Random field modeling method for quantizing initial defects in spherical shell structures

The random field modeling method for spherical shells addresses the challenge of quantifying initial defects by determining correlation functions and performing feature decomposition, enhancing defect quantization accuracy and performance analysis.

JP2026092631AActive Publication Date: 2026-06-05ZHEJIANG UNIV CITY COLLEGE

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
ZHEJIANG UNIV CITY COLLEGE
Filing Date
2024-12-10
Publication Date
2026-06-05

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Abstract

This invention provides a random field modeling method that accurately quantizes the intrinsic correlation of initial defects in a spherical shell and further improves the accuracy of spherical shell performance analysis. [Solution] A random field modeling method for quantizing initial defects in a spherical shell structure includes: determining simulation spherical shell data corresponding to a target spherical shell, including geometric information and material information of the spherical shell; determining a target correlation function and representative discrete points corresponding to the target spherical shell based on the geometric information and material information of the spherical shell; determining a correlation coefficient matrix based on the target correlation function and representative discrete points; decomposing the feature values ​​of the correlation coefficient matrix to obtain a standard random field; and performing a random field transformation on the standard random field based on a random field transformation formula to obtain a target random field corresponding to the target spherical shell.
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