Data Quality
JP2025526394APending Publication Date: 2025-08-13MALVERN PANALYTICAL LTD
Patent Information
- Application Number
- JP2025504312
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-07-25
- Filing Date
- 2023-07-24
- Publication Date
- 2025-08-13
Smart Images

Figure 2025526394000001_ABST
Abstract
A method for automatically identifying data quality issues in background data for laser diffraction particle characterization is provided. The method includes receiving background data corresponding to light intensities measured by each of a plurality of detectors in a laser diffraction based particle size analysis system. A processor is used to automatically determine whether the background data includes at least one artifact indicative of a source of error in the particle size analysis system. If the background data is found to include at least one artifact, an indication is provided that the background data includes at least one artifact. Further, the at least one artifact is classified, and the classification is reported.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Thermal compensation
JP2018059905A