Inspection control device, method, and program

Abstract

To provide an inspection management device, a method and a program that easily confirm an inspection plan in which a wait time of an examinee and a spare time of an inspection in an inspection type are both optimized.SOLUTION: In a medical information system in which an inspection management device, a plurality of inspection room terminals, monitors, portable terminals of medical personnel, and portable terminals of patients, and a management server are communicably connected to each other via a network, the inspection management device acquires inspection information including one or more inspection types that are exercised on each of the plurality of examinees and optimizes a wait time of the examinees and a spare time of an inspection in an inspection type until all inspections on all examinees are finished, thereby deriving a first inspection plan that includes the order of medical examination of inspection for each examinee until all inspections are finished and a second inspection plan that includes the order of medical examination of examinees for each inspection type until all inspections are completed, with the first and second inspection plans presented simultaneously or switchably .SELECTED DRAWING: Figure 5

Description

Technical Field

[0001] The present disclosure relates to an inspection management apparatus, method, and program.

Background Art

[0002] In hospitals and inspection institutions, various methods for managing the schedule, that is, the inspection plan, for various inspections performed on examinees to be inspected have been proposed. For example, in Non-Patent Document 1, a method for optimizing the inspection plan for a medical check-up has been proposed. Specifically, a method has been proposed in which time is defined on the horizontal axis and the identification numbers of examinees are defined on the vertical axis, and an inspection plan is derived by allocating a plurality of inspections to a plurality of examinees so as to reduce the waiting time of the examinees. Further, in Patent Document 1, a method has been proposed in which time is defined on the horizontal axis and the identification numbers of inspection apparatuses such as CT and MRI are defined on the vertical axis, and the inspections of a plurality of examinees are allocated to a plurality of inspection apparatuses so that the idle time of each inspection apparatus is reduced and it can operate efficiently.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Non-Patent Documents

[0004]

Non-Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] The method described in Non-Patent Document 1 can reduce the waiting time for the subject, but it does not take into consideration reducing the downtime in the equipment, i.e., the time between examinations for the next subject. Furthermore, the method described in Patent Document 1 can improve the utilization rate of the equipment and reduce downtime in examinations, but it does not take into consideration the waiting time for the subject.

[0006] Since hospital examinations involve human subjects, they may need to be interrupted or emergency examinations may be required depending on the patient's condition, potentially leading to changes from the initially planned schedule. Therefore, creating and adjusting the schedule requires fine-tuning based on experience, which is a time-consuming process.

[0007] This disclosure is made in light of the circumstances described above and aims to make it easy to confirm examination plans that have been optimized to the degree of waiting time for the subject and the availability of examinations for each type of examination. [Means for solving the problem]

[0008] The inspection control device described herein comprises at least one processor, The processor is, Obtain test information including one or more test types performed on each of multiple subjects. Based on the test information, by optimizing the waiting time for all subjects and the available time for each test type until all tests are completed for all subjects, a first test plan is derived that includes the order in which each subject receives tests until all tests are completed, and a second test plan is derived that includes the order in which each subject receives tests until all tests are completed for each test type. The first and second inspection plans are presented simultaneously or interchangeably.

[0009] "Type of test" refers not only to cases where each test has different content, but also to cases where, even if the test has the same content, if there are multiple testing devices or multiple medical professionals performing the test, tests performed with different testing devices or by different medical professionals will be treated as different types of tests.

[0010] "Availability between tests of a particular test type" refers to the time between the completion of one test for a given test subject and the start of the next test subject's test for that test type.

[0011] In addition, in the inspection management device according to this disclosure, the processor may derive a first inspection plan by setting multiple subjects on a first axis and time on a second axis intersecting the first axis, and arranging inspection indicators that identify the type of inspection and the time required for the inspection for each subject in chronological order on the second axis.

[0012] Furthermore, in the inspection management device according to this disclosure, the processor may set multiple inspection types on a first axis and time on a second axis intersecting the first axis, and derive a second inspection plan by arranging subject indicators that identify the subject and the time required for the subject's inspection on the second axis in chronological order for each inspection type.

[0013] Furthermore, in the examination management device described herein, the processor sorts multiple subjects in a predetermined order, By arranging multiple subjects along the first axis in the sorted order, and assigning test indicators to each subject along the second axis in order from the earliest time to the latest time, so that the time for the same test type does not overlap among subjects, a first assignment is made. After the first assignment, a second assignment is made to assign test indicators to each subject along the second axis toward the latest time, so that the time for the same test type does not overlap among subjects, thereby optimizing waiting times and idle times and deriving the first examination plan. A second inspection plan may be derived based on the first inspection plan that has been derived.

[0014] Also, in the inspection management device according to the present disclosure, the processor derives the total inspection time excluding the waiting time required for each of a plurality of subjects until all inspections are completed, and may sort the plurality of subjects in an order based on the total inspection time.

[0015] Also, in the inspection management device according to the present disclosure, the processor derives an evaluation value for optimization based on the waiting time and the idle time, and may perform optimization based on the evaluation value.

[0016] Also, in the inspection management device according to the present disclosure, the processor derives a plurality of first inspection plans and a plurality of second inspection plans by performing optimization by different methods based on a plurality of evaluation values, and may present each of the plurality of first inspection plans and each of the plurality of second inspection plans simultaneously or switchably.

[0017] Also, in the inspection management device according to the present disclosure, the processor may further present the evaluation value.

[0018] Also, in the inspection management device according to the present disclosure, the processor receives an instruction to modify at least one of the first inspection plan and the second inspection plan, and may modify at least one of the first inspection plan and the second inspection plan according to the instruction to modify.

[0019] In the inspection management device according to the present disclosure, the processor may derive the first inspection plan and the second inspection plan by fixing the inspection time of a specific inspection type for a specific subject in the first inspection plan and the second inspection plan and optimizing the waiting time of the subject and the idle time for each inspection type.

[0020] In addition, in the inspection management device according to the present disclosure, the processor may present the progress status of the inspection in the first inspection plan and the second inspection plan.

[0021] The inspection management method according to the present disclosure acquires inspection information including one or more types of inspections to be performed on each of a plurality of subjects, Based on the inspection information, by optimizing the waiting time of the subjects and the free time of the inspections in the inspection types until all the inspections for all the subjects are completed, a first inspection plan including the order of receiving the inspections until all the inspections for each subject are completed, and a second inspection plan including the order of receiving the subjects until all the inspections for each inspection type are completed are derived, The first inspection plan and the second inspection plan are presented simultaneously or switchably.

[0022] The inspection management program according to the present disclosure includes a procedure for acquiring inspection information including one or more types of inspections to be performed on each of a plurality of subjects, Based on the inspection information, by optimizing the waiting time of the subjects and the free time of the inspections in the inspection types until all the inspections for all the subjects are completed, a first inspection plan including the order of receiving the inspections until all the inspections for each subject are completed, and a second inspection plan including the order of receiving the subjects until all the inspections for each inspection type are completed are derived, A procedure for causing a computer to present the first inspection plan and the second inspection plan simultaneously or switchably is executed.

Effect of the Invention

[0023] According to the present disclosure, it is possible to easily confirm an inspection plan in which the degree of optimization for each of the waiting time of the subject and the free time of the inspection in the inspection type is adjusted.

Brief Description of the Drawings

[0024] [Figure 1] Schematic Configuration Diagram of the Radiation Medical Information System According to the Present Embodiment [Figure 2]Diagram showing the hardware configuration of the inspection management device. [Figure 3] Diagram showing the functional configuration of the inspection control device. [Figure 4] Diagram showing inspection information [Figure 5] Flowchart showing the optimization process [Figure 6] Diagram showing sorted inspection information [Figure 7] Diagram to explain the first assignment [Figure 8] Diagram to explain the second assignment [Figure 9] Diagram showing the second inspection plan [Figure 10] Diagram showing the display screen for the inspection plan. [Figure 11] Diagram showing the display screen for the inspection plan. [Figure 12] Flowchart showing the process performed in this embodiment [Figure 13] Diagram showing multiple first inspection plans and display screens for multiple inspection plans. [Figure 14] Diagram showing the display screen for individual patient examination plans. [Figure 15] A diagram showing the first inspection plan, displaying the progress of the inspection. [Figure 16] A diagram showing the first inspection plan, displaying the progress of the inspection. [Modes for carrying out the invention]

[0025] Embodiments of this disclosure will be described below with reference to the drawings. Figure 1 is a schematic diagram of a medical information system to which the examination management device according to this embodiment is applied. As shown in Figure 1, the medical information system 1 is configured such that the examination management device 2 according to this embodiment, a plurality of examination room terminals 3, a plurality of monitors 4, one or more mobile terminals 5 of medical personnel and one or more mobile terminals 6 of patients, and a management server 7 are connected to each other via a wired or wireless network 10 in a manner that enables them to communicate with one another.

[0026] Each device connected to network 10 is a computer on which an application program is installed to function as a component of the medical information system 1. The application program is stored in a memory device of a server computer connected to network 10, or in network storage, in a state that is accessible from the outside, and is downloaded and installed on the computer upon request. Alternatively, it may be recorded on a recording medium such as a DVD (Digital Versatile Disc) or CD-ROM (Compact Disc Read Only Memory) and distributed, and then installed on the computer from that recording medium.

[0027] The laboratory terminal 3 is installed in the laboratory where the examination is performed. The laboratory terminal 3 and the mobile terminal 5 allow medical professionals performing the examination, such as doctors, nurses, and radiographers, to confirm the examination plan, as described later. In addition, the laboratory terminal 3 and the mobile terminal 5 can accept revisions to the examination plan and transmit them to the examination management device 2.

[0028] Multiple monitors 4 are installed, for example, in the waiting room of the patient undergoing the examination. The monitors 4 and the mobile terminal 6 allow the patient to check the examination plan.

[0029] Management Server 7 is a computer system that manages information on various tests and includes a database. Examples of Management Server 7 include the RIS (Radiology Information System) for managing patient-specific tests, the HIS (Hospital Information System) for managing electronic medical records, and the PACS (Picture Archiving and Communication System). The database on Management Server 7 contains patient information and the types of tests the patient receives.

[0030] Patient information includes various information about the patient, such as patient attribute information (e.g., patient ID, patient's name, phonetic spelling, gender, date of birth, age, height, weight, blood type, and facial photograph), medical history, medical history, current physical condition (e.g., whether the patient can walk independently), and past test results. The test type represents the tests the patient will undergo, and includes, for example, radiography, blood sampling, electrocardiogram, medical interview, blood pressure measurement, ultrasound, gastroscopy, CT scan, and MRI scan. Each test type also includes information on the estimated time required to complete the test. This estimated time information is derived in advance based on the patient's condition, such as the content of the test and whether the patient can walk independently (e.g., whether a wheelchair or stretcher is used), and is managed by the management server 7.

[0031] Furthermore, management server 7 also manages the diagnostic equipment installed within the hospital using a database. Examples of diagnostic equipment include radiography equipment, CT scanners, MRI scanners, endoscopes, ultrasound scanners, and blood pressure monitors. Management server 7 registers information in the database when diagnostic equipment is added or malfunctions occur.

[0032] Figure 2 shows the hardware configuration of the inspection management device 2. As shown in Figure 2, the inspection management device 2 is a computer and includes a CPU (Central Processing Unit) 11, non-volatile storage 13, and memory 16 as temporary storage. The inspection management device 2 also includes a display 14 such as an LCD, input devices 15 such as a keyboard and mouse, and a network interface 17 connected to the network 10. The CPU 11, storage 13, display 14, input devices 15, memory 16, and network interface 17 are connected to a bus 18.

[0033] The storage 13 is implemented using an HDD (Hard Disk Drive), SSD (Solid State Drive), and flash memory, etc. The storage 13, as a storage medium, stores the inspection management program 12 executed by the inspection management device 2. The CPU 11 reads the inspection management program 12 from the storage 13, expands it into memory 16, and executes the expanded inspection management program 12.

[0034] The inspection management program 12 is stored in a storage device or network storage of a server computer (not shown) connected to the network 10, in a state that allows external access, and is downloaded and installed on the inspection management device 2 upon request. Alternatively, it may be recorded on a recording medium such as a DVD or CD-ROM and distributed, and then installed on the inspection management device 2 from that recording medium.

[0035] Figure 3 shows the functional configuration of the inspection management device 2. As shown in Figure 3, the inspection management device 2 comprises an information acquisition unit 21, an optimization unit 22, an evaluation unit 23, a display control unit 24, and a communication control unit 25. When the CPU 11 executes the inspection management program 12, the CPU 11 functions as the information acquisition unit 21, the optimization unit 22, the evaluation unit 23, the display control unit 24, and the communication control unit 25.

[0036] The information acquisition unit 21 acquires examination information from the management server 7. The examination information includes one or more types of examinations to be performed for each of multiple patients. Figure 4 is a diagram showing the examination information. As shown in Figure 4, the examination information 30 includes patient IDs 31, patient information 32, and the examinations 33 that each patient will receive for multiple patients. For example, for patient ID 000123, patient information 32 is Fujitaro, male, etc., and the examinations 33 to be received are blood pressure measurement, radiography, gastroscopy, and medical interview. In addition, each type of examination included in the examinations 33 that the patient receives includes information on the estimated time for each examination type. For example, for the examinations 33 that Fujitaro will receive, blood pressure measurement takes 3 minutes, radiography takes 5 minutes, gastroscopy takes 10 minutes, and medical interview takes 5 minutes. Note that if the patient is a child or elderly, the examination may take longer. Also, depending on the patient's physical condition, such as if the patient uses a wheelchair, the examination may take longer. For this reason, the estimated time for each examination is determined considering the patient's age and physical condition.

[0037] Furthermore, the examination information 30 may be displayed on the display 14, and patient information 32 and the examinations 33 to be received by the patient may be edited by input from the input device 15. In addition, the information acquisition unit 21 may acquire the examination information 30 by input from a medical professional via the input device 15.

[0038] Furthermore, the information acquisition unit 21 also acquires device information regarding the testing equipment used for the examination from the management server 7. The device information includes the type and number of testing devices used for the examination. Examples of testing equipment include radiography equipment, CT scanners, MRI scanners, endoscopes, ultrasound scanners, and blood pressure monitors installed within the hospital where the examination is performed.

[0039] It should be noted that there may be multiple testing devices that perform the same test. In this embodiment, the same test performed by multiple testing devices will be treated as a different test type. For example, if there are two CT scanners in a hospital, the tests performed by the two CT scanners will be the same test, but will be treated as different test types. Also, there may be cases where multiple medical professionals are responsible for the same test, such as when multiple doctors are responsible for taking a medical history. In this case as well, in this embodiment, even if the tests are the same, they will be treated as different test types.

[0040] The optimization unit 22 optimizes the patient waiting time and the available time for each test type for all patients until all tests are completed, based on the test information. This then derives a first test plan, which includes the order in which each patient receives tests until all tests are completed, and a second test plan, which includes the order in which each patient receives tests until all tests are completed for each test type.

[0041] Here, when multiple patients Pa, Pb, Pc, ... undergo multiple tests Ma, Mb, Mc, ..., to minimize the waiting time for each patient between the completion of one test and the start of the next, the tests should be performed sequentially for each patient. That is, when patient Pa finishes test Ma, the next patient Pb starts test Ma, but if the start times for the tests of the second and subsequent patients are planned to be later so that there is no waiting time before the tests begin, then waiting time can be eliminated.

[0042] On the other hand, minimizing patient waiting times reduces the utilization rate of testing equipment and healthcare professionals, resulting in longer downtime for each type of test. In other words, for a given type of test, there is a longer period of time when no tests are being performed between the end of one patient's test and the start of the next patient's test. Consequently, the time when all tests are completed for all patients also becomes later.

[0043] For example, if the tests are scheduled to begin at 9:00 AM, and patient Pa is scheduled to start their test at 9:00 AM and patient Pb is scheduled to start their test at 10:00 AM, then if patient Pb arrives at 10:00 AM, there will be no waiting time for patient Pb between 9:00 AM and 10:00 AM.

[0044] However, if patient Pa's examination, which began at 9:00, is completed in 10 minutes, then no further examinations will be conducted until 10:00, resulting in a gap in the examination schedule before the next patient's examination begins. Therefore, it is necessary to optimize patient waiting times and examination gaps for each examination type by achieving a good balance between minimizing patient waiting times and minimizing examination gaps. In this embodiment, "waiting time" is defined as the sum of the time each patient waits between examinations, and "gap time" is defined as the sum of the time when no examinations are being conducted for each examination type, from the completion of one patient's examination until the start of the next patient's examination.

[0045] The following describes the optimization of patient waiting times and available time for different examination types in this embodiment. Figure 5 is a flowchart of the optimization process.

[0046] In this embodiment, under the conditions that (1) multiple patients are not assigned to the same type of test at the same time during hospital consultation hours, and (2) a patient can receive only one type of test at a time, the optimization is performed so that the following three conditions are met: (A) patient waiting times are reduced, (B) waiting times for each type of test are reduced, and (C) all tests are completed early (the work of medical personnel is completed early).

[0047] First, in this embodiment, the optimization unit 22 derives the total examination time for each of the multiple patients undergoing examinations based on the acquired examination information 30 (step ST1). The total examination time is the sum of the time required for all examinations that each patient receives. The patient's waiting time is not included in the total examination time. Then, the optimization unit 22 sorts the multiple patients in descending order of total examination time (step ST2). Alternatively, the multiple patients may be sorted in descending order of total examination time.

[0048] Figure 6 shows sorted test information. In this embodiment, the test information includes 20 patients, and the numbers 01 to 20 assigned to the patients in Figure 6 are the numbers assigned in order of shortest total test time when the 20 patients included in the test information are sorted in order of shortest total test time. In Figure 6, the numbers 01 to 20 assigned to the patients are associated with the patient ID. If the total test time is the same, the order can be determined as appropriate, such as in order of youngest to oldest. In addition, the test information shown in Figure 6 has seven types of tests, each indicated by the letters A to G. It is assumed that there are two testing devices capable of performing test A and two testing devices capable of performing test D within the hospital. Therefore, in the following explanation, it will be assumed that there are nine types of tests.

[0049] The optimization unit 22 sets patients 01 to 20 on the vertical axis and time on the horizontal axis, and derives a first examination plan by arranging examination indicators that clearly show the type of examination and the time required for each examination on the horizontal axis in chronological order, starting with patient 01. To this end, the optimization unit 22 arranges patients 01 to 20 along the vertical axis in the sorted order, and performs a first assignment (step ST3) by assigning examination indicators to each patient along the horizontal axis in order from the earliest time, so that the time for the same type of examination does not overlap among patients.

[0050] Figure 7 is a diagram illustrating the first assignment. As shown in Figure 7, the vertical axis represents patients, and the horizontal axis represents time. First, for patient 01, the tests for patient 01 are A, B, C, and D. Therefore, test indicators with widths corresponding to the length of the test time for tests A, B, C, and D are arranged in order from earliest to latest for tests A, B, C, and D. In Figure 7, the test indicators are bar graph-like figures with widths indicating the length of the test time, and letters A to G representing the test type are shown within the area of ​​the figure. Alternatively, the color of the test indicators may be different depending on the test type, or in addition to the letters of the test type. The shape of the test indicators may also be different depending on the test type.

[0051] Since there are two testing devices for Test A, the tests performed on each device are designated A1 and A2. Similarly, since there are two testing devices for Test D, the tests performed on each device are designated D1 and D2. Therefore, for patient 01, the test indicators for Tests A1, B, C, and D1 are arranged in chronological order from the earliest to the latest.

[0052] Next, for patient 02, the tests for patient 02 are A, B, C, D, and E. Since there are two testing devices for test A, the test indicators for test A2 are placed at the same time that patient 01 undergoes test A, followed by the test indicators for tests D1 and DB. Subsequently, after waiting for patient 01 to finish test C, the test indicators for test C are placed, and finally the test indicators for test E are placed. The first assignment is completed by repeating the above process for all patients in the sorted order. Note that in the first assignment, test types are assigned in order from the earliest time, so patients 07 to 020 have long waiting times between the completion of one test and the start of the next.

[0053] After the first assignment, the optimization unit 22 performs a second assignment, allocating the test indicators for each patient along the horizontal axis toward the later time side so that the time for the same test type does not overlap among patients. The order in which the second assignment is performed is the reverse of the order in which the first assignment was performed. That is, it is performed in order from patient 20 with the longest total test time. When performing the second assignment, the optimization unit 22 determines whether there are any patients whose test indicators can be shifted toward the later time side as a result of the first assignment (Patient existence: step ST4). Here, "a patient whose test indicators can be shifted toward the later time side" is synonymous with a patient whose test has a waiting time between the completion of one test and the start of the next test as a result of the first assignment. If step ST4 is affirmed, the optimization unit 22 performs the second assignment (step ST5).

[0054] Figure 8 is a diagram illustrating the second assignment. First, in the result of the first assignment shown in Figure 7, patient 20 has a waiting time between test B and test C. During this waiting time, test B does not overlap with other patients. Therefore, the optimization unit 22 shifts patient 20's test B to the test C side. Also, patient 20 has a waiting time between test A2 and test B. During this waiting time, test A does not overlap with other patients. Therefore, the optimization unit 22 shifts patient 20's test A to the test B side. As a result, although the start time of the tests for patient 20 is delayed, the waiting time between tests becomes zero.

[0055] Next, returning to step ST4, the optimization unit 22 repeats the processing of steps ST4 and ST5 in the order of patient 19 to patient 01 until step ST4 is rejected. When step ST4 is rejected, the second assignment is completed. This derives the first examination plan (step ST6).

[0056] Next, the optimization unit 22 sets the examination type on the vertical axis and time on the horizontal axis, and derives a second examination plan by arranging patient indicators, which clearly identify the patient and the time required for the examination for each examination type, in chronological order on the horizontal axis (step ST7). This completes the optimization process. The second examination plan is derived based on the first examination plan. Note that patient indicators are an example of subject indicators.

[0057] Here, the first examination plan has patients 01-20 on the vertical axis and time on the horizontal axis, with each patient assigned an examination type and an examination index representing the time required for that examination type. Therefore, the optimization unit 22 derives the second examination plan by converting the first examination plan into a patient index that has examination type on the vertical axis and time on the horizontal axis, representing the patient and the time required for the examination for each examination type. Figure 9 shows the second examination plan. In the second examination plan, the width of the patient index corresponds to the time required for the examination of that patient for each examination index.

[0058] The evaluation unit 23 derives evaluation values ​​for the first and second examination plans. The evaluation values ​​derived by the evaluation unit 23 are evaluation values ​​for the three conditions mentioned above: (A) reducing patient waiting time, (B) reducing downtime between examinations, and (C) completing all examinations early. Here, the waiting time for patient i to undergo examination of examination type j is w. ij Therefore, the total waiting time for patient i can be calculated using the following formula (1). In this embodiment, i = 1 to 20 and j = 1 to 9.

number

[0059] The average waiting time W for all patients can be calculated using the following formula (2), where N is the number of patients undergoing the examination (in this embodiment, N=20).

number

[0060] The available time for a certain test type j is calculated by setting the start time of test k for test type j to t skj , end time ekj The operating hours (times during which the test can be performed) for each test type on the day are T j Therefore, it can be calculated using the following equation (3).

number

[0061] Time required for each test ekj -t skj This can be measured or estimated in advance. For example, the examination time is thought to depend on the changeover of equipment from the previous examination (e.g., changing the coils of an MRI machine in an examination using an MRI machine, and changing the arrangement of tubes in a radiography machine), the content of the examination, and the patient's condition, so it is preferable to estimate it taking these factors into consideration. In addition, it is possible that time may be required for movement, preparation, and examination in children and elderly patients. For this reason, the examination time may be estimated as a function of age. Alternatively, it may be estimated based on past examination results under similar conditions.

[0062] The average idle time R for all inspection types can be calculated using the following formula (4), where M is the number of inspection types (M=9 in this embodiment). Note that the number of inspection types is based on the number of inspection devices if one inspection is performed by multiple inspection devices.

number

[0063] End time of examination for examination type j on the day U j This can be calculated using the following formula (5). Max represents the slowest time.

number

[0064] The average U of the test completion times for all test types can be calculated using the following formula (6).

number

[0065] The evaluation unit 23 calculates the evaluation value S using the following formula (7). S = -WRU (7)

[0066] The display control unit 24 presents the first inspection plan and the second inspection plan simultaneously or in a switchable manner. Specifically, it displays the first inspection plan and the second inspection plan on the display 14 simultaneously or in a switchable manner. Figure 10 is a diagram showing the display screen of the inspection plan. As shown in Figure 10, the display screen 40 simultaneously displays the first inspection plan 41 and the second inspection plan 42. The display screen 40 also displays the evaluation value 43 derived by the evaluation unit 23. The evaluation value 43 may be the value of S as described above, but any of the values ​​of W, R, or U may be used. Alternatively, the value of W may be displayed as the evaluation value in correspondence with the first inspection plan, and the values ​​of R and U may be displayed as the evaluation values ​​in correspondence with the second inspection plan.

[0067] As shown in Figure 11, a toggle button 44 may be displayed on the display screen 40, allowing the first inspection plan 41 and the second inspection plan 42 to be switched by operating the toggle button 44 or the input device 15.

[0068] Furthermore, the system may allow modifications to the first and second examination plans displayed using the input device 15. For example, it may be possible to change the order of patient examinations, insert emergency patient examinations, or delete patients who canceled on the day. If the first and second examination plans are modified, the optimization unit 22 may re-derive the first and second examination plans, and the evaluation unit 23 may re-derive the evaluation values.

[0069] The first and second inspection plans may be modified before or after the start of the inspection. After the start of the inspection, the optimization unit 22 may re-derive the first and second inspection plans for inspection types other than those that have been completed, i.e., for incomplete inspection types. The evaluation unit 23 may also re-derive evaluation values ​​for incomplete inspection types. Modifications after the start of the inspection may be made by instructions from the laboratory terminal 3 and the medical personnel's mobile terminal 5.

[0070] The communication control unit 25 presents the derived first and second examination plans simultaneously or in a switchable manner. Specifically, the communication control unit 25 presents the first and second examination plans by transmitting them to multiple examination room terminals 3, a monitor 4 in the waiting room, a mobile terminal 5 for medical personnel, and a mobile terminal 6 for patients. The receiving examination room terminals 3, monitor 4, mobile terminal 5 for medical personnel, and mobile terminal 6 display the first and second examination plans simultaneously or in a switchable manner.

[0071] In this embodiment, the first and second examination plans are displayed simultaneously or in a switchable manner. However, when displayed in a switchable manner, the second examination plan may be initially displayed on the laboratory terminal 3 and the medical staff's mobile terminal 5. Alternatively, the first examination plan may be initially displayed on the monitor 4 and the patient's mobile terminal 6.

[0072] Next, the processing performed in this embodiment will be described. Figure 12 is a flowchart of the processing performed in this embodiment. First, the information acquisition unit 21 acquires inspection information from the management server 7 (step ST11). Next, the optimization unit 22 derives first and second inspection plans based on the inspection information and device information, in accordance with the optimization processing shown in Figure 5 (step ST12). Then, the display control unit 24 presents the first and second inspection plans simultaneously or in a switchable manner (step ST13).

[0073] Next, the optimization unit 22 determines whether or not there has been an instruction to modify the examination plan using the input device 15 (step ST14). If step ST14 is affirmative, the optimization unit 22 modifies the first and second examinations (step ST15) and returns to the process of step ST13. If step ST14 is negative, the communication control unit 25 presents the first and second examination plans simultaneously or switchably to the examination room terminal 3, monitor 4, medical personnel's mobile terminal 5, and patient's mobile terminal 6 (step ST16), and terminates the process.

[0074] Thus, in this embodiment, the first and second examination plans are presented simultaneously or switchably. This allows for easy confirmation of examination plans that have been optimized to suit both patient waiting times and available time for each type of examination. Furthermore, compared to cases where only one of the patient waiting times or available time for each type of examination is presented, the quality of the examination plan can be evaluated in a more balanced manner.

[0075] Furthermore, since the first and second inspection plans presented can be modified using the input device 15, even inexperienced personnel can easily create inspection plans.

[0076] In the above embodiment, optimization of both patient waiting time and available time for each test type is performed according to the flowchart shown in Figure 5, but the method is not limited to this. For example, an evaluation value S may be derived from the average patient waiting time W, the average available time for each test R, and the average test completion time U using the following equation (8), and both patient waiting time and available time for each test type may be optimized to maximize the evaluation value S. In equation (8), w, r, and u are weight coefficients and are real numbers greater than or equal to 0. S = -w·Wr·Ru·U (8)

[0077] Furthermore, the weight coefficients w, r, and u may be adjusted as appropriate depending on the optimization strategy. Alternatively, the weight coefficients w, r, and u may be adjusted by instructions from the input device 15. Here, since W, R, and U are mean values, it is not necessary to significantly change the coefficients due to increases or decreases in the number of patients or additions of examination types. However, the units (dimensions) of W and U are time, so appropriate adjustments are necessary. Also, since the optimization situation does not change even if each term of the evaluation value S in equation (8) is multiplied by a constant, one of the weight coefficients w, r, and u that is not set to 0 (the term used) may be fixed to 1.

[0078] Here, reducing W corresponds to high continuity of examinations for each patient and low patient waiting times. Reducing R corresponds to short intervals between examinations for each type of examination and low downtime. Reducing U corresponds to the entire examination being completed in an early time. If we optimize by setting r=0 in equation (8), patient waiting times will decrease, but there is no guarantee that examination downtime will also decrease. Similarly, if we set w=0, examination downtime will decrease, but there is no guarantee that patient waiting times will also decrease.

[0079] Furthermore, when calculating the evaluation value S in equation (8), a term that takes into account the medical fees for the examination may be added.

[0080] Furthermore, especially in situations like pandemics, the probability of hospital-acquired infections can be reduced by adjusting the weighting coefficients w, r, and u to derive evaluation values ​​and optimize them, thereby achieving things like shortening unnecessary patient stays in the examination room, i.e., waiting times, or ensuring that patients do not come into close proximity to each other in the examination room by leaving a certain time interval between them for the same type of test (i.e., increasing the waiting time).

[0081] Furthermore, the derivation of evaluation values ​​is not limited to the methods shown in equation (7) or equation (8). For example, the statistical values ​​of W, R, and U (mean, weighted mean, median, maximum, and minimum) may be derived as evaluation values.

[0082] Alternatively, the system may derive multiple evaluation values ​​by changing the weight coefficients w, r, and u, and then derive the first and second inspection plans by performing optimization using different methods based on each of the derived evaluation values. In this case, each of the multiple first inspection plans and each of the multiple second inspection plans may be presented simultaneously or in a switchable manner. Figure 13 shows a display screen 50 of multiple first inspection plans and multiple second inspection plans. As shown in Figure 13, the display screen 50 shows multiple (in this case, three) first inspection plans 51A to 51C and multiple (in this case, three) second inspection plans 52A to 52C. Note that the first inspection plan 51A corresponds to the second inspection plan 52A, the first inspection plan 51B corresponds to the second inspection plan 52B, and the first inspection plan 51C corresponds to the second inspection plan 52C. Furthermore, the display screen 50 also shows evaluation values ​​53A to 53C corresponding to the first and second inspection plans 51A to 51C and 52A to 52C.

[0083] The operator can finalize the inspection plan by selecting the desired inspection plan from the multiple first and second inspection plans 51A-51C and 52A-52C displayed.

[0084] Furthermore, when performing optimization, it is difficult for wheelchair users to travel between examination rooms located far apart. Therefore, for wheelchair users, the first and second examination plans may be derived by optimizing to minimize travel distance. In situations where the burden and time of travel are significant due to the arrangement of examination rooms, etc., travel time may be explicitly predicted and reflected in the evaluation value.

[0085] Furthermore, some types of tests have a predetermined order in which they must be performed, and some have a fixed time interval between preparation and the test itself. It is preferable to optimize the process to ensure that these constraints are correctly reflected in the first and second test plans.

[0086] Furthermore, there are cases where a specific type of test needs to be performed on a specific patient at a fixed time. For example, test C for patient 03 may need to be performed at 13:00. In such cases, when the optimization unit 22 makes the first assignment, it should first assign test C to patient 03, and then proceed to make the first assignments to patients 01 and onward.

[0087] Furthermore, the optimization algorithm is not limited to those described above. Any known algorithm can be used. In this case, since obtaining an exact solution may require a long computation time, a practically acceptable solution may be obtained using a known heuristic method (such as the Greedy algorithm, Simulated annealing, or Tabu search).

[0088] Furthermore, in the above embodiment, the optimization unit 22 may derive an examination plan for each individual patient. For example, an examination plan for Fujitaro may be derived and the derived examination plan may be sent to Fujitaro's mobile terminal 6. The display screen on the mobile terminal 6 in this case is shown in Figure 14. As shown in Figure 14, the display screen 56 of the mobile terminal 6 displays Fujitaro's examination schedule 57 for today based on the first examination plan. A toggle button 58 is also displayed on the display screen 56, and by operating the toggle button 58, the examination schedule 57 can be switched to the screen of the second examination plan shown in Figure 9.

[0089] The presentation of the first and second examination plans to the patient's mobile device 6 may be done by operating the mobile device 6, or it may be done via a push notification system.

[0090] Furthermore, in the above embodiment, the optimization unit 22 may derive an examination plan for each individual examination type. For example, an examination plan for examination A may be derived and transmitted to the examination room terminal 3 in the examination room where examination A is performed, or to the mobile terminal 5 of the medical professional performing examination A. In this case as well, a toggle button is displayed, and by operating the toggle button, the schedule for examination A can be switched to the screen for the first examination plan.

[0091] Furthermore, the presentation of the first and second examination plans to the medical professional's mobile device 5 may be done by operating the mobile device 5, or it may be done via a push notification system.

[0092] Furthermore, in the above embodiment, first and second inspection plans are derived for inspections to be performed in one day. However, the first and second inspection plans that are possible on the day may be derived using inspection information for inspections exceeding the expected number of inspections that can be performed in one day. Alternatively, the first and second inspection plans may be derived over multiple days.

[0093] Furthermore, while the above embodiment derives first and second examination plans for examinations within a single hospital, it is not limited to this. The first and second examination plans may also be derived considering collaboration between multiple hospitals or group hospitals that are affiliated with a regional network.

[0094] Furthermore, in the above embodiment, the progress of the examination may be displayed in the first and second examination plans. Figure 15 shows the first examination plan with the progress of the examination displayed. In Figure 15, indicators for completed examinations are grayed out, and indicators for examinations in progress are highlighted. In Figure 15, the highlighting of an indicator is indicated by hatching on the indicator. Furthermore, as shown in Figure 16, the progress of the first examination plan may be displayed using a lightning bolt line 60. In this case, the current waiting time and the waiting time reflecting the progress may be displayed for each individual patient. The progress of the examination can be derived by sending a message from the examination room terminal 3 to the management server 7 indicating that the examination has been completed for each patient, and then obtaining that information from the management server 7.

[0095] Furthermore, the progress of such tests can be managed on the management server 7, and the tests that tend to deviate from the schedule can be analyzed to improve the test plan. For example, from a hospital management perspective, it becomes possible to conduct management analysis such as identifying the types of tests that are bottlenecks and considering whether the tests can be carried out more efficiently by adding more testing equipment and increasing the number of testing personnel.

[0096] Furthermore, while the above embodiments derive first and second examination plans for patient examinations, the invention is not limited thereto. The technology of this disclosure can also be applied when conducting examinations on patients undergoing health checkups.

[0097] Furthermore, in the above embodiment, the first examination plan shown in Figure 8 has patients on the vertical axis and time on the horizontal axis, but it is not limited to this. Time may be set on the vertical axis and patients on the horizontal axis.

[0098] Furthermore, in the above embodiment, the second inspection plan shown in Figure 9 has the inspection type on the vertical axis and time on the horizontal axis, but it is not limited to this. Time may be set on the vertical axis and inspection type on the horizontal axis.

[0099] In each of the above embodiments, the hardware structure of the Processing Unit that executes various processes, such as the information acquisition unit 21, the optimization unit 22, the evaluation unit 23, the display control unit 24, and the communication control unit 25, can be the various processors shown below. As mentioned above, these various processors include a CPU, which is a general-purpose processor that executes software (programs) and functions as various processing units, as well as a Programmable Logic Device (PLD), such as a GPU (Graphics Processing Unit) or FPGA (Field Programmable Gate Array), which is a processor whose circuit configuration can be changed after manufacturing, and a dedicated electrical circuit, such as an ASIC (Application Specific Integrated Circuit), which is a processor with a circuit configuration specifically designed to execute a particular process.

[0100] A single processing unit may consist of one of these various processors, or it may consist of a combination of two or more processors of the same or different types (for example, a combination of multiple FPGAs or a combination of a CPU and an FPGA). Alternatively, multiple processing units may be composed of a single processor.

[0101] Examples of configuring multiple processing units with a single processor include, firstly, a configuration where one or more CPUs and software combine to form a single processor, as exemplified by client and server computers, and this processor functions as multiple processing units. Secondly, a configuration using a processor that realizes the functions of the entire system, including multiple processing units, on a single IC (Integrated Circuit) chip, as exemplified by System-on-a-Chip (SoC). Thus, various processing units are configured, in terms of hardware structure, using one or more of the above-mentioned processors.

[0102] Furthermore, the hardware structure of these various processors can more specifically utilize electrical circuits (Circuitry) that combine circuit elements such as semiconductor elements. [Explanation of Symbols]

[0103] 1. Medical Information System 2. Inspection and control device 3. Laboratory terminals 4 monitors 5. Mobile devices used by healthcare workers 6. Patient's mobile device 7. Management Server 10 Networks 11 CPU 12 Optimization Programs 13 Storage 14 displays 15 Input Devices 16 memory 17 Network Interface 18 bus 21 Information Acquisition Department 22 Optimization Unit 23 Evaluation Department 24 Display Control Unit 25 Communication Control Unit 30. Inspection Information 31 Patient ID 32 Patient Information 33 Tests that patients undergo 40 display screen 41. First Inspection Plan 42. Second Inspection Plan 43 Evaluation Value 44 Switch button 50,56 display screen 51A~51C First Inspection Plan 52A~52C Second Inspection Plan 53A~53C Evaluation Value 57 Scheduled for examination 58 Switch button 60 Inazuma Line

Claims

1. Equipped with at least one processor, The aforementioned processor, Obtain test information including one or more test types performed on each of multiple subjects. The aforementioned multiple subjects are sorted in a predetermined order, A first assignment is performed by assigning the multiple subjects on a first axis and time on a second axis intersecting the first axis, arranging the multiple subjects along the first axis in the sorted order, and assigning an identifiable test index indicating the test type and the time required for the test to each subject along the second axis in order from the earliest time, so as not to overlap the time for the same test type among the subjects, and after the first assignment, a second assignment is performed by assigning the test index for each subject along the second axis toward the latest time, so as not to overlap the time for the same test type among the subjects, thereby optimizing the waiting time for each subject and the available time for each test type until all tests for all subjects are completed, and deriving a first test plan including the order in which each subject receives tests until all tests are completed. Based on the derived first examination plan, a second examination plan is derived, which includes the order in which the subject receives examinations until all examinations of each examination type are completed. An inspection management device that presents the first inspection plan and the second inspection plan simultaneously or in a switchable manner.

2. The processor derives the total examination time, excluding the waiting time, required to complete all examinations for each of the multiple subjects. The examination management device according to claim 1, which sorts the plurality of subjects in an order based on the total examination time.

3. Equipped with at least one processor, The aforementioned processor, Obtain test information including one or more test types performed on each of multiple subjects. Based on the aforementioned examination information, evaluation values ​​are derived to optimize the waiting time for each subject and the available time for each examination type until all examinations for all subjects are completed, by changing the weighting of the waiting time and the available time, and by performing different optimizations based on the aforementioned evaluation values, a plurality of first examination plans, including the order in which each subject receives examinations until all examinations are completed, and a plurality of second examination plans, including the order in which each subject receives examinations until all examinations for each examination type are completed, An inspection management device that simultaneously or in a switchable manner presents each of the plurality of first inspection plans and the plurality of second inspection plans.

4. The inspection management device according to claim 3, wherein the processor further presents the evaluation value.

5. The inspection management device according to any one of claims 1 to 4, wherein the processor derives the first inspection plan and the second inspection plan by fixing the inspection time for a specific type of inspection for a specific subject in the first inspection plan and the second inspection plan, and optimizing the waiting time for the subject and the available time for each type of inspection.

6. Equipped with at least one processor, The aforementioned processor, Obtain test information including one or more test types performed on each of multiple subjects. Based on the aforementioned examination information, a first examination plan including the order in which each subject receives examinations until all examinations are completed is derived, and a second examination plan including the order in which each subject receives examinations until all examinations are completed is derived, based on the aforementioned examination information. The first inspection plan and the second inspection plan are presented simultaneously or in a switchable manner. We accept instructions for modifications to at least one of the first inspection plan and the second inspection plan. An inspection control device that modifies at least one of the first inspection plan and the second inspection plan in accordance with the instructions for modification.

7. The inspection management device according to any one of claims 1 to 6, wherein the processor sets the inspection type on a first axis and time on a second axis intersecting the first axis, and derives the second inspection plan by arranging subject indicators that identify the subject and the time required for the subject's inspection on the second axis in chronological order for each inspection type.

8. The inspection management device according to any one of claims 1 to 7, wherein the processor presents the progress of the inspection in the first inspection plan and the second inspection plan.

9. Obtain test information including one or more test types performed on each of multiple subjects. The aforementioned multiple subjects are sorted in a predetermined order, A first assignment is performed by assigning the multiple subjects on a first axis and time on a second axis intersecting the first axis, arranging the multiple subjects along the first axis in the sorted order, and assigning an identifiable test index indicating the test type and the time required for the test to each subject along the second axis in order from the earliest time, so as not to overlap the time for the same test type among the subjects, and after the first assignment, a second assignment is performed by assigning the test index for each subject along the second axis toward the latest time, so as not to overlap the time for the same test type among the subjects, thereby optimizing the waiting time for each subject and the available time for each test type until all tests for all subjects are completed, and deriving a first test plan including the order in which each subject receives tests until all tests are completed. Based on the derived first examination plan, a second examination plan is derived, which includes the order in which the subject receives examinations until all examinations of each examination type are completed. An inspection management method that presents the first inspection plan and the second inspection plan simultaneously or in a switchable manner.

10. Obtain test information including one or more test types performed on each of multiple subjects. Based on the aforementioned examination information, evaluation values ​​are derived to optimize the waiting time for each subject and the available time for each examination type until all examinations for all subjects are completed, by changing the weighting of the waiting time and the available time, and by performing different optimizations based on the aforementioned evaluation values, a plurality of first examination plans, including the order in which each subject receives examinations until all examinations are completed, and a plurality of second examination plans, including the order in which each subject receives examinations until all examinations for each examination type are completed, An inspection management method that presents each of the plurality of first inspection plans and the plurality of second inspection plans simultaneously or in a switchable manner.

11. Obtain test information including one or more test types performed on each of multiple subjects. Based on the aforementioned examination information, a first examination plan including the order in which each subject receives examinations until all examinations are completed is derived, and a second examination plan including the order in which each subject receives examinations until all examinations are completed is derived, based on the aforementioned examination information. The first inspection plan and the second inspection plan are presented simultaneously or in a switchable manner. We accept instructions for modifications to at least one of the first inspection plan and the second inspection plan. An inspection control method that modifies at least one of the first inspection plan and the second inspection plan in accordance with the instructions for modification.

12. A procedure for obtaining test information, including one or more test types performed on each of multiple subjects, A procedure for sorting the aforementioned multiple subjects in a predetermined order, A procedure for deriving a first examination plan, including the order in which each subject receives examinations until all examinations for each subject are completed, by assigning the plurality of subjects on a first axis and time on a second axis intersecting the first axis, arranging the plurality of subjects along the first axis in the sorted order, and performing a first assignment to assign examination indicators that identify the examination type and the time required for the examination to each subject along the second axis in order from the earliest time, so as not to overlap the time for the same examination type among the subjects, and after the first assignment, performing a second assignment to assign the examination indicators for each subject along the second axis toward the latest time, so as not to overlap the time for the same examination type among the subjects, thereby optimizing the waiting time for each subject and the available time for each examination type until all examinations for all subjects are completed, A procedure for deriving a second examination plan, which includes the order in which the subject receives examinations until all examinations for each type of examination are completed, based on the derived first examination plan, An inspection management program that causes a computer to perform a procedure for presenting the first inspection plan and the second inspection plan simultaneously or in a switchable manner.

13. A procedure for obtaining test information, including one or more test types performed on each of multiple subjects, A procedure for deriving multiple evaluation values ​​for optimizing the waiting time for each subject and the available time for each test type until all tests for all subjects are completed, based on the aforementioned test information, by changing the weighting of the waiting time and the available time, and by performing different optimizations based on the multiple evaluation values, thereby deriving multiple first test plans including the order in which each subject receives tests until all tests are completed, and multiple second test plans including the order in which each subject receives tests until all tests for each test type are completed. An inspection management program that causes a computer to perform a procedure for presenting each of the aforementioned plurality of first inspection plans and the plurality of second inspection plans simultaneously or in a switchable manner.

14. A procedure for obtaining test information, including one or more test types performed on each of multiple subjects, A procedure for deriving a first examination plan, which includes the order in which each subject receives examinations until all examinations are completed, and a second examination plan, which includes the order in which each subject receives examinations until all examinations are completed, by optimizing the waiting time for each subject and the available time for each examination type until all examinations are completed for each subject, based on the aforementioned examination information. A procedure for presenting the first inspection plan and the second inspection plan simultaneously or in a switchable manner, A procedure for receiving instructions for modifications to at least one of the first inspection plan and the second inspection plan, An inspection management program that causes a computer to perform a procedure for modifying at least one of the first inspection plan and the second inspection plan in accordance with the instructions for modification.

Images