Imaging device, 3D analysis system, imaging method, and 3D analysis method
By utilizing a dual slit light source and zoom lens with adjustable focal lengths, the system maintains resolution and improves image quality while simplifying adjustments, addressing vibration-related issues in conventional three-dimensional imaging.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- MITSUBISHI ELECTRIC CORP
- Filing Date
- 2024-11-27
- Publication Date
- 2026-06-08
Smart Images
Figure 2026093235000001_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to an imaging device, a three-dimensional analysis system, an imaging method, and a three-dimensional analysis method.
Background Art
[0002] As a method for three-dimensionally analyzing an object, there is a light section method. In the light section method, an object is irradiated with a light beam (also referred to as a laser beam), and the reflected light is imaged using a lens and a sensor. The imaging position on the sensor changes depending on the position of the imaged object, and the position of the object is determined by triangulation based on the information of the imaging position (see, for example, Patent Document 1).
Prior Art Documents
Patent Documents
[0003]
Patent Document 1
Summary of the Invention
Problems to be Solved by the Invention
[0004] In the conventional technology, when measuring objects at different positions using one laser light source, every time the position of the object is different with respect to one laser light source, the light beam, the lens, and the photodetector are adjusted so as to satisfy the shine-proof condition according to the position of the object. Therefore, in the conventional technology, an actuator or a mirror is used to adjust the position and direction of the light beam according to the position of the object, or an actuator is used to adjust the position or direction of the lens and the photodetector according to the position of the object. In this case, the adjustment and calibration of the mirror and the actuator become complicated, and the resolution of the device deteriorates particularly in a situation where vibration occurs.
[0005] An object of the present disclosure is to solve the above problems and increase the resolution with a simple configuration.
Means for Solving the Problems
[0006] An imaging device relating to one aspect of this disclosure is: A first slit light source that emits a first slit beam, A second slit light source that emits a second slit beam, A zoom lens that can switch between a first focal length and a second focal length longer than the first focal length, A sensor that detects reflected light from an object irradiated by the first or second slit light through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, the first slit light source is arranged to satisfy the shineproof condition. When the focal length of the zoom lens is the second focal length, the second slit light source is arranged to satisfy the shineproof condition. It is characterized by the following: A three-dimensional analysis system according to one aspect of this disclosure is: The imaging device and, The aforementioned imaging device and an analysis device capable of communicating with each other Equipped with, The analysis device acquires reflected light information corresponding to the reflected light detected by the sensor from the imaging device, and performs three-dimensional measurement of the object based on the reflected light information. It is characterized by the following: The imaging method relating to one aspect of this disclosure is: Irradiating with the first slit light, By irradiating with a second slit beam, Switching the focal length of a zoom lens between a first focal length and a second focal length that is longer than the first focal length, The sensor is used to detect reflected light from an object irradiated with the first or second slit light, through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, a first slit light source is arranged to emit the first slit light in such a way that the shineproof condition is satisfied. When the focal length of the zoom lens is the second focal length, a second slit light source is arranged to emit the second slit light in such a way that the shineproof condition is satisfied. It is characterized by the following: A three-dimensional analysis method relating to one aspect of this disclosure is: The imaging method described above, Based on the reflected light information corresponding to the reflected light detected by the sensor, a three-dimensional analysis of the object is performed. It is characterized by having the following features. [Effects of the Invention]
[0007] According to this disclosure, resolution can be increased with a simple configuration. [Brief explanation of the drawing]
[0008] [Figure 1] This diagram schematically shows the configuration of the imaging device according to the embodiment. [Figure 2] This figure shows an arrangement that satisfies the Scheinproof condition for the first laser light source. [Figure 3] This figure shows an arrangement that satisfies the Scheinproof condition for the second laser light source. [Figure 4] This is a block diagram that schematically shows the configuration of the 3D analysis system. [Figure 5] This flowchart shows an example of how a 3D analysis system works. [Figure 6] This diagram shows an example of the imaging operation of an imaging device installed on the roof of a railway vehicle traveling inside a tunnel. [Figure 7] This diagram shows an example of the imaging operation of an imaging device installed on the roof of a railway vehicle traveling outside a tunnel. [Figure 8] This figure shows an example of the imaging operation of an imaging device installed on a gondola traveling through an area where structures such as eaves exist. [Figure 9] It is a diagram showing an example of an imaging operation of an imaging device installed on a gondola that travels in an area where there is no structure such as an eaves.
Embodiments for Carrying Out the Invention
[0009] FIG. 1 is a diagram schematically showing the configuration of an imaging device 1 according to the present embodiment. The imaging device 1 includes a first laser light source 11, a second laser light source 12, a zoom lens 13, and a sensor 14. Here, the first laser light source 11 is an example of a first slit light source, and the second laser light source 12 is an example of a second slit light source. The first slit light source and the second slit light source do not have to be laser light sources, and for example, they may be slit light sources that irradiate slit light using a light-emitting element such as an LED.
[0010] The first laser light source 11 irradiates a first laser beam L1. The first laser light source 11 is adjacent to the second laser light source 12. The direction of the first laser light source 11 is fixed in one direction. The first laser beam L1 is slit light that spreads in the depth direction of the paper surface (that is, in a direction perpendicular to both the direction in which the sensor 14 and the first laser light source 11 face each other and the direction from the first laser light source 11 toward the object 2). Here, the first laser beam L1 is an example of a first slit beam. The first slit beam is not limited to that irradiated from a laser light source, and may be slit light irradiated from a slit light source using an LED or the like.
[0011] The second laser light source 12 emits a second laser beam L2. The second laser light source 12 is adjacent to the first laser light source 11. The orientation of the second laser light source 12 is fixed in one direction. In the example shown in Figure 1, the second laser beam L2 is parallel to the first laser beam L1. The second laser beam L2 is a slit beam that spreads in the depth direction of the paper (i.e., in a direction perpendicular to both the direction in which the sensor 14 and the second laser light source 12 face each other and the direction in which the second laser light source 12 moves toward the object 2). Here, the second laser beam L2 is an example of a second slit beam. The second slit beam is not limited to that emitted from a laser light source, but may also be a slit beam emitted from a slit light source using an LED or the like.
[0012] The zoom lens 13 can change its focal length. For example, the focal length can be changed by driving the zoom lens 13 electrically (e.g., by a motor or actuator). When the focal length is changed electrically, the imaging device 1 may have a mechanism (e.g., a motor or actuator) for driving the zoom lens 13, and may also have a control circuit for controlling the mechanism for driving the zoom lens 13.
[0013] Sensor 14 has a light-receiving element, such as a photodiode. Sensor 14 detects reflected light from object 2 through zoom lens 13. For example, sensor 14 detects reflected light from object 2 in a first region Z1 where the first laser beam L1 is irradiated, or reflected light from object 2 in a second region Z2 where the second laser beam L2 is irradiated.
[0014] Sensor 14 can output a signal indicating reflected light information corresponding to the detected light (reflected light). The signal output from sensor 14 may be processed inside the imaging device 1 or output outside the imaging device 1. As a result, the imaging device 1 can generate, output, or acquire an image of the object 2 irradiated with the first laser beam L1 or the second laser beam L2. The reflected light information corresponding to the light (reflected light) can be information that has been converted into data for identification by a computer such as an analysis device, based on the reflected light detected by sensor 14.
[0015] Figure 2 shows an arrangement that satisfies the Scheinproof condition with respect to the first laser light source 11. Based on the Scheinproof principle, the first laser light source 11, zoom lens 13, and sensor 14 are arranged such that the surface 14a of the sensor 14, the main plane 13a of the zoom lens 13 (a plane perpendicular to the optical axis of the zoom lens 13), and the object surface 2a, which is the plane of focus, intersect at a single point P1. That is, the first laser light source 11 is positioned at point P1 that satisfies the Scheinproof condition. In this case, the focal length of the zoom lens 13 is the first focal length f1. In other words, when the focal length of the zoom lens 13 is the first focal length f1, the first laser light source 11 is positioned to satisfy the Scheinproof condition. When the focal length of the zoom lens 13 is the first focal length f1, the angle of view φ1 of the zoom lens 13 corresponds to the first region Z1. The surface 14a of the sensor 14 is the sensing surface on which the sensor 14 senses light.
[0016] Figure 3 shows an arrangement that satisfies the Scheinproof condition with respect to the second laser light source 12. Based on the Scheinproof principle, the second laser light source 12, zoom lens 13, and sensor 14 are arranged such that the surface 14a of the sensor 14, the main plane 13a of the zoom lens 13, and the object surface 2a, which is the plane of focus, intersect at a single point P2. That is, the second laser light source 12 is positioned at point P2 that satisfies the Scheinproof condition. In this case, the focal length of the zoom lens 13 is the second focal length f2. In other words, when the focal length of the zoom lens 13 is the second focal length f2, the second laser light source 12 is positioned to satisfy the Scheinproof condition. When the focal length of the zoom lens 13 is the second focal length f2, the angle of view φ2 of the zoom lens 13 corresponds to the second region Z2.
[0017] The zoom lens 13 is switchable between a first focal length f1 and a second focal length f2, with the second focal length f2 being longer than the first focal length f1.
[0018] For example, when the sensor 14 detects reflected light from an object 2 irradiated by the first laser beam L1, the focal length of the zoom lens 13 is the first focal length f1, and when the sensor 14 detects reflected light from an object 2 irradiated by the second laser beam L2, the focal length of the zoom lens 13 is the second focal length f2. In other words, when imaging an object 2 located in the first region Z1 (see Figure 1), which is a region near the imaging device 1, the zoom lens 13 sets its focal length to the first focal length f1, and when imaging an object 2 located in the second region Z2 (see Figure 1), which is a distant region (i.e., a region farther than the first region Z1), the zoom lens 13 sets its focal length to the second focal length f2. In other words, the first laser light source 11 is pre-configured to satisfy the Scheinproof condition when the first focal length f1 is used (when imaging an object 2 located in the first region Z1, which is a region near the imaging device 1), and the second laser light source 12 is pre-configured to satisfy the Scheinproof condition when the second focal length f2 is used (when imaging an object 2 located in the second region Z2, which is a distant region). Therefore, when the distance from the imaging device 1 to the object 2 changes, the focal length only needs to be changed. This makes it possible to maintain resolution or image resolution even when the distance from the imaging device 1 to the object 2 (i.e., the distance from the imaging device 1 to the object being imaged) changes, and it is possible to improve resolution or image resolution with a simpler configuration compared to conventional technology.
[0019] As shown in Figures 2 and 3, regardless of the focal length of the zoom lens 13, the tilt of the zoom lens 13, the tilt of the surface of the sensor 14, the position of the first laser light source 11, and the position of the second laser light source 12 are fixed. That is, the tilt θ of the zoom lens 13, the shineproof angle α formed by the surface of the sensor 14 and the main plane 13a of the zoom lens 13, the shortest distance b1 from the surface 14a of the sensor 14 to the first laser beam L1, and the shortest distance b2 from the surface 14a of the sensor 14 to the second laser beam L2 are fixed. The tilt θ of the zoom lens 13 is the angle of the optical axis 13b of the zoom lens 13 with respect to a straight line 13c parallel to the first laser beam L1 and the second laser beam L2.
[0020] Even if the distance from the imaging device 1 to the object being imaged changes during the imaging operation of the imaging device 1, it is not necessary to change the tilt θ of the zoom lens 13, the orientation (direction of laser light emission) and position of the first laser light source 11, or the orientation (direction of laser light emission) and position of the second laser light source 12. Therefore, during the imaging operation of the imaging device 1, resolution or image quality can be maintained with a simple configuration with few adjustment points without changing the tilt θ of the zoom lens 13, the orientation and position of the first laser light source 11, or the orientation and position of the second laser light source 12.
[0021] Figure 4 is a block diagram that schematically shows the configuration of the 3D analysis system 100. The 3D analysis system 100 includes an imaging device 1 and an analysis device 101 that can communicate with the imaging device 1.
[0022] The analysis device 101 acquires reflected light information (hereinafter referred to as "detection data") corresponding to the reflected light detected by the sensor 14 from the imaging device 1. The analysis device 101 performs three-dimensional measurement of the object 2 using the detection data and pre-measured data. In other words, the analysis device 101 performs three-dimensional measurement of the object 2 based on the detection data. The analysis device 101 is, for example, a computer. The pre-measured data is calibration data acquired in the "preparation" described later. Here, the calibration data is, for example, data used to correct aberrations of the zoom lens 13, or to correct positional information and relative angle information between the laser light source (or slit light source) and the sensor 14.
[0023] Figure 5 is a flowchart showing an example of the operation of the 3D analysis system 100. The operation of the 3D analysis system 100 shown in Figure 5 includes the imaging operation by the imaging device 1.
[0024] <Preparation> In step S11, the imaging range to be captured by the imaging device 1 is confirmed, and the specifications such as the required number of regions are determined. In step S12, parameters such as angle and focal length that satisfy the Scheinproof condition are determined. In step S13, the imaging device 1 is manufactured based on the parameters determined in step S12. In step S14, calibration data for 3D analysis is created using the imaging device 1 manufactured in step S13.
[0025] <Imaging Operation> In step S21, when the imaging device 1 starts the imaging operation, the imaging device 1 acquires positional information of the imaging device 1 or the object 2. For example, the positional information of the imaging device 1 or the object 2 may be acquired using a distance meter such as LiDAR (Light Detection And Ranging) or a laser rangefinder, or the positional information of the imaging device 1 or the object 2 may be acquired using GPS.
[0026] In step S22, the imaging device 1 determines the imaging area based on the position information acquired in step S21. For example, the imaging device 1 determines either the first area Z1 or the second area Z2 as the imaging area.
[0027] In step S23, the imaging device 1 sets the focal length according to the imaging area determined in step S22. When imaging the first area Z1, the imaging device 1 sets the focal length to the first focal length f1 and irradiates with the first laser beam L1. When imaging the second area Z2, the imaging device 1 sets the focal length to the second focal length f2 and irradiates with the second laser beam L2. In other words, the imaging device 1 (specifically, the zoom lens 13) switches the focal length of the zoom lens 13 between the first focal length f1 and the second focal length f2.
[0028] In this case, the first focal length f1 and the second focal length f2 may be automatically switched depending on the distance from the imaging device 1 (for example, the zoom lens 13, the sensor 14, the first laser light source 11, or the second laser light source 12) to the object 2, or the first focal length f1 and the second focal length f2 may be switched by an input from outside the imaging device 1. For example, when the first focal length f1 and the second focal length f2 are automatically switched, the switching may be done automatically based on an output from, for example, a counter or trigger mechanism of the imaging device 1. In such a case, the focal length can be automatically switched at a preset timing, and the switching can be easily performed when the focal length needs to be switched at periodic timings. Also, for example, when the first focal length f1 and the second focal length f2 are switched by an input from outside the imaging device 1, the first focal length f1 and the second focal length f2 may be automatically switched in conjunction with equipment provided outside the imaging device 1, such as a rangefinder or photometer. In such cases, it is possible to easily switch to an appropriate setting according to the surrounding environment.
[0029] For example, while object 2 is illuminated by the first laser beam L1, the second laser light source 12 is off, and while object 2 is illuminated by the second laser beam L2, the first laser light source 11 is off.
[0030] In step S24, the imaging device 1 uses the sensor 14 to detect reflected light from the object 2 irradiated with the first laser beam L1 or the second laser beam L2 through the zoom lens 13. As a result, the imaging device 1 can generate, output, or acquire an image of the object 2 irradiated with the first laser beam L1 or the second laser beam L2.
[0031] <3D analysis> The three-dimensional analysis method according to this embodiment comprises the imaging method described above and performing a three-dimensional analysis of the object 2 based on reflected light information (detection data) corresponding to the reflected light detected by the sensor 14. When performing 3D analysis, it is desirable to perform the 3D analysis of object 2 using detection data and pre-measured data (calibration data), as described below.
[0032] For example, in step S25, calibration is performed on the detection data obtained during the imaging operation (e.g., the output of sensor 14 and the image of object 2) using the calibration data prepared in advance.
[0033] In step S26, a three-dimensional analysis of the object 2 is performed using the analysis device 101 based on the accurate data obtained in step S25 after calibration. By performing the three-dimensional analysis, the analysis device 101 can measure the distance from the imaging device 1 to the object 2, the shape of the object 2, or changes thereto, and output the analysis results. As a result, the user can be informed of whether or not there have been any structural changes in the object 2.
[0034] <Usage example 1> An example of 3D analysis of the area above a railway is described below. For example, in a railway, the position of the structure (e.g., the trolley wire) as object 2 changes significantly depending on the presence or absence of tunnels. Therefore, as shown in Figures 6 and 7 described later, the imaging device 1 switches its focal length according to its position.
[0035] Figure 6 shows an example of the imaging operation of imaging device 1 installed on the roof of a railway vehicle traveling inside a tunnel. When performing a three-dimensional analysis of the area above the railway inside a tunnel, the object 2 located in the first region Z1, which is the area near the imaging device 1, is imaged. Therefore, the zoom lens 13 is set to the first focal length f1, and the first laser light source 11 emits the first laser beam L1.
[0036] While the railway vehicle is traveling through the tunnel, the first laser light source 11 is on and its focal length is maintained at the first focal length f1. While the railway vehicle is traveling through the tunnel, the imaging device 1 (specifically, the sensor 14) detects the reflected light from the object 2 illuminated by the first laser beam L1 through the zoom lens 13. This allows the imaging device 1 to acquire an image of the object 2 illuminated by the first laser beam L1.
[0037] Figure 7 shows an example of the imaging operation of the imaging device 1 installed on the roof of a railway vehicle traveling outside a tunnel. When performing a 3D analysis of the area above the railway outside the tunnel, the object 2 located in the second region Z2, which is a distant region, is imaged. Therefore, the zoom lens 13 is set to the second focal length f2, and the second laser light source 12 emits the second laser light L2. For example, when the railway vehicle exits the tunnel, the imaging device 1 turns off the first laser light source 11, turns on the second laser light source 12, and switches the focal length from the first focal length f1 to the second focal length f2.
[0038] While the railway vehicle is traveling outside the tunnel, the second laser light source 12 is on and its focal length is maintained at the second focal length f2. While the railway vehicle is traveling outside the tunnel, the imaging device 1 (specifically, the sensor 14) detects the reflected light from the object 2 illuminated by the second laser beam L2 through the zoom lens 13. This allows the imaging device 1 to acquire an image of the object 2 illuminated by the second laser beam L2.
[0039] When the railway vehicle re-enters the tunnel, the imaging device 1 turns off the second laser light source 12, turns on the first laser light source 11, and switches the focal length from the second focal length f2 to the first focal length f1. In other words, in the examples shown in Figures 6 and 7, the first laser light source 11 and the second laser light source 12 are switched on and off at the boundary between the inside and outside of the tunnel, and the focal length is switched between the first focal length f1 and the second focal length f2. This makes it possible to maintain resolution or image quality during the imaging operation of the imaging device 1 without changing the tilt θ of the zoom lens 13, the orientation and position of the first laser light source 11, and the orientation and position of the second laser light source 12.
[0040] <Usage example 2> An example of 3D analysis of a building's wall surface is described below. For example, in a building, the shape or structure of the wall surface as object 2 changes significantly depending on the presence or absence of structures such as eaves. Therefore, as shown in Figures 8 and 9 described later, the imaging device 1 switches its focal length according to its position.
[0041] Figure 8 shows an example of the imaging operation of imaging device 1 installed on a gondola traveling through an area where structures such as eaves exist. When performing a three-dimensional analysis of a wall surface containing structures such as eaves, the object 2 located in a first region Z1, which is the area near the imaging device 1, is imaged. For this purpose, the zoom lens 13 is set to a first focal length f1, and the first laser light source 11 emits a first laser beam L1.
[0042] While the gondola is traveling through an area where structures such as eaves exist, the first laser light source 11 is turned on and its focal length is maintained at the first focal length f1. While the gondola is traveling through an area where structures such as eaves exist, the imaging device 1 (specifically, the sensor 14) detects the reflected light from the object 2 illuminated by the first laser beam L1 through the zoom lens 13. This allows the imaging device 1 to acquire an image of the object 2 illuminated by the first laser beam L1.
[0043] Figure 9 shows an example of the imaging operation of imaging device 1 installed on a gondola traveling in an area without structures such as eaves. When performing a 3D analysis of an area without structures such as eaves, the object 2 located in a second area Z2, which is a distant area, is imaged. For this purpose, the zoom lens 13 is set to the second focal length f2, and the second laser light source 12 emits the second laser light L2. For example, when entering an area without structures such as eaves, the imaging device 1 turns off the first laser light source 11, turns on the second laser light source 12, and switches the focal length from the first focal length f1 to the second focal length f2.
[0044] While the gondola is traveling in an area without structures such as eaves, the second laser light source 12 is turned on and its focal length is maintained at the second focal length f2. While the gondola is traveling in an area without structures such as eaves, the imaging device 1 (specifically, the sensor 14) detects the reflected light from the object 2 illuminated by the second laser beam L2 through the zoom lens 13. This allows the imaging device 1 to acquire an image of the object 2 illuminated by the second laser beam L2.
[0045] When the gondola re-enters an area where structures such as eaves exist, the imaging device 1 turns off the second laser light source 12, turns on the first laser light source 11, and switches the focal length from the second focal length f2 to the first focal length f1. In other words, in the examples shown in Figures 8 and 9, the first laser light source 11 and the second laser light source 12 are switched on and off at the boundary between an area without structures such as eaves and an area with such structures, and the focal length is switched between the first focal length f1 and the second focal length f2. This makes it possible to maintain resolution or image quality during the imaging operation of the imaging device 1 without changing the tilt θ of the zoom lens 13, the orientation and position of the first laser light source 11, and the orientation and position of the second laser light source 12.
[0046] <Variation 1> In the above-described usage example, the first laser light source 11 and the second laser light source 12 are switched on and off, but both the first laser light source 11 and the second laser light source 12 may be turned on during the imaging operation of the imaging device 1. That is, during the imaging operation of the imaging device 1, the first laser light L1 and the second laser light L2 may be emitted from the first laser light source 11 and the second laser light source 12, respectively. In this case as well, when the imaging device 1 images an object 2 located in the first region Z1, the zoom lens 13 is set to the first focal length f1, and when the imaging device 1 images an object 2 located in the second region Z2, the zoom lens 13 is set to the second focal length f2.
[0047] <Variation 2> The imaging device 1 may have a first member capable of shielding the first laser beam L1 and a second member capable of shielding the second laser beam L2. Each of the first and second members is, for example, a cover, a screen, or a shield.
[0048] If the imaging device 1 has a first member capable of shielding the first laser beam L1 and a second member capable of shielding the second laser beam L2, then during the imaging operation of the imaging device 1, the first laser beam L1 and the second laser beam L2 may be emitted from the first laser light source 11 and the second laser light source 12, respectively. In this case, the imaging device 1 may have a mechanism (e.g., a motor, an actuator) for driving the first member and the second member, and may also have a control circuit for controlling the mechanism for driving the first member and the second member.
[0049] For example, when the imaging device 1 images an object 2 located in a first region Z1, the first member does not shield the first laser beam L1, the second member shields the second laser beam L2, and the zoom lens 13 sets its focal length to the first focal length f1. This allows the resolution or image quality to be maintained even when the first laser light source 11 and the second laser light source 12 are turned on. In other words, the resolution or image quality can be maintained without switching the first laser light source 11 and the second laser light source 12 on or off.
[0050] For example, when the imaging device 1 images an object 2 located in a second region Z2, the first member shields the first laser beam L1, the second member does not shield the second laser beam L2, and the zoom lens 13 is set to the second focal length f2. This allows the resolution or image quality to be maintained even when the first laser light source 11 and the second laser light source 12 are turned on. In other words, the resolution or image quality can be maintained without switching the first laser light source 11 and the second laser light source 12 on or off.
[0051] As described above, according to this embodiment, resolution or image quality can be increased with a simpler configuration compared to conventional technology. Furthermore, since the tilt of the zoom lens 13, the tilt of the surface of the sensor 14, the position of the first laser light source 11, and the position of the second laser light source 12 are fixed, the system is more resistant to vibrations than conventional technology, and the accuracy of measurement, imaging, or analysis can be improved.
[0052] The various aspects of this disclosure are summarized below as an appendix. (Note 1) A first slit light source that emits a first slit beam, A second slit light source that emits a second slit beam, A zoom lens that can switch between a first focal length and a second focal length longer than the first focal length, A sensor that detects reflected light from an object irradiated by the first or second slit light through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, the first slit light source is arranged to satisfy the shineproof condition. When the focal length of the zoom lens is the second focal length, the second slit light source is arranged to satisfy the shineproof condition. An imaging device characterized by the following features. (Note 2) When the sensor detects reflected light from the object irradiated by the first slit light, the focal length of the zoom lens is the first focal length. When the sensor detects reflected light from the object irradiated by the second slit light, the focal length of the zoom lens is the second focal length. The imaging apparatus described in Appendix 1, characterized by the features described herein. (Note 3) While the object is being illuminated by the first slit light, the second slit light source is off. While the object is being illuminated by the second slit light, the first slit light source is turned off. The imaging apparatus according to Appendix 1 or 2, characterized by the features described herein. (Note 4) The imaging apparatus according to any one of appendices 1 to 3, characterized in that the tilt of the zoom lens, the tilt of the surface of the sensor, the position of the first slit light source, and the position of the second slit light source are fixed. (Note 5) The imaging apparatus according to any one of the appendices 1 to 4, characterized in that the focal length is changed by electrically driving the zoom lens. (Note 6) The imaging device according to Appendix 5, characterized in that the first focal length and the second focal length are automatically switched according to the distance from the imaging device to the object. (Note 7) The imaging device according to any one of the appendices 1 to 5, characterized in that the first focal length and the second focal length are switched by an input from outside the imaging device. (Note 8) An imaging device described in any one of the appendices 1 to 7, The aforementioned imaging device and an analysis device capable of communicating with each other Equipped with, The analysis device acquires reflected light information corresponding to the reflected light detected by the sensor from the imaging device, and performs three-dimensional measurement of the object based on the reflected light information. A three-dimensional analysis system characterized by the following features. (Note 9) Irradiating with the first slit light, By irradiating with a second slit beam, Switching the focal length of a zoom lens between a first focal length and a second focal length that is longer than the first focal length, The sensor is used to detect reflected light from an object irradiated with the first or second slit light, through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, a first slit light source is arranged to emit the first slit light in such a way that the shineproof condition is satisfied. When the focal length of the zoom lens is the second focal length, a second slit light source is arranged to emit the second slit light in such a way that the shineproof condition is satisfied. An imaging method characterized by the following: (Note 10) When the sensor detects reflected light from the object irradiated by the first slit light, the focal length of the zoom lens is the first focal length. When the sensor detects reflected light from the object irradiated by the second slit light, the focal length of the zoom lens is the second focal length. The imaging method described in Appendix 9, characterized by the features described herein. (Note 11) While the object is being illuminated by the first slit light, the second slit light source is off. While the object is being illuminated by the second slit light, the first slit light source is turned off. The imaging method according to appendix 9 or 10, characterized by the features described herein. (Note 12) The imaging method according to any one of appendices 9 to 11, characterized in that the tilt of the zoom lens, the tilt of the surface of the sensor, the position of the first slit light source, and the position of the second slit light source are fixed. (Note 13) The imaging method according to any one of appendices 9 to 12, characterized in that the focal length is changed by electrically driving the zoom lens. (Note 14) The imaging method according to Appendix 13, characterized in that the first focal length and the second focal length are automatically switched according to the distance from the imaging device (zoom lens, sensor, first slit light source, or second slit light source) to the object. (Note 15) The imaging method according to any one of appendices 9 to 13, characterized in that the first focal length and the second focal length are switched by an input from outside the imaging device having the sensor and the zoom lens. (Note 16) The imaging method described in any one of the appendices 9 to 15, Based on the reflected light information corresponding to the reflected light detected by the sensor, a three-dimensional analysis of the object is performed. A three-dimensional analysis method characterized by comprising the following features. [Explanation of symbols]
[0053] 1 Imaging device, 2 Object, 11 First laser light source, 12 Second laser light source, 13 Zoom lens, 14 Sensor, 100 3D analysis system, 101 Analysis device, L1 First laser beam, L2 Second laser beam, f1 First focal length, f2 Second focal length
Claims
1. A first slit light source that emits a first slit beam, A second slit light source that emits a second slit beam, A zoom lens that can switch between a first focal length and a second focal length longer than the first focal length, A sensor that detects reflected light from an object irradiated by the first slit light or the second slit light through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, the first slit light source is arranged to satisfy the shineproof condition. When the focal length of the zoom lens is the second focal length, the second slit light source is arranged to satisfy the shineproof condition. An imaging device characterized by the following features.
2. When the sensor detects the reflected light from the object irradiated by the first slit light, the focal length of the zoom lens is the first focal length. When the sensor detects reflected light from the object irradiated by the second slit light, the focal length of the zoom lens is the second focal length. The imaging apparatus according to feature 1.
3. While the object is being illuminated by the first slit light, the second slit light source is off. While the object is being illuminated by the second slit light, the first slit light source is turned off. The imaging apparatus according to claim 1 or 2.
4. The imaging apparatus according to claim 1 or 2, characterized in that the tilt of the zoom lens, the tilt of the surface of the sensor, the position of the first slit light source, and the position of the second slit light source are fixed.
5. The imaging apparatus according to claim 1 or 2, characterized in that the focal length is changed by electrically driving the zoom lens.
6. The imaging device according to claim 5, characterized in that the first focal length and the second focal length are automatically switched according to the distance from the imaging device to the object.
7. The imaging device according to claim 1 or 2, characterized in that the first focal length and the second focal length are switched by an input from outside the imaging device.
8. The imaging apparatus according to claim 1 or 2, The aforementioned imaging device and an analysis device capable of communicating with each other Equipped with, The analysis device acquires reflected light information corresponding to the reflected light detected by the sensor from the imaging device, and performs three-dimensional measurement of the object based on the reflected light information. A three-dimensional analysis system characterized by the following features.
9. Irradiating with the first slit light, By irradiating with a second slit beam, Switching the focal length of a zoom lens between a first focal length and a second focal length that is longer than the first focal length, The sensor is used to detect reflected light from an object irradiated with the first or second slit light, through the zoom lens. Equipped with, When the focal length of the zoom lens is the first focal length, a first slit light source is arranged to emit the first slit light in such a way that the shineproof condition is satisfied. When the focal length of the zoom lens is the second focal length, a second slit light source is arranged to emit the second slit light in such a way that the shineproof condition is satisfied. An imaging method characterized by the following:
10. When the sensor detects reflected light from the object irradiated by the first slit light, the focal length of the zoom lens is the first focal length. When the sensor detects reflected light from the object irradiated by the second slit light, the focal length of the zoom lens is the second focal length. The imaging method according to feature 9.
11. While the object is being illuminated by the first slit light, the second slit light source is off. While the object is being illuminated by the second slit light, the first slit light source is turned off. The imaging method according to claim 9 or 10.
12. The imaging method according to claim 9 or 10, characterized in that the tilt of the zoom lens, the tilt of the surface of the sensor, the position of the first slit light source, and the position of the second slit light source are fixed.
13. The imaging method according to claim 9 or 10, characterized in that the focal length is changed by electrically driving the zoom lens.
14. The imaging method according to claim 13, characterized in that the first focal length and the second focal length are automatically switched according to the distance from the sensor or the zoom lens to the object.
15. The imaging method according to claim 9 or 10, characterized in that the first focal length and the second focal length are switched by an input from outside the imaging device having the sensor and the zoom lens.
16. The imaging method according to claim 9 or 10, The three-dimensional analysis of the object is performed based on the reflected light information corresponding to the reflected light detected by the sensor. A three-dimensional analysis method characterized by comprising the following features.