107results about "Cathode-ray oscilloscopes" patented technology

An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sample rate, and produce digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based upon entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.

A test and measurement device includes an input port to receive an input signal, a sampling circuit structured to generate a sample from the input signal, in which generating the sample from the input signal produces an amount of kickout energy, and an energy reducing circuit coupled between the sampling circuit and one or more other components of the test and measurement device, the energy reducing circuit structured to decrease the amount of kickout energy from the sampling circuit. The energy reducing circuit may include or be combined with a pick-off circuit. Methods are also described.

To artificially generate waveform data for machine learning.SOLUTION: An AI assistant 10 receives, from a user 20, input such as patterns and definitions relating to waveforms to be generated, and accesses a memory 14 that stores knowledge of test measurement, waveform fault information 16, descriptions 18 of test measurement devices, and various protocol standards 26, and provides knowledge required for waveform generation to a generative AI model 12. Further, via an assistant API, a vector database and retrieval-augmented generation (RAG) may be connected to a system so as to provide the generative AI model 12 with knowledge / information of specific domains relating to waveforms for test measurement. Using these, the generative AI model 12 is capable of generating a large amount of waveform data for machine learning, with labels assigned to respective waveform data.SELECTED DRAWING: Figure 1

To analyze power signals of a motor from a new perspective.SOLUTION: A power vector analyzer 130 for analyzing power from a DUT motor 120 comprises: one or more channels for measuring a reference voltage signal from a power line connected to the DUT 120; one or more channels for measuring a reference current signal from the power line; a user interface having a display and one or more operating units; and a quadrature synchronous detector (QSD) 46 for each phase of apparent power to be measured. The QSD 46 is configured to use the reference voltage signal and the reference current signal to determine the apparent power for each phase of the power to be measured by the DUT 120 and display the apparent power for each phase on the display 144.SELECTED DRAWING: Figure 14

The system includes an input for receiving a digital waveform signal, a memory, and one or more processors configured to execute a program that causes the one or more processors to perform the following operations: generate a horizontal ramp sweep signal based on the digital waveform signal; receive a selection input for identifying a segment of the digital waveform signal; gate the horizontal ramp sweep signal and the digital waveform signal based on the selection input to generate circular loop image data for the segment of the digital waveform; store the circular loop image data in memory; and provide the circular loop image data as one or more inputs to a machine learning system.A method for waveform classification using circular loop images includes receiving an input waveform, receiving selection information for a segment of the input waveform, and converting the segment of the input waveform into circular loop image data, including generating a horizontal ramp sweep signal based on an edge transition in the input waveform, storing the circular loop image data in memory, and transmitting the circular loop image data to a machine learning system to determine attributes of the input waveform.

To provide a waveform output device capable of causing a waveform to be suitably displayed even when a data volume of measurement results is large.SOLUTION: A waveform output device 1 outputs a waveform that represents a change over time in a measurement result of a physical quantity to be measured via communication. The waveform output device 1 acquires measurement data that represents a measurement result of a predetermined physical quantity, generates waveform data that indicates a waveform from the measurement result of the obtained measurement data, and outputs the waveform data to a user terminal for causing the user terminal used by a user to display the waveform. At this time, the waveform output device 1 extracts a part of the measurement result included in the measurement data based on a predetermined condition, generates partial waveform data that indicates a partial waveform from a part of the extracted measurement result, and outputs the partial waveform data to the user terminal.SELECTED DRAWING: Figure 5

Capture time-correlated signals for SI / PI analysis. [Solution] The signal and power analyzer includes a high-bandwidth input channel set as a real-equivalent-time (RET) input channel or a radio frequency (RF) channel, an input channel set as a low-bandwidth real-time (RT) input channel, one or more analog-to-digital converters (ADCs) having multiple pipes, a first set of pipes connected to the high-bandwidth input channel and generating high-bandwidth data, a second set of pipes connected to the low-bandwidth RT input channel and generating low-bandwidth RT data, a system clock circuit 54 connected to the high-bandwidth input channel and the low-bandwidth RT input channel, a memory 34 connected to the system clock circuit 54, the first set of pipes and the second set of pipes, and one or more processors that store the low-bandwidth RT data and high-bandwidth data in the memory 34 and reconcile the high-bandwidth data and low-bandwidth data.

A display device, comprising a main display module, an auxiliary display module, and an adjusting unit. The main display module comprises a main control circuit, and the main control circuit is configured to control display of the main display module; the auxiliary display module comprises an auxiliary control circuit, and the auxiliary control circuit is configured to control display of the auxiliary display module; and any two of the main control circuit, the auxiliary control circuit, and the adjusting unit are electrically connected, and the main control circuit, the auxiliary control circuit, and the adjusting unit are configured to adjust the display brightness and the display color temperature of the main display module and the auxiliary display module to be consistent.

To shorten the test time using AI.SOLUTION: A test and measurement device 10 includes one or more ports 28 to connect to a device under test (DUT) 12, a user interface 22 having one or more control devices, a display 24, a storage 26, one or more processors 20. The processors 20 receive test signals from the DUT 12 through the one or more ports 28 during test of the DUT 12, use the test signals to generate test data, display test data on the display 24, display on the user interface 22 a control button indicating that an artificial intelligence (AI) assistant is available, receive an input through the control button to start the AI assistant, provide, on the user interface 22, regions allowing the user to interact with the AI assistant, and apply a machine learning model represented by the AI assistant to provide the user with additional information related to one or more of the test and the DUT 12.SELECTED DRAWING: Figure 1

Method for selecting at least one signal segment extending over a first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) ( { si} t E nd 1 t Start 1 , { si} t E nd 2 t Start 2 , { si} t E nd 3 t Start 3 ,... ) of a detected signal (s(t)) with the following process steps: • Determining a start time ( t Start 1 , t Start 2 , t Start 3 ,... ) of the respective first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) from at least one time point which corresponds to a defined first event that occurred in the signal (s(t)) or in at least one signal derivable from the signal (s(t)) or in a timer or in an external trigger signal, • Determining an end time (t End 1, t End 2, t End 3,...) of the respective first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) from at least one time point which belongs to a defined second event that occurred in the signal (s(t)) or in at least one signal derivable from the signal (s(t)) or in the timer or in the external trigger signal and is related to at least one first event, and • Selecting the signal waveform ( { si} t E nd 1 t Start 1 , { si} t E nd 2 t Start 2 , { si} t E nd 3 t Start 3 ,... ) of the detected signal (s(t)) in the respective first signal section ( Δ t 1 , Δ t 2 , Δ t 3 ,... ) , where the in the respective first signal sections (Δ t 1 , Δ t 2 , Δ t 3 ,... ) selected signal waveforms ( { si} t E nd 1 t Start 1 , { si} t E nd 2 t Start 2 , { si} t E nd 3 t Start 3 ,... ) of the detected signal (s(t)) with the corresponding first signal sections ( Δ t 1 , Δ t 2 , Δ t 3 ,... ) , proper start and end times ( t Start 1 , t Start 2 , t Start 3 ,..., t End 1 , t End 2 , t End 3 ,... ) on a display device (12), wherein in the respective first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) Deterministic and / or statistical parameters of the detected signal (s(t)) are determined and compared with associated defined reference values ​​for admissibility, and including a selection and representation of the respective first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) on the display device (12) only if the respective first signal section (Δ t 1 , Δ t 2 , Δ t 3 ,... ) exhibits permissible deterministic and / or statistical parameters.

To selectively display only a waveform of interest from many acquired waveforms with an intuitive operation.SOLUTION: A test measurement device acquires a plurality of waveforms from a device under test, stores the waveforms in a memory, and displays the plurality of acquired waveforms on a display section by overlaying the acquired waveforms. A user can visually select a waveform of interest by drawing a box such as regions of interest 302, 304, and 306 from a user input section. Then, the test measurement device updates the waveform display of the display section so as to display only a waveform determined to be in the regions of interest 302, 304, and 306 from the plurality of acquired waveforms.SELECTED DRAWING: Figure 3

An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sampling rate, and generate digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based on entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.

To improve measurement speed.SOLUTION: A test and measurement device 20 receives a signal from a device 10 under test through a probe 32. One or more processors 38 generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform from a user interface device 44, select the number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system 46 to the short pattern waveforms to obtain a value for the one or more measurements, and supply the values of the one or more measurements for the waveform.SELECTED DRAWING: Figure 8

To effectively detect transition of a PAMn signal.SOLUTION: The test and measurement instrument 100 includes an input 102 to receive an n-ary pulse amplitude modulation (PAMn) signal, an analog-to-digital converter (ADC) 106 to digitize the PAMn signal, a memory 108 to store the digitized PAMn signal as a waveform, and a trigger circuit 110 coupled to the ADC and the memory. In addition, a clock and data recovery (CDR) circuit 112 decodes bits from the PAMn signal. The transition detection logic 114 causes the trigger circuit 110 to generate a trigger signal when it detects a transition of a particular symbol based on the decoded bits.SELECTED DRAWING: Figure 1

The present invention relates to a test or measurement instrument, comprising a test unit, a memory, a display, a network interface and a processing unit. The processing unit is configured to generate a machine-readable representation of data such as a QR code which comprises encoded address information of the data file stored in the memory. The processing unit is further configured to display the generated QR code on the display for enabling an external network device to download the stored data file via the network interface after having scanned the displayed QR code and decoded the address information encoded therein. The invention further relates to a method for enabling a network device to downloaded data stored in a test or measurement instrument.

A measuring instrument is described. The measuring instrument comprises at least one input port and a measuring module. The input port is configured to receive a radio frequency (RF) signal from a device under test, where the RF signal includes a sequence of symbols. The measurement module is configured to receive an RF signal from the input port. The measurement module includes a reference signal module, where the reference signal module is configured to generate a reference signal based on the received RF signal, where the reference signal includes an extracted symbol sequence corresponding to a symbol sequence of the RF signal. The measurement module also includes an error module, wherein the error module is configured to determine an error vector based on the RF signal and based on the reference signal. The measurement module further comprises an analysis module, wherein the analysis module is configured to determine whether the reference signal is correct based on the determined error vector.

Efficiently save characteristic parts of the waveform to memory. [Solution] The oscilloscope 100 includes an input unit 102 that receives an input signal consisting of multiple waveform segments whose amplitude changes with respect to time, a sampler that samples the input signal at regular intervals and generates a sampling signal consisting of multiple sample segments corresponding to each waveform segment, an acquisition processor 110 having a slew rate controller 112 that determines the instantaneous rate of change of amplitude of a selected waveform segment in the waveform segments of the input signal as the instantaneous slew rate of the input signal, and a sampling filter that stores the sample segment corresponding to the selected waveform segment in the waveform segments of the input signal in the acquisition memory 114 only for the period during which the instantaneous slew rate of the selected waveform segment of the input signal exceeds a slew rate threshold.

An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector comprising a first multiplexer having a first plurality of inputs and a second multiplexer having a second plurality of inputs, and a first multiplexer having a first plurality of inputs, each input of the first plurality of inputs coupled to a different one of the plurality of test signals from one or more devices under test and having a first output of a selected one of the first plurality of inputs, and a second plurality of inputs having a second output of a selected one of the first plurality of inputs, each input of the second plurality of inputs is coupled to a different one of the plurality of test signals from the one or more devices under test, and has a second output of a selected one of the plurality of inputs. Methods are also described.

Signal Processing Apparatus and Method, Digital Oscilloscope, The signal processing apparatus is configured to output one of two types of target signals based on a trigger signal and a trigger level, and includes a trigger comparison unit (100) configured to extract a low-frequency component signal of the trigger signal, a controller (200) electrically connected to the trigger comparison unit (100) and configured to generate a trigger comparison signal based on the relationship between the low-frequency component signal and the trigger signal, and output one of the target signals obtained based on the trigger comparison signal according to a preset, and a trigger display unit (500) electrically connected to the controller (200) and configured to receive the target signal and display it on a target interaction interface.

To intelligibly display which measurement item has a problem when an output to an input is measured.SOLUTION: A measurement result output device (91) determines, based on a degree of deviation from a predetermined value defined for a measurement item, whether a measurement result corresponding to the measurement item falls under conformity, non-conformity, or potential non-conformity, and executes output of the measurement item and the measurement result, based on the result of the determination, such that the measurement result falling under non-conformity or potential non-conformity is displayed in a mode different from that of the measurement result falling under conformity.SELECTED DRAWING: Figure 1

This application discloses and provides a method and apparatus for collecting high-frequency power supply signals. The method includes: determining a rising edge section and a falling edge section within a current pulse period based on the power change amount of continuous sampling points and a predetermined determination threshold; determining abnormal data bits corresponding to the rising edge section of the pulse ramp determination module and the falling edge section of the pulse ramp determination module in a sampling array; setting the abnormal data bits to 0, a null signal value, or a low-level value of the signal, or skipping the output of the data of the abnormal data bits of the pulse ramp determination module when outputting sampling data, thereby solving the problem in the prior art that high-frequency power supplies are continuously sampled and the ramp signals generated during switch switching and in PULSE mode cannot be accurately read.

A test and measurement instrument comprises an input for receiving a pulse-amplitude modulated n-level signal (PAMn), an analog-to-digital converter (ADC) coupled to the input to digitize the PAMn signal, a capture memory coupled to the ADC and configured to store at least a portion of the digitized PAMn signal as a waveform, a trigger circuit coupled to the ADC and the capture memory to generate a trigger signal to cause the test and measurement instrument to initiate waveform acquisition, a PAMn clock and data recovery (CDR) circuit configured to decode bits from the PAMn signal, and a transition detection logic circuit coupled to the PAMn CDR circuit and the trigger circuit to detect symbol transitions based on the decoded bits and to initiate the trigger circuit.The trigger signal is designed to generate a response to the detection of a specific symbol transition.

A test and measurement system has a test and measurement instrument that includes a connection to a device under test (DUT); one or more analog-to-digital converters (ADCs) to receive and convert a signal from the DUT to one or more digital waveforms; and one or more processors to: receive the one or more digital waveforms corresponding to one set of tuning parameters applied to the DUT; build one or more image tensors of the one or more digital waveforms; use an artificial intelligence embedding model that generates one or more text strings from metadata and embeds the metadata and the one or more image tensors into a vector; access a vector database; receive a set of indexes having a number of indexes corresponding to a number of matches; use the set of indexes to find one or more sets of optimal tuning parameters; and validate operation of the DUT.

It handles a variety of applications without having to train multiple different models. [Solution] The test measurement device 30 includes a port that connects the test measurement device 30 to the device under test (DUT) 32 to enable receiving signals from the DUT 32, one or more analog-to-digital converters (ADCs) 38 that receive signals from the DUT 32 and convert them into one or more digital waveforms, a user interface 40 that allows the user to input queries, and one or more processors 42. The device is configured to execute a program that creates one or more images of one or more digital waveforms from one or more ADCs 38, sends one or more images to a domain-adaptive multimodal large-scale language model (MLLM), receives parameters from the domain-adaptive MLLM, provides the user with parameters for the DUT 32 according to the query, and has one or more processors 42 perform the processing of applying the parameters to the DUT 32.

To achieve a higher bandwidth than what can be conventionally achievable.SOLUTION: A test and measurement instrument 10 provided herein comprises one or more ports 12 for receiving a signal from a device under test (DUT) 11, an array 18 of analog-to-digital converters (ADC) for receiving the signal, a data collector for outputting one sample from each ADC 16 during one ADC clock cycle, and one or more processors 24 for providing a sample clock to each ADC 16 having a different clock phase from other ADCs to cause non-uniform sample spacing below a Nyquist frequency, and for causing the ADCs to output samples with non-uniform spacing.SELECTED DRAWING: Figure 1

This replicates signals from a device under test with specific environmental and channel conditions. [Solution] The test measurement system 10 includes a plurality of nodes 12, each having one or more sensors configured to receive signals; one or more generative adversarial network (GAN) models; one or more signal generators configured to generate and transmit signals; and one or more processors 16. The system is configured to execute a program that causes one or more processors to perform the following processes: receive a request for a signal having a signal profile from any of the plurality of nodes 12, send the signal profile and the request to one or more GAN models, receive a signal profile that matches the signal profile, send the matching signal profile to one or more signal generators, and generate and transmit a matching signal.

The present disclosure provides a measurement application device control unit comprising: a text input interface configured to receive a textual user request with respect to a measurement application device; a processor coupled to the text input interface through a pre-trained artificial intelligence algorithm and configured to generate response data about the measurement application device based on the textual user request; and an output interface coupled to the pre-trained artificial intelligence algorithm and configured to output the response data. In addition, the invention also provides a measurement application device and a corresponding method.

What is needed is an improved signal transmission system that can preserve the bandwidth, accuracy, and fidelity of all of the high speed differential signals under severe common mode and environmental conditions.SOLUTION: Optical probing systems transmit high fidelity analog signals from a device under test (DUT) to a measurement instrument. The system receives a differential input signal and splits the differential input signal into a high frequency (HF) component and a low frequency (LF) component. Each component is independently modulated using a different analog modulation technique and transmitted over a separate optical fiber. The architecture maintains galvanic isolation between the input and output devices and allows for independent transmission of signal portions optimized for bandwidth and accuracy. The signals are demodulated, delay-matched, and recombined in the analog domain to produce a reconstructed full-bandwidth output.SELECTED DRAWING: Figure 3

To enable error detection even in the presence of influence of sideband signals for a pattern of a main signal of a bus.SOLUTION: A logic circuit 76 in a test and measurement device determines a data sequence from a main signal of a bus received on a main acquisition channel 60 of the test and measurement device, and uses information from an auxiliary (sideband) signal of the bus on an auxiliary channel 81 or 91 of the test and measurement device based upon a protocol associated with the bus so as to perform error detection on the data sequence.SELECTED DRAWING: Figure 3