Surface layer measuring device

The surface layer measuring device uses broadband light interference to achieve high-resolution measurement of epithelial tissue thickness, addressing the limitations of conventional imaging methods and enabling early detection of carcinoma in situ.

JP2026086289APending Publication Date: 2026-05-26SAITAMA UNIVERSITY
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
SAITAMA UNIVERSITY
Filing Date
2024-11-14
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Conventional methods such as X-ray CT, MRI, and PET lack sufficient resolution to measure the thickness of epithelial tissue, which is crucial for detecting carcinoma in situ, as it does not appear on the surface but causes structural disturbances at the boundary between the epithelial layer and the subcutaneous layer.

Method used

A surface layer measuring device utilizing broadband light interference to detect surface waves with high resolution, comprising a surface wave detection unit, image generation unit, and surface layer characteristic distribution calculation unit, capable of measuring surface layer characteristics like thickness with micrometer precision.

Benefits of technology

Enables detection of carcinoma in situ by measuring surface wave irregularities with several micrometer resolution, facilitating early-stage cancer diagnosis and assessment.

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Abstract

To provide a high-resolution surface layer measurement device capable of measuring carcinoma in situ. [Solution] The surface layer measuring device according to this disclosure comprises a surface wave detection unit for measuring surface waves generated on the surface of a target to be measured, an image generation unit, and a surface layer characteristic distribution calculation unit. The surface wave detection unit includes a light source unit that forms first light and second light, and a photodetector arranged in one or two dimensions that detects light resulting from the interference of the first light and the second light reflected from the target to be measured. The image generation unit generates an image using the output of the photodetector as pixel values, and the surface layer characteristic distribution calculation unit determines the distribution of the surface layer characteristics of the target to be measured based on the image. The first light and the second light are broadband light.
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