Beam management using backtracking and dithering

Abstract

To provide efficient methods, systems, and devices for determining and selecting beams in a Unified Environment (UE). [Solution] In a wireless communication system, UE115-f determines the best beam using a beam selection procedure and beam selection algorithm based on measurements of one or more beam selection parameters for different layers of the beam, measures the beam selection parameters to select a first layer beam, measures the beam selection parameters of one or more second layer beams corresponding to the first layer beam, and, based on the beam selection parameter measurements, decides to backtrack and select a different first layer beam in order to continue the beam selection procedure, and applies dithering to the initially selected first layer beam to reduce the likelihood that the initially selected first layer beam will be selected again.

Description

Technical Field

[0001] Cross-reference

[0001] This patent application claims the benefit of U.S. Patent Application No. 17 / 084,985, filed Oct. 30, 2020, by Lau et al., entitled "BEAM MANAGEMENT WITH BACKTRACKING AND DITHERING," which is assigned to the assignee of this application and is hereby incorporated by reference in its entirety.

[0002]

[0002] The following relates to wireless communication, including beam management using backtracking and dithering.

Background Art

[0003]

[0003] Wireless communication systems are widely deployed to provide various types of communication content, such as voice, video, packet data, messaging, broadcast, etc. These systems may be able to support communication with multiple users by sharing available system resources (e.g., time, frequency, and power). Examples of such multi-connectivity systems include fourth-generation (4G) systems such as Long-Term Evolution (LTE (registered trademark)) systems, LTE-Advanced (LTE-A) systems, or LTE-A Pro systems, and fifth-generation (5G) systems sometimes referred to as New Radio (NR) systems. These systems may employ techniques such as code division multiple access (CDMA), time division multiple access (TDMA), frequency division multiple access (FDMA), orthogonal frequency division multiple access (OFDMA), or discrete Fourier transform spread orthogonal frequency division multiplexing (DFT-S-OFDM).

[0004]

[0004] A wireless multiple access communication system may include one or more base stations or one or more network access nodes, each simultaneously supporting communication for multiple communication devices, which may in some cases be known as user equipment (UE). In some cases, the UE may use beamforming techniques to communicate with other wireless devices (e.g., additional UEs, base stations, vehicles, satellites, or different wireless devices). An efficient technique for determining and selecting beams in the UE for communication with one or more other wireless devices is desired. [Overview of the project]

[0005]

[0005] The techniques described relate to improved methods, systems, devices, and apparatus for supporting beam management using backtracking and dithering. Generally, the techniques described provide a first wireless device, such as a user equipment (UE), determining the best beam for communication with a second wireless device using a beam selection procedure and a beam selection algorithm based on measurements of one or more beam selection parameters (i.e., the best beam may correspond to the beam for which the best beam selection parameter was measured). For example, a first wireless device may determine a set of first layer beams (for example, a beam for a given layer, which will be described in more detail below, may include several activation elements to generate a beam corresponding to a given layer), and the first wireless device may then use this set of first layer beams (for example, the beam with the widest coverage emission pattern) to receive one or more transmissions (for example, a reference signal) from a second wireless device. The first wireless device may then measure beam selection parameters for each beam in the set of first layer beams based on at least some of the one or more received transmissions, and may select the first beam in the set of first layer beams based on whether the measured beam selection parameter of the first beam is the best value (for example, the highest value with respect to the beam selection parameter, such as a power measurement, or the lowest value with respect to the beam selection parameter, such as a descent energy measurement).

[0006]

[0006] The first wireless device may then determine a set of second layer beams associated with the first beam (for example, the set of second layer beams may be called one or more child beams corresponding to the first beam) and measure beam selection parameters of at least some, if not each, of the set of second layer beams. If each measurement of the beam selection parameter of each beam in the set of second layer beams is worse than the measurement of the beam selection parameter of the first beam, the first wireless device may efficiently backtrack and select a different beam from the set of first layer beams in order to continue the beam selection procedure. Furthermore, in some examples, the first wireless device may apply dithering to the first beam (for example, by intentionally applying a intended amount of noise) after determining that the beam selection parameter of each beam in the set of second layer beams is worse than the measurement of the beam selection parameter of the first beam, thereby reducing the likelihood that the first wireless device will again select the first beam of the set of first layer beams.

[0007]

[0007] One inventive aspect of the subject matter described herein may be implemented in a method for wireless communication in a first wireless device. The method may include receiving one or more signals from a second wireless device on each beam of a plurality of first layer beams; measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device; selecting a first beam of the plurality of first layer beams based on the measurement of the first beam selection parameter, which is measured for each beam of the plurality of first layer beams; measuring a second beam selection parameter for each beam of a plurality of second layer beams associated with the first beam based on the selection of the first beam; and selecting a second beam of the plurality of first layer beams based on the measurement of the first beam selection parameter and the measurement of the second beam selection parameter.

[0008]

[0008] Another inventive aspect of the subject matter described herein may be implemented in an apparatus for wireless communication in a first wireless device. The apparatus may include a processor, a memory communicating electronically with the processor, and instructions stored in the memory. Instructions may be executable by the processor to cause the apparatus to receive one or more signals from a second wireless device on each beam of a plurality of first layer beams set; measure a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device; select a first beam of the plurality of first layer beams set based on the measurement of the first beam selection parameter, which is measured for each beam of the plurality of first layer beams set; measure a second beam selection parameter for each beam of a plurality of second layer beams set associated with the first beam, based on the selection of the first beam; and select a second beam of the plurality of first layer beams set based on the measurement of the first beam selection parameter and the measurement of the second beam selection parameter.

[0009]

[0009] Another inventive aspect of the subject matter described herein may be implemented in another apparatus for wireless communication in a first wireless device. The apparatus may include means for receiving one or more signals from a second wireless device on each beam of a plurality of first layer beams; means for measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device; means for selecting a first beam of a plurality of first layer beams based on the measurement of the first beam selection parameter, which is measured for each beam of a plurality of first layer beams; means for measuring a second beam selection parameter for each beam of a plurality of second layer beams associated with the first beam, based on the selection of the first beam; and means for selecting a second beam of a plurality of first layer beams based on the measurement of the first beam selection parameter and the measurement of the second beam selection parameter.

[0010]

[0010] Another inventive aspect of the subject matter described herein may be implemented in a non-temporary computer-readable medium for storing code for wireless communication in a first wireless device. The code may include instructions executable by a processor to receive one or more signals from a second wireless device on each beam of a plurality of first layer beams set; measure a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device; select a first beam of the plurality of first layer beams set based on the measurement of the first beam selection parameter, which is measured for each beam of the plurality of first layer beams set; measure a second beam selection parameter for each beam of a plurality of second layer beams set associated with the first beam, based on the selection of the first beam; and select a second beam of the plurality of first layer beams set based on the measurement of the first beam selection parameter and the measurement of the second beam selection parameter.

[0011]

[0011] In some examples of the methods, apparatus, and non-temporary computer-readable media described herein, selecting a second beam from a set of multiple first layer beams may include an operation, feature, means, or instruction for selecting a second beam from a set of multiple first layer beams based on a comparison of a set of multiple measurements of the second beam selection parameter of each beam in the set of multiple second layer beams associated with the first beam with a first measurement of the first beam selection parameter of the first beam in the set of multiple first layer beams.

[0012]

[0012] In some examples of the methods, apparatus, and non-temporary computer-readable media described herein, selecting a second beam from a set of multiple first layer beams may include an operation, feature, means, or instruction for selecting a second beam from a set of multiple first layer beams from a range of beam identifiers selected for a beam selection procedure, wherein the selection of the second beam is based on the fact that the second beam is oriented in a different direction from the first beam.

[0013]

[0013] Some examples of methods, apparatus, and non-temporary computer-readable media described herein may further include operations, features, means, or instructions for tuning a first beam by measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, applying an arbitrary signal to add noise to the signal received through the first beam of a set of multiple first layer beams, wherein the second beam of the set of multiple first layer beams may be selected based on the tuning of the first beam.

[0014]

[0014] Some examples of methods, apparatus, and non-transient computer-readable media described herein may further include actions, features, means, or instructions for determining an operability condition for one or more technology operations of a first wireless device, based on a measurement of how one or more technology operations of a first wireless device may be affected by beamforming communications in the same time slot, wherein the selection of a first beam of a plurality of first layer beams, a second beam of a plurality of first layer beams, or both, may be based on the determination of the operability condition.

[0015]

[0015] Some examples of methods, apparatus, and non-temporary computer-readable media described herein may further include operations, features, means, or instructions for determining the battery charge level of a first wireless device, wherein the selection of a first beam of a set of multiple first layer beams, a second beam of a set of multiple first layer beams, or both, may be based on the battery charge level of the first wireless device.

[0016]

[0016] Some examples of methods, apparatus, and non-transient computer-readable media described herein may further include operations, features, means, or instructions for determining latency and link reliability conditions for communicating with a second wireless device, wherein the selection of a first beam from a set of multiple first layer beams, a second beam from a set of multiple first layer beams, or both, may be based on the determination of latency and link reliability conditions for communicating with the second wireless device.

[0017]

[0017] Some examples of methods, apparatus, and non-temporary computer-readable media described herein may further include operations, features, means, or instructions for selecting beams of a set of multiple second layer beams associated with a second beam, measuring a third beam selection parameter for each beam in a set of multiple second layer beams associated with a second beam, based on the selection of a second beam, measuring a first beam selection parameter, and based on the measurement of the third beam selection parameter.

[0018]

[0018] Some examples of methods, apparatus, and non-temporary computer-readable media described herein may further include operations, features, means, or instructions for determining that a set of multiple first layer beams, a set of multiple second layer beams, or both, include a multipath beam, based on the fact that a signal measurement has detected multiple directional beams that fall within each other's ranges.

[0019]

[0019] In some examples of the methods, apparatus, and non-temporary computer-readable media described herein, a plurality of sets of first layer beams, a plurality of sets of second layer beams, or both may be determined based on one or more of machine learning procedures or beam characterization procedures for different multipath conditions or simulated channel models. [Brief explanation of the drawing]

[0020] [Figure 1]

[0020] A diagram showing an example of a wireless communication system that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 2]

[0021] A diagram showing an example of a wireless communication system that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 3A]

[0022] A diagram showing an example of the operation of a beam selection procedure that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 3B] A diagram showing an example of the operation of a beam selection procedure that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 3C] A diagram showing an example of the operation of a beam selection procedure that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 3D] A diagram showing an example of the operation of a beam selection procedure that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 4]

[0023] A diagram showing an example of a flowchart that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 5]

[0024] A diagram showing an example of a dithering technique that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 6A]

[0025] A diagram showing an example of a communication path that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 6B] A diagram showing an example of a communication path that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 7]

[0026] A diagram showing an example of a process flow that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 8]

[0027] A block diagram of a device that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 9] A block diagram of a device supporting beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 10]

[0028] A block diagram of a communications manager supporting beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 11]

[0029] A diagram of a system including a device that supports beam management using backtracking and dithering according to an aspect of the present disclosure. [Figure 12]

[0030] A flowchart illustrating a method for supporting beam management using backtracking and dithering according to aspects of this disclosure. [Figure 13] A flowchart illustrating a method for supporting beam management using backtracking and dithering according to aspects of this disclosure. [Figure 14] A flowchart illustrating a method for supporting beam management using backtracking and dithering according to aspects of this disclosure. [Figure 15] A flowchart illustrating a method for supporting beam management using backtracking and dithering according to aspects of this disclosure. [Figure 16] A flowchart illustrating a method for supporting beam management using backtracking and dithering according to aspects of this disclosure. [Modes for carrying out the invention]

[0021]

[0031] In wireless communication, a user device (UE) (e.g., a first wireless device) may perform a beam selection procedure to determine and select one or more relatively best beams for communication with a wireless device (e.g., a base station, an additional UE, or another wireless device). For example, the UE may first select a first beam from a set of first layer beams (e.g., a broad Layer 1 (L1) beam) based, for example, on a comparison of power measurements between several first layer beams (e.g., from several L1 beams, an L1 beam with a relatively high power measurement may be selected). Based on the selected first layer beam, the UE may determine several higher directivity sub-beams corresponding to the selected first layer beam (e.g., a narrower Layer 2 (L2) beam), and then select one of these narrower sub-beams based on an additional comparison of power measurements of these narrower sub-beams (e.g., from several L2 beams, an L2 beam with the relatively highest power measurement may be selected). The UE may continue this process until the final beam with the highest received power is determined and selected, and then use this final selected beam to communicate with the wireless device. However, if there are multiple first-layer beams with relatively similar power measurements, the UE may initially select an inaccurate beam, thereby directing subsequent child beams associated with this inaccurate beam toward a direction further away from the wireless device, resulting in a suboptimal final beam selection, among other drawbacks.

[0022]

[0032] Various embodiments relate generally to beam selection procedures, and more specifically to the use of backtracking and dithering techniques to determine a beam for communication with a wireless device when the beam selection algorithm determines that the beam selection procedure cannot find the most optimal beam for communication. For example, a UE may first select a first beam from a set of first layer beams (e.g., a broad L1 beam) based on beam selection parameters (e.g., power measurements) measured for at least some, if not each, beam of the first layer beam set. Then, based on having selected the first beam, the UE may then measure beam selection parameters (e.g., the same beam selection parameters, different beam selection parameters) for several child beams (e.g., a narrower L2 beam) associated with the first beam. However, if the measured beam selection parameters for each of the child beams are worse than the beam selection parameters for the first beam, the UE may select a second beam from the first layer beam set and repeat the algorithm until a suitable beam is found (e.g., a beam or combination of beams with the best measured beam selection parameters, such as the highest received power from the base station or the lowest descent energy). In other words, if multiple child beams of the selected beam are determined to be worse than the selected beam (for example, having relatively lower beam selection parameters), the UE may attempt the process again using a different beam than the one initially selected (for example, backtracking).

[0023]

[0033] In some cases, the UE may randomly select a second beam from a set of first layer beams, specifically from a set of beams that are neighbors of the first beam initially selected from the set of first layer beams (e.g., a first option of dithering). Additionally or alternatively, after determining that the child beams of the selected first beam are worse, the UE may add noise to the selected first beam or intentionally select a beam different from the selected first beam using a predetermined algorithm or in a pseudo-random manner (e.g., a second option of dithering), thereby increasing the likelihood that the second beam from the set of first layer beams is different from the first beam initially selected (e.g., the added noise will result in the initially selected first beam having a different radiation pattern, affecting the measured beam selection parameters of the first beam, thereby reducing the likelihood that the first beam could be selected again). Based on these described techniques of backtracking and dithering, the UE may support selecting different branches of the next hierarchy family of beams to move outside the local maximum in an attempt to obtain a global maximum in order to determine the beam for communication with the wireless device.

[0024]

[0034] Certain aspects of the subject matter described herein may be implemented to realize one or more of the following potential benefits. Techniques employed by the described communication devices may provide benefits and extensions to the operation of the communication devices, including determining a more optimal beam in an efficient and effective manner for communication with additional wireless devices. For example, the operation performed by the described communication devices may provide improvements to beam measurements, beam selection procedures, and beam selection algorithms. In some implementations, the operation performed by the described communication devices may increase the likelihood of a more optimal beam for communication with additional wireless devices, by backtracking or applying dithering.

[0025]

[0035] Aspects of this disclosure are initially described in the context of wireless communication systems. Further, aspects of this disclosure are illustrated through additional wireless communication systems, beam selection procedure operations, flowcharts, dithering techniques, communication paths, and process flows. Aspects of this disclosure are further illustrated and described with reference to equipment diagrams, system diagrams, and flowcharts relating to beam management using backtracking and dithering.

[0026]

[0036] Figure 1 shows an example of a wireless communication system 100 that supports beam management using backtracking and dithering according to an aspect of the present disclosure. The wireless communication system 100 may include one or more base stations 105, one or more UEs 115, and a core network 130. In some examples, the wireless communication system 100 may be a Long-Term Evolution (LTE) network, an LTE Advanced (LTE-A) network, an LTE-A Pro network, or a New Radio (NR) network. In some examples, the wireless communication system 100 may support extended broadband communication, ultra-high reliability (e.g., mission-critical) communication, low-latency communication, communication using low-cost and low-complexity devices, or any combination thereof.

[0027]

[0037] Base stations 105 may be distributed across a geographical area to form a wireless communication system 100 and may be devices of different forms or with different capabilities. Base stations 105 and UEs 115 may communicate wirelessly via one or more communication links 125. Each base station 105 may provide a coverage area 110 on which the UEs 115 and base station 105 can establish one or more communication links 125. A coverage area 110 may be an example of a geographical area on which base stations 105 and UEs 115 can support the communication of signals according to one or more radio access technologies.

[0028]

[0038] The UE115 may be distributed throughout the coverage area 110 of the wireless communication system 100, and each UE115 may be stationary, mobile, or both at different times. The UE115 may be devices of different forms or with different capabilities. Several exemplary UE115 are shown in Figure 1. The UE115 described herein may be capable of communicating with various types of devices, such as other UE115, base stations 105, or network equipment (e.g., core network nodes, relay devices, integrated access and backhaul (IAB) nodes, or other network equipment), as shown in Figure 1.

[0029]

[0039] Base stations 105 may communicate with the core network 130, communicate with each other, or both. For example, base stations 105 may interface with the core network 130 through one or more backhaul links 120 (e.g., via S1, N2, N3, or other interfaces). Base stations 105 may communicate with each other over the backhaul links 120 (e.g., via X2, Xn, or other interfaces) either directly (e.g., directly between base stations 105) or indirectly (e.g., via the core network 130), or both. In some examples, the backhaul links 120 may be one or more wireless links, or include them.

[0030]

[0040] One or more of the base stations 105 described herein may include, or be referred to as, a base transceiver station, a radio base station, an access point, a radio transceiver, a node B, an e-node B (eNB), a next-generation node B or giga-node B (either of which may be called a gNB), a home node B, a home e-node B, or other preferred terms.

[0031]

[0041] UE115 may include, or may be referred to as, a mobile device, wireless device, remote device, handheld device, or subscriber device, or any other preferred term, where “device” may also be referred to as a unit, station, terminal, or client, in the examples. UE115 may also include, or may be referred to as, a personal electronic device such as a cellular phone, personal digital assistant (PDA), tablet computer, laptop computer, or personal computer. In some examples, UE115 may include, or may be referred to as, a wireless local loop (WLL) station, an Internet of Things (IoT) device, any Internet of Things (IoE) device, or a machine-type communications (MTC) device, in the examples, which may be implemented in various objects such as equipment, vehicles, meters, etc.

[0032]

[0042] The UE115 described herein may be capable of communicating with other UE115s that may sometimes function as relays, as shown in Figure 1, as well as with various types of devices, including, among other examples, a macro eNB or gNB, a small cell eNB or gNB, or a base station 105 and network equipment including a relay base station.

[0033]

[0043] UE115 and base station 105 may communicate wirelessly with each other via one or more communication links 125 over one or more carriers. The term "carrier" may refer to a set of radio frequency spectrum resources having a defined physical layer structure for supporting communication links 125. For example, a carrier used for communication link 125 may include a portion of a radio frequency spectrum band (e.g., a bandwidth portion (BWP)) operating according to one or more physical layer channels for a given radio access technology (e.g., LTE, LTE-A, LTE-A Pro, NR). Each physical layer channel may carry capture signaling (e.g., synchronization signals, system information), control signaling to coordinate carrier operation, user data, or other signaling. The wireless communication system 100 may support communication with UE115 using carrier aggregation or multi-carrier operation. UE115 may consist of multiple downlink component carriers and one or more uplink component carriers according to a carrier aggregation configuration. Carrier aggregation can be used with both frequency-division duplex (FDD) component carriers and time-division duplex (TDD) component carriers.

[0034]

[0044] In some examples (for instance, in carrier aggregation configurations), a carrier may also have capture signaling or control signaling to coordinate the operation of other carriers. A carrier may be associated with a frequency channel (e.g., an Advanced Universal Mobile Telecommunications System Terrestrial Radio Access (E-UTRA) Absolute Radio Frequency Channel Number (EARFCN)) and may be arranged according to a channel raster for discovery by the UE115. A carrier may operate in a standalone mode where initial capture and connection are performed by the UE115 via the carrier, or it may operate in a non-standalone mode where the connection is anchored using different carriers (e.g., the same or different radio access technologies).

[0035]

[0045] The communication link 125 shown in the wireless communication system 100 may include uplink transmissions from the UE 115 to the base station 105, or downlink transmissions from the base station 105 to the UE 115. The carrier may carry downlink or uplink communications (for example, in FDD mode), or may be configured to carry downlink and uplink communications (for example, in TDD mode).

[0036]

[0046] A carrier may be associated with a specific bandwidth of the radio frequency spectrum, and in some examples, the carrier bandwidth may be referred to as the carrier or the “system bandwidth” of the wireless communication system 100. For example, the carrier bandwidth may be one of several determined bandwidths for the carrier of a particular radio access technology (e.g., 1.4, 3, 5, 10, 15, 20, 40, or 80 megahertz (MHz)). Devices of the wireless communication system 100 (e.g., base station 105, UE 115, or both) may have a hardware configuration that supports communication over a specific carrier bandwidth, or may be configurable to support communication over one of a set of carrier bandwidths. In some examples, the wireless communication system 100 may include a base station 105 or UE 115 that supports simultaneous communication over carriers associated with multiple carrier bandwidths. In some examples, each serviced UE 115 may be configured to operate over a portion (e.g., subband, BWP) or all of the carrier bandwidth.

[0037]

[0047] The signal waveform transmitted on a carrier can consist of multiple subcarriers (for example, using multicarrier modulation (MCM) techniques such as orthogonal frequency division multiplexing (OFDM) or discrete Fourier transform extended OFDM (DFT-S-OFDM). In systems employing MCM techniques, a resource element may consist of one symbol period (e.g., the duration of one modulation symbol) and one subcarrier, where the symbol period and subcarrier interval are inversely related. The number of bits carried by each resource element may depend on the modulation scheme (e.g., the order of the modulation scheme, the coding rate of the modulation scheme, or both). Therefore, the more resource elements the UE115 receives, and the higher the order of the modulation scheme, the higher the data rate of the UE115 can be. Wireless communication resources can refer to a combination of radio frequency spectral resources, temporal resources, and spatial resources (e.g., spatial layers or beams), and the use of multiple spatial layers can further increase the data rate or data integrity for communication with the UE115.

[0038]

[0048] One or more numerologies may be supported for a carrier, where the numerology may include a subcarrier spacing (Δf) and a cyclic prefix. A carrier may be divided into one or more BWPs having the same or different numerologies. In some examples, UE115 may consist of multiple BWPs. In some examples, a single BWP for a carrier may be active at a given time, and communication for UE115 may be limited to one or more active BWPs.

[0039]

[0049] The time interval for base station 105 or UE115 is, for example, T s = 1 / (Δf max ·N f ) can refer to a sampling period of seconds, which can be expressed in multiples of basic time units, where Δf max This can represent the maximum supported subcarrier interval, N fThis may represent the maximum supported Discrete Fourier Transform (DFT) size. The time interval of the communication resources may be organized according to radio frames, each having a specified duration (e.g., 10 milliseconds (ms)). Each radio frame may be identified by a system frame number (SFN) (e.g., ranging from 0 to 1023).

[0040]

[0050] Each frame may contain multiple sequentially numbered subframes or slots, each subframe or slot may have the same duration. In some examples, a frame may be divided into subframes (e.g., in the time domain), and each subframe may be further divided into several slots. Alternatively, each frame may contain a variable number of slots, the number of slots may depend on the subcarrier interval. Each slot may contain several symbol periods (e.g., depending on the length of the cyclic prefix prepared for each symbol period). In some wireless communication systems 100, a slot may be further divided into several minislots, each containing one or more symbols. Except for the cyclic prefix, each symbol period may contain one or more (e.g., N) symbols. f It may include a sampling period of (1) units. The duration of the symbol period may depend on the subcarrier interval or frequency operating bandwidth.

[0041]

[0051] A subframe, slot, minislot, or symbol may be the smallest scheduling unit (e.g., in the time domain) of the wireless communication system 100 and may be called a transmit time interval (TTI). In some examples, the TTI duration (e.g., the number of symbol periods in the TTI) may be variable. Additionally or alternatively, the smallest scheduling unit of the wireless communication system 100 may be dynamically selected (e.g., in a burst of shortened TTIs (sTTIs)).

[0042]

[0052] Physical channels can be multiplexed on a carrier according to various techniques. Physical control channels and physical data channels can be multiplexed on a downlink carrier using, for example, one or more of the following techniques: time-division multiplexing (TDM), frequency-division multiplexing (FDM), or hybrid TDM-FDM. A control region (e.g., a control resource set (CORESET)) for a physical control channel may be defined by several symbolic periods and may extend across the carrier's system bandwidth or a subset of the system bandwidth. One or more control regions (e.g., a CORESET) may be configured for a set of UE115s. For example, one or more of the UE115s may monitor or search for control regions for control information according to one or more search space sets, each search space set may contain one or more control channel candidates in one or more cascaded aggregation levels. An aggregation level for control channel candidates may refer to several control channel resources (e.g., control channel elements (CCEs)) associated with encoded information for a control information format having a given payload size. The search space set may include a common search space set configured to send control information to multiple UE115s, and a UE-specific search space set for sending control information to a specific UE115.

[0043]

[0053] Each base station 105 may provide communication coverage through one or more cells, such as macrocells, small cells, hotspots, or other types of cells, or any combination thereof. The term “cell” may refer to a logical communication entity used for communication with base station 105 (for example, on a carrier) and may be associated with an identifier for distinguishing neighboring cells (for example, a physical cell identifier (PCID), a virtual cell identifier (VCID), or something else). In some examples, a cell may also refer to a geographical coverage area 110 or a portion of geographical coverage area 110 (for example, a sector) on which the logical communication entity operates. Such cells may span from smaller areas (for example, structures, subsets of structures) to larger areas, depending on various factors such as the capabilities of base station 105. For example, a cell may be, in the example, a building, a subset of a building, or external space between or overlapping with geographical coverage areas 110, or include them.

[0044]

[0054] Macrocells generally cover relatively large geographical areas (e.g., a radius of several kilometers) and can enable unrestricted access by UE115s subscribed to the services of a network provider that supports macrocells. Small cells, compared to macrocells, may be associated with low-power base stations 105 and may operate in the same or different (e.g., licensed, unlicensed) frequency bands as macrocells. Small cells may provide unrestricted access to UE115s subscribed to the services of a network provider, or they may provide restricted access to UE115s associated with small cells (e.g., UE115s in limited subscriber groups (CSGs), UE115s associated with users in their homes or offices). Base station 105 may support one or more cells and may also support communication on one or more cells using one or more component carriers.

[0045]

[0055] In some cases, a carrier may support multiple cells, and different cells may be configured according to different protocol types (e.g., MTC, Narrowband IoT (NB-IoT), Enhanced Mobile Broadband (eMBB)) that can provide access to different types of devices.

[0046]

[0056] In some examples, base station 105 is mobile and therefore can provide communication coverage to a moving geographic coverage area 110. In some examples, different geographic coverage areas 110 associated with different technologies may overlap, but different geographic coverage areas 110 may be supported by the same base station 105. In other examples, overlapping geographic coverage areas 110 associated with different technologies may be supported by different base stations 105. The wireless communication system 100 may include, for example, heterogeneous networks in which different types of base stations 105 provide coverage to various geographic coverage areas 110 using the same or different radio access technologies.

[0047]

[0057] The wireless communication system 100 may be configured to support ultra-high reliability communication, low-latency communication, or various combinations thereof. For example, the wireless communication system 100 may be configured to support ultra-high reliability low-latency communication (URLLC) or mission-critical communication. The UE 115 may be designed to support ultra-high reliability functionality, low-latency functionality, or critical functionality (e.g., mission-critical functionality). Ultra-high reliability communication may include private or group communication and may be supported by one or more mission-critical services, such as mission-critical push-to-talk (MCPTT), mission-critical video (MCVideo), or mission-critical data (MCData). Support for mission-critical functionality may include service prioritization, and mission-critical services may be used for public safety or general commercial applications. The terms ultra-high reliability, low-latency, mission-critical, and ultra-high reliability low-latency may be used interchangeably herein.

[0048]

[0058] In some examples, a UE115 may also be able to communicate directly with other UE115s over a device-to-device (D2D) communication link 135 (for example, using peer-to-peer (P2P) or D2D protocols). One or more UE115s utilizing D2D communication may be within the geographical coverage area 110 of the base station 105. Other UE115s in such a group may be outside the geographical coverage area 110 of the base station 105, or otherwise unable to receive transmissions from the base station 105. In some examples, a group of UE115s communicating via D2D communication may utilize a one-to-many (1:M) system where each UE115 transmits to any other UE115 in the group. In some examples, the base station 105 facilitates the scheduling of resources for D2D communication. In other cases, D2D communication occurs between UE115s without the involvement of the base station 105.

[0049]

[0059] In some systems, D2D communication link 135 may be an example of a communication channel, such as a side-link communication channel between vehicles (e.g., UE 115). In some examples, vehicles may communicate using vehicle-to-anything (V2X) communication, vehicle-to-vehicle (V2V) communication, or any combination thereof. Vehicles may signal information about traffic conditions, signal scheduling, weather, safety, emergencies, or any other information relevant to the V2X system. In some examples, vehicles in a V2X system may communicate with roadside infrastructure such as roadside units, or with a network via one or more network nodes (e.g., base station 105) using vehicle-to-network (V2N) communication, or both.

[0050]

[0060] The core network 130 may provide user authentication, access permission, tracking, Internet Protocol (IP) connectivity, and other access, routing, or mobility functions. The core network 130 may be an advanced packet core (EPC) or 5G core (5GC) that includes at least one control plane entity that manages access and mobility (e.g., a Mobility Management Entity (MME), an Access and Mobility Management Function (AMF)) and at least one user plane entity that routes packets or interconnections to the external network (e.g., a Serving Gateway (S-GW), a Packet Data Network (PDN) Gateway (P-GW), or a User Plane Function (UPF)). The control plane entity may manage non-access layer (NAS) functions, such as mobility, authentication, and bearer management, for UE 115 serviced by base station 105 associated with the core network 130. User IP packets may be forwarded through user plane entities that may provide IP address allocation and other functions. A user plane entity may be connected to an IP service 150 for one or more network operators. The IP service 150 may include access to the Internet, an intranet, an IP multimedia subsystem (IMS), or a packet-switched streaming service.

[0051]

[0061] Some of the network devices, such as the base station 105, may include sub-components such as access network entities 140, which may be an example of an access node controller (ANC). Each access network entity 140 may communicate with the UE 115 through one or more other access network transmitting entities 145, which may be called radio heads, smart radio heads, or transmit / receive points (TRPs). Each access network transmitting entity 145 may include one or more antenna panels. In some configurations, the various functions of each access network entity 140 or base station 105 may be distributed across various network devices (e.g., radio heads and ANCs) or integrated into a single network device (e.g., base station 105).

[0052]

[0062] The wireless communication system 100 may typically operate using one or more frequency bands in the range of 300 megahertz (MHz) to 300 gigahertz (GHz). Generally, the region from 300 MHz to 3 GHz is known as the ultra-high frequency (UHF) region or decimeter band, as the wavelengths range from approximately 1 decimeter to 1 meter. While UHF waves may be blocked or redirected by buildings and environmental features, the waves may penetrate structures well enough for a macrocell to serve a UE 115 located indoors. Transmitting UHF waves may be associated with smaller antennas and shorter distances (e.g., less than 100 kilometers) compared to transmitting using lower frequencies and longer waves in the high frequency (HF) or very high frequency (VHF) portions of the spectrum below 300 MHz.

[0053]

[0063] The wireless communication system 100 may also operate in the very high frequency (SHF) region using a frequency band from 3 GHz to 30 GHz, also known as the centimeter band, or in the extremely high frequency (EHF) region of the spectrum (e.g., from 30 GHz to 300 GHz), also known as the millimeter band. In some examples, the wireless communication system 100 may support millimeter-wave (mmW) communication between a UE 115 and a base station 105, where the EHF antennas of each device may be smaller and more closely spaced than UHF antennas. In some examples, this may facilitate the use of antenna arrays within the device. However, the propagation of EHF transmissions may be subject to greater atmospheric attenuation and shorter distances than SHF or UHF transmissions. The techniques disclosed herein may be employed across transmissions using one or more different frequency domains, and the specified use of bands across these frequency domains may vary by country or regulatory body.

[0054]

[0064] The wireless communication system 100 may utilize both licensed and unlicensed radio frequency spectrum bands. For example, the wireless communication system 100 may employ license-assisted access (LAA), unlicensed LTE (LTE-U) radio access technology, or NR technology in unlicensed bands such as the 5 GHz Industrial Scientific Medical (ISM) band. When operating in unlicensed radio frequency spectrum bands, devices such as base station 105 and UE 115 may employ carrier detection for collision detection and avoidance. In some examples, operation in unlicensed bands may be based on a carrier aggregation configuration, along with component carriers operating in licensed bands (e.g., LAA). Operation in unlicensed spectrums may include, among other examples, downlink transmission, uplink transmission, P2P transmission, or D2D transmission.

[0055]

[0065] Base station 105 or UE115 may be equipped with multiple antennas that can be used to employ techniques such as transmit diversity, receive diversity, multiple-input multiple-output (MIMO) communication, or beamforming. The antennas of base station 105 or UE115 may be located within one or more antenna arrays or antenna panels that can support MIMO operation or transmit or receive beamforming. For example, one or more base station antennas or antenna arrays may be collated in an antenna assembly, such as an antenna tower. In some examples, the antennas or antenna arrays associated with base station 105 may be located in diverse geographical locations. Base station 105 may have an antenna array with several rows and columns of antenna ports that base station 105 can use to support beamforming of communication with UE115. Similarly, UE115 may have one or more antenna arrays that can support various MIMO or beamforming operations. As an addition or alternative, an antenna panel may support radio frequency beamforming for signals transmitted through antenna ports.

[0056]

[0066] A base station 105 or UE115 may use MIMO communication to leverage multipath signal propagation and increase spectral efficiency by transmitting or receiving multiple signals through different spatial layers. Such techniques are sometimes called spatial multiplexing. Multiple signals may be transmitted by a transmitting device through different antennas or different combinations of antennas. Similarly, multiple signals may be received by a receiving device through different antennas or different combinations of antennas. Each of the multiple signals may be called a separate spatial stream and may carry bits associated with the same data stream (e.g., the same codeword) or different data streams (e.g., different codewords). Different spatial layers may be associated with different antenna ports used for channel measurement and reporting. MIMO techniques include single-user MIMO (SU-MIMO), in which multiple spatial layers are transmitted to the same receiving device, and multi-user MIMO (MU-MIMO), in which multiple spatial layers are transmitted to multiple devices.

[0057]

[0067] The wireless communication system 100 may be a packet-based network operating according to a layered protocol stack. In the user plane, communication at the bearer or Packet Data Convergence Protocol (PDCP) layer may be IP-based. The Radio Link Control (RLC) layer may perform packet segmentation and reassembly for communication over logical channels. The Medium Access Control (MAC) layer may perform priority handling and multiplexing of logical channels to transport channels. The MAC layer may also use error detection techniques, error correction techniques, or both to support retransmission at the MAC layer to improve link efficiency. In the control plane, the Radio Resource Control (RRC) protocol layer may provide establishment, configuration, and maintenance of RRC connections between the UE 115 and the base station 105 or core network 130, supporting radio bearers for user plane data. At the physical layer, transport channels may be mapped to physical channels.

[0058]

[0068] UE115 and base station 105 may support data retransmission to increase the likelihood that data will be successfully received. Hybrid Automatic Retransmission Request (ARQ) feedback is one technique to increase the likelihood that data will be accurately received on communication link 125. HARQ may include a combination of error detection (e.g., using cyclic redundancy check (CRC)), forward error correction (FEC), and retransmission (e.g., Automatic Retransmission Request (ARQ)). HARQ may improve throughput at the MAC layer under poor radio conditions (e.g., low signal-to-noise conditions). In some examples, a device may support same-slot HARQ feedback, in which the device may provide HARQ feedback in a given slot for data received in the previous symbol within that slot. In other cases, the device may provide HARQ feedback in subsequent slots or according to some other time interval.

[0059]

[0069] Sometimes called spatial filtering, directional transmission, or directional reception, beamforming is a signal processing technique that can be used in a transmitting or receiving device (e.g., base station 105, UE115) to shape or steer an antenna beam (e.g., transmit beam, receive beam) along a spatial path between the transmitting and receiving devices. Beamforming can be achieved by combining signals communicated through the antenna elements of an antenna array such that several signals propagating in a particular orientation relative to the antenna array experience constructive interference and others experience destructive interference. Coordination of signals communicated through antenna elements may include the transmitting or receiving device applying amplitude offset, phase offset, or both to the signals carried through the antenna elements associated with the device. Coordination associated with each antenna element may be defined by a beamforming weight set associated with a particular orientation (e.g., relative to the antenna array of the transmitting or receiving device, or to some other orientation).

[0060]

[0070] The base station 105 or UE 115 may use beam sweeping techniques as part of its beamforming operation. For example, the base station 105 may use multiple antennas or antenna arrays (e.g., antenna panels) to perform beamforming operations for directional communication with the UE 115. Several signals (e.g., synchronization signals, reference signals, beam selection signals, or other control signals) may be transmitted multiple times in different directions by the base station 105. For example, the base station 105 may transmit signals according to different beamforming weight sets associated with different transmission directions. Transmissions in various beam directions may be used to identify the beam direction for subsequent transmission or reception by the base station 105 (e.g., by a transmitting device such as the base station 105, or by a receiving device such as the UE 115).

[0061]

[0071] Some signals, such as data signals associated with a specific receiving device, may be transmitted by the base station 105 in a single beam direction (for example, the direction associated with a receiving device such as UE115). In some examples, the beam direction associated with transmission along a single beam direction may be determined based on signals transmitted in one or more beam directions. For example, UE115 may receive one or more signals transmitted by the base station 105 in different directions and report to the base station 105 indications of the signals received by UE115 at the highest or otherwise acceptable signal quality.

[0062]

[0072] In some examples, transmission by a device (e.g., by base station 105 or UE115) may be performed using multiple beam directions, and the device may use a combination of digital precoding or radio frequency beamforming to generate a composite beam for transmission (e.g., from base station 105 to UE115). UE115 may report feedback indicating precoding weights for one or more beam directions, and the feedback may correspond to a configured number of beams across the system bandwidth or one or more subbands. Base station 105 may transmit reference signals (e.g., cell-specific reference signals (CRS), channel-state information reference signals (CSI-RS)) that can be precoded or amplified. UE115 may provide feedback for beam selection, which may be a precoding matrix indicator (PMI) or codebook-based feedback (e.g., a multi-panel type codebook, a linear combination type codebook, a port selection type codebook). While these techniques have been described in relation to signals transmitted by base station 105 in one or more directions, UE 115 may employ similar techniques for transmitting signals multiple times in different directions (for example, to identify beam directions for subsequent transmission or reception by UE 115) or for transmitting signals in a single direction (for example, to transmit data to a receiving device).

[0063]

[0073] A receiving device (e.g., UE115) may attempt multiple receiving configurations (e.g., directional listening) when receiving various signals from base station 105, such as synchronization signals, reference signals, beam selection signals, or other control signals. For example, a receiving device may attempt multiple receiving directions by receiving through different antenna subarrays, by processing the received signal according to different antenna subarrays, by receiving according to different sets of receive beamforming weights (e.g., different directional listening weight sets) applied to the received signal at multiple antenna elements of an antenna array, or by processing the received signal according to different sets of receive beamforming weights applied to the received signal at multiple antenna elements of an antenna array, any of which may be referred to as "listening" according to different receiving configurations or receiving directions. In some examples, a receiving device may use a single receiving configuration to receive along a single beam direction (e.g., when receiving a data signal). A single receiving configuration can be matched in a beam direction determined based on listening according to different receiving configuration directions (for example, a beam direction determined to have the highest signal intensity, highest signal-to-noise ratio (SNR), or otherwise acceptable signal quality based on listening according to multiple beam directions).

[0064]

[0074] In some cases, beams on the same layer may have the same number of elements activated in the phased array (for example, each layer may contain the same number of antenna elements from the antenna array used to generate the beam for that layer), and therefore, beams on the same layer may have less directivity than beams on higher or subsequent layers that may have more activated elements (for example, a higher number of activated elements may result in more control over how the beam is formed and directed). For example, an L1 beam may have one activated element (for example, one antenna element is used to generate the beam for the L1 beam), while an L2 beam may have two activated elements. In some implementations, a phased array antenna (PAA) with more activated elements may be used to construct a beamforming radiation pattern that has higher directivity than a PAA employing fewer activated elements. Furthermore, beams on different layers may be referred to as parent beams and (one or more) child beams based on the hierarchy of beam bifurcation. A beam on a higher layer (e.g., a second layer or L2 beam) may be called a child beam of a related lower layer beam (e.g., a first layer or L1 beam) when all elements activated in the related lower layer beam can be found in the higher layer beam, where the related lower layer beam may be called the parent beam. The child beam may inherit all elements used to generate the corresponding parent beam.

[0065]

[0075] A wireless device (e.g., UE115 or base station 105) may use a beamfinding algorithm to determine a beam for communication with additional wireless devices (e.g., to select the optimal single beam or multiple beam patterns). For example, a beamfinding algorithm may start with the least directional beam pattern (e.g., a lower-layer beam such as an L1 or L2 beam) and then refine the least directional beam pattern to a more directional beam (e.g., a Layer 3 (L3) or Layer 4 (L4) beam) by comparing the power received from various beamforming patterns. The least directional beam pattern may contain the minimum number of elements excited in the beamforming PAA module. Furthermore, the beam excited with the minimum number of elements may be the parent beam from which all (one or more) child and (one or more) grandchild beams are derived using the same beamforming PAA module.

[0066]

[0076] Each module may contain a “root” parent beam. For example, a first beam may contain a single excitation element to generate the first beam, and each child beam corresponding to this first beam may contain two excitation elements, at least one of which is one of the two excitation elements, and each grandchild beam corresponding to each child beam may contain three excitation elements, at least two of which are used to generate the corresponding child beam of a given grandchild beam. This designation of parent, child, grandchild beams, etc., can be extended to different numbers of activation elements. For example, a beam higher in the beam hierarchy with fewer activation elements is called the parent beam of a beam lower in the beam hierarchy with a higher number of activation elements, and a beam lower in the hierarchy is called a child beam of a beam higher in the hierarchy.

[0067]

[0077] In some cases, when performing a beam selection procedure to determine a beam for communication with a wireless device, the UE115 may be oriented at angles where two or more beams may relate to similar power levels for signals received from the wireless device, resulting in problems using beam search. For example, the UE115 may experience problems based on the fact that the search algorithm utilized by the UE115 is not capable of effectively determining which beam branch is the correct branch based solely on a power comparison of the first layer beam set. If the UE115 then selects the wrong first layer beam, any subsequent higher layer beams (e.g., narrower beams that depend on the first layer beam) may not properly point towards the wireless device. For example, child beam coverage (such as subsequent higher layer coverage) may be within the limits of the corresponding parent beam (e.g., lower layer beam coverage) (e.g., a child beam may contain a narrower beam that falls within the area of ​​a wider parent beam), which means that a child beam may not point outside the parent beam coverage, due to what phase array is used to generate the child beam and how the beam is constructed. If the wrong parent beam is selected, none of its associated child beams may be able to point at the wireless device better than the parent beam. Consequently, if the wrong parent beam is selected by the UE115, the beam selection algorithm may reach a dead end because none of the child beams can receive higher power than the parent beam, and may incorrectly select the parent beam (e.g., the lower level L1 beam).

[0068]

[0078] For example, based on the boundary orientation of UE115, UE115 may receive similar power levels from a wireless device for transmissions from a wireless device at a given angular orientation. In some cases, UE115 may select the first beam based on a slightly higher power level received for the first beam. However, UE115 may inaccurately select a sub-beam corresponding to the first beam, even though a better upper-layer beam could correspond to a different beam. Despite the sub-beam having relatively higher directivity, a sub-beam corresponding to the first beam may have lower power than the first beam (e.g., the corresponding parent beam) because the sub-beam cannot physically "point" at the wireless device. Since multiple sub-beams can come from the same parent beam, searching between sub-beams may not solve this problem of a sub-beam having lower power, and UE115 may be stuck at low power until beam searching is abandoned, resulting in UE115 remaining on a lower-level beam (e.g., L1 or L2 beam).

[0069]

[0079] The wireless communication system 100 may support efficient techniques for determining and selecting the relatively best beam for communication with wireless devices by using backtracking and dithering. For example, if the selected beam is detected to be the wrong beam for the beam selection procedure, the UE 115 may go back to the previous operation to select a beam different from the initially selected beam. After selecting this different beam, the UE 115 may then continue the beam selection procedure by measuring the beam selection parameters of the child beams of the different beam to improve the beam for communication with wireless devices. Furthermore, after detecting that the selected beam is the wrong beam for the beam selection procedure, the UE 115 may apply dithering to the incorrectly selected beam to reduce the likelihood that the same beam will be selected a second time for the beam selection procedure.

[0070]

[0080] Figure 2 shows an example of a wireless communication system 200 that supports beam management using backtracking and dithering according to an aspect of the present disclosure. The wireless communication system 200 may implement an aspect of the wireless communication system 100. For example, the wireless communication system 200 may show an example of wireless communication between a base station 105-a and a UE 115-a, where the base station 105 and UE 115 are respectively represented as described with reference to Figure 1. Furthermore, the base station 105-a and UE 115-a may support beamformed communication, as described with reference to Figure 1, for sending and receiving messages between them. For example, the base station 105-a may use beam 205 to communicate with UE 115-a (i.e., send, receive, or both), and the UE 115-a may use beam 210 to communicate with base station 105-a. In some examples, UE115-a may determine, based on the results of the beam selection algorithm 215, which beam 210 option should be used to communicate with base station 105-a, such as a first beam 210-a or a second beam 210-b.

[0071]

[0081] Using the beam selection algorithm 215, UE115-a may first select one of the beams 210 for communicating with base station 105-a based on the beam selection parameters of a transmission (e.g., a reference signal) received from base station 105-a. For example, base station 105-a may transmit one or more signals using beam 205. UE115-a may then receive signals on both, for example, the first beam 210-a and the second beam 210-b. UE115-a may select one of the beams 210 based on having measured the received power of the signals using both beams 210. In some implementations, UE115-a may select the first beam 210-a based on the fact that its received power measurement is higher than its received power measurement for the signal on the second beam 210-b. Furthermore, beam 210 may include a first layer beam (e.g., the L1 beam) which is the root parent beam with the widest coverage emission pattern, and if UE 115-a does not know where base station 105-a is located when UE 115-a wakes up, the beam selection algorithm 215 may start with these first layer beams.

[0072]

[0082] Subsequently, UE115-a may perform a beam refinement procedure (or subsequent operation of the beam selection procedure using the beam selection algorithm 215) to determine and select a narrower beam corresponding to the first beam 210-a. For example, UE115-a may determine one or more sub-beams (e.g., narrower beams) corresponding to the first beam 210-a and select a sub-beam using beam selection parameters (e.g., received signal power measurement). UE115-a may continue to refine the selected beam until any subsequently identified beam can no longer achieve a better beam selection parameter measurement of the previously measured beam during the search loop time slot of the beam selection procedure, and UE115-a may then use this previously measured beam for communication with base station 105-a. Furthermore, although power measurements are described for beam selection parameters for beam selection algorithm 215, one or more different selection parameters may be used to refine beam 210 for communication with base station 105-a. For example, one or more different selection parameters may include descent energy measurements of how other technologies affect different beams, battery consumption of different beams, latency measurements of different beams, reliability measurements of different beams, or additional parameters.

[0073]

[0083] In some implementations, however, the beam selection parameters (e.g., received signal power measurements) of the first beam 210-a and the second beam 210-b may be similar in magnitude, making it uncertain which beam 210 UE115-a should select. Subsequently, UE115-a may select an incorrect beam 210 based on the similarity of the beam selection parameters for both beams 210, in which case the child beam of the selected beam does not point toward the base station 105-a. For example, if UE115-a selects the first beam 210-a at the start of the beam selection procedure using the beam selection algorithm 215, UE115-a may determine that the child beam is pointing toward a direction away from the base station 105-a based on the fact that the beam selection parameter of the child beam corresponding to the first beam 210-a is worse (e.g., smaller) than the beam selection parameter of the first beam 210-a. In other words, UE115-a may select the wrong beam for the beam selection procedure using the beam selection algorithm, based on the ambiguity of the beam selection parameters between the first beam 210-a and the second beam 210-b. UE115-a may then use a suboptimal beam for communication with base station 105-a by using a subsequent child beam corresponding to the wrong beam (e.g., causing transient performance loss) for the beam selection procedure.

[0074]

[0084] Rather than continuing the beam selection procedure with the wrong beam (e.g., the first beam 210-a), if UE115-a detects that the selected beam is the wrong beam (for example, based on having determined one or more measurements of one or more beam selection parameters), UE115-a may backtrack and return to a previous part of the beam selection procedure to select a different beam to perform the procedure. For example, after selecting the first beam 210-a, UE115-a may measure the beam selection parameters of the child beams of the first beam 210-a and determine that the beam selection parameters for each child beam are worse than the measured beam selection parameters for the first beam 210-a (i.e., the child beams of the first beam 210-a are pointed in a direction that moves them further away from the base station 105-a). Rather than proceeding to use these sub-beams corresponding to the first beam 210-a to improve the beam for communication with base station 105-a, UE115-a may go back and select the second beam 210-b to perform a beam selection procedure using beam selection algorithm 215. This backtracking technique will be described in more detail with reference to Figures 3 and 4.

[0075]

[0085] In some implementations, if UE115-a detects that the first beam 210-a is the wrong beam, and before selecting the second beam 210-b, dithering may be applied to the first beam 210-a to increase the likelihood that the first beam 210-a will not be selected again if UE115-a goes back to perform the beam selection procedure (i.e., dithering may include applying an arbitrary signal or noise to the first beam 210-a to change its beam pattern). In some examples, dithering may allow UE115-a to escape (e.g., get away from) being stuck in a loop searching for the optimal beam, where the same wrong beam is successively selected for the beam selection procedure based on the fact that the measured beam selection parameters of the wrong beam are better than those of the other beams, even though the child beams of the wrong beam are not very optimal for communication. For example, any applied signal or noise can misalign the beam in such a way that the UE115-a moves outside of the bad local maximum in order to obtain the global maximum. This dithering technique will be explained in more detail later in the section, with reference to Figures 4 and 5.

[0076]

[0086] In some implementations, as part of using the beam selection algorithm 215, the UE115-a may detect the amount of desense (e.g., degradation of sensitivity due to increased exposure energy from other mechanisms or wireless technologies operating concurrently with the beam selection algorithm 215) experienced by other systems (e.g., LTE, Global Positioning System (GPS), Wireless Fidelity (Wi-Fi®) protocol) by measuring the signal at different antennas while other systems of the UE115-a are operating. A table of various beam identifiers (IDs) to be avoided may be expanded and stored, for example, in the memory of the UE115-a. The UE115-a may then refer to this table during the beam selection procedure using the beam selection algorithm 215 if other technologies (e.g., LTE, GPS, Wi-Fi) are also used during the beam selection procedure in the same time slot. For example, if GPS is being used while UE115-a is employing beam 210 (e.g., a mmW beam), UE115-a may refer to a beam to be avoided in the table based on one or more beams previously determined to be the relatively strongest violating beam that sensitively suppresses GPS operation. Additionally or alternatively, beam 210 may be interfered with by other technologies, and UE115-a may select a different set of beams or a different antenna array (e.g., PAA) to maintain best performance using beam selection parameters (e.g., throughput, latency, reliability, battery consumption, or different parameters) in the presence of interference from other technologies.

[0077]

[0087] In some implementations, when measuring the amount of desense, UE115-a may use two parent beams to pick up energy from base station 105-a on each beam while other systems are operating, but the amount of desense experienced by a receiver using one of UE115-a's other systems (e.g., a GPS receiver) may differ when the first parent beam is used compared to when the second parent beam is used. For example, when the measured beam selection parameters for using beam selection algorithm 215 include finding a lower desense experience by another system of UE115-a (e.g., GPS), the measurement of the beam selection parameters may be performed on a receiver configured for the other system (e.g., a GPS receiver, not the receiver used for the beam selection procedure).

[0078]

[0088] As an addition or alternative, the UE115-a may measure the current battery consumption for different beam IDs. If the UE115-a then detects a low battery level, any beam characterized as the most power-consuming based on the battery consumption measurement may be prohibited from use (for example, as part of a beam selection procedure or for current communications). For example, during a beam selection procedure using beam selection algorithm 215, the UE115-a may, based on its battery level, verify that its battery level exceeds a certain threshold before selecting which beam 210 should be used from the pool of available beam IDs along with the beam selection procedure. In some implementations, the UE115-a may measure how other factors affect different beam IDs. For example, UE115-a may determine how different beams are affected by extreme environmental conditions such as extreme heat or extreme cold, or how different beams are affected when different UE operating conditions are compromised by different scenarios such as manual handling, when UE115-a is placed in a bag, or when part of UE115-a is damaged (e.g., one PAA module is damaged). In addition to identifying alternative beams to select to mitigate these different factors (including battery consumption), UE115-a may modify other transmission and control methods, such as updating time slots for using beam selection algorithm 215, adjusting hysteresis levels, changing modulation, using different component carriers or resource blocks, and adjusting power levels or maximum power reduction (MPR).

[0079]

[0089] As an addition or alternative, the UE115-a may measure latency and link reliability in a (simulated or real-world) multipath fading environment for different beam IDs. Then, if the UE115-a is involved in mission-critical applications (e.g., V2V, V2X, URLLC), the UE115-a may select a beam based on the measured latency and link reliability to maintain a consistent link. Specifically, the UE115-a may determine a limited subset of available beam IDs (and modulations; note that for mission-critical links, 4-phase-shift keying (QPSK) is preferred over 64-quadrature-amplitude modulation (QAM)) that can be selected for a beam selection procedure using beam selection algorithm 215.

[0080]

[0090] When determining the beam 210 on which to run the beam selection algorithm 215, the UE115-a may use the above criteria (e.g., desensing experience with other systems or technologies, battery consumption, or latency and reliability measurements) or additional criteria. For example, the UE115-a may determine a set of candidate beams for running the beam selection procedure based on one or more of the following: hand gripping, thermal relaxation, or machine learning, or other embodiments. In the hand gripping embodiment, the UE115-a may collect measurements (e.g., electric field (e-field) measurements) for the phantom hand (i.e., various positions where the hand may hold the UE115-a), for computer-simulated fading, and for multipath channel conditions, and the UE115-a may then generate a list of candidate beams to be tested and measured for the beam selection procedure. As an addition or alternative, in the thermal relaxation embodiment, the UE115-a may simulate thermal relaxation scenarios to generate a set of candidate beams that extend beyond the nominal adjacent beam list.

[0081]

[0091] In machine learning embodiments, data collected from offline measurements (e.g., during the design phase of UE115-a or offline training when UE115-a is in training mode) can be used to augment a list of candidate beams, which may include various emulations of various use cases and environmental conditions (e.g., channel models). Alternatively, online learning algorithms such as reinforcement learning (e.g., beam selection algorithm 215) may propose candidate beams on the fly (i.e., during operation). UE115-a may collect training data for determining candidate beams and send this data to base station 105-a. The data may then be trained over the network via base station 105-a, which may send back a model based on the trained data to UE115-a to support UE115-a in determining a set of candidate beams for performing a beam selection procedure (e.g., using beam selection algorithm 215), as described herein.

[0082]

[0092] In some implementations, the beam selection procedure using the beam selection algorithm 215 may always occur continuously at very short time intervals. Furthermore, if the next identified beam corresponding to the previously selected beam (e.g., a lower-layer beam) is found but has a power improvement less than a threshold (e.g., the next identified beam includes an improvement of x decibels (dB) over the previously selected beam, where x dB is a small number and therefore below the threshold), hysteresis can be constructed for the continuous beam selection procedure so that the beam selection algorithm 215 may continue to use the previously selected beam to limit the number of beam switches.

[0083]

[0093] While UE115-a is demonstrated using beam selection algorithm 215 as part of a beam selection procedure to determine the optimal beam for communication with base station 105-a, the described technique may also be used by base station 105-a to determine the optimal beam for base station 105-a, UE115-a, or both, either similarly or alternatively. For example, the described technique may also be applied to coordinate beam usage at base station 105-a, in which case the technique may be performed independently on base station 105-a, on UE115-a, or on both, within the same beam control system. In some implementations, the described beam selection procedure using beam selection algorithm 215 may become more efficient by utilizing beam control on both UE115-a and base station 105-a. Furthermore, backtracking and dithering procedures may similarly be applied on systems that incorporate beams from both UE115-a and base station 105-a together. In other words, a synergistic effect may exist between the beam selection procedures in both UE115-a and base station 105-a, in which UE115-a and base station 105-a may determine beams for themselves, for each other, or for both, and then signal the determined beams to each other.

[0084]

[0094] Furthermore, while the described technique is used to implement a beam selection procedure that starts with lower-layer parent beams and refines those parent beams into more optimal upper-layer child beams, the described technique may also be applicable to different methods of beam selection or beam search. For example, beam selection algorithm 215 may start with more directed beams (such as upper-layer beams or highly directional beams) and proceed downward to broadside lower-layer beams. As an addition or alternative, beam selection algorithm 215 may be used with probabilistic models or other unconventional methods concerning randomized beam selection (for example, probabilistic route selection algorithms for smart vacuum cleaners). In some examples, dithering and backtracking may be beneficial for these various methods.

[0085]

[0095] Figures 3A, 3B, 3C, and 3D illustrate examples of beam selection procedures 300, 301, 302, and 303, respectively, that support beam management using backtracking and dithering according to embodiments of the present disclosure. Beam selection procedures 300, 301, 302, and 303 may be implemented by embodiments of wireless communication systems 100 and 200, or may implement embodiments thereof. For example, beam selection procedures 300, 301, 302, and 303 may include UE115-b and base station 105-b, representing examples of UE115 and base station 105, respectively, as described with reference to Figures 1 and 2. UE115-b may attempt to communicate with base station 105-b on the beam by selecting a first beam from a first set of beams, and then selecting a narrower beam from a second set of beams that corresponds to the selected first beam from the first set of beams. The beams in each set may be selected according to the beam selection algorithm, as explained with reference to Figure 2.

[0086]

[0096] In operation 300, UE115-b may first determine a first set of beams. For example, UE115-b may determine a candidate set of beams for performing the beam selection procedure based on various factors described with reference to Figure 2 (e.g., desensing experience with other systems or technologies, battery consumption, latency and reliability measurements, various operating conditions of UE115-b, thermal relaxation, and machine learning models). In some implementations, various operating conditions of UE115-b may include being held by hand, whether UE115-b is in a bag, atmospheric humidity, foliage shadow, whether UE115-b is a vehicle moving at high speed, whether UE115-b is an exoplanetary satellite in the presence of cosmic rays, whether UE115-b is a damaged UE, or other operating conditions for UE115-b. After a first set of beams (i.e., a candidate set of beams) has been determined, UE115-b may then monitor transmissions from base station 105-b (e.g., reference signals) on each of the beams in the first set of beams. For example, the first set of beams may include a first beam 305-a and a second beam 305-b (e.g., a first layer beam or L1 beam), and UE115-b may use both beams 305 to monitor and receive transmissions from base station 105-b.

[0087]

[0097] Subsequently, in some examples, using a beam selection algorithm, UE115-b may select a first beam 305-a based on measured beam selection parameters (e.g., received signal power measurement, reference signal received power (RSRP) measurement, reference signal intensity indicator (RSSI) measurement, or different beam selection parameters) as part of performing the beam selection procedure. In some examples, the measured beam selection parameters of the first beam 305-a and the measured beam selection parameters of the second beam 305-b may be close to each other, so that it may not be clear to UE115-b which beam 305 is the appropriate beam to perform or continue the beam selection procedure. However, UE115-b may select the first beam 305-a based on the fact that the measured beam selection parameters of the first beam 305-a are at least slightly more optimal than the measured beam selection parameters of the second beam 305-b (e.g., higher for power measurement, lower for descent energy, or another indication that the beam is better suited for communication).

[0088]

[0098] In operation 301, UE115-b may determine a second set of beams to continue the beam selection procedure (e.g., a beam refinement procedure) based on its selection of the first beam 305-a from the first set of beams. For example, the second set of beams may include a first beam 310-a, a second beam 310-b, and a third beam 310-c that fall within the limits (e.g., area) of the first beam 305-a of the first set of beams. In some implementations, the second set of beams may be called a child beam or narrower beam corresponding to the first beam 305-a (e.g., a second layer beam or L2 beam). UE115-b may then measure the beam selection parameters for each beam 310 in the second set of beams corresponding to the first beam 305-a according to the beam selection algorithm. Subsequently, in some cases, UE115-b may determine that the measured beam selection parameters for the first beam 310-a, the second beam 310-b, and the third beam 310-c of the second set of beams are worse (e.g., smaller) than the measured beam selection parameters for the first beam 305-a.

[0089]

[0099] Therefore, UE115-b may determine that the first beam 305-a was misselected (for example, because the measurements for the first beam 305-a and the second beam 305-b are close to each other) based on the fact that the measured beam selection parameters for each beam in the second set of beams are worse than the measured beam selection parameters for the first beam 305-a. That is, the fact that the measured beam selection parameters for each beam in the second set of beams are worse than the measured beam selection parameters for the first beam 305-a may indicate that each beam in the second set of beams is either oriented further away from base station 105-b or is a suboptimal beam for communication with base station 105-b than the measured beam selection parameters for the first beam 305-b shown. Therefore, UE115-b may then backtrack to a different beam in the first set of beams (for example, a different beam that is wider than the first beam 305-a) in order to perform or continue the beam selection procedure according to the beam selection algorithm.

[0090]

[0100] In operation 302, UE115-b may backtrack to the first set of beams based on the measurement of the beam selection parameters of the second set of beams corresponding to the first beam 305-a performed during operation 301 of the beam selection procedure being worse than the measurement of the beam selection parameters of the first beam 305-a. Subsequently, as illustrated, UE115-b may select the second beam 305-b of the first set of beams in order to continue the beam selection procedure. In some examples, UE115-b may make a selection based on the application of dithering to the first beam 305-a, as will be described in more detail with reference to Figure 5. Furthermore, UE115-b may select the second beam 305-b from a set of neighbor beams that corresponds to the initial selection of the first beam 305-a. As an addition or alternative, in some examples, UE115-b may select a second beam 305-b from the first set of beams based on initial measurements of the beam selection parameters for each beam in the first set of beams, or based on a new set of measurements of the beam selection parameters for each beam in the first set of beams (for example, after dithering has been applied).

[0091]

[0101] In operation 303, UE115-b may measure beam selection parameters for each beam in the second set of beams corresponding to the second beam 305-b of the first set of beams. For example, the second set of beams corresponding to the second beam 305-b of the first set of beams may include a first beam 315-a, a second beam 315-b, and a third beam 315-c (for example, a second layer beam or L2 beam corresponding to the second beam 305-b) that fall within the limits (e.g., area) of the second beam 305-b. Based on the measured beam selection parameters for each beam 315 in the second set of beams corresponding to the second beam 305-b, UE115-a may select one of the beams 315 from the second set of beams for communication with base station 105-b. For example, measurements of beam 315 may indicate that the first beam 315-a of the second set of beams is the optimal beam for communication with base station 105-b (i.e., the first beam 315-a is most directly directed towards base station 105-b within the second set of beams).

[0092]

[0102] In some examples, UE115-b may select the first beam 315-a based on the fact that the measured beam selection parameters are more optimal for the first beam 315-a compared to the measured beam selection parameters for the second beam 315-b and the third beam 315-c, and that the measured beam selection parameters for the first beam 315-a are more optimal than the measured beam selection parameters for the second beam 305-b. UE115-b may then use this first beam 315-a for communication with base station 105-b (i.e., terminate the beam selection procedure), or it may determine a third set of beams corresponding to the first beam 315-a in a second set of beams in order to continue the beam selection procedure using the beam selection algorithm.

[0093]

[0103] In some implementations, operations 300, 301, 302, and 303 of the beam selection procedure are used to determine a beam with higher directivity or a higher layer (e.g., beam 315 or a subsequent higher layer beam), but the most optimal beam may be selected by the UE115-b (or a different wireless device) that does not correspond to a higher layer beam. For example, the beam selection algorithm described may be implemented to determine the best beam (or the best set of multiple beams working together) that includes the best measured beam selection parameters, which may not correspond to a beam with higher directivity or a higher layer beam. Thus, the technique described may more generally prevent the UE115-b from getting stuck with a suboptimal beam by using, for example, backtracking and dithering.

[0094]

[0104] Figure 4 shows an example of procedure 400 supporting beam management using backtracking and dithering according to embodiments of the present disclosure. Procedure 400 may be implemented by embodiments of wireless communication systems 100 and 200, or may implement embodiments thereof. For example, UE 115 (or additional wireless devices) may use procedure 400 as part of a beam selection procedure (e.g., as part of beam management) to refine and select a beam for communication with base station 105 (or different wireless devices). Furthermore, procedure 400 may implement a beam selection algorithm as described with reference to Figures 2 and 3.

[0095]

[0105] In 405, UE115 may measure beam selection parameters for one or more beams, such as beam A and beam B, each beam of a first set of beams (e.g., the L1 beam or a different layer, in a first layer). In some examples, beam selection parameters may include power measurements (e.g., maximum power) for each beam. For example, base station 105 may transmit one or more signals received by UE115 on each beam of the first set of beams, and UE115 may then measure the received power of one or more signals on each beam of the first set of beams. UE115 may determine the first set of beams based on signaling from base station 105, or in combination thereof, as described with reference to Figure 2 for determining the candidate set of beams.

[0096]

[0106] In 410, UE115 may determine a first beam (e.g., a first parent beam) as part of performing a beam selection procedure based on the measurements captured in 405. In some examples, the first beam may be an example of an L1 beam. Furthermore, UE115 may determine the first beam based on which beam in the first set of beams has the most optimal measurements of the beam selection parameters (e.g., the highest received power measurement, the lowest descent energy measurement, the lowest battery consumption measurement, the lowest latency measurement, or the highest reliability measurement).

[0097]

[0107] In 415, UE115 may measure beam selection parameters for each beam in a second set of beams corresponding to the beam determined in 410. For example, the second set of beams may include a set of child beams corresponding to the first beam (i.e., the parent beam) determined in 410. In some examples, the second set of beams may be narrower than the first beam determined, and the first beam determined may encompass the area of ​​the second set of beams.

[0098]

[0108] In 415-a, if the measured beam selection parameter for beam A in the first set of beams is greater than the measured beam selection parameter for beam B in the first set of beams, UE115 may measure the beam selection parameter for each beam in the second set of beams corresponding to beam A.

[0099]

[0109] In 415-b, if the measured beam selection parameter for beam A in the first set of beams is worse than the measured beam selection parameter for beam B in the first set of beams, UE115 may measure the beam selection parameter for each beam in the second set of beams corresponding to beam B.

[0100]

[0110] In 420, UE115 may compare the measured beam selection parameters of the determined first beam with the measured beam selection parameters of a second set of beams corresponding to the determined first beam (e.g., child beams).

[0101]

[0111] For example, based on the fact that in 420-a, it was decided in 410 to use beam A from the first set of beams, and in 415-a, beam selection parameters were measured for each beam in the second set of beams corresponding to beam A, UE115 may compare the measured beam selection parameters for each beam in the second set of beams corresponding to beam A with the beam selection parameters measured for beam A in 405.

[0102]

[0112] As an addition or alternative, in 420-b, based on the decision to use beam B of the first set of beams in 410 and the measurement of beam selection parameters for each beam in the second set of beams corresponding to beam B in 415-b, UE115 may compare the measured beam selection parameters for each beam in the second set of beams corresponding to beam B with the beam selection parameters measured for beam B in 405.

[0103]

[0113] In step 425, if the measured beam selection parameter of at least one beam in the second set of beams corresponding to the determined first beam is greater than the measured beam selection parameter of the determined first beam, the UE 115 may continue the beam selection procedure until a beam narrow enough for communication with the base station 105 is found (for example, by performing a subsequent power search). For example, the UE 115 may determine a third set of beams corresponding to the beams in the second set of beams (i.e., the beams in the second set of beams that have the highest measured beam selection procedure) in order to further refine the beam for communication with the base station 105, and perform beam selection procedure measurements for each beam in the third set of beams.

[0104]

[0114] In 425-a, UE115 can continue to improve beam A in subsequent sets of narrower beams by subsequent power searches for each beam in subsequent sets of narrower beams. As an addition or alternative, in 425-b, UE115 can continue to improve beam B in subsequent sets of narrower beams by subsequent power searches.

[0105]

[0115] Additionally or alternatively, in 430, if none of the measured beam selection parameters for a second set of beams corresponding to the determined first beam (e.g., one or more child beams) are greater than the measured beam selection parameters for the determined first beam, UE115 may determine that the wrong first beam was selected. UE115 may then select (e.g., choose) a new parent beam (i.e., a first layer beam) to continue the beam selection procedure.

[0106]

[0116] For example, in 430-a, UE115 may determine that beam A is an inaccurate selection for the beam selection procedure based on the fact that a second set of beams corresponding to beam A (e.g., sub-beams) has lower beam selection parameter measurements than beam A, and UE115 may then select a new beam to perform the beam selection procedure.

[0107]

[0117] As an addition or alternative, in 430-b, UE115 may determine that beam B is an inaccurate selection for the beam selection procedure based on the fact that a second set of beams corresponding to beam B (e.g., child beams) has lower beam selection parameter measurements than beam B, and UE115 may then select a new beam to perform the beam selection procedure. In some examples, UE115 may backtrack to 405 to select a new parent beam from the first set of beams, based on the fact that it has again measured the beam selection parameter for each beam in the first set of beams. As an addition or alternative, UE115 may backtrack to select a different beam from the first set of beams based on an initial set of measurements, and then proceed to 415-a or 415-b to select an alternative to beam A or beam B.

[0108]

[0118] In 435, UE115 may apply dithering to the determined first beam to avoid getting stuck at a local maximum. For example, without dithering, after determining that a second set of beams of the selected beam is worse than the corresponding selected beam, UE115 may get stuck in a loop where it continues to select the same beam over and over for the beam selection procedure based on the fact that the measured beam selection parameter of that beam is better than the other beams in the same set of beams. In some examples, dithering may involve adding arbitrary noise to the initially determined first beam to add randomness and detuning the determined first beam in order to adjust the beam pattern of the determined first beam (for example, by orienting the determined first beam in a different direction, thereby worsening the measured beam selection parameter of the determined first beam).

[0109]

[0119] In other examples, as part of dithering, UE115 may select from a range of pre-selected neighbor beams for a determined first beam and intentionally select a suboptimal beam to continue the beam selection procedure. For example, if the beam ID of the determined first beam is "0", then the neighbors of this determined first beam may have beam IDs "2", "3", "4", "5", and "6". For each beam ID, the beam ID selection for dithering may be chosen based on the beam characterization codebook results. Thus, UE115, which initially selected beam "0" as the determined first beam, may then randomly select one of beam "0's" neighbor beams during backtracking, or select a particular neighbor beam that is suboptimal to beam "0" (e.g., has lower measurements of beam selection parameters). In some examples, additional beam IDs that are not neighbor beams for the determined first beam may be added to the candidate pool of beams available for use for the beam selection procedure to reduce the likelihood of getting stuck in the wrong sub-bifloc. These additional dithering beam IDs can be added to the candidate pool based on measurements of the beam's beam selection parameters.

[0110]

[0120] In some implementations, a neighbor beam may be defined as a beam with peak power pointing adjacent to the original “host” peak angle (e.g., a beam in the same layer with peak power pointing adjacent to a given beam). For example, all beam angles and radiation patterns may be measured in advance in a beam characterization test, where all possible beam patterns are measured at all spherical angles for the wireless device. In some implementations, several radiation patterns for forming a beam may include two or more peaks (e.g., a “Y” shape) and other types of shapes, and the UE115 may determine the corresponding type of beam with these different shapes and different numbers of peaks as part of beam characterization. The resulting characterization results can then be constructed into a codebook containing all beam IDs, along with their respective information such as the peak power angles of the wireless device.

[0111]

[0121] Without backtracking or dithering, the beam selection algorithm described may get stuck at a local maximum when all beams on a “wrong” branch do not receive beam selection parameters that are better measured than the previously selected beam (for example, no child beam has higher power than the parent beam). For example, each time the beam selection procedure is performed, the same parent beam that yields the local maximum (for example, the same beam with the same maximum received power among all beams on the same layer) may be selected.

[0112]

[0122] This same parent beam may have similar power measurements to one or more beams on the same layer, but with at least slightly higher power, received from an additional wireless device (e.g., base station 105). Therefore, when comparing this same parent beam to a different parent beam on the same layer (e.g., the "correct" parent beam), the different parent beam may continue to select the same parent beam, even though, in the hierarchical branching of beams branching from the different parent beam, it could eventually reach the global maximum value child beam (e.g., the child beam with the highest power measurement among all possible conceivable beams). If the beam selection algorithm described cannot escape from the wrong parent branch, the beam selection algorithm may not be able to find the true global maximum in the beam selection procedure (e.g., beam search) and may get stuck with a suboptimal beam. In some implementations, noise applied from the dithering procedure may "escape" beam selection to obtain the global maximum, moving outside of a bad local maximum.

[0113]

[0123] Figure 5 shows an example of a dithering technique 500 that supports beam management using backtracking and dithering according to an embodiment of the present disclosure. The dithering technique 500 may be implemented by embodiments of the wireless communication systems 100 and 200, or may implement embodiments thereof. For example, the dithering technique 500 may include UE115-c and base station 105-c, which may represent examples of corresponding UE115 and base station 105, respectively, as described with reference to Figures 1 to 4. Furthermore, UE115-c may implement the beam selection algorithm described with reference to Figures 2 to 4.

[0114]

[0124] As a first operation of the beam selection procedure, UE115-c may determine a first set of beams, including a first beam 505-a and a second beam 505-b, as described with reference to Figures 2-4. For example, the first beam 505-a and the second beam 505-b may represent examples of a set of parent beams (e.g., a first layer beam) from which UE115-c selects to perform the beam selection procedure. Subsequently, UE115-c may first select the first beam 505-a based on the fact that the measured beam selection parameters of the first beam 505-a are more optimal than the measured beam selection parameters of the second beam 505-b.

[0115]

[0125] If, during the next operation of the beam selection procedure, the beam selection parameters of a second set of beams corresponding to the first beam 505-a (e.g., one or more child beams) are measured, however, UE115-c may determine that the measured beam selection parameters of each beam in the second set of beams are lower than the measured beam selection parameters of the first beam 505-a. Therefore, as illustrated with reference to Figures 2-4, UE115-c may then backtrack and select a different beam from the first set of beams in order to continue the beam selection procedure.

[0116]

[0126] As described with reference to Figure 4, if the measured beam selection parameters for the first beam 505-a remain optimal compared to the measured beam selection parameters for the second beam 505-b, UE115-c may incorrectly select the first beam 505-a again. To prevent UE115-c from incorrectly selecting and remaining at this “local maximum” for selecting the same beam for the beam selection procedure, UE115-c may use embodiments relating to the dithering technique 500 to determine a detuned beam 510 corresponding to the first beam 505-a. For example, the detuned beam 510 could be an example of the first beam 505-a detuned by the detunement process 515.

[0117]

[0127] The detuning process 515 may include applying an auxiliary signal or a different mode to the first beam 505-a in order to generate a detuned beam 510. Thus, the detuned beam 510 may have a different beam pattern than the first beam 505-a based on the dithering and detuning process 515. In some examples, based on the application of a different beam pattern to the first beam 505-a, the detuned beam 510 may be misdirected to point further away from the base station 105-c or pointed in a different direction. For example, as part of the dithering and detuning process 515, the UE 115-c may add or apply random noise to the phase of the antenna array elements that generated the first beam 505-a in order to generate the detuned beam 510. Since the detuned beam 510 can no longer easily point towards base station 105-c based on dithering, UE 115-c may be less likely to select the detuned beam 510 for the beam selection procedure after determining that the first beam 505-a is the wrong beam, based on the fact that the detuned beam 510 has lower beam selection parameter measurements than those initially measured for the first beam 505-a.

[0118]

[0128] Figures 6A and 6B show examples of communication paths 600 and 601 that support beam management using backtracking and dithering according to embodiments of the present disclosure. Communication paths 600 and 601 may be implemented by embodiments of wireless communication systems 100 and 200, or may implement embodiments thereof. For example, communication path 600 may include UE115-d and base station 105-d, which may each represent an example of a corresponding UE115 and base station 105, as described with reference to Figures 1 to 5. Furthermore, communication path 601 may include UE115-e and base station 105-e, which may each represent an example of a corresponding UE115 and base station 105, as described with reference to Figures 1 to 5.

[0119]

[0129] Communication path 600 may represent an example of a line-of-sight (LOS) communication path between UE115-d and base station 105-d. A line-of-sight (LOS) communication path may include the fact that communication between UE115-d and base station 105-d is direct and not reflected from any additional medium. For example, UE115-d and base station 105-d may communicate via a single path 605 (e.g., using their respective beams at each device). Furthermore, UE115-d may use the beam selection algorithm described with reference to Figures 2-5 to identify the strongest path (e.g., the most optimal beam) for communication with base station 105-d. For example, a single path 605 may represent a single narrow, highly directional beam for the LOS path from the viewpoint of UE115-d.

[0120]

[0130] As an addition or alternative, communication path 601 may represent an example of communication between UE115-e and base station 105-e via a multipath. For example, a single path 605 (e.g., LOS path) as shown in Figure 6A may be blocked or interfered with by an obstacle 610 (e.g., a beamformed transmit may be susceptible to being blocked by physical obstacles that prevent the beamformed transmit from passing through). The UE115-c and base station 105-c may then communicate via a multipath consisting of multiple reflections 620 of the beamformed transmit, such as a first reflection 620-a and a second reflection 620-b reflecting from surface 615.

[0121]

[0131] In such cases where a direct path (i.e., a LOS path) is blocked, the UE115-e may decide to enter a multipath mode to accept multiple paths of signals with similar intensity, based on whether there are multiple directional beams with similar signal intensity. In this multipath mode, the UE115-e may decide that a lower level, less narrow beam, or beam pointed away from base station 105-e may be better than a narrow, highly directional beam pointed towards base station 105-e. In some cases, the UE115-e may accept different child beams from multiple different parent beams. Furthermore, the UE115-e may select a different pool of beam candidates for the beam selection procedure when a multipath condition is detected (as opposed to a pool of beam candidates for a single path 605, a direct path, or a LOS path, for example). For example, in the case of multipath, the UE115-e may use different beam selection procedures, including on-call machine learning characterization and off-call UE beam characterization in different multipath conditions or different simulated channel modeling.

[0122]

[0132] In some implementations, the UE115-e may include a multipath beam component 625 for performing beam search optimized for multipath scenarios (i.e., no LOS path) using machine learning for on-the-fly updates during online operation, as well as simulation and UE characterization (e.g., if the phantom hand holds the device in various ways, but not limited to these cases). For example, the multipath beam component 625 may communicate with various components and processors within the UE115-e to identify the beam to be used in a multipath scenario, and may store the optimal multipath beam within the UE115-e (e.g., in memory on the UE115-e).

[0123]

[0133] Figure 7 shows an example of a process flow 700 that supports beam management using backtracking and dithering according to an aspect of the present disclosure. In some examples, the process flow 700 may be implemented by or be implemented by aspects of wireless communication systems 100 and 200. For example, the process flow 700 may include base stations 105-f and UE 115-f, which may represent examples of corresponding base stations 105 and UE 115, respectively, as described above with reference to Figures 1 to 6B.

[0124]

[0134] In the following description of process flow 700, the operations between UE115-f and base station 105-f may be transmitted in a different order than the exemplary order shown, or the operations performed by UE115-f and base station 105-f may be performed in a different order or at different times. Also, some operations may be omitted from process flow 700, or other operations may be added to process flow 700. While it is shown that UE115-f and base station 105-f perform some operations in process flow 700, it should be understood that any wireless device may perform the operations shown. For example, base station 105-f may similarly perform the operations shown in process flow 700 as part of a beam search or beam selection procedure.

[0125]

[0135] In 705, UE115-f may receive one or more signals from a wireless device (e.g., base station 105-f) on each beam of the first layer beam set. In some examples, UE115-f may determine the first layer beam set in order to perform a beam selection procedure.

[0126]

[0136] In 710, the UE115-f may measure one or more first beam selection parameters for one or more signals as part of a beam selection procedure for communicating with a wireless device, wherein one or more first beam selection parameters are measured for each beam in a set of first layer beams, in some examples.

[0127]

[0137] In 715, the UE115-f may determine operability conditions for one or more technical operations based on measurements of how one or more technical operations of the UE115-f are affected by beamforming communications in the same time slot, where selecting a first beam of a first set of first layer beams, a second beam of a first set of first layer beams, or both, is based on the determination of operability conditions. In some examples, one or more technical operations may include, among other examples, operations using a radio access technology different from the radio access technology used to communicate by the wireless device (e.g., LTE communication), operations using GPS, or operations using the Wi-Fi protocol.

[0128]

[0138] As an addition or alternative, the UE115-f may determine its battery charge level, in which the selection of the first beam of the first set of first layer beams, the second beam of the first set of first layer beams, or both, is based on the battery charge level of the UE115-f. In some examples, the UE115-f may determine the latency and link reliability conditions for communication by wireless devices, in which the selection of the first beam of the first set of first layer beams, the second beam of the first set of first layer beams, or both, is based on the determination of the latency and link reliability conditions for communication by wireless devices.

[0129]

[0139] In 720, UE115-f may select a first beam from a first set of layer beams based on its measurements. For example, UE115-f may select a first beam based on the fact that a measurement of the first beam selection parameter is higher (e.g., more optimal) for the first beam compared to a measurement of the first beam selection parameter for other beams in the first set of layer beams. In 725, UE115-f may receive a second set of signals from a wireless device on one or more beams of a second set of layer beams associated with the first beam.

[0130]

[0140] In 730, UE115-f may measure a second beam selection parameter for each beam in a second set of layer beams associated with the first beam, based on the selection of the first beam. Subsequently, in some examples, UE115-f may determine that the first beam selection of the first set of layer beams for the beam selection procedure results in one or more subsequent beams that are unsuitable for communicating with the wireless device, based on the fact that the set of measured values ​​of the second beam selection parameter for each beam in the second set of layer beams associated with the first beam is worse (e.g., smaller) than the first measured value of the first beam selection parameter for the first beam. In some examples, the first set of layer beams may include a set of L1 beams, and the second set of layer beams may include a set of L2 beams corresponding to the L1 beams in the set of L1 beams. Furthermore, the first beam selection parameter, the second beam selection parameter, or both may include a received signal power measurement.

[0131]

[0141] In some examples, the first set of layer beams, the second set of layer beams, or both may include LOS beams. Additionally or alternatively, the first set of layer beams, the second set of layer beams, or both may include multipath beams. For example, UE115-f may determine the first set of layer beams, the second set of layer beams, or both based on the fact that the first set of layer beams, the second set of layer beams, or both are multipath beams, in which measuring the first beam selection parameter and measuring the second beam selection parameter are based on having determined the first set of layer beams, the second set of layer beams, or both in order to perform the beam selection procedure.

[0132]

[0142] In some examples, the UE115-f may determine that a first set of layer beams, a second set of layer beams, or both are multipath beams based on the fact that signal measurements detect multiple directional beams that fall within each other's range. Furthermore, the first set of layer beams, the second set of layer beams, or both may be determined based on one or more of different multipath conditions or machine learning procedures or beam characterization procedures for simulated channel models.

[0133]

[0143] In 735, UE115-f may adjust the first beam of a first layer beam set by measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, applying an arbitrary signal to add noise to the signal received through the first beam (e.g., dithering), in which case the second beam of the first layer beam set is selected based on the adjustment of the first beam. In some examples, adjusting the first beam of a first layer beam set may include changing the beam pattern of the first beam (e.g., the first beam oriented in a different direction, having a different shape, or causing another effect on the first beam).

[0134]

[0144] In 740, UE115-f may select a second beam in a first layer beam set based on having measured a first beam selection parameter and a second beam selection parameter (for example, backtracking of a first layer beam set to a second beam). For example, UE115-f may select a second beam in a first layer beam set based on comparing a set of measured values ​​of the second beam selection parameter for each beam in the second layer beam set associated with the first beam with a first measured value of the first beam selection parameter for the first beam in the first layer beam set. In some examples, UE115-f may select a second beam in a first layer beam set based on the fact that a set of measured values ​​of the second beam selection parameter for each beam in the second layer beam set is worse (for example, smaller) than a first measured value of the first beam selection parameter for the first beam. As an addition or alternative, the UE115-f may select a second beam from a set of first layer beams from a range of beam IDs selected for the beam selection procedure, wherein the selection of the second beam is based on the fact that the second beam is oriented in a different direction from the first beam (e.g., dithering).

[0135]

[0145] In some examples, after backtracking and selecting the second beam from the first set of layer beams, the UE115-f may measure a third beam selection parameter for each beam in the second set of layer beams associated with the second beam, based on the selection of the second beam. The UE115-f may then select beams in the second set of layer beams associated with the second beam, based on the measurement of the first beam selection parameter and the measurement of the third beam selection parameter. For example, the UE115-f may select beams in the second set of layer beams associated with the second beam based on a first comparison of a first measurement of the first beam selection parameter of the second beam of the first set of layer beams with a set of measurements of the third beam selection parameter for each beam in the second set of layer beams associated with the second beam, and a second comparison of each measurement of the set of measurements of the third beam selection parameter for each beam in the second set of layer beams associated with the second beam. In some examples, selecting a beam for a second set of layer beams associated with a second beam is based on the fact that the measured value of the third beam selection parameter for the beam in the second set of layer beams associated with the second beam is optimal (e.g., higher) than the measured value of the first beam selection parameter for the second beam, and that the measured value of the third beam selection parameter for the beam is the most optimal (e.g., highest) value for the second set of layer beams associated with the second beam.

[0136]

[0146] In 745, UE115-f may iteratively or recursively perform the operation of process flow 700 to determine the optimal beam for communication with base station 105-f. For example, the beam selection procedure may be performed continuously with very short time gaps and with a hysteresis limit (e.g., 2 dB better than the previously selected or current beam), where any beams found whose beam selection measurement exceeds the hysteresis limit may be selected as new beams. That is, UE115-f may continuously perform the beam selection procedure and select a different beam when the measured beam selection parameter of a child beam or a different beam is sufficiently better than the measured beam selection parameter of the corresponding parent beam or the previously selected beam.

[0137]

[0147] Figure 8 shows a block diagram of device 805 supporting beam management using backtracking and dithering according to an aspect of the present disclosure. Device 805 may be an example of an aspect of the UE 115 or base station 105 described herein (e.g., a first wireless device). Device 805 may include a receiver 810, a transmitter 815, and a communications manager 820. The communications manager 820 may be implemented at least in part by a modem and / or a processor. Each of these components may communicate with one another (e.g., via one or more buses).

[0138]

[0148] Receiver 810 may provide means for receiving information such as packets, user data, control information, or any combination thereof, related to various information channels (e.g., control channels, data channels, information channels related to beam management using backtracking and dithering). The information may be passed to other components of device 805. Receiver 810 may utilize a single antenna or a set of multiple antennas.

[0139]

[0149] Transmitter 815 may provide means for transmitting signals generated by other components of device 805. For example, transmitter 815 may transmit information such as packets related to various information channels (e.g., control channels, data channels, information channels related to size-based neural network selection for autoencoder-based communication), user data, control information, or any combination thereof. In some examples, transmitter 815 may be collated with receiver 810 in the transceiver configuration. Transmitter 815 may utilize a single antenna or a set of multiple antennas.

[0140]

[0150] The communication manager 820, receiver 810, transmitter 815, or various combinations thereof or various components thereof may be examples of means for implementing various aspects of beam management using backtracking and dithering as described herein. For example, the communication manager 820, receiver 810, transmitter 815, or various combinations thereof or components thereof may support a method for implementing one or more of the functions described herein.

[0141]

[0151] In some examples, the communications manager 820, the receiver 810, the transmitter 815, or various combinations or components thereof may be implemented in hardware (for example, in communications management circuits). The hardware may include a processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof, configured or otherwise supported as means for performing the functions described herein. In some examples, a processor and memory coupled to the processor may be configured to perform one or more of the functions described herein (for example, by the processor executing instructions stored in the memory).

[0142]

[0152] As an addition or alternative, in some examples, the communications manager 820, receiver 810, transmitter 815, or various combinations or components thereof may be implemented in code executed by a processor (for example, as communications management software or firmware). When implemented in code executed by a processor, the functions of the communications manager 820, receiver 810, transmitter 815, or various combinations or components thereof may be implemented by a general-purpose processor, DSP, central processing unit (CPU), ASIC, FPGA, or any combination thereof or other programmable logic device (for example, configured as a means for performing or otherwise supporting the functions described herein).

[0143]

[0153] In some examples, the communications manager 820 may be configured to use or otherwise cooperate with the receiver 810, the transmitter 815, or both to perform various operations (e.g., receiving, monitoring, transmitting). For example, the communications manager 820 may receive information from the receiver 810, send information to the transmitter 815, or be integrated with the receiver 810, the transmitter 815, or both to receive information, transmit information, or perform various other operations described herein.

[0144]

[0154] The communication manager 820 may support wireless communication in a first wireless device in accordance with examples disclosed herein. For example, the communication manager 820 may be configured as a means for receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams, or otherwise support this. The communication manager 820 may be configured as a means for measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device, and the first beam selection parameter may be measured for each beam of the set of multiple first layer beams. The communication manager 820 may be configured as a means for selecting a first beam of the set of multiple first layer beams based on the measurements, or otherwise support this. The communication manager 820 may be configured as a means for measuring a second beam selection parameter for each beam of a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The communication manager 820 may be configured, or otherwise support, for selecting a second beam from a set of multiple first layer beams based on having measured a first beam selection parameter and a second beam selection parameter.

[0145]

[0155] By including or configuring a communications manager 820 according to the examples described herein, device 805 (e.g., a processor controlling a receiver 810, a transmitter 815, a communications manager 820, or a combination thereof, or otherwise coupled to them) may support techniques for more efficient use of communications resources. For example, based on measurements of beam selection parameters, device 805 may determine the optimal beam for communication with another wireless device.

[0146]

[0156] Figure 9 shows a block diagram of device 905 supporting beam management using backtracking and dithering according to an aspect of the present disclosure. Device 905 may be an example of an aspect of device 805 or UE 115 or base station 105 described herein (e.g., a first wireless device). Device 905 may include a receiver 910, a transmitter 915, and a communications manager 920. Device 905 may be implemented at least in part by a modem and / or a processor. Each of these components may communicate with one another (e.g., via one or more buses).

[0147]

[0157] The receiver 910 may provide means for receiving information such as packets, user data, control information, or any combination thereof, related to various information channels (e.g., control channels, data channels, information channels related to beam management using backtracking and dithering). The information may be passed to other components of device 905. The receiver 910 may utilize a single antenna or a set of multiple antennas.

[0148]

[0158] The transmitter 915 may provide means for transmitting signals generated by other components of device 905. For example, the transmitter 915 may transmit information such as packets related to various information channels (e.g., control channels, data channels, information channels related to size-based neural network selection for autoencoder-based communication), user data, control information, or any combination thereof. In some examples, the transmitter 915 may be collated with the receiver 910 in the transceiver configuration. The transmitter 915 may utilize a single antenna or a set of multiple antennas.

[0149]

[0159] Device 905, or various components thereof, may be examples of means for implementing various aspects of beam management using backtracking and dithering as described herein. For example, the communications manager 920 may include a signaling component 925, a first layer beam selection parameter component 930, a first layer beam selection component 935, a second layer beam selection parameter component 940, a backtracking component 945, or any combination thereof. The communications manager 920 may be an example of an aspect of the communications manager 820 as described herein. In some examples, the communications manager 920, or various components thereof, may be configured to perform various operations (e.g., receiving, monitoring, transmitting) using or in other ways with the receiver 910, the transmitter 915, or both. For example, the communications manager 920 may receive information from the receiver 910, send information to the transmitter 915, or be integrated with the receiver 910, the transmitter 915, or both, in order to receive information, transmit information, or perform various other operations as described herein.

[0150]

[0160] The communication manager 920 may support wireless communication in the first wireless device in accordance with the examples disclosed herein. The signaling component 925 may be configured as a means for receiving one or more signals from the second wireless device on each beam of a plurality of first layer beam sets. The first layer beam selection parameter component 930 may be configured as a means for measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device, and the first beam selection parameter may be measured for each beam of the plurality of first layer beam sets. The first layer beam selection component 935 may be configured as a means for selecting a first beam of the plurality of first layer beam sets based on the measurements, and may be supported by other means. The second layer beam selection parameter component 940 may be configured as a means for measuring a second beam selection parameter for each beam of a plurality of second layer beam sets associated with the first beam, based on the selection of the first beam. The backtracking component 945 may be configured as a means for selecting a second beam from a set of multiple first layer beams based on the measurement of a first beam selection parameter and a second beam selection parameter, or it may support this in other ways.

[0151]

[0161] Figure 10 shows a block diagram of a communications manager 1020 supporting beam management using backtracking and dithering according to an aspect of this disclosure. Communications manager 1020 may be an example of communications manager 820, communications manager 920, or both, as described herein. Communications manager 1020, or various components thereof, may be an example of means for implementing various aspects of beam management using backtracking and dithering as described herein. For example, communications manager 1020 may include a signaling component 1025, a first layer beam selection parameter component 1030, a first layer beam selection component 1035, a second layer beam selection parameter component 1040, a backtracking component 1045, a dithering component 1050, a beam selection component 1055, a beam selection procedure continuation component 1060, a first layer beam determination component 1065, a multipath beam component 1070, or any combination thereof. Each of these components may communicate with one another directly or indirectly (for example, via one or more buses).

[0152]

[0162] The communication manager 1020 may support wireless communication in the first wireless device in accordance with the examples disclosed herein. The signaling component 1025 may be configured as a means for receiving one or more signals from the second wireless device on each beam of a plurality of first layer beam sets. The first layer beam selection parameter component 1030 may be configured as a means for measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device, and the first beam selection parameter may be measured for each beam of the plurality of first layer beam sets. The first layer beam selection component 1035 may be configured as a means for selecting a first beam of the plurality of first layer beam sets based on the measurements, and may be supported by other means. The second layer beam selection parameter component 1040 may be configured as a means for measuring a second beam selection parameter for each beam of a plurality of second layer beam sets associated with the first beam, based on the selection of the first beam. The backtracking component 1045 is configured as a means for selecting a second beam from a set of multiple first layer beams based on the measurement of a first beam selection parameter and a second beam selection parameter, or it may support this in other ways.

[0153]

[0163] In some examples, to support the selection of a second beam from a set of multiple first layer beams, the backtracking component 1045 may be configured, or otherwise support, for selecting a second beam from a set of multiple first layer beams based on a comparison of a set of multiple measurements of the second beam selection parameter of each beam in the set of multiple second layer beams associated with the first beam with a first measurement of the first beam selection parameter of the first beam in the set of multiple first layer beams.

[0154]

[0164] In some examples, selecting a second beam from a set of multiple first layer beams is based on the fact that a set of multiple measurements of the second beam selection parameter for each beam in the set of multiple second layer beams is worse (e.g., smaller) than a first measurement of the first beam selection parameter for the first beam.

[0155]

[0165] In some examples, to support the selection of a second beam from a set of multiple first layer beams, the dithering component 1050 is configured as a means for selecting a second beam from a set of multiple first layer beams from a range of beam identifiers selected for a beam selection procedure, or otherwise supports it, and the selection of the second beam may be based on the fact that the second beam is oriented in a different direction from the first beam.

[0156]

[0166] In some examples, the dithering component 1050 may be configured as a means for tuning the first beam by measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, applying an arbitrary signal to add noise to the signal received through the first beam of a set of multiple first layer beams, or it may support this in other ways, in which the second beam of the set of multiple first layer beams is selected based on the tuning of the first beam.

[0157]

[0167] In some examples, adjusting the first beam of a set of multiple first layer beams involves changing the beam pattern of the first beam.

[0158]

[0168] In some examples, the beam selection component 1055 may be configured, or otherwise support, for determining operability conditions for one or more technical operations of a first wireless device based on measurements of how one or more technical operations of a first wireless device are affected by beamforming communications in the same time slot, wherein the selection of a first beam from a set of multiple first layer beams, a second beam from a set of multiple first layer beams, or both, is based on the determination of the operability conditions.

[0159]

[0169] In some examples, one or more technical operations include operations using a different radio access technology than the radio access technology used to communicate with a second wireless device, operations using a Global Positioning System, or operations using the Wireless Fidelity Protocol.

[0160]

[0170] In some examples, the beam selection component 1055 may be configured as a means for determining the battery charge level of a first wireless device, or may otherwise support it, wherein the selection of a first beam from a set of multiple first layer beams, a second beam from a set of multiple first layer beams, or both, is based on the battery charge level of the first wireless device.

[0161]

[0171] In some examples, the beam selection component 1055 is configured as a means for determining latency and link reliability conditions for communicating with a second wireless device, or can otherwise support this, where selecting a first beam from a set of multiple first layer beams, a second beam from a set of multiple first layer beams, or both, is based on determining latency and link reliability conditions for communicating with the second wireless device.

[0162]

[0172] In some examples, the beam selection procedure continuation component 1060 may be configured as a means for measuring a third beam selection parameter for each beam in a set of multiple second layer beams associated with the second beam, based on the selection of the second beam. In some examples, the beam selection procedure continuation component 1060 may be configured as a means for selecting beams in a set of multiple second layer beams associated with the second beam, based on the measurement of a first beam selection parameter and the measurement of a third beam selection parameter, or may be configured as a means for selecting beams in a set of multiple second layer beams associated with the second beam, based on the measurement of a first beam selection parameter and the measurement of a third beam selection parameter.

[0163]

[0173] In some examples, the beam selection procedure continuation component 1060 may be configured, or otherwise support, as a means for selecting a beam of a set of multiple second layer beams associated with a second beam, based on a first comparison of a first measurement of a first beam selection parameter of a second beam of a set of multiple first layer beams associated with the second beam with a set of multiple measurements of a third beam selection parameter of each beam in the set of multiple second layer beams associated with the second beam, and based on a second comparison of each measurement of a set of multiple measurements of a third beam selection parameter of each beam in the set of multiple second layer beams associated with the second beam.

[0164]

[0174] In some examples, selecting a beam for a second set of layer beams associated with a second beam is based on the fact that the measured value of the third beam selection parameter for the beam in the second set of layer beams associated with the second beam is optimal (e.g., higher) than the measured value of the first beam selection parameter for the second beam, and that the measured value of the third beam selection parameter for the beam is optimal (e.g., highest value) for the second set of layer beams associated with the second beam.

[0165]

[0175] In some examples, the backtracking component 1045 may be configured, or otherwise support, for determining that the selection of a first beam from a set of multiple first layer beams for a beam selection procedure results in one or more subsequent beams that are unsuitable for communicating with a second wireless device, based on the fact that a set of multiple measurements of a second beam selection parameter for each beam of a set of multiple second layer beams associated with a first beam is smaller than a first measurement of a first beam selection parameter for the first beam.

[0166]

[0176] In some examples, the first layer beam determination component 1065 is configured as a means for determining a set of multiple first layer beams for performing a beam selection procedure, or may otherwise support it, where measuring the first beam selection parameters is based on having determined a set of multiple first layer beams for performing the beam selection procedure.

[0167]

[0177] In some examples, a set of multiple first layer beams includes a set of multiple layer 1 beams, and a set of multiple second layer beams includes a set of multiple layer 2 beams corresponding to the layer 1 beams in the set of multiple layer 1 beams.

[0168]

[0178] In some examples, multiple sets of first-layer beams, multiple sets of second-layer beams, or both, include line-of-sight beams.

[0169]

[0179] In some examples, a set of multiple first layer beams and a multipath beam component 1070 may be configured as a means for determining a set of multiple first layer beams, a set of multiple second layer beams, or both, based on the fact that the set of multiple first layer beams, a set of multiple second layer beams, or both, the set of multiple first layer beams, a set of multiple second layer beams, or both, in order to perform a beam selection procedure, wherein measuring a first beam selection parameter and measuring a second beam selection parameter are based on the determination of a set of multiple first layer beams, a set of multiple second layer beams, or both.

[0170]

[0180] In some examples, the multipath beam component 1070 may be configured, or otherwise support, as a means for determining that a set of multiple first layer beams, a set of multiple second layer beams, or both, include a multipath beam, based on the fact that the signal measurement senses multiple directional beams that fall within each other's ranges.

[0171]

[0181] In some examples, multiple sets of first layer beams, multiple sets of second layer beams, or both are determined based on one or more machine learning procedures or beam characterization procedures for different multipath conditions or simulated channel models. For example, a multipath beam component 1070 may communicate with the processor of device 1005 to perform machine learning on determining the optimal beam of the multipath beam for communication with a second wireless device on the fly in a multipath scenario, and on performing beam characterization procedures in a more static manner for offline determination of the optimal beam for communication with the second wireless device.

[0172]

[0182] In some examples, the first beam selection parameter, the second beam selection parameter, or both include a received signal power measurement.

[0173]

[0183] Figure 11 shows a diagram of a system including a device 1105 that supports beam management using backtracking and dithering according to an aspect of the present disclosure. Device 1105 may be an example of a component of device 805, device 905, or UE 115 as described herein (e.g., a first wireless device), or may include them. Device 1105 may wirelessly communicate with one or more base stations 105, UE 115, or any combination thereof. Device 1105 may include components for bidirectional voice and data communication, including components for transmitting and receiving communications, such as a communications manager 1120, an I / O controller 1110, a transceiver 1115, an antenna 1125, a memory 1130, a code 1135, and a processor 1140. These components communicate electronically via one or more buses (e.g., bus 1145) or may be coupled in other ways (e.g., operationally, communicatively, functionally, electronically, electrically).

[0174]

[0184] The I / O controller 1110 can manage input and output signals for device 1105. The I / O controller 1110 can also manage peripherals not integrated into device 1105. In some cases, the I / O controller 1110 may represent a physical connection or port to an external peripheral. In some cases, the I / O controller 1110 may utilize an operating system, such as iOS®, ANDROID®, MS-DOS®, MS-WINDOWS®, OS / 2®, UNIX®, LINUX®, or another known operating system. In some other cases, the I / O controller 1110 may represent or interact with a modem, keyboard, mouse, touchscreen, or similar device. In some cases, the I / O controller 1110 may be implemented as part of a processor, such as processor 1140. In some cases, a user may interact with device 1105 via the I / O controller 1110 or via hardware components controlled by the I / O controller 1110.

[0175]

[0185] In some cases, device 1105 may include a single antenna 1125. However, in some other cases, device 1105 may have two or more antennas 1125 that may be capable of simultaneously transmitting or receiving multiple wireless transmissions. Transceiver 1115 may communicate bidirectionally via one or more antennas 1125, a wired link, or a wireless link, as described herein. For example, transceiver 1115 may represent a wireless transceiver and communicate bidirectionally with another wireless transceiver. Transceiver 1115 may also include a modem that modulates packets, feeds the modulated packets to one or more antennas 1125 for transmission, and demodulates packets received from one or more antennas 1125. Transceiver 1115, or transceiver 1115 and one or more antennas 1125, may be examples of transmitters 815, 915, 810, 910, or any combination thereof or their components, as described herein.

[0176]

[0186] Memory 1130 may include random access memory (RAM) and read-only memory (ROM). Memory 1130 may store computer-readable, computer-executable code 1135, which, when executed by processor 1140, contains instructions that cause device 1105 to perform various functions described herein. Code 1135 may be stored in a non-temporary computer-readable medium, such as system memory or other types of memory. In some cases, code 1135 may not be directly executable by processor 1140, but (for example, when compiled and executed) may cause the computer to perform the functions described herein. In some cases, memory 1130 may include a basic I / O system (BIOS) that can control basic hardware or software operations, in particular, such as interaction with peripheral components or devices.

[0177]

[0187] The processor 1140 may include intelligent hardware devices (e.g., general-purpose processors, DSPs, CPUs, microcontrollers, ASICs, FPGAs, programmable logic devices, discrete gate or transistor logic components, discrete hardware components, or any combination thereof). In some cases, the processor 1140 may be configured to operate a memory array using a memory controller. In some other cases, the memory controller may be integrated into the processor 1140. The processor 1140 may be configured to execute computer-readable instructions stored in memory (e.g., memory 1130) to cause device 1105 to perform various functions (e.g., functions or tasks supporting beam management with backtracking and dithering). For example, device 1105 or components of device 1105 may include the processor 1140 and memory 1130 coupled to the processor 1140, and the processor 1140 and memory 1130 are configured to perform the various functions described herein.

[0178]

[0188] The communication manager 1120 may support wireless communication in a first wireless device in accordance with the examples disclosed herein. For example, the communication manager 1120 may be configured as a means for receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams, or otherwise support it. The communication manager 1120 may be configured as a means for measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device, and the first beam selection parameter may be measured for each beam of the set of multiple first layer beams. The communication manager 1120 may be configured as a means for selecting a first beam of the set of multiple first layer beams based on the measurements, or otherwise support it. The communication manager 1120 may be configured as a means for measuring a second beam selection parameter for each beam of a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The communication manager 1120 may be configured, or otherwise support, for selecting a second beam from a set of multiple first layer beams based on having measured a first beam selection parameter and a second beam selection parameter.

[0179]

[0189] By including or configuring a communications manager 1120 according to the examples described herein, device 1105 may support techniques for improved communication and an improved user experience. For example, based on backtracking and dithering techniques, the processor of device 1105 may determine the optimal beam for communication with additional wireless devices.

[0180]

[0190] In some examples, the communications manager 1120 may be configured to use or otherwise cooperate with the transceiver 1115, one or more antennas 1125, or any combination thereof, to perform various operations (e.g., receiving, monitoring, transmitting). Although the communications manager 1120 is shown as a separate component, in some examples, one or more functions described with respect to the communications manager 1120 may be supported or performed by the processor 1140, memory 1130, code 1135, or any combination thereof. For example, code 1135 may include instructions that can be executed by the processor 1140 to cause the device 1105 to perform various aspects of beam management using backtracking and dithering as described herein, or the processor 1140 and memory 1130 may be otherwise configured to perform or support such operations.

[0181]

[0191] In some implementations, device 1105 may include a multipath beam component for performing beam search optimized for multipath scenarios (i.e., no LOS path) using machine learning for on-the-fly updates during online operation, as well as simulation and characterization (e.g., if a phantom hand holds the device in various ways, but not limited to these cases). For example, the multipath beam component may use the communication manager 1120 and processor 1140 to identify beams for use in multipath scenarios on the fly (e.g., using machine learning) and via offline procedures (e.g., using characterization and simulation), and store the optimal multipath beam within device 1105 (e.g., in memory 1130).

[0182]

[0192] Figure 12 shows a flowchart illustrating a method for supporting beam management using backtracking and dithering according to an aspect of this disclosure. The operation of this method may be implemented by a UE or base station or their components as described herein (e.g., a first wireless device). For example, the operation of this method may be implemented by a UE 115 or base station 105 as described with reference to Figures 1 to 11. In some examples, the UE or base station may execute a set of instructions to control functional elements of the UE or base station to perform the described functions. In addition or alternatively, the UE or base station may use dedicated hardware to perform aspects of the described functions.

[0183]

[0193] In 1205, the method may include receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams. Operation of 1205 may be carried out according to the examples disclosed herein. In some examples, the operation of 1205 may be carried out by the signaling component 1025 described with reference to Figure 10.

[0184]

[0194] In 1210, the method includes measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with a second wireless device, wherein the first beam selection parameter may be measured for each beam of a set of multiple first layer beams. Operation of 1210 may be carried out according to the examples disclosed herein. In some examples, the operation of 1210 may be carried out by a first layer beam selection parameter component 1030 described with reference to Figure 10.

[0185]

[0195] In 1215, the method may include selecting a first beam from a set of multiple first layer beams based on the measurements. The operation of 1215 may be carried out according to the examples disclosed herein. In some examples, the operation of 1215 may be carried out by a first layer beam selection component 1035 described with reference to Figure 10.

[0186]

[0196] In 1220, the method may include measuring a second beam selection parameter for each beam in a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The operation of 1220 may be carried out according to the examples disclosed herein. In some examples, the operation of 1220 may be carried out by a second layer beam selection parameter component 1040 described with reference to Figure 10.

[0187]

[0197] In 1225, the method may include measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, selecting a second beam from a set of multiple first layer beams. The operation of 1225 may be carried out according to the examples disclosed herein. In some examples, the operation of 1225 may be carried out by a back-tracking component 1045 described with reference to Figure 10.

[0188]

[0198] Figure 13 shows a flowchart illustrating a method for supporting beam management using backtracking and dithering according to an aspect of this disclosure. The operation of this method may be implemented by a UE or base station or their components as described herein (e.g., a first wireless device). For example, the operation of this method may be implemented by a UE 115 or base station 105 as described with reference to Figures 1 to 11. In some examples, the UE or base station may execute a set of instructions to control functional elements of the UE or base station to perform the described functions. In addition or alternatively, the UE or base station may use dedicated hardware to perform aspects of the described functions.

[0189]

[0199] In 1305, the method may include receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams. The operation of 1305 may be carried out according to the examples disclosed herein. In some examples, the operation of 1305 may be carried out by the signaling component 1025 described with reference to Figure 10.

[0190]

[0200] In 1310, the method includes measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with a second wireless device, wherein the first beam selection parameter may be measured for each beam of a set of multiple first layer beams. The operation of 1310 may be carried out according to the examples disclosed herein. In some examples, the operation of 1310 may be carried out by a first layer beam selection parameter component 1030 described with reference to Figure 10.

[0191]

[0201] In 1315, the method may include selecting a first beam from a set of multiple first layer beams based on the measurements. The operation of 1315 may be carried out according to the examples disclosed herein. In some examples, the operation of 1315 may be carried out by a first layer beam selection component 1035 described with reference to Figure 10.

[0192]

[0202] In 1320, the method may include measuring a second beam selection parameter for each beam in a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The operation of 1320 may be carried out according to the examples disclosed herein. In some examples, the operation of 1320 may be carried out by a second layer beam selection parameter component 1040 described with reference to Figure 10.

[0193]

[0203] In 1325, the method may include measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, selecting a second beam from a set of multiple first layer beams. The operation of 1325 may be carried out according to the examples disclosed herein. In some examples, the operation of 1325 may be carried out by a back-tracking component 1045 described with reference to Figure 10.

[0194]

[0204] In 1330, the method may include selecting a second beam from a set of multiple first layer beams based on a comparison of a set of multiple measurements of the second beam selection parameter of each beam in a set of multiple second layer beams associated with a first beam with a first measurement of the first beam selection parameter of the first beam in the set of multiple first layer beams. The operation of 1330 may be carried out according to the examples disclosed herein. In some examples, the operation of 1330 may be carried out by a backtracking component 1045 described with reference to Figure 10.

[0195]

[0205] Figure 14 shows a flowchart illustrating a method for supporting beam management using backtracking and dithering according to an aspect of this disclosure. The operation of this method may be implemented by a UE or base station or their components as described herein (e.g., a first wireless device). For example, the operation of this method may be implemented by a UE 115 or base station 105 as described with reference to Figures 1 to 11. In some examples, the UE or base station may execute a set of instructions to control functional elements of the UE or base station to perform the described functions. In addition or alternatively, the UE or base station may use dedicated hardware to perform aspects of the described functions.

[0196]

[0206] In 1405, the method may include receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams. Operation of 1405 may be carried out according to the examples disclosed herein. In some examples, the operation of 1405 may be carried out by the signaling component 1025 described with reference to Figure 10.

[0197]

[0207] In 1410, the method includes measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with a second wireless device, wherein the first beam selection parameter may be measured for each beam of a set of multiple first layer beams. The operation of 1410 may be carried out according to the examples disclosed herein. In some examples, the operation of 1410 may be carried out by a first layer beam selection parameter component 1030 described with reference to Figure 10.

[0198]

[0208] In 1415, the method may include selecting a first beam from a set of multiple first layer beams based on the measurements. The operation of 1415 may be carried out according to the examples disclosed herein. In some examples, the operation of 1415 may be carried out by a first layer beam selection component 1035 described with reference to Figure 10.

[0199]

[0209] In 1420, the method may include measuring a second beam selection parameter for each beam in a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The operation of 1420 may be carried out according to the examples disclosed herein. In some examples, the operation of 1420 may be carried out by a second layer beam selection parameter component 1040 described with reference to Figure 10.

[0200]

[0210] In 1425, the method may include measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, selecting a second beam from a set of multiple first layer beams. The operation of 1425 may be carried out according to the examples disclosed herein. In some examples, the operation of 1425 may be carried out by a backtracking component 1045 described with reference to Figure 10.

[0201]

[0211] In 1430, the method includes selecting a second beam from a set of multiple first layer beams from a range of beam identifiers selected for a beam selection procedure, the selection of the second beam may be based on the fact that the second beam is oriented in a different direction from the first beam. The operation of 1430 may be carried out according to the examples disclosed herein. In some examples, the operation of 1430 may be carried out by a dithering component 1050 described with reference to Figure 10.

[0202]

[0212] Figure 15 shows a flowchart illustrating a method for supporting beam management using backtracking and dithering according to an aspect of this disclosure. The operation of this method may be implemented by a UE or base station or their components as described herein (e.g., a first wireless device). For example, the operation of this method may be implemented by UE 115 or base station 105 as described with reference to Figures 1 to 11. In some examples, the UE or base station may execute a set of instructions to control functional elements of the UE or base station to perform the described functions. In addition or alternatively, the UE or base station may use dedicated hardware to perform aspects of the described functions.

[0203]

[0213] In 1505, the method may include receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams. The operation of 1505 may be carried out according to the examples disclosed herein. In some examples, the operation of 1505 may be carried out by the signaling component 1025 described with reference to Figure 10.

[0204]

[0214] In 1510, the method includes measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with a second wireless device, the first beam selection parameter may be measured for each beam of a set of multiple first layer beams. Operation of 1510 may be carried out according to the examples disclosed herein. In some examples, the operation of 1510 may be carried out by a first layer beam selection parameter component 1030 described with reference to Figure 10.

[0205]

[0215] In 1515, the method may include selecting a first beam from a set of multiple first layer beams based on the measurements. The operation of 1515 may be carried out according to the examples disclosed herein. In some examples, the operation of 1515 may be carried out by a first layer beam selection component 1035 described with reference to Figure 10.

[0206]

[0216] In 1520, the method may include measuring a second beam selection parameter for each beam in a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The operation of 1520 may be carried out according to the examples disclosed herein. In some examples, the operation of 1520 may be carried out by a second layer beam selection parameter component 1040 described with reference to Figure 10.

[0207]

[0217] In 1525, the method may include measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, selecting a second beam from a set of multiple first layer beams. The operation of 1525 may be carried out according to the examples disclosed herein. In some examples, the operation of 1525 may be carried out by a back-tracking component 1045 described with reference to Figure 10.

[0208]

[0218] In 1530, the method may include adjusting a first beam of a set of multiple first layer beams by measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, applying an arbitrary signal to add noise to the signal received through the first beam, wherein the second beam of the set of multiple first layer beams is selected based on the adjustment of the first beam. The operation of 1530 may be carried out according to the examples disclosed herein. In some examples, the operation of 1530 may be carried out by a dithering component 1050 described with reference to Figure 10.

[0209]

[0219] Figure 16 shows a flowchart illustrating a method for supporting beam management using backtracking and dithering according to an aspect of this disclosure. The operation of this method may be implemented by a UE or base station or their components as described herein (e.g., a first wireless device). For example, the operation of this method may be implemented by UE 115 or base station 105 as described with reference to Figures 1 to 11. In some examples, the UE or base station may execute a set of instructions to control functional elements of the UE or base station to perform the described functions. In addition or alternatively, the UE or base station may use dedicated hardware to perform aspects of the described functions.

[0210]

[0220] In 1605, the method may include receiving one or more signals from a second wireless device on each beam of a set of multiple first layer beams. Operation of 1605 may be carried out according to the examples disclosed herein. In some examples, the operation of 1605 may be carried out by the signaling component 1025 described with reference to Figure 10.

[0211]

[0221] In 1610, the method includes measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with a second wireless device, wherein the first beam selection parameter may be measured for each beam of a set of multiple first layer beams. Operation of 1610 may be carried out according to the examples disclosed herein. In some examples, the operation of 1610 may be carried out by a first layer beam selection parameter component 1030 described with reference to Figure 10.

[0212]

[0222] In 1615, the method may include selecting a first beam from a set of multiple first layer beams based on the measurements. The operation of 1615 may be carried out according to the examples disclosed herein. In some examples, the operation of 1615 may be carried out by a first layer beam selection component 1035 described with reference to Figure 10.

[0213]

[0223] In 1620, the method may include measuring a second beam selection parameter for each beam in a set of multiple second layer beams associated with the first beam, based on the selection of the first beam. The operation of 1620 may be carried out according to the examples disclosed herein. In some examples, the operation of 1620 may be carried out by a second layer beam selection parameter component 1040 described with reference to Figure 10.

[0214]

[0224] In 1625, the method may include measuring a first beam selection parameter and, based on the measurement of a second beam selection parameter, selecting a second beam from a set of multiple first layer beams. The operation of 1625 may be carried out according to the examples disclosed herein. In some examples, the operation of 1625 may be carried out by a backtracking component 1045 described with reference to Figure 10.

[0215]

[0225] In 1630, the method may include measuring a third beam selection parameter for each beam in a set of multiple second layer beams associated with the second beam, based on the selection of the second beam. The operation of 1630 may be carried out according to the examples disclosed herein. In some examples, the operation of 1630 may be carried out by the beam selection procedure continuation component 1060 described with reference to Figure 10.

[0216]

[0226] In 1635, the method may include measuring a first beam selection parameter and, based on the measurement of a third beam selection parameter, selecting a beam from a set of multiple second layer beams associated with a second beam. The operation of 1635 may be carried out according to the examples disclosed herein. In some examples, the operation of 1635 may be carried out by a beam selection procedure continuation component 1060 described with reference to Figure 10.

[0217]

[0227] The following provides an overview of the aspects of this disclosure.

[0218]

[0228] Embodiment 1: A method for wireless communication in a first wireless device, comprising: receiving one or more signals from a second wireless device on each of a plurality of first layer beams; measuring a first beam selection parameter for one or more signals as part of a beam selection procedure for communicating with the second wireless device; selecting a first beam of the plurality of first layer beams at least in part on the first beam selection parameter being measured for each of the plurality of first layer beams; measuring a second beam selection parameter for each of a plurality of second layer beams associated with the first beam at least in part on the selection of the first beam; and selecting a second beam of the plurality of first layer beams at least in part on measuring the first beam selection parameter and measuring the second beam selection parameter.

[0219]

[0229] Embodiment 2: The method of Embodiment 1, wherein the selection of a second beam of a plurality of first layer beams is at least in part on a comparison of a plurality of measurements of a second beam selection parameter for each beam of the plurality of second layer beams associated with a first beam with a first measurement of a first beam selection parameter for the first beam of the plurality of first layer beams.

[0220]

[0230] Embodiment 3: The method of Embodiment 2, wherein the selection of a second beam from a plurality of first layer beams is at least in part based on the fact that multiple measurements of the second beam selection parameter for each beam of the plurality of second layer beams are smaller than a first measurement of the first beam selection parameter for the first beam.

[0221]

[0231] Embodiment 4: A method of any of Embodiments 1 to 3, wherein selecting a second beam from a plurality of first layer beams comprises selecting a second beam from a plurality of first layer beams from a range of beam identifiers selected for a beam selection procedure, and the selection of the second beam is at least partially based on the fact that the second beam is oriented in a different direction from the first beam.

[0222]

[0232] Embodiment 5: Any method of Embodiments 1 to 4, further comprising adjusting the first beam by measuring a first beam selection parameter and, at least in part, on measuring a second beam selection parameter, by applying an arbitrary signal to add noise to the signal received through the first beam of a plurality of first layer beams, wherein the second beam of the plurality of first layer beams is selected at least in part on adjusting the first beam.

[0223]

[0233] Embodiment 6: The method of Embodiment 5, wherein adjusting the first beams of a plurality of first layer beams comprises changing the beam pattern of the first beams.

[0224]

[0234] Embodiment 7: Any method of Embodiments 1 to 6, further comprising determining operability conditions for one or more technical operations of a first wireless device, at least in part on measurements of how one or more technical operations of a first wireless device are affected by beamforming communications in the same time slot, wherein selecting a first beam of a plurality of first layer beams, a second beam of a plurality of first layer beams, or both, is at least in part on determining the operability conditions.

[0225]

[0235] Embodiment 8: The method of Embodiment 7, wherein one or more technical operations include one or more operations using a radio access technology different from the radio access technology used to communicate with a second wireless device, operations using a Global Positioning System, or operations using the Wireless Fidelity Protocol.

[0226]

[0236] Embodiment 9: A method of any embodiment 1 to 8, further comprising determining the battery charge level of a first wireless device, wherein the selection of a first beam of a plurality of first layer beams, a second beam of a plurality of first layer beams, or both, is at least partially based on the battery charge level of the first wireless device.

[0227]

[0237] Embodiment 10: A method of any embodiment 1 to 9, further comprising determining latency and link reliability conditions for communicating with a second wireless device, wherein selecting a first beam of a plurality of first layer beams, a second beam of a plurality of first layer beams, or both, is at least in part based on determining latency and link reliability conditions for communicating with a second wireless device.

[0228]

[0238] Embodiment 11: A method of any embodiment 1 to 10, further comprising measuring a third beam selection parameter for each beam of a plurality of second layer beams associated with a second beam, at least in part on having selected a second beam, and selecting a beam of a plurality of second layer beams associated with a second beam, at least in part on having measured a first beam selection parameter and having measured the third beam selection parameter.

[0229]

[0239] Embodiment 12: The method of Embodiment 11, further comprising selecting beams of a plurality of second layer beams associated with a second beam, at least in part on a first comparison of a first measurement of a first beam selection parameter of a plurality of second layer beams associated with a second beam with a plurality of measurement of a third beam selection parameter of each beam of the plurality of second layer beams associated with the second beam, and at least in part on a second comparison of each measurement of a plurality of measurement of a third beam selection parameter of each beam of the plurality of second layer beams associated with the second beam.

[0230]

[0240] Embodiment 13: The method of Embodiment 12, wherein the selection of beams of a plurality of second layer beams is at least partially based on the fact that the measured value of the third beam selection parameter of the beams of the plurality of second layer beams associated with the second beam is higher than the first measured value of the first beam selection parameter of the second beam, and at least partially based on the fact that the measured value of the third beam selection parameter of the beams is the highest value of the plurality of second layer beams associated with the second beam.

[0231]

[0241] Embodiment 14: Any method of Embodiments 1 to 13, further comprising determining that the selection of a first beam of a plurality of first layer beams for a beam selection procedure results in one or more subsequent beams that are not suitable for communicating with a second wireless device, at least in part on the fact that a plurality of measurements of a second beam selection parameter for each beam of a plurality of second layer beams associated with a first beam are smaller than a first measurement of a first beam selection parameter for the first beam.

[0232]

[0242] Embodiment 15: A method of any of Embodiments 1 to 14, further comprising determining a plurality of first layer beams for performing a beam selection procedure, wherein measuring a first beam selection parameter is at least in part based on having determined a plurality of first layer beams for performing a beam selection procedure.

[0233]

[0243] Embodiment 16: A method according to any of Embodiments 1 to 15, wherein a plurality of first layer beams comprise a plurality of layer 1 beams, and a plurality of second layer beams comprise a plurality of layer 2 beams corresponding to a layer 1 beam among the plurality of layer 1 beams.

[0234]

[0244] Embodiment 17: Any method of Embodiments 1 to 16, wherein a plurality of first layer beams, a plurality of second layer beams, or both are line-of-sight beams.

[0235]

[0245] Embodiment 18: A method of any embodiment 1 to 17 wherein a plurality of first layer beams, a plurality of second layer beams, or both are multipath beams, and the method further comprises determining a plurality of first layer beams, a plurality of second layer beams, or both, at least in part on the fact that a plurality of first layer beams, a plurality of second layer beams, or both are multipath beams, wherein measuring a first beam selection parameter and measuring a second beam selection parameter are at least in part on the fact that a plurality of first layer beams, a plurality of second layer beams, or both have been determined to perform a beam selection procedure.

[0236]

[0246] Embodiment 19: The method of Embodiment 18, further comprising determining that a plurality of first layer beams, a plurality of second layer beams, or both, comprise a multipath beam, at least in part on the fact that a signal measurement has detected a plurality of directional beams that fall within each other's ranges.

[0237]

[0247] Embodiment 20: The method of Embodiment 19, wherein a plurality of first layer beams, a plurality of second layer beams, or both are determined at least in part on one or more of different multipath conditions or machine learning procedures or beam characterization procedures for simulated channel models.

[0238]

[0248] Embodiment 21: Any method of Embodiments 1 to 20, wherein the first beam selection parameter, the second beam selection parameter, or both comprises a received signal power measurement.

[0239]

[0249] Embodiment 22: An apparatus for wireless communication in a first wireless device, comprising a processor, a memory coupled to the processor, and instructions stored in the memory, wherein the instructions are executable by the processor to cause the apparatus to perform any of the methods of Embodiments 1 to 21.

[0240]

[0250] Embodiment 23: An apparatus for wireless communication in a first wireless device, comprising at least one means for carrying out any of the methods of Embodiments 1 to 21.

[0241]

[0251] Embodiment 24: A non-temporary computer-readable medium for storing code for wireless communication in a first wireless device, wherein the code comprises instructions that can be executed by a processor to carry out any of the methods of Embodiments 1 to 21.

[0242]

[0252] It should be noted that the methods described herein represent possible implementations, and that the operations and steps may be rearranged or, in some cases, modified, and that other implementations are possible. Furthermore, two or more embodiments of the methods may be combined.

[0243]

[0253] Embodiments of LTE, LTE-A, LTE-A Pro, or NR systems may be described as examples, and the terms LTE, LTE-A, LTE-A Pro, or NR may be used for the majority of the description, however the techniques described herein are applicable to networks other than LTE, LTE-A, LTE-A Pro, or NR networks. For example, the techniques described may be applicable to various other wireless communication systems such as Ultra Mobile Broadband (UMB), IEEE 802.11 (Wi-Fi), IEEE 802.16 (WiMAX®), IEEE 802.20, Flash OFDM, and other systems and wireless technologies not expressly mentioned herein.

[0244]

[0254] The information and signals described herein may be represented using any of the various different techniques and methods. For example, the data, instructions, commands, information, signals, bits, symbols, and chips that may be mentioned throughout the above description may be represented by voltage, electric current, electromagnetic waves, magnetic fields or magnetic particles, light fields or optical particles, or any combination thereof.

[0245]

[0255] The various exemplary blocks and components described in relation to the disclosure herein may be implemented or carried out using general-purpose processors, DSPs, ASICs, CPUs, FPGAs or other programmable logic devices, individual gate or transistor logic, individual hardware components, or any combination thereof designed to perform the functions described herein. A general-purpose processor may be a microprocessor, but alternatively, a processor may be any processor, controller, microcontroller, or state machine. A processor may also be implemented as a combination of computing devices (for example, a combination of a DSP and a microprocessor, multiple microprocessors, one or more microprocessors working with a DSP core, or any other such configuration).

[0246]

[0256] The functions described herein may be implemented in hardware, software executed by a processor, firmware, or a combination thereof. When implemented in software executed by a processor, the functions may be stored on or transmitted via a computer-readable medium as one or more instructions or codes. Other examples and implementations fall within the scope of this disclosure and the accompanying claims. For example, depending on the nature of the software, the functions described herein may be implemented using software executed by a processor, hardware, firmware, hardwiring, or a combination thereof. Features implementing the functions may also be physically located in various locations, including the distribution of parts of the function so that they are implemented in different physical locations.

[0247]

[0257] Computer-readable media include both non-temporary computer storage media and communication media, including any media that facilitates the transfer of computer programs from one location to another. Non-temporary storage media can be any available media that can be accessed by a general-purpose or dedicated computer. Examples, but not limited to, non-temporary computer-readable media may include RAM, ROM, electrically erasable programmable ROM (EEPROM®), flash memory, compact disk (CD) ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other non-temporary media that can be used to carry or store desired program code means in the form of instructions or data structures, and can be accessed by a general-purpose or dedicated computer or general-purpose or dedicated processor. Any connection is also appropriately referred to as computer-readable media. For example, if software is transmitted from a website, server, or other remote source using coaxial cable, fiber optic cable, twisted pair, digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwave, then coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of computer-readable media. As used herein, disk and disc include CD, LaserDisc®, OpticalDisc, Digital Multipurpose Disc (DVD), FloppyDisc, and Blu-ray®, where disk typically reproduces data magnetically and disc optically reproduces data by laser. Combinations of the above are also included in the scope of computer-readable media.

[0248]

[0258] Where used herein, including in the claims, “or” in an enumeration of items (for example, an enumeration of items ending with a phrase such as “at least one of” or “one or more of”) means an inclusive enumeration such that, for example, an enumeration of at least one of A, B, or C means A or B or C or AB or AC or BC or ABC (i.e., A and B and C). Also, the phrase “based on” as used herein shall not be construed as a reference to a closed set of conditions. For example, an exemplary step described as “based on condition A” may be based on both condition A and condition B without departing from the scope of this disclosure. In other words, the phrase “based on” as used herein shall be construed in the same manner as the phrase “at least partially based on.”

[0249]

[0259] In the attached diagram, similar components or features may have the same reference label. Furthermore, various components of the same type may be distinguished by following the reference label with a dash and a second label to distinguish them from similar components. When only the first reference label is used herein, its description is applicable to any similar component having the same first reference label, regardless of the second reference label or any other subsequent reference labels.

[0250]

[0260] The descriptions provided herein with respect to the accompanying drawings describe exemplary configurations and do not necessarily represent all examples that may be implemented or that fall within the scope of the claims. The term “example” as used herein means “acting as an example, case, or illustration,” and does not imply “preferred” or “advantageous over other examples.” Detailed descriptions include specific details to provide an understanding of the described techniques. However, these techniques may be practiced without these specific details. In some cases, known structures and devices are shown in block diagram form to avoid obscuring the concepts of the described examples.

[0251]

[0261] The descriptions herein are provided so that those skilled in the art may create or use this disclosure. Various modifications of this disclosure will be obvious to those skilled in the art, and the general principles defined herein may be applied to other variations without departing from the scope of this disclosure. Accordingly, this disclosure should be given the broadest scope that is consistent with the principles and novel features disclosed herein, and is not limited to the examples and designs described herein.

Claims

1. A method for wireless communication in a first wireless device, Receiving one or more signals from a second wireless device on each of the multiple first layer beams, As part of a beam selection procedure for communicating with the second wireless device, a first beam selection parameter is measured for one or more signals, and the first beam selection parameter is measured for each of the plurality of first layer beams. Based at least in part on the measurements described above, the first beam of the plurality of first layer beams is selected, Based at least in part on the selection of the first beam, a second beam selection parameter is measured for each of the multiple second layer beams associated with the first beam, A method comprising measuring the first beam selection parameter and selecting a second beam of the plurality of first layer beams at least in part on the measurement of the second beam selection parameter.

2. The method according to claim 1, wherein the selection of the second beam of the plurality of first layer beams is at least partially based on a comparison of a plurality of measurements of the second beam selection parameter of each beam of the plurality of second layer beams associated with the first beam with a first measurement of the first beam selection parameter of the first beam of the plurality of first layer beams.

3. The method according to claim 2, wherein the selection of the second beam of the plurality of first layer beams is at least in part based on the plurality of measurements of the second beam selection parameter for each of the plurality of second layer beams being smaller than the first measurement of the first beam selection parameter for the first beam.

4. The method according to claim 1, wherein selecting the second beam of the plurality of first layer beams comprises selecting the second beam of the plurality of first layer beams from a range of beam identifiers selected for the beam selection procedure, and the selection of the second beam is at least partially based on the fact that the second beam is oriented in a different direction from the first beam.

5. The method according to claim 1, further comprising adjusting the first beam by measuring the first beam selection parameter and applying an arbitrary signal to add noise to the signal received through the first beam of the plurality of first layer beams, at least on the basis of measuring the second beam selection parameter, wherein the second beam of the plurality of first layer beams is selected at least on the basis of adjusting the first beam.

6. The method according to claim 5, wherein adjusting the first beam of the plurality of first layer beams comprises changing the beam pattern of the first beam.

7. The method according to claim 1, further comprising determining operability conditions for one or more technical operations of the first wireless device, at least in part on measurements of how one or more technical operations of the first wireless device are affected by beamforming communications in the same time slot, wherein the selection of the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both, is at least in part on determining the operability conditions.

8. The method according to claim 7, wherein the one or more technical operations include one or more operations using a radio access technology different from the radio access technology used to communicate with the second wireless device, operations using a global positioning system, or operations using the Wireless Fidelity Protocol.

9. The method according to claim 1, further comprising determining the battery charge level of the first wireless device, wherein the selection of the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both, is at least partially based on the battery charge level of the first wireless device.

10. The method according to claim 1, further comprising determining latency and link reliability conditions for communication with the second wireless device, wherein selecting the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both, is at least in part based on determining the latency and link reliability conditions for communication with the second wireless device.

11. Based at least in part on the selection of the second beam, a third beam selection parameter is measured for each of the multiple second layer beams associated with the second beam, The method according to claim 1, further comprising measuring the first beam selection parameter and selecting the beams of the plurality of second layer beams associated with the second beam, at least in part on the measurement of the third beam selection parameter.

12. The method according to claim 11, further comprising selecting the beam of the plurality of second layer beams associated with the second beam, at least partially based on a first comparison of a first measurement of the first beam selection parameter of the plurality of second layer beams associated with the second beam with a plurality of measurement of the third beam selection parameter of each of the plurality of second layer beams associated with the second beam, and at least partially based on a second comparison of each measurement of the plurality of measurement of the third beam selection parameter of each of the plurality of second layer beams associated with the second beam.

13. The method according to claim 12, wherein the selection of the plurality of second layer beams is at least partially based on the fact that a measured value of the third beam selection parameter of the beam of the plurality of second layer beams associated with the second beam is higher than a first measured value of the first beam selection parameter of the second beam, and the measured value of the third beam selection parameter of the beam is at least partially based on the fact that the highest value of the plurality of second layer beams associated with the second beam.

14. The method according to claim 1, further comprising determining, at least in part, that the first beam selection of the plurality of first layer beams for the beam selection procedure results in one or more subsequent beams that are not suitable for communication with the second wireless device, based on the fact that a plurality of measurements of the second beam selection parameter for each of the plurality of second layer beams associated with the first beam are smaller than a first measurement of the first beam selection parameter for the first beam.

15. The method according to claim 1, further comprising determining the plurality of first layer beams for performing the beam selection procedure, wherein the measurement of the first beam selection parameters is at least in part based on determining the plurality of first layer beams for performing the beam selection procedure.

16. The method according to claim 1, wherein the plurality of first layer beams comprises a plurality of layer 1 beams, and the plurality of second layer beams comprises a plurality of layer 2 beams corresponding to the layer 1 beams among the plurality of layer 1 beams.

17. The method according to claim 1, wherein the plurality of first layer beams, the plurality of second layer beams, or both are line-of-sight beams.

18. The method according to claim 1, wherein the plurality of first layer beams, the plurality of second layer beams, or both comprise a multipass beam, and the method further comprises determining the plurality of first layer beams, the plurality of second layer beams, or both, at least in part on the fact that the plurality of first layer beams, the plurality of second layer beams, or both comprise a multipass beam, wherein the measurement of the first beam selection parameter and the measurement of the second beam selection parameter are at least in part on the fact that the plurality of first layer beams, the plurality of second layer beams, or both have been determined to carry out the beam selection procedure.

19. The method of claim 18, further comprising determining that the plurality of first layer beams, the plurality of second layer beams, or both, comprise the multipath beam, at least in part on the sensing of the plurality of directional beams where the signal measurement values ​​fall within each other's ranges.

20. The method according to claim 19, wherein the plurality of first layer beams, the plurality of second layer beams, or both are determined at least in part on one or more of different multipath conditions or machine learning procedures or beam characterization procedures for simulated channel models.

21. The method according to claim 1, wherein the first beam selection parameter, the second beam selection parameter, or both include a received signal power measurement.

22. A device for wireless communication in a first wireless device, Processor and The memory coupled to the aforementioned processor, The device comprises instructions stored in the memory, and the instructions are transmitted to the device. Receiving one or more signals from a second wireless device on each of the multiple first layer beams, As part of a beam selection procedure for communicating with the second wireless device, a first beam selection parameter is measured for one or more signals, and the first beam selection parameter is measured for each of the plurality of first layer beams. Based at least in part on the measurements described above, the first beam of the plurality of first layer beams is selected, Based at least in part on the selection of the first beam, a second beam selection parameter is measured for each of the multiple second layer beams associated with the first beam, An apparatus that can be operated by the processor to measure the first beam selection parameter and, at least in part, select a second beam from the plurality of first layer beams based on the measurement of the second beam selection parameter.

23. The apparatus according to claim 22, wherein the instruction for selecting the second beam of the plurality of first layer beams is executable by the processor to cause the apparatus to select the second beam of the plurality of first layer beams based at least in part on a comparison of a plurality of measurements of the second beam selection parameter of each of the plurality of second layer beams associated with the first beam with a first measurement of the first beam selection parameter of the plurality of first layer beams.

24. The apparatus according to claim 23, wherein the selection of the second beam of the plurality of first layer beams is at least in part based on the plurality of measurements of the second beam selection parameter for each of the plurality of second layer beams being smaller than the first measurement of the first beam selection parameter for the first beam.

25. The apparatus according to claim 22, wherein the instruction for selecting the second beam of the plurality of first layer beams is executable by the processor to cause the apparatus to select the second beam of the plurality of first layer beams from a range of beam identifiers selected for the beam selection procedure, and the selection of the second beam is at least partially based on the fact that the second beam is oriented in a different direction from the first beam.

26. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to adjust the first beam by applying an arbitrary signal to add noise to the signals received through the first beam of the plurality of first layer beams, at least on the basis of measuring the first beam selection parameter and the second beam selection parameter, wherein the second beam of the plurality of first layer beams is selected at least on the basis of adjusting the first beam.

27. The apparatus according to claim 26, wherein adjusting the first beam of the plurality of first layer beams comprises changing the beam pattern of the first beam.

28. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to determine operability conditions for one or more technical operations of the first wireless device, at least in part on a measurement of how one or more technical operations of the first wireless device are affected by beamforming communications in the same time slot, wherein the selection of the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both, is at least in part on the determination of the operability conditions.

29. The apparatus according to claim 28, wherein the one or more technical operations include one or more operations using a radio access technology different from the radio access technology used to communicate with the second wireless device, operations using a global positioning system, or operations using the Wireless Fidelity Protocol.

30. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to determine the battery charge level of the first wireless device, wherein the selection of the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both is at least partially based on the battery charge level of the first wireless device.

31. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to determine latency and link reliability conditions for communication with the second wireless device, wherein the selection of the first beam of the plurality of first layer beams, the second beam of the plurality of first layer beams, or both, is at least in part based on the determination of the latency and link reliability conditions for communication with the second wireless device.

32. The command to the device, Based at least in part on the selection of the second beam, a third beam selection parameter is measured for each of the multiple second layer beams associated with the second beam, The apparatus according to claim 22, wherein the processor is further capable of causing the apparatus to perform, at least in part, on measuring the first beam selection parameter and on measuring the third beam selection parameter, to select the beams of the plurality of second layer beams associated with the second beam.

33. The apparatus according to claim 32, wherein the instruction is further executable by the processor to cause the apparatus to select the beam of the plurality of second layer beams associated with the second beam, at least in part on a first comparison of a first measurement of the first beam selection parameter of the plurality of second layer beams associated with the second beam with a plurality of measurements of the third beam selection parameter of each of the plurality of second layer beams associated with the second beam, and at least in part on a second comparison of each measurement of the plurality of measurements of the third beam selection parameter of each of the plurality of second layer beams associated with the second beam.

34. The apparatus according to claim 33, wherein the selection of the plurality of second layer beams is at least partially based on the fact that a measured value of the third beam selection parameter of the beam of the plurality of second layer beams associated with the second beam is higher than a first measured value of the first beam selection parameter of the second beam, and the measured value of the third beam selection parameter of the beam is at least partially based on the fact that it is the highest value of the plurality of second layer beams associated with the second beam.

35. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to determine that the selection of the first beam of the plurality of first layer beams for the beam selection procedure results in one or more subsequent beams that are not suitable for communication with the second wireless device, at least in part on the fact that a plurality of measurements of the second beam selection parameter for each of the plurality of second layer beams associated with the first beam are smaller than a first measurement of the first beam selection parameter for the first beam.

36. The apparatus according to claim 22, wherein the instruction is further executable by the processor to cause the apparatus to determine the plurality of first layer beams for performing the beam selection procedure, wherein the measurement of the first beam selection parameters is at least in part based on the determination of the plurality of first layer beams for performing the beam selection procedure.

37. The apparatus according to claim 22, wherein the plurality of first layer beams comprises a plurality of layer 1 beams, and the plurality of second layer beams comprises a plurality of layer 2 beams corresponding to the layer 1 beams among the plurality of layer 1 beams.

38. The apparatus according to claim 22, wherein the plurality of first layer beams, the plurality of second layer beams, or both are line-of-sight beams.

39. Apparatus according to claim 22, wherein the plurality of first layer beams, the plurality of second layer beams, or both comprise multipath beams, and the instruction is further executable by the processor to cause the apparatus to determine the plurality of first layer beams, the plurality of second layer beams, or both, on at least partly based on the plurality of first layer beams, the plurality of second layer beams, or both comprise multipath beams, wherein the measurement of the first beam selection parameter and the measurement of the second beam selection parameter are at least partly based on the determination of the plurality of first layer beams, the plurality of second layer beams, or both, in order to carry out the beam selection procedure.

40. The apparatus according to claim 39, wherein the instruction is further executable by the processor to cause the apparatus to determine that the plurality of first layer beams, the plurality of second layer beams, or both, comprise the multipath beam, based at least in part on the detection of the plurality of directional beams in which a signal measurement falls within the range of each other.

41. The apparatus according to claim 40, wherein the plurality of first layer beams, the plurality of second layer beams, or both are determined at least in part on one or more of different multipath conditions or machine learning procedures or beam characterization procedures for simulated channel models.

42. The apparatus according to claim 22, wherein the first beam selection parameter, the second beam selection parameter, or both, comprises a received signal power measurement.

43. A device for wireless communication in a first wireless device, Means for receiving one or more signals on each beam of a plurality of first layer beams from a second wireless device, As part of a beam selection procedure for communicating with the second wireless device, means for measuring a first beam selection parameter of one or more signals, the first beam selection parameter is measured for each of the plurality of first layer beams. Means for selecting the first beam of the plurality of first layer beams, based at least in part on the measurements described above, Means for measuring a second beam selection parameter for each of a plurality of second layer beams associated with the first beam, at least in part based on the selection of the first beam, An apparatus comprising means for measuring the first beam selection parameter and for selecting a second beam of a plurality of first layer beams, at least in part, based on the measurement of the second beam selection parameter.

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