Monitoring method, monitoring program, and monitoring device

Abstract

To provide a monitoring method, monitoring program and monitoring device, which allow for easily maintaining the state of an analysis device.SOLUTION: A monitoring method for monitoring an analysis device monitoring a target object is provided, the method comprising acquiring self-diagnosis data of the analysis device outside a target object observation period of the analysis device, diagnosing the state of the analysis device on the basis of the self-diagnosis data, and outputting a diagnostic result of the state of the analysis device.SELECTED DRAWING: Figure 2A

Description

[Technical Field]

[0001] The present disclosure relates to a monitoring method, a monitoring program, and a monitoring device for an analysis device. [Background technology]

[0002] As described in Patent Document 1, a system is known in which information from an analysis device is uploaded and saved as shared data. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2003-344422 Summary of the Invention [Problem to be solved by the invention]

[0004] It is necessary not only to share information about analytical equipment, but also to utilize it to maintain the condition of the equipment.

[0005] The present disclosure has been made in consideration of the above points, and aims to provide a monitoring method, a monitoring program, and a monitoring device that can easily maintain the state of an analysis device. [Means for solving the problem]

[0006] In some embodiments, a monitoring method (1) is a method for monitoring an analytical device that observes an object, the monitoring method including: acquiring self-diagnosis data of the analytical device during a self-diagnosis enabled period during which the analytical device is not performing observation of the object; diagnosing the state of the analytical device based on the self-diagnosis data; and outputting a diagnosis result of the state of the analytical device.

[0007] By acquiring self-diagnosis data during a period when the analytical device is not observing an object, the influence on the observation results of the object is reduced. Furthermore, by outputting the diagnostic results of the analytical device's status, the status of the analytical device can be more easily understood than when the status of the analytical device is understood from the self-diagnosis data alone. As a result, the status of the analytical device can be easily maintained.

[0008] (2) In the monitoring method described in (1) above, the self-diagnosis enabling period may include a period during which the analysis device is not set to an observation mode.

[0009] (3) In the monitoring method described in (1) or (2) above, when the analytical device is operating in a continuous observation mode in which observation of the object is performed continuously, the self-diagnosis period may include a period before the analytical device starts operating in the continuous observation mode or a period after the analytical device ends operating in the continuous observation mode.

[0010] (4) In the monitoring method described in (1) or (2) above, when the analysis device is operating in a time lapse mode in which observation of the object is performed intermittently, the self-diagnosis period may include at least a portion of the period before the analysis device starts a series of operations performed during a section of the period in which the analysis device is operating in the time lapse mode, or at least a portion of the period after the analysis device has completed the series of operations.

[0011] (5) In the monitoring method according to any one of (1) to (4), the self-diagnosis data may be acquired immediately after the self-diagnosis enabled period starts or immediately before the self-diagnosis enabled period ends. This prevents the acquisition of self-diagnosis data from starting unintentionally by the user. As a result, the user can work safely.

[0012] (6) The monitoring method described in any one of (1) to (5) above may further include receiving an input from a user of the analytical device to set the time for acquiring the self-diagnosis data. The self-diagnosis data may be acquired after the time set by the user of the analytical device and within the self-diagnosis period. By the user setting the time for acquiring the self-diagnosis data, the user can check the status of the analytical device without forgetting. As a result, the status of the analytical device can be easily maintained.

[0013] (7) The monitoring method according to any one of (1) to (6) above may further include acquiring, as the self-diagnosis data, data that can be measured by placing a jig on the analysis device.

[0014] (8) In the monitoring method described in (7) above, the jig may have an opening. When the analysis device includes a camera, the opening may be configured so that noise contained in an image generated by the camera or dust or dirt adhering to the camera can be analyzed by capturing an image of the opening with the camera.

[0015] (9) In the monitoring method described in (7) or (8) above, the jig may include a pattern unit that displays a specific pattern. When the analysis device includes a camera and a stage configured to allow the object to be placed on the stage, the pattern unit may be configured to generate an image for checking the movement accuracy of the stage by placing the jig on the stage, moving the stage to a plurality of positions, and using the camera to capture the specific pattern of the pattern unit as the stage moves to each position.

[0016] (10) In the monitoring method according to any one of (7) to (9), the jig may include a holder, which may be configured to allow placement of a sample for the analyzer to acquire an autofocus optical signal when the analyzer implements an autofocus function.

[0017] By acquiring data using a jig, the accuracy of diagnosing the state of the analyzer is improved, and as a result, the state of the analyzer can be easily maintained.

[0018] (11) In the monitoring method according to any one of (1) to (10) above, the self-diagnosis data may include data measured by a sensor provided in the analysis device.

[0019] (12) In the monitoring method described in (11) above, the sensor may include at least one of an illuminance sensor that measures the intensity of laser light used by the analysis device to observe the object, a temperature sensor that measures the temperature inside a chamber in which the object is placed, or a gas sensor that measures the gas concentration inside the chamber.

[0020] When data measured by a sensor provided in an analytical device is acquired as self-diagnosis data, the self-diagnosis data is acquired without using a jig. By acquiring the self-diagnosis data without using a jig, the self-diagnosis data can be acquired in a short time. As a result, the state of the analytical device can be easily maintained.

[0021] (13) The monitoring method described in any one of (1) to (12) above may further include notifying the results of analyzing the state of the analysis device in the diagnostic results outside the network connected to the analysis device.

[0022] (14) The monitoring method according to any one of (1) to (13) above may further include notifying the diagnostic result outside a network connected to the analysis device.

[0023] (15) The monitoring method according to any one of (1) to (14) above may further include notifying a user of the analysis device of the diagnostic result by displaying the diagnostic result.

[0024] (16) The monitoring method described in any one of (1) to (15) above may further include notifying a user of the analysis device of the results of analyzing the state of the analysis device in the diagnostic results.

[0025] By notifying the user or maintenance staff of the analytical device of the status, the user or maintenance staff of the analytical device can check the diagnostic results without operating devices connected to the network to which the analytical device is connected, thereby easily maintaining the status of the analytical device.

[0026] (17) The monitoring method according to any one of (1) to (16) above may further include acquiring a log that records the operation of the analysis device during the period in which the analysis device is observing the object, and outputting the log. By having the control device acquire and output the log from the analysis device, a user or maintenance person of the analysis device can check the operating status of the analysis device without operating the control device or the analysis device.

[0027] (18) The monitoring method described in (17) above may further include notifying the analysis result of the log outside the network connected to the analysis device when at least one item included in the log does not meet the log monitoring criteria. In this way, a user or maintenance person of the analysis device can check for abnormalities included in the log of the analysis device without connecting to the network connected to the analysis device. As a result, the status of the analysis device can be easily maintained.

[0028] (19) A monitoring program according to some embodiments causes a processor to monitor an analytical device observing an object, the monitoring program including causing the processor to acquire self-diagnosis data of the analytical device outside of a period during which the analytical device observes the object, causing the processor to diagnose a state of the analytical device based on the self-diagnosis data, and causing the processor to output a diagnosis result of the state of the analytical device.

[0029] In some embodiments (20), a monitoring device monitors an analytical device that observes an object. The monitoring device acquires self-diagnosis data of the analytical device during a self-diagnosis enabled period during which the analytical device is not performing observation of the object, diagnoses the state of the analytical device based on the self-diagnosis data, and outputs a diagnosis result of the state of the analytical device. [Effects of the Invention]

[0030] According to the monitoring method, monitoring program, and monitoring device disclosed herein, the state of the analysis device can be easily maintained. [Brief explanation of the drawings]

[0031] [Figure 1] FIG. 1 is a block diagram illustrating an example of the configuration of a monitoring system according to a comparative example. [Figure 2A] 1 is a block diagram illustrating an example of the configuration of a monitoring system according to an embodiment. [Figure 2B] FIG. 2 is a block diagram illustrating an example of the configuration of a server control unit. [Figure 2C] FIG. 2 is a block diagram showing an example of the configuration of a sensor. [Figure 3] FIG. 2 is a schematic diagram showing an example of the configuration of a jig. [Figure 4] 10 is a flowchart illustrating an example of a procedure of a monitoring method according to an embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0032] (Comparative Example) 1, a monitoring system 9 according to the comparative example includes an analysis device 91 and a database 92. The analysis device 91 and the database 92 are connected via a network 93 so as to be able to communicate with each other.

[0033] The analytical device 91 is configured to be able to observe an object under a microscope. The analytical device 91 uploads data representing the state of the analytical device 91 itself to a database 92 while performing an operation to observe the object. The database 92 stores data representing the state of the analytical device 91. A user of the analytical device 91 manages consumables for the analytical device 91 and the timing of maintenance for the analytical device 91 based on the data stored in the database 92.

[0034] However, the information stored in database 92 is merely shared and is not specifically subject to analysis or analysis.

[0035] Therefore, a monitoring system 1 (see FIG. 2A) according to the present disclosure utilizes data representing the state of the analysis device 10 (see FIG. 2A) to easily maintain the state of the analysis device 10. The monitoring system 1 and the monitoring method according to the present disclosure will be described below.

[0036] (Configuration example of monitoring system 1 according to the present disclosure) 2A, 2B, and 2C, a monitoring system 1 according to an embodiment of the present disclosure includes an analysis device 10, a control device 20, and a server 30. The control device 20 controls the analysis device 10. The control device 20 may be configured integrally with the analysis device 10. That is, the analysis device 10 may have the control device 20 built in. At least a portion of the control device 20 or at least a portion of the server 30 is also referred to as a monitoring device. That is, the monitoring device may be configured to include at least a portion of the control device 20 or at least a portion of the server 30.

[0037] The control device 20 and the server 30 are connected via a network 40 so as to be able to communicate with each other via a wired or wireless connection. When the analysis device 10 has the control device 20 built in, the analysis device 10 and the server 30 are connected via the network 40 so as to be able to communicate with each other via a wired or wireless connection. The network 40 may be the Internet. The network 40 may also be a closed network using a dedicated line separated from the Internet. When the network 40 is the Internet, a VPN (Virtual Private Network) may be used to ensure the security of communication between the control device 20 and the server 30.

[0038] In the monitoring system 1, the analysis device 10 analyzes an image of an object to acquire data related to the object. The analysis device 10 may be, for example, an HCA (High Content Analysis) device. The object may be, for example, a living cell. The analysis device 10 may be configured to observe changes in the living cell over time, or may be configured to observe the living cell while culturing it. The object analyzed by the analysis device 10 is not limited to a living cell, and may be various other objects.

[0039] The control device 20 controls the analysis device 10 to acquire data related to the object, and also acquires data representing the state of the analysis device 10. The data representing the state of the analysis device 10 is data used to diagnose the analysis device 10, and is also referred to as self-diagnosis data. The control device 20 transmits the self-diagnosis data to the server 30.

[0040] The server 30 diagnoses the state of the analysis device 10 based on the self-diagnosis data and outputs the diagnosis result. A user of the analysis device 10, such as a manager or operator, can refer to the diagnosis result to confirm the reproducibility of data related to the object obtained by the analysis device 10. A user of the analysis device 10 can refer to the diagnosis result to confirm the stability of the environment for culturing the living cells, if the object is a living cell. In other words, the user of the analysis device 10 can confirm the quality of the data related to the object obtained by the analysis device 10 based on the diagnosis result.

[0041] Based on the diagnostic results, the server 30 may automatically perform maintenance on the analysis device 10. For example, the server 30 may perform maintenance on the analysis device 10 by instructing the control device 20 to replace parts or consumables of the analysis device 10.

[0042] The analysis device 10 may be monitored by a maintenance contractor. In this case, the person in charge at the maintenance contractor may check the diagnostic results of each of the multiple analysis devices 10 that are the target of maintenance on the server 30, determine whether maintenance is necessary for the analysis device 10 based on the diagnostic results, and perform the maintenance for the analysis device 10.

[0043] By automating or outsourcing the maintenance of analysis device 10, users of analysis device 10 can use analysis device 10 with peace of mind, knowing that the quality of data related to the target object is guaranteed. Furthermore, when analysis device 10 is managed by referring to diagnostic results obtained based on self-diagnosis data, the state of analysis device 10 can be maintained more easily than when analysis device 10 is managed by referring only to the self-diagnosis data of analysis device 10.

[0044] Below, specific examples of each component of the monitoring system 1 will be described.

[0045] <Analysis device 10> As shown in FIG. 2A, the analysis device 10 includes a microscope 11, a stage 14, a camera 12, and a sensor 13.

[0046] The microscope 11 has an optical system that forms an image of an object on the imaging plane of the camera 12. The optical system includes an objective lens located on the side of the object. The microscope 11 may be configured to be able to change the magnification when forming an image of the object. The microscope 11 may be configured to be able to adjust the focus of the optical system that forms an image of the object. The microscope 11 may have an autofocus function that can automatically adjust the focus of the optical system.

[0047] In the present disclosure, the microscope 11 is a fluorescence microscope that uses laser light. When the microscope 11 is a fluorescence microscope that uses laser light, the microscope 11 has a light source that emits laser light. The microscope 11 is not limited to a fluorescence microscope that uses laser light, and may be configured in various other ways.

[0048] The camera 12 captures an image of the object imaged by the microscope 11 and outputs the captured image. The camera 12 may be configured to include an imaging element such as a CCD (Charge Coupled Device Image Sensor) or a CMOS (Complementary Metal Oxide Semiconductor) sensor. The imaging surface on which the microscope 11 images the object may be the light receiving surface of the imaging element.

[0049] The camera 12 may be cooled to reduce noise contained in captured images. The camera 12 may be configured to include a cooling means such as air cooling or water cooling. The camera 12 may be configured to be able to measure the temperature of the camera 12 itself. The camera 12 may be configured to be able to control the temperature of the camera 12 itself.

[0050] The camera 12 may be configured to include an optical system that forms an image of an object. The camera 12 may be configured so that the focus of the optical system is adjustable. The camera 12 may have an autofocus function that can automatically adjust the focus of the optical system.

[0051] The stage 14 is configured to allow an object to be placed thereon. The stage 14 may be included in the microscope 11. The stage 14 may be configured to move relative to the microscope 11 and the camera 12. Conversely, the microscope 11 and the camera 12 may be configured to move relative to the stage 14. Both the stage 14, the microscope 11, and the camera 12 may be configured to be movable.

[0052] The stage 14 may be configured to allow a container containing an object to be placed thereon. The stage 14 may also be configured to allow a jig 50 (see FIG. 3) used to acquire self-diagnosis data to be placed thereon.

[0053] 3, the jig 50 includes a holder 51, an opening 52, and a pattern portion 53 that displays a specific pattern. The jig 50 does not necessarily have to include at least one of the holder 51, the opening 52, and the pattern portion 53.

[0054] The holder 51 is configured so that a 35 mm dish or the like used to contain cells as an object can be placed thereon. When placing the 35 mm dish in the holder 51, the 35 mm dish may be filled with only water. The stage 14 is moved to the position of the holder 51 so that the 35 mm dish can be observed with the objective lens of the microscope 11, and autofocus is performed on the 35 mm dish filled with only water, thereby acquiring an autofocus optical signal. The holder 51 is configured so that a sample can be placed thereon for the analysis device 10 to acquire an autofocus optical signal.

[0055] The opening 52 is configured so that the camera 12 can capture an image of a space where nothing is present. The image captured by the camera 12 of the opening 52 includes noise from the imaging element of the camera 12, or dust or dirt adhering to the microscope 11 or the camera 12. In other words, by moving the stage 14 to the position of the opening 52 and capturing an image, information on the noise, dust, or dirt superimposed on the captured image is obtained. The opening 52 is configured so that by capturing an image of the opening 52 with the camera 12, the noise included in the image generated by the camera 12, or the dust or dirt adhering to the camera 12, can be analyzed.

[0056] The pattern section 53 displays a specific pattern. The specific pattern may include, for example, a grid pattern. The pattern section 53 is wider than the field of view of the objective lens of the microscope 11. Images for checking the movement accuracy of the stage 14 are acquired by photographing the pattern section 53 in multiple fields of view while moving the stage 14. The movement accuracy of the stage 14 is confirmed by the connection of the specific patterns shown in the images of each field of view. The pattern section 53 is configured so that images for checking the movement accuracy of the stage 14 can be generated by placing the jig 50 on the stage 14, moving the stage 14 to multiple positions, and using the camera 12 to photograph the pattern section 53 when the stage 14 moves to each position.

[0057] When the object is a cell, the stage 14 may include a chamber capable of controlling the temperature, carbon dioxide concentration, etc., required for culturing the cell or maintaining the cell state.

[0058] Sensor 13 measures physical quantities that indicate the state of each part of analysis device 10 and outputs the measurement results as self-diagnosis data. As shown in FIG. 2C, sensor 13 includes illuminance sensor 131, temperature sensor 132, and gas sensor 133.

[0059] When the microscope 11 is a fluorescence microscope that uses laser light, the illuminance sensor 131 is configured to measure the intensity of the laser light emitted from the light source. The illuminance sensor 131 may be located on the stage 14. When the illuminance sensor 131 is located on the stage 14, the stage 14 may be controlled so that the illuminance sensor 131 moves to a position irradiated with the laser light.

[0060] The temperature sensor 132 is configured to measure the temperature of the stage 14 or chamber in which the object is placed.

[0061] The gas sensor 133 is configured to measure a gas concentration, such as a carbon dioxide concentration, on the stage 14 on which the object is placed.

[0062] The sensor 13 may include at least one of the illuminance sensor 131, the temperature sensor 132, and the gas sensor 133. Conversely, the sensor 13 does not have to include at least one of the illuminance sensor 131, the temperature sensor 132, and the gas sensor 133. The sensor 13 is not limited to these examples and may be configured to measure various other physical quantities.

[0063] <Control device 20> The control device 20 includes a processor 21, a storage unit 22, and a communication unit 23.

[0064] The processor 21 may be configured to include, for example, a CPU (Central Processing Unit) or the like. The processor 21 may execute a predetermined program to realize various functions of the control device 20. Specifically, the processor 21 may control the microscope 11 or the stage 14 and the camera 12 of the analysis device 10 to acquire an image of any part of the object. The processor 21 may control the stage 14 to measure the intensity of the laser light with the illuminance sensor 131.

[0065] The storage unit 22 may store various types of information used in the operation of the control device 20, or programs for realizing the functions of the control device 20. The storage unit 22 may function as a work memory for the processor 21. The storage unit 22 may be configured to include an electromagnetic storage medium such as a magnetic disk, or may be configured to include a memory such as a semiconductor memory or a magnetic memory. The storage unit 22 may be configured integrally with the processor 21. The storage unit 22 may be configured as a storage device separate from the control device 20.

[0066] The communication unit 23 includes a communication device that is communicatively connected to the analysis device 10 and the server 30 via wired or wireless communication. The communication device may be configured to be communicable based on, for example, a LAN (Local Area Network) communication standard. The communication device may be configured to be communicable based on, for example, a mobile communication standard such as 4G (4th Generation), LTE (Long Term Evolution), or 5G (5th Generation). The communication device is not limited to these examples and may be configured to be communicable based on various communication standards.

[0067] The control device 20 may be configured as a PC (Personal Computer). The control device 20 may also be configured in various other ways.

[0068] The control device 20 may include a display device for notifying the user of the analysis device 10 of information. The display device may include, for example, a liquid crystal display (LCD). The display device may include, for example, an organic electroluminescence (EL) display or an inorganic EL display. The display device is not limited to these displays and may include displays of various other types. The display device may include a light-emitting device such as an LED (light-emitting diode).

[0069] The control device 20 may include an audio output device, such as a speaker, for communicating information to the user of the analysis device 10. The server 30 may include other output devices.

[0070] The control device 20 may include an input device for receiving input of operations or data by the user of the analysis device 10. The input device may include, for example, a keyboard or physical keys, or a pointing device such as a touch panel, a touch sensor, or a mouse. The input device is not limited to these examples and may include various other devices.

[0071] <Server 30> The server 30 includes a server control unit 31, a server storage unit 32, a server communication unit 33, and a display unit .

[0072] The server control unit 31 may be configured to include a processor such as a CPU (Central Processing Unit). The server control unit 31 may implement various functions of the server 30 by executing predetermined programs. As shown in FIG. 2B , the server control unit 31 includes an image analysis unit 310, a waveform analysis unit 311, a numerical analysis unit 312, a report creation unit 313, and a log analysis unit 314. The operation of each unit will be described later. The server control unit 31 does not necessarily include at least one of the image analysis unit 310, the waveform analysis unit 311, the numerical analysis unit 312, the report creation unit 313, and the log analysis unit 314.

[0073] The server storage unit 32 may store various types of information used in the operation of the server 30, or programs for realizing the functions of the server 30. The server storage unit 32 may function as a work memory for the server control unit 31. The server storage unit 32 may be configured to include an electromagnetic storage medium such as a magnetic disk, or may be configured to include a memory such as a semiconductor memory or a magnetic memory. The server storage unit 32 may be configured integrally with the server control unit 31. The server storage unit 32 may be configured as a storage device separate from the server 30.

[0074] The server communication unit 33 includes a communication device that is communicatively connected to the control device 20 or the analysis device 10 via wired or wireless communication. The communication device may be configured to be communicable based on, for example, a LAN communication standard. The communication device may be configured to be communicable based on, for example, a mobile communication standard such as 4G, LTE, or 5G. The communication device is not limited to these examples and may be configured to be communicable based on various communication standards.

[0075] The display unit 34 is configured to notify information to a user or maintenance person of the analysis device 10. The display unit 34 may include, for example, a liquid crystal display, an organic EL display, or an inorganic EL display. The display unit 34 is not limited to these displays and may include various other types of displays.

[0076] The server 30 may include an input device that accepts input of data, etc. from a user or maintenance person of the analysis device 10. The input device may include, for example, a keyboard or physical keys, or a pointing device such as a touch panel, a touch sensor, or a mouse. The input device is not limited to these examples and may include various other devices.

[0077] The server 30 may be configured as a PC or may be configured as at least one server device. The server 30 may be realized as a cloud computing system.

[0078] (Example of monitoring operation of the state of the analysis device 10) The monitoring system 1 monitors the state of the analysis device 10. In the monitoring system 1, the control device 20 acquires self-diagnosis data of the analysis device 10 during a self-diagnosis period using the sensor 13 of the analysis device 10, etc. The self-diagnosis period is a period during which the control device 20 can acquire self-diagnosis data of the analysis device 10. In the present disclosure, the self-diagnosis period is defined as a period during which the analysis device 10 is not observing an object. By acquiring self-diagnosis data when the analysis device 10 is not observing an object, the impact of the operation of acquiring the self-diagnosis data on data related to the object obtained by the analysis device 10 observing the object is reduced.

[0079] When performing observation of an object, the analysis device 10 may operate in either a continuous observation mode or a time-lapse mode.

[0080] The continuous observation mode is a mode in which the analysis device 10 continuously performs observation of the object. Continuous observation may include capturing images of the object at a predetermined frame rate, such as 60 frames per second. Continuous observation may also include moving a microscope motor to capture images continuously.

[0081] The time lapse mode is a mode in which the analysis device 10 performs intermittent observation of an object. Intermittent observation corresponds to photographing the object at a time interval longer than the time interval at which the object is photographed in continuous observation mode. The time interval at which the object is photographed in time lapse mode may be set in units of, for example, one minute or one hour, but is not limited to this and may be set as appropriate.

[0082] The state in which the analysis device 10 is operating in either the continuous observation mode or the time lapse mode corresponds to the state in which the analysis device 10 is performing an operation to observe an object. Conversely, the state in which the analysis device 10 is not performing an operation to observe an object corresponds to the state in which the analysis device 10 is not operating in either the continuous observation mode or the time lapse mode.

[0083] In the present disclosure, the continuous observation mode and the time lapse mode are collectively referred to as observation modes. The analysis device 10 may observe an object by operating in the set observation mode. Conversely, a period in which the analysis device 10 is not set to an observation mode is a period in which the analysis device 10 is not performing an operation to observe an object. The self-diagnosis possible period may include a period in which the analysis device 10 is not set to an observation mode.

[0084] When the analysis device 10 is operating in continuous observation mode, the self-diagnosis period may include at least a portion of the period before the analysis device 10 starts operating in continuous observation mode, or at least a portion of the period after the analysis device 10 ends operating in continuous observation mode.

[0085] When the analysis device 10 is operating in time lapse mode, the self-diagnosis period may include at least a portion of a period before the analysis device 10 starts a series of operations during a period during which the analysis device 10 is operating in time lapse mode, or at least a portion of a period after the analysis device 10 completes a series of operations during a period during which the analysis device 10 is operating in time lapse mode. A period during which the analysis device 10 operates in time lapse mode is a period during which the analysis device 10 performs a single observation that is started intermittently at a set time interval. Completion of a series of operations during a period during which the analysis device 10 operates in time lapse mode means that the analysis device 10 enters a standby state until the start of operations during the next period. In other words, when the analysis device 10 is operating in time lapse mode, the self-diagnosis period may include a period during which the analysis device 10 temporarily pauses while intermittently observing an object. A period during which the analysis device 10 temporarily pauses while intermittently observing an object is also referred to as a pause period.

[0086] Furthermore, when analysis device 10 is operating in time lapse mode, the self-diagnosis period may include at least a portion of the period before analysis device 10 starts operating in time lapse mode or at least a portion of the period after analysis device 10 ends operating in time lapse mode. In other words, when analysis device 10 is operating in time lapse mode, the self-diagnosis period does not need to include the sleep period.

[0087] Whether or not the self-diagnosis enabling period includes a rest period may be determined according to the time interval at which analysis device 10 captures images of the object in time lapse mode, so that self-diagnosis data is acquired at an appropriate frequency.

[0088] The control device 20 uploads the self-diagnosis data of the analysis device 10 acquired during the self-diagnosis period to the server 30. The server 30 diagnoses the state of the analysis device 10 based on the self-diagnosis data. The server 30 outputs the diagnosis results so that the user or a maintenance person can check them.

[0089] An example of the operation of the control device 20 and the server 30 in the monitoring system 1 according to this embodiment to monitor the state of the analysis device 10 will be described below.

[0090] <Example of operation of the control device 20> The control device 20 controls the analysis device 10 and monitors the state of the analysis device 10 .

[0091] The operation of the control device 20 to control the analysis device 10 is realized by the processor 21 of the control device 20 executing control software. As an operation of the control software, the processor 21 acquires self-diagnosis data of the analysis device 10 via the communication unit 23 and stores the self-diagnosis data in the memory unit 22.

[0092] The operation of the control device 20 to monitor the analysis device 10 is realized by the processor 21 executing monitoring software. When the control device 20 executes the monitoring software, it constitutes at least a part of the monitoring device. As an operation of the monitoring software, the processor 21 detects that the self-diagnosis data of the analysis device 10 has been stored in the memory unit 22, and uploads the self-diagnosis data of the analysis device 10 to the server 30 via the network 40. The network 40 used to upload the self-diagnosis data may be a closed network.

[0093] The processor 21 may be configured to execute both the control software and the monitoring software using a single CPU or the like. The processor 21 may also be configured to execute the control software and the monitoring software using separate CPUs or the like. The control software and the monitoring software may be realized as a single piece of software.

[0094] The server 30 receives the self-diagnosis data of the analysis device 10 uploaded from the control device 20 via the server communication unit 33. The server control unit 31 analyzes the self-diagnosis data of the analysis device 10 using the image analysis unit 310, the waveform analysis unit 311, or the numerical analysis unit 312 (see FIG. 2B). The server control unit 31 may store the self-diagnosis data of the analysis device 10 in the server storage unit 32 and analyze the self-diagnosis data.

[0095] The server control unit 31 generates a diagnosis result of the analysis device 10 based on the self-diagnosis data in the report creation unit 313 (see FIG. 2B). The server control unit 31 may create the diagnosis result as a file in a predetermined format such as PDF. The server control unit 31 may create the diagnosis result as web content in a predetermined format such as HTML (HyperText Markup Language).

[0096] The server control unit 31 may display the diagnostic results on the display unit 34. The server control unit 31 may store the diagnostic results in the server storage unit 32 and display information such as a uniform resource locator (URL) that identifies the location where the diagnostic results are stored on the display unit 34 so that the user can view the diagnostic results on a terminal device. The user of the analysis device 10 can check the diagnostic results without going to the location where the control device 20 or the analysis device 10 is installed.

[0097] When maintenance of the analysis device 10 is outsourced, the person in charge of the maintenance contractor can check the diagnostic results without visiting the installation location of the control device 20 or the analysis device 10. When maintenance is outsourced for multiple analysis devices 10, the maintenance person may check the diagnostic results of each of the multiple analysis devices 10 together on the display unit 34. The diagnostic results can be checked without visiting the installation locations of each of the multiple analysis devices 10, and it is only necessary to visit the analysis device 10 that requires maintenance. As a result, the condition of the analysis device 10 can be easily maintained.

[0098] The server control unit 31 may transmit the diagnostic results from the server communication unit 33 to the control device 20 via the network 40. The network 40 used when transmitting the diagnostic results to the control device 20 may be a closed network. The processor 21 of the control device 20 may acquire the diagnostic results and output them on the control device 20 or the analysis device 10. If the control device 20 or the analysis device 10 is equipped with a display device, it may display the diagnostic results. The user of the analysis device 10 can check the diagnostic results on the control device 20 or the analysis device 10. In other words, there is no need to prepare an external device to check the diagnostic results. As a result, the state of the analysis device 10 is easily maintained.

[0099] The server control unit 31 may transmit the diagnostic results from the server communication unit 33 to an external device such as a terminal device of a user or maintenance person of the analysis device 10. The user or maintenance person of the analysis device 10 can check the diagnostic results without the user or maintenance person having to check the diagnostic results themselves. As a result, the state of the analysis device 10 can be easily maintained.

[0100] When it is determined based on the diagnosis results that maintenance of analysis device 10 is required, server control unit 31 may notify an external device, such as a terminal device of a user of analysis device 10 or a maintenance technician, that maintenance of analysis device 10 is required. In other words, server control unit 31 may notify an external device, outside network 40 connected to analysis device 10, that maintenance of analysis device 10 is required. In this way, the user of analysis device 10 or a maintenance technician can confirm that maintenance of analysis device 10 is required without connecting to network 40 connected to analysis device 10. As a result, the state of analysis device 10 is easily maintained.

[0101] If the diagnostic result contains an error, the server control unit 31 may determine that maintenance of the analysis device 10 is necessary. The diagnostic result error may include at least one item representing the status of the analysis device 10 being abnormal. In other words, the diagnostic result error may include at least one item representing the status of the analysis device 10 being outside the monitoring criteria. If the measurement result of an item representing the status of the analysis device 10 is obtained as a numerical value, the monitoring criteria for that item may be set as a numerical range. If the measurement result of an item representing the status of the analysis device 10 is obtained as an image or a waveform, the monitoring criteria for that item may be set as a reference image or a reference waveform. The reference image or reference waveform is an image or waveform used as a reference for monitoring the status of the analysis device 10. The server control unit 31 may generate a machine learning or deep learning model using the reference image or reference waveform and determine whether at least one item representing the status of the analysis device 10 is outside the monitoring criteria using the generated model.

[0102] The server control unit 31 may notify the user or maintenance person of the analysis device 10 that maintenance of the analysis device 10 is required by sending an email or a message. When notifying that maintenance of the analysis device 10 is required, the server control unit 31 may attach a file such as a PDF file generated as a diagnosis result. By being notified that maintenance of the analysis device 10 is required, the user or maintenance person of the analysis device 10 does not need to check all of the diagnosis results. As a result, the state of the analysis device 10 can be easily maintained.

[0103] The server control unit 31 may analyze the state of the analysis device 10 in the diagnostic results and notify the analysis result of the state of the analysis device 10 outside the network 40 connected to the analysis device 10. The server control unit 31 may notify the diagnostic result outside the network 40 connected to the analysis device 10, regardless of whether at least one item representing the state of the analysis device 10 in the diagnostic results falls outside the monitoring standard. The server control unit 31 may notify the diagnostic result outside the network 40 connected to the analysis device 10 when at least one item representing the state of the analysis device 10 in the diagnostic results falls outside the monitoring standard. In this way, a user or maintenance person of the analysis device 10 can check the diagnostic result without operating a device connected to the network 40 connected to the analysis device 10. As a result, the state of the analysis device 10 is easily maintained.

[0104] As described above, the server control unit 31 monitors the state of the analysis device 10 by diagnosing the state of the analysis device 10 based on the self-diagnosis data of the analysis device 10. The server 30 constitutes at least a part of a monitoring device.

[0105] <Example of self-diagnosis data> As described above, the state of analysis device 10 is easily maintained by outputting a diagnosis result based on the self-diagnosis data of analysis device 10. Examples of self-diagnosis data used to diagnose the state of analysis device 10 are described below.

[0106] <<Self-diagnosis data acquired without using the jig 50>> The self-diagnosis data of the analysis device 10 includes data acquired without using the jig 50. Examples of self-diagnosis data acquired without using the jig 50 will be described below.

[0107] When analysis device 10 observes an object using laser light, the self-diagnosis data of analysis device 10 may include the result of measuring the intensity of the laser light with illuminance sensor 131. When observing the object, control device 20 controls analysis device 10 to irradiate the object with laser light, but when measuring the intensity of the laser light, control device 20 controls analysis device 10 to irradiate illuminance sensor 131 with laser light. Specifically, control device 20 may move a light source of the laser light to the position of illuminance sensor 131. Control device 20 may also move illuminance sensor 131 to the position where the laser light is irradiated.

[0108] When the analytical device 10 controls the temperature of the chamber to culture or maintain the state of living cells, the self-diagnosis data of the analytical device 10 may include the result of measuring the temperature of the chamber with the temperature sensor 132. The temperature sensor 132 may be installed in the chamber.

[0109] When the analytical device 10 controls the carbon dioxide concentration in the chamber, the self-diagnostic data of the analytical device 10 may include the result of measuring the carbon dioxide concentration in the chamber with the gas sensor 133. The gas sensor 133 may be installed in the chamber.

[0110] The self-diagnosis data of the analysis device 10 may include the temperature measurement results of the camera 12. The control device 20 may acquire the temperature measurement results of the camera 12 from the camera 12 via an API (Application Programming Interface) of the camera 12.

[0111] The server 30 uses the numerical analysis unit 312 of the server control unit 31 to analyze the measurement results of the laser light intensity, the temperature or carbon dioxide concentration of the chamber, or the temperature of the camera 12, and generates a diagnosis result of the analysis device 10. The numerical analysis unit 312 may generate a diagnosis result of the analysis device 10 by determining whether the numerical value obtained as the measurement result for each item falls within a predetermined range.

[0112] When data measured by the sensor 13 included in the analysis device 10 is acquired as self-diagnosis data, the self-diagnosis data is acquired without using the jig 50. By acquiring the self-diagnosis data without using the jig 50, the self-diagnosis data can be acquired in a short time. As a result, the state of the analysis device 10 can be easily maintained.

[0113] <<Self-diagnosis data acquired using the jig 50>> The self-diagnosis data of the analysis device 10 may include data acquired using the jig 50. Examples of the self-diagnosis data acquired using the jig 50 are given below.

[0114] The self-diagnosis data of the analysis device 10 may include information such as noise superimposed on an image of the object captured by the camera 12, or dust or dirt that appears in the image. The information on the noise, dust, or dirt is acquired by capturing an image of the opening 52 of the jig 50 with the camera 12. The control device 20 may prompt the user to install the jig 50 on the analysis device 10 so that the camera 12 can capture an image of the opening 52 in the analysis device 10, or may control the analysis device 10 to automatically install the jig 50.

[0115] The self-diagnosis data of the analysis device 10 may include images for checking the movement accuracy of the stage 14. The movement accuracy of the stage 14 affects the accuracy of the image of the object when an object that does not fit within the field of view of the objective lens of the microscope 11 is photographed by the camera 12 in multiple fields of view and the images of the multiple fields of view are stitched together to generate an image of the object. Images for checking the movement accuracy of the stage 14 are acquired by photographing the pattern portion 53 in multiple fields of view while moving the stage 14. The control device 20 may prompt the user to install the jig 50 on the analysis device 10 so that the pattern portion 53 can be photographed by the camera 12, or may control the analysis device 10 to automatically install the jig 50.

[0116] The self-diagnosis data of the analysis device 10 may include an optical signal from autofocus. The optical signal from autofocus is acquired by performing autofocus on a 35 mm dish filled with only water. The 35 mm dish is placed in the holder 51 of the jig 50. The control device 20 may prompt the user to perform an operation to place the jig 50 on the analysis device 10 so that autofocus can be performed on the 35 mm dish, or may control the analysis device 10 to automatically place the jig 50.

[0117] The server 30 analyzes an image of the opening 52 or an image of the pattern portion 53, etc., using the image analysis unit 310 of the server control unit 31, and generates a diagnostic result for the analysis device 10. The image analysis unit 310 may generate a diagnostic result for the analysis device 10 indicating whether the image of the opening 52 contains noise, dust, dirt, etc. The image analysis unit 310 may generate a diagnostic result for the analysis device 10 indicating whether the deviation of the grid pattern in the image of the pattern portion 53 is within a predetermined range. The server 30 analyzes a waveform of an optical signal of the autofocus, etc., using the waveform analysis unit 311 of the server control unit 31, and generates a diagnostic result for the analysis device 10. The waveform analysis unit 311 may generate a diagnostic result for the analysis device 10 indicating whether the waveform of the optical signal of the autofocus is normal.

[0118] The data that can be acquired using jig 50 is data that cannot be acquired when analysis device 10 is performing normal observation operations. By acquiring data using jig 50, the accuracy of diagnosing the state of analysis device 10 is improved. As a result, the state of analysis device 10 is easily maintained.

[0119] <When to collect self-diagnosis data> As described above, the control device 20 acquires the self-diagnosis data of the analysis device 10 during the period during which the analysis device 10 is capable of performing self-diagnosis. The timing for acquiring the self-diagnosis data may be set as appropriate during the period during which the analysis device 10 is capable of performing self-diagnosis.

[0120] The control device 20 may receive an input from the user specifying the time for acquiring self-diagnosis data. If the time set by the user is within the self-diagnosis enabled period, the control device 20 may acquire the self-diagnosis data at the time set by the user. If the time set by the user is outside the self-diagnosis enabled period, the control device 20 may acquire the self-diagnosis data when the self-diagnosis enabled period occurs after the time set by the user. In other words, the self-diagnosis data may be acquired after the time set by the user and within the self-diagnosis enabled period. The control device 20 may acquire both data that can be acquired without using the jig 50 and data that can be acquired using the jig 50. The control device 20 may acquire only data that can be acquired without using the jig 50 at the time set by the user. By the user setting the time for acquiring self-diagnosis data, the user can check the status of the analysis device 10 without forgetting. As a result, the status of the analysis device 10 is easily maintained.

[0121] The control device 20 may acquire self-diagnosis data as an interrupt operation immediately before the analysis device 10 starts the operation of observing the object or immediately after the analysis device 10 finishes the operation of observing the object. In other words, the self-diagnosis data may be acquired at the start or end of the period during which the analysis device 10 performs the observation of the object. By acquiring the self-diagnosis data at the start or end of the observation period, the quality of the observation results acquired during the observation period is guaranteed. The self-diagnosis data may be acquired immediately after the start of the self-diagnosis possible period or immediately before the end of the self-diagnosis possible period. When the control device 20 recognizes that the analysis device 10 will start the operation of observing the object, the control device 20 may acquire the self-diagnosis data before the analysis device 10 starts the operation of observing the object. Furthermore, the control device 20 may acquire the self-diagnosis data before causing the analysis device 10 to start the operation of observing the object. In this way, the control device 20 can acquire the self-diagnosis data immediately before the analysis device 10 starts the operation of observing the object.

[0122] Acquiring self-diagnosis data when the analysis device 10 starts or ends a period during which the analysis device 10 performs observation of an object can be considered to be performing a self-diagnosis in conjunction with the user's intended action of performing the observation. By performing a self-diagnosis when the user performs an operation to start or end the observation, it is possible to prevent the analysis device 10 from starting to acquire self-diagnosis data when the user does not intend. For example, it is possible to prevent the analysis device 10 from suddenly starting unintentionally while a maintenance technician is performing maintenance on the analysis device 10. By not acquiring self-diagnosis data when the user does not intend, the user can work safely.

[0123] <Example of monitoring procedure> The processor 21 of the control device 20 may execute a monitoring method including the procedure exemplified in the flowchart of Fig. 4. The procedure exemplified in the flowchart of Fig. 4 may be realized as a monitoring program executed by a processor constituting the processor 21. The monitoring program may be stored in a non-transitory computer-readable medium such as an electromagnetic storage medium.

[0124] Processor 21 determines whether the time set by the user has arrived as the time for acquiring self-diagnosis data (step S1). If the time set by the user has not arrived (step S1: NO), processor 21 ends the execution of the procedure of the flowchart in FIG.

[0125] If the time has arrived as set by the user (step S1: YES), processor 21 determines whether the current time is within the self-diagnosis possible period (step S2). Specifically, processor 21 determines that the current time is outside the self-diagnosis possible period when analysis device 10 is operating in continuous observation mode or time lapse mode. Conversely, processor 21 determines that the current time is within the self-diagnosis possible period when analysis device 10 is not operating in either continuous observation mode or time lapse mode.

[0126] If the current time is not within the self-diagnosis possible period (step S2: NO), processor 21 repeats the determination procedure of step S2 until analysis device 10 is no longer performing the observation operation, i.e., until analysis device 10 has finished the observation operation. If the current time is within the self-diagnosis possible period (step S2: YES), processor 21 acquires self-diagnosis data (step S3). After executing the procedure of step S3, processor 21 ends execution of the procedure of the flowchart in FIG. 4.

[0127] When processor 21 acquires the self-diagnosis data, processor 21 uploads the self-diagnosis data to server 30. Server control unit 31 of server 30 diagnoses the state of analysis device 10 based on the self-diagnosis data and outputs the diagnosis result.

[0128] The processor 21 may acquire the self-diagnosis data immediately before the analysis device 10 starts operation in either the continuous observation mode or the time lapse mode. The processor 21 may acquire the self-diagnosis data immediately before the analysis device 10 starts operation by acquiring the self-diagnosis data and then starting operation of the analysis device 10. The processor 21 may acquire the self-diagnosis data immediately after the analysis device 10 finishes operation in either the continuous observation mode or the time lapse mode.

[0129] <Summary> As described above, with the monitoring system 1, control device 20, and server 30 according to this embodiment, self-diagnosis data is acquired within a self-diagnosis possible period during which the analysis device 10 is not performing an operation to observe an object. By acquiring self-diagnosis data within the self-diagnosis possible period, the impact of the operation of acquiring the self-diagnosis data on the observation results of the object is reduced. Furthermore, the state of the analysis device 10 is diagnosed based on the self-diagnosis data, and a diagnosis result of the state of the analysis device 10 is output. By outputting the diagnosis result of the state of the analysis device 10, the state of the analysis device 10 can be understood more easily than when the state of the analysis device 10 is understood from the self-diagnosis data alone. As a result, the state of the analysis device 10 can be easily maintained.

[0130] (Other embodiments) Other embodiments of the monitoring system 1 will now be described.

[0131] <Log output> The analysis device 10 may generate a log that records the operation of the microscope 11, camera 12, stage 14, etc. of the analysis device 10 during the period in which the object is being observed. If an error occurs in the operation of the microscope 11, camera 12, stage 14, etc., the analysis device 10 may generate an error log that records the error. The control device 20 may acquire the log or error log from the analysis device 10 and upload it to the server 30. The control device 20 may upload the log or error log of the analysis device 10 to the server 30, for example, every 24 hours. The interval at which the control device 20 uploads the log or error log is not limited to 24 hours and may be set as appropriate. By the control device 20 acquiring the log or error log from the analysis device 10 and uploading it to the server 30, a user or maintenance person of the analysis device 10 can check the operating status of the analysis device 10 without operating the control device 20 or the analysis device 10.

[0132] The server control unit 31 of the server 30 may analyze the log or error log of the analysis device 10 using the log analysis unit 314. The log analysis unit 314 may determine whether at least one item included in the log of the analysis device 10 falls outside the log monitoring criteria. For example, when the operation of each part of the analysis device 10 is recorded as a numerical value, the log monitoring criteria may be set as a numerical range for when each part is operating normally. When the log analysis unit 314 acquires an error log, it may determine that the analysis device 10 falls outside the log monitoring criteria.

[0133] If at least one item included in the log of analysis device 10 does not meet the log monitoring criteria, server control unit 31 may notify the log analysis result outside network 40 connected to analysis device 10. In this way, a user or maintenance person of analysis device 10 can check abnormalities included in the log of analysis device 10 without connecting to network 40 connected to analysis device 10. As a result, the state of analysis device 10 can be easily maintained.

[0134] <Example of device configuration> As described above, in the monitoring system 1 according to the present disclosure, the server 30 processes data from the analysis device 10. The control device 20 may be configured to execute the functions of the server 30. In other words, the server 30 and the control device 20 may be configured as an integrated unit.

[0135] Furthermore, when control device 20 is included in analysis device 10, analysis device 10 may be configured to execute the functions of server 30. In other words, server 30 and analysis device 10 may be configured as an integrated unit.

[0136] The control devices 20 and the analysis devices 10 may be connected in a one-to-one correspondence. That is, one control device 20 may be connected to one analysis device 10. The server 30 may be connected to each combination of the control device 20 and the analysis device 10.

[0137] One control device 20 may be connected to multiple analysis devices 10. In this case, the server 30 may be connected to one control device 20 via a network 40. If the network 40 is a closed network, the server 30 is connected to one control device 20, thereby reducing the number of devices connected to the closed network.

[0138] <Estimation of the state of the analysis device 10> As described above, in the monitoring system 1 according to the present disclosure, the server 30 can diagnose the state of the analysis device 10 based on the self-diagnosis data of the analysis device 10. The server 30 may also estimate the future state of the analysis device 10 based on the self-diagnosis data of the analysis device 10. For example, the server control unit 31 of the server 30 may estimate the replacement time for the laser light source based on the measurement results of the laser light intensity and the operating time of the laser light source. Furthermore, the server control unit 31 may estimate the maintenance time for the stage 14 based on the movement accuracy of the stage 14.

[0139] Server control unit 31 may estimate the timing of maintenance for each part of analysis device 10 based on the change over time in each item of self-diagnosis data of analysis device 10.

[0140] The above describes an embodiment of the present disclosure with reference to the drawings, but the specific configuration is not limited to this embodiment, and various modifications are also included within the scope that does not deviate from the spirit of the present disclosure. [Explanation of symbols]

[0141] 1. Surveillance System 10 Analysis device (11: microscope, 12: camera, 13: sensor, 131: illuminance sensor, 132: temperature sensor, 133: gas sensor, 14: stage) 20 control device (21: processor, 22: memory unit, 23: communication unit) 30 Server (31: Server control unit, 310: Image analysis unit, 311: Waveform analysis unit, 312: Numerical analysis unit, 313: Report creation unit, 314: Log analysis unit, 32: Server storage unit, 33: Server communication unit, 34: Display unit) 40 Network 50 jig (51: holder, 52: opening, 53: pattern portion)

Claims

1. 1. A monitoring method for monitoring an analytical device that observes an object, comprising: acquiring self-diagnosis data of the analysis device during a self-diagnosis enabled period during which the analysis device is not performing observation of the object; diagnosing the state of the analyzer based on the self-diagnosis data; outputting a diagnosis result of the state of the analysis device; A monitoring method, including:

2. The monitoring method according to claim 1 , wherein the self-diagnosis enabling period includes a period during which the analysis device is not set to an observation mode.

3. The monitoring method described in claim 1, wherein when the analytical device is operating in a continuous observation mode, which is a mode in which observation of the object is performed continuously, the self-diagnosis possible period includes a period before the analytical device starts operating in the continuous observation mode or a period after the analytical device ends operating in the continuous observation mode.

4. 2. The monitoring method of claim 1, wherein, when the analysis device is operating in a time lapse mode in which observation of the object is performed intermittently, the self-diagnosis period includes at least a portion of a period before the analysis device starts a series of operations performed during a section of the period in which the analysis device is operating in the time lapse mode, or at least a portion of a period after the analysis device has completed the series of operations.

5. The monitoring method according to claim 1 , wherein the self-diagnosis data is acquired immediately after the self-diagnosis enabled period starts or immediately before the self-diagnosis enabled period ends.

6. and receiving an input from a user of the analysis device to set a time when the self-diagnosis data is to be acquired; The monitoring method according to claim 1 , wherein the self-diagnosis data is acquired after a time set by a user of the analysis device and within the self-diagnosis enabled period.

7. The monitoring method according to claim 1 , further comprising acquiring, as the self-diagnosis data, data that can be measured by placing a jig on the analysis device.

8. the jig has an opening; The monitoring method according to claim 7, wherein the opening is configured so that, when the analysis device is equipped with a camera, noise contained in an image generated by the camera or dust or dirt adhering to the camera can be analyzed by photographing the opening with the camera.

9. the jig has a pattern portion that displays a specific pattern, The monitoring method of claim 7, wherein when the analysis device is equipped with a camera and a stage configured to allow the object to be placed on it, the pattern section is configured so that an image for confirming the movement accuracy of the stage can be generated by placing the jig on the stage, moving the stage to multiple positions, and using the camera to photograph a specific pattern of the pattern section as the stage moves to each position.

10. The jig includes a holder; The monitoring method according to claim 7 , wherein the holder is configured to allow the analyzer to place a sample thereon for acquiring an optical signal of autofocus when the analyzer implements an autofocus function.

11. The monitoring method according to claim 1 , wherein the self-diagnosis data includes data measured by a sensor provided in the analysis device.

12. The monitoring method of claim 11, wherein the sensor includes at least one of an illuminance sensor that measures the intensity of a laser light used by the analysis device to observe the object, a temperature sensor that measures the temperature in a chamber in which the object is placed, or a gas sensor that measures a gas concentration in the chamber.

13. The monitoring method according to claim 1 , further comprising notifying a result of analyzing the state of the analysis device in the diagnosis result to a network outside the analysis device.

14. The monitoring method according to claim 1 , further comprising transmitting the diagnostic results outside a network connected to the analysis device.

15. The monitoring method of claim 1 , further comprising notifying a user of the analytical device of the diagnostic results by displaying the diagnostic results.

16. The monitoring method according to claim 1 , further comprising notifying a user of the analysis device of the results of analyzing the state of the analysis device in the diagnosis result.

17. acquiring a log that records the operation of the analysis device while the analysis device is observing the object; outputting the log; The monitoring method according to any one of claims 1 to 4, further comprising:

18. The monitoring method according to claim 17, further comprising notifying an analysis result of the log outside the network connected to the analysis device when at least one item included in the log does not meet a log monitoring standard.

19. a monitoring program that causes a processor to monitor an analytical device that observes an object, the monitoring program comprising: causing the processor to acquire self-diagnosis data of the analysis device outside a period during which the analysis device observes the object; causing the processor to diagnose the state of the analyzer based on the self-diagnosis data; causing the processor to output a diagnosis of the state of the analysis device; Including, monitoring programs.

20. A monitoring device that monitors an analysis device that observes an object, acquiring self-diagnosis data of the analysis device during a self-diagnosis enabled period, which is a period during which the analysis device is not performing observation of the object; Diagnosing the state of the analyzer based on the self-diagnosis data; Outputting the diagnosis result of the state of the analysis device Monitoring equipment.

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