period Pm. In S20, S2020, S3020, and S4020 in the control flows of the modified examples related to the first to fourth embodiments, the distance L to a specific reflector in the housing unit 11 may be detected as the trial distance Lt, instead of the distance L to the stationary target Xt, during the steady period Psr set to the monitoring period Pm.

[0107] In the modified examples of the first to fourth embodiments, the control device that executes the above-mentioned control method and control program as a control unit 51, and the moving body 1 to which the optical sensor 10 equipped with the same is applied may be, for example, an autonomous robot that is capable of transporting luggage or collecting information by autonomous or remote driving. In the modified examples of the first to fourth embodiments, the control device that executes the above-mentioned control method and control program as a control unit 51, and the optical sensor 10 equipped with the same may be, in addition to the moving body 1, an infrastructure facility such as a smart pole.

[0108] With regard to the first and second embodiments, in S20 and S2020 of the control flow for controlling the optical sensor 10 applied to the infrastructure equipment as described above, the distance L to a specific point on the ground may be detected as the trial distance Lt, instead of the distance L to the stationary target Xt, during the startup period Pss set in the monitoring period Pm. With regard to the first to fourth embodiments, in S20, S2020, S3020, and S4020 of the control flow for controlling the optical sensor 10 applied to the infrastructure equipment, the distance L to a specific point on the ground may be detected as the trial distance Lt, instead of the distance L to the stationary target Xt, during the steady period Psr set in the monitoring period Pm.

[0109] In the modified examples of the third and fourth embodiments, the fluctuation range ΔM itself may be monitored as the failure indicator Ir correlated with the fluctuation range ΔM focused on in S3020 and S4020. In the modified example of the fourth embodiment, in the update process when the failure indicator Ir falls outside the allowable range in S4020, the update of the stored parameter Mpm may be performed in accordance with the first embodiment. In the modified examples of the third and fourth embodiments, the notification process in S3020 and S4020 may be skipped. In the modified example of the third embodiment, the control adjustment process in S3020 may be skipped. In the modified examples of the third and fourth embodiments, in addition to or instead of the steady period Psr, the control according to the above description may also be performed in the startup period Pss. In addition to the forms described above, the first to fourth embodiments and each of the modified examples described above may be implemented in the form of a semiconductor device (e.g., a semiconductor chip) as the control unit 51.

[0110] (Additional remarks) This specification discloses the following technical ideas and their combinations. Note that the reference characters in parentheses in the appended remarks indicate the corresponding relationship with the specific means described in the above detailed embodiment, and do not limit the technical scope of this disclosure.

[0111] (Technical thought 1) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, in a correction model (M) for correcting the detection data of the distance depending on temperature (T), a fluctuation range (ΔM) of a correction parameter (Mp) that specifies the dependency of the temperature on the correction amount (ΔL) of the distance is monitored, and a stored parameter (Mpm) stored in a storage medium (51a) as the correction parameter is updated when the fluctuation range falls outside a permissible range; and correcting the detection data by the correction amount adjusted to the temperature each time the distance is detected according to the correction model provided in response to the latest stored parameters.

[0112] (Technical thought 2) Updating the stored parameters by monitoring the fluctuation range updating the stored parameters relating to the startup parameters when the fluctuation range of the startup parameters (Mps) monitored as the correction parameters that provide the correction model for the startup period (Pss) during which the optical sensor is started falls outside an allowable range; and updating the stored parameters related to the steady-state parameters when the fluctuation range of the steady-state parameters (Mpr) monitored as the correction parameters that provide the correction model for the steady-state period (Psr, Pdr) in which the optical sensor is in a steady state after the startup period falls outside an allowable range; The step of correcting the detection data includes: selecting the correction model according to the latest stored parameters related to the startup parameters to correct the detection data during the startup period; and correcting the detection data during the steady-state period by selecting the correction model that is given according to the latest stored parameters related to the steady-state parameters.

[0113] (Technical Thought 3) Updating the stored parameters by monitoring the fluctuation range Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the fluctuation range is monitored; monitoring the fluctuation range, which is a difference between the trial parameter (Mpt) serving as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; The control device according to Technical Idea 1 or 2, further comprising updating the stored parameters with the trial parameters when the fluctuation range falls outside an allowable range.

[0114] (Technical Thought 4) An optical sensor configured to be mountable on a moving body (1), Updating the stored parameters by monitoring the fluctuation range changing the trial temperature during the monitoring period that is set while the moving body is stopped; A control device as described in technical idea 3, which includes detecting the distance to the stationary target by the optical sensor for each change point of the trial temperature during the monitoring period during the stoppage.

[0115] (Technical Thought 5) Updating the stored parameters by monitoring the fluctuation range changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the variation range, which is a difference between the trial parameter that provides the correction model in accordance with the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; A control device according to technical idea 3 or 4, which includes, when the fluctuation range corresponding to at least one of the sensor elements falls outside the allowable range, learning of the stored parameters using the trial parameters is performed for each of the sensor elements.

[0116] (Technical Thought 6) Updating the stored parameters by monitoring the fluctuation range The control device according to technical idea 5 includes updating the stored parameters of the sensor elements whose fluctuation range falls outside the acceptable range to zero values.

[0117] (Technical Thought 7) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, monitoring a failure indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); and determining a state of the optical sensor in which the failure indicator falls outside an acceptable range as a failure state, and outputting failure notification information notifying the failure state.

[0118] (Technical Thought 8) Monitoring the fault indicators includes: Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the failure indicator is monitored; The control device according to technical idea 7 includes monitoring the failure indicator that correlates with the fluctuation range, which is the difference between a trial parameter (Mpt) as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and a stored parameter (Mpm) stored in a storage medium (51a) as the correction parameter.

[0119] (Technical Thought 9) Monitoring the fault indicators includes: changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the failure indicator correlated with the fluctuation range, which is a difference between the trial parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; The output of the failure notification information includes: The control device according to technical idea 8 includes outputting the fault notification information that notifies the state of the sensor element in which the fault indicator falls outside the allowable range as the fault state.

[0120] (Technical Thought 10) The processor, The control device according to technical idea 9, further configured to update the stored parameters of the sensor elements whose failure indicators fall outside the tolerance range to zero values.

[0121] (Technical Thought 11) The processor, The control device according to any one of Technical Ideas 7 to 9, further configured to adjust control parameters for controlling the optical sensor to recover from the failure state of the optical sensor when the failure indicator falls outside the acceptable range.

[0122] (Technical Thought 12) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, monitoring a failure indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); a control device configured to set a state of the optical sensor in which the failure indicator falls outside an acceptable range as a failure state, and to adjust a control parameter for controlling the optical sensor to a recovery side from the failure state.

[0123] (Technical Thought 13) Monitoring the fault indicators includes: Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the failure indicator is monitored; The control device according to technical idea 12 includes monitoring the failure indicator that correlates with the fluctuation range, which is the difference between a trial parameter (Mpt) as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and a stored parameter (Mpm) stored in a storage medium (51a) as the correction parameter.

[0124] (Technical Thought 14) Monitoring the fault indicators includes: changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the failure indicator correlated with the fluctuation range, which is a difference between the trial parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; Adjusting the control parameters includes: A control device according to technical idea 13, which includes adjusting the control parameters for controlling the sensor element when the failure indicator falls outside the acceptable range to a side to recover from the failure state.

[0125] (Technical Thought 15) Adjusting the control parameters includes: The control device according to technical idea 14 includes adjusting the control parameters for controlling the light-projecting unit (21) that projects the light beam as the sensor element whose failure indicator has fallen outside the acceptable range, to the recovery side of the failure state.

[0126] (Technical Thought 16) Adjusting the control parameters includes: The control device described in technical idea 14 or 15 includes adjusting the control parameters for controlling the light receiving unit (41) that receives the reflected beam as the sensor element whose failure indicator has fallen outside the acceptable range to the recovery side of the failure state.

[0127] (Technical Thought 17) An optical sensor configured to be mountable on a moving body (1), Monitoring the fault indicators includes: changing the trial temperature during the monitoring period that is set while the moving body is stopped; A control device described in any one of technical ideas 8 to 11, 13 to 16, which includes detecting the distance to the stationary target by the optical sensor for each change point of the trial temperature during the monitoring period during the stoppage. (Technical Thought 18) An optical sensor that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, A control unit (51) including the control device according to any one of Technical Concepts 1 to 17 and generating the detection data; a light projection unit (21) that projects the light projection beam in accordance with the control of the control unit; and a light receiving portion (41) that receives the reflected beam under control of the control portion.

[0128] The above-mentioned technical concepts 1 to 18 may be understood as the respective technical concepts of a method and a program. [Explanation of symbols]

[0129] 1: moving object, 10: optical sensor, 21: light projecting unit, 41: light receiving unit, 51: control unit, 51a: memory, 51b: processor, DA: detection area, Ir: fault indicator, L: distance, M: correction model, Mp: correction parameter, Mpm: stored parameter, Mpr: steady-state parameter, Mps: startup parameter, Mpt: trial parameter, PB: projected beam, Pm: monitoring period, Psr, Pdr: steady-state period, Pss: startup period, RB: reflected beam, T: temperature, Tt: trial temperature, Xt: target, ΔL: correction amount, ΔM: fluctuation range

Claims

1. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, a correction model (M) for correcting the detection data of the distance depending on temperature (T), monitoring a fluctuation range (δM) of a correction parameter (Mp) that specifies the dependency of the temperature on the correction amount (ΔL) of the distance, and updating a stored parameter (Mpm) stored in a storage medium (51 a) as the correction parameter when the fluctuation range falls outside an allowable range; and correcting the detection data by the correction amount adjusted to the temperature each time the distance is detected according to the correction model provided in response to the latest stored parameters.

2. Updating the stored parameters by monitoring the fluctuation range updating the stored parameters relating to the startup parameters (Mps) when the fluctuation range of the startup parameters (Mps) monitored as the correction parameters that provide the correction model for the startup period (Pss) during which the optical sensor is started falls outside an allowable range; and updating the stored parameters related to the steady-state parameters when the fluctuation range of the steady-state parameters (Mpr) monitored as the correction parameters that provide the correction model for a steady-state period (Psr, Pdr) in which the optical sensor is in a steady state after the startup period falls outside an allowable range; The step of correcting the detection data further comprises: selecting the correction model according to the latest stored parameters related to the startup parameters to correct the detection data during the startup period; and correcting the detection data during the steady state period by selecting the correction model provided in response to the latest stored parameters related to the steady state parameters.

3. Updating the stored parameters by monitoring the fluctuation range Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the fluctuation range is monitored; monitoring the fluctuation range, which is a difference between the stored parameter and a trial parameter (Mpt) serving as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period; 3. The control device according to claim 1, further comprising: updating the stored parameters with the trial parameters when the fluctuation range falls outside an allowable range.

4. The optical sensor is configured to be mountable on a moving body (1), Updating the stored parameters by monitoring the fluctuation range changing the trial temperature during the monitoring period that is set while the moving body is stopped; The control device according to claim 3 , further comprising: detecting the distance to the stationary target by the optical sensor for each change point of the trial temperature during the monitoring period during the stoppage.

5. Updating the stored parameters by monitoring the fluctuation range changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the variation range, which is a difference between the trial parameter that provides the correction model in accordance with the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; 4. The control device according to claim 3, further comprising: when the fluctuation range corresponding to at least one of the sensor elements falls outside an allowable range, learning of the stored parameters using the trial parameters is performed for each of the sensor elements.

6. Updating the stored parameters by monitoring the fluctuation range The control device according to claim 5 , further comprising updating the stored parameter of the sensor element in which the fluctuation range falls outside the allowable range to a zero value.

7. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); and determining a state of the optical sensor in which the failure indicator falls outside an acceptable range as a failure state, and outputting failure notification information notifying the failure state.

8. Monitoring the fault indicators includes: Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the failure indicator is monitored; The control device according to claim 7, further comprising monitoring the failure indicator that correlates with the fluctuation range, which is the difference between a trial parameter (Mpt) as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and a stored parameter (Mpm) stored in a storage medium (51a) as the correction parameter.

9. Monitoring the fault indicators includes: changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the failure indicator correlated with the fluctuation range, which is a difference between the trial parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; The output of the failure notification information includes: The control device according to claim 8 , further comprising outputting the failure notification information notifying, as the failure state, a state of the sensor element in which the failure indicator is outside an allowable range.

10. The processor, The control system of claim 9 , further configured to update the stored parameters of the sensor elements for which the fault indicator falls outside an acceptable range to a zero value.

11. The processor, The control device of claim 7 , further configured to adjust a control parameter for controlling the optical sensor to a recovery side of the fault condition of the optical sensor for which the fault indicator falls outside an acceptable range.

12. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, The processor, monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); a control device configured to set a state of the optical sensor in which the failure indicator falls outside an acceptable range as a failure state, and to adjust a control parameter for controlling the optical sensor to a recovery side from the failure state.

13. Monitoring the fault indicators includes: Varying a trial temperature (Tt), which is the temperature during a monitoring period (Pm) during which the failure indicator is monitored; The control device according to claim 12, further comprising monitoring the failure indicator that correlates with the fluctuation range, which is the difference between a trial parameter (Mpt) as the correction parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and a stored parameter (Mpm) stored in a storage medium (51a) as the correction parameter.

14. Monitoring the fault indicators includes: changing the temperature of each sensor element constituting the optical sensor as the trial temperature during the monitoring period; monitoring, for each of the sensor elements, the failure indicator correlated with the fluctuation range, which is a difference between the trial parameter that provides the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period and the stored parameter; Adjusting the control parameters includes: The control device according to claim 13 , further comprising adjusting the control parameter for controlling the sensor element for which the failure indicator has fallen outside an acceptable range to a side toward recovery from the failure state.

15. Adjusting the control parameters includes: The control device according to claim 14, further comprising adjusting the control parameters for controlling a light-projecting unit (21) that projects the light beam as the sensor element for which the failure indicator has fallen outside the tolerance range, to a recovery side of the failure state.

16. Adjusting the control parameters includes: The control device according to claim 14, further comprising adjusting the control parameters for controlling a light receiving unit (41) that receives the reflected beam as the sensor element in which the failure indicator falls outside the tolerance range, to a recovery side of the failure state.

17. The optical sensor is configured to be mountable on a moving body (1), Monitoring the fault indicators includes: changing the trial temperature during the monitoring period that is set while the moving body is stopped; The control device according to claim 8 or 13, further comprising: detecting the distance to the stationary target by the optical sensor for each change point of the trial temperature during the monitoring period during the stoppage.

18. An optical sensor that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, A control unit (51) including the control device according to any one of claims 1, 2, 7, and 12, and generating the detection data; a light projection unit (21) that projects the light projection beam according to the control of the control unit; and a light receiving portion (41) that receives the reflected beam under control of the control portion.

19. A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: a correction model (M) for correcting the detection data of the distance depending on temperature (T), monitoring a fluctuation range (δM) of a correction parameter (Mp) that specifies the dependency of the temperature on the correction amount (ΔL) of the distance, and updating a stored parameter (Mpm) stored in a storage medium (51 a) as the correction parameter when the fluctuation range falls outside an allowable range; and correcting the detection data by the correction amount adjusted to the temperature for each detection of the distance according to the correction model provided in response to the latest stored parameters.

20. A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); and outputting fault notification information notifying the optical sensor of the fault state when the fault indicator falls outside an acceptable range.

21. A control method executed by a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, comprising: monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); determining a state of the optical sensor in which the failure indicator falls outside an acceptable range as a failure state, and adjusting a control parameter for controlling the optical sensor to a recovery side from the failure state.

22. A control program stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, the control program including instructions to be executed by a processor (51b), a correction model (M) for correcting the detection data of the distance depending on temperature (T), monitoring a fluctuation range (δM) of a correction parameter (Mp) that specifies the dependency of the temperature on the correction amount (ΔL) of the distance, and updating a stored parameter (Mpm) stored in a storage medium (51 a) as the correction parameter when the fluctuation range falls outside an allowable range; and correcting the detection data by the correction amount adjusted to the temperature each time the distance is detected according to the correction model provided in response to the latest stored parameters.

23. A control program stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, the control program including instructions to be executed by a processor (51b), monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); and outputting fault notification information notifying the failure state of the optical sensor when the fault indicator falls outside an acceptable range.

24. A control program stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) in response to a projected beam (PB) projected onto a detection area (DA) and outputs detection data that detects a distance (L) to the target, the control program including instructions to be executed by a processor (51b), monitoring a fault indicator (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines a degree of dependency of the temperature on a correction amount (ΔL) of the distance in a correction model (M) for correcting the detection data of the distance depending on temperature (T); and determining that the state of the optical sensor in which the failure indicator falls outside an acceptable range is a failure state, and adjusting a control parameter for controlling the optical sensor to a side to recover from the failure state.

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