Test systems that use vibration to position devices;

Abstract

An exemplary test system includes a tray for holding devices, including devices under test or tested devices; a motor that is controllable to cause vibrations; and components that couple the motor to the tray to vibrate the tray in response to vibrations of the motor.

Description

[Technical field]

[0001] This disclosure generally relates to the use of focused vibration to position devices in test systems. [Background technology]

[0002] Test systems are configured to test the operation of electronic devices such as microprocessors and memory chips. The testing may involve sending a signal to the device and determining how the device reacted to the signal based on its response. The device's reaction determines whether the device passed or failed the test. Summary of the Invention [Means for solving the problem]

[0003] An exemplary test system includes a tray for holding devices, including devices under test or tested devices, a motor that is controllable to induce vibrations, and components coupling the motor to the tray for vibrating the tray in response to vibrations of the motor. The test system may include one or more of the following features, either alone or in combination.

[0004] The part may be configured to hold the motor against the tray for coupling the motor directly to the tray. An exemplary test system may include a frame for holding the tray. The part may be configured to hold the motor against the frame for coupling the motor to the tray via the frame. The part may be flexible and configured to flex and move away from the tray upon contact with the tray.

[0005] The tray may include receptacles, each configured to hold a device. The vibration may be calibrated to accommodate misplaced devices within the receptacle. The exemplary test system may also include a power source to power the motor. The motor may include an eccentric mass. The exemplary test system may include a control system that sets a voltage input to the motor to control the rotational speed of the eccentric mass, cause vibrations at a particular frequency and amplitude, and set a duration of operation of the motor. The voltage may be between 3 volts and 4 volts, and the duration of operation may be between 1 second and 3 seconds.

[0006] The exemplary test system may also include a feeder that moves the tray containing the untested devices to a predetermined position adjacent to the motor. The control system may be configured to control operation of the motor to cause the vibrations after the feeder is moved to the predetermined position. As previously mentioned, the exemplary test system may also include a frame for holding the tray. The feeder may be configured to move the frame that holds the tray so that the tray is in position relative to the motor. The feeder may include a belt for moving the tray and a pressing device for pressing the tray against a surface of the frame. The tray may be part of a cassette of multiple trays. The tray may be movable up and down within the cassette relative to the surface holding the test system.

[0007] The control system may be configured to cause operation of the motor based on a total mass of the devices in the tray. The feeder may be configured to move the tray containing the tested devices away from the motor. The control system may be configured to cause operation of the motor before the feeder is moved away from the motor. The feeder may be configured to move the tray containing the tested devices away from the motor and may be configured to move the tray containing the tested devices towards the motor. The control system may be configured to cause operation of the motor before the feeder is moved away from the motor and after the tray has been moved towards the motor.

[0008] The exemplary test system may also include a test carrier for holding at least some of the devices; a device shuttle for transporting at least some of the devices between the tray and the test carrier; and a first robot for moving at least some of the devices between the test carrier and the device shuttle. The device shuttle may be configured to move a first device, which has not been tested among the devices, toward a stage of the test system including the first robot. The device shuttle may be configured to move in a first dimension. The first robot may be configured to move the first device from the device shuttle to the test carrier. The first robot may be configured to move in a second dimension, different from the first dimension. The second robot may be configured to move at least some of the devices between the tray and the device shuttle. The exemplary test system may also include a second robot for moving the first device from the first tray to the shuttle and for moving a second device, which has been tested, from the shuttle to a second tray.

[0009] The tray may be a first tray; the motor may be a first motor; and the part may be a first part. The exemplary test system may also include a second tray that holds the device; a second motor that is controllable to cause vibrations; and a second part that couples the second motor to the second tray to vibrate the second tray in response to vibrations of the second motor. The exemplary test system may also include a third tray that holds the device; a third motor that is controllable to cause vibrations; and a third part that couples the third motor to the third tray to vibrate the third tray in response to vibrations of the third motor. The first tray, the second tray, and the third tray may be arranged in parallel within the test system.

[0010] Any two or more of the features described herein, including this Summary, may be combined to form an implementation not specifically set forth herein.

[0011] The systems and techniques and processes described herein, or portions thereof, may be implemented as / controlled by a computer program product that includes instructions stored on one or more non-transitory machine-readable storage media and that are executable on one or more processing devices to control (e.g., coordinate) the operations described herein. The systems and techniques and processes described herein may be implemented as apparatuses, methods or electronic systems that may include one or more processing devices and memory that stores executable instructions for performing various operations.

[0012] The details of one or more implementations are set forth in the accompanying drawings and the following description. Other features, objects, and advantages will become apparent from the description and accompanying drawings, and from the claims. [Brief description of the drawings]

[0013] [Figure 1] FIG. 1 is a perspective view of an exemplary test system. [Diagram 2] 2A-2C are perspective views illustrating example internal components of the test system of FIG. 1 in various configurations during operation. [Diagram 3] 2A-2C are perspective views illustrating example internal components of the test system of FIG. 1 in various configurations during operation. [Figure 4] FIG. 4 is a perspective view of a portion of an example assembly including components for applying vibration to a test tray in the example system of FIGS. 1-3. [Diagram 5] FIG. 4 is an exploded view of some portions of the assembly shown in FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0014] Like reference numbers in the various drawings indicate like elements.

[0015] Described herein are exemplary implementations of a carrier-based test system. An exemplary carrier-based test system includes a carrier having, among other components, one or more test sockets that each house a device to be tested. The devices being tested are referred to as device under test, or DUTs. DUTs may be loaded into and removed from the test system by using trays, such as JEDEC (Joint Electron Device Engineering Council) trays. For example, a transport robot may be configured and controllable to place tested devices into the trays and remove untested devices from the trays for testing. Each tray may include multiple bins (also called "nests"). The bins may be sized to house the DUTs being tested. However, the alignment of the transport robot to each bin may not always be perfect, resulting in one or more of the DUTs being off-center or rotated within the bin. Mishandling of the untested DUTs by a technician may also result in one or more of the DUTs being off-center within the bin. To address this (e.g., to improve positioning of the DUTs within the tray receptacles), the trays can be subjected to focused and controllable vibration. For example, a rotary vibration motor can be physically coupled directly or indirectly to the tray. Operation of the motor for an appropriate time and at an appropriate frequency causes movement of the DUTs within their respective receptacles. This movement of the DUTs properly seats all or some of the DUTs within their respective receptacles. As a result, all or some of the DUTs can be better positioned within their respective trays for removal by a robot or other automated component of the test system.

[0016] The concepts described herein are not limited to use with the test systems or tests described herein generally, but rather, the concepts may be applied in any suitable technical context.

[0017] 1, 2, and 3, the exemplary test system 10 includes five stages (or zones) per automated test subsystem; however, any suitable number of stages may be included in the test system. In this regard, the exemplary test system is modular, allowing the test system to address a variety of test requirements. Each unit of the test system is referred to as a slice. Two or more slices may be combined and controlled to operate cooperatively (e.g., dependently) or independently to perform a test operation.

[0018] In an exemplary implementation, the five stages include an input / output (I / O) stage 14, a transport stage 17, a loading stage 18, an insertion stage 19, and a test stage 20. The definitions of the various stages are not meant to be limiting, and one or more components may perform functions in more than one stage. In some implementations, the various stages are configured to operate with different levels of precision. For example, a high level of precision (e.g., down to the micrometer level) may be used in the loading stage, while a lower level of precision may be used in some or all of the other stages. System components, such as mechanical components, may be configured for operation within tolerances that allow a lower level of precision in some stages. By committing high precision to stages that may require it, the cost and complexity of the test system may be controlled in some cases.

[0019] A computer system 45 communicates with test system 10 to control and coordinate the operation of test system 10. Computer system 45 may include one or more processing devices, examples of which are described herein. Communication between test system 10 and computer system 45 is represented by dashed arrow 46.

[0020] The various stages of the test system can operate independently and simultaneously. In the example of Figure 2, each stage includes two parallel paths 21 and 22. Each of the parallel paths includes automation, such as a robot, to pass trays, carriers, devices, or both between adjacent stages. The operation of the various stages independently, simultaneously, and in parallel paths can support higher test throughput and speed than some similar test systems.

[0021] In the example of FIG. 1, the I / O stage 14 includes, but is not limited to, feeders for receiving trays of tested devices and for providing trays of untested devices to the test system. The feeders are where a human operator interacts with the tester system. As noted above, examples of trays that may be used include JEDEC trays; however, the system may use any suitable type of tray. In the example of FIG. 1, there are three feeders 23, 24, 25 per slice; however, the system is not limited to use with three feeders. The first feeder 23 is for trays containing untested devices; the second feeder 24 is for trays containing tested devices that have not passed testing, and the third feeder 25 is for trays containing devices that have passed testing. In this example, the feeder 23 is manually loaded with trays of untested devices. One tray of the stack of trays containing untested devices is provided from the feeder 23 to the transport stage 17. After all devices on the tray have been transferred for testing and the tray is empty, the tray is withdrawn into the feeder and a new tray containing untested devices is provided to the transport stage. After devices are loaded onto the tray following testing and the tray is full (in some implementations), the tray is withdrawn into the feeder and a new empty tray is provided from the I / O stage (from either feeder 24 or 25) to the transport stage. In some implementations, the operation of feeders 24 and 25 may be the same for trays containing devices that have passed testing and trays containing devices that have not passed testing. In some implementations, the trays handled by feeder 24 are part of a cartridge that contains multiple trays that move up and down within the feeder. Devices may be binned onto the various trays handled by feeder 24 based on why those devices failed testing. Exemplary bins are physical and logical locations that separate devices for post-test sorting.Thus, in the case of feeder 24, the feeder may feed a first tray containing tested devices into the system, remove the first tray after the tested devices have been added, feed a second tray into the system, remove the second tray after the tested devices have been added, and feed the first tray back into the system to accommodate in the first tray any devices that failed testing for the same reason as the other devices.

[0022] 4 and 5 show parts of an example assembly 72 that may be incorporated into I / O stage 14 to hold trays, such as trays 34, 35, and 36 of FIGS. 2 and 3. FIG. 4 shows a perspective view of a portion of assembly 72 (cut away at line 73), and FIG. 5 shows a partially exploded view of a portion of assembly 72. In assembly 72, tray 74 (which may be, for example, trays 34, 35, and 36 of FIGS. 2 and 3) includes a two-dimensional array of containers 75 for holding tested DUTs, untested DUTs, or both tested and untested DUTs. In some implementations, the tray may include a one-dimensional array of containers. In some implementations, the tray may include a three-dimensional array of containers.

[0023] Assembly 72 includes a frame 76 that holds trays 74. The frame includes belts 80 (only one belt is visible in FIG. 4) that are controllable to move the trays in the directions of arrows 82 and 83. When fully extended in the direction of arrow 82, as shown in FIGS. 4 and 5, the trays are in the positions indicated by trays 34, 35, and 36 in FIGS. 2 and 3. When in the positions indicated by trays 34, 35, and 36 in FIGS. 2 and 3, transport robot 30, described below, may remove untested DUTs from the trays or add tested DUTs to the trays, as also described below. When moved in the direction of arrow 83, the trays are retracted into their corresponding feeders, such as feeders 23, 24, or 25. A new tray may then be introduced into the system by movement in the direction of arrow 82.

[0024] As shown in FIGS. 4 and 5, the assembly 72 includes a motor 84 that is controllable to induce vibration. For example, the motor may be controlled by a computer system 45, which may control the tester system. In some implementations, the motor includes an eccentric mass. The computer system may be configured to set a voltage input to the motor to control the rotational speed of the eccentric mass to induce vibration and to set the duration of operation of the motor. The magnitude or amplitude, frequency, and duration of the vibration will depend on the physical characteristics of the tray and the DUT. For example, the magnitude or amplitude, frequency, and duration of the vibration may depend on and be set based on the size of the DUT, the size of the container, the size of the DUT relative to the size of the container, the weight of the tray, the weight of the tray when the DUT is added, etc.

[0025] In any case, the magnitude, frequency, and duration of the vibration should be sufficient to move the individual DUTs within their respective containers, but not sufficient to move the individual DUTs out of their respective containers. For example, the magnitude, frequency, and duration of the vibration may be sufficient to cause all or some of the individual DUTs to fit within their respective containers. For example, the vibration may be calibrated to cause misplaced devices within the containers to fit within the containers. For example, the magnitude, frequency, and duration of the vibration may be sufficient to cause all or some of the individual DUTs to fit within their respective containers, such that the approximate center of each DUT is aligned with the approximate center of the corresponding container. The DUTs may also rotate about their centers to properly orient themselves with the containers.

[0026] In an exemplary implementation, the motor 84 is a coin cell motor. In one example, the coin cell motor includes a printed circuit board (PCB) that includes a three-pole commutation circuit around the motor's central internal shaft. Two voice coils and an eccentric mass are assembled into a flat plastic disk with a bearing in its center. This arrangement is mounted on the shaft. Brushes on the underside of the plastic disk contact the PCB commutation pads and provide power to the voice coil. This creates a magnetic field. This field interacts with the magnetic flux created by a disk magnet that is attached to the motor's chassis. The commutation circuit alternates the direction of the magnetic field through the voice coil. This alternating magnetic field interacts with a north / south pole pair that is part of the magnet. This causes the plastic disk to rotate. The eccentric mass within the disk thus rotates and creates vibrations. These vibrations are transferred to the motor housing. In some implementations, the coin cell motor operates for 1 to 3 seconds using a voltage that is between 3 and 4 volts. In some implementations, the coin cell motor operates for different periods of time by using different voltages. A power supply (not shown) may be included to provide power to the motor.

[0027] Arrangement 72 also includes components such as an arm 85 that couples motor 84 to tray 74 to vibrate the tray in response to vibrations of the motor. The coupling between the motor and tray can be direct. For example, the motor can be in direct contact with the tray. In this case, vibrations of the motor are transferred directly to the tray. The coupling between the motor and tray can be indirect. For example, there can be one or more components, such as a frame 76, between the motor and the tray. In this case, vibrations from the motor are transferred to the tray via one or more components, such as the frame 76, between the tray and the motor.

[0028] In the example of FIG. 4, the arm 85 is physically connected to the frame 76. The arm 85 carries a motor on a side 86 of the arm that faces the tray 74. In this example, the frame 76 includes an opening 88 at its end 89. As a result, when moved to the position shown in FIGS. 4 and 5, the tray 74 has direct access to and is in contact with the motor 84. Thus, the motor is in direct contact with the tray 74. However, in some implementations, the motor may not be able to directly contact the tray. For example, the motor may be located on a side 90 or 91 of the frame 76. Alternatively, the frame 76 may completely surround the tray. In these examples, which constitute an indirect coupling between the motor and the tray, vibrations are transferred from the motor to the frame and then to the tray.

[0029] In some implementations, the arm is flexible and configured to bend away from the tray upon contact with the tray. For example, the arm may be made of bendable plastic, rubber, aluminum, composite, or other suitable material that bends back to its original position. In some implementations, the arm may be spring loaded. In operation, as the tray advances in the direction of arrow 82, it eventually contacts a motor 84 mounted on arm 85. The arm bends in response to this contact and presses the motor against the tray. In some implementations, for example where a frame surrounds the tray, the arm holds the motor against the frame to couple the motor to the tray through the frame.

[0030] In some implementations, the frame 76 includes members 92 made of a flexible material. The members 92 apply a diagonal force to the tray 74 in the direction of arrow 94. The amount of force is sufficient to bias the tray against the frame and arms without preventing the tray from moving within the frame. The amount of force required will vary based on factors such as the size, shape and weight of the tray, the existing compliance between the tray and the frame, the shape of the frame, and the flexibility of the arms. Other factors may also affect the amount of force that may be required.

[0031] In some implementations, the motor is activated to induce vibration when the tray is in the position shown in Figure 4. For example, if the tray contains untested DUTs, vibration is activated when the tray is in the position shown in Figure 4 to cause the untested devices to fall into the tray receptacles. For example, if the tray contains tested DUTs, vibration is activated when the tray is in the position shown in Figure 4 to cause the tested devices to fall into the tray receptacles. The tray containing the test DUTs can then be withdrawn into the feeder as described herein and replaced with a new empty tray or a different tray containing some tested DUTs and unoccupied receptacles to accommodate additional tested DUTs.

[0032] In some implementations, the motor may be actuated at times different than those described above. For example, in some implementations where the motor contacts the frame, vibration may be induced at any suitable time. For example, vibration may be induced when the tray is in the location shown in FIG. 4. Vibration may be induced when the tray travels from the feeder to the location shown in FIG. 4. Vibration may be induced when the tray is initially introduced into the system, for example, adjacent to the feeder.

[0033] As described herein, in some implementations, the system may include three trays arranged in parallel, each having the assembly shown in Figures 2 and 3. In some implementations, there may be less than two trays or more than two trays.

[0034] 2 and 3, the transport stage 17 includes, but is not limited to, a transport robot 30 (e.g., FIG. 2) and two device shuttles 31, 32 (e.g., FIG. 3). The two device shuttles provide both parallel transport paths into and out of the loading stage 18 described below, as well as aiding in test throughput and redundant reliability in some examples. The transport robot 30 is controllable to pick up untested devices from a tray 34 (e.g., FIG. 2) and place them on the device shuttles 31 and / or 32 (e.g., FIG. 3). The transport robot 30 is controllable to pick up tested devices from the device shuttles 31 and 32 and place them in the appropriate one of the trays 35 or 36 depending on whether the particular device passed or failed the test. In some implementations, the transport robot 30 may pick up and hold the devices via air suction or by using mechanical grips or other mechanical mechanisms. Following operation of the transport robot, vibrations may be introduced into the trays as described with respect to FIGS. 4 and 5.

[0035] In some implementations, the two device shuttles may be configured and controlled to operate in parallel, independently, contemporaneously, and / or simultaneously. For example, a transport robot may provide a device under test to one device shuttle while removing a tested device from another device shuttle. The two device shuttles may be configured to move independently, in parallel, contemporaneously, and / or simultaneously between a loading stage and a transport stage. For example, one device shuttle may transport a device under test from the transport stage towards and to the loading stage, while the other device shuttle transports a tested device away from the loading stage and to the transport stage. In addition, one device shuttle may be stationary while the other device shuttle is moving. For example, one device shuttle may receive a device under test while the other device shuttle transports a device to or from the loading stage.

[0036] In some implementations, the loading stage 18 includes, without limitation, loading robots 48, 49 and areas for loading devices into and unloading devices from test carriers (such as 50 and 51). In this example, there are two loading robots per slice; however, the test system may include any suitable number of loading robots. In this example, the loading robots 48, 49 are configured to move in the X and Z dimensions to perform pick-and-place operations on the devices. For example, untested devices are picked up from a shuttle and moved into a carrier for testing, and tested devices are picked up from a carrier and moved to the shuttle.

[0037] In the examples of Figures 2 and 3, two test arms 77, 78 per slice are shown; however, the test system may include any suitable number of test arms. The test arms are capable of moving (including rotating and flipping) in all three dimensions (X, Y and Z) to insert test carriers containing untested devices into test slots in a test rack, and to extract or remove test carriers containing tested devices from test slots in a test rack. Carriers containing tested devices are returned to the loading stage, where the devices are unloaded onto the shuttle by the loading robot.

[0038] Each test arm is configured to hold two test carriers simultaneously, one on each face or side of the test arm. In some implementations, each side of the test arm (e.g., 77 or 78) includes a carrier holding receptacle (such as a gripper) for receiving, holding, and releasing the test carriers. In one example, the grippers are spring loaded to receive test carriers containing untested devices from a carrier shuttle and release test carriers containing tested devices to a (same or different) carrier shuttle. The carrier shuttle may be configured to control the opening and closing of each gripper. A carrier shuttle 82 may move the carriers between the test arm and a loading position.

[0039] Test rack 70 includes a number of test slots. Carriers 71 are shown inside corresponding slots in the test rack. Each test slot may be configured and controllable to test devices in test sockets on the test carriers and report the test results to a computer system that controls the test system. The computer system tracks which devices have passed the test and which have failed, sorts the devices accordingly, and reports the test results. Test slots in a test rack are serviced by test arms. In some implementations, during testing, a test slot remains occupied at all times except for a short period of time during which a test carrier is swapped in the test slot. For example, a test arm 77 or 78 may reach a test slot while holding a test carrier containing an untested device, extract a test carrier containing a tested device from the test slot, and insert a test carrier containing an untested device into the same test slot from which the other test carrier was extracted. Thus, the test slot remains occupied except for the time between removal and insertion of a test carrier. Each test slot in a test rack may be serviced in this manner to enhance testing throughput. Examples of how test carriers are inserted and extracted are provided below.

[0040] During operation, the test arm 77 or 78 moves (e.g., flips and rotates) to pick up a test carrier with an untested device from a carrier shuttle (such as carrier shuttle 50) and to position itself to place a test carrier with a tested device onto a (same or different) carrier shuttle. In this example, the test carrier rotates (e.g., about 170°) and flips. The rotation is about the longitudinal axis of the test arm, and the flip includes a rotation in the X dimension. As a result of this movement, an empty first gripper on the test arm is in a predetermined position to pick up a test carrier with an untested device from the carrier shuttle. Thus, the first gripper is controlled to pick up a test carrier with an untested device from the carrier shuttle. The test arm then rotates along its longitudinal axis at a point on or near the carrier shuttle to position the test carrier with the tested device for accumulation on the carrier shuttle. The second gripper on the test arm holding the test carrier opens, so that the test carrier with the tested device is accumulated on the carrier shuttle. The carrier shuttle then transports the test carriers containing the tested devices to the loading stage.

[0041] Thus, at this time, the second gripper is empty and the first gripper holds a test carrier containing untested devices. The test arm then rotates and flips to position it to service the test slot. The test arm may also move vertically to position itself in front of the target test slot to be serviced. This rotation and flip is opposite to the rotation and flip performed to position the test arm over the carrier shuttle. The test arm is thus positioned to extract or receive the test carrier containing the tested device from the target test slot. The test carrier containing the tested device is received into the previously empty second gripper. Following the reception of the test carrier containing the tested device, the test arm rotates to position the test carrier (containing the untested device) in the first gripper in a position for insertion into the same test slot. The test carrier containing the untested device is then pushed into that test slot and the above operation is repeated for each slot.

[0042] An example implementation of a system including some of the features of FIGS. 1-3 is described in U.S. Patent Application Publication No. 2019 / 0064305, entitled "Calibration Process For An Automated Test System," filed Aug. 28, 2017, which is incorporated herein by reference. For example, the robot and other components of input / output (I / O) stage 14, transport stage 17, loading stage 18, insertion stage 19, and test stage 20 may be implemented in a manner similar to that described in U.S. Patent Application Publication No. 2019 / 006430. 5 No. 6,349,363, filed on Dec. 23, 2003, which is incorporated herein by reference.

[0043] A carrier-based test system may be, but is not necessarily, a system-level test (SLT) system. System-level testing involves testing the entire device rather than its individual components. If the device passes a series of system-level tests, it is assumed that the individual components of the device are working correctly. SLT has become more prevalent as the complexity of devices and the number of components within a device have increased. For example, a chip-implemented system such as an application-specific integrated circuit (ASIC) may be tested at the system level to determine that the components that comprise the chip are functioning correctly.

[0044] The exemplary systems described herein may be implemented and / or controlled using one or more computer systems including hardware or a combination of hardware and software. For example, a system as described herein may include various controllers and / or processing devices located at various points within the system to control the operation of the automated elements. A central computer may coordinate the operation among the various controllers or processing devices. The central computer, controllers, and processing devices may execute various software routines to control and coordinate the various automated elements.

[0045] The example systems described herein may be controlled, at least in part, by the use of one or more computer program products, e.g., one or more computer programs tangibly embodied in one or more information carriers, such as one or more non-transitory machine-readable media, for execution by or to control the operation of one or more data processing devices (e.g., programmable processors, computers, multiple computers and / or programmable logic components).

[0046] A computer program may be written in any type of programming language, including compiled or interpreted languages, and may be deployed in any form, including a stand-alone program, or a module, component, subroutine, or other unit suitable for use in a computing environment. A computer program may be deployed to be executed on one computer or multiple computers at one site, or may be distributed across multiple sites and interconnected by a network.

[0047] The actions associated with performing all or a portion of the testing may be performed by one or more programmable processors executing one or more computer programs to perform the functions described herein. All or a portion of the testing may be performed using special purpose logic circuitry, such as field programmable gate arrays (FPGAs) and / or application-specific integrated circuits (ASICs).

[0048] Processors suitable for executing computer programs include, by way of example, both general purpose and special purpose microprocessors, and one or more processors of any type of digital computer. Typically, a processor receives instructions and data from a read-only or random access storage area, or both. Elements of a computer (including a server) include one or more processors for executing instructions, and one or more storage area devices for storing instructions and data. Typically, a computer also includes, or is operatively coupled to receive data from, transmit data to, or both, one or more machine-readable storage media, such as a mass storage device for storing data (e.g., magnetic, magneto-optical, or optical disks, etc.). Machine-readable storage media suitable for embodying computer program instructions and data include, by way of example, all types of non-volatile storage areas, including, by way of example, semiconductor storage area devices, such as EPROM, EEPROM, and flash storage area devices; magnetic disks, such as internal hard disks or removable disks; magneto-optical disks; and CD-ROM and DVD-ROM disks.

[0049] Any "electrical connection" as used herein may mean a direct physical connection, or a wired or wireless connection that allows electrical signals to flow between connected parts, with or without intervening parts. Any "connection" that involves electrical circuitry that allows signals to flow is an electrical connection unless expressly stated otherwise, but is not necessarily a direct physical connection, regardless of whether the term "electrical" is used to modify the "connection."

[0050] Elements of the various implementations described herein may be combined to form other embodiments not specifically described above. Elements may be omitted from the structures described herein without adversely affecting their operation. Additionally, various individual elements may be combined into one or more individual elements to perform the functions described herein.

Claims

1. 1. A test system comprising: a tray including a plurality of containers for holding devices, including devices under test or devices that have been tested; a motor that is controllable to induce vibration; a component coupling the motor to a side of the tray to vibrate the tray in response to the vibration of the motor; Including, the side of the tray surrounds the plurality of containers; the part is an arm, the arm holds the motor on one side of the arm, A testing system, wherein the arm is flexible and configured to bend and move away from the tray upon contact with the tray.

2. The test system of claim 1 , wherein the component is configured to hold the motor relative to the tray for directly coupling the motor to the tray.

3. further comprising a frame for holding the tray; The test system of claim 1 , wherein the component is configured to hold the motor relative to the frame to couple the motor to the tray through the frame.

4. the tray is a first tray, the motor is a first motor, the part is a first part, The test system comprises: a second tray for holding the devices; a second motor controllable to induce vibration; a second part coupling the second motor to the second tray to vibrate the second tray in response to the vibration of the second motor; and The test system of claim 1 further comprising:

5. a third tray for holding the devices; a third motor that is controllable to induce vibration; and a third component coupling the third motor to the third tray to vibrate the third tray in response to the vibration of the third motor; and Further comprising: The test system of claim 4 , wherein the first tray, the second tray, and the third tray are arranged in parallel within the test system.

6. 10. The test system of claim 1, wherein the vibration is calibrated to accommodate misplaced devices in a container within the container.

7. The test system of claim 1 further comprising a power supply for powering the motor.

8. the motor includes an eccentric mass; 2. The test system of claim 1, further comprising a control system that sets a voltage input to the motor to control the rotational speed of the eccentric mass, cause the vibration at a specific frequency and amplitude, and set a period of operation of the motor.

9. 9. The test system of claim 8, wherein the voltage is between 3 volts and 4 volts and the duration is between 1 second and 3 seconds.

10. 10. The testing system of claim 1, further comprising a feeder that moves the tray containing untested devices into position adjacent the motor.

11. The test system of claim 10 , further comprising a control system that controls operation of the motor to cause the vibrations after the feeder is moved to the predetermined position.

12. further comprising a frame for holding the tray; the feeder is configured to move the frame holding the tray so that the tray is in a predetermined position relative to the motor; The test system of claim 10 , wherein the feeder includes a belt for moving the tray and a pressing device for pressing the tray against a surface of the frame.

13. 10. The test system of claim 1, wherein the tray is part of a multiple tray cassette and is movable up and down within the cassette relative to a surface holding the test system.

14. The test system of claim 1 , further comprising a control system that causes operation of the motor based on a total mass of devices in the tray.

15. The test system of claim 1 , further comprising a feeder that moves the tray containing the tested devices away from the motor.

16. The test system of claim 10 , further comprising a control system that causes operation of the motor before the feeder is disengaged from the motor.

17. 10. The test system of claim 1, further comprising a feeder for moving the tray containing the tested devices away from the motor and for moving the tray containing the tested devices towards the motor.

18. 11. The test system of claim 10, further comprising a control system that causes operation of the motor before the feeder is moved away from the motor and after the tray is moved towards the motor.

19. a test carrier for holding at least some of said devices; a device shuttle for transporting at least some of the devices between the tray and the test carrier; a first robot for moving at least some of the devices between the test carrier and the device shuttle; Further comprising: the device shuttle is configured to move a first one of the untested devices in a first dimension toward a stage of the test system including the first robot; The test system of claim 1 , wherein the first robot is configured to move the first device from the device shuttle to the test carrier in a second dimension different from the first dimension.

20. 20. The test system of claim 19, further comprising a second robot that moves at least some of the devices between the tray and the device shuttle.

21. the tray is a first tray, The test system further comprises: a second tray for holding the devices; a second robot for moving the first device from the first tray to the device shuttle and for moving a second device from the device shuttle to the second tray among the devices being tested; 20. The test system of claim 19, comprising:

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