Apparatus and method for automatically collecting research data

Abstract

To provide a collection device that automatically collects various research data, and method therefore.SOLUTION: A collection device is provided. The collection device may comprise a collector that collects test data generated at a specific test location, a data server that stores test data generated at the specific test location, and an administrator's handler.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to an apparatus and method for collecting various types of data. [Background technology]

[0002] As the era of artificial intelligence advances, the importance of collecting research data is increasing.

[0003] In order to improve the utilization value of collected research data, it is desirable that the collected research data be reusable.

[0004] A data collection system is necessary to collect accurate data that can be reused. In particular, for systems that must collect data from multiple measuring devices and various sensors, tools that can accurately collect and classify that data are necessary.

[0005] Patent Document 1 discloses a technology for processing unformatted research record information and automatically generating formatted research record data. [Prior art documents] [Patent documents]

[0006] [Patent Document 1] Korean Patent Publication No. 2022-0114780 Summary of the Invention [Problem to be solved by the invention]

[0007] The present invention provides a collection device and method for automatically collecting various research data. [Means for solving the problem]

[0008] The collection device of the present invention may include a collector that collects test data generated at a particular test site.

[0009] The collection device of the present invention is provided with a handler that obtains handle information including first identification information of the specific test location, and the collection machine obtains the handle information from the handler, and the collection machine can use the first identification information included in the handle information to identify the specific test location from which to collect the test data.

[0010] A sensing unit is provided to sense test data generated at the specific test location, a first storage unit is provided to store the test data sensed by the sensing unit, and a first management unit is provided to manage the sensing unit or the first storage unit using handle information obtained from an administrator's handler, and the first management unit monitors whether the sensing unit is operating normally or whether the storage space of the first storage unit is running low, and the first management unit can transmit the monitoring results to the handler.

[0011] A sensing unit is provided that senses test data generated at the specific test location, a mobile unit is provided that is mounted with the sensing unit and is physically capable of moving from an initial position to the specific test location, and a first management unit is provided that controls the sensing unit and the mobile unit, and the first management unit can turn off the sensing unit when it is determined that the mobile unit has not entered the specific test location, and can turn on the sensing unit when it is determined that the mobile unit has entered the specific test location.

[0012] When a sensor for detecting the test data is placed at the specific test location, a first communication unit is provided for wired or wireless communication with the sensor, a first storage unit is provided for storing the test data received from the sensor via the first communication unit, and a first management unit is provided for controlling the first communication unit and the first storage unit, the first management unit first stores the test data received from the sensor in the first storage unit, the first management unit monitors a communication status between the first communication unit and the data server, and the first management unit can control the first communication unit to transmit the test data stored in the first storage unit to the data server if the communication status satisfies a set condition.

[0013] The system further includes a first storage unit for storing collected test data, a first communication unit for communicating with a data server, and a first management unit for controlling the first communication unit. The first management unit transmits the test data stored in the first storage unit to the data server when a communication state between the first communication unit and the data server satisfies a set condition. When an error state is defined as a state in which the communication state does not satisfy the set condition due to deterioration of the communication state while the test data is being transmitted to the data server, the first management unit stops transmitting the test data to the data server when the error state occurs. The first management unit grasps the time when the error state occurred, and when test data being transmitted to the data server at the time when the error state occurred is defined as first data and test data already transmitted to the data server within a set time from the time of the error state occurrence is defined as second data, the first management unit transmits the test data to the data server in order starting with the second data instead of the first data if the communication state again satisfies the set condition.

[0014] A first storage unit is provided to store collected test data, a first communication unit is provided to transmit the test data stored in the first storage unit to a data server, and a first management unit is provided to control the first communication unit, wherein the first management unit obtains missing information from the data server to determine whether test data is missing, and the first management unit can control the first communication unit to retransmit the test data to the data server if there is a difference between the data transmitted to the data server and the data received by the data server through analysis of the missing information.

[0015] The loss information includes time interval information, and the first management unit can use the time interval information to identify a specific time interval in which data loss occurred, and the first management unit can control the first communication unit to retransmit the test data transmitted in the specific time interval to the data server.

[0016] The collection device of the present invention can include a data server that stores test data generated at a particular test site.

[0017] A second communication unit may be provided to receive the test data from a collector that collects the test data at the specific test location, and a second storage unit may be provided to store the test data received by the second communication unit.

[0018] A second management unit is provided that obtains metadata including index information from an administrator's handler, and the second management unit subdivides the test data received via the second communication unit to match the index information, and through the subdivision, the test data is made searchable using the index information, and the second management unit can store the subdivided test data in the second storage unit according to the index information.

[0019] A second management unit is provided that monitors the communication load of the second communication unit or the available capacity of the second storage unit, and the second management unit can determine whether to receive the test data depending on the communication load or the available capacity.

[0020] A second management unit is provided that obtains metadata from the administrator's handler, and the second management unit predicts a required capacity corresponding to the storage capacity required to store the test data through analysis of the metadata. If the second storage unit meets the required capacity, the second management unit can allocate space to store the test data in the second storage unit.

[0021] The second management unit grasps first identification information of the specific test location through analysis of the metadata, and the second management unit analyzes the storage history of existing test data of the first identification information. Through analysis of the storage history, the second management unit can predict the required capacity as a capacity obtained by adding a set percentage value to the average value of the existing storage capacity.

[0022] A second management unit is provided to determine whether missing data exists when the test data is stored in the second storage unit, and the second management unit receives confirmation information used to confirm the existence of the missing data from the collector, compares related information of the test data stored in the second storage unit with the confirmation information, and when the second management unit determines that the missing data exists through the comparison between the related information and the confirmation information, it can request the collector to retransmit the missing data.

[0023] A second management unit is provided to monitor the communication status between the collector and the second communication unit, and if the communication status does not satisfy a set condition, the second management unit can request the collector to transmit the test data after the collector has finished collecting the test data.

[0024] A second management unit is provided to obtain the first identification information of the specific test location. Through the analysis of the first identification information or the test data, the second management unit grasps the second identification information of the object that is included in the specific test location and has generated the test data. Through the analysis of the second identification information, the second management unit predicts the index information of the test data, and the second management unit can automatically index the test data according to the index information.

[0025] A second management unit is provided to process the test data received via the second communication unit. The second management unit performs at least one of the first processing, second processing, third processing, fourth processing, and fifth processing. The first processing includes processing to delete unnecessary data from the test data. The second processing includes processing to generate n-dimensional information (where n is a natural number greater than or equal to 1 and n < m) using a part of the m-dimensional information (where m is a natural number greater than or equal to 2). The third processing includes processing to graph the text information. The fourth processing includes processing to calculate the representative value of the test data. The fifth processing includes processing to extract feature points for estimating the position of the test subject or recognizing the test subject from the images or videos included in the test data. In the second storage unit, the original of the test data received via the second communication unit is stored, and at the same time, the data processed by the second management unit can be additionally stored.

[0026] A second management unit is provided to be requested by the handler of the administrator to transmit the test data stored in the second storage unit. The second management unit extracts the test data matching the request of the handler from the second storage unit. The second management unit tabulates the test data extracted from the storage unit, and the second management unit can transmit the tabulated test data to the handler.

[0027] The collection method of the present invention can include: an acquisition step of acquiring test data generated at a specific test location; a processing step of processing the test data; and a storage step of storing the original of the test data and additionally storing the processed data processed in the processing step.

[0028] The processing step can perform at least one of the first processing, the second processing, the third processing, the fourth processing, and the fifth processing.

[0029] The first processing includes processing for deleting unnecessary data from the test data. The second processing includes processing for generating n-dimensional information (where n is a natural number of 1 or more and n < m) using a part of the m-dimensional information (where m is a natural number of 2 or more). The third processing includes processing for graphing text information. The fourth processing includes processing for calculating a representative value of the test data. The fifth processing can include processing for extracting feature points for estimating the position of the test subject or recognizing the test subject from an image or video included in the test data.

Advantages of the Invention

[0030] The collection device and method of the present invention can collect various research data and test data in a reusable manner.

[0031] Further, according to the present invention, test data can be accurately collected without omission from a plurality of measuring devices and sensors.

[0032] According to the present invention, it is possible to collect research, experiment, and test data of experimental devices used in various laboratories. The collection device can be transmitted with test data independently obtained by the experimental device. Alternatively, the collection device can directly sense the experimental process and experimental results of the experimental device to obtain test data.

[0033] As a result, the collection device of the present invention can collect test data from various sensors existing in the laboratory and also using its own sensors in a multi-faceted manner.

[0034] The collection device of the present invention can include various methods for ensuring that the test data collected by the collector is transmitted to the data server without omission.

[0035] The collection device of the present invention can centrally monitor the communication status between the collector and the data server. If the communication status does not meet the set condition, such as if the transmission rate is below a set value, the collector can stop transmitting test data to the data server. In this case, the collector can directly store the collected test data without transmitting it to the data server. If the communication status meets the set condition, the collector can extract the test data stored in the memory and transmit it to the data server.

[0036] Another method can be provided to prevent the loss of test data transmitted from the collector to the data server due to poor communication conditions, etc. For example, the collector can independently save the test data while collecting it. The collector can transmit the test data to the data server only after the collection of the test data is completed.

[0037] In addition, the collection device of the present invention can determine whether test data is missing during the transmission process by comparing the test data collected by the collection device with the test data received by the data server. If it is determined that test data is missing, the collection device can retransmit the missing test data to the data server.

[0038] The collection device of the present invention can process the collected test data so that it can be reused later.

[0039] For example, the data server of the present invention can segment test data based on the index information of the metadata generated by the administrator, so that a user who needs specific test data can easily extract the desired test data by using the related index information.

[0040] The data server can process test data in a way that is easy for users who need specific test data to understand. For example, the data server can create a chart of test data containing various values ​​and store the chart along with the original test data. In addition, the data server can process test data in various ways and store the processed data along with the original test data.

[0041] The data server can provide the user (terminal) with easily recognizable processed data upon request from the user, and can provide the user with the original test data upon additional request from the user. [Brief explanation of the drawings]

[0042] [Figure 1] 1 is a schematic diagram illustrating a collection device of the present invention. [Figure 2] FIG. 2 is a block diagram illustrating a collection device. [Figure 3] FIG. 2 is a schematic diagram illustrating the operation of the collection device. [Figure 4] 10 is a schematic diagram showing another operation of the collection device. FIG. [Figure 5] 1 is a flowchart illustrating a collection method of the present invention. [Figure 6] 1 is a diagram illustrating a computing device according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0043] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0023] The present invention will now be described in detail with reference to the accompanying drawings, so that those skilled in the art can easily understand and practice the present invention. However, the present invention may be embodied in various different forms and is not limited to the embodiments described herein. In order to clearly illustrate the present invention in the drawings, parts that are not relevant to the description are omitted, and similar parts are designated by similar reference numerals throughout the specification.

[0044] In this specification, duplicated descriptions of the same components will be omitted.

[0045] Furthermore, when a component is referred to herein as being "coupled" or "connected" to another component, it should be understood that the component may be directly coupled or connected to the other component, but that there may be other components in between. On the other hand, when a component is referred to herein as being "directly coupled" or "directly connected" to another component, it should be understood that there are no other components in between.

[0046] Furthermore, the terms used in this specification are merely used to describe particular embodiments and are not intended to limit the present invention.

[0047] Furthermore, in this specification, singular expressions can include plural expressions unless the context clearly indicates otherwise.

[0048] Furthermore, in this specification, the terms "comprise" or "have" and the like are intended to specify only the presence of features, numbers, steps, operations, components, parts, or combinations thereof described in the specification, and should be understood not to preclude the possibility of the presence or addition of one or more other features, numbers, steps, operations, components, parts, or combinations thereof.

[0049] Also, as used herein, the term "and / or" includes a combination of two or more listed items or any one of two or more listed items. As used herein, "A or B" can include "A," "B," or "both A and B."

[0050] Furthermore, in this specification, detailed descriptions of known functions and configurations that may obscure the gist of the present invention will be omitted.

[0051] FIG. 1 is a schematic diagram showing a collection device of the present invention.

[0052] The collection device shown in FIG. 1 may include a collector 100 , a data server 200 , and a handler 300 .

[0053] The collector 100 can collect test data generated at a specific test location s. Various test data can be generated at a site where various tests are conducted. For example, at a site where a robot's movement is tested, physical characteristics (including chemical characteristics) of the robot, such as its movement path and movement speed, can be test data.

[0054] The collector 100 can obtain and collect data from various types of sensors. To this end, the collector 100 can be communicatively coupled to one or more sensors.

[0055] A plurality of collectors 100 may be provided. In this case, the same time may be set for each of the collectors 100. This allows for time synchronization between test data collected by each collector 100. In other words, the collectors 100 may collect various types of test data output from sensors in a time-synchronized manner.

[0056] The collector 100 can transmit the test data to the data server 200 in various ways depending on the data processing speed, communication speed, etc.

[0057] The collector 100 can perform the above functions according to instructions from the handler 300.

[0058] The data server 200 can store test data generated at a particular test location s.

[0059] The collector 100 may be provided with a first storage unit 130 that stores or archives the test data. However, the storage capacity of the first storage unit 130 may be very limited. Therefore, the collector 100 with limited storage capacity may delete the test data after transmitting the test data to the data server 200.

[0060] In contrast, the second storage unit 230 installed in the data server 200 may have a storage capacity capable of storing test data semi-permanently for several years or more. Due to this characteristic, the data server 200 may become a search target for users who need test data corresponding to the results of existing tests in the future.

[0061] The data server 200 can acquire basic data related to the test data from the handler 300 and allocate storage space in the second storage unit 230 according to the data collection items.

[0062] The data server 200 can store the test data collected from the collector 100 according to the characteristics of the sensor. For example, if the test data is temperature and the sensor has the characteristic of measuring in degrees Fahrenheit, the data server 200 can store the test data in degrees Fahrenheit.

[0063] After the test is completed, the data server 200 can determine whether any data stored in the second storage unit 230 is missing. If any data is missing, the data server 200 can notify the handler 300 of the fact.

[0064] The data server 200 can process the test data so that the final results indicated by the test data are displayed in different ways, and display the processed results on the handler 300 .

[0065] The handler 300 may include various terminals operated by an administrator of the collection device 100 or the data server 200. The terminals may include a personal computer, a laptop computer, a mobile communication terminal, a tablet computer, and the like.

[0066] The handler 300 can control the collection machine 100 and the data server 200 according to the administrator's operation.

[0067] As an example, the handler 300 can set a test location where test data will be collected. The handler 300 can set the type of data to be collected at a particular test location, such as temperature, speed, humidity, location, etc. The handler 300 can generate and provide to the data server 200 metadata for indexing the test data to be stored in the data server 200. The test data indexed via the handler 300 can later be easily searched by a user.

[0068] The administrator can use the handler 300 to set the experiment and test methods to be performed at a particular test site.

[0069] The handler 300 can receive handle information from the administrator, such as which sensor is used in the experiment, which data from the sensor is used in the experiment, and how long the experiment will last. The handler 300 can transmit the handle information obtained from the administrator to the collector 100. Alternatively, the handler 300 can generate a control signal based on the handle information and transmit the generated control signal to the collector 100.

[0070] The handler 300 can manage sensor status information. Upon receiving a collection command from an administrator, the handler 300 can generate and manage handle information including the collection command in the form of metadata. The handler 300 can provide the handle information to the collector 100. In addition, the handler 300 can control and manage the data server 200 so that the data server 200 is prepared to store test data.

[0071] The handler 300 can generate metadata including test data collection cycles, collection times, collection methods, etc. according to the purpose of each test. The handler 300 can also provide information about each test to the data server 200 in advance. The handler 300 can prepare the data server 200 to pre-allocate storage space in consideration of the format, size (capacity), etc. of the test data to be collected.

[0072] FIG. 2 is a block diagram illustrating a collection device.

[0073] The handler 300 can obtain the handle information, which can include first identification information corresponding to the identification information of the particular test location s.

[0074] The collector 100 can obtain handle information from the handler 300 .

[0075] The collector 100 can use the first identification information included in the handle information to identify the specific test location where the test data is to be collected. Using the first identification information, in a situation where there are multiple test locations, the collector 100 can accurately identify the test location where the current test is being performed.

[0076] The collector 100 may include a sensing unit 110, a first storage unit 130, a first communication unit 150, a first management unit 170, and a moving unit 190.

[0077] The sensing unit 110 can sense test data generated at a specific test location s. The sensing unit 110 can be provided with sensors that sense and measure various test data. Alternatively, the sensing unit 110 can be provided with a communication module that performs wired or wireless communication with various sensors present at the specific test location s. In the latter case, the sensing unit 110 can receive test data measured by the sensors.

[0078] The first storage unit 130 may store test data sensed by the sensing unit 110. The first storage unit 130 may include a memory semiconductor for storing various digital and analog information.

[0079] The first management unit 170 may manage the sensing unit 110 or the first storage unit 130 using the handle information obtained from the administrator's handler 300. For example, the first management unit 170 may monitor whether the sensing unit 110 is operating normally. Alternatively, the first management unit 170 may monitor whether the first storage unit 130 is running out of storage space. The first management unit 170 may transmit the monitoring results to the handler 300. The handler 300 may be provided with a display or a speaker that displays the monitoring results. The administrator, who has received the monitoring results through the handler 300, may take appropriate measures to resolve the malfunction of the sensing unit 110 or the lack of storage space.

[0080] Depending on the situation, the collector 100 may be formed in the form of a physically moving robot. To this end, a moving unit 190 on which the sensing unit 110 is mounted may be provided. The moving unit 190 may include wheels or tracks that make rolling contact with the ground. The moving unit 190 may be provided with an actuator that rotates the wheels or tracks. Alternatively, the moving unit 190 may be configured to be movable along rails formed on the floor, wall, or ceiling.

[0081] The moving part 190 may be configured to be physically movable from an initial position to a particular test location s.

[0082] At this time, the first management unit 170 can control the sensing unit 110 and the moving unit 190.

[0083] The first management unit 170 can turn off the sensing unit 110 when it is determined that the moving unit 190 has not entered the specific test location s.

[0084] The first management unit 170 can turn on the sensing unit 110 when it is determined that the moving unit 190 has entered a specific test location s.

[0085] A sensor for detecting test data may be placed at a specific test location s. The sensor may be mounted on a measuring device provided at the test location. In this case, the sensor may be referred to as an external sensor 10. Alternatively, the sensor may be mounted on the sensing unit 110.

[0086] At this time, the first communication unit 150 can perform wired or wireless communication with the sensor. Also, the first communication unit 150 can perform wired or wireless communication with the data server 200 or the handler 300. To this end, the first communication unit 150 may be provided with various wired or wireless communication modules such as Wi-Fi, Bluetooth, ZigBee, and Ethernet.

[0087] The first storage unit 130 may store the test data received from the sensor via the first communication unit 150. The first management unit 170 may control the first communication unit 150 and the first storage unit 130.

[0088] The first management unit 170 may first store the test data received from the sensor in the first storage unit 130 .

[0089] The first management section 170 can grasp the acquisition time corresponding to the time when the first communication section 150 acquired the test data, separately from the time information included in the test data itself.

[0090] The first management unit 170 can store the test data together with the time of acquisition in the first storage unit 130.

[0091] The first management unit 170 can monitor the communication status between the first communication unit 150 and the data server 200 .

[0092] If the communication state satisfies a set condition, the first management unit 170 may control the first communication unit 150 to transmit the test data and the acquisition time information stored in the first storage unit 130 to the data server 200. As an example, the first management unit 170 may transmit the test data and the acquisition time information to the data server 200 only if a transmission rate indicating the transmission capacity per unit time between the first communication unit 150 and the data server 200 satisfies a set value. According to this embodiment, data transmission is performed with a sufficiently secured transmission rate, thereby reliably preventing data loss due to a low transmission rate. Furthermore, by using the acquisition time information uniquely assigned in the collector 100, multiple test data collected from multiple collectors 100 may be synchronized in time.

[0093] A situation in which the communication condition does not satisfy the set condition due to deterioration of the communication condition during transmission of test data to the data server 200 can be defined as an error situation.

[0094] The first management unit 170 can stop transmitting test data to the data server 200 when an error condition occurs.

[0095] The first management unit 170 can grasp the time when an error situation occurs.

[0096] Test data that was being transmitted to the data server 200 when the error occurred may be defined as the first data. Test data that was already transmitted to the data server 200 within a set time from the time when the error occurred may be defined as the second data.

[0097] If the communication state satisfies the set condition again, the first management unit 170 can transmit the test data to the data server 200 in order starting from the second data instead of the first data. According to this embodiment, when the communication state deteriorates and then returns to normal, the test data can be transmitted again to the data server 200 starting from the data that was already safely transmitted before the deterioration of the communication state, rather than the data transmitted at the time the communication state deteriorated. According to this embodiment, even the data loss phenomenon that may occur before and after the deterioration of the communication state can be completely prevented.

[0098] After the test data is transmitted to the data server 200, the first management unit 170 can obtain missing information from the data server 200, which allows the first management unit 170 to determine whether or not test data is missing.

[0099] The first management unit 170 can determine whether there is a difference between the data transmitted to the data server 200 and the data received by the data server 200 through the analysis of the missing information. If there is a difference between the data transmitted to the data server 200 and the data received by the data server 200, the first management unit 170 can control the first communication unit 150 to retransmit the test data to the data server 200.

[0100] For example, the first management unit 170 may receive the original test data stored in the data server 200 and compare the received original test data with the test data stored in the first storage unit 130. At this time, the original test data received from the data server 200 may correspond to missing information.

[0101] Through this comparison, the first management unit 170 can determine whether there is any missing content in the original test data stored in the data server 200. The first management unit 170 can extract test data corresponding to the identified missing content from the first storage unit 130 and retransmit it to the data server 200.

[0102] In order to reduce the communication load associated with retransmission of missing data, time interval information may be included in the missing information.

[0103] The first management unit 170 can identify a specific time period in which data loss occurred by using the time period information.

[0104] The first management unit 170 can control the first communication unit 150 to retransmit the test data transmitted in a specific time period to the data server 200 .

[0105] For example, the missing information may include the first number of bits of test data received from the collector 100 during each interval divided according to the time interval information.

[0106] The first management unit 170 may grasp the number of second bits of the test data transmitted to the data server 200 during each interval divided according to the time interval information. The first management unit 170 may compare the first number of bits with the second number of bits. If the first number of bits and the second number of bits are different, the first management unit 170 may retransmit the test data transmitted to the data server 200 during the corresponding time interval.

[0107] The data server 200 that stores test data generated at a specific test location may be provided with a second communication unit 250, a second management unit 270, and a second storage unit 230.

[0108] The second communication unit 250 can receive test data from the collector 100 that collects test data at a specific test location. The second communication unit 250 can be configured to be able to communicate with not only the collector 100 but also the handler 300. To this end, the second communication unit 250 can be provided with various wired and wireless communication modules.

[0109] The second storage unit 230 may store the test data received by the second communication unit 250. The first storage unit 130 may include a memory semiconductor that stores various digital information and analog information.

[0110] The second management unit 270 can obtain metadata including index information from the manager's handler 300.

[0111] The second management unit 270 may subdivide the test data received through the second communication unit 250 to match the test data with the index information. Through the subdivision, the test data may be made searchable using the index information.

[0112] The second management unit 270 can store the subdivided test data in the second storage unit 230 according to the index information.

[0113] The second management unit 270 can monitor the communication load of the second communication unit 250 or the available capacity of the second storage unit 230 .

[0114] The second management section 270 can determine whether to receive the test data depending on the communication load or the available capacity.

[0115] The second management unit 270 can predict the required storage capacity corresponding to the storage capacity required to store the test data through the analysis of the metadata.

[0116] If the second storage unit 230 meets the required capacity, the second management unit 270 can allocate space to the second storage unit 230 to store the test data.

[0117] If the second management unit 270 determines that the second storage unit 230 does not have the required capacity, it may transmit a message to the collector 100 requesting that the transmission of test data be stopped.

[0118] The second manager 270 can notify the handler 300 of the fact that the required capacity does not exist.

[0119] The second management unit 270 can ascertain the first identification information of a particular testing location through analysis of the metadata.

[0120] The second management unit 270 can analyze the storage history of existing test data of the first identification information.

[0121] The second management unit 270 can predict the required capacity by analyzing the storage history and adding a set percentage to the average value of the existing storage capacity.

[0122] The second management unit 270 can determine whether missing data exists when the test data is stored in the second storage unit 230 .

[0123] The second management unit 270 can receive confirmation information from the collector 100 that is used to confirm the presence of missing data.

[0124] The second management unit 270 can compare the test data related information stored in the second storage unit 230 with the confirmation information.

[0125] If the second management unit 270 determines that there is missing data through a comparison between the related information and the confirmation information, it can request the collector 100 to retransmit the missing data.

[0126] Unlike this embodiment, whether or not there is missing data may be determined by the first management unit 170 as described above.

[0127] The second management unit 270 can monitor the communication status between the collection machine 100 and the second communication unit 250.

[0128] If the communication state does not satisfy the set condition, the second management unit 270 can request the collector 100 to transmit the test data after the collector 100 finishes collecting the test data.

[0129] The second management unit 270 can obtain second identification information of the object that is included in the specific test location s and that generated the test data through analysis of the first identification information or the test data. For example, the object can include various measuring instruments, testing instruments, test objects, etc. that output the test data.

[0130] The second management unit 270 can predict index information of the test data through analysis of the second identification information. For example, assume that the test object is a robot that moves along the x-axis and y-axis directions based on the second identification information. In this case, the second management unit 270 can automatically predict or extract the measurement time, x-axis position, and y-axis position from the index information.

[0131] The second management unit 270 can automatically index the test data according to the index information. According to this embodiment, the test data can be automatically stored in the second storage unit 230 according to the predicted index information, even if the administrator does not provide index information for the test data through the handler 300. A user who needs the test data later can easily search for and reuse the desired data using the index information.

[0132] The second management section 270 can process the test data received via the second communication section 250 .

[0133] Specifically, the second management section 270 can perform at least one of the first processing, the second processing, the third processing, the fourth processing, and the fifth processing.

[0134] The first processing may include deleting unnecessary data from the test data. A specific test location may be equipped with a tester or measuring device for a specific test. If the tester or measuring device is equipped with a sensor, the sensor can detect test data in accordance with the operation of the tester or measuring device. However, the sensor may be equipped in a collector 100 that is separate from the tester or measuring device. In this case, it may be difficult for the collector 100 to determine when the tester or measuring device is not operating intermittently during the test process. Therefore, the collector 100 can continuously collect test data from the start of the test to the end of the test.

[0135] A section during the test period where test data itself is not generated due to various reasons is defined as a dummy section.

[0136] The test data collected continuously from the start to the end of the test may also include data from a dummy section. In this case, the test data from the dummy section may be dummy data that has no practical meaning.

[0137] In order to prevent a decrease in storage capacity and confusion for users, it is better to eliminate dummy data. Therefore, the second management unit 270 can process the test data received from the collection device 100 to delete the dummy data.

[0138] Meanwhile, the dummy data may be eliminated at the collection stage. If the dummy data is eliminated at the collection stage, the collector 100 can avoid wasting resources by collecting dummy data and transmitting it to the data server 200.

[0139] As an example, the collector 100 or the first management unit 170 can perform short-range wireless communication with a testing machine provided at a specific test location. Also, it is possible to check whether each testing machine is operating or not. When the collector or the first management unit determines that the testing machine is operating, it can collect test data. When the collector or the first management unit determines that the testing machine is not operating or is in an off state, it can interrupt the collection of test data.

[0140] The second processing can include processing for generating n-dimensional information (where n is a natural number of 1 or more and n < m) using part of the m-dimensional information (where m is a natural number of 2 or more). By reducing the dimensional value, test data that can be intuitively recognized by the user can be provided.

[0141] As an example, the laser tracker can collect three-dimensional information of x, y, z, and t (time) on a three-dimensional space having three coordinate axes x, y, and z that are orthogonal to each other. At this time, the three-dimensional information corresponds to test data and can be received by the data server 200.

[0142] The second management unit 270 can perform a second processing for representing the three-dimensional information in two dimensions of x and y. Since the data after the second processing has a smaller data volume compared to the original data, it can be useful for the user to determine whether the data is what they want.

[0143] The third processing can include processing for graphing text information (including numerical values represented by text).

[0144] As an example, the second management unit 270 can perform a third processing for graphing the two-dimensional data of x and y that has been second-processed above. Through the graph after the third processing, the user can intuitively grasp the movement of the plane of the test object targeted by the laser tracker. The user who has recognized the movement of the plane can quickly determine whether the test data is what they want.

[0145] If it is difficult to graph the test data itself, the second management unit 270 can perform mathematical processing such as differentiation (partial differentiation) and integration, which are advantageous for graphing. The second management unit 270 can represent mathematically processed values ​​in a graph.

[0146] The fourth processing may include processing for calculating a representative value of the test data.

[0147] For example, the second management unit 270 can perform a fourth process to calculate representative values ​​such as the average value, variance value, and standard deviation value of the test data. The representative values ​​can help a user search for desired test data. The representative values ​​can be used to compare test results between multiple test specimens.

[0148] The fifth processing may include processing to extract feature points from the images or videos included in the test data to estimate the position of the test object or to recognize the test object.

[0149] A camera can be used as a sensor for detecting test data. In this case, the test data may include images or videos. It may take a huge amount of time to view countless images and videos one by one. Therefore, it is very difficult for a user to find the data they want from the numerous images or videos.

[0150] According to the fifth processing step, feature points of an image or video are extracted, and a user can easily search for the test data he or she wants by searching for the feature points. The second storage unit 230 stores the original test data received via the second communication unit 250, and may also store data processed by the second management unit 270.

[0151] The second management unit 270 may be requested by the manager's handler 300 to transmit the test data stored in the second storage unit 230 .

[0152] The second management unit 270 can extract test data matching the request of the handler 300 from the second storage unit 230 .

[0153] The second management unit 270 can graph the test data extracted from the storage unit. The second management unit 270 can transmit the graphed test data to the handler 300. Accordingly, instead of the test data represented by various numerical values, the test data represented by a graph can be displayed on the display of the handler 300. The administrator can easily check the test data to be stored through the graph.

[0154] FIG. 3 is a schematic diagram illustrating the operation of the collection device.

[0155] The administrator can input various test information related to the test using the handler 300. The test information can be obtained by the handler 300 as handle information (S510). To input the test information, the handler 300 can be provided with various input means such as a touch screen, a keyboard, etc.

[0156] The handle information is transmitted to the collector 100, and the collector 100 can collect various test data generated at a specific test location s using the handle information (S520).

[0157] The data server 200 may receive the test data from the collector 100 and store it in the second storage unit 230 (S530).

[0158] The second management unit 270 of the data server 200 may process the received test data (first processing, second processing, third processing, fourth processing, fifth processing, etc.) (S540). The processed data may be stored in the second storage unit 230 together with the original test data.

[0159] The data server 200 can display the test data in the form of a graph or the like and transmit it to the handler 300 (S550). The administrator can check the displayed graph through the handler 300 and confirm the collection status of the target test data.

[0160] FIG. 4 is a schematic diagram illustrating another operation of the collection device.

[0161] The handler 300 receives the test information input by the user (S510) and transmits it to the handler information collector 100 and the data server 200.

[0162] The collector 100 that has received the handle information may prepare to collect test data (S515). For example, the first management unit 170 of the collector 100 may check whether a sensor that collects data requested by the handle information is operating normally. Alternatively, the first management unit 170 may check whether the storage capacity of the first storage unit 130 that temporarily stores the test data is sufficient.

[0163] After collecting the test data (S520), the collector 100 can transmit the collected test data to the data server 200 if the communication status (e.g., network transmission rate) with the data server 200 is good (S560). If the communication status is poor, the collector 100 can stop transmitting the test data to the data server 200 and collect the test data.

[0164] When the communication state becomes good again or the collection of the test data is completed (S570), the collector 100 can transmit the remaining test data to the data server 200.

[0165] The data server 200, which has received the handle information from the handler 300, can prepare to store the test data (S517).

[0166] For example, the second management unit 270 may provide storage space in advance in the second storage unit 230 for storing the format of the test data (format type of the saved file such as mp3, wav, txt, etc.) and the specification information of the sensor that collected the test data (in the case of video, frames per second, resolution, compression format, vendor, model name, aperture value, etc.).

[0167] The second management unit 270 can predict the space (required capacity) required to store the test data and allocate the required capacity to the second storage unit 230. In addition, the second management unit 270 can allocate paths of the storage space by index. For example, the second management unit 270 can create folders with names such as video, audio, and radar, and prepare paths of the folders so that they can be searched using metadata.

[0168] Thereafter, the second management unit 270 can store the test data (S530) and process the test data (S540). The second management unit 270 can manage the test results by reporting at least a portion of the stored test data to the handler 300 (S550).

[0169] FIG. 5 is a flow chart illustrating the collection method of the present invention.

[0170] The collection method of FIG. 5 can be performed by the collection device shown in FIG. 1 or the data server 200 of FIG.

[0171] The collection method may include an acquisition step (S610), a processing step (S620), and a storage step (S630).

[0172] The acquiring step (S610) can acquire test data generated at a specific test location. The acquiring step (S610) can be performed by the second communication unit 250.

[0173] The processing step (S620) can process the test data. The processing step (S620) can be performed by the second management unit 270.

[0174] The processing step (S620) can perform at least one of a first processing, a second processing, a third processing, a fourth processing, and a fifth processing.

[0175] The first process can include a process of deleting unnecessary data from the test data.

[0176] The second process can include a process of generating n-dimensional information (where n is a natural number of 1 or more and n < m) using a part of the m-dimensional information (where m is a natural number of 2 or more).

[0177] The third process can include a process of graphing text information.

[0178] The fourth process can include a process of calculating a representative value of the test data.

[0179] The fifth process can include a process of extracting feature points for estimating the position of the test subject or recognizing the test subject from an image or video included in the test data.

[0180] The saving step (S630) can save the original of the test data and additionally save the processed data processed in the processing step (S630). The saving step (S630) can be performed by the second management unit 270 or can be performed by the second storage unit 230. The place where the original of the test data and the processed data are saved can be the second storage unit 230.

[0181] FIG. 6 is a drawing showing a computing device according to an embodiment of the present invention. The computing device (TN100) in FIG. 6 can be the one described in this specification (for example, a collection device, etc.).

[0182] 6, the computing device (TN100) may include at least one processor (TN110), a transceiver (TN120), and a memory (TN130). The computing device (TN100) may further include a storage device (TN140), an input interface device (TN150), an output interface device (TN160), etc. The components included in the computing device (TN100) are connected by a bus (TN170) to communicate with each other.

[0183] The processor (TN110) can execute program commands stored in at least one of the memory (TN130) and the storage device (TN140). The processor (TN110) may refer to a central processing unit (CPU), a graphics processing unit (GPU), or a dedicated processor on which a method according to an embodiment of the present invention is performed. The processor (TN110) can be configured to implement the procedures, functions, and methods described in connection with an embodiment of the present invention. The processor (TN110) can control each component of the computing device (TN100).

[0184] The memory (TN130) and the storage device (TN140) can each store various information related to the operation of the processor (TN110). The memory (TN130) and the storage device (TN140) can each be composed of at least one of a volatile storage medium and a non-volatile storage medium. For example, the memory (TN130) can be composed of at least one of a read only memory (ROM) and a random access memory (RAM).

[0185] The transceiver TN120 can transmit or receive wired or wireless signals and can communicate with a network.

[0186] On the other hand, the embodiments of the present invention may not be realized only through the devices and / or methods described above, but may also be realized through a program that realizes functions corresponding to the configuration of the embodiments of the present invention or a recording medium on which the program is recorded, and such realization can be easily realized by a person of ordinary skill in the technical field to which the present invention belongs from the description of the above embodiments.

[0187] Although the embodiments of the present invention have been described in detail above, the scope of the present invention is not limited to these examples, and various modifications and improvements made by those skilled in the art using the basic concept of the present invention defined in the following claims also fall within the scope of the present invention. [Explanation of symbols]

[0188] 10...External sensor 100...Collector 110...Sensing unit 130...1st preservation section 150...1st Communications Department 170...1st Management Department 190...Moving part 200...Data server 230...2nd preservation section 250...Second Communications Department 270...Second Management Department 300...Handler

Claims

1. A collection device including a collection machine that collects test data generated at a specific test location, a handler is provided for obtaining handle information including a first identification of the particular test location; a sensing unit is provided to sense test data generated at the specific test location; a first storage unit configured to store the test data sensed by the sensing unit; a first management unit that manages the sensing unit or the first storage unit by using handle information obtained from a manager's handler; The first management unit monitors whether the sensing unit operates normally or whether the storage space of the first storage unit is insufficient, The first management unit transmits the results of the monitoring to the handler.

2. A collection device including a collection machine that collects test data generated at a specific test location, a sensing unit is provided to sense test data generated at the specific test location; a moving unit is provided on which the sensing unit is mounted and which is configured to be physically movable from an initial position to the specific test location; a first management unit that controls the sensing unit and the moving unit; The first management unit turns off the sensing unit when it is determined that the moving unit has not entered the specific test location; A collection device, wherein the first management unit turns on the sensing unit when it is determined that the moving unit has entered the specific test location.

3. A collection device including a collection machine that collects test data generated at a specific test location, When a sensor for sensing said test data is placed at said particular test location, a first communication unit that communicates with the sensor via wired or wireless communication; a first storage unit configured to store the test data received from the sensor via the first communication unit; a first management unit that controls the first communication unit and the first storage unit; The first management unit first stores the test data received from the sensor in the first storage unit; The first management unit grasps an acquisition time corresponding to a time when the first communication unit acquired the test data, separately from time information included in the test data itself, The first management unit stores the acquisition time point together with the test data in the first storage unit, the first management unit monitors a communication state between the first communication unit and a data server; The first management unit controls the first communication unit to transmit the test data stored in the first storage unit and the acquisition time point to the data server if the communication state satisfies a set condition.

4. A collection device including a collection machine that collects test data generated at a specific test location, a first storage unit for storing collected test data; a first communication unit that communicates with a data server and a first management unit that controls the first communication unit; the first management unit transmits the test data stored in the first storage unit to the data server if a communication state between the first communication unit and the data server satisfies a set condition; When the error state is defined as a state in which the communication state does not satisfy the set condition due to deterioration of the communication state during transmission of the test data to the data server, the first management unit stops transmitting the test data to the data server when the error condition occurs; The first management unit grasps the time when the error situation occurred, When the test data being transmitted to the data server at the time when the error occurred is defined as first data, and the test data already transmitted to the data server within a set time from the time when the error occurred is defined as second data, When the communication state satisfies the set condition again, the first management unit transmits the test data to the data server in order starting from the second data instead of the first data.

5. A collection device including a collection machine that collects test data generated at a specific test location, a first storage unit for storing collected test data; a first communication unit for transmitting the test data stored in the first storage unit to a data server; a first management unit that controls the first communication unit; The first management unit obtains missing information from the data server, which allows the first management unit to determine whether test data is missing, The first management unit controls the first communication unit to retransmit the test data to the data server if a difference exists between the data transmitted to the data server and the data received by the data server through the analysis of the missing information.

6. the missing information includes time interval information; The first management unit identifies a specific time period in which data loss occurred using the time period information, The collection device according to claim 5 , wherein the first management unit controls the first communication unit to retransmit the test data transmitted in the specific time period to the data server.

7. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit is provided to obtain metadata including index information from the administrator's handler; the second management unit subdivides the test data received via the second communication unit so as to match the index information; Through the subdivision, the test data is made searchable using the index information, The second management unit stores the test data subdivided according to the index information in the second storage unit.

8. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit that monitors a communication load of the second communication unit or an available capacity of the second storage unit; The second management unit determines whether to receive the test data depending on the communication load or the available capacity.

9. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit is provided to obtain metadata from the administrator's handler; The second management unit predicts a required storage capacity corresponding to a storage capacity required for storing the test data through analysis of the metadata, and The second management unit allocates space to the second storage unit for storing the test data when the second storage unit meets the required capacity.

10. The second management unit determines first identification information of the specific testing location through analysis of the metadata, The second management unit analyzes the storage history of existing test data of the first identification information, The collection device according to claim 9 , wherein the second management unit predicts the required capacity by adding a set percentage to an average value of the existing storage capacity through analysis of the storage history.

11. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit configured to determine whether missing data exists when the test data is stored in the second storage unit; the second management unit receives confirmation information used to confirm the presence of the missing data from the collection device; The second management unit compares the confirmation information with the test data related information stored in the second storage unit, When the second management unit determines that the missing data exists through a comparison between the related information and the confirmation information, the second management unit requests the collector to retransmit the missing data.

12. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit that monitors a communication state between the collector and the second communication unit; If the communication state does not satisfy a set condition, the second management unit requests the collector to transmit the test data after the collector finishes collecting the test data.

13. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit is provided to obtain first identification information of the specific testing location; The second management unit, through analysis of the first identification information or the test data, grasps second identification information of the object that is included in the specific test location and that generated the test data; the second management unit predicts index information of the test data through analysis of the second identification information; The second management unit automatically indexes the test data in accordance with the index information.

14. A collection device including a data server that stores test data generated at a specific test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit that processes the test data received via the second communication unit; the second management unit performs at least one of a first processing, a second processing, a third processing, a fourth processing, and a fifth processing, the first processing includes processing to delete unnecessary data from the test data, the second processing includes processing to generate n-dimensional information (where n is a natural number equal to or greater than 1, and n<m) using a part of m-dimensional information (where m is a natural number equal to or greater than 2); the third processing includes processing of converting text information into a graph, the fourth processing includes processing for calculating a representative value of the test data, The fifth processing includes processing for extracting feature points for estimating the position of the test object or recognizing the test object from an image or video included in the test data, A collection device in which the second storage unit stores the original test data received via the second communication unit, and also stores data processed by the second management unit.

15. A collection device including a data server that stores test data generated at a particular test location, a second communication unit for receiving the test data from a collector that collects the test data at the specific test location; a second storage unit configured to store the test data received by the second communication unit; a second management unit that receives a request from a manager's handler to transmit the test data stored in the second storage unit; The second management unit extracts test data matching the request of the handler from the second storage unit; The second management unit charts the test data extracted from the second storage unit; The second management unit transmits the tabulated test data to the handler.

16. A collection method performed by a collection device, acquiring test data generated at a particular test location; a processing step of processing the test data; a storage step of storing the original test data and additionally storing the processed data processed in the processing step; The processing step includes performing at least one of a first processing, a second processing, a third processing, a fourth processing, and a fifth processing, the first processing includes processing to delete unnecessary data from the test data, the second processing includes processing to generate n-dimensional information (where n is a natural number equal to or greater than 1, and n<m) using a part of m-dimensional information (where m is a natural number equal to or greater than 2); the third processing includes processing of converting text information into a graph, the fourth processing includes processing for calculating a representative value of the test data, The fifth processing is a collection method that includes processing to extract feature points from images or videos included in the test data to estimate the position of the test object or recognize the test object.

Images