80results about "Cathode-ray oscilloscopes" patented technology

An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sample rate, and produce digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based upon entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.

To artificially generate waveform data for machine learning.SOLUTION: An AI assistant 10 receives, from a user 20, input such as patterns and definitions relating to waveforms to be generated, and accesses a memory 14 that stores knowledge of test measurement, waveform fault information 16, descriptions 18 of test measurement devices, and various protocol standards 26, and provides knowledge required for waveform generation to a generative AI model 12. Further, via an assistant API, a vector database and retrieval-augmented generation (RAG) may be connected to a system so as to provide the generative AI model 12 with knowledge / information of specific domains relating to waveforms for test measurement. Using these, the generative AI model 12 is capable of generating a large amount of waveform data for machine learning, with labels assigned to respective waveform data.SELECTED DRAWING: Figure 1

The system includes an input for receiving a digital waveform signal, a memory, and one or more processors configured to execute a program that causes the one or more processors to perform the following operations: generate a horizontal ramp sweep signal based on the digital waveform signal; receive a selection input for identifying a segment of the digital waveform signal; gate the horizontal ramp sweep signal and the digital waveform signal based on the selection input to generate circular loop image data for the segment of the digital waveform; store the circular loop image data in memory; and provide the circular loop image data as one or more inputs to a machine learning system.A method for waveform classification using circular loop images includes receiving an input waveform, receiving selection information for a segment of the input waveform, and converting the segment of the input waveform into circular loop image data, including generating a horizontal ramp sweep signal based on an edge transition in the input waveform, storing the circular loop image data in memory, and transmitting the circular loop image data to a machine learning system to determine attributes of the input waveform.

Capture time-correlated signals for SI / PI analysis. [Solution] The signal and power analyzer includes a high-bandwidth input channel set as a real-equivalent-time (RET) input channel or a radio frequency (RF) channel, an input channel set as a low-bandwidth real-time (RT) input channel, one or more analog-to-digital converters (ADCs) having multiple pipes, a first set of pipes connected to the high-bandwidth input channel and generating high-bandwidth data, a second set of pipes connected to the low-bandwidth RT input channel and generating low-bandwidth RT data, a system clock circuit 54 connected to the high-bandwidth input channel and the low-bandwidth RT input channel, a memory 34 connected to the system clock circuit 54, the first set of pipes and the second set of pipes, and one or more processors that store the low-bandwidth RT data and high-bandwidth data in the memory 34 and reconcile the high-bandwidth data and low-bandwidth data.

A display device, comprising a main display module, an auxiliary display module, and an adjusting unit. The main display module comprises a main control circuit, and the main control circuit is configured to control display of the main display module; the auxiliary display module comprises an auxiliary control circuit, and the auxiliary control circuit is configured to control display of the auxiliary display module; and any two of the main control circuit, the auxiliary control circuit, and the adjusting unit are electrically connected, and the main control circuit, the auxiliary control circuit, and the adjusting unit are configured to adjust the display brightness and the display color temperature of the main display module and the auxiliary display module to be consistent.

To shorten the test time using AI.SOLUTION: A test and measurement device 10 includes one or more ports 28 to connect to a device under test (DUT) 12, a user interface 22 having one or more control devices, a display 24, a storage 26, one or more processors 20. The processors 20 receive test signals from the DUT 12 through the one or more ports 28 during test of the DUT 12, use the test signals to generate test data, display test data on the display 24, display on the user interface 22 a control button indicating that an artificial intelligence (AI) assistant is available, receive an input through the control button to start the AI assistant, provide, on the user interface 22, regions allowing the user to interact with the AI assistant, and apply a machine learning model represented by the AI assistant to provide the user with additional information related to one or more of the test and the DUT 12.SELECTED DRAWING: Figure 1

To selectively display only a waveform of interest from many acquired waveforms with an intuitive operation.SOLUTION: A test measurement device acquires a plurality of waveforms from a device under test, stores the waveforms in a memory, and displays the plurality of acquired waveforms on a display section by overlaying the acquired waveforms. A user can visually select a waveform of interest by drawing a box such as regions of interest 302, 304, and 306 from a user input section. Then, the test measurement device updates the waveform display of the display section so as to display only a waveform determined to be in the regions of interest 302, 304, and 306 from the plurality of acquired waveforms.SELECTED DRAWING: Figure 3

An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sampling rate, and generate digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based on entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.

To improve measurement speed.SOLUTION: A test and measurement device 20 receives a signal from a device 10 under test through a probe 32. One or more processors 38 generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform from a user interface device 44, select the number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system 46 to the short pattern waveforms to obtain a value for the one or more measurements, and supply the values of the one or more measurements for the waveform.SELECTED DRAWING: Figure 8

To effectively detect transition of a PAMn signal.SOLUTION: The test and measurement instrument 100 includes an input 102 to receive an n-ary pulse amplitude modulation (PAMn) signal, an analog-to-digital converter (ADC) 106 to digitize the PAMn signal, a memory 108 to store the digitized PAMn signal as a waveform, and a trigger circuit 110 coupled to the ADC and the memory. In addition, a clock and data recovery (CDR) circuit 112 decodes bits from the PAMn signal. The transition detection logic 114 causes the trigger circuit 110 to generate a trigger signal when it detects a transition of a particular symbol based on the decoded bits.SELECTED DRAWING: Figure 1

Efficiently save characteristic parts of the waveform to memory. [Solution] The oscilloscope 100 includes an input unit 102 that receives an input signal consisting of multiple waveform segments whose amplitude changes with respect to time, a sampler that samples the input signal at regular intervals and generates a sampling signal consisting of multiple sample segments corresponding to each waveform segment, an acquisition processor 110 having a slew rate controller 112 that determines the instantaneous rate of change of amplitude of a selected waveform segment in the waveform segments of the input signal as the instantaneous slew rate of the input signal, and a sampling filter that stores the sample segment corresponding to the selected waveform segment in the waveform segments of the input signal in the acquisition memory 114 only for the period during which the instantaneous slew rate of the selected waveform segment of the input signal exceeds a slew rate threshold.

Signal Processing Apparatus and Method, Digital Oscilloscope, The signal processing apparatus is configured to output one of two types of target signals based on a trigger signal and a trigger level, and includes a trigger comparison unit (100) configured to extract a low-frequency component signal of the trigger signal, a controller (200) electrically connected to the trigger comparison unit (100) and configured to generate a trigger comparison signal based on the relationship between the low-frequency component signal and the trigger signal, and output one of the target signals obtained based on the trigger comparison signal according to a preset, and a trigger display unit (500) electrically connected to the controller (200) and configured to receive the target signal and display it on a target interaction interface.

To intelligibly display which measurement item has a problem when an output to an input is measured.SOLUTION: A measurement result output device (91) determines, based on a degree of deviation from a predetermined value defined for a measurement item, whether a measurement result corresponding to the measurement item falls under conformity, non-conformity, or potential non-conformity, and executes output of the measurement item and the measurement result, based on the result of the determination, such that the measurement result falling under non-conformity or potential non-conformity is displayed in a mode different from that of the measurement result falling under conformity.SELECTED DRAWING: Figure 1

A test and measurement instrument comprises an input for receiving a pulse-amplitude modulated n-level signal (PAMn), an analog-to-digital converter (ADC) coupled to the input to digitize the PAMn signal, a capture memory coupled to the ADC and configured to store at least a portion of the digitized PAMn signal as a waveform, a trigger circuit coupled to the ADC and the capture memory to generate a trigger signal to cause the test and measurement instrument to initiate waveform acquisition, a PAMn clock and data recovery (CDR) circuit configured to decode bits from the PAMn signal, and a transition detection logic circuit coupled to the PAMn CDR circuit and the trigger circuit to detect symbol transitions based on the decoded bits and to initiate the trigger circuit.The trigger signal is designed to generate a response to the detection of a specific symbol transition.

A test and measurement system has a test and measurement instrument that includes a connection to a device under test (DUT); one or more analog-to-digital converters (ADCs) to receive and convert a signal from the DUT to one or more digital waveforms; and one or more processors to: receive the one or more digital waveforms corresponding to one set of tuning parameters applied to the DUT; build one or more image tensors of the one or more digital waveforms; use an artificial intelligence embedding model that generates one or more text strings from metadata and embeds the metadata and the one or more image tensors into a vector; access a vector database; receive a set of indexes having a number of indexes corresponding to a number of matches; use the set of indexes to find one or more sets of optimal tuning parameters; and validate operation of the DUT.

It handles a variety of applications without having to train multiple different models. [Solution] The test measurement device 30 includes a port that connects the test measurement device 30 to the device under test (DUT) 32 to enable receiving signals from the DUT 32, one or more analog-to-digital converters (ADCs) 38 that receive signals from the DUT 32 and convert them into one or more digital waveforms, a user interface 40 that allows the user to input queries, and one or more processors 42. The device is configured to execute a program that creates one or more images of one or more digital waveforms from one or more ADCs 38, sends one or more images to a domain-adaptive multimodal large-scale language model (MLLM), receives parameters from the domain-adaptive MLLM, provides the user with parameters for the DUT 32 according to the query, and has one or more processors 42 perform the processing of applying the parameters to the DUT 32.

To achieve a higher bandwidth than what can be conventionally achievable.SOLUTION: A test and measurement instrument 10 provided herein comprises one or more ports 12 for receiving a signal from a device under test (DUT) 11, an array 18 of analog-to-digital converters (ADC) for receiving the signal, a data collector for outputting one sample from each ADC 16 during one ADC clock cycle, and one or more processors 24 for providing a sample clock to each ADC 16 having a different clock phase from other ADCs to cause non-uniform sample spacing below a Nyquist frequency, and for causing the ADCs to output samples with non-uniform spacing.SELECTED DRAWING: Figure 1

This replicates signals from a device under test with specific environmental and channel conditions. [Solution] The test measurement system 10 includes a plurality of nodes 12, each having one or more sensors configured to receive signals; one or more generative adversarial network (GAN) models; one or more signal generators configured to generate and transmit signals; and one or more processors 16. The system is configured to execute a program that causes one or more processors to perform the following processes: receive a request for a signal having a signal profile from any of the plurality of nodes 12, send the signal profile and the request to one or more GAN models, receive a signal profile that matches the signal profile, send the matching signal profile to one or more signal generators, and generate and transmit a matching signal.

The present disclosure provides a measurement application device control unit comprising: a text input interface configured to receive a textual user request with respect to a measurement application device; a processor coupled to the text input interface through a pre-trained artificial intelligence algorithm and configured to generate response data about the measurement application device based on the textual user request; and an output interface coupled to the pre-trained artificial intelligence algorithm and configured to output the response data. In addition, the invention also provides a measurement application device and a corresponding method.

What is needed is an improved signal transmission system that can preserve the bandwidth, accuracy, and fidelity of all of the high speed differential signals under severe common mode and environmental conditions.SOLUTION: Optical probing systems transmit high fidelity analog signals from a device under test (DUT) to a measurement instrument. The system receives a differential input signal and splits the differential input signal into a high frequency (HF) component and a low frequency (LF) component. Each component is independently modulated using a different analog modulation technique and transmitted over a separate optical fiber. The architecture maintains galvanic isolation between the input and output devices and allows for independent transmission of signal portions optimized for bandwidth and accuracy. The signals are demodulated, delay-matched, and recombined in the analog domain to produce a reconstructed full-bandwidth output.SELECTED DRAWING: Figure 3

To enable error detection even in the presence of influence of sideband signals for a pattern of a main signal of a bus.SOLUTION: A logic circuit 76 in a test and measurement device determines a data sequence from a main signal of a bus received on a main acquisition channel 60 of the test and measurement device, and uses information from an auxiliary (sideband) signal of the bus on an auxiliary channel 81 or 91 of the test and measurement device based upon a protocol associated with the bus so as to perform error detection on the data sequence.SELECTED DRAWING: Figure 3

A spectrum analyzer triggering system includes a frequency select trigger (FST) configured to generate a power signal from an input digital signal, the input power signal including high or low transitions at given transmission intervals of the input digital signal. The triggering system further includes a hysteresis comparator configured to generate a trigger pulse at the high or low transitions of the input power signal, and a leaky peak detector (LPD) configured to inhibit errant high or low transitions of the input power signal from causing the hysteresis comparator to generate a trigger pulse.

The accessory device has a test port, an instrument port connected to a measuring instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port for converting signals from the test port having a first frequency range to signals having a second frequency range different from the first frequency range. The test and measurement system includes a test and measurement instrument having an operating bandwidth and an accessory device. The accessory device has a first instrument port for connecting the accessory device to the test and measurement instrument, a test port for connecting the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port for downconverting signals from the test port having the first frequency range to signals having a second frequency range lower than the first frequency range.

The present disclosure provides a measurement application device control unit comprising a text-based input interface configured to receive text-based user requests regarding a measurement application device, a pre-trained artificial-intelligence algorithm coupled to the text-based input interface, and configured to generate response data regarding the measurement application device based on the text-based user requests, and an output interface coupled to the pre-trained artificial-intelligence algorithm, and configured to output the response data. Further, the present disclosure provides a measurement application device, and a respective method.

To provide a probe head for measuring both an AC electric signal and a DC electric signal of high-power electronic signal from an inverter or from power electronics similar to an inverter.SOLUTION: There is disclosed a device for providing a test signal from a test target device (DUT) to a measurement apparatus. The device includes a probe head 110 formed to receive an electric signal from the DUT. The probe head 110 has an electrooptical modulator. The device also includes a control box 120 with a light source. The light source is formed so that the electrooptical modulator will be provided with an input light signal and the electrooptical modulator is formed to provide an output light signal on the basis of an electric signal from the DUT. A control box 120 also includes an optical bias control circuit. A bias control signal alone is provided to the electrooptical modulator.SELECTED DRAWING: Figure 1

Provided is a measurement device, wherein a signal processing device: calculates an inductance value of an inductor on the basis of measured current waveform data of a current value flowing through the inductor as measured by a current probe and measured voltage waveform data of a voltage value between terminals of the inductor as measured by a voltage probe; calculates calculated voltage waveform data on the basis of the measured current waveform data and the inductance value; and detects a phase error between the measured voltage waveform data and the calculated voltage waveform data as a phase error generated between a first port to which the current probe is connected and a second port to which the voltage probe is connected. A trigger detector updates, in accordance with the phase error, an offset value between a first start sampling position number of the measured current waveform data and a second start sampling position number of the measured voltage waveform data.

An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector including a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and including a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and including a second output of a selected one of the multiple inputs. Methods are also described.

To provide a trigger generation circuit and a waveform measurement device, which may enhance convenience of waveform measurement.SOLUTION: A trigger generation circuit 20 comprises: a trigger signal generation unit configured to output a trigger signal TR for allowing a signal progressing circuit 10 to acquire an input signal IN; and a trigger counter 28 configured to output the number of outputs of the trigger signal TR.SELECTED DRAWING: Figure 6

To provide a test measuring device and a calibration signal generation method that generate a calibration signal of a stressed eye signal used for a compliance test of a device under test in a shorter time.SOLUTION: First and second parameters are set to initial values (30), and the parameters are used to generate an initial eye diagram 32, first and second difference between the first and second characteristics and the first and second target characteristics are obtained, respectively (34). The next first value that makes a first difference zero is estimated (36), the first parameter is set to the next first value (38), the next eye diagram is generated (40), these estimation, setting, and generation are repeated until the first characteristic of the latest next eye diagram falls within the first target characteristic, and the final first parameter value is set to the latest next first value (44), the final second parameter value is set to the initial second value (58) when the second characteristic of the latest next eye diagram is within the second target characteristic, and a calibration signal is generated according to the final first and second parameter values.SELECTED DRAWING: Figure 3

The utility model provides a multistage trigger circuit and storage depth adjustable oscilloscope, including regulation and control module, storage module, measurement module, search module and display module, the storage module includes a plurality of submodule, regulation and control module and storage module, measurement module, search module and display module are connected, regulation and control module includes a plurality of storage depth adjustment option. The utility model has the advantages of: utilize regulation and control module cooperation multistage trigger circuit, control the different submodule of storage module and work. When analysing fast change signal, can select deeper storage depth to capture more signal details, and when monitoring long time stable signal, then can select shallower storage depth to save storage space and processing time. Oscilloscope can switch according to the specific situation of input signal storage depth, and the information of input can be better stored, can adapt to more signals, and the applicability is stronger.