Anti-counterfeiting label and management status determination method
The counterfeit prevention label integrates temperature management verification through a laminated substrate structure with specific dimensional change rates, enabling effective counterfeit detection and temperature control assurance.
Patent Information
- Application Number
- JP2024047929
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-03-25
- Publication Date
- 2025-10-07
AI Technical Summary
Existing anti-counterfeit labels do not effectively integrate temperature management verification, making it difficult to determine if temperature-controlled products have been properly handled during distribution.
A counterfeit prevention label with a laminated structure of substrates having specific dimensional change rates, incorporating a thin line pattern that forms an optical image upon light irradiation, allowing detection of warping due to temperature and humidity exposure, indicating improper temperature management.
Enables both counterfeit prevention and reliable temperature management verification by detecting warping, ensuring appropriate temperature control during distribution.
Smart Images

Figure 2025147600000001_ABST
Abstract
Description
[Technical Field]
[0001] The present invention relates to a counterfeit prevention label and a method for determining the management state. [Background technology]
[0002] As a measure to prevent the distribution of counterfeit goods, a system is known in which an anti-counterfeit label is attached to a product to determine whether the product is genuine. For example, Patent Document 1 discloses an anti-counterfeit label that is attached to an expensive product or the like and enables verification of unauthorized removal, the anti-counterfeit label comprising at least a substrate, an information display layer, and an adhesive layer laminated together, the adhesive layer having a multilayer structure in which, from the substrate side, at least a first adhesive layer, a diffraction structure-forming layer, and a second adhesive layer are laminated in this relative order, the first adhesive layer having a visible light transmittance of 50% or more, and the materials constituting the first adhesive layer and the second adhesive layer each having an adhesive strength, as defined in JIS Z0237, of 8000 mN / 25 mm or more.
[0003] Patent Document 2 discloses an information processing method used in a system that can guarantee the authenticity of commodities in circulation, in which an information processing device executes the following steps: a product information acquisition step in which an information processing device acquires product identification information that can identify the product to be compared from a serial code attached to the product to be compared or image information of the product to be compared; an optical image acquisition step in which an optical image information related to an optical image obtained from a fine line pattern attached to the product to be compared; and a matching step in which an information processing device generates a matching result by comparing the acquired optical image information with correct answer information related to a correct answer label of the optical image that corresponds to the product identification information.
[0004] On the other hand, labels with a temperature identification function have been disclosed as a method for detecting whether the temperature of distributed goods is being properly controlled.For example, Patent Document 3 discloses a label with a heating temperature identification function for heated foods, etc., which is a label that makes it easy to determine the appropriate heating state for food when heating the food in a microwave oven, etc., and which is characterized in that a heat-shrinkable film having a larger thermal shrinkage rate than the base film is attached to the surface side of a base film made of a single layer or multilayer film so as to be able to shrink and deform relative to the base film, and a temperature confirmation display section is provided on the surface of the base film for checking the heating temperature corresponding to the degree of shrinkage of the heat-shrinkable film.
[0005] Patent Document 4 discloses a high-precision temperature display label, specifically a temperature display label that is affixed to a desired location on various devices that require temperature control and that irreversibly displays that fact when a preset temperature is reached. The label uses petroleum wax, fatty acid, or a compound thereof that is solid at room temperature as its main raw material, and is made by kneading the main raw material, which is ground into powder, with an appropriate amount of a thickener and a solvent. The main raw material has a temperature substance that irreversibly changes from a cloudy, opaque state to transparent or translucent at a specific temperature that is specific to the distillation and refining temperature of the main raw material, coated on a colored surface and dried. The temperature indicator is positioned on the surface of a sheet-like label base, and a display section is provided near the temperature indicator that displays both the temperature at which the temperature indicator starts to change and the temperature at which the change ends. [Prior art documents] [Patent documents]
[0006] [Patent Document 1] Japanese Patent Application Laid-Open No. 2011-227276 [Patent Document 2] International Publication No. 2022 / 054869 [Patent Document 3] Japanese Utility Model Application Publication No. 2-140576 [Patent Document 4] Japanese Patent Application Laid-Open No. 2014-2040 Summary of the Invention [Problem to be solved by the invention]
[0007] According to the techniques of Patent Documents 1 and 2, by attaching the tag to distributed products, it is possible to prevent counterfeiting. Depending on the distributed product, such as leather products, proper temperature control may be required. By adding a temperature history detector function to the anti-counterfeiting labels attached to products during distribution, it is possible to determine that the temperature has not exceeded a certain level during distribution, and the reliability of the temperature history information can be increased.
[0008] The present invention provides a counterfeit prevention label and a management status determination method that not only has a counterfeit prevention function but also enables determination of whether temperature management is being performed appropriately. [Means for solving the problem]
[0009] The present invention includes the following embodiments. <1> A first substrate and a protective layer, a thin line pattern formed on at least one surface of the first substrate; A counterfeit prevention label, wherein the relationship between the dimensional change rate ΔL1 of the first substrate and the dimensional change rate ΔL2 of the protective layer satisfies the relationship of formula (1). 50ppm≦|ΔL1-ΔL2|≦2000ppm (1) (In the formula, ΔL1 is L A1 / L B1 and L A1 is the dimension of the major axis of the first substrate after a test in which the first substrate is exposed to conditions of 90% relative humidity and 60°C for 3 days, L B1 is the dimension of the major axis of the first substrate before the test, ΔL2 is L A2 / L B2 and L A2 is the dimension of the major axis of the protective layer after the test, LB2 is the dimension of the major axis of the protective layer before the test. <2> The protective layer is a second substrate. <1> The anti-counterfeiting label described in <3> The first substrate and the second substrate are laminated together with an adhesive. <2> The anti-counterfeiting label described in <4> At least one of the first substrate and the second substrate is transparent. <2> The anti-counterfeiting label described in <5> The thin line pattern can form an optical image by irradiating the thin line pattern with light and focusing the reflected light using a Fourier transform lens. <1> ~ <4> 1. An anti-counterfeiting label according to any one of the preceding items. <6> the optical image is a reflection diffraction image formed by the thin line pattern; <5> The anti-counterfeiting label described in <7> The thin line pattern is a diffraction grating including thin lines with a line width of 5 μm or less. <1> ~ <6> 1. An anti-counterfeiting label according to any one of the preceding items. <8> The aperture ratio of the fine line pattern is 60 to 99.9% by area. <1> ~ <7> 1. An anti-counterfeiting label according to any one of the preceding items. <9> It is tag-like, <1> ~ <8> 1. An anti-counterfeiting label according to any one of the preceding items. <10> <1> ~ <9> measuring the warpage of the anti-counterfeit label according to any one of the preceding items; A management status determination method including: <11> determining the temperature condition during distribution based on the measured value of the warpage of the anti-counterfeit label; Including, <10> The management state determination method according to claim 1. [Effects of the Invention]
[0010] According to the present invention, it is possible to provide a counterfeit prevention label and a management state determination method that not only has a counterfeit prevention function but also makes it possible to determine whether temperature management is being performed appropriately. [Brief explanation of the drawings]
[0011] [Figure 1] 1 is a plan view showing a schematic configuration of an anti-counterfeit label according to an embodiment of the present invention. [Figure 2] 2 is a cross-sectional view taken along the line AA' showing a schematic configuration of the anti-counterfeit label according to the present embodiment. FIG. [Figure 3] 1 is a cross-sectional view showing one aspect of the anti-counterfeit label of the present embodiment. [Figure 4] 1 is an explanatory diagram of a method for measuring the amount of warping of a counterfeit prevention label according to the present embodiment. [Figure 5] FIG. 1 is a diagram illustrating an example of a system configuration according to an embodiment of the present invention. [Figure 6] FIG. 2 is a block diagram showing one aspect of the configuration of a terminal according to the present embodiment. [Figure 7] 10A and 10B are schematic diagrams illustrating an example of a state in which the terminal according to the present embodiment acquires optical image information. [Figure 8] 10A and 10B are schematic diagrams showing another mode in which the terminal in the present embodiment acquires optical image information. [Figure 9] FIG. 2 is a block diagram showing one aspect of the configuration of a server according to the present embodiment. [Figure 10] FIG. 10 is a diagram showing one aspect of correct answer data in the present embodiment. [Figure 11] FIG. 10 is a diagram showing another aspect of the supervised data in the present embodiment. [Figure 12] FIG. 10 is a diagram showing another aspect of the supervised data in the present embodiment. [Figure 13] FIG. 2 is a diagram showing one aspect of ledger data in the present embodiment. [Figure 14] 3 is a processing sequence of the information processing method according to the first embodiment. [Figure 15] 10 is a processing sequence of an information processing method according to a second embodiment. DETAILED DESCRIPTION OF THE INVENTION
[0012] Hereinafter, an embodiment of the present invention (hereinafter referred to as "the present embodiment") will be described in detail with reference to the drawings as necessary, but the present invention is not limited to this, and various modifications are possible without departing from the spirit of the present invention. In the drawings, the same elements are given the same reference numerals, and redundant explanations will be omitted. Furthermore, positional relationships such as up, down, left, and right will be based on the positional relationships shown in the drawings unless otherwise specified. Furthermore, the dimensional ratios of the drawings are not limited to those shown in the drawings.
[0013] 1.Anti-counterfeiting labels The anti-counterfeit label according to this embodiment is A first substrate and a protective layer, a thin line pattern formed on at least one surface of the first substrate; The relationship between the dimensional change rate ΔL1 of the first base material and the dimensional change rate ΔL2 of the protective layer satisfies the relationship of formula (1). 50ppm≦|ΔL1-ΔL2|≦2000ppm (1) (In the formula, ΔL1 is L A1 / L B1 and L A1 is the dimension of the major axis of the first substrate after a test in which the first substrate is exposed to conditions of 90% relative humidity and 60°C for 3 days, L B1 is the dimension of the major axis of the first substrate before the test, ΔL2 is L A2 / L B2 and L A2 is the dimension of the major axis of the protective layer after the test, L B2 is the dimension of the major axis of the protective layer before the test. The anti-counterfeit label according to this embodiment not only has an anti-counterfeit function but also makes it possible to determine whether temperature management is being performed appropriately. The anti-counterfeit label has a fine line pattern that provides an anti-counterfeit function. Furthermore, by satisfying the relationship of the aforementioned formula (1), warping occurs when exposed to high temperature conditions due to the difference in the thermal shrinkage rate between the first substrate and the protective layer, making it possible to determine whether temperature control is being carried out appropriately.
[0014] When |ΔL1 - ΔL2| satisfies the relationship shown in formula (1), that is, when the range is between 50 ppm and 2000 ppm, if a product with an anti-counterfeit label is exposed to high temperature and humidity during transportation or other distribution conditions and temperature control is not properly maintained, the label will warp, indicating that temperature control is not being properly maintained. When |ΔL1 - ΔL2| is 50 ppm or more, detectable warping will occur, and when |ΔL1 - ΔL2| is 2000 ppm or less, the label will exhibit adequate detection capabilities and will not react excessively to slight temperature changes that do not affect quality control, making it easy to handle as an anti-counterfeit label.
[0015] From the viewpoint of determining whether temperature control is being performed appropriately based on the warping of the anti-counterfeit label, |ΔL1-ΔL2| is preferably 100 ppm or more, more preferably 300 ppm or more, even more preferably 600 ppm or more, still more preferably 800 ppm or more, and even more preferably 1000 ppm or more. |ΔL1-ΔL2| is preferably 1800 ppm or less, more preferably 1500 ppm or less, and still more preferably 1300 ppm or less. The range of |ΔL1-ΔL2| can be set by combining the lower and upper limits shown here. When |ΔL1-ΔL2| is 100 ppm or more, warping is easy to detect, when it is 300 ppm or more, warping is even easier to detect, and when it is 600 ppm or more, warping becomes more noticeable, which is preferable. Furthermore, when |ΔL1-ΔL2| is 2000 ppm or less, handling as an anti-counterfeit label is easy, when it is 1500 ppm or less, label warping that is sensitive to certain environmental changes is easily suppressed, and when it is 1300 ppm or less, it is easy to achieve both ease of handling of the anti-counterfeit label and ease of warping detection.
[0016] ΔL1 is L A1 / L B1 And L A1 is the dimension of the major axis of the first substrate after a test in which it is exposed to conditions of 90% relative humidity and 60°C for 3 days, and L B1 is the dimension of the major axis of the first substrate before the test. ΔL2 is L A2 / L B2 And L A2 is the dimension of the major axis of the protective layer after a test in which the protective layer is exposed to conditions of 90% relative humidity and 60°C for 3 days, and L B2 is the dimension of the major axis of the protective layer before the test.
[0017] The "major axis" refers to the longer of the two orthogonal axes in the first substrate or protective layer that constitutes the anti-counterfeit label. For example, if the anti-counterfeit label is a rectangular strip, it refers to the longest side, and if the anti-counterfeit label is elliptical, it refers to the longest axis (major axis). Note that if the anti-counterfeit label is circular, all axes have the same length, so it is sufficient that any one of the axes satisfies the above-mentioned |ΔL1-ΔL2|. Also, if the anti-counterfeit label is square, all sides have the same length, so it is sufficient that any one of the sides satisfies the above-mentioned |ΔL1-ΔL2|.
[0018] |ΔL1-ΔL2| is the absolute value of the difference between ΔL1 and ΔL2. The unit ppm for |ΔL1-ΔL2| simply indicates one part per million, and is expressed as "×10- 6 " is synonymous with ".
[0019] |ΔL1-ΔL2| can be calculated from the measured values obtained by measuring ΔL1 and ΔL2 according to the test method described in the Examples.
[0020] Hereinafter, this embodiment will be described in detail with reference to the drawings. (Note that in each drawing, components with the same reference numerals have the same or similar configurations.)
[0021] Fig. 1 is a plan view showing a schematic configuration of the anti-counterfeit label according to this embodiment, and Fig. 2 is a cross-sectional view taken along line AA' showing a schematic configuration of the anti-counterfeit label according to this embodiment. As shown in FIGS. 1 and 2, the anti-counterfeit label 300 according to this embodiment (hereinafter also simply referred to as the “label 300”) includes a first substrate 310, a fine line pattern 330, and a protective layer 340.
[0022] 1.1.First base material The first substrate may be a transparent substrate. The transparency of the first substrate 310 prevents the appearance of the product from being impaired after temperature detection. The term "transparent" in the context of a transparent substrate means that the visible light transmittance is preferably 80% or more, more preferably 90% or more, and even more preferably 95% or more. The visible light transmittance can be measured in accordance with JIS K 7361-1:1997.
[0023] The material of the first substrate is not particularly limited, but examples thereof include transparent inorganic substrates such as glass; and transparent organic substrates such as acrylic acid esters, methacrylic acid esters, polyethylene terephthalate, polybutylene terephthalate, polyethylene naphthalate, polycarbonate, polyarylate, polyvinyl chloride, polyethylene, polypropylene, polystyrene, nylon, aromatic polyamide, polyether ether ketone, polysulfone, polyether sulfone, polyimide, and polyetherimide. Among these, polyethylene terephthalate, polyimide, or polyethylene naphthalate is preferred. The use of polyethylene terephthalate tends to improve the productivity (cost reduction effect) for producing the conductive film and also tends to further improve the adhesion between the transparent substrate and the thin metal wires. Furthermore, the use of polyimide tends to further improve the heat resistance of the conductive film. Furthermore, the use of polyethylene naphthalate tends to further improve the adhesion between the transparent substrate and the thin metal wires.
[0024] The first substrate may be made of one material or may be made of a laminate of two or more materials. When the substrate is a multilayer body made of two or more materials, the substrate may be made of a laminate of organic or inorganic substrates, or a laminate of an organic substrate and an inorganic substrate.
[0025] The thickness of the first substrate is preferably 5 μm or more and 500 μm or less, more preferably 10 μm or more and 100 μm or less. When the thickness is 5 μm or more, the anti-counterfeit label becomes easy to handle, while when the thickness is 500 μm or less, warping occurs easily, making it easier to determine whether temperature control is being performed appropriately.
[0026] An underlayer (not shown) may be formed on the surface of the first base material 310. The underlayer is a layer that constitutes the surface on which a thin line pattern 330 (described later) is formed. Such an underlayer may be a cured product of an inorganic material. Examples of inorganic materials include silicon compounds (e.g., (poly)silanes, (poly)silazanes, (poly)silthians, (poly)siloxanes, silicon, silicon carbide, silicon oxide, silicon nitride, silicon chloride, silicate, zeolite, silicide, etc.), aluminum compounds (e.g., aluminum oxide, etc.), magnesium compounds (e.g., magnesium fluoride), etc. Among these, silicon compounds are preferred, and siloxanes are more preferred.
[0027] Examples of the silicon compound include condensates of polyfunctional organosilanes, and polycondensates obtained by hydrolyzing polyfunctional organosilanes or oligomers thereof with polyvinyl acetate.
[0028] Examples of polyfunctional organosilanes include bifunctional organosilanes such as dimethyldimethoxysilane, dimethyldiethoxysilane, diethyldimethoxysilane, diethyldiethoxysilane, diphenyldimethoxysilane, and diphenyldiethoxysilane; trifunctional organosilanes such as methyltrimethoxysilane, methyltriethoxysilane, and phenyltrimethoxysilane; and tetrafunctional organosilanes such as tetramethoxysilane and tetraethoxysilane.
[0029] The underlayer can be formed by applying a composition containing the inorganic material described above to the first substrate and drying it. Alternatively, the underlayer may be formed by a vapor deposition method such as PVD or CVD. The composition for forming the underlayer may contain a dispersant, a surfactant, a binder, etc., as needed.
[0030] The thickness of the underlayer is preferably 0.01 μm to 100 μm, more preferably 0.01 μm to 10 μm, and even more preferably 0.01 μm to 1 μm. When the thickness of the underlayer is within the above range, the adhesion of the thin line pattern 330 is further improved.
[0031] 1.2. Thin line patterns The thin line pattern 330 may be a pattern composed of thin lines 320 formed on the first substrate 310. For example, in order to guarantee the authenticity of the anti-counterfeit label, optical image information relating to an optical image obtained from the thin line pattern attached to the anti-counterfeit label can be acquired and verified. In other words, when light is irradiated onto the anti-counterfeit label, an optical image is obtained due to interference of reflected light from the thin line pattern, and by verifying this optical image, counterfeiting can be prevented. The method of verifying the optical image will be described later.
[0032] The thin line pattern 330 of the label 300 may be formed as a desired pattern using the thin metal wires 320. Fig. 1 shows the thin line pattern 330 consisting of a grid pattern made up of the thin metal wires 320.
[0033] The thin line pattern 330 is any pattern made up of the thin lines 320, and may be a grid pattern (mesh pattern) of triangles, rectangles, hexagons, etc., or a line pattern. The thin lines 320 are not limited to straight lines, but may also be curved or wavy lines.
[0034] When a predetermined light is irradiated onto such a thin line pattern 330 from an irradiation device, the thin line pattern 330 reflects predetermined diffracted light, which passes through a Fourier transform lens, thereby obtaining a predetermined optical image.
[0035] For example, if a plurality of fine lines with a line width of 5 μm or less are arranged at equal intervals with a periodic pitch of about several hundred μm in the fine line pattern 330, a diffraction image will be observed in the reflected light, and the optical image will include such a diffraction image. In this case, the generated diffraction image may include not only a diffraction spot image and a diffraction stripe pattern, but also letters, numbers, symbols, and other marks and figures obtained by combining different diffraction images.
[0036] Furthermore, if the thin line pattern 330 is composed of multiple thin metal lines with a line width of 5 μm or less and arranged at equal intervals with a pitch of several hundred μm, the individual thin metal lines will be invisible, and the thin line pattern 330 will be transparent. In other words, the thin line pattern 330 may be a pattern that is difficult to see. Therefore, even if the thin line pattern 330 is attached to the product to be verified or its packaging, its design and displayed information will not be impaired. On the other hand, as described above, even with such a transparent thin line pattern 330, a diffraction image can be obtained due to diffracted light that occurs only when light is irradiated at a predetermined angle.
[0037] The thin wire 320 is preferably a thin wire containing a metal. The metal is not particularly limited, but examples thereof include gold, silver, copper, and aluminum. Among these, silver or copper is preferable, and copper is more preferable.
[0038] From the above perspective, it is preferable that the thin wire 320 be difficult to see with the naked eye. For example, the line width W1 (see FIG. 1) of the thin wire 320 is preferably 5 μm or less, more preferably 0.1 to 5 μm, and even more preferably 0.3 to 5 μm. By setting the line width W1 to 5 μm or less, the visibility of the thin wire 320 is reduced. This allows the thin line pattern to be applied without compromising the design of the product to be compared that has the thin line pattern applied. Furthermore, such thin lines with low visibility are difficult to manufacture, which also contributes to ensuring that they are difficult to replicate. Here, the line width W1 in this embodiment refers to the line width of the thin wire 320 when projected onto the surface of the first substrate 310 from the side of the first substrate 310 on which the thin wire 320 is arranged.
[0039] Furthermore, the opening ratio OR, which is the ratio of the area of the portion of the thin line pattern 330 having a predetermined area where the thin lines 320 are not formed, is preferably 60 to 99.9 area%, more preferably 80 to 99.8 area%, even more preferably 90 to 99.6 area%, and even more preferably 95 to 99.5 area%. The opening ratio OR can also be referred to as transmittance. An opening ratio of 60 area% or more is preferable because it does not impair the design or display information of the product to be verified or its package. By keeping the opening ratio within the above range, even if the thin line pattern is applied, it is possible to avoid impairing the design or display information of the product to be verified or its package, and the aesthetic appearance is not impaired.
[0040] (Thickness H1) The thickness H1 (see FIG. 2) of the thin wires constituting the thin wires 320 is preferably 10 nm or more and 1000 nm or less, more preferably 50 nm or more, and even more preferably 75 nm or more. When the thin wire thickness H1 is 10 nm or more, it becomes easier to obtain optical image information regarding the optical image obtained from the thin line pattern. On the other hand, when the thin wire thickness H1 is 1000 nm or less, visibility is reduced over a wide viewing angle.
[0041] (aspect ratio) The aspect ratio (H1 / W1), which is the thickness H1 of the thin wire 320 relative to the line width W1 of the thin wire 320, is preferably 0.01 or more and 1 or less. The lower limit of the aspect ratio is more preferably 0.05 or more, and even more preferably 0.10 or more. When the aspect ratio is 0.01 or more, optical image information regarding the optical image can be easily obtained without reducing thin line visibility. Furthermore, when the aspect ratio is 1 or less, visibility is likely to be suppressed at a wide viewing angle.
[0042] (Pitch P1) The pitch P1 of the thin wires 320 (see FIG. 1) is preferably 5 μm or more, more preferably 25 μm or more, and even more preferably 50 μm or more. By making the pitch P1 of the thin wires 320 5 μm or more, the invisibility of the thin wires 320 can be improved. Furthermore, the pitch P1 of the thin wires 320 is preferably 1000 μm or less, more preferably 500 μm or less, and even more preferably 250 μm or less. A pitch P1 within the above range is preferable because the diffraction image of the thin wire pattern 330 becomes clear. In the case of a square grid pattern of the thin wires 320, an aperture ratio of 99% can be achieved by setting the pitch P1 of the thin wires 320 with a line width of 1 μm to 200 μm. The pitch P1 refers to the sum of the line width W1 and the distance between the thin wires.
[0043] (Occupied area ratio A1) The occupied area ratio A1 is preferably 0.5% or more, more preferably 1.0% or more, and even more preferably 2% or more. The occupied area ratio A1 is preferably 10% or less, and more preferably 7% or less. By setting the occupied area ratio A1 to this value or less, the visible light transmittance of the thin line pattern 330 tends to be further improved. The "occupancy area ratio" of the pattern can be calculated using the following formula for the area on the first base material 310 where the thin line pattern 330 is formed. Occupancy rate (%) = (area occupied by thin line pattern / area of region of substrate where thin line pattern is formed) × 100
[0044] The opening width W2 of the opening (see FIG. 1) is preferably 40 μm or more, more preferably 45 μm or more, and even more preferably 50 μm or more. By setting it within this range, the invisibility of the thin line pattern 330 tends to be improved. The opening width W2 of the opening is preferably 500 μm or less, more preferably 300 μm or less, and even more preferably 100 μm or less. By setting it within this range, the diffraction image by the thin line pattern 330 tends to be clearer.
[0045] The "opening width" refers to the width of the opening in the short direction. If the opening is square, it refers to the width of one of the sides.
[0046] (Visible light transmittance T1 of thin line pattern) The visible light transmittance T1 of the thin line pattern 330 is preferably 75% or more and 99.0% or less, and more preferably 80% or more and 99.0% or less. A visible light transmittance of 75% or more is unlikely to impair the design or display information of the product to be checked or its package, while a visible light transmittance of 80% or more makes it easy to avoid impairing the design or display information of the product to be checked or its package, even if the thin line pattern is attached. Visible light transmittance can be measured by calculating the transmittance of visible light (360 to 830 nm) in accordance with JIS K 7361-1:1997, which defines total light transmittance.
[0047] Furthermore, it is preferable that the thin line pattern 330 is a pattern of periodic thin lines 320 formed on the first substrate 310. With this configuration, the thin line pattern 330 becomes a highly transmittant diffraction grating, so that even when the label 300 is attached to a product package, the design and displayed information are not impaired.
[0048] By irradiating the above-mentioned thin line pattern 330 with light, diffracted light reflected from the thin line pattern 330 passes through a Fourier transform lens to form an optical image, which can be acquired. By using this optical image, it is possible to prevent counterfeiting of the laminate, and a specific method for this will be described later.
[0049] 1.3.Laminated structure As shown in FIG. 2, the label 300 may be formed by laminating a first substrate 310, a fine line pattern 330, and a protective layer 340 in this order.
[0050] 3, the label 300 may be formed by laminating a first substrate 310, a fine line pattern 330, an adhesive layer 341, and a second substrate 342 in this order. In this case, the second substrate 342 is laminated as a protective layer. The first substrate 310 and the second substrate 342 are laminated with an adhesive.
[0051] Here, the second base material 342 can be made of the same material, laminated structure, and thickness as those exemplified for the first base material 310 described above.
[0052] It is preferable that at least one of the first substrate and the second substrate is transparent, which protects the thin line pattern 330 from external impacts and allows an optical image to be formed by imaging with a Fourier transform lens using light irradiation.
[0053] The adhesive layer 341 contains an adhesive. Here, the adhesive may be a pressure-sensitive adhesive (a so-called pressure-sensitive adhesive) or a curing adhesive, but is preferably a pressure-sensitive adhesive. The pressure-sensitive adhesive makes it more likely to deform in response to thermal contraction of the protective layer 340, and warping of the anti-counterfeit label 300 occurs when the label is exposed to high temperatures.
[0054] A cured coating film may be formed as the protective layer 340. Examples of cured coating films include epoxy resin and acrylic resin. By using a cured coating film with high heat shrinkability, it is possible to obtain an anti-counterfeit label having |ΔL1-ΔL2| that satisfies the relationship of the above-mentioned formula (1).
[0055] The shape of the label 300 is not particularly limited, but it is preferably tag-shaped. The tag shape means a shape that can be used by hanging it on a product, etc. It is preferable that the tag does not have an adhesive surface.
[0056] The label 300 can be attached to an object and used to determine authenticity as described below. An object with an anti-counterfeit label comprises the label 300 and an object to which the label 300 is attached. The object is not particularly limited and may be, for example, a product to be verified. Specifically, the object is suitable for use with products that require temperature control, such as leather products.
[0057] In the above-described usage mode, the label 300 is distributed together with the object. If the object is not properly temperature-controlled during distribution, warping occurs in the label 300. By measuring the warping, the management state can be determined.
[0058] 2. Management status determination method The management state determination method according to this embodiment includes measuring the warpage of the anti-counterfeit label according to this embodiment. The method for measuring warpage is to place the anti-counterfeit label on a horizontal plane as shown in Figure 4, measure the heights of both ends from the horizontal plane to measure warpage δ1 and δ2 (unit: mm), and calculate using the following formula. Note that the points to measure warpage δ1 and δ2 are the ends of the sample's long axis, where the largest warpage occurs. Amount of warpage = δ1 + δ2
[0059] The management state determination method according to the present embodiment may also include determining the temperature state during distribution based on the measured value of the warpage of the anti-counterfeit label. As will be shown by the experimental results described later, the amount of warping of the anti-counterfeit label according to this embodiment increases when it is placed under conditions of higher temperature and higher humidity. The amount of warping may be used as an index for determining the temperature conditions during distribution.
[0060] 3. Information Processing Method Counterfeiting of the anti-counterfeit label 300 can be prevented by using the following information processing method, etc. More specifically, the information processing method according to this embodiment executes an irradiation step in which an information processing device irradiates light onto the anti-counterfeit label 300 having a thin line pattern 330, an imaging step in which the light reflected from the thin line pattern 330 passes through a Fourier transform lens to form an optical image and acquire the optical image, and a comparison step in which optical image information regarding the optical image is compared with correct answer information to generate a comparison result.
[0061] In an embodiment of a system used in an information processing method, an information processing device (hereinafter also referred to as a "terminal") acquires optical image information (hereinafter also simply referred to as "optical image information") regarding an optical image obtained by focusing diffracted light reflected from a fine line pattern using a Fourier transform lens, and performs a matching process using the optical image information and correct answer information (hereinafter also simply referred to as "correct answer information") regarding the correct label of the optical image.
[0062] An example of the configuration of the system according to the embodiment is shown in Fig. 5. In Fig. 5, terminals 100A to 100D are provided at respective bases where products to be verified with laminates attached are carried in and out, such as a shipping base of a manufacturer's product, a logistics base of a distributor, and a logistics base of a retailer, and each of the terminals 100A to 100D is connected to a server 400 via a network N.
[0063] As a result, each of the terminals 100A to 100D can cooperate with the server 400 to determine the authenticity of a product to be verified each time it passes through the terminal, thereby ensuring that the product to be verified in circulation is genuine. Furthermore, each of the terminals 100A to 100D transmits information about the authenticity of the laminate or the product to be verified, which is determined each time a product to be verified with a laminate attached thereto passes through the terminal. As a result, the server 400 can accumulate information about the authenticity of the target product that has passed through each terminal 100, as well as logistics information about the place and time of passage.
[0064] 5 shows one terminal 100 at each base station, the number of terminals 100 is not limited to this, and a terminal 100 may be installed at each of the product carry-in gate and carry-out gate at each base station. This allows authenticity determination to be performed using the terminal 100 at both the time of carry-in and the time of carry-out. When there is no need to particularly distinguish between the terminals 100A to 100D, they will simply be referred to as terminal 100.
[0065] In the system of this embodiment, the terminal 100 acquires optical image information (hereinafter simply referred to as "optical image information") regarding an optical image obtained by focusing diffracted light reflected from a thin line pattern using a Fourier transform lens, and may perform a matching process using the optical image information and correct answer information (hereinafter simply referred to as "correct answer information") regarding the correct label of the optical image.
[0066] The terms used in this embodiment will be explained below, followed by an explanation of the configuration of the terminal 100.
[0067] 3.1. Optical image information The optical image information is information about an optical image that can be obtained from the above-described thin line pattern 330, and more specifically, information about a diffraction image that occurs when light is irradiated onto the thin line pattern at a predetermined angle. A diffraction image is an image observed in the reflected light when light is irradiated at a predetermined angle onto a thin line pattern in which thin lines are arranged at equal intervals with a predetermined period, and includes diffraction spot images and diffraction fringe patterns.
[0068] Furthermore, the optical image information may be image data of these optical images, non-image data, or both. Here, "image data" refers to the data of the image itself, and "non-image data" refers to information that indicates the characteristics of the image data and can be used in the same way as image data in the matching process.
[0069] The non-image data may include, but is not limited to, parameter information for more specifically specifying the arrangement of the diffraction grating. Furthermore, the non-image data may include information about the conditions used to generate the optical image. Such information about the conditions may include, for example, information about the illumination conditions, such as the illumination angle of the light.
[0070] Specific examples of such optical image information include image data of diffraction point images of a reflected diffraction image obtained by irradiating a laser beam onto label 300 having the diffraction grating and transmitting the reflected light through a Fourier transform lens, as well as non-image data such as the distance of each diffraction point from the center of the reflected zeroth-order light, the distance from the center of the reflected zeroth-order light to the diffraction points of attenuating orders, and the intersection angle of the diffraction images. These image data and non-image data are uniquely determined by the pitch and line width of the fine-line pattern, the opening shape (e.g., square or rectangular), and the material constituting label 300. Because these optical image information are unique values formed from the microstructure of the fine-line pattern and are difficult to counterfeit, the optical image information can be used to determine whether the fine-line pattern constituting label 300 is authentic.
[0071] Furthermore, the optical image information may represent letters, numbers, symbols, other marks, or figures by combining multiple diffraction images such as those described above. Specifically, this applies to a case where a diffraction image in the shape of the letter "A" is formed, and either no diffraction image is formed around the "A" or a different diffraction image is formed around it, resulting in an optical image in which the shape of "A" can be recognized. In this case, the non-image data may include information such as letters, numbers, symbols, other marks, or figures that are observed when the optical image is viewed as a whole.
[0072] 4. Correct Answer Information As will be described later, for example, the matching unit 155 of the terminal 100 can determine that the laminate is authentic by matching the optical image information with the correct answer information regarding the correct label. Here, the correct answer information is information corresponding to the optical image information obtained from the thin line pattern, and includes information regarding the correct label of the optical image.
[0073] The correct label may be, for example, information that matches the optical image information, or information that matches the optical image information after a predetermined conversion process. From this perspective, the correct label may be image data, non-image data, or both, just like the optical image information. Note that "matching" here also includes similarity, which will be described later.
[0074] Furthermore, the correct information may be information in which a common correct label is set for two or more pieces of visible information code identification information among a plurality of pieces of visible information code identification information. In other words, thin line patterns associated with the same correct label may be attached to different products to be matched. In this way, the same correct label is associated with two or more different pieces of visible information code identification information.
[0075] The manner in which the same correct label is set on different products to be matched is not particularly limited, but examples include when the same correct label is set on a group of identical products sold under the name of product name S, when the same correct label is set on a small group of identical products with a common feature within the group of products with the product name S, when the same correct label is set on products from a certain product manufacturer, and when the same correct label is set on products manufactured around the same time.
[0076] Additionally, non-image data may include information about the conditions used to generate the optical image, such as, for example, information about illumination conditions such as the angle of illumination of light if the optical image is a diffraction image.
[0077] The correct label can include various data about the optical image obtained from the thin line pattern. For example, the correct label can be at least one parameter, such as the position of a diffraction spot, that indicates an optical image such as a diffraction image, or a combination of multiple parameters. The correct label can also include image data and non-image data of optical images obtained under different conditions. The type and number of parameters to be matched with the optical image information in the correct label can be determined appropriately depending on the accuracy of the matching process, the difficulty of imitating the thin line pattern, the speed of the matching process, etc.
[0078] Furthermore, even if a certain correct label has multiple parameters, such as the positions of multiple diffraction spots, in the matching process described below, only some of the parameters, for example, the position of one diffraction spot, may be used for matching. In the matching process, by using more parameters included in the correct label, the accuracy of authenticity determination can be improved, or by using fewer parameters, the processing speed of the determination can be improved.
[0079] Furthermore, instead of or in addition to the correct label, the correct answer information may include, as information about the correct label, information that allows the correct label to be identified by referring to other data, for example.
[0080] 5.Product specific information The product identification information is information that can identify the product to be verified, and can be obtained from the serial code attached to the product to be verified or image information of the product to be verified. The product identification information may be information for uniquely identifying the product to be verified, information indicating a group of identical products, or information indicating a small group of identical products that share an arbitrary commonality.
[0081] For example, if there are sneakers sold under the product name S, "information indicating a group of identical products" refers to information corresponding to the product name S, and refers to all products sold under the name S. In a similar example, "information indicating a small group of identical products with any common denominator" refers to information that includes information about any category within sneakers sold under the same product name S, such as a group of sneakers belonging to a specific production lot or a group of sneakers sold in a specific region. In a similar example, "information for unique identification" refers to information that indicates a specific sneaker under the product name S.
[0082] Furthermore, the product identification information may be information indicating a product manufacturer. For example, the product identification information may be information that can identify footwear manufacturer A, footwear manufacturer B, footwear manufacturer C, or other manufacturers. In this case, the product to be matched indicated by certain product identification information can be understood as having been manufactured by the product manufacturer corresponding to that product identification information. As an example, such product identification information indicating a product manufacturer may be a serial code or a trademark that is understood as image information.
[0083] The serial code is not particularly limited, but may refer to, for example, information recorded on an IC chip such as an RF tag attached to the product to be verified, or information that can be read from a two-dimensional code such as a QR code (registered trademark) or a barcode. Product identification information that can be obtained from such a serial code is not particularly limited, but may include, for example, a GTIN (Global Trade Item Number) or other information attached by product manufacturers, distribution centers, distributors, or retailers for product classification or identification. Furthermore, in addition to the serial code itself, the product identification information may also include information about the product that is recorded in association with the serial code in a database that manages such serial codes.
[0084] The product to be verified may have the serial code and thin line pattern attached together, or they may be attached separately. The combination of the serial code and thin line pattern is also called a "tag." Examples of such tags include, but are not limited to, RF tags (Radio Frequency tags) in which a serial code is recorded on an IC chip and the antenna portion is composed of a metal thin line pattern. Other examples of tags include tags in which a two-dimensional code or barcode and a thin line pattern are arranged side by side on one surface, or tags in which a two-dimensional code or barcode and a highly transparent thin line pattern are arranged on top of each other and integrated together.
[0085] Furthermore, the product identification information that can be obtained from the image information of the product to be verified can be information obtained by searching the image information of the product for the product that appears in the image. As with the serial code, the product identification information that can be obtained from the image information of the product to be verified may include information about the product identified from the image information in addition to the image information itself. Note that conventionally known means can be used to identify the product from the image information.
[0086] 6. Hardware Configuration Terminal The terminal 100 includes an irradiation device 131 that irradiates light onto the thin line pattern, a Fourier transform lens 132 through which diffracted light reflected from the thin line pattern passes to form an optical image, an imaging device 133 that acquires the formed optical image, and a matching unit 155 that matches correct answer information regarding the correct answer label of the optical image with optical image information regarding the optical image to generate a matching result.
[0087] 6 is a block diagram showing the configuration of the terminal 100. The terminal 100 typically includes one or more processors 110, a communication interface 120, an input / output interface 130, a memory 140, a storage 150, and one or more communication buses 160 for interconnecting these components.
[0088] The one or more processors 110 execute processes, functions, or methods implemented by code or instructions contained in a program stored in memory 140. Processor 110 may include, by way of example and not limitation, one or more CPUs or GPUs.
[0089] The communication interface 120 transmits and receives various data to and from other information processing devices via the network N. The communication may be performed either wired or wirelessly, and any communication protocol may be used as long as mutual communication is possible. For example, the communication interface 120 may be implemented as hardware such as a network adapter, various communication software, or a combination of these.
[0090] The input / output interface 130 may include, in addition to the irradiation device 131, the Fourier transform lens 132, and the imaging device 133, output devices such as a screen 134, a product information reading device 135, an abnormality information input device 136, an input device for inputting various operations to the terminal 100, and a display device 137 for outputting the processing results processed by the terminal 100, as necessary.
[0091] Fig. 7 is a schematic diagram showing how the terminal 100 acquires an optical image. In Fig. 7, the irradiation device 131 irradiates the thin line pattern 330 with light at a predetermined irradiation angle θ, and the diffracted light reflected from the thin line pattern 330 passes through the Fourier transform lens 132, and the formed optical image is acquired by the imaging device 133.
[0092] The irradiation device 131 is not particularly limited as long as it can irradiate the thin line pattern 330 with predetermined light at a predetermined angle. The light source in the irradiation device 131 may be one that emits light having an emission wavelength intensity distribution that includes a required wavelength band. The light source may be, for example, a halogen lamp, an LED, a semiconductor laser, etc., and the irradiation device 131 may include a light guide path, an optical fiber, etc. that guides the light emitted from these light sources. Among these, it is preferable to use an LED as the irradiation device 131 in terms of compactness, heat generation characteristics, lifespan, and cost.
[0093] Furthermore, the irradiation device 131 may include a slit (not shown) for suppressing diffusion of light in directions other than a specific direction and for obtaining a predetermined optical purity, and may also include a collimator lens (not shown) for converging light onto the thin line pattern 330. In this case, the collimator lens does not necessarily need to be focused on the surface of the thin line pattern 330, and is not particularly limited as long as it can increase the light intensity from the light source and improve the signal intensity of the diffracted light reflected from the thin line pattern 330.
[0094] The Fourier transform lens 132 is not particularly limited as long as it can receive diffracted light reflected from the thin line pattern 330 and guide the optical image to the imaging device 133. The Fourier transform lens 132 has a focal length F and forms an optical image on the imaging device 133 using the diffracted light that has been Fourier transformed. Furthermore, slits, mirrors, and filters (not shown) may be provided before and after the optical path of the Fourier transform lens 132, and multiple Fourier transform lenses may be combined to form the Fourier transform lens 132. Combining multiple Fourier transform lenses is preferable because it increases the resolution of the optical image formed on the imaging device 133.
[0095] By using the Fourier transform lens 132, even if the distance between the irradiation device 131, the thin line pattern 330, and the Fourier transform lens 132 changes, it is possible to form the same image on the imaging device 133. In particular, when the thin line pattern 330 is made up of a plurality of thin lines 320 with a line width of 5 μm or less, arranged at equal intervals at a pitch of about several hundred μm, and is transparent, the intensity of diffracted light generated when light is irradiated at a predetermined angle becomes very weak, but by using the Fourier transform lens 132, the light can be focused on the imaging device 133, and an optical image can be stably acquired.
[0096] The imaging device 133 is not particularly limited as long as it can convert the optical image formed by the Fourier transform lens 132 into an electrical signal and output it, and examples of the imaging device 133 include a CMOS sensor, a CCD sensor, and a line sensor.
[0097] Furthermore, the imaging device 133 may be a mechanism that captures an optical image formed on a predetermined projection surface, rather than a mechanism that directly converts the optical image into an electrical signal. Fig. 8 shows another schematic diagram of terminal 100 capturing an optical image. In Fig. 7, the imaging device 133 directly captures the optical image formed by the Fourier transform lens 132, whereas in Fig. 8, diffracted light that has passed through the Fourier transform lens 132 is focused on a screen 134, and the optical image formed on the screen 134 is captured by imaging device 133.
[0098] In this case, a CCD camera, an image pickup tube, or the like can be used as the image pickup device 133 that captures the optical image formed on the screen 134. In Fig. 8, light irradiated from the irradiation device 131 is reflected from the thin line pattern 330 and is imaged on the screen 134 by the Fourier transform lens 132. Then, the formed optical image is captured by the image pickup device 133 (CCD camera).
[0099] 8, the imaging device 133 may be located off-axis or on-axis of the Fourier transform lens 132. A location off-axis of the Fourier transform lens 132 is preferable because it allows the terminal 100 to be made smaller, while a location on-axis of the Fourier transform lens 132 is preferable because the reflected diffraction image formed on the screen 134 is not distorted, making it easier to compare with the correct information.
[0100] The optical image information regarding the optical image acquired by the imaging device 133 is matched with the correct answer information by the matching unit 155 of the terminal 100, and the matching result is transmitted to the server 400 via the network N by the transmitting / receiving unit 152 (see FIG. 5). Note that the terminal 100 may receive correct answer information in advance from another information processing device such as the server 400 and store it in the matching data 154 (see FIG. 9).
[0101] The imaging device 133 may be configured to be capable of moving the positions of the imaging device 133 and the thin line pattern 330 relatively so as to be able to photograph a specific region of the thin line pattern 330. The imaging device 133 may also be configured to be capable of performing image processing such as identifying and acquiring an optical image from a specific region of the acquired captured image.
[0102] The product information reading device 135 acquires product identification information capable of identifying the product to be verified from the serial code attached to the product to be verified, which has a thin line pattern, or from image information of the product to be verified. Such a product information reading device 135 can be appropriately selected depending on the object to be read. The product information reading device 135 that acquires product identification information from the serial code is, for example, an RF tag reader when reading the serial code from an RF tag, an imaging device when reading the serial code from a QR code, or a barcode reader when reading the serial code from a barcode. Furthermore, the product information reading device 135 that acquires product identification information from image information of the product to be verified is, for example, an imaging device for acquiring image information.
[0103] In addition, if product information reading device 135 is an imaging device, product information reading device 135 and imaging device 133 for acquiring an optical image can be the same device. In this specification, even if product information reading device 135 and imaging device 133 are the same imaging device, they will be referred to separately.
[0104] The abnormality information input device 136 allows input of abnormality information of the label 300 that is visually confirmed by a human. If the label 300 is warped, the worker inputs this as abnormality information. The input abnormality information is temporarily stored in the memory 140. The terminal 100 may transmit the input abnormality information to the server 400 via the communication interface 120 (see FIG. 5).
[0105] The memory 140 temporarily stores programs loaded from the storage 150 and provides a working area for the processor 110. The memory 140 also temporarily stores various data generated while the processor 110 is executing the programs. The memory 140 may be, for example and without limitation, a high-speed random access memory such as a DRAM, an SRAM, a DDR RAM, or another random access solid-state storage device, or a combination thereof.
[0106] Storage 150 stores programs, various functional units, and various data. Storage 150 may be, for example and without limitation, a magnetic disk storage device, an optical disk storage device, a flash memory device, or a nonvolatile memory such as other nonvolatile solid-state storage devices, or a combination thereof. Another example of storage 150 may be one or more storage devices installed remotely from processor 110.
[0107] Storage 150 stores programs and data structures, or a subset thereof. Processor 110 is configured to function as a transmitter / receiver 152, an information acquisition unit 153, and a collation unit 155, as shown in FIG. 6, by reading and executing each program stored in storage 150.
[0108] Here, the program stored in storage 150 is not particularly limited as long as it causes terminal 100 to execute an irradiation step of irradiating light onto a thin line pattern, an imaging step of forming an optical image by passing diffracted light reflected from the thin line pattern through a Fourier transform lens and acquiring the optical image, and a matching step of matching correct answer information regarding the correct answer label of the optical image with optical image information regarding the optical image to generate a matching result.
[0109] Operating system 151, for example, handles various basic system services and includes procedures for performing tasks with the hardware.
[0110] The transceiver unit 152 is used, for example, to connect the terminal 100 to other computers, such as the server 400, via the communication interface 120 and one or more communication networks, such as the Internet, other wide area networks, local area networks, metropolitan area networks, etc.
[0111] The information acquisition unit 153 executes a process of acquiring optical image information via the irradiation device 131, the Fourier transform lens 132, the imaging device 133, and, if necessary, the screen 134, etc.
[0112] For example, the information acquisition unit 153 may control the irradiation device 131 to change the angle or intensity of the light irradiated from the irradiation device 131 onto the thin line pattern 330, or the position on the thin line pattern 330 where the light is irradiated.
[0113] Furthermore, the information acquisition unit 153 may control the positional relationship between the devices so as to change the positions of the Fourier transform lens 132 and the imaging device 133, or the positions of the Fourier transform lens 132 and the screen 134.
[0114] Furthermore, the information acquisition unit 153 may execute a process of acquiring product identification information capable of identifying the product to be matched from the serial code attached to the product to be matched or image information of the product to be matched via the product information reading device 135.
[0115] Furthermore, the information acquisition unit 153 may execute a process of acquiring abnormality information that has been input in advance.
[0116] Furthermore, the information acquisition unit 153 may include a non-image data generation unit that acquires non-image information from the optical image.
[0117] Here, "image data" refers to data of the image itself, and "non-image data" refers to information that indicates the characteristics of the image data and can be used in the same way as image data in the matching process.
[0118] Specific examples of non-image data include, for example, the distance of each diffraction point from the center of the reflected zeroth order light, the distance from the center of the reflected zeroth order light to the attenuated diffraction point of the order, and the intersection angle of the diffraction image in the optical image obtained by irradiating laser light onto the label 300 having the above-mentioned transmission diffraction grating.
[0119] The non-image data can be generated, for example, in a non-image data generating unit (not shown) from image analysis of the optical image information.
[0120] The matching data 154 can store the product identification information and optical image information acquired by the information acquisition unit 153 in response to an instruction from the information acquisition unit 153, or can store the correct answer information in response to an instruction from the matching unit 155. The matching data 154 can also store the matching result in response to an instruction from the matching unit 155.
[0121] The supervised information stored in the matching data 154 may include a plurality of pieces of product identification information and information on the supervised labels of optical images corresponding to the plurality of pieces of product identification information. In this specification, "information on the plurality of pieces of product identification information and the supervised labels of optical images corresponding to the plurality of pieces of product identification information" may also be expressed as "supervised information corresponding to the plurality of pieces of product identification information." In this case, the matching unit 155 can match the supervised information corresponding to the product identification information with optical image information related to the optical image in the matching data 154 to generate a matching result.
[0122] In this way, by storing in advance correct answer information corresponding to a plurality of pieces of product identification information in the matching data 154, the matching unit 155 does not need to query the server 400 for correct answer information for each matching process. This reduces the amount and number of times data is exchanged between the terminal 100 and the server 400, and also speeds up the matching process. Furthermore, even if the server 400 stops due to a communication failure between the terminal 100 and the server 400, a power outage, a natural disaster, or the like, the terminal 100 can still perform authentication, thereby ensuring authenticity of products without causing a stagnation in product distribution due to a stoppage in authenticity determination.
[0123] Furthermore, the correct answer information stored in the matching data 154 may be information in which a common correct answer label is set for two or more pieces of product identification information among a plurality of pieces of product identification information. In other words, thin line patterns associated with the same correct answer label may be attached to different products to be matched. In this way, the same correct answer label is associated with two or more different pieces of product identification information.
[0124] Even if the matching data 154 stores in advance supervised information corresponding to a plurality of pieces of product identification information as described above, the number of products in circulation is enormous, so it is conceivable that the storage capacity of the terminal 100 is limited, or the matching process performed by the matching unit 155 takes time. In this regard, by setting a common supervised label for two or more pieces of product identification information, it is possible to reduce the amount of supervised information stored in the matching data 154 and speed up the matching process. Furthermore, reducing the data amount of the supervised information also reduces the amount and frequency of data exchange between the terminal 100 and the server 400.
[0125] The manner in which the same correct label is set on different products to be matched is not particularly limited, but examples include when the same correct label is set on a group of identical products sold under the name of product name S, when the same correct label is set on a small group of identical products with a common feature within the group of products with the product name S, when the same correct label is set on products from a certain product manufacturer, and when the same correct label is set on products manufactured around the same time.
[0126] The correct answer information stored in the matching data 154 may be received via the transmitting / receiving unit 152 from the server 400 that manages the product identification information. The timing of receiving the correct answer information is not particularly limited. For example, the matching unit 155 may receive correct answer information corresponding to the acquired product identification information for each matching process and store it in the matching data 154. Furthermore, when the matching unit 155 receives correct answer information corresponding to the product identification information acquired in a certain matching process, rather than for every matching process, it may also receive correct answer information corresponding to multiple pieces of product identification information unrelated to that matching process and store it in the matching data 154. Note that the above-mentioned mode of not receiving correct answer information for every matching process is hereinafter also referred to as "for some matching processes." Furthermore, the matching unit 155 may receive correct answer information corresponding to multiple pieces of product identification information periodically or irregularly, unrelated to the matching process.
[0127] In particular, it is preferable that the matching unit 155 receives correct answer information corresponding to multiple pieces of product identification information for each matching process and stores it in the matching data 154, or that the matching unit 155 receives correct answer information corresponding to multiple pieces of product identification information periodically or irregularly, unrelated to the matching process, and stores it in the matching data 154. This allows the matching data 154 of the terminal 100 to have some correct answer information stored therein, making it possible to eliminate or reduce the process of receiving correct answer information corresponding to product identification information acquired for each inquiry process. This makes it possible to reduce the amount and frequency of data exchanged between the terminal 100 and the server 400, and to speed up the matching process.
[0128] A further description will be given of an embodiment in which the terminal 100 has correct answer information in which a common correct answer label is set for two or more pieces of product identification information in the matching data 154, and does not receive correct answer information corresponding to the product identification information from the server 400 for each matching process. In this embodiment, the terminal 100 receives correct answer information corresponding to a plurality of pieces of product identification information periodically or irregularly, and stores it in the matching data 154.
[0129] It should be noted that "receiving correct answer information periodically" means receiving correct answer information at a predetermined timing such as a period of time.
[0130] Furthermore, "receiving correct answer information irregularly" means receiving correct answer information according to circumstances. Examples of such circumstances include, but are not limited to, when the terminal 100 transmits a request to the server 400 to transmit correct answer information, and when receiving correct answer information corresponding to product identification information acquired in a certain matching process, the terminal 100 also receives multiple pieces of product identification information unrelated to the matching process and correct answer information corresponding to the multiple pieces of product identification information, and when correct answer information is registered in the correct answer data 453 of the server 400, the terminal 100 receives the correct answer information.
[0131] The matching unit 155 performs a process of matching the correct answer information with the optical image information to generate a matching result. At this time, the matching unit 155 may match the image data of the optical image information with the image data in the correct answer information, or may match the non-image data of the optical image information with the non-image data in the correct answer information.
[0132] Furthermore, the matching unit 155 may transmit product identification information to the server 400 for each matching process, receive correct answer information corresponding to the product identification information from the server 400, and perform the matching process, or may receive correct answer information corresponding to a plurality of pieces of product identification information for each partial matching process, store it in the matching data 154, and perform the matching process by referring to the matching data 154 during the matching process. Furthermore, the matching unit 155 may receive correct answer information from the server 400 periodically or irregularly, independently of the matching process, store it in the matching data 154, and perform the matching process by referring to the matching data 154 during the matching process.
[0133] Furthermore, in the case where the matching unit 155 receives correct answer information from the server 400 for each matching process or independently of the matching process, stores it in the matching data 154, and uses it for the matching process, when the matching data 154 does not contain correct answer information corresponding to the product identification information of a product to be matched that passes through the terminal 100, the matching unit 155 may transmit the product identification information to the server 400, receive correct answer information corresponding to the product identification information from the server 400, and perform the matching process.
[0134] Furthermore, the matching unit 155 may calculate the similarity between the optical image information and the supervised information based on the optical image information and the supervised information, and generate a matching result based on the similarity. Note that the matching unit 155 may generate a result indicating whether the optical image information and the supervised information match or do not match when the similarity is above or below a certain threshold or falls within a certain value range. The threshold or value range of the similarity used for such matching may be included as part of the supervised information stored in the matching data 154.
[0135] For example, the matching unit 155 may calculate the similarity by referring to the optical image information and the correct answer information and comparing the feature amounts of the optical image information with the feature amounts of the correct answer information. For example, when image data is used as the optical image information or the correct answer information, the matching unit 155 may calculate the feature amounts by image processing and then calculate the similarity. Specifically, the similarity may be calculated using, for example, the sum of squares of pixel value differences between the optical image information and the image data in the correct answer information, the sum of absolute values of pixel value differences, normalized cross-correlation, image uniformity ratio, mutual information, or Kullback-Leibler information. Furthermore, when non-image data such as parameters representing diffraction spot images or diffraction fringe patterns are used as the optical image information and the correct answer information, the non-image data may be used as the feature amounts to calculate the similarity. Specifically, the similarity may be calculated using, for example, the difference or ratio of feature amounts between the optical image information and the correct answer information, or a function using these as variables.
[0136] Because fluctuations in the acquired optical image information may occur depending on the shooting conditions, if a comparison result indicating that the thin line pattern is genuine is generated only when there is a perfect match, there is a possibility that a comparison result indicating that the optical image information and the correct information do not match, even though they actually match. In contrast, by using similarity as described above, it is possible to appropriately determine the match between the optical image information and the correct information, even when fluctuations occur in the optical image information. In this case, the comparison result may include information regarding whether the optical image information and the correct information match, or the degree of similarity between them. Furthermore, the comparison result may further include information regarding the date and time when the product identification information was acquired and information regarding the terminal 100 that acquired the product identification information.
[0137] The process of comparing the optical image information with the correct answer information by the comparing unit 155 means determining the authenticity of the thin line pattern, and determining the authenticity of the thin line pattern means determining the authenticity of the product to be compared that has the thin line pattern attached. The generated comparison result also means the authenticity determination result of the product to be compared.
[0138] The terminal 100 having the above configuration can determine the authenticity of a product to be verified by using the product identification information and optical image information. Furthermore, even if a serial code attached to a product to be verified, such as an RF tag or a two-dimensional code, is duplicated, it is possible to determine the authenticity of the product to be verified by verifying the authenticity of the thin line pattern.
[0139] Furthermore, the matching unit 155 may control the display of the matching result on the display device 137, may transmit the matching result to the server 400, or may store the matching result in the matching data 154.
[0140] The matching unit 155 sends the matching results to the server 400, and the ledger management unit 456 of the server 400 stores the matching results in the ledger data 455. This makes it possible to track the products to be matched from the stage at which the manufacturer ships them based on the matching results collected from the terminals 100 at each distribution base, thereby ensuring the authenticity of the products to be matched throughout the entire distribution process.
[0141] Furthermore, since the matching unit 155 stores the matching results in the matching data 154, there is no need to send the authenticity determination results to the server 400 for each matching process. Therefore, even if the server 400 is stopped due to a communication failure, power outage, natural disaster, etc., the authenticity determination can be carried out, and the authenticity of the product can be guaranteed without causing a stagnation in product distribution due to the stoppage of the authenticity determination.
[0142] The abnormality information confirmation unit 156 confirms whether or not abnormality information has been input. If abnormality information has been input, processing such as not proceeding to the next step, such as an irradiation step, may be performed. Furthermore, if abnormality information has been input, the abnormality information may be displayed on the display device 137.
[0143] Server The server 400 includes, but is not limited to, a matching unit that transmits correct answer information regarding the correct answer label of the optical image to another information processing device (terminal 100) that acquires optical image information regarding the optical image obtained from the fine line pattern attached to the product to be matched, and a ledger management unit that receives the matching result of matching the correct answer information with the optical image information from the other information processing device (terminal 100).
[0144] 9 is a block diagram showing the configuration of the server 400. The server 400 typically includes one or more processors 410, a communication interface 420, a memory 440, a storage 450, and one or more communication buses 460 for interconnecting these components. The processor 410, the communication interface 420, the memory 440, the storage 450, and the communication bus 460 may have the same configuration as the processor 110, the communication interface 120, the memory 140, the storage 150, and the communication bus 160 described above.
[0145] The server 400 may also include an input / output interface 430. The input / output interface 430 may include a keyboard, a mouse, and a display device. Alternatively, the input / output interface 430 may be connected to an external input / output interface to receive predetermined inputs and perform output.
[0146] Storage 450 stores programs and data structures, or a subset thereof. Processor 410 is configured to function as a transmitter / receiver 452, a collator 454, and a ledger manager 456, as shown in FIG. 9, by reading and executing each program stored in storage 450.
[0147] Here, the program stored in storage 450 is not particularly limited, but may, for example, cause server 400 to execute a correct answer information sending step of sending correct answer information regarding the correct answer label of the optical image to terminal 100, and a matching result receiving step of receiving from terminal 100 a matching result obtained by matching the correct answer information with the optical image information.
[0148] Operating system 451, for example, handles various basic system services and contains procedures for performing tasks with the hardware.
[0149] The transceiver unit 452 is used, for example, to connect the server 400 to other computers, such as the terminal 100, via the communication interface 420 and one or more communication networks, such as the Internet, other wide area networks, local area networks, metropolitan area networks, etc.
[0150] For example, product identification information of a certain product to be verified and a correct label of an optical image that can be acquired from a thin line pattern attached to the product to be verified are associated and stored in the correct answer data 453. Here, as described above, the correct answer label stored in the correct answer data 453 may be image data, non-image data, or both.
[0151] FIG. 10 shows an example of the correct answer data 453. As shown in FIG. 10(a), the correct answer data 453 may store, for example, "product identification information," "type of optical image," and "pattern parameters" in association with each other. Note that the correct answer data 453 may store image data of the correct answer image instead of the "type of optical image," etc. Furthermore, as shown in FIG. 10(b), the correct answer data 453 may store, in association with each other, "product identification information" and "correct label ID."
[0152] In the supervised data 453, the product identification information and the supervised labels may correspond one-to-one, or as shown in Figures 10(a) and 10(b), a common supervised label (Type A) may be set for two or more pieces of product identification information. In other words, thin line patterns associated with the same supervised label may be attached to different products to be matched. This allows the same supervised label to be associated with two or more different pieces of product identification information.
[0153] Even if the matching data 154 stores in advance correct answer information corresponding to a plurality of pieces of product identification information as described above, the number of products in circulation is enormous, so it is conceivable that the storage capacity of the terminal 100 is limited, and the matching process performed by the matching unit 155 takes time. In this regard, by setting a common correct answer label for two or more pieces of product identification information, it is possible to reduce the amount of data of correct answer information stored in the matching data 154, and also shorten the time required for searching for the correct answer label, thereby speeding up the matching process. Furthermore, by reducing the data amount of correct answer information, it is possible to reduce the amount and frequency of data exchange between the terminal 100 and the server 400.
[0154] Furthermore, for example, the product identification information and the thin line pattern issuing period may be associated and stored as the correct answer data 453, as shown in Fig. 11(a). In this case, for example, the thin line pattern issuing period may be separately associated and stored as shown in Fig. 11(b), and the pattern parameters corresponding to the thin line pattern issuing period may be used as the correct answer label to perform the matching process.
[0155] As a result, the thin line patterns issued within a predetermined period can be subjected to the matching process assuming that they have the predetermined correct answer information. Therefore, there is no need to transmit the correct answer information from the server 400 to the terminal 100 for each matching process, and the frequency of transmission can be reduced. In addition, the time required for searching for the correct answer label is shortened, and the matching process can be speeded up.
[0156] 12, for example, a product manufacturer ID (MakerID00001...) is added as product identification information as the correct answer data 453. As a result, when products from a certain manufacturer are passed through the terminal 100 in bulk, it is not necessary to transmit correct answer information from the server 400 to the terminal 100 for each matching process, and the frequency of this can be reduced. Also, the time required for searching for a correct answer label, etc. is shortened, and the matching process can be speeded up.
[0157] The matching unit 454 executes a process of transmitting correct answer information about the correct answer label of the optical image to the terminal 100 that acquires optical image information about the optical image obtained from the thin line pattern attached to the product to be matched.
[0158] The timing of transmitting the correct answer information is not particularly limited. For example, the matching unit 454 may receive product identification information from the terminal 100 for each matching process, extract correct answer information corresponding to the received product identification information from the correct answer data 453, and transmit the extracted correct answer information to the terminal 100. Furthermore, the matching unit 454 may receive certain product identification information from the terminal 100, not for every matching process, and when transmitting correct answer information corresponding to the product identification information to the terminal 100, also transmit correct answer information corresponding to multiple pieces of product identification information unrelated to the product identification information to the terminal 100. Note that the above-mentioned aspect of not transmitting correct answer information for every matching process is also referred to as "for some matching processes" hereinafter. Furthermore, the matching unit 454 may extract correct answer information corresponding to multiple pieces of product identification information from the correct answer data 453 regularly or irregularly, unrelated to the matching process.
[0159] As described above, the correct answer information transmitted by the matching unit 454 to the terminal 100 may include a plurality of pieces of product identification information and information on correct labels of optical images corresponding to the plurality of pieces of product identification information. Also, a common correct answer label may be set for two or more pieces of product identification information among the plurality of pieces of product identification information.
[0160] Ledger data 455 is data in which product identification information and matching results are associated with each other, and may include any information for each piece of product identification information, such as a flag attached to the product identification information.
[0161] 13 shows an example of predetermined product identification information included in ledger data 455 and updates of information associated with that product identification information when the product to be verified passes through each terminal. "Terminal ID" is identification information that allows this system to uniquely identify terminal 100. "Date and time" is the date and time when terminal 100 performed the authenticity verification, and "verification result" is the result of the authenticity verification performed by terminal 100.
[0162] 13, before shipping, only the product identification information is recorded as product identification information, and when a product to be verified is carried out from the manufacturer and passes through terminal 100, the terminal ID of terminal 100, the verification result, and information relating to the time are recorded in association with the product identification information. Then, when the product passes through terminal 100 installed at a distributor's base, the terminal ID of terminal 100, the verification result, and information relating to the time are recorded in association with the product identification information. Also, when the product passes through terminal 100 installed at a distributor's base and is carried out, the terminal ID of terminal 100, the verification result, and information relating to the time are recorded in association with the product identification information.
[0163] In this way, a set of information on the terminal ID, time, and matching result is added to the product identification information included in the ledger data 455 each time a terminal 100 passes by. Therefore, by referring to the information associated with the product identification information, it is possible to obtain the installation base of the terminal 100 through which the product to be matched passed, the date and time of passing, and the judgment result.
[0164] Note that Figure 13 shows a data format in which terminal IDs and the like are sequentially associated with product identification information, but the data managing product identification information is not limited to this and may be managed in any data format, such as a table format.
[0165] In the above description, the supervising data 453 and the ledger data 455 are distinguished from each other, but the supervising data 453 may be a part of the ledger data 455. In this case, for example, non-image data such as a supervising label ID, such as "PRODUCT00001 (product identification information)-Type A (supervising label ID)-", may be associated and recorded in the product identification information of the ledger data 455. This allows the product identification information of a certain product to be verified and the supervising label of an optical image that can be acquired from a thin line pattern attached to the product to be verified to be stored in association with each other in the ledger data 455 as well.
[0166] The ledger management unit 456 executes a process of receiving a comparison result obtained by comparing the correct answer information with the optical image information from the terminal 100. Furthermore, the ledger management unit 456 may execute a process of updating the ledger data 455 that manages the product identification information, based on the comparison result received from the terminal 100.
[0167] Additionally, the ledger management unit 456 has a function of transmitting information recorded in the ledger data 455 and updating the ledger data 455. For example, in response to a request from the terminal 100, a client terminal, or the like, the ledger management unit 456 may refer to the ledger data 455, output a report of the requested distribution information, and transmit it to another information processing terminal.
[0168] The "other information processing devices" referred to here include, for example, any information processing devices (hereinafter also referred to as "client terminals") owned by the manufacturer, distributor, or retailer in Fig. 5. Here, the client terminal is a terminal owned by a business operator involved in the distribution of the product to be verified, and refers to a terminal other than the terminal that can access this system.
[0169] In this embodiment, the server 400 may provide the above service independently, or a plurality of servers 400 may provide the above service jointly.
[0170] In this embodiment, the terminal 100 and the server 400 may function as an information processing device that configures a distributed ledger (hereinafter also referred to as a "blockchain") that stores ledger data. Furthermore, the information processing device that configures the distributed ledger may include the client terminal.
[0171] In this embodiment, the distributed ledger (blockchain) that stores the ledger data may be of any of a public type, a private type, and a consortium type. For example, even in the case of a consortium type managed by businesses involved in the distribution of the products to be verified, the terminal 100, the server 400, and the client terminal may have the same authority in managing the ledger data, or the server 400 may have authority to manage the ledger data, and the terminal 100 and the client terminal may have authority to refer to the ledger data. Here, "management" includes updating and authenticating the distributed ledger, and the updating and authentication may be performed by separate information processing devices (the server 400).
[0172] Hereinafter, a description will be given of an embodiment in which only the server 400 has the authority to manage a distributed ledger that stores ledger data, but the system of this embodiment is not limited to this. For example, an information processing device (such as a client terminal) other than the server 400 may have the function of managing a distributed ledger. Furthermore, the ledger data is not limited to a distributed ledger, and may be in the form of a database stored in the storage unit of one or more servers 400.
[0173] 7. Operation processing The terminal 100 of this embodiment is an anti-counterfeit label having a fine line pattern and a functional layer located closer to the attachment surface than the fine line pattern, and executes an irradiation step of irradiating light onto the anti-counterfeit label having an incoherent inducibility of the functional layer of ΔP20% or more; an imaging step of forming an optical image by passing diffracted light reflected from the fine line pattern through a Fourier transform lens and acquiring the optical image; and a matching step of matching correct answer information regarding the correct label of the optical image with optical image information regarding the optical image to generate a matching result.
[0174] In addition, the server 400 of this embodiment may execute a correct answer information sending step of sending correct answer information regarding the correct answer label of the optical image to another information processing device (terminal 100) that acquires optical image information regarding the optical image obtained from the fine line pattern attached to the product to be matched, and a matching result receiving step of receiving from the other information processing device (terminal 100) a matching result obtained by matching the correct answer information with the optical image information.
[0175] The operation and processing of the system of this embodiment configured as above will be described below.
[0176] 7.1. First embodiment FIG. 14 shows a processing sequence of an information processing method in which, for each matching process, the server 400 receives product identification information from the terminal 100, extracts correct answer information corresponding to the received product identification information from the correct answer data 453, transmits the extracted correct answer information to the terminal 100, and the terminal 100 executes the matching process (first embodiment).
[0177] In step S1001, the abnormality information checking unit 156 of the terminal 100 checks whether or not there is abnormality information. When evidence of peeling is visually confirmed, the abnormality information is input in advance by the abnormality information input device 136 of the terminal 100. The abnormality information checking unit 156 of the terminal 100 may perform control so that the collation result is displayed on the display device of the terminal 100 (result display step).
[0178] In step S1002, the information acquisition unit 153 of the terminal 100 acquires optical image information from the thin line pattern of the label 300 attached to the product to be verified via the irradiation device 131, the Fourier transform lens 132, and the imaging device 133 (optical image acquisition step), and acquires product identification information attached to the product to be verified via the product information reading device 135 (product information acquisition step). At this time, the information acquisition unit 153 may simultaneously acquire the terminal ID of the terminal 100 that acquired the optical image information and the acquisition date and time thereof.
[0179] In step S1003, the information acquisition unit 153 of the terminal 100 instructs the transmission / reception unit 152 to transmit the product identification information to the server 400. At this time, the information acquisition unit 153 may transmit to the server 400 the terminal ID of the terminal 100 that has acquired the product identification information and the acquisition date and time thereof at the same time.
[0180] In steps S1004 and S1005, the collation unit 454 of the server 400 refers to the correct answer data 453 and acquires correct answer information based on the product identification information received from the terminal 100. Then, the collation unit 454 instructs the transmission / reception unit 452 to transmit the identified correct answer information to the terminal 100 (correct answer information transmission step).
[0181] At this time, the matching unit 454 may send non-image data instead of image data as the correct answer information, or may send both image data and non-image data. By sending non-image data, it is possible to reduce the amount of data received by the terminal 100 from the server 400. Therefore, it is possible to avoid delays in the matching process that occur due to a large amount of data being sent and received.
[0182] In step S1006, the matching unit 155 of the terminal 100 matches the optical image information with the correct information to generate a matching result (matching step). At this time, if the correct information received by the terminal 100 is non-image data, the matching unit 155 of the terminal 100 may convert the correct information into image data or convert the optical image information into non-image data before performing the above matching process.
[0183] In step S1007, the matching unit 155 of the terminal 100 instructs the transmitting / receiving unit 152 to transmit the matching result to the server 400 (matching result transmitting step, matching result receiving step). At this time, the matching unit 155 may transmit to the server 400 the terminal ID of the terminal 100 that generated the matching result and the date and time of generation of the matching result at the same time.
[0184] Furthermore, in step S1007, if the matching result indicates that the correct answer information and the optical image information do not match, the matching unit 155 of the terminal 100 may control the matching result to be displayed on the display device of the terminal 100 (result display step).
[0185] In step S1008, ledger management unit 456 of server 400 updates ledger data 455 based on the matching result received from terminal 100 (ledger update step). More specifically, ledger management unit 456 records, for example, "G0011 (terminal ID)-T1001 (date and time)-True (matching result)" in ledger data 455 based on the matching result.
[0186] As described above, the system according to this embodiment can determine the authenticity of a product to be verified and can guarantee that a product to be verified in circulation is genuine. Furthermore, this system can also accumulate information on the authenticity of target products that have passed through each terminal 100, as well as logistics information on the place and time of passage.
[0187] 7.2. Second embodiment FIG. 15 also shows a processing sequence of an information processing method in which the server 400 transmits product identification information and correct answer information corresponding to the product identification information to the terminal 100, either periodically or irregularly, after each matching process or independently of the matching process, and the terminal 100 executes the matching process based on the correct answer information received in advance (second embodiment).
[0188] In steps S1101 and S1102, the matching unit 454 of the server 400 transmits correct answer information to the terminal 100 after each matching process, or periodically or irregularly, regardless of the matching process, and the matching unit 155 of the terminal 100 stores the received correct answer information in the matching data 154.
[0189] In this case, the correct answer information transmitted by the matching unit 454 to the terminal 100 may include a plurality of pieces of product identification information and correct answer labels of optical images corresponding to the plurality of pieces of product identification information. Also, a common correct answer label may be set for two or more pieces of product identification information among the plurality of pieces of product identification information.
[0190] Furthermore, the matching unit 454 may send non-image data instead of image data as the correct label, or may send both image data and non-image data. By sending non-image data, it is possible to reduce the amount of data received by the terminal 100 from the server 400. This makes it possible to avoid delays in the matching process that occur due to a large amount of data being sent and received.
[0191] Thereafter, steps S1103, S1104, S1105, S1106, and S1107 can perform the same processing as steps S1001, S1002, S1006, S1007, and S1008, respectively.
[0192] As described above, by separating the step of obtaining correct information (S1101-S1102) from the confirmation step (S1103) and the matching step (S1104-S1107) and by obtaining the correct information in advance, the matching process can be performed more quickly. In addition, even if the terminal 100 and the server 400 are temporarily unable to communicate due to a server communication failure, power outage, or server shutdown caused by a natural disaster, authenticity determination can be carried out, and the authenticity of the product can be guaranteed without causing a stagnation in product distribution due to the suspension of authenticity determination.
[0193] The above-described embodiments are intended to facilitate understanding of the present invention and are not intended to limit the present invention. The elements of the embodiments, as well as their arrangement, materials, conditions, shapes, sizes, etc., are not limited to those illustrated and can be modified as appropriate. Furthermore, configurations shown in different embodiments can be partially substituted or combined with each other. [Example]
[0194] The present embodiment will be described in more detail below with reference to examples, but the present embodiment is not limited to the following examples.
[0195] <|ΔL1-ΔL2|, dimensional change rates ΔL1 and ΔL2> When the first substrate and the protective layer were the second substrate, the substrate was not laminated and the measurement was performed as a single layer. For the measurement of ΔL1, first measure the dimension of the long axis of the first substrate, and then calculate L B1 Next, the sample was left in a Lightspec thermostatic (humidity) chamber (product name "LHL-114") manufactured by Espec Corporation at a temperature of 60°C and a relative humidity of 90% for 3 days. After that, the length of the long axis of the sample was measured. A1 ΔL1 was calculated using the following formula: ΔL1=L A1 / L B1
[0196] For the measurement of ΔL2, first measure the dimension of the long axis of the second substrate, and then calculate L B2 Next, the sample was left in a Lightspec thermostatic (humidity) chamber (product name "LHL-114") manufactured by Espec Corporation at a temperature of 60°C and a relative humidity of 90% for 3 days. After that, the length of the long axis of the sample was measured. A2 ΔL2 was calculated using the following formula: ΔL2=L A2 / L B2 When the protective layer is a cured film, the cured film is formed on a release paper to prepare a single-layer protective layer, and the above-mentioned test is carried out.
[0197] |ΔL1-ΔL2| is calculated from the above-mentioned ΔL1 and ΔL2.
[0198] <High temperature warpage test> Anti-counterfeit labels measuring 30mm x 84mm were prepared and left for three days in a Lightspec thermostatic (hygroscopic) chamber (product name "LHL-114") manufactured by Espec Corp., at a specified temperature and humidity. For the low and high humidity conditions, the sealed sample was heated to a specified temperature and set to a specified relative humidity. After that, the amount of warpage of the sample film is calculated by placing the anti-counterfeit label (sample) on a horizontal surface as shown in Figure 4, measuring the heights of warpage δ1 and δ2 (unit: mm) from the horizontal surface at both ends, and using the following formula: Note that the points to measure warpage δ1 and δ2 are the ends of the sample's long axis, where the largest warpage has occurred. Amount of warpage = δ1 + δ2
[0199] <Visible light transmittance measurement method> In accordance with JIS R3106, the transmittance of the functional layer was measured at wavelengths from 400 nm to 780 nm, and the transmittance was calculated by multiplying the transmittance by a weighting coefficient obtained from the wavelength distribution of the relative luminous efficiency at each wavelength and calculating the weighted average.
[0200] Example 1 A polyethylene terephthalate (PET) film (manufactured by Toyobo Co., Ltd., product name Cosmoshine A4160, film thickness 50 μm) was used as a first substrate, and a composition containing 2 mass% silicon oxide particles, 1 mass% conductive organic silane compound, 65 mass% 2-propanol, 25 mass% 1-butanol, and 7 mass% water was applied to one side and dried to form a silicon oxide-containing film with a thickness of 50 nm, thereby obtaining a transparent substrate.
[0201] Next, 20 parts by mass of cuprous oxide nanoparticles with a particle diameter of 21 nm, 4 parts by mass of a dispersant (manufactured by BYK-Chemie, product name: Disperbyk-145), 1 part by mass of a surfactant (manufactured by Seimi Chemical, product name: S-611), and 75 parts by mass of ethanol were mixed and dispersed to prepare an ink containing 20% by mass of cuprous oxide nanoparticles.
[0202] The ink was then applied to the surface of the transfer medium, and the ink-coated surface was placed opposite a plate with conductive grooves, and the two plates were pressed together to transfer a portion of the ink onto the raised surface of the plate. The remaining ink-coated surface of the transfer medium was then placed opposite a transparent substrate, and the two plates were pressed together to transfer the desired conductive pattern of ink onto the first outermost layer of the transparent substrate. The fine-line pattern of ink (dispersion coating film) was then baked by flash lamp annealing at room temperature using a NovaCentrix Pulseforge 1300. The resulting metallic fine-line pattern was the mesh pattern shown in Figure 1, with a line width (W1) of 2 μm and a pitch (P1) of 60 μm.
[0203] Next, a polyethylene terephthalate (PET) film (manufactured by Toyobo Co., Ltd., product name Cosmoshine A4160, film thickness 50 μm) with an easy-adhesion layer formed on one side was laminated onto the mesh pattern as an adhesive layer and a second base layer to form a sheet.
[0204] The sheet obtained in Example 1 was cut into strips measuring 30 mm x 84 mm to obtain anti-counterfeit labels 1. The |ΔL1-ΔL2| of the obtained anti-counterfeit label 1 was 524 ppm.
[0205] The sheet obtained in Example 1 was cut into strips measuring 30 mm × 84 mm perpendicular to the long axis of the aforementioned anti-counterfeit label 1, to obtain anti-counterfeit label 2. The obtained anti-counterfeit label 2 had a |ΔL1-ΔL2| of 1165 ppm.
[0206] The anti-counterfeit labels 1 and 2 obtained in Example 1 were subjected to a durability test under the temperature and relative humidity conditions shown in the table below.
[0207] [Table 1] [Explanation of symbols]
[0208] 100... terminal, 110... processor, 120... communication interface, 130... input / output interface, 131... irradiation device, 132... Fourier transform lens, 133... imaging device, 134... screen, 135... product information reading device, 136... abnormality information input device, 137... display device, 140... memory, 150... storage, 151... operating system, 152... transmission / reception unit, 153... information acquisition unit, 154... comparison data, 155... comparison unit, 156... abnormality information confirmation unit, 1 60...communication bus, 300...anti-counterfeiting label, 310...first substrate, 320...thin wire, 330...thin line pattern, 340...protective layer, 341...adhesive layer, 342...second substrate, 400...server, 410...processor, 420...communication interface, 430...input / output interface, 440...memory, 450...storage, 451...operating system, 452...transmitting / receiving unit, 453...correct data, 454...collating unit, 455...ledger data, 456...ledger management unit, 460...communication bus
Claims
1. A first substrate; a protective layer, a thin line pattern formed on at least one surface of the first substrate; The dimensional change rate ΔL of the first base material 1 and the dimensional change rate ΔL of the protective layer 2 and the relationship satisfies the relationship of formula (1). 50ppm≦|ΔL 1 -ΔL 2 |≦2000ppm (1) (In the formula, ΔL 1 Is, L A1 / L B1 and L A1 is the dimension of the major axis of the first substrate after a test in which the first substrate is exposed to conditions of 90% relative humidity and 60°C for 3 days, L B1 is the dimension of the major axis of the first substrate before the test, ΔL 2 Is, L A2 / L B2 and L A2 is the dimension of the major axis of the protective layer after the test, L B2 is the dimension of the major axis of the protective layer before the test.)
2. The anti-counterfeit label according to claim 1 , wherein the protective layer is a second substrate.
3. The counterfeit prevention label according to claim 2 , wherein the first substrate and the second substrate are laminated together with an adhesive.
4. The anti-counterfeit label according to claim 2 , wherein at least one of the first substrate and the second substrate is transparent.
5. 2. The counterfeit prevention label according to claim 1, wherein the thin line pattern can form an optical image by irradiating the thin line pattern with light and focusing the reflected light with a Fourier transform lens.
6. 6. The anti-counterfeit label according to claim 5, wherein the optical image is a reflection diffraction image formed by the fine line pattern.
7. 2. The anti-counterfeiting label according to claim 1, wherein the thin line pattern is a diffraction grating including thin lines with a line width of 5 μm or less.
8. 2. The anti-counterfeiting label according to claim 1, wherein the opening ratio of the fine line pattern is 60 to 99.9% by area.
9. The anti-counterfeiting label according to claim 1, which is in the form of a tag.
10. Measuring the warpage of the anti-counterfeit label according to any one of claims 1 to 9; A management status determination method including:
11. determining the temperature condition during distribution based on the measured value of the warpage of the anti-counterfeit label; The management state determination method according to claim 10, comprising:
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