Test management interface device and information processing method

Abstract

To provide a technique for effectively performing processing required for machine learning or the like by using an unused device in an ETC test control system.SOLUTION: A test management interface device connected to a log collection device that stores log data of a lane server and an ETC test control device includes: a log collection device communication unit that acquires log files from the log collection device; a central processing unit that acquires the log data from the log files, converts the log data into format data that is a format used by the ETC test control device and performs failure prediction of the lane server by using the format data; and a memory unit that stores target data including the format data and prediction results of the failure prediction.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] FIELD Embodiments of the present invention relate to a test management interface device and an information processing method. [Background technology]

[0002] Currently, the ETC test control system is being used to test whether newly installed lane servers are operating correctly before they are put into operation.

[0003] Furthermore, in order to improve the efficiency of troubleshooting in ETC test control systems, there is a method of analyzing the log data of lane servers acquired from each log collection device and predicting failures in each device installed on the many lane servers. For example, Patent Document 1 discloses a technology for predicting failures and foreseeing failures based on characteristic occurrence patterns of log data. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2015-164005 [Patent Document 2] Japanese Patent Application Laid-Open No. 2004-013208 [Patent Document 3] Japanese Patent Application Laid-Open No. 2004-038764 [Patent Document 4] Japanese Patent Application Publication No. 2019-012475 Summary of the Invention [Problem to be solved by the invention]

[0005] Generally, it is considered to introduce a machine learning processing module to detect malfunctioning equipment before a failure occurs. However, there are problems with the large number of lanes and the time it takes for the machine learning processing module to analyze. In addition, if the central processing server of the ETC test control system executes the machine learning processing module, it will use a large amount of the central processing server's processing resources, which will affect other processes.

[0006] This invention was made in light of the above circumstances, and its purpose is to provide a technology that effectively performs processing required for machine learning, etc., when processing resources are not being used in the arithmetic device of an ETC test control system. [Means for solving the problem]

[0007] In one embodiment, a test management interface device connected to a log collection device storing log data of a lane server and an ETC test control device includes a log collection device communication unit that acquires log files from the log collection device, a central processing unit that acquires the log data from the log files, converts the log data into format data that is a format used by the ETC test control device, and performs failure prediction of the lane server using the format data, and a memory unit that stores target data including the format data and the prediction results of the failure prediction. [Brief explanation of the drawings]

[0008] [Figure 1] FIG. 1 is a diagram showing an example of a schematic configuration of an ETC test control system according to the first embodiment. [Figure 2] FIG. 2 is a block diagram showing an example of a schematic configuration of a test management interface device and a log collection device according to the first embodiment. [Figure 3] FIG. 3 is a diagram showing an example of log acquisition information stored in the lane server database. [Figure 4]FIG. 4 is a diagram showing an example of lane server information stored in the lane server database. [Figure 5] FIG. 5 is a sequence diagram showing a log data collection method according to the first embodiment. [Figure 6] FIG. 6 is a flowchart illustrating step ST104 in more detail. [Figure 7] FIG. 7 is a diagram showing an example of analysis data generated from log data. [Figure 8] FIG. 8 is a diagram showing an example of weather data acquired via a network. [Figure 9] FIG. 9 is a diagram showing an example of the failure data generated by the central processing unit. [Figure 10] FIG. 10 is a diagram showing an example of log acquisition information stored in the lane server database according to the second embodiment. [Figure 11] FIG. 11 is a sequence diagram showing a log data collection method according to the second embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0009] The test management interface device and the information processing method will be described in detail below with reference to the drawings. In the following embodiments, parts with the same numbers perform the same operations, and redundant description will be omitted. For example, when there are multiple identical or similar elements, a common symbol may be used to describe each element without distinguishing between them, or a subnumber may be used in addition to the common symbol to describe each element with distinction between them.

[0010] (composition) FIG. 1 is a diagram showing an example of a schematic configuration of an ETC test control system according to the first embodiment. As shown in Figure 1, the ETC test control system of the embodiment includes an ETC test control device 1, a test management interface device 2 (referred to as a test management IF device in Figure 1), a log collection device 3, and a lane server 4.

[0011] The ETC test control system may include other configurations as needed in addition to the configuration shown in FIG. 1, or specific configurations may be excluded.

[0012] The ETC test control device 1 is a device that manages the test management interface device 2. The ETC test control device 1 is installed at a predetermined location of the operator that manages the toll road. The ETC test control device 1 may be configured, for example, as a general-purpose computer equipped with a processor, etc. The ETC test control device 1 is connected to each of multiple test management interface devices 2. The ETC test control device 1 can send and receive various information to each of the test management interface devices 2. For example, the ETC test control device 1 can request the test management interface device 2 to acquire log data collected by the log collection device 3.

[0013] The test management interface device 2 is a device that converts log data into format data that the ETC test control device 1 uses for processing. Like the ETC test control device 1, the test management interface device 2 is installed at a predetermined location of the operator that manages the toll road. The test management interface device 2 may be configured as, for example, a general-purpose computer. The test management interface device 2 is connected to a log collection device 3 that is installed for each lane at each toll gate. For example, the test management interface device 2 can send and receive various information to and from each log collection device 3. The test management interface device 2 converts the log data collected by the log collection device 3 into format data that the ETC test control device 1 uses for processing, and stores the converted format data.

[0014] Generally, the ETC test control device 1 can predict failures of various devices installed in the lane server 4 based on log data. Here, there are many toll gates on a toll road, and multiple lane servers 4 are installed at each toll gate (for example, there are approximately 500 lane servers 4). Therefore, it would take an enormous amount of time to predict failures of each device in all lane servers 4. Furthermore, if failure predictions were performed on lane servers 4 in order, it would take many days from the start of failure prediction for the first server to the completion of failure prediction for the 500th server, and it may not be possible to predict failures in advance.

[0015] The log collection device 3 is a device that collects log data from the lane server 4. The log collection device 3 is installed in the toll booth machine room of the entrance toll booth and the exit toll booth (hereinafter simply referred to as the toll booth) installed on the toll road. The log collection device 3 may be configured as, for example, a general-purpose computer. The log collection device 3 is arranged in a one-to-one relationship with the lane server 4 installed on each lane, and is connected to the associated lane server 4. The log collection device 3 acquires log data from the connected lane server 4. The log collection device 3 then stores the collected log data as a log file.

[0016] The lane server 4 is installed in the toll booth machine room of the toll booth, corresponding to the lane where vehicles that can use the ETC system (hereinafter referred to as ETC vehicles) can pass. When an ETC vehicle passes through the lane, the lane server 4 establishes communication with the on-board unit of the ETC vehicle and transmits and receives various information to and from the on-board unit. Furthermore, the lane server 4 acquires various data when the ETC vehicle passes through using various devices installed on the lane. The lane server 4 then stores this information as a passage record of one ETC vehicle. The lane server 4 transmits the stored data to the log collection device 3 as log data.

[0017] It goes without saying that the lane server 4 may control various devices installed on the lane, control the passage of ETC vehicles, calculate tolls, and control the display of information on various devices.

[0018] FIG. 2 is a block diagram showing an example of a schematic configuration of the test management interface device 2 and the log collection device 3 according to the first embodiment. First, the configuration of the test management interface device 2 will be described. The test management interface device 2 is one or more computers, and includes an ETC test control device communication unit 21, a central processing unit 22, a storage unit 23, a log collection device communication unit 24, a network communication unit 25, and the like.

[0019] The ETC test control device communication unit 21 is a communication interface for communicating with the ETC test control device 1. For example, the communication interface may be a general one as long as it can communicate with the ETC test control device 1 under the control of the central processing unit 22 and send and receive various information.

[0020] The central processing unit 22 controls the test management interface device 2. The central processing unit 22 includes a hardware processor such as a central processing unit (CPU). For example, the central processing unit 22 may be an integrated circuit capable of executing various programs.

[0021] The storage unit 23 includes a program storage unit that stores programs necessary for the central processing unit 22 to execute various processes. The program storage unit may use, as a storage medium, a combination of nonvolatile memories that can be written to and read from at any time, such as an EPROM (Erasable Programmable Read Only Memory), an HDD (Hard Disk Drive), or an SSD (Solid State Drive), and a nonvolatile memory such as a ROM (Read Only Memory). For example, the central processing unit 22 can implement various controls and operations by reading and executing programs stored in the program storage unit of the storage unit 23.

[0022] Furthermore, the memory unit 23 includes a data storage unit for storing data acquired and generated in the course of various processes performed by the central processing unit 22 by executing the programs. The data storage unit of the memory unit 23 includes a storage medium that combines a nonvolatile memory that can be written to and read from at any time, such as an HDD or a memory card, with a volatile memory such as a RAM (Random Access Memory).

[0023] The storage unit 23 also includes a lane server database 231, a log file storage unit 232, a target data database 233, and the like as data storage units.

[0024] The lane server database 231 is a database for storing information about the lane servers 4 connected to the test management interface device 2 via the log collection device 3. The lane server database 231 stores log acquisition information including parameters for acquiring log data from the log collection device 3 and lane server information including parameters indicating how the lane servers 4 are installed.

[0025] FIG. 3 is a diagram showing an example of log acquisition information stored in the lane server database 231. As shown in FIG. In the example of FIG. 3, the log acquisition information includes the number of registered lanes, toll gate numbers, lane numbers, etc. as parameters.

[0026] The number of registered lanes is a parameter that indicates the number of lanes for which log files are to be acquired. For example, in the example of Fig. 3, log files are to be acquired from 10 lane servers 4 (log collection devices 3).

[0027] Here, the toll gate number is a unique number that indicates the toll gate where the log collection device 3 and the lane server 4 are located, and the lane number is the number of the lane where the lane server 4 is installed.

[0028] The log acquisition information shown in FIG. 3 is merely an example, and may include any data necessary for collecting log files, in addition to the above-mentioned parameters.

[0029] FIG. 4 is a diagram showing an example of lane server information stored in the lane server database 231. As shown in FIG. In the example of FIG. 4, the lane server information includes parameters such as toll gate number, lane number, installation direction, altitude, and switching stop time.

[0030] The installation direction indicates the direction in which the lane server 4 is installed. The altitude indicates the altitude at which the lane server 4 is installed. The switching stop time indicates the time when the lane server 4 goes from being stopped to being operational.

[0031] It should be noted that the parameters stored in the lane server database 231 are not limited to the above-mentioned parameters, and may of course include any parameters that indicate how the lane server 4 is installed.

[0032] The log file storage unit 232 is a storage unit used to store format data obtained by converting the log data acquired from the log collection device 3 into data usable by the ETC test control device 1. Details of the format data will be described later.

[0033] The target data database 233 is a database used to store target data that can be used in the ETC test control device 1. Details of the target data will be described later.

[0034] The log collection device communication unit 24 is a communication interface for communicating with the lane server 4. For example, the communication interface may be a general one as long as it can communicate with the lane server 4 under the control of the central processing unit 22 and send and receive various information.

[0035] The network communication unit 25 is a communication interface for communicating with other web servers etc. via a network. For example, the communication interface may be a general one as long as it can communicate with various servers via a network under the control of the central processing unit 22 and send and receive various information.

[0036] Next, the configuration of the log collection device 3 will be described. The log collection device 3 is one or more computers, and includes a test management interface device communication unit 31, a central processing unit 32, a storage unit 33, a lane server communication unit 34, and the like.

[0037] The test management interface device communication unit 31 is a communication interface for communicating with the test management interface device 2. For example, the communication interface may be a general one as long as it can communicate with the test management interface device 2 under the control of the central processing unit 32 and send and receive various information.

[0038] The central processing unit 32 controls the log collection device 3. The central processing unit 32 includes a hardware processor such as a central processing unit (CPU). For example, the central processing unit 32 may be an integrated circuit capable of executing various programs.

[0039] The memory unit 33 includes a data storage unit for storing data acquired and generated in the course of various processes performed by the central processing unit 32 by executing a program. The data storage unit of the memory unit 33 includes a storage medium that combines a nonvolatile memory that can be written to and read from at any time, such as an HDD or a memory card, with a volatile memory, such as a RAM.

[0040] The storage unit 33 includes a log data storage unit as a data storage unit, etc. The log data storage unit of the storage unit 33 is used to store the log data acquired from the lane server 4.

[0041] The lane server communication unit 34 is a communication interface for communicating with the lane server 4. For example, the communication interface may be a general one as long as it can communicate with the lane server 4 under the control of the central processing unit 32 and send and receive various information.

[0042] (operation) The operation of the first embodiment will be described below.

[0043] FIG. 5 is a sequence diagram showing a log data collection method according to the first embodiment. 5 shows a case where a first log collection device 301 and a second log collection device 302 are connected to the test management interface device 2. However, FIG. 5 is merely an example, and it goes without saying that the number of log collection devices 3 connected to the test management interface device 2 may be more than two.

[0044] For example, the ETC test control device 1 periodically or at any timing generates a data collection request that requests acquisition of log data. Then, the ETC test control device 1 transmits the generated data collection request to the test management interface device 2, thereby starting the operation of this sequence.

[0045] In step ST101, the central processing unit 22 receives a data collection request through the ETC test control device communication unit 21. The data collection request includes an instruction to acquire log data from the log collection device 3, as described above. The data collection request may include information on parameters that should be updated among the parameters shown in FIG. 3. If the data collection request includes this information, the central processing unit 22 updates the parameters of the log acquisition information stored in the lane server database 231, and stores the updated log acquisition information in the lane server database 231.

[0046] In step ST102, the central processing unit 22 transmits a data collection response. After receiving the data collection request, the central processing unit 22 generates a data collection response including information indicating that log data will be acquired. If the data collection request includes an instruction to update parameters, the data collection response may include information indicating that the parameters have been updated in accordance with the instruction. The central processing unit 22 then transmits the data collection response to the ETC test control device 1 via the ETC test control device communication unit 21.

[0047] In step ST103, the central processing unit 22 acquires a log file. The central processing unit 22 acquires the log file in response to the data collection request. For example, the central processing unit 22 controls the log collection device communication unit 24 to acquire the log file from the first log collection device 301 using FTP communication. The log file includes log data for a period that has not been acquired by the test management interface device 2. Alternatively, if the data collection request includes an instruction to acquire log data for a specific period, the central processing unit 22 acquires a log file including log data in accordance with the instruction. The central processing unit 22 stores the acquired log data in the log file storage unit 232.

[0048] In step ST104, the central processing unit 22 converts the log data into format data, which is data to be used in the ETC test control device 1.

[0049] FIG. 6 is a flowchart illustrating step ST104 in more detail.

[0050] In step ST1041, the central processing unit 22 generates analysis data from the log data.

[0051] FIG. 7 is a diagram showing an example of analysis data generated from log data. For example, the central processing unit 22 generates analysis data including the cumulative number of passing vehicles, the time when the lane server 4 was operating (working hours), the time when it was not operating (non-working hours), etc. from the log data for one day acquired in step ST103. The central processing unit 22 counts the number of passing vehicles in the log data and calculates the cumulative number of passing vehicles. Note that the analysis data generated by the central processing unit 22 is not limited to the above information and may include any data that can be calculated from the log data. For example, the analysis data may include information such as the number of passing vehicles for each vehicle type.

[0052] In step ST1042, the central processing unit 22 acquires weather data. For example, the central processing unit 22 connects to a network via the network communication unit 25 and acquires weather data for a toll gate where the acquired lane server 4 is located. Note that the weather data may be weather data closest to the toll gate.

[0053] FIG. 8 is a diagram showing an example of weather data acquired via a network. As shown in FIG. 8, the weather data includes a toll gate number, a lane number, and weather information. The weather information includes maximum temperature, minimum temperature, precipitation, snowfall, wind direction, maximum wind speed, etc. For example, the central processing unit 22 extracts location information (latitude and longitude) corresponding to the toll gate number and lane number, and acquires weather data in the vicinity of the location information. Note that the weather data may be only obtainable information from the information described above. Of course, the weather data may also include information other than the information described above (for example, advisories and warnings).

[0054] In step ST1043, the central processing unit 22 generates failure data. If the log data contains information about the failed lane server 4, the central processing unit 22 generates the failure data. Note that if the log data does not contain information about the failed lane server 4, step ST1043 may be skipped.

[0055] FIG. 9 is a diagram showing an example of the failure data generated by the central processing unit 22. As shown in FIG. 9, the failure data includes the toll gate number, lane number, failure occurrence date and time, failure recovery date and time, etc. The failure occurrence date and time indicates the date and time when the failure occurred, and the failure recovery date and time indicates the date and time when the failure was recovered from.

[0056] In step ST1044, the central processing unit 22 generates format data. The central processing unit 22 generates format data including analysis data, weather data, and failure data. The format data may be data in a format used by the ETC test control device 1. For example, the central processing unit 22 may convert the format data into a format that can be used by the ETC test control device 1.

[0057] Returning to FIG. 5, in step ST105, the central processing unit 22 converts the format data into a file and stores the file in the log file storage unit 232.

[0058] In step ST106, the central processing unit 22 searches for data. The central processing unit 22 extracts lane servers 4 that require failure prediction from the format data. For example, the central processing unit 22 extracts format data based on the number of vehicles passing through the lane, the operating hours, the weather conditions at the toll gate, and the installation status of the lane. When a predetermined condition is met, such as when the number of vehicles passing through the lane exceeds a predetermined threshold, when the operating hours exceed a predetermined time, or when the temperature at the toll gate exceeds a predetermined temperature, the central processing unit 22 acquires format data that satisfies the condition.

[0059] The conditions may be conditions derived by machine learning based on past failure situations of the lane server 4, or may be conditions determined in advance by the administrator of the test management interface device 2.

[0060] The central processing unit 22 then performs failure prediction on the extracted format data. The failure prediction method may be the same as the normal failure prediction performed by the ETC test control device 1, and therefore a detailed description thereof will be omitted here.

[0061] In one embodiment, failure prediction, which has conventionally been performed by the ETC test control device 1, is performed by the test management interface device 2. Generally, the test management interface device 2 only performs processing such as generating format data and storing this format data in the log file storage unit 232, and has ample processing resources. Therefore, in one embodiment, failure prediction is performed using the test management interface device 2, which has ample processing resources.

[0062] In step ST107, the central processing unit 22 stores the target data in the target data database 233 of the storage unit 23. The central processing unit 22 stores the format data and the prediction result in the target data database 233 as target data.

[0063] In step ST108, the central processing unit 22 notifies the ETC test control device 1 of a data storage completion notification. The central processing unit 22 transmits a data storage completion notification to the ETC test control device communication unit 21, via the ETC test control device communication unit 21, indicating that the target data has been stored in the target data database 233.

[0064] In step ST109, the ETC test control device 1 acquires the target file. For example, the processor of the ETC test control device 1 acquires the target file from the target data database 233 using FTP.

[0065] Steps ST110 to ST118 may be the same as steps ST101 to ST109 except that they are performed on the second log collection device 302. Therefore, redundant explanations will be omitted here.

[0066] In step ST119, the central processing unit 22 acquires data. After collecting log data from all the log collection devices 3, the central processing unit 22 acquires the lane server information stored in the lane server database 231 and the log data and format data stored in the log file storage unit 232.

[0067] In step ST120, the central processing unit 22 executes a machine learning module. The central processing unit 22 executes machine learning using the lane server information, log data, and format data. The method for executing the machine learning may be any common method, and therefore a detailed description thereof will be omitted here.

[0068] In step ST121, the central processing unit 22 updates the parameters. When the lane server 4 to be searched (failure predicted) next is output by machine learning, the central processing unit 22 updates the parameters of the log acquisition information stored in the lane server database 231 (i.e., updates the parameters shown in FIG. 3). For example, the central processing unit 22 derives similar lanes based on the lane server information shown in FIG. 4, the analysis data shown in FIG. 7, the weather data shown in FIG. 8, and the failure data shown in FIG. 9. Then, the central processing unit 22 updates the parameters of the log acquisition information based on the derived similar lanes. That is, the central processing unit 22 updates the parameters so as to acquire log data of the lane server 4 to be searched.

[0069] (Operation and effect of the first embodiment) According to the first embodiment described above, failure prediction and machine learning using format data, etc. are performed by the test management interface device 2. This makes it possible to secure processing resources in the ETC test control device 1. Furthermore, since multiple test management interface devices 2 are connected to the ETC test control device 1, the failure prediction and machine learning processes are distributed, making it possible to reduce the execution time for these processes.

[0070] [Second embodiment] In the first embodiment, an example has been described in which log data is collected from the log collection device 3 in response to a request from the ETC test control device 1. In the second embodiment, an example will be described in which the test management interface device 2 collects log data voluntarily.

[0071] (composition) The configuration of the second embodiment is the same as that of the first embodiment except for the log acquisition information stored in the lane server database 231. Therefore, a duplicated description of the configuration that is the same as that of the first embodiment will be omitted.

[0072] FIG. 10 is a diagram showing an example of log acquisition information stored in the lane server database 231 according to the second embodiment. In the example of FIG. 10, in addition to the information described with reference to FIG. 3, the information includes the timer start time and the log file acquisition interval.

[0073] The timer start time is a parameter that indicates the time to start the timer, i.e., the time to acquire the log data. For example, in Fig. 10, the timer start time is set to 01:00. The timer start time may be set to any time, but may also be set to a late-night time slot when the network is not congested.

[0074] The log file acquisition interval is a parameter that indicates the interval at which a log file is acquired. For example, in Fig. 10, the log file acquisition interval is 24 hours, i.e., every other day.

[0075] (operation) FIG. 11 is a sequence diagram showing a log data collection method according to the second embodiment. 11, similarly to Fig. 5, shows a case where a first log collection device 301 and a second log collection device 302 are connected to a test management interface device 2. However, Fig. 11 is merely an example, and it goes without saying that the number of log collection devices 3 connected to the test management interface device 2 may be more than two.

[0076] For example, the operation of this sequence starts after the test management interface device 2 starts up and establishes a connection with the ETC test control device 1 and the log collection device 3 (the first log collection device 301 and the second log collection device 302). Alternatively, the operation of this sequence may start at any timing determined by the administrator of the test management interface device 2.

[0077] In step ST201, the central processing unit 22 starts a timer based on the timer start time included in the log collection information.

[0078] In step ST202, the central processing unit 22 determines that the timer has timed out. If the log file acquisition interval has been exceeded, the central processing unit 22 determines that the timer has timed out. For example, in the case of the log collection information shown in Fig. 10, the timer is started at 01:00 and is determined to have timed out at 01:00 on the next day.

[0079] Steps ST203 to ST219 may be the same operations as steps ST103 to ST121 described with reference to Fig. 5. Therefore, a duplicated description will be omitted here.

[0080] In step ST220, the central processing unit 22 restarts the timer, resets the timer, and restarts the timer, i.e., the process may return to step ST202.

[0081] (Effects of the second embodiment) According to the second embodiment described above, the test management interface device 2 autonomously collects log data, which eliminates the need for instructions from the ETC test control device 1.

[0082] Furthermore, fault prediction and machine learning using format data, etc., are performed by the test management interface device 2. This makes it possible to secure processing resources in the ETC test control device 1. Furthermore, since multiple test management interface devices 2 are connected to the ETC test control device 1, the fault prediction and machine learning processes are distributed, making it possible to reduce the execution time for these processes.

[0083] [Other embodiments] It should be noted that the present invention is not limited to the above-described embodiment. For example, in the above-described embodiment, for simplicity, an example in which all log data is acquired from the lane server 4 has been described, but only a portion of the log data may be acquired. For example, if a failure is predicted only in a certain device of the lane server 4 as a result of machine learning, the log data of that device may be acquired.

[0084] In short, this invention is not limited to the above-described embodiments, and various modifications can be made in the implementation stage without departing from the spirit of the invention. Furthermore, the embodiments may be implemented in combination as appropriate as possible, and in such cases, the combined effects can be obtained. Furthermore, the above-described embodiments include inventions at various stages, and various inventions can be extracted by appropriately combining the disclosed multiple constituent elements. [Explanation of symbols]

[0085] 1...ETC test control device 2...Test management interface device 21...ETC test control device communication section 22...Central processing unit 23…Storage section 231...Lane server database 232...Log file storage section 233...Target data database 24...Log collection device communication unit 25...Network Communications Department 3, 301, 302...Log collection device 31...Test management interface device communication unit 32...Central processing unit 33...Storage section 34...Lane server communication unit 4...Lane Server

Claims

1. A test management interface device connected to a log collection device that stores log data of the lane server and an ETC test control device, a log collection device communication unit that acquires a log file from the log collection device; a central processing unit that acquires the log data from the log file, converts the log data into format data that is a format used by the ETC test control device, and performs failure prediction for the lane server using the format data; a storage unit that stores target data including the format data and a prediction result of the failure prediction; A test management interface device comprising:

2. a network communication unit connected to a network and configured to acquire weather data in the vicinity of where the lane server is located via the network; the central processing unit generates analysis data by analyzing the log data; the format data includes the analysis data and the meteorological data; 2. The test management interface device of claim 1.

3. The central processing unit extracts failure data contained in the log file, the format data further includes the failure data; 3. The test management interface device of claim 2.

4. the central processing unit extracts, based on a predetermined condition, format data for which the failure prediction needs to be performed from the format data, and performs the failure prediction on the extracted format data.

2. The test management interface device of claim 1.

5. When the target data is stored in the storage unit, the central processing unit controls the ETC test control device communication unit to send a notification indicating that the target data has been stored to the ETC test control device.

2. The test management interface device of claim 1.

6. the central processing unit controls the log collection device communication unit to acquire the log file from the log collection device in response to a data collection request from the ETC test control device; 2. The test management interface device of claim 1.

7. the central processing unit starts a timer, and when it determines that the timer has timed out, controls the log collection device communication unit to acquire the log file from the log collection device.

2. The test management interface device of claim 1.

8. the storage unit further stores lane server information including a parameter indicating how the lane server is installed; the central processing unit performs machine learning based on the lane server information, the log data, and the format data; 2. The test management interface device of claim 1.

9. the storage unit further stores log acquisition information including parameters for acquiring log data; the central processing unit updates parameters included in the log acquisition information based on the results of the machine learning.

9. The test management interface device of claim 8.

10. An information processing method executed by a test management interface device connected to a log collection device that stores log data of a lane server and an ETC test control device, comprising: a log collection device communication unit of the test management interface device acquiring a log file from the log collection device; a central processing unit of the test management interface device acquiring the log data from the log file; The central processing unit converts the log data into format data that is a format used by the ETC test control device; The central processing unit uses the format data to perform failure prediction of the lane server; the central processing unit stores target data including the format data and the prediction result of the failure prediction in a storage unit of the test management interface device; An information processing method comprising:

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