Method for inspecting glass plates and method for manufacturing sample glass plates for detecting foreign objects.
By applying a hydrophobic treatment to glass surfaces, the method enhances the visibility of foreign matter on clean glass plates, facilitating accurate detection through differential fogging patterns.
JP2026079698APending Publication Date: 2026-05-15NIPPON ELECTRIC GLASS CO LTD
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- NIPPON ELECTRIC GLASS CO LTD
- Filing Date
- 2025-07-30
- Publication Date
- 2026-05-15
AI Technical Summary
Technical Problem
Existing methods struggle to accurately detect foreign matter, particularly transparent lubricants, adhering to glass plates used for display substrates and covers, due to their high wettability which causes water droplets to spread thinly and obscure visibility.
Method used
A hydrophobic treatment is applied to the glass surface to reduce the wettability of clean areas, while maintaining high wettability in areas with foreign matter, allowing water droplets to condense differently and enhance visibility for detection.
Benefits of technology
The method improves the visibility of foreign matter on clean glass surfaces, enabling accurate detection by creating distinct fogging differences between clean and contaminated areas.
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Smart Images
Figure 2026079698000001_ABST
Abstract
Even on a clean glass plate, the visibility of attached foreign matter is enhanced, allowing for accurate detection. [Solution] The glass plate inspection method comprises a hydrophobic treatment step S1 in which a hydrophobic treatment is performed on the main surface Gm of the glass plate G to make the wettability of a clean area Gy where no foreign matter is attached lower than the wettability of a foreign matter area Gx where foreign matter is attached, and a detection step S2 in which, after the hydrophobic treatment step S1, water vapor W is blown onto the main surface Gm of the glass plate G to cause condensation, and the foreign matter area Gx on the main surface Gm is detected.
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