Autosampler system with automated sample container cover removal and sample probe positioning functions.

Abstract

A system and method for removing the sample container cover and positioning the sample probe are provided. [Solution] The autosampler system comprises a z-axis support rotatable around the z-axis of an autosampler deck, a sample probe support structure coupled to the z-axis support, a sample probe support structure configured to hold a sample probe for collecting a fluid-containing sample held in a sample container supported by the autosampler deck, and a sample cap remover coupled to the z-axis support in a position offset from the z-axis in the rotational direction relative to the sample probe support structure, wherein the sample cap remover is configured to lift the cap from the sample container so that the inside of the sample container can be accessed by the sample probe supported by the sample probe support structure.

Description

Technical Field

[0001] [Cross - Reference to Related Applications] This application is a continuation - in - part application under 35 U.S.C. § 120, claiming the benefit of U.S. Application No. 17 / 208,136, filed on March 22, 2021, entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION", and claims the benefit of U.S. Provisional Application No. 62 / 992,334, filed on March 20, 2020, entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION" under 35 U.S.C. § 119(e). This application also claims the benefit of U.S. Provisional Application No. 63 / 057,441, filed on July 28, 2020, entitled "AUTOSAMPLER SYSTEM WITH AUTOMATED SAMPLE CONTAINER COVER REMOVAL AND SAMPLE PROBE POSITIONING" under 35 U.S.C. § 119(e). U.S. Provisional Application Nos. 62 / 992,334 and 63 / 057,441, and U.S. Application No. 17 / 208, are hereby incorporated by reference in their entireties.

Background Art

[0002] In many experimental environments, it is often necessary to analyze a large number of chemical or biochemical samples located within individual sample containers. To streamline such processes, the handling of samples is mechanized. Such mechanized sampling is generally referred to as autosampling and is performed using an automated sampling device, i.e., an autosampler.

Summary of the Invention

[0003] An automated sampling device, or autosampler, is capable of supporting a sample probe on a vertically extending rod, the rod moving the sample probe along or across one or more directions of movement. For example, the sample probe may be coupled to a vertically movable portion of the rod by a probe support arm (sample probe support structure) or other device that moves the probe vertically, thereby allowing the probe to be positioned in and out of sample containers (e.g., tubes or other containers), wash containers, standard chemical containers, diluent containers, etc., on the deck of the autosampler. In other situations, the rod may be rotated to facilitate movement of the probe in a horizontal plane, such as positioning the probe over other sample containers and other containers placed on the deck.

[0004] Autosamplers are used to automate the handling of multiple samples stored in sample containers, such as sample vials, sample tubes, and microtiter wells. If the system is programmed to introduce a sample probe into a sample container, the sample containers may be supported by sample racks on the autosampler's deck to allow various sample containers to be used by the sample probe. An autosampler may have multiple metal mechanical or structural components that move relative to each other to facilitate the movement of one or more probes. As these components begin to wear down (e.g., due to repeated friction-based interactions), metal particles may be released onto the autosampler's deck or into containers positioned around the probe arm. For example, metal particles may accumulate directly in sample containers, on the probe, or in other containers used in the sample preparation process (e.g., washing containers, standard chemical containers, diluent containers, etc.), thereby introducing contaminants into the sample or other fluids. Such contaminants may be detectable through analytical instruments and can distort analytical measurements of samples or other fluids by providing unreliable or inaccurate data. Furthermore, metal mechanical and structural components may be exposed to irritating chemicals present on the autosampler's deck, such as corrosive acids, which could facilitate the release of metal particles through the autosampler's normal operation.

[0005] Holding samples awaiting processing by an autosampler can have potential negative consequences, such as sample loss, contamination risks, or other accuracy risks. The length of time a given sample is held in a sample container typically depends on the time required for the sample handling system to analyze all samples scheduled for analysis before the given sample. If the sample container is open to the surrounding environment (e.g., open top), certain samples may be adversely affected during the waiting period for analysis. For example, part of the sample may evaporate or be lost to the surrounding environment. Contaminants may be introduced into the sample container through the opening. Multiple different sample portions may chemically react, forming precipitates in part of the system or in other sample containers. Alternatively, other results may adversely affect the accuracy of the analysis of the sample's composition. The effects of evaporation can particularly affect small amounts of sample, and even small amounts of loss of solvent or other liquid portions can lead to significant variability in analytical accuracy.

[0006] Accordingly, a system and method for handling a sample held in a closed sample container is disclosed, by automatically removing the cap of the sample container and positioning a sample probe. In one embodiment, the autosampler system includes an automatic sample cap remover and a probe support arm, the autosampler system configured to position the sample cap remover over the sample cap, to temporarily or permanently remove the sample cap from the sample container, and to position the sample probe, held by the probe support arm, inside the sample container to collect (extract) the fluid-containing sample. The sample cap remover may be supported by a z-axis support that moves along a channel in the deck of the autosampler, thereby providing movement along the z axis and rotational motion along the xy plane. In the embodiment, the z-axis support is coupled to the sample cap remover and the probe support arm, respectively. For example, the sample cap remover may be rotationally offset from the probe support arm along the xy plane, so that when the sample cap remover is supporting the sample cap removed from the sample container, the sample cap does not intersect the vertical axis of the sample probe (for example, to avoid interfering with the insertion of the sample probe into the sample container). Other configurations are possible, for example, in which the sample cap remover and the sample probe are arranged substantially vertically.

[0007] Systems and methods for preventing metal particles that may be detected in a sample from being released from an autosampler during sample analysis are also disclosed. In one embodiment, the system includes an inner shuttle magnetically coupled to an outer shuttle configured to support a sample probe. The inner shuttle is enclosed in a tube formed or coated with a chemically inert material (e.g., a fluoropolymer), and the outer shuttle is formed or coated with a chemically inert material (e.g., a fluoropolymer), so that the metal components (features) are not exposed to the external environment during the operation of the autosampler. The inner shuttle moves within the tube, and this movement is transmitted (converted) to the outer shuttle via magnetic coupling, and further transmitted (converted) to the probe support structure. In the embodiment, the tube has surface features (e.g., splines) on its outer surface, and the outer shuttle has corresponding features on its inner surface. The surface features of the tube and the outer shuttle interact to transmit (convert) the rotational motion of the tube to the outer shuttle, and this motion of the outer shuttle is further transmitted (converted) to the probe support structure. Autosamplers facilitate the movement of multiple surfaces of the sample probe without the risk of metal particles being exposed to sample containers or other containers placed on the autosampler's deck.

[0008] In one embodiment, the autosampler comprises, but is not limited to, a z-axis support rotatable about the z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, configured to hold a sample probe for collecting (extracting) a fluid-containing sample held in a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in a position offset rotationally from the z-axis with respect to the sample probe support structure, wherein the sample cap remover is configured to lift the cap from the sample container so that the sample probe supported by the sample probe support structure can access (reach) the inside of the sample container.

[0009] In one embodiment, the autosampler system comprises, but is not limited to, a z-axis support rotatable about the z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, configured to hold a sample probe for collecting (extracting) a fluid-containing sample held in a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support, wherein the sample cap remover includes a clamp portion configured to engage with the outer circumferential surface of the z-axis support; a cover portion configured to cover at least a portion of the clamp portion; and a cap remover support arm extending from the cover portion, angled and rotationally offset from the sample probe support structure in the xy plane, wherein the sample cap remover is configured to lift the cap from the sample container so that the sample probe supported by the sample probe support structure can access (reach) the inside of the sample container. [Brief explanation of the drawing]

[0010] A detailed explanation follows, with reference to the attached drawings. In the following description and drawings, the use of the same reference numerals in different embodiments may indicate similar or identical items (elements).

[0011] [Figure 1A] This is an isometric view of an autosampler probe rail system for preventing metal particles that may be detected in a sample during sample analysis from being released from the autosampler, according to an exemplary embodiment of the present disclosure. [Figure 1B] Figure 1A is an isometric view showing the autosampler probe rail system with the autosampler's support arm moved to a lower position along the z-axis. [Figure 1C]Figure 1A is an isometric view showing the autosampler probe rail system with the support arm rotated around the z-axis. [Figure 2] Figure 1A is a cross-sectional view of a portion of the autosampler probe rail system, seen from the side. [Figure 3] Figure 1A is a partial isometric view showing the inner shuttle of the autosampler probe rail system. [Figure 4] Figure 1A is a partial cross-sectional isometric view showing the magnets supported on the inner shuttle and the magnets supported on the outer shuttle in the autosampler probe rail system. [Figure 5] Figure 1A is a partial cross-sectional view of the associated drive system in the autosampler probe rail system, seen from the side. [Figure 6] Figure 1A is a plan view of the autosampler probe rail system. [Figure 7] Figure 1A is an isometric view showing the support arm of the autosampler probe rail system. [Figure 8] Figure 1A is a partial isometric view of the outer shuttle of the autosampler probe rail system, according to an exemplary embodiment of the present disclosure. [Figure 9] This is an isometric view of an autosampler system, according to an exemplary embodiment of the present disclosure, in which the removal of the sample container cover and the positioning of the sample probe are automated. [Figure 10A] Figure 9 is a plan view of the autosampler system. [Figure 10B] This is a schematic diagram showing a plurality of rails for positioning a sample probe and / or container cover positioning element in an autosampler system, according to an exemplary embodiment of the present disclosure, in which the removal of the sample container cover and the positioning of the sample probe are automated. [Figure 11] This is an isometric cross-sectional view of the sample cap remover of the autosampler system shown in Figure 9, according to an exemplary embodiment of the present disclosure. [Figure 12A]Figure 9 shows an autosampler system according to an exemplary embodiment of the present disclosure, with a cover positioning tool positioned on top of a cover-covered sample container. [Figure 12B] This is a diagram of an autosampler system showing a cover positioning tool removing a cover from a sample container. [Figure 12C] This diagram shows the autosampler system with a cover positioning tool moving the cover out of the vertical axis of the sample probe, indicating that the sample probe has been introduced into the sample container. [Figure 12D] This is a diagram of the autosampler system showing the cover positioning tool positioned on top of the second covered sample container. [Modes for carrying out the invention]

[0012] Referring to Figures 1A to 8, an autosampler probe rail system ("System 100") according to one embodiment of the present disclosure is shown. System 100 is for preventing the release of metallic particles from the autosampler that, without System 100, might be detected in the sample during sample analysis. System 100 generally comprises a probe support arm 102, an outer shuttle 104, an inner shuttle 106, and a z-axis support 108. The probe support arm (sample probe support structure) 102, the outer shuttle 104, and the z-axis support 108 each have a structure formed from or coated with a chemically inert material to prevent exposure of metallic components to the external environment of System 100. This can prevent, for example, the introduction of metallic contaminants into a sample container adjacent to the autosampler or into other fluid containers. For example, the chemically inert material may include, but is not limited to, a fluoropolymer such as polytetrafluoroethylene (PTFE).

[0013] The probe support arm 102 includes a probe support 110. The probe support 110 holds a sample probe and associated tubes for withdrawing (extracting) fluid from, or introducing fluid into, a sample container disposed adjacent to the system 100, such as on the deck of an autosampler system. The probe support arm 102 is coupled to the outer shuttle 104 (e.g., via a friction fit, snap fit, etc.). At this coupling, each of the probe support arm 102 and the outer shuttle 104 defines an opening, and the upper portion 112 of the z-axis support 108 fits (is inserted) into the opening, whereby the probe support arm 102 and the outer shuttle 104 are coupled to the z-axis support 108. For example, the upper portion 112 of the z-axis support 108 has a generally circular shape corresponding to the generally circular openings in each of the probe support arm 102 and the outer shuttle 104. Here, a generally circular shape is shown, but any other shape, including, for example, rectangular, triangular, irregular shapes, etc., may be utilized in the system 100. The probe support arm 102 can be held in place with respect to the z-axis support 108 by a friction fit between the respective structures and a magnetic coupling between the outer shuttle 104 and the inner shuttle 106 disposed within the z-axis support 108. In an embodiment, the probe support arm 102 and the outer shuttle 104, or portions thereof, may be formed as an integral structure.

[0014] The system 100 controls the positioning of the sample probe held by the probe support arm 102 through controlled positioning of the outer shuttle 104 and rotation of the z-axis support 108. For example, FIG. 1B shows the movement of the outer shuttle 104 along the z-axis support 108 (e.g., along the z-axis 114). This movement of the outer shuttle 104 moves the probe support arm 102 through the interaction between the outer shuttle 104 and the inner shuttle 106. FIG. 1C shows the rotational movement of the probe support arm 102 due to rotation of the z-axis support 108, which is further described herein.

[0015] Referring to Figure 2, a cross-section of a system 100 according to an embodiment of the present disclosure is shown. As shown, the z-axis support 108 has an outer tube 200 defining an internal space 202. The inner shuttle 106 is configured to influence the vertical movement of the outer shuttle 104 by passing through the internal space 202. The system 100 can move the inner shuttle 106 within the tube 200 via various mechanisms. These mechanisms include, but are not limited to, linear actuators (e.g., pneumatic actuators) with, for example, push rods, spline screw rails, or combinations thereof. In the illustrated example, the system 100 has a spline screw rail 204 (as shown, for example, in Figures 2 to 5). The spline screw rail 204 has a screw 206 positioned along the z-axis 114 and a structural rail 208 positioned around a portion of the screw 206. The structural rail 208 is fixedly mounted to a base, and the screw 206 is rotatably coupled within the tube 200. For example, system 100 may include a first drive unit (e.g., a pulley drive unit 500 shown in Figure 5) that guides the rotational motion of the screw 206 within the tube 200. The inner shuttle 106 has corresponding threads on its inner surface so as to engage with the threads of the screw 206. When the screw 206 is rotationally driven, the inner shuttle 106 moves vertically along the z-axis 114 within the tube 200 (e.g., through the internal space 202) via the interaction between the corresponding threads described above. Alternatively or additionally, system 100 has a pneumatic actuator for pushing the inner shuttle 106 vertically within the internal space 202. In an embodiment, the inner shuttle 106 defines one or more openings corresponding to the shape of the structural rail 208 so that the structural rail 208 can pass through the openings of the inner shuttle 106 as the inner shuttle 106 moves within the tube 200. For example, the inner shuttle 106 has a "C" shaped opening that fits into the "C" shaped structural rail 208, as shown in the embodiment in Figure 3.

[0016] The outer shuttle 104 and the inner shuttle 106 each have one or more magnets for magnetically coupling these shuttles to each other. Thereby, when the inner shuttle 106 is driven along the z-axis 114 (e.g., by the operation of the spline screw rail 204 and the first drive unit, the operation of a pneumatic actuator, etc.), following this, the outer shuttle 104 performs a corresponding vertical movement along the outer peripheral surface of the z-axis support 108. For example, as shown in the figure, the inner shuttle 106 has two magnets 210 disposed within the outer structure 212 of the inner shuttle 106. The outer structure 212 may include, but is not limited to, a polyvinylidene fluoride (PVDF) material wound around the main body structure 214 of the inner shuttle 106. In the present embodiment, a corresponding thread that meshes with the thread of the screw 206 is formed on the main body structure 214. The magnet 210 has a circular or ring-shaped configuration with an opening at the center through which the structure of the spline screw rail 204 can pass in the illustrated example. For example, the magnet 210 surrounds the z-axis 114 together with the spline screw rail 204 passing through the opening of the magnet 210. The inner shuttle 106 has a spacer structure 216 disposed between the plurality of magnets 210 in the illustrated example. The outer structure 212 and the main body structure 214 can control the separation (distance) between the magnets 210, such as maintaining a substantially uniform distance between the magnets 210 during the operation of the system 100, by pushing each magnet 210 against the spacer structure 216. The magnets 210 are aligned such that the same poles face each other (e.g., such that the same poles face (contact) the spacer structure 216). For example, FIG. 2 shows that the N poles of each magnet 210 face each other across the spacer structure 216 and the S poles are arranged to face away from each other. Alternatively, the S poles of the magnets 210 may be arranged to face each other and the N poles to face away from each other.

[0017] The outer shuttle 104 has corresponding magnets that interact with the magnets 210 of the inner shuttle 106. For example, as shown, the outer shuttle 104 has two corresponding magnets 218 held within the main body structure 220. Similar to the inner shuttle 106, the outer shuttle 104 may have a spacer structure 222 positioned between the multiple magnets 218 within the main body structure 220. In this embodiment, the main body structure 220 has an upper part 224, a lower part 226 coupled to the upper part 224, and a cavity defined between the upper part 224 and the lower part 226 to accommodate the magnets 218 and the spacer structure 222. The upper part 224 and the lower part 226 may be fixed to each other (e.g., by snap-fit) to position the magnets 218 relative to the spacer structure 222. The multiple magnets 218 are aligned so that the same poles face each other. The poles of magnet 218 face the poles of the adjacent magnet 210 on the inner shuttle 106, and these opposing poles are opposite to each other. For example, as shown in Figure 2, the north pole of magnet 218 faces the south pole of magnet 210 (with the tube 200 in between), and the south pole of magnet 218 faces the north pole of magnet 210 (with the tube 200 in between). The opposing poles of magnets 210 and 218 facing each other cause the magnetic field to couple the inner shuttle 106 to the outer shuttle 104, so that the linear motion of the inner shuttle 106 causes the corresponding linear motion of the outer shuttle 104. In the illustrated example, system 100 has two magnets for each of the outer shuttle 104 and the inner shuttle 106, but system 100 is not limited to two magnets, and each shuttle may have fewer or more magnets (for example, depending on the desired attractive force between the shuttles).

[0018] In this embodiment, the tube 200 has surface properties formed on its outer circumferential surface to facilitate the rotational motion of the outer shuttle 104 when the tube 200 is rotated. For example, in the illustrated example, the tube 200 has a plurality of splines 300 oriented longitudinally along the outer circumferential surface of the tube 200. The outer shuttle 104 has surface properties on its inner circumferential surface to interact with the surface properties of the tube 200. For example, in the illustrated example, the outer shuttle 104 has corresponding splines 302 that fit into the gaps between the splines 300 of the tube 200. The surface properties of the tube 200 and the outer shuttle 104 interact to transmit (convert) the rotational motion of the tube 200 to the outer shuttle 104, and further transmit (convert) it to the probe support structure (probe support arm) 102 to rotate the probe support structure (probe support arm) 102 around the z-axis 114. In this embodiment, the tube 200 is rotated through the operation of a second drive unit (e.g., a pulley drive unit 502 shown in Figure 5) to induce rotational motion of the tube 200. For example, the system 100 may have a bushing 504 coupled between a stationary drive base 506 and a rotary drive structure 508. The rotary drive structure 508 is coupled to the pulley drive unit 502 so as to rotate around the z-axis 114 when the pulley drive unit 502 is operating. The tube 200 is coupled to the rotary drive structure 508 and rotates in accordance with the rotary drive structure 508 when the pulley drive unit 502 is operating, thereby rotating the outer shuttle 104 through the interaction of corresponding surface properties (e.g., splines 300, 302) and rotating the probe support structure 102.

[0019] The outer shuttle 104 may be mounted on the z-axis support 108 by positioning the main body structure 220 adjacent to the upper part 112 of the z-axis support 108. In this case, the end 228 of the main body structure 220 housing the magnet 218 is positioned to correspond to the end 230 of the main body structure 214 housing the magnet 210, thereby enabling interaction between the magnetic fields of shuttles 104,106 that magnetically couples the inner shuttle 106 and the outer shuttle 104. The surface properties of the outer shuttle 104 and the tube 200 (e.g., splines 302 and 300, respectively) are such that they can slide adjacent to each other so that the outer shuttle 104 is positioned below the z-axis support 108 until the magnet 218 couples with the magnet 218. In this embodiment, the system 100 has a key structure for orienting the probe support structure 102 in a predetermined direction when installed on the z-axis support 108, thereby providing a specific position for the probe held by the probe support structure 102, for example, for intermittent purposes via rotation of the tube 200. For example, in the example in Figure 6, the tube 200 is provided with a key structure 600 (e.g., a spline having a larger cross-section than the other splines 300), and the outer shuttle 104 is provided with a corresponding key structure 602 (e.g., an opening for receiving the key structure 600). The probe support structure 102 and the outer shuttle 104 also have corresponding key structures to provide a desired orientation of the probe support structure 102 relative to the tube 200. For example, in the illustrated example, the outer shuttle 104 has a key structure 604, and the probe support structure 102 has a corresponding key structure 606 (e.g., an opening for receiving the key structure 604). In this embodiment, the probe support structure 102 is detachably coupled to the outer shuttle 104 so that another probe support structure 102 can be coupled to the outer shuttle 104. Alternatively or additionally, different outer shuttles may be arranged on the z-axis support 108 to introduce different styles of probe support structures onto the z-axis support (for example, to facilitate partition-penetrating probes).

[0020] Referring here to Figures 9 to 12D, System 100 has a configuration example for processing a sample held in a closed sample container by automatically removing the cap of the sample container and positioning the sample probe in order to remove the sample from the sample container following removal of the cap, repositioning the cap, or reconfiguring the cap. System 100 generally comprises a z-axis support 900, a probe support arm (sample probe support structure) 902, and a sample cap remover 904. System 100 coordinates the movements of the z-axis support 900, the sample cap remover 904, and the sample probe 906 held by the probe support arm 902 to position the sample cap remover 904 over a particular sample container with a cap (for example, located on the deck 908 of System 100), or over another structure that encloses a sample within a sample container, remove the cap, or otherwise modify the cap to allow access by the sample probe, introduce the sample probe into the sample to retrieve the sample, optionally replace the cap on the sample container, and reposition the sample cap remover 904 to another sample container to repeat the procedure of removing the cap and retrieving the sample. For example, the sample cap remover 904 may include, but is not limited to, vacuum tweezers for removing the cap by vacuum pressure, a rotary grip structure (for example, for rotating the cap around the screw of the container), a rotary positioning mechanism (for example, for repositioning the cap away from the z-axis), a prong or forceps structure (for example, for friction fitting around the outer circumference of the cap), or a combination thereof. An example of the process for removing and repositioning the sample cap for access to the inside of the sample container by the sample probe 906 is further described herein with reference to Figures 12A to 12D.In the embodiment, the z-axis support 900 and probe support arm 902 correspond to the z-axis support 108 and probe support arm 102 (for example, to facilitate the prevention of metal particle contamination), but the disclosure is not limited to such configurations, and system 100 may include other configurations and structures of the z-axis support 900 and probe support arm 902.

[0021] As shown in Figures 9 and 10A, the probe support arm 902 and the sample cap remover 904 are supported on the same z-axis support 900 and can be translated on the autosampler deck 908 via the channel 910 or rotated around the z-axis by motor operation. In this embodiment, the probe support arm 902 and the sample cap remover 904 are arranged in one or more non-parallel orientations such that they are rotationally offset from each other. For example, the probe support arm 902 and the sample cap remover 904 may be offset from each other along the xy-plane by an angle (indicated as α in Figure 10A). This angle may be selected based on the size of the cap to be removed by the sample cap remover 904. This allows the z-axis support 900 to rotate around the z-axis when the cap is removed from the sample container, shifting the cap along the xy-plane and positioning the sample probe 906 above the open end of the sample container so that the cap does not intersect the vertical axis of the sample probe (for example, so as not to obstruct the insertion of the sample probe into the sample container). In this embodiment, the angle from the z-axis in the xy-plane may be about 5 degrees to about 90 degrees. For example, the angle from the z-axis in the xy-plane may be about 10 degrees to about 35 degrees. A smaller angle can reduce the time it takes for the system 100 to process a given sample, for example, by reducing the movement required to position the probe support arm 902 and the sample cap remover 904.

[0022] Instead of using a single z-axis support, the probe support arm 902 and the sample cap remover 904 may be supported on separate z-axis supports 900. For example, referring to Figure 10B, the probe support arm 902 is supported by a first z-axis support 900A, and the sample cap remover 904 is supported by a second z-axis support 900B, which facilitates the removal of the cap from the sample support on the first portion 1000 of the deck 908. The first z-axis support 900A moves in parallel along the first channel 910A and rotates around the z-axis of the first z-axis support 900A to position the sample probe on the sample container held on the first portion 1000 of the deck 908. The second z-axis support 900B moves in parallel along the second channel 910B and rotates about the z-axis of the second z-axis support 900B to position the sample cap remover 904B on the sample container held on the first portion 1000 of the deck 908. In the illustrated example, a third z-axis support 900C is also provided. The third z-axis support 900C provides another sample cap remover 904C to facilitate the removal of caps from samples supported on the second portion 1002 of the deck 908, by moving in parallel along the third channel 910C and by rotating about the z-axis of the third z-axis support 900C to position the sample cap remover 904C on the sample container held on the second portion 1002 of the deck 908. In this embodiment, the second z-axis support 900B can fully rotate the probe support arm 902 around the z-axis to provide access by the sample probe 906 to the sample container from which the cap has been removed by the sample cap removers 904B, 904C, or by another part of the system 100.

[0023] Referring to Figure 11, in the illustrated embodiment, the sample cap remover 904 comprises a vacuum tweezers structure 1100 supported by a cap remover support arm 1102. The cap remover support arm 1102 fixes the vacuum tweezers structure 1100 to the z-axis support 900. The sample cap remover 904 may also include a clamp portion 1104 that provides a friction fit around the outer surface of the z-axis support 900 (for example, via a clamp fastener 1106), thereby resisting vertical movement of the clamp portion 1104 on the z-axis support 900 or rotational movement of the z-axis support 900. The rotational motion of the z-axis support 900 around the z-axis and the translational motion along the channel 910 are transmitted (converted) to the clamp portion 1104 via the connection between the clamp portion 1104 and the z-axis support 900. The sample cap remover 904 may also include a cover portion 1108 configured to cover at least a portion of the clamp portion 1104 (for example, to prevent the clamp portion 1104 from being exposed to the external environment of the system 100). The cap remover support arm 1102 is provided to extend from the cover portion 1108, thereby allowing the vacuum tweezers structure 1100 to be positioned substantially distal to the clamp portion 1104 when the cover portion 1108 is positioned on the clamp portion 1104. In this embodiment, the cover portion 1108 is positioned on the clamp portion 1104 while allowing vertical movement of the cover portion 1108 relative to the clamp portion 1104 (for example, the top of the cover portion 1108 is engageable with the top of the clamp portion 1104). This facilitates vertical movement of the cap from each sample container (for example, during operation of the vacuum tweezers structure 1100 as described herein).

[0024] The sample cap remover 904 may be provided with one or more spaces through which a fluid tube can pass to introduce vacuum pressure, fluid pressure, or a combination thereof (which may be supplied, for example, from system 100 or from outside the system) into a portion of the sample cap remover 904. In this embodiment, the sample cap remover 904 is provided with a channel 1110 that passes through the cap remover support arm 1102. The channel 1110 is coupled to the vacuum tweezers port (vacuum port) 1112 of the vacuum tweezers structure 1100 to hold a vacuum line for supplying vacuum to the vacuum tweezers structure 1100 through the sample cap remover 904. The vacuum tweezers structure 1100 can then interact with (engage with) a cap held in a sample container, for example, by removing the cap by introducing vacuum into the vacuum tweezers port 1112 and repositioning the cap by stopping the vacuum applied to the vacuum tweezers port 1112. In this embodiment, the sample cap remover (sample cover remover) 904 is provided with a channel 1114 between the clamp portion 1104 and the cover portion 1108, communicating with the channel 1110. This allows the sample cap remover (sample cover remover) 904 to supply a vacuum line through the sample cap remover (sample cover remover) 904 to the vacuum tweezers structure 1100 via channels 1110 and 1114. Alternatively or additionally, the sample cap remover 904 may hold a vacuum line, a fluid line, or a combination thereof within different parts of the body of the sample cap remover 904, on the surface of the sample cap remover, or in combination thereof.

[0025] In this embodiment, the sample cap remover 904 is provided with a space for introducing one or more fluid lines, which introduce pressurized fluid into the sample cap remover 904 for the vertical movement of the cover portion 1108 relative to the clamp portion 1104. This facilitates the removal and repositioning of the cap of the sample container. For example, the sample cap remover 904 may be provided with a channel 1116 (for example, passing through or being defined by the clamp portion 1104). The channel 1116 introduces the fluid line passing through the sample cap remover 904 to a piston port 1118 coupled to a piston in the sample cap remover 904 (for example, housed via one or more of the cover portion 1108 or the clamp portion 1104). In this embodiment, the sample cap remover 904 maintains an elevated position for positioning the vacuum tweezers structure 1100, which is raised above the cap on the sample container (for example, to prevent initial contact between the cap and the vacuum tweezers structure 1100 until the sample cap remover 904 is lowered). When air is applied to the piston port 1118 to lower the vacuum tweezers structure 1100 so that it contacts the cap, the piston can push the cover portion 1108 vertically downward relative to the clamp portion 1104. If no or insufficient fluid pressure is applied to the piston port 1118, for example, when a single-acting piston is included in the sample cap remover 904, a spring can bias the piston to the elevated position. Alternatively, the piston may be provided with a spring that biases the piston to the lowered position, and the fluid pressure pushes the piston, raising the cover portion 1108 to the elevated position when air is applied to the piston port 1118. In this embodiment, a dual-acting piston may be used to bias the sample cap remover to its resting position via fluid pressure.

[0026] The vertical movement of the cover portion 1108 relative to the clamp portion 1104 can provide a distance for lifting the cap from the sample container. This allows the sample cap remover 904 to rotate around the z-axis (e.g., via the rotational movement of the z-axis support 900) without interference between the cap and the sample container, for example, while the cap is moving away from the sample container to provide access to the sample container for the sample probe 906. In this embodiment, the vertical distance for lifting the cap from the sample container is approximately 5 mm to approximately 40 mm. However, the system 100 is not limited to such distances and may include vertical distances of less than approximately 5 mm or more than approximately 40 mm. Furthermore, although the system 100 is described as including a pneumatic piston that provides the above vertical movement, the system 100 is not limited to such a structure. For example, the system 100 may include additional or alternative structures that guide the vertical movement of the sample cap remover 904. In this case, the sample cap remover 904 may include, but is not limited to, a shuttle in a z-axis support 900 magnetically coupled to the sample cap remover 904, a mechanical push rod, a linear drive, a magnetic coupling, a controllable electromagnetic coupling, etc.

[0027] Referring to Figures 12A to 12D, an example of the operation of system 100 is shown in which the probe support arm 902 and the sample cap remover 904 are fixed to a single z-axis support 900, and the sample cap remover 904 has a pneumatic vacuum forceps structure. System 100 is illustrated with multiple sample containers, the internal space of the sample containers being surrounded by caps positioned above the openings at the top of the sample containers. While the samples await processing by the system, the caps can perform multiple functions. For example, (e.g., while the probe is being moved from container to container) the caps can prevent contamination of the samples by preventing chemicals or objects from the environment from being introduced through the openings of the sample containers. The caps can also prevent the evaporation of one or more sample components, such as solvents, sample matrices, or other components. Furthermore, the caps can prevent parts of one sample from interacting (e.g., chemically reacting) with other parts of another sample. For example, the cap can prevent vapors from one container (e.g., holding ammonium hydroxide) from interacting with vapors from another container (e.g., holding hydrofluoric acid) and chemically reacting to form a solid precipitate (e.g., ammonium fluoride crystals) that may coat part of system 100. In the illustrated example, the cap is held in place by its own weight on the sample container, but in some embodiments, the cap may be held in place via a thread, a clip, a gasket, or one or more of other structures.

[0028] As shown in Figure 12A, the system 100 positions a sample cap remover 904 on top of the first sample container 1200, which has a first cap 1202 positioned on top to isolate the fluid sample (fluid-containing sample) held inside the first sample container 1200 from the external environment 1204. The sample cap remover 904 then removes the first cap 1202 from the top of the first sample container 1200 by lifting the first cap 1202 vertically along the z-axis (for example, by pneumatic operation of the sample cap remover 904), as shown in Figure 12B. For example, the system 100 may introduce vacuum into the vacuum tweezers port 1112, introduce the tip of the vacuum tweezers structure 1100 onto the cap, and introduce fluid into the piston port 1118 to grasp and lift the cap from the top of the sample container.

[0029] Next, as shown in Figure 12C, the sample cap remover 904 rotates along the xy plane to reposition the first cap 1202 while the first cap 1202 is held by the sample cap remover 904. For example, the z-axis support 900 rotates around the z axis to reposition the end of the sample cap remover 904 while holding the first cap 1202 and moving the first cap 1202 away from the first sample container 1200 so that the sample probe 906 can access the first sample container 1200. In embodiments where the probe support arm 902 and the sample cap remover 904 are fixed to a single z-axis support 900, the rotational movement of the z-axis support 900 can simultaneously move the probe support arm 902 and the sample cap remover 904, respectively, along the xy plane. For example, when the first cap 1202 is removed from the first sample container 1200, the z-axis support 900 can prepare to introduce the sample probe 906 into the fluid sample (fluid-containing sample) in the first sample container 1200 by positioning the end of the probe support arm 902 over the open container.

[0030] During the rotation of the z-axis support 900 for positioning the sample probe 906, the relative movement of the sample cap remover 904 with respect to the probe support arm 902 causes the sample cap remover 904 to move away from the first sample container 1200 so as not to obstruct access of the sample probe 906 for sample extraction (recovery). For example, as shown in Figure 12C, the sample cap remover 904 is positioned away from the first sample container 1200, and the probe support arm is moved vertically along the z-axis support 900 to introduce the sample probe 906 into the first sample container 1200. The sample probe 906 then extracts (aspirates) the sample from the first sample container 1200 (e.g., via a vacuum acting on the sample probe 906 by a pump or other vacuum source) and is removed from the first sample container 1200 (e.g., via the vertical movement of the probe support arm 902). The system 100 can optionally reposition the first cap 1202 onto the first sample container 1200 (or sample cap storage location) by, for example, rotating the z-axis support 900 and releasing the vacuum in the sample cap remover 904. Then, as shown in Figure 12D, the system 100 positions the sample cap remover 904 on the second sample container 1210 and repeats the same process for another sample. In this embodiment, the system 100 may include a sample rack 1212 that raises the base of the sample container from the deck 908 to a specific height. This can provide access to the underside of the sample container (for example, via a scanning device) or otherwise hold the sample container in place on the deck 908.

[0031] In this embodiment, the sample cap remover 904 may be replaced by, combined with, or provided in addition to, another structure used to access the inside of the sample container. For example, the system 100 may include a sample spiker (sample mixer) having a tube or other fluid handling structure. In this case, a chemical can be introduced into the sample at a specific time, such as a chemical configured to induce a chemical reaction with the sample at a known time before sample analysis.

[0032] [Conclusion] While the above is described using terminology specific to structural features and / or process behavior, it should be understood that the content defined in the attached claims is not necessarily limited to the specific features (configurations) or actions (behaviors) described above. Rather, the specific features (configurations) or actions (behaviors) described above are disclosed merely as exemplary forms for carrying out the claims.

Claims

1. A z-axis support that can rotate around the z-axis of the autosampler deck, A sample probe support structure coupled to the z-axis support, configured to hold a sample probe for collecting a fluid-containing sample held in a sample container supported by the autosampler deck, The system comprises a sample cap remover coupled to the z-axis support, The sample cap remover includes a clamp portion configured to engage with the outer circumferential surface of the z-axis support, a cover portion configured to cover at least a part of the clamp portion, and a cap remover support arm extending from the cover portion, which is angled and offset in the rotational direction from the sample probe support structure in the x-y plane. An autosampler system in which the sample cap remover is configured to lift the cap from the sample container so that the sample probe, supported by the sample probe support structure, can access the inside of the sample container.

2. The autosampler system according to claim 1, wherein the sample cap remover includes a vacuum tweezers structure configured to remove the cap from the sample container by applying a vacuum.

3. The autosampler system according to claim 2, wherein the sample cap remover is provided with a channel for receiving a vacuum line passing through the sample cap remover so as to connect to a vacuum port of the vacuum tweezers structure.

4. The cover portion can be placed on the clamp portion, and The autosampler system according to claim 1, wherein the cover portion is movable relative to the clamp portion in the vertical direction.

5. The autosampler system according to claim 4, wherein the sample cap remover includes a piston configured to provide vertical relative movement of the cover portion with respect to the clamp portion.

6. The autosampler system according to claim 1, wherein the angle is approximately 5 degrees to approximately 90 degrees.

7. An outer shuttle coupled to the outer circumferential surface of the z-axis support, The system further comprises an inner shuttle that is linearly movable within the internal space of the z-axis support, The inner shuttle is magnetically coupled to the outer shuttle so as to transmit the linear movement of the inner shuttle to the outer shuttle. The autosampler system according to claim 1, wherein the sample probe support structure is coupled to the outer shuttle so as to transmit the linear movement of the outer shuttle to the sample probe support structure.

8. A z-axis support that can rotate around the z-axis of the autosampler deck, A sample probe support structure coupled to the z-axis support, configured to hold a sample probe for collecting a fluid-containing sample held in a sample container supported by the autosampler deck, The sample cap remover is coupled to the z-axis support in a position offset from the z-axis in the rotational direction relative to the sample probe support structure, An autosampler system in which the sample cap remover is configured to lift the cap from the sample container so that the sample probe, supported by the sample probe support structure, can access the inside of the sample container.

9. The autosampler system according to claim 8, wherein the sample cap remover includes a vacuum tweezers structure configured to remove the cap from the sample container by applying a vacuum.

10. The autosampler system according to claim 9, wherein the sample cap remover is provided with a channel for receiving a vacuum line passing through the sample cap remover so as to connect to a vacuum port of the vacuum tweezers structure.

11. The sample cap remover includes a clamp part and a cover part, The clamp portion is configured to be coupled to the z-axis support, The autosampler system according to claim 8, wherein the cover portion covers at least a part of the clamp portion.

12. The cover portion can be placed on the clamp portion, and The autosampler system according to claim 11, wherein the cover portion is movable relative to the clamp portion in the vertical direction.

13. The autosampler system according to claim 12, wherein the sample cap remover includes a piston configured to provide vertical relative movement of the cover portion with respect to the clamp portion.

14. The piston is a pneumatic piston having a piston port, The autosampler system according to claim 13, wherein the piston port is configured to receive fluid and to provide the relative vertical movement.

15. The sample cap remover includes a cap remover support arm extending from the cover portion. The autosampler system according to claim 11, wherein the cap remover support arm is angled so as to be offset in the rotational direction from the sample probe support structure in the x-y plane.

16. The autosampler system according to claim 15, wherein the angle is approximately 5 degrees to approximately 90 degrees.

17. The autosampler system according to claim 15, wherein the angle is approximately 10 degrees to approximately 35 degrees.

18. The autosampler system according to claim 8, wherein the sample probe support structure and the sample cap remover are each directly coupled to the z-axis support.

19. An outer shuttle coupled to the outer circumferential surface of the z-axis support, The system further comprises an inner shuttle that is linearly movable within the internal space of the z-axis support, The autosampler system according to claim 8, wherein the inner shuttle is magnetically coupled to the outer shuttle so as to transmit the linear movement of the inner shuttle to the outer shuttle.

20. The autosampler system according to claim 19, wherein the sample probe support structure is coupled to the outer shuttle so as to transmit the linear movement of the outer shuttle to the sample probe support structure.

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