Device for performing load measurement on a hinged device

Abstract

An exemplary hinged device flexible substrate testing system includes a first plate having a first surface configured to hold a first side of a hinged device under test stationary, a second plate having a second surface configured to hold a second side of the hinged device under test, a first cam follower coupled to the second plate, a first drive arm configured to move the first cam follower to rotate the second plate about a hinge pivot axis of the hinged device under test, an actuator configured to rotate the drive arm, and a load cell configured to measure a load on the first plate while the actuator moves the second plate.

Description

Technical Field

[0001] [Related Applications] This application claims the benefit of U.S. Provisional Patent Application No. 63 / 018,130, filed Apr. 30, 2020, and U.S. Patent Application No. 17 / 220,587, filed Apr. 1, 2021, both entitled "METHODS AND APPARATUS TO PERFORM LOAD MEASUREMENTS ON HINGED DEVICES". The entire disclosures of U.S. Provisional Patent Application No. 63 / 018,130 and U.S. Patent Application No. 17 / 220,587 are hereby incorporated by reference in their entirety.

[0002] The present disclosure relates generally to materials testing, and more particularly to methods and apparatus for performing load measurements on flexible substrates.

Background Art

[0003] Reliability testing of an assembly, or moving the components of an assembly, may involve repeatedly performing intended and / or unintended movements of the components to verify that the components and / or assembly operate reliably for a defined minimum number of movement cycles. For example, reliability testing of a flexible substrate may involve repeatedly bending the substrate in one or more ways while testing for continuous operation of the device and / or monitoring for various failure modes.

Summary of the Invention

[0004] A method and apparatus for performing load measurements on a hinged device are disclosed substantially as shown in and described in connection with at least one of the drawings, as more fully set forth in the claims.

[0005] These features, aspects, and advantages of the present disclosure, as well as other features, aspects, and advantages, will be better understood when the following detailed description is read with reference to the accompanying drawings, in which like reference numerals represent like parts throughout the drawings.

Brief Description of the Drawings

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[0015] The drawings are not necessarily to scale.

[0016] Where appropriate, like or identical reference numerals are used to refer to like or identical components.

[0017] Flexible specimens often include restraint mechanisms, such as simple hinges, double hinges, elliptical mechanisms, and / or assemblies and / or devices with other forms of restraint. Conventional measurement systems are not capable of characterizing the forces associated with flexible specimens with such restraint mechanisms. This is because conventional measurement systems cannot bend such specimens without overconstraining the specimens (resulting in damage), and / or the reaction forces generated by the restraint mechanisms are typically many orders of magnitude larger than the reaction forces generated by flexible material specimens.

[0018] The disclosed exemplary hinged device test system performs repeated stress testing and / or load measurement of a hinged device while reducing or minimizing additional stresses generated in the hinged device by the hinged device test system itself. For example, some disclosed hinged device test systems allow the system to bend a specimen while allowing a specimen restraint device (s) (e.g., a hinge(s)) to define an exact bending path of the specimen, thereby testing the specimen in the same manner as ultimately intended during use of the specimen.

[0019] Some of the disclosed hinged device test systems include fixtures that provide for the repeated folding and unfolding of a hinged device, such as a hinged mobile electronic device (e.g., a smartphone). In some examples, the test system is configured to control the folding and unfolding path of the hinge of the hinged device along a foldable substrate while measuring the force applied to the foldable substrate. The disclosed examples configure fixtures, such as guides for moving parts, so that the fixtures do not create additional forces on the hinge(s) of the hinged device when the sides of the hinged device are folded or unfolded together.

[0020] In some examples, the hinged device test system includes a translational link mechanism that restricts forces on the device that are not in the direction measured using the hinged device test system. As an example, the translational link mechanism can convert lateral forces applied to the measured side(s) of the hinged device into forces in the measurement direction (e.g., forces perpendicular to the face of the hinged device, forces related to the resistance of the hinge to folding, etc.).

[0021] The disclosed examples of the hinged device test system include a dynamic part, i.e., a movable part, and a stationary load measurement part. An example of the dynamic part is a rotating shaft that articulates a plurality of drive arms. Each drive arm is characterized by a slot in which a cam follower (e.g., a bearing) moves freely radially along the drive arm. Each bearing is fixed to a shared mounting plate, and the shared mounting plate moves a portion of the hinged device attached to the mounting plate. The stationary load measurement part is fixed to the same base plate as the dynamic side. The stationary side is characterized by a static stationary mounting plate to which another portion of the hinged device is attached. In some examples, the stationary mounting plate is suspended above the base plate using parallel fixtures. In addition to the parallel fixtures, a load cell (e.g., including corresponding adapter components) connects the stationary mounting plate to the base plate.

[0022] In some examples, the stationary side also includes an attachment point of a rigid body that is decoupled from the load measurement path, and the hinge portion can be attached to the attachment point so as to reduce or eliminate the force of the hinge. By providing an attachment point of a rigid body to the specimen constraint mechanism, the disclosed examples enable highly sensitive measurement of the specimen bending force because the reaction force associated with the constraint mechanism is isolated from the load measurement.

[0023] The disclosed exemplary hinged device test system is versatile enough to accommodate various constraint mechanisms including hinges, double hinges, and unforeseen mechanisms. The disclosed examples can accommodate different specimen sizes with little or no adjustment (e.g., 2 mm bend, 3 mm bend, etc.). The disclosed examples can be extended to test multiple specimens at once by connecting the specimens to the same drive shaft. Further, the disclosed exemplary test system is inexpensive.

[0024] FIG. 1 is a block diagram of an exemplary hinged device test system 100 for performing a mechanical property test on a hinged device 102. The exemplary hinged device 102 can be an electronic device or other device having one or more hinges 104 that enable at least partially bending at least a first portion 106 and a second portion 108 of the hinged device 102. The system 100 of FIG. 1 is configured to repeatedly bend and unfold the hinged device 102 to measure forces associated with the bending and unfolding (e.g., resistance force, spring force, etc.). FIG. 1 shows the hinged device 102 in a deployed or flat position (solid line) and a bent position (dotted line).

[0025] The exemplary system 100 includes a first plate 110, a second plate 112, one or more cam followers 114 coupled to the second plate 112, one or more drive arms 116, an actuator 118, one or more load cells 120, and a translational link mechanism 122. The system 100 can include additional features, such as a structural support or frame, processing circuitry, communication and / or input / output (I / O) circuitry, and / or any other optional components.

[0026] The first plate 110 has a first surface 124 to which the first side 106 of the hinged device 102 is attached or fixed and is held stationary with respect to the first surface 124. The second plate 112 has a second surface 126 to which the second side 108 of the hinged device 102 is attached or fixed and is held stationary with respect to the second surface 126. The plates 110, 112 are separated by a gap bridged by the hinge 104.

[0027] The drive arm(s) 116 move the corresponding cam follower(s) 114 to rotate the second plate 112 about the axis of rotation of the hinge 104 of the hinged device 102. The actuator 118 rotates the drive arm(s) 116 so that the second plate 112 moves the second portion 108 of the hinged device 102 toward the first portion 106 in the bent position (shown by the dashed line) from the first position (shown by the solid line). The drive arm(s) 116 enable the movement of the cam follower(s) 114 along the length of the drive arm(s) 116 such that the system 100 limits or cancels the force exerted on the first portion 106 of the hinged device 102 by the weight of the second plate 112 or the drive arm(s) 116, whereby the measured force exerted on the first portion 106 of the hinged device 102 is fully determined by the operation of the hinge 104.

[0028] In some examples, the actuator 118 can be a motor attached to the drive arm(s) 116 to rotate the drive arm(s) 116 about the pivot of the drive arm(s).

[0029] The load cell 120 measures the load on the first plate 110 while the actuator 118 is moving the second plate 112. In particular, the load cell 120 measures the stress (e.g., bending force) on the hinged device 102 when the hinged device 102 is bent by measuring the load applied to the first plate 110 by the first side 106 of the hinged device 102.

[0030] The translational link mechanism 122 restricts the movement of the first plate 110 in a direction other than the direction in which the load cell 120 is loaded by the first plate 110. For example, if the load cell 120 is configured to measure the load in a direction perpendicular to the plane of the first surface 124, the translational link mechanism 122 allows the load to be transmitted from the first plate 110 to the load cell 120 while restricting the movement of the first plate 110 in a direction parallel to the plane of the first surface 124. An exemplary translational link mechanism 122 can include one or more four-bar link mechanisms coupled to a frame fixed to the load cell 120. In some examples, the translational link mechanism 122 is further restricted in the direction towards the load cell 120 to prevent overloading of the load cell 120. For example, a stop point can be attached to the frame to prevent the movement of the four-bar link mechanism(s) and the first plate 110 towards the load cell 120 beyond this stop point.

[0031] During operation, an exemplary load cell 120 can be biased or offset after fixing the hinged device 102 to the first plate 110 and the second plate 112 in order to subtract the preload from the test measurement value. For example, the preload in the load cell 120 may occur due to the weight of the first plate 110, the weight of the translational link mechanism 122, and / or the weight of the first side portion 106 of the hinged device 102 and / or the hinge 104 in the first plate 110. By determining the preload in the load cell 120, the load cell 120 can be calibrated or offset to measure the stress applied to the hinged device 102 during bending and deployment.

[0032] FIG. 2 is a block diagram of an exemplary embodiment of the hinged device test system 100 of FIG. 1. As shown in FIG. 2, the flexible hinged device test system 100 includes a test fixture 201 and a computing device 202.

[0033] Exemplary computing device 202 may be a general-purpose computer, laptop computer, tablet computer, mobile device, server, all-in-one computer, and / or any other type of computing device. The computing device 202 in FIG. 2 includes a processor 203, and the processor 203 can be a general-purpose central processing unit (CPU). In some examples, the processor 203 can include one or more dedicated processing devices such as an FPGA, a RISC processor having an ARM core, an image processing device, a digital signal processor, and / or a system-on-chip (SoC). The processor 203 executes machine-readable instructions 204 that can be locally stored in the processor (e.g., in a built-in cache or in an SoC), in random access memory 206 (or other volatile memory), in read-only memory 208 (or other non-volatile memory such as flash memory), and / or in mass storage device 210. Exemplary mass storage device 210 may be a hard drive, solid state storage drive, hybrid drive, RAID array, and / or any other mass data storage device. Bus 212 enables communication between processor 203, RAM 206, ROM 208, mass storage device 210, network interface 214, and / or input / output interface 216.

[0034] Exemplary network interface 214 includes hardware, firmware, and / or software that connects computing device 202 to a communication network 218 such as the Internet. For example, network interface 214 can include IEEE 202.X compliant wireless and / or wired communication hardware for transmitting and / or receiving communications.

[0035] The exemplary I / O interface 216 of FIG. 2 includes hardware, firmware, and / or software that connects one or more input / output devices 220 to the processor 203 to provide input to and / or output from the processor 203. For example, the I / O interface 216 may include an image processing device that interface connects to a display device, a universal serial bus port that interface connects to one or more USB-compliant devices, FireWire (registered trademark), a field bus, and / or any other type of interface. The exemplary extensometer system 100 includes a display device 224 (e.g., an LCD screen) coupled to the I / O interface 216. Other exemplary I / O device(s) 220 may include a keyboard, a keypad, a mouse, a trackball, a pointing device, a microphone, an audio speaker, a display device, an optical media drive, a multi-touch touch screen, a gesture recognition interface, a magnetic media drive, and / or any other type of input and / or output device.

[0036] The computing device 202 can access the non-transitory machine-readable medium 222 via the I / O interface 216 and / or the I / O device(s) 220. Examples of the machine-readable medium 222 of FIG. 2 include optical disks (e.g., compact disks (CDs), digital versatile / video disks (DVDs), Blu-ray (registered trademark) disks, etc.), magnetic media (e.g., floppy disks), portable storage media (e.g., portable flash drives, secure digital (SD) cards, etc.), and / or any other type of removable and / or installed machine-readable medium.

[0037] The test fixture 201 is coupled to the computing device 202. In the example of FIG. 2, the test fixture 201 is coupled to the computing device via an I / O interface 216 such as a USB port, a Thunderbolt port, a FireWire (registered trademark) (IEEE 1394) port, and / or any other type of serial or parallel data port. In some examples, the test fixture 201 is coupled to the network interface 214 and / or the I / O interface 216 via a wired or wireless connection (e.g., Ethernet, Wi-Fi, etc.) directly or via the network 218.

[0038] The test fixture 201 includes a frame 228, a load cell 230, a material fixture 236, and a control processor 238. The frame 228 provides a rigid structural support for the other components of the test fixture 201 that perform the test. The load cell 230 can implement the load cell 120 of FIG. 1 and measures the force applied to the material under test (e.g., the hinged device 102) by the actuator 246 via the gripping portion 248 (e.g., plates 110, 112).

[0039] The actuator 246 applies a force to the material under test and / or forces a displacement of the material under test while the gripping portion 248 grips the material under test or is otherwise coupled to the actuator 246.

[0040] Exemplary actuators that can be used to apply force and / or motion to the components of the test fixture 201 include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, relays, and / or switches. An exemplary test fixture 201 uses a motor such as a servo motor or a direct drive linear motor, but other systems may use different types of actuators. For example, a hydraulic actuator, a pneumatic actuator, and / or any other type of actuator may be used based on the requirements of the system.

[0041] The exemplary gripping portion 248 includes platens, clamps, and / or other types of fixtures depending on the mechanical properties being tested and / or the material being tested. The gripping portion 248 can be manually configured, controlled by manual input, and / or automatically controlled by the control processor 238.

[0042] The test system 100 can further include one or more control panels 250 including one or more input devices 252. The input devices 252 can include buttons, switches, and / or other input devices located on an operator control panel. For example, the input devices 252 can include buttons that control the actuator 246 to jog (e.g., position) the gripping portion 248 to a desired position, switches (e.g., foot switches) that control the gripping portion 248 to open and close (e.g., via another actuator), and / or any other input devices that control the operation of the test fixture 201.

[0043] The exemplary control processor 238 communicates with the computing device 202 to receive test parameters from, for example, the computing device 202 and / or report measurements and / or other results to the computing device 202. For example, the control processor 238 can include one or more communication and / or I / O interfaces that enable communication with the computing device 202. The control processor 238 controls the actuator 246 to move in a given direction and / or control the speed of the actuator 246, controls the fixture(s) 236 to grip or release the material being tested, and / or can receive measurements from the displacement transducer 232, load cell 230, and / or other transducers.

[0044] The exemplary control processor 238 is configured to perform an iterative motion test process in which a test specimen (e.g., the hinged device 102) undergoes testing in the test fixture 201. For example, to measure the stress on the hinged device 102 during or after a series of bending and unfolding motions, the control processor 238 monitors the load cell 230 to measure the stress on the hinged device 102 while controlling the actuator 246 to move the gripping portion 248 (e.g., the first plate 110 and the second plate 112). In some examples, the control processor 238 monitors the motor encoder of the actuator 246 to determine the bending angle and / or establish the ratio of the degree of bending per pulse.

[0045] FIG. 3 is a perspective view of an exemplary embodiment of the hinged device test system 100 of FIG. 1. The exemplary figure of FIG. 3 shows the hinge 104 of the exemplary hinged device 102 attached to the hinged device test system 100, as well as the first portion 106 and the second portion 108. FIG. 3 further shows two exemplary drive arms 116a, 116b configured to move the second plate 112 via corresponding cam followers 114a, 114b. FIG. 4A is an elevation view of the exemplary hinged device test system 100 of FIG. 3 with the hinged device 102 in the open or unfolded position. FIG. 4B is an elevation view of the exemplary hinged device test system 100 of FIG. 3 with the hinged device 102 in the closed or bent position.

[0046] As shown in FIGS. 3, 4A, and 4B, the drive arms 116a, 116b include respective slots 302a, 302b that extend radially from the pivot axes 304 of the drive arms 116a, 116b. In the example of FIG. 3, the actuator 118 actuates (e.g., rotates) the drive arms 116a, 116b via a shaft 306 that defines the pivot axis 304. The slots 302a, 302b guide the respective cam followers 114a, 114b as the drive arms 116a, 116b rotate, while allowing the cam followers 114a, 114b to move freely along the lengths of the slots 302a, 302b as the drive arms 116a, 116b rotate. The cam followers 114a, 114b are coupled to the second plate 112 via a support shaft 314 that couples the cam followers 114a, 114b.

[0047] The exemplary hinged device test system 100 of FIGS. 3, 4A, and 4B limits the loads from the hinges 104a, 104b to the load cell 120 via hinge support plates 308a, 308b coupled to the base plate 310. The hinge support plates 308a, 308b hold the respective first sides of the hinges 104a, 104b in a separated state from the first plate 110 during testing. As a result, the resistance forces by the hinges 104a, 104b that occur during the folding and unfolding of the hinged device 102 are transmitted to the hinge support plates 308a, 308b instead of being transmitted to the first plate 110 and the load cell 120.

[0048] The exemplary translational link mechanism 122 includes flexures 312a, 312b coupled to the base plate 310. The flexures 312a, 312b support the first plate 110 and allow the transmission of the load from the hinged device 102 to the load cell 120. The flexures 312a, 312b limit the movement of the first plate 110 in directions other than the direction in which the load cell 120 measures the force.

[0049] The examples disclosed above include the entire hinged device 102, but in other examples, the hinges 104a, 104b can be directly coupled to the first plate 110 and the second plate 112 without the first portion 106 and the second portion 108 of the hinged device 102. Additionally or alternatively, although two drive arms 116a, 116b are shown in FIG. 3, other examples can include one drive arm or three or more drive arms.

[0050] FIG. 5 is a more detailed view of an exemplary first plate 110, flexures 312a, 312b, and load cell 120. The exemplary flexures 312a, 312b are supported by brackets 502a, 502b coupled to the base plate 310.

[0051] The flexures 312a, 312b comprise brackets 502a, 502b and metal strips attached to the first plate 110 to support the weight of the first plate 110. The first plate 110 is also coupled to the load cell 120 to transmit a load to the load cell 120 for measurement.

[0052] To avoid overloading the load cell 120, the first plate 110 comprises stop points configured to prevent the first plate 110 from advancing towards the load cell 120 beyond a stop point. In the example shown, the stop points are implemented using stop blocks 504a, 504b. Support brackets 506a, 506b couple the flexures 312a, 312b to the first plate 110. The blocks 504a, 504b are configured to stop the support brackets 506a, 506b that couple the flexures 312a, 312b to the first plate 110 after a predetermined amount of travel of the support brackets 506a, 506b (e.g., after a predetermined amount of load is applied to the first plate 110).

[0053] FIG. 6 is a side view of the exemplary hinged device test system 100 of FIG. 3. FIG. 7 is a plan view of the exemplary hinged device test system 100 of FIG. 3.

[0054] FIG. 8 shows a partially exploded view of another exemplary embodiment of the translational link mechanism 122 of FIG. 1. The exemplary translational link mechanism 122 of FIG. 8 includes a first four-bar link mechanism 802, a second four-bar link mechanism 804, and a frame 806. The frame 806 is coupled to be stationary with respect to the base plate 310 (e.g., via hinge support plates 308a, 308b, or another structure). The frame 806 and the load cell 120 are stationary with respect to each other.

[0055] The inner link mechanisms 808, 810 of the four-bar link mechanisms 802, 804 are coupled to the first plate 110. The intermediate link mechanisms 812, 814, 816, 818 couple the inner link mechanisms 808, 810 to the frame 806. Similar to the bent portions 312a, 312b of FIG. 3, the first four-bar link mechanism 802 and the second four-bar link mechanism 804 limit the movement of the first plate 110 in a direction parallel to the surface of the first plate 110 to which the first portion 106 of the hinged device 102 is attached, while allowing the load from the first plate 110 to be transmitted to the load cell 120 in a direction perpendicular to the surface of the first plate 110 (e.g., by the extension post 308 coupled to the load cell 120).

[0056] The present method and system can be implemented in hardware, software, and / or a combination of hardware and software. The present method and / or system can be implemented centrally in at least one computing system or distributively such that different elements are distributed over several interconnected computing systems. Any kind of computing system or other device adapted to execute the methods described herein is suitable. A typical combination of hardware and software can include a general-purpose computing system together with a program or other code that, when loaded and executed, controls the computing system to execute the methods described herein. Another typical embodiment can include an application-specific integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disk, a magnetic storage disk, etc.), such non-transitory machine-readable media storing one or more lines of machine-executable code, thereby causing a machine to perform a process as described herein. As used herein, the term "non-transitory machine-readable medium" includes all types of machine-readable storage media and is defined to exclude propagated signals.

[0057] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (i.e., hardware), and any software and / or firmware ("code") that can configure the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware. As used herein, for example, a particular processor and memory can include a first "circuit" when executing one or more first lines of code, and can include a second "circuit" when executing one or more second lines of code. As used herein, "and / or" means any one or more of the items in the list connected by "and / or". As an example, "x and / or y" means any element of the three-element set {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used herein, the term "exemplary" serves as a non-limiting example, instance or illustration. As used herein, the term "for example" begins a list of one or more non-limiting examples, instances or illustrations. As used herein, circuitry is "operable" to perform its function whenever it includes the hardware and code (if either is required) necessary to perform a function, whether or not the performance of that function has been disabled (e.g., by user-configurable settings, factory trim, etc.) or not enabled.

[0058] Although the method and / or system have been described with reference to certain specific embodiments, those skilled in the art will understand that various changes can be made and equivalents can be substituted without departing from the scope of the method and / or system. For example, the disclosed example blocks and / or components can be combined, divided, rearranged, and / or otherwise changed. In addition, many modifications can be made to adapt the teachings of this disclosure to specific situations or materials without departing from the scope of this disclosure. Therefore, the method and / or system are not limited to the specific embodiments disclosed. Instead, the method and / or system include all embodiments that fall within the scope of the appended claims, literally or under the doctrine of equivalents. The invention disclosed in this specification includes the following. [Aspect 1] A first plate having a first surface configured to hold a first side of a hinged device under test in a stationary state; A second plate having a second surface configured to hold a second side of the hinged device under test; A first cam follower coupled to the second plate; A first drive arm configured to move the first cam follower to rotate the second plate about the hinge axis of the hinged device under test; An actuator configured to rotate the drive arm; A load cell configured to measure a load on the first plate while the actuator moves the second plate; A hinged device test system comprising the above. [Aspect 2] The hinged device test system according to Aspect 1, wherein the first plate and the second plate are configured to position the hinge of the hinged device under test based on the pivot axis of the drive arm. [Aspect 3] The hinged device test system according to Aspect 1, wherein the drive arm includes a slot extending radially from the pivot axis of the drive arm, and the slot is configured to guide the cam follower as the drive arm rotates. [Aspect 4] The hinged device test system according to Aspect 3, wherein the slot is configured to allow the cam follower to move freely along the slot as the drive arm rotates. [Aspect 5] The hinged device test system according to Aspect 1, wherein the second plate is configured to attach the cam follower at a plurality of positions on the second plate. [Aspect 6] The hinged device test system according to Aspect 1, further comprising a translational link mechanism configured to limit movement of the first plate in a direction other than the direction in which the load cell is configured to measure the load. [Aspect 7] The translational link mechanism limits the movement of the first plate in a direction parallel to the plane of the first surface, and is configured to enable a load to be transmitted from the first plate to the load cell in a direction perpendicular to the plane of the first surface. The hinged device test system according to aspect 6. [Aspect 8] The translational link mechanism A frame fixed to the load cell, A first four-bar link mechanism coupled to the frame and the first plate, The hinged device test system according to aspect 6, comprising. [Aspect 9] The translational link mechanism further comprises a second four-bar link mechanism coupled to the frame and the first plate. The hinged device test system according to aspect 8. [Aspect 10] The translational link mechanism supports the first plate and comprises a bent portion configured to enable transmission of a load from the hinged device under test to the load cell. The hinged device test system according to aspect 6. [Aspect 11] The control circuit unit is further configured to control the actuator to move the second plate in a first direction to bend the hinged device under test or in a second direction to deploy the hinged device under test. The hinged device test system according to aspect 1. [Aspect 12] The hinged device test system according to aspect 1 further comprises a hinge support plate configured to hold the first side portion of the hinge in a separated state from the first plate. [Aspect 13] The second plate is configured to hold the second side portion of the hinge such that the hinge controls the bending path of the hinged device under test when the actuator moves the second plate. The hinged device test system according to aspect 12. [Aspect 14] The hinge support plate, the second plate, the first plate, the drive arm, and the cam follower are configured to limit the force applied to the load cell during bending and deployment to the force of the hinged device under test without generating a force by the hinge during bending and deployment. The hinged device test system according to aspect 12.

Claims

1. a first plate having a first surface configured to hold stationary a first side of a hinged device under test; a second plate having a second surface configured to hold a second side of the hinged device under test; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to rotate the second plate about a hinge pivot of the hinged device under test; an actuator configured to rotate the drive arm; a load cell configured to measure a load on the first plate while the actuator moves the second plate; Equipped with a translation linkage configured to limit movement of the first plate in a direction other than a direction in which the load cell is configured to measure a load; the translation linkage is configured to limit movement of the first plate in a direction parallel to the plane of the first surface and to allow a load to be transferred from the first plate to the load cell in a direction perpendicular to the plane of the first surface.

2. A first plate having a first surface configured to hold a first side of a hinged device under test in a stationary state; a second plate having a second surface configured to hold a second side of the hinged device under test; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to rotate the second plate about a hinge pivot of the hinged device under test; an actuator configured to rotate the drive arm; a load cell configured to measure a load on the first plate while the actuator moves the second plate; Equipped with a translation linkage configured to limit movement of the first plate in a direction other than a direction in which the load cell is configured to measure a load; The translation link mechanism includes: A frame fixed to the load cell; a first four-bar linkage coupled to the frame and the first plate; A hinged device testing system comprising:

3. A first plate having a first surface configured to hold a first side of a hinged device under test in a stationary state; a second plate having a second surface configured to hold a second side of the hinged device under test; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to rotate the second plate about a hinge pivot of the hinged device under test; an actuator configured to rotate the drive arm; a load cell configured to measure a load on the first plate while the actuator moves the second plate; Equipped with a translation linkage configured to limit movement of the first plate in a direction other than a direction in which the load cell is configured to measure a load; the translation linkage includes a flexure configured to support the first plate and to enable transfer of load from the hinged device under test to the load cell.

4. 4. The hinged device testing system of claim 1, wherein the first plate and the second plate are configured to position the hinge of the hinged device under test based on a pivot axis of the drive arm.

5. 4. The hinged device test system of claim 1, wherein the drive arm includes a slot extending radially from a pivot axis of the drive arm, the slot configured to guide the cam follower as the drive arm rotates.

6. The hinged device test system of claim 5 , wherein the slot is configured to allow the cam follower to move freely along the slot as the drive arm rotates.

7. The hinged device testing system of any one of claims 1 to 3, wherein the second plate is configured to mount the cam followers at a plurality of positions on the second plate.

8. The hinged device test system of claim 2 , wherein the translation linkage further comprises a second four-bar linkage coupled to the frame and the first plate.

9. 4. The hinged device testing system of claim 1, further comprising control circuitry configured to control the actuator to move the second plate in a first direction to fold the hinged device under test or in a second direction to unfold the hinged device under test.

10. 4. The hinged device testing system of claim 1, further comprising a hinge support plate configured to hold a first side of the hinge separated from the first plate.

11. 11. The hinged device testing system of claim 10, wherein the second plate is configured to hold the second side of the hinge such that when the actuator moves the second plate, the hinge controls a folding path of the hinged device under test.

12. 11. The hinged device testing system of claim 10, wherein the hinge support plate, the second plate, the first plate, the drive arm, and the cam follower are configured to limit forces on the load cell during the folding and unfolding to forces on the hinged device under test without causing forces on the hinge during the folding and unfolding.

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