Test and measurement device and method for detecting logical value trajectory segments

Abstract

To analyze a cause of unexpected measurement result if the unexpected measurement result is obtained.SOLUTION: A test and measurement instrument 100 such as an oscilloscope is configured to: receive a signal to be measured by a port 102; generate a wave data record of the signal to be measured; and store the wave data record in a memory 106. A processor 104 is configured to: from the waveform data record, determine a measurement value of the record and an occurrence location of a measurement event such as a rising edge; detect one or more logical path segments in the occurrence location of the measurement event; generate display data of each measurement value and display data of overlaying the measurement values; and display the display data on a display part 108. Display data overlaying the logical path segments are generated, the logical path segments are separated separately, and each logical path segment can be displayed separately on the display part 108.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to test and measurement instruments and methods, and more particularly to test and measurement instruments and methods for generating measurement result populations from waveform data records and automatically detecting logic value trajectory segments within the measurement result populations. [Background technology]

[0002] Typically, measurement results from test and measurement equipment, such as oscilloscopes, are provided as black box results. This means that it is difficult for users to examine the measurement results and identify potential causes of any errors or abnormal results. This is not a problem if the measurements or results are reasonably understandable to the user. However, if the measurements or results appear abnormal to the user, the user continues to debug their device under test without any additional information from the test and measurement equipment as to why the results might be abnormal.

[0003] Conventional test and measurement instruments typically only make one measurement per waveform, and if a user wants to see the source of that measurement, they must either find the first occurrence in the waveform or have the measurement annotated. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2007-286025 [Patent Document 2] Japanese Patent Application Laid-Open No. 2009-236765 [Non-patent literature]

[0005] [Non-Patent Document 1] Transistor Technology Special, ed., "Digital Oscilloscope Usage Notes," 5-2 How Trigger Circuits Work, pp. 85-87, Figure 2 (Circuit Block Diagram), Transistor Technology Special for Freshers No. 99, CQ Publishing Co., Ltd., July 1, 2007 Summary of the Invention [Problem to be solved by the invention]

[0006] However, with modern test and measurement equipment, measurements are taken at every occurrence of a waveform, and the test and measurement equipment can output statistics and histograms of those measurements. If the results are unexpected, it becomes more difficult to understand why the measurement results are unexpected.

[0007] Embodiments of the present invention seek to address these and other problems of the prior art. [Means for solving the problem]

[0008] The test and measurement instrument of the present invention includes a memory configured to store a waveform data record, one or more processors, and a display. The one or more processors receive the waveform data record, determine measurements for the waveform data record, determine multiple occurrences of a measurement event, detect one or more logic value trajectory segments among the multiple occurrences, generate visual representations of each measurement result, and also generate display data overlaid with each of the visual representations of each measurement result. The multiple visual representations of each measurement result and the one or more logic value trajectory segments may be displayed on the display.

[0009] Aspects, features and advantages of embodiments of the present invention will become apparent from the following description of the embodiments, taken in conjunction with the accompanying drawings. [Brief explanation of the drawings]

[0010] [Figure 1]FIG. 1 is a block diagram of an exemplary test and measurement instrument in accordance with an embodiment of the present invention. [Figure 2] Figure 2 is an example histogram for rising edge waveform measurements. [Figure 3] FIG. 3 shows an example of a display in which the results of multiple rising edge measurements are superimposed on a screen according to an embodiment of the present invention. [Figure 4] FIG. 4 is an example of multiple logic value trajectory segments detected in the overlaid rising edge measurement display of FIG. 3, according to an embodiment of the present invention. [Figure 5] FIG. 5 shows example histograms corresponding to each of the multiple logic trajectory segments shown in FIG. [Figure 6] FIG. 6 illustrates an exemplary method for overlaying multiple rising edge measurements according to an embodiment of the present invention. [Figure 7] FIG. 7 illustrates how a boolean trajectory segment is determined according to an embodiment of the present invention. [Figure 8] FIG. 8 illustrates how a boolean trajectory segment is determined according to an embodiment of the present invention. [Figure 9] FIG. 9 illustrates how a boolean trajectory segment is determined according to an embodiment of the present invention. [Figure 10] FIG. 10 illustrates how a boolean trajectory segment is determined according to an embodiment of the present invention. [Figure 11] FIG. 11 illustrates how a boolean trajectory segment is determined according to an embodiment of the present invention. [Figure 12] FIG. 12 is an example of a graphical user interface according to an embodiment of the present invention that is displayed on the display unit. [Figure 13] FIG. 13 is another example of a graphical user interface displayed on the display unit according to an embodiment of the present invention. [Figure 14] FIG. 14 is an example of using an interactive graphical user interface as a visual trigger to filter a measurement population according to an embodiment of the present invention. [Figure 15] FIG. 15 is an example of a histogram that can be generated by an embodiment of the present invention. [Figure 16] FIG. 16 is another example of a graphical user interface displayed on the display unit according to an embodiment of the present invention. [Figure 17] FIG. 17 is another example of a graphical user interface displayed on the display unit according to an embodiment of the present invention. [Figure 18] FIG. 18 is another example of a graphical user interface displayed on the display unit according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0011] FIG. 1 is a block diagram of an exemplary test and measurement instrument 100, such as an oscilloscope, that implements embodiments of the presently disclosed invention. The test and measurement instrument 100 may have one or more ports 102, which may be any electrical signal transmission medium. The ports 102 may include a receiver, transmitter, or transceiver. Each port 102 represents a channel of the test and measurement instrument 100. The ports 102 may be coupled to one or more processors 104 that process signals (or waveforms) received at the ports 102 from one or more devices under test. For simplicity of illustration, FIG. 1 shows only one processor 104; however, multiple processors 104 of various types may be used in combination rather than a single processor 104.

[0012] Port 102 may further be connected to a measurement unit (not shown for simplicity) within test and measurement instrument 100. Such a measurement unit may include any component capable of measuring characteristics (e.g., voltage, current, amplitude, etc.) of signals received through port 102. The test and measurement instrument may also include additional hardware and processors for further analysis, such as signal conditioning circuitry, analog-to-digital converters, and other circuitry for converting the received signals into waveforms. The resulting waveforms may be stored in memory 106 or displayed on display 108.

[0013] The one or more processors 104 execute instructions from memory 106 to perform methods and related processes indicated by those instructions, such as, but not limited to, displaying measurements to automatically identify common waveform trajectories, overlaying selected waveform trajectories from a population of measurements, filtering waveform trajectories, and generating and displaying histograms of original and sub-element measurements. Memory 106 may be implemented as processor cache, random access memory (RAM), read-only memory (ROM), solid-state memory, a hard disk drive, or other memory types. Memory 106 may also serve as a medium for storing data, computer program products, and other instructions. For example, in some embodiments, waveform data, such as waveform records, which may be acquired through port 102 or a measurement unit, may be stored in memory 106. The waveform data records may then be input from memory 106 to one or more processors 104.

[0014] A user input 110 is coupled to the one or more processors 104. The user input 110 may include a keyboard, mouse, trackball, touchscreen, or other control device that allows a user to interact with a graphical user interface (GUI) on the display 108. The display 108 may be a digital screen, cathode ray tube-based display, or any other monitor that displays waveforms, measurements, and other data to a user. While the components of the test and measurement instrument 100 are depicted as being integrated within the test and measurement instrument 100, those skilled in the art will appreciate that any of these components may be external to the test and measurement instrument 100 and coupled to the test and measurement instrument 100 by any conventional method (e.g., wired or wireless communication medium or mechanism). For example, the display 108 may be located remotely from the test and measurement instrument 100.

[0015] In some embodiments, one or more processors 104 may receive waveform data records from memory 106 or a remote device. One or more processors 104 may perform measurements on the waveform data records, for example, with a measurement unit. For example, one or more processors 104 may perform rising edge measurements, falling edge measurements, rising and falling edge measurements, edge measurements, long bit measurements, or any customized measurements configured by a user. Using the results of these measurements, one or more processors 104 may generate a histogram and direct display of the histogram on display 108.

[0016] 2 shows an example histogram 200 that may be generated based on rising edge measurements of a waveform data record. If a user expected a more normal distribution of rising edge measurement results, the resulting histogram 200 may be surprising. Embodiments of the present invention, as described in more detail further below, allow users to better understand what is occurring in the measurements they make.

[0017] Based on the measurements, one or more processors 104 may generate a measurement population, which can visually depict the measurements shown in histogram 200 as waveform segments. Generating the measurement population includes overlaying the trajectories of the separate waveform segments associated with the measurements. This process may be similar to the method used to generate an eye diagram, for example.

[0018] That is, embodiments of the present invention, as described in more detail below, can generate a collection of measurement results 300 by overlaying the results of each rising edge measurement (which provides a "waveform segment"), as shown in FIG. 3, which may be displayed on display 108.

[0019] The one or more processors 104 then automatically separate the superimposed waveforms into logical path segments or bit patterns, as shown in Figure 4. That is, the one or more processors 104 automatically separate the measurement constellation 300 into logical path segments, as shown, using various methods described below. The scale of the measurement constellation 300 may be changed, and the one or more processors 104 may automatically adjust the logical path segments based on the scale of the measurement constellation 300.

[0020] As shown in FIG. 4, in this example, one or more processors 104 determine that measurement population 300 is comprised of four logic trajectory segments 400, 402, 404, and 406. Here, logic trajectory segment 400 corresponds to logic transition 0010, logic trajectory segment 402 corresponds to logic transition 0011, logic trajectory segment 404 corresponds to logic transition 1010, and logic trajectory segment 406 corresponds to logic transition 1011. These are merely examples of possible rising-edge transitions that may be present in the data record represented by measurement population 300. While FIGS. 3 and 4 illustrate rising-edge measurements, each type of measurement represents a unique, representative logic trajectory segment. Each of rising-edge logic trajectory segments 400, 402, 404, and 406 will significantly affect the final rising-edge measurement.

[0021] 5 shows histograms 500, 502, 504, and 506 corresponding to logic trajectory segments 400, 402, 404, and 406, respectively. One or more processors 104 can generate the histograms corresponding to each of the illustrated logic trajectory segments. If combined, histograms 500, 502, 504, and 506 would produce the histogram of FIG. 2. Histograms 500 and 502, corresponding to logic trajectory segments 400 and 402, respectively, have mean values ​​μ around 400 ps, ​​while histograms 504 and 506, corresponding to logic trajectory segments 404 and 406, respectively, have mean values ​​μ around 370 ps.

[0022] The histogram, as well as the measurement population and logic trajectory segments, may be displayed to the user on the display 108. This information may be useful to the user, and may reveal to the user the reasons for the distribution of histogram 200 of Figure 2. The user may then use this information to further debug their device under test.

[0023] As shown in Figures 2-5, embodiments of the present invention allow a user to examine a large collection of measurements from various angles, which can be useful for gaining insight into the cause of seemingly unexpected measurements. As described above, measurements are taken whenever a waveform occurs. Each measurement taken at each waveform occurrence includes specific locations (start location, end location, location of interest, and the measurement itself). In the example of a rising edge measurement, the start location is the beginning (start) location of the rising edge, the end location is the location of the end of the rising edge, the location of interest is the mid-crossing point, and the measurement is the difference between the values ​​at the start location and the end location.

[0024] Figure 6 illustrates how measurements are overlaid as they occur to generate a visual representation of a collection of waveforms representing the measurement. As Figure 6 shows, waveform segments 600, 602, and 604 associated with a measurement (in this example, a rising edge measurement) are overlaid as a single waveform, allowing one or more processors 104 to generate a visual representation 606 of the collection of waveforms representing the measurement. The display 108 may change the scale of the visual representation of the collection of waveforms representing the measurement to display more or fewer waveform segments associated with the measurement. For example, the horizontal or vertical scale may be changed to achieve this.

[0025] The one or more processors 104 may automatically identify or identify logic trajectory segments of waveforms present in a population of waveforms representing measurements. When a population of waveforms representing measurements is rescaled as described above, the one or more processors 104 may determine new logic trajectory segments based on the amount of the population of measurements displayed.

[0026] In some embodiments, one or more processors 104 may use machine-learning or pattern recognition to automatically detect and isolate distinct waveform logic trajectory segments present in a population of measurements. For example, in some embodiments, machine-learning or pattern recognition may be accomplished by plotting the mean versus slope for each measurement and then using a machine-learning processor to group the distinct logic trajectory segments of the population of measurements into clusters.

[0027] For example, in Figure 7, a measurement population 700 is shown with a horizontal scale of 70 picoseconds (ps) per division (abbreviated as Div), and in this example, only one Boolean trajectory segment is detected, shown as cluster plot 702. All measurements shown in this display of measurement population 700 are clustered together, so the machine learning processor detects only one Boolean trajectory segment. The machine learning processor may be included in one or more processors 104.

[0028] In FIG. 8, a measurement ensemble 800 is shown with a horizontal scale of 100 picoseconds (ps) per division, and in this example, cluster plot 802 shows that there are four distinct logic trajectory segments visible in measurement ensemble 800. FIG. 9 shows a measurement ensemble 900 with a horizontal scale of 200 picoseconds (ps) per division, where the ensemble is more clearly visible in measurement ensemble 900 and the machine learning processor can more clearly detect the four distinct logic trajectory segments visible in measurement ensemble 900. FIG. 10 shows a measurement ensemble 1000 with a wider range, with a horizontal scale of 300 picoseconds (ps), and cluster plot 1002 depicts the 16 or more logic trajectory segments that the machine learning processor indicated.

[0029] The slope and mean cluster plot and machine learning processor can also be used for other types of waveforms. For example, Figure 11 shows an eye diagram measurement population 1100, and the machine learning processor can determine from the cluster plot 1102 that there are eight distinct logic value trajectory segments in the measurement population 1100.

[0030] In some embodiments, the machine learning processor may determine the Boolean trajectory segments by using a density-based algorithm. This approach works well for relatively small measurement collections, but can be slow for larger measurement collections, even for shorter waveform record lengths. Therefore, in another embodiment, the machine learning processor may use a grid-based algorithm. Gridding is a process that uses slope as the x-axis and mean as the y-axis. Minimum and maximum values ​​for the size of each plot group define row and column ranges. A specific number of cells are defined for each axis, and each row and column cell is a list of waveform segment trajectories.

[0031] The machine learning processor combines clumps by grouping slope and mean waveform segment trajectories together at associated grid locations and combining adjacent grid cells. This can be done quickly by the machine learning processor, and the grouping operation can be adjusted coarsely or finely by changing the number of rows and columns in the grid. Additionally, the minimum density used as a threshold for space occupancy may be changed, allowing the user to choose to discard infrequently occurring information, making it easier for the machine learning processor to separate tightly packed clusters.

[0032] When a measurement population generated by one or more processors 104 is displayed on display 108, one or more processors 104 can also automatically generate each of the boolean trajectory segments found in the measurement population, which are displayed as thumbnail images below the measurement population on display 108. A user can then select any of these thumbnail representations of a boolean trajectory segment to view more detail of that boolean trajectory segment in a larger view.

[0033] 12 shows an exemplary graphical user interface (GUI) of the display unit 108 when a measurement population 1200 has been generated and displayed on the screen. The measurement population 1200 is displayed in a main display area 1220, and below it are displayed thumbnails 1202, 1204, 1206, and 1208, each corresponding to a plurality of boolean trajectory segments. These thumbnails were automatically detected from the measurement population 1200 by a machine learning processor. Additionally, a thumbnail 1210 of the measurement population 1200 itself may be displayed and may be highlighted, as shown in box 1212, to indicate that the measurement population in thumbnail 1210 corresponds to the measurement population 1200 displayed in the main display area 1220.

[0034] As shown in FIG. 13 , when a thumbnail 1204 is selected, the logic trajectory segment depicted by the thumbnail 1204 is displayed in the main display area 1220. The user may further analyze the logic trajectory segment displayed in the main display area 1220, if desired. In some embodiments, a single measurement may be associated with multiple thumbnails, allowing for easier comparison of the logic trajectory segments. For example, for multiple rising edges in a single measurement, categorizing the logic trajectory segments by transition state may facilitate identification of problematic logic trajectory segments. This may be particularly useful when there are a large number of logic trajectory segments in a measurement population.

[0035] In some embodiments, the measurement population may be manually filtered through an interactive interface, such as a visual trigger (e.g., a mask trigger) via user input 110, where the user interacts with the screen, interacts with the screen, and then interacts with the screen again. For example, as shown in FIG. 14, the user may use user input 110 to define boxes 1402 and 1404 or some other gate (barrier) around portions of the measurement population shown on screen 1400 that the user wishes to view. As shown in FIG. 14, only the logical trajectory segments that fall within the ranges of boxes 1402 and 1404, respectively, are displayed on display 108. If either box 1402 or 1404 is removed, the measurement population display may automatically update to reflect the new trigger box settings.

[0036] In some embodiments, when one or more trigger boxes are added to a measurement population, the main display area 1420 of the display 108 may be automatically updated to display only the Boolean trajectory segments that are within the trigger boxes. Although not depicted in FIG. 14 , thumbnails for each of the Boolean trajectory segments present in the updated measurement population may be displayed below the main display area 1420. In some embodiments, a thumbnail for the complete measurement population with all Boolean trajectory segments may also be displayed, allowing the user to easily return to and view the original measurement population without deleting boxes 1402 and 1404 by selecting the thumbnail for the complete measurement population.

[0037] As shown in FIG. 15, if a user focuses on an exceptional anomaly and wishes to investigate it in more detail, they may select to display histograms of different measurements overlaid on one another to gain insight into the relationships between them and their relationship relative to the overall set of measurements. For example, FIG. 15 shows histogram 1500, which includes both rising-edge measurement result 1502 and falling-edge measurement result 1504. Note that in FIG. 15, rising-edge measurement result 1502 has been selected (highlighted by box 1512) using the selection button below the histogram, so rising-edge measurement result 1502 is displayed before falling-edge measurement result 1504. Additionally, the mean value μ, standard deviation σ, and number of data points N for rising-edge measurement result 1502 are displayed numerically in the upper right corner. Conversely, falling-edge measurement result 1504 can also be selected in a similar manner.

[0038] Figure 16 is an example of a graphical user interface displaying a collection of measurement results. In Figure 16, a main display area 1620 displays an eye diagram 1600 generated by one or more processors 104 using waveform data records. The eye diagram 1600 is a widely used statistical display for visualizing and analyzing the behavior of serial bus signals.

[0039] The one or more processors 104 then automatically detect the different logic value trajectory segments in the eye diagram and display each of these logic value trajectory segments as a plurality of thumbnails 1602 in the sub-display area 1630. A user may select one of the thumbnails 1602 through the user input 110, and in response, the main display area 1620 may display the logic value trajectory segment corresponding to the selected thumbnail, allowing the user to more closely analyze the selected logic value trajectory segment. A thumbnail for the eye diagram with all the logic value trajectory segments may also be displayed, and selecting this thumbnail may cause the eye diagram with all the logic value trajectory segments to be displayed again in the main display area. The selected thumbnail may be highlighted, for example, in box 1612.

[0040] The processing by the one or more processors 104 is not limited to generating a single set of measurements for display on the display 108. For example, in FIG. 17 , the main display area 1720 displays a pair of waveforms, a strobe waveform 1700 and a data waveform 1701. The one or more processors 104 may generate separate sets of measurements for the strobe waveform 1700 and the data waveform 1701. To do this, the one or more processors 104 may detect one or more logic value trajectory segments of the strobe waveform 1700 using the techniques described above. The data waveform 1701 may be rendered using timing information obtained from these logic value trajectory segments. By displaying both waveforms simultaneously, a user can easily observe the relationship between the strobe waveform 1700 and the data waveform 1701. Multiple thumbnails 1702 may be displayed to show different logic value trajectory segments of the waveforms. As described with respect to other embodiments, selecting any of the thumbnails 1702 may cause the corresponding logical trajectory segment to be displayed in the main display area 1720 for further analysis and observation by the user.

[0041] In some embodiments, a user may select other methods of displaying the data. For example, rather than providing a main display area as described in some of the above embodiments, measurement populations and logic trajectory segments, along with their associated measurements, may be displayed in dedicated waveform display areas. For example, as shown in FIG. 18 , logic trajectory segments and measurement populations may be displayed in their own dedicated waveform display areas within waveform display area 1800, with corresponding histograms of rising edge measurements displayed in corresponding measurement display areas within measurement display area 1802 adjacent to each dedicated waveform display area.

[0042] Embodiments of the present invention may operate on specially created hardware, firmware, digital signal processors, or specially programmed general-purpose computers, including processors that operate according to programmed instructions. The terms "controller" or "processor" herein contemplate microprocessors, microcomputers, ASICs, and dedicated hardware controllers, among others. Aspects of the present invention may be implemented in computer-usable data and computer-executable instructions, such as one or more program modules, executed by one or more computers (including a monitoring module) or other devices. Generally, program modules include routines, programs, objects, components, data structures, and the like, which, when executed by a processor in a computer or other device, perform particular tasks or implement particular abstract data formats. Computer-executable instructions may be stored in computer-readable storage media, such as hard disks, optical disks, removable storage media, solid-state memory, RAM, and the like. Those skilled in the art will appreciate that the functionality of the program modules may be combined or distributed as desired in various embodiments. Furthermore, such functionality may be embodied in whole or in part in firmware or hardware equivalents, such as integrated circuits, field programmable gate arrays (FPGAs), etc. One or more aspects of the present invention may be more effectively implemented using particular data structures, and such data structures are considered within the scope of the computer-executable instructions and computer-usable data described herein.

[0043] The disclosed aspects may, in some cases, be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried by or stored on one or more computer-readable media that can be read and executed by one or more processors. Such instructions may be referred to as a computer program product. As used herein, computer-readable media refers to any medium that can be accessed by a computing device. By way of example and not limitation, computer-readable media may include computer storage media and communication media.

[0044] "Computer storage media" means any medium that can be used to store computer-readable information. By way of example and not limitation, computer storage media may include random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory and other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) and other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage and other magnetic storage devices, and any other volatile or nonvolatile, removable or non-removable medium implemented in any technology. "Computer storage media" excludes signals themselves and transitory forms of signal transmission.

[0045] A communication medium means any medium available for communicating computer-readable information. By way of example, and not limitation, communication media may include coaxial cable, fiber optic cable, air, or any other medium suitable for communicating electrical, optical, radio frequency (RF), infrared, acoustic, or other types of signals.

[0046] The following examples are provided to aid in understanding the technology disclosed in this application. Embodiments of the technology may include one or more of the examples described below, and any combination thereof.

[0047] Example 1 is a test and measurement instrument comprising: a memory configured to store a waveform data record; one or more processors configured to receive the waveform data record, determine measurement values ​​and a plurality of occurrences of measurement events in the waveform data record, detect one or more logical value trajectory segments at the plurality of occurrences, and generate visual display data for each of the measurement values ​​and visual display data in which each of the measurement values ​​is overlaid; and a display configured to display the visual display data for the measurement values.

[0048] Example 2 is the test and measurement instrument of Example 1, wherein the one or more processors are further configured to individually isolate one or more of the logic value trajectory segments, and the display is further configured to display each of the logic value trajectory segments.

[0049] Example 3 is the test and measurement instrument of Example 2, wherein the display unit is further configured to display visual representation data of the measurement value simultaneously with displaying each of the logic value trajectory segments.

[0050] Example 4 is the test and measurement instrument of any of Examples 1 to 3, wherein the one or more processors are configured to detect the one or more logic value trajectory segments using a pattern recognition process.

[0051] Example 5 is the test and measurement instrument of Example 4, wherein the pattern recognition process includes generating a grid based on each of the measurements and grouping similar adjacent grid cells.

[0052] Example 6 is the test and measurement instrument of Example 4, wherein the pattern recognition process includes correlating multiple measurements using density analysis.

[0053] Example 7 is the test and measurement instrument of any of Examples 1 to 6, further comprising a user input, wherein the one or more processors are further configured to filter the detected one or more logic value trajectory segments based on input from the user input.

[0054] Example 8 is the test and measurement instrument of any of Examples 1 to 7, wherein the measurement is the result of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

[0055] Example 9 is the test and measurement instrument of any of Examples 1 to 8, wherein the measurements are first measurements, and the one or more processors are further configured to generate a histogram based on the first measurements and a second measurement different from the first measurements.

[0056] Example 10 is a method for automatically detecting logic value trajectory segments in a collection of measurement results, comprising: determining measurement values ​​and a plurality of occurrences of measurement events in the waveform data record; detecting one or more logic value trajectory segments at the plurality of occurrences; generating visual display data for each of the measurement values ​​and visual display data overlaid with each of the measurement values; and displaying the visual display data for each of the measurement values.

[0057] Example 11 is the method of example 10, further comprising isolating one or more of the boolean trajectory segments individually and displaying each of the boolean trajectory segments.

[0058] Example 12 is the method of example 11, further comprising displaying each of the logic trajectory segments simultaneously with visual representation data for each of the measurements.

[0059] Example 13 is the method of any of Examples 10 to 12, further comprising detecting one or more of the boolean trajectory segments by a pattern recognition process.

[0060] Example 14 is the method of example 13, wherein the pattern recognition process includes generating a grid based on each of the measurements and grouping similar adjacent grid cells.

[0061] Example 15 is the method of example 13, wherein the pattern recognition process comprises correlating the measurements using density analysis.

[0062] Example 16 is the method of any of Examples 10 to 15, further comprising filtering the detected one or more boolean trajectory segments based on input from a user.

[0063] Example 17 is the method of any of examples 10 to 16, wherein the measurement is the result of any of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

[0064] Example 18 is a computer program having instructions that, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to perform processes of determining measurement values ​​and multiple occurrences of measurement events in the waveform data record, detecting one or more logical value trajectory segments at the multiple occurrences, generating visual display data for each of the measurement values ​​and visual display data overlaid with each of the measurement values, and displaying the visual display data overlaid with each of the measurement values.

[0065] Example 19 is the computer program of Example 18, further comprising instructions for simultaneously displaying each of the logical value trajectory segments with visual display data overlaid on each of the logical value trajectory segments.

[0066] Example 20 is the computer program of any of Examples 18 and 19, wherein the measurement is the result of any of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

[0067] Although the above-described versions of the disclosed subject matter have many advantages that have been described or that will be apparent to those skilled in the art, not all of these advantages or features are required in every version of the disclosed devices, systems, or methods.

[0068] Additionally, the description of this application refers to specific features. It should be understood that the disclosure herein includes all possible combinations of these specific features. When a specific feature is disclosed in the context of a particular aspect or embodiment, that feature can also be used in the context of other aspects and embodiments, to the extent possible.

[0069] Furthermore, when this application refers to a method having two or more defined steps or processes, these defined steps or processes may be performed in any order or simultaneously, unless the circumstances do not preclude this possibility.

[0070] Although specific embodiments of the invention have been illustrated and described for purposes of illustration, it will be appreciated that various changes can be made therein without departing from the spirit and scope of the invention. Accordingly, the invention is not to be limited except as by the appended claims. [Explanation of symbols]

[0071] 100 Test and measurement equipment Port 102 104 processors 106 memory 108 Display section 110 User input section

Claims

1. a memory configured to store a waveform data record of a logic transition signal; one or more processors receiving said waveform data record; determining measurements and multiple occurrences of measurement events in the waveform data record; detecting one or more logic value trajectory segments at a plurality of said occurrences, said logic value transitions being waveform segments representing said logic value transitions in said waveform data record; separating one or more of the logic value trajectory segments individually based on the logic value; generating visual representation data for each of the measurements and visual representation data overlaid with each of the measurements; the processor configured to: a display configured to display a visual representation of the measurement; A test and measurement device comprising:

2. The test and measurement device of claim 1, wherein the display is further configured to display each of the logical value trajectory segments separated based on the logical value.

3. further comprising a user input unit; 3. The test and measurement instrument of claim 1, wherein one or more of the processors are further configured to filter one or more of the detected logic value trajectory segments based on input from the user input.

4. 1. A method for automatically detecting boolean trajectory segments in a set of measurements, comprising: determining measurements and multiple occurrences of measurement events in a waveform data record of a logic transition signal; generating the set of measurements by overlapping waveform segments at multiple occurrences of the measurements and the measurement events in the waveform data record; detecting one or more logic value trajectory segments at a plurality of said occurrences, said logic value transitions being waveform segments representing said logic value transitions in said waveform data record; separating one or more of the logic value trajectory segments individually based on the logic value; generating visual representation data for each of the measurements and visual representation data overlaid with each of the measurements; displaying a visual representation of each of said measurements; A method for detecting boolean trajectory segments comprising:

5. Displaying each of said logical value trajectory segments separated based on said logical values.

5. The method of claim 4, further comprising:

6. 6. A computer program comprising instructions that, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to perform the method of any of claims 4 or 5.

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