Data Quality

JP2025526394APending Publication Date: 2025-08-13MALVERN PANALYTICAL LTD
View PDF 1 Cites 0 Cited by

Patent Information

Application Number
JP2025504312
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2022-07-25
Filing Date
2023-07-24
Publication Date
2025-08-13

Smart Images

  • Figure 2025526394000001_ABST
    Figure 2025526394000001_ABST
Patent Text Reader

Abstract

A method for automatically identifying data quality issues in background data for laser diffraction particle characterization is provided. The method includes receiving background data corresponding to light intensities measured by each of a plurality of detectors in a laser diffraction based particle size analysis system. A processor is used to automatically determine whether the background data includes at least one artifact indicative of a source of error in the particle size analysis system. If the background data is found to include at least one artifact, an indication is provided that the background data includes at least one artifact. Further, the at least one artifact is classified, and the classification is reported.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Thermal compensation

    JP2018059905A