High frequency device calibration method

Abstract

To provide a radio frequency (RF) device calibration method.SOLUTION: A method includes: obtaining a measurement result for one channel of a first-stage device under one control condition; obtaining a reference measurement result for a reference channel of a second-stage device, wherein the channel corresponds to the reference channel, and the measurement result and the reference measurement result are measured before the first-stage device and the second-stage device are assembled into an RF device; determining an estimated measurement result corresponding to the channel based on the measurement result and the reference measurement result; obtaining a post-assembly measurement result for the channel of the RF device under the control condition after the first-stage device and the second-stage device have been assembled into the RF device; and performing a calibration operation corresponding to the channel based on the estimated measurement result and the post-assembly measurement result.SELECTED DRAWING: Figure 3

Description

[Technical field]

[0001] The present invention relates to high frequency technology, and more particularly to a method for calibrating high frequency devices. [Background technology]

[0002] Please refer to Fig. 1. Fig. 1 is a schematic diagram of a multi-stage radio frequency (RF) device. In Fig. 1, an RF device 10 may include RF elements RFU1 to RFUN belonging to a first stage and a multiplexer 11 belonging to a second stage. Each of the RF elements RFU1 to RFUN may be, for example, an RF circuit board, and the RF circuit board may have one or more (RF) channels. In addition, the multiplexer 11 may be, for example, but is not limited to, a power divider or power combiner having one or more (RF) channels. Summary of the Invention [Problem to be solved by the invention]

[0003] For an RF device, errors due to crosstalk between multiple groups of RF signals and / or matching between multi-stage elements need to be suppressed or reduced by calibration. Generally, when an RF device 10 is calibrated, the RF elements RFU1 to RFUN and the multiplexer 11 need to be first assembled into the RF device 10, and then the RF device 10 needs to be calibrated as a whole. However, this approach takes a lot of time and is inefficient. [Means for solving the problem]

[0004] Therefore, the present invention provides a radio frequency (RF) device calibration method used to solve the above technical problems.

[0005] One embodiment of the present invention provides an RF device calibration method, which includes: obtaining a first measurement result of a first channel of a first stage device under first control conditions, obtaining a first reference measurement result of a first reference channel of a second stage device, where the first channel corresponds to a first reference channel, and the first measurement result and the first reference measurement result are measured before the first stage device and the second stage device are assembled into an RF device, determining a first estimated measurement result corresponding to the first channel based on the first measurement result and the first reference measurement result, obtaining a first post-assembly measurement result of the first channel of the RF device under first control conditions after the first stage device and the second stage device are assembled into the RF device, and performing a first calibration operation corresponding to the first channel based on the first estimated measurement result and the first post-assembly measurement result. Effect of the Invention

[0006] From another perspective, when a parallel transmission line network as shown in Fig. 1 exists in an RF device having a multi-stage structure, it generally takes a lot of time to perform a complex calibration procedure on the RF device after installation. However, through the method proposed by one embodiment of the present invention, the time for calibrating the RF device can be effectively reduced, thereby enhancing the associated calibration efficiency. [Brief description of the drawings]

[0007] [Figure 1] FIG. 1 is a schematic diagram of a multi-stage RF device. [Diagram 2] 1 is a schematic diagram of a calibration device shown in accordance with one embodiment of the present invention. [Diagram 3] 2 is a flow diagram of a method for calibrating an RF device according to one embodiment of the present invention; [Figure 4] FIG. 2 is a schematic diagram of measurement acquisition according to one embodiment of the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0008] 2, which is a schematic diagram of a calibration device shown in accordance with one embodiment of the present invention. In different embodiments, calibration device 200 may be implemented as a variety of smart devices and / or computing devices. In some embodiments, calibration device 200 may be implemented as a dedicated instrument for calibrating radio frequency (RF) devices, but is not limited to such.

[0009] 2, the calibration device 200 includes a memory circuit 202 and a processor 204. The memory circuit 202 may be, for example, any type of fixed or removable random access memory (RAM), read only memory (ROM), flash memory, a hard disk, or other similar device or combination of these devices, and may be used to store multiple program codes or modules.

[0010] The processor 204 is coupled to the memory circuitry 202 and may be a general purpose processor, an application specific processor, a conventional processor, a digital signal processor, multiple microprocessors, one or more microprocessors combining digital signal processor cores, a controller, a microcontroller, an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), other types of integrated circuits, a state machine, an advanced RISC machine (ARM) based processor, and the like.

[0011] In one embodiment of the present invention, the processor 204 may access program code stored in the memory circuitry 202 to implement the RF device calibration method proposed by the present invention.

[0012] Please refer to Fig. 3. Fig. 3 is a flow diagram of an RF device calibration method according to an embodiment of the present invention. The method of the present embodiment may be performed by the calibration device 200 of Fig. 2, and the details of each step of Fig. 3 will be described below together with the elements shown in Fig. 2. In addition, for easy understanding of the concept of the present invention, the object to be calibrated by the calibration device 200 is the RF device 10 of Fig. 1, but is not limited thereto.

[0013] First, in step S310, the processor 204 acquires a first measurement result (hereinafter referred to as M1) of a first channel of a first-stage device under a first control condition. In this embodiment, the first-stage device is, for example, one of the RF elements RFU1 to RFUN in Fig. 1. For ease of explanation, it is assumed that the first-stage device under consideration is the RF element RFU1, but is not limited to this.

[0014] Please refer to Fig. 4. Fig. 4 is a schematic diagram of obtaining the illustrated measurement results according to one embodiment of the present invention. In Fig. 4, a tester may, for example, connect a device to be tested 41 to an oscilloscope 42, and then perform corresponding measurements on the device to be tested 41. In one embodiment, the device to be tested 41 may, for example, be a first stage device (e.g., RF element RFU1) under consideration, but may not be limited thereto.

[0015] In one embodiment of the present invention, it is assumed that the RF element RFU1 has one or more (RF) channels, and the first channel is, for example, one of the channels of the RF element RFU1. For ease of explanation, in the following, it is assumed that the RF element RFU1 includes four channels (hereinafter referred to as CH11 to CH14), and the first channel is, for example, channel CH11, but is not limited thereto.

[0016] Further, the first control condition may be one of a plurality of control conditions pre-set, for example, by a designer, and the different control conditions may have, for example, but are not limited to, different settings, parameters, and / or environments.

[0017] In one embodiment of the present invention, the first measurement result M1 is measured, for example, before the RF element RFU1 (and other RF elements) and the multiplexer 11 are assembled into the RF device 10. In one embodiment, the first measurement result M1 may include, but is not limited to, a first gain and a first phase of a first channel (e.g., the gain and phase of channel CH11) under a first control condition.

[0018] Furthermore, the processor 204 may acquire measurement results of other channels of the first stage device under the first control condition. For example, the processor 204 may acquire gains and phases corresponding to channels CH12 to CH14 of the RF element RFU1 as corresponding measurement results, but is not limited to this.

[0019] In one embodiment, the processor 204 may obtain measurement results of each channel of the first stage device under other control conditions (eg, second to fourth control conditions different from the first control condition).

[0020] In one embodiment, corresponding measurement results of channels CH11 to CH14 of RF element RFU1 under different first to fourth control conditions are shown in Table 1 below.

[0021] [Table 1]

[0022] In one embodiment, the RF element RFU1 has a corresponding key code and / or MAC address for identification by the calibration device 200. Therefore, after obtaining the above measurement results of the RF element RFU1, these measurement results may be labeled with the key code and / or MAC address corresponding to the RF element RFU1 and recorded in the storage circuit 202. In one embodiment, when the processor 204 accesses the measurement results associated with the RF element RFU1 for subsequent analysis, the corresponding measurement results may be found in the storage circuit 202 based on the key code and / or MAC address of the RF element RFU1, but this is not limited thereto.

[0023] In another embodiment, the RF element RFU1 may include a built-in storage medium (e.g., an electrically erasable read-only memory (EEPROM)). In this case, after the measurement of the RF element RFU1 to obtain the above measurement result is completed, the measurement result may be written to the storage medium of the RF element RFU1. Therefore, when the RF element RFU1 is assembled into the RF device 10 in the future, the measurement result stored in the storage medium can be reused for other analysis, but this is not limited to the above.

[0024] For other RF elements, the associated measurement results may be stored in the memory circuitry 202 and / or the built-in storage medium of each RF element based on the above teachings, but may not be limited to such.

[0025] Furthermore, in the case of Table 1, the second control condition considered has, for example, the same phase as the first control condition, but the gain corresponding to the second control condition is 5 dB lower than the gain corresponding to the first control condition. Furthermore, in the case of Table 1, compared with the gain of the second control condition of channels CH11 to CH14, the gain of the third control condition considered of channels CH11 to CH14 is reduced by 7.5 dB, 2.5 dB, 1 dB, and 0 dB, respectively. In the case of Table 1, compared with the phase of the third control condition of channels CH11 to CH14, the phase of the fourth control condition considered of channels CH11 to CH14 is adjusted by 90 degrees, 270 degrees, 180 degrees, and 0 degrees, respectively.

[0026] In step S320, the processor 204 obtains a first reference measurement result (hereinafter referred to as RM1) of a first reference channel of a second-stage device. In this embodiment, the second-stage device is, for example, the multiplexer 11 (for example, a frequency divider) in FIG. 1, but is not limited thereto.

[0027] In one embodiment, a tester may obtain a first reference measurement result of the multiplexer 11 based on the situation shown in Fig. 4. For example, the tester may replace the device to be tested 41 in Fig. 4 with the multiplexer 11, connect the multiplexer 11 to an oscilloscope 42 to obtain a first reference measurement result, and then perform a corresponding measurement on the multiplexer 11, but is not limited thereto.

[0028] In one embodiment, it is assumed that the multiplexer 11 also has one or more (RF) channels, and the first reference channel is, for example, one of the reference channels of the multiplexer 11. For ease of explanation, in the following it is assumed that the multiplexer 11 includes four reference channels (hereinafter referred to as RCH1 to RCH4), and the first reference channel is, for example, but not limited to, that reference channel RCH1.

[0029] In one embodiment of the present invention, the first reference measurement result RM1 is measured, for example, before the RF element RFU1 (and other RF elements) and the multiplexer 11 are assembled into the RF device 10. In one embodiment, the first reference measurement result RM1 may include, but is not limited to, a first reference channel gain and phase (e.g., the gain and phase of the reference channel RCH1).

[0030] In one embodiment, the reference measurement results of the reference channels RCH1-RCH4 of the multiplexer 11 may be as shown in Table 2 below.

[0031] [Table 2]

[0032] In another embodiment, the second stage device may be implemented as another RF element (hereinafter referred to as a reference RF element) different from the RF elements RFU1 to RFUN. In this case, the processor 204 may acquire measurement results of the reference channels RCH1 to RCH4 of the reference RF element under different control conditions (for example, the first to fourth control conditions) as corresponding reference measurement results, and these reference measurement results may be represented as another table having a structure similar to Table 1, but is not limited to this.

[0033] In one embodiment, multiplexer 11 has a corresponding key code and / or MAC address for identification by calibration device 200. Thus, after obtaining the above measurement results of multiplexer 11, these measurement results may be labeled with the key code and / or MAC address corresponding to multiplexer 11 and recorded in storage circuit 202. In one embodiment, when processor 204 accesses the measurement results associated with multiplexer 11 for subsequent analysis, the corresponding measurement results may be found in storage circuit 202 based on the key code and / or MAC address of multiplexer 11, but may not be limited thereto.

[0034] In another embodiment, the multiplexer 11 may include a built-in storage medium (e.g., an electrically erasable read-only memory (EEPROM)). In this case, after the measurement of the multiplexer 11 to obtain the above measurement result is completed, the measurement result may be written to the storage medium of the multiplexer 11. Therefore, when the multiplexer 11 is assembled into the RF device 10 in the future, the measurement result stored in the storage medium may be reused for other analysis, but is not limited to this.

[0035] In step S330, the processor 204 determines a first estimated measurement result (hereinafter referred to as EM1) corresponding to the first channel based on the first measurement result M1 and the first reference measurement result RM1.

[0036] In one embodiment, the processor 204 may, for example, obtain the first measurement result M1 and / or the first reference measurement result RM1 from the memory circuit 202, or may obtain the first measurement result M1 and the first reference measurement result RM1 from the storage medium of the RF element RFU1 and the storage medium of the multiplexer 11, respectively, but is not limited to this.

[0037] For example, the processor 204 may acquire the first measurement result M1 and the first reference measurement result RM1 from the memory circuit 202 after the RF element RFU1 and the multiplexer 11 are assembled into the RF device 10, or may acquire the first measurement result M1 and the first reference measurement result RM1 from the storage medium of the RF element RFU1 and the storage medium of the multiplexer 11, respectively, but is not limited to this.

[0038] In one embodiment, the processor 204 may obtain a first estimated measurement result EM1 corresponding to the first channel by adding the first measurement result M1 and the first reference measurement result RM1. In addition, the processor 204 may obtain estimated measurements corresponding to other channels in a similar manner.

[0039] In one embodiment, the processor 204 may, for example, add up (part of) the contents of Table 1 and Table 2 to obtain a first estimated measurement result EM1 and estimated measurement results corresponding to other channels, and the obtained first estimated measurement result EM1 and estimated measurement results corresponding to other channels are shown in Table 3 below.

[0040] [Table 3]

[0041] In the scenario in Table 3, it is assumed that in the process of assembling the RF device 10, the channels CH11 to CH14 of the RF element RFU1 are all expected to be connected to the reference channel RCH1 of the multiplexer 11, but this is not limited to the above.

[0042] In this case, the processor 204 may add the gain in each column of Table 1 to the gain corresponding to the reference channel RCH1 in Table 2 to obtain the gain in each column of Table 3. Similarly, the processor 204 may add the phase in each column of Table 1 to the phase corresponding to the reference channel RCH1 in Table 2 to obtain the phase in each column of Table 3, but is not limited to this.

[0043] For example, in the first estimated measurement result EM1 in Table 3, the gain of channel "CH11+RCH1" under the first control condition (i.e., 13.55) is, for example, the sum of the gain of channel CH11 under the first control condition in Table 1 (i.e., 21.75) and the gain of reference channel RCH1 in Table 2 (i.e., -8.2). Also, in the first estimated measurement result EM1 in Table 3, the phase of channel "CH11+RCH1" under the first control condition (i.e., -199·44) is, for example, the sum of the phase of channel CH11 under the first control condition in Table 1 (i.e., -114.26) and the phase of reference channel RCH1 in Table 2 (i.e., -85.18).

[0044] Also, in the first estimated measurement result EM1 in Table 3, the gain of the channel "CH11+RCH1" under the second control condition (i.e., 8.42) is, for example, the sum of the gain of the channel CH1 under the first control condition in Table 1 (i.e., 16.62) and the gain of the reference channel RCH1 in Table 2 (i.e., -8.2). Also, in the first estimated measurement result EM1 in Table 3, the phase of the channel "CH11+RCH1" under the second control condition (i.e., -198.58) is, for example, the sum of the phase of the channel CH11 under the second control condition in Table 1 (i.e., -113.4) and the phase of the reference channel RCH1 in Table 2 (i.e., -85.18).

[0045] As another example, in the first estimated measurement result EM1 in Table 3, the gain of the channel "CH12+RCH1" under the first control condition (i.e., 11.18) is, for example, the sum of the gain of the channel CH12 under the first control condition in Table 1 (i.e., 19.38) and the gain of the reference channel RCH1 in Table 2 (i.e., -8.2). Also, in the first estimated measurement result EM1 in Table 3, the phase of the channel "CH12+RCH1" under the first control condition (i.e., -202.77) is, for example, the sum of the phase of the channel CH12 under the first control condition in Table 1 (i.e., -117.59) and the phase of the reference channel RCH1 in Table 2 (i.e., -85.18).

[0046] For those skilled in the art, methods for obtaining the contents of other fields in Table 3 should be inferable from the above teachings and will not be repeated here.

[0047] In step S340, after a first stage device (e.g., RF element RFU1) and a second stage device (e.g., multiplexer 11) are assembled into an RF device 10, a first post-assembly measurement result (hereinafter referred to as PM1) of a first channel of the RF device 10 under first control conditions is obtained.

[0048] In one embodiment of the present invention, the first post-assembly measurement result PM1 may include, for example, but is not limited to, the overall gain and phase of the first channel and the first reference channel of the RF device 10 under the first control conditions (e.g., the overall gain and phase of channel CH11 and reference channel RCH1).

[0049] The processor 204 may also obtain post-assembly measurements of other channels and corresponding reference channels of the RF device 10 under the first control condition (and other control conditions).

[0050] In one embodiment of the present invention, it is assumed that channels CH11 to CH14 of RF element RFU1 are all connected to reference channel RCH1 of multiplexer 11, and therefore processor 204 may measure post-assembly measurement results corresponding to each of channels CH12 to CH14, and these post-assembly measurement results, together with first post-assembly measurement result PM1, may be organized, for example, in Table 4 below.

[0051] [Table 4]

[0052] Next, in step S350, the processor 204 executes a calibration operation corresponding to the first channel based on the first estimated measurement result EM1 and the first post-assembly measurement result PM1.

[0053] In one embodiment, the processor 204 may obtain a first comparison result between the first estimated measurement result EM1 and the first post-assembly measurement result PM1, and perform a first calibration operation corresponding to the first channel based on the first comparison result.

[0054] In one embodiment, the processor 204 may obtain a difference between the first estimated measurement result EM1 and the first post-assembly measurement result PM1 as the first comparison result.

[0055] For example, in the contents of Table 3, the first estimated measurement result EM1 of the first channel (i.e., channel CH11) includes a gain value of 13.55 dB and a phase value of −199.44 degrees. Also, in the contents of Table 4, the first post-assembly measurement result PM1 of the first channel (i.e., channel CH11) includes a gain value of 13.07 dB and a phase value of 132.95 degrees. Therefore, the first difference between the first estimated measurement result EM1 and the first post-assembly measurement result PM1 includes, for example, a gain of 0.48 dB (i.e., 13.55-13.07) and a phase of 27.61 degrees (equal to (−199.44-132.95) degrees).

[0056] Based on a similar principle, the processor 204 may obtain comparison results between the estimated measurement results and the post-assembly measurement results corresponding to other channels. In one embodiment of the present invention, the processor 204 may obtain various comparison results shown in Table 5 below based on the contents of Tables 3 and 4, for example.

[0057] [Table 5]

[0058] In one embodiment, processor 204 may subtract the gain and phase in column i of Table 4 from the gain and phase in column i of Table 3 to obtain the gain and phase in column i of Table 5. In the contents of Tables 3-5, i may be an integer, for example, but not limited to, not less than 1 and not greater than 16.

[0059] For example, processor 204 may subtract the gain (i.e., 13.07) and phase (i.e., 132.95) of the first column in Table 4 from the gain (i.e., 13.55) and phase (i.e., -199.44) of the first column in Table 3 to obtain the gain (i.e., 0.48) and phase (i.e., 27.61) of the first column in Table 5. As another example, processor 204 may subtract the gain (i.e., 12.67) and phase (i.e., 132.57) of the third column in Table 4 from the gain (i.e., 13.62) and phase (i.e., -196.14) of the third column in Table 3 to obtain the gain (i.e., 0.95) and phase (i.e., 31.29) of the third column in Table 5. The gains and phases in the other columns of Table 5 should be inferable from the teachings above and will not be repeated in detail here.

[0060] The processor 204 may then perform a calibration operation corresponding to at least one of the channels CH11-CH14 based on the contents of Table 5, for example.

[0061] In one embodiment, when the processor 204 performs a calibration operation corresponding to channel CH11 based on Table 5, the gain (i.e., 0.48) and phase (i.e., 27.61) corresponding to the first control condition may be compensated to normalize the gain and phase to 0 dB and 0 degrees, respectively. Similarly, when the processor 204 performs a calibration operation corresponding to channel CH12 based on Table 5, the gain (i.e., 0.45) and phase (i.e., 36.11) corresponding to the first control condition may be compensated to normalize the gain and phase to 0 dB and 0 degrees, respectively. Also, when the processor 204 performs a calibration operation corresponding to channel CH13 based on Table 5, the gain (i.e., 0.95) and phase (i.e., 31.29) corresponding to the first control condition may be compensated to normalize the gain and phase to 0 dB and 0 degrees, respectively.

[0062] In one embodiment, after completing the calibration operations for channels CH11 to CH13 based on the above teachings, the processor 204 may measure the RF device 10 again to obtain the normalized gain differences and phase differences shown in Table 6.

[0063] [Table 6]

[0064] As can be seen from Table 6, in the above teachings, although calibration (e.g., compensation) is performed based only on the gain and phase corresponding to the first control condition in Table 5, the gain and phase corresponding to the other control conditions are also correspondingly calibrated / compensated to obtain gain differences and phase differences close to zero.

[0065] Also, although in the above embodiment it is assumed that the calibration is performed based on the gain and phase corresponding to the first control condition in Table 5, in other embodiments, the calibration of each channel may be performed based on the gain and phase corresponding to another control condition (e.g., the second control condition), in which case the gain and phase corresponding to the other control condition are also correspondingly adjusted / compensated to obtain gain and phase differences close to zero.

[0066] From the above, it can be seen that in one embodiment of the present invention, by simply compensating for the measurement result of one of the control conditions after the RF device 10 is assembled, the compensation for the other control conditions can be substantially completed correspondingly. Therefore, compared with the conventional method of measuring and compensating the RF device 10 after assembly, one embodiment of the present invention can achieve more favorable efficiency.

[0067] In addition, since the conventional method performs the calibration of the entire machine after the RF device 10 is assembled, if any RF element and / or multiplexer in the RF device 10 fails, the calibration of the entire machine needs to be performed again after the failed RF element / device is replaced, thus consuming more time and being inefficient.

[0068] However, through the method of one embodiment of the present invention, after the failed element / device is replaced with a new element / device, only the new element / device needs to be calibrated, thereby achieving the effect of saving time and increasing efficiency.

[0069] Although the above embodiments take a first stage device and a second stage device as illustrative examples, in other embodiments, other devices (e.g., a third stage device) may be connected after the second stage device, and other devices may be connected before the first stage device, in which case the concepts taught in the above embodiments may still be applied to perform the corresponding analysis and calibration.

[0070] Also, although only one second stage device is shown in FIG. 1, the method proposed by one embodiment of the present invention is also applicable to situations where multiple second stage devices are present in RF device 10.

[0071] Based on the above, a method of one embodiment of the present invention can obtain a measurement result of a channel of the first stage device and a reference measurement result of a reference channel of the second stage device before the first stage device and the second stage device are assembled into an RF device, respectively, and then determine an estimated measurement result, for example, by adding the measurement result and the reference measurement result.

[0072] After the first stage device and the second stage device are assembled into an RF device, an embodiment of the present invention can further obtain post-assembly measurement results of the channel and the reference channel, and perform calibration operations of the channel and the reference channel based on the comparison results between the estimated measurement results and the post-assembly measurement results, thereby improving the calibration time and efficiency of the assembled RF device.

[0073] From another aspect, when a parallel transmission line network as shown in Fig. 1 exists in an RF device having a multi-stage structure, it generally takes a lot of time to perform a complex calibration procedure on the RF device after installation. However, through the method proposed in one embodiment of the present invention, the time for calibrating the RF device can be effectively reduced, thereby enhancing the associated calibration efficiency. [Industrial Applicability]

[0074] The method for calibrating a high frequency device of the present invention can be applied to high frequency technology. [Explanation of symbols]

[0075] 10: RF Devices 11: Multiplexer 41: Device 42: Oscilloscope 200: Calibration device 202:Memory circuit 204: Processor CH11~CH14: Channel EM1: First estimated measurement result M1: First measurement result PM1: Measurement results after first assembly RFU1 to RFUN: RF elements RM1: 1st reference measurement result

Claims

1. obtaining a first measurement (M1) of a first channel of a first stage device under first control conditions; obtaining a first reference measurement result (RM1) of a first reference channel of a second stage device, said first channel corresponding to said first reference channel, said first measurement result (M1) and said first reference measurement result (RM1) being measured before said first stage device and said second stage device are assembled into an RF device (10); determining a first estimated measurement result (EM1) corresponding to the first channel based on the first measurement result (M1) and the first reference measurement result (RM1); obtaining a first post-assembly measurement (PM1) of the first channel of the RF device (10) under the first controlled conditions after the first stage device and the second stage device are assembled to the RF device (10); performing a first calibration operation corresponding to the first channel based on the first estimated measurement result (EM1) and the first post-assembly measurement result (PM1); Including, RF device calibration methods.

2. the first measurement result (M1) includes a first gain and a first phase of the first channel under the first control condition; The method of claim 1 .

3. The step of obtaining the first reference measurement (RM1) of the first reference channel of the second stage device comprises: obtaining a measurement result of the first reference channel of the second stage device under the first control condition as the first reference measurement result (RM1); Including, The method of claim 1 .

4. determining the first estimated measurement result (EM1) corresponding to the first channel based on the first measurement result (M1) and the first reference measurement result (RM1), obtaining the first estimated measurement result (EM1) corresponding to the first channel by adding the first measurement result (M1) and the first reference measurement result (RM1); Including, The method of claim 1 .

5. performing the first calibration operation corresponding to the first channel based on the first estimated measurement result (EM1) and the first post-assembly measurement result (PM1), Obtaining a first comparison between the first estimated measurement result (EM1) and the first post-assembly measurement result (PM1); performing the first calibration operation corresponding to the first channel based on a result of the first comparison; Including, The method of claim 1 .

6. The step of obtaining a first comparison between the first estimated measurement result (EM1) and the first post-assembly measurement result (PM1) comprises: obtaining a first difference between the first estimated measurement result (EM1) and the first post-assembly measurement result (PM1) as the first comparison result; Including, The method of calibrating an RF device according to claim 5 .

7. obtaining a second measurement of a second channel of the first stage device under the first controlled conditions, the second channel corresponding to the first reference channel, the second measurement being measured before the first stage device and the second stage device are assembled into the RF device (10); determining a second estimated measurement result corresponding to the second channel based on the second measurement result and the first reference measurement result (RM1); obtaining second post-assembly measurements of the second channel of the RF device (10) under the first controlled conditions after the first stage device and the second stage device are assembled to the RF device (10); performing a second calibration operation corresponding to the second channel based on the second estimated measurement result and the second post-assembly measurement result; Further comprising: The method of claim 1 .

8. At least one of the first measurement result (M1), the first reference measurement result (RM1), the first estimated measurement result (EM1), and the first post-assembly measurement result (PM1) is recorded in a corresponding table. The method of claim 1 .

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