X-ray ripple markers for X-ray calibration
The X-ray ripple marker and alignment controller provide accurate C-arm alignment by generating orientation-dependent imaging waves, enhancing registration accuracy and enabling advanced surgical imaging techniques.
JP7797876B2Active Publication Date: 2026-01-14KONINKLIJKE PHILIPS NV
Patent Information
- Application Number
- JP2021544715
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2019-02-15
- Filing Date
- 2020-02-14
- Publication Date
- 2026-01-14
- Estimated Expiration
- 2040-02-14
Smart Images
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Abstract
Various embodiments of the present disclosure include a C-arm alignment system employing a controller 70 to align a C-arm 60 to an X-ray ripple marker 20 including a ripple pattern 50 extending radially from a fixed point 40 of the X-ray ripple marker 20. During operation, the controller 70 identifies the ripple pattern 50 in an X-ray image generated from an X-ray projection by the C-arm 60 and showing a portion or all of the ripple pattern 50, the identification of the ripple pattern 50 in the X-ray image being characteristic of the orientation of the X-ray projection by the C-arm 60 relative to the X-ray ripple marker 20. The controller 70 further analyzes the ripple pattern 50 in the X-ray image to derive one or more transformation parameters that define the orientation of the X-ray projection by the C-arm 60 relative to the X-ray ripple marker 20, and aligns the C-arm 60 to the X-ray ripple marker 20 based on the transformation parameters.
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Citation Information
Patent Citations
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