Processing diagnosis device, learning device, inference device, processing diagnosis method, processing diagnosis program, and machine tool system
JPWO2026004116A5Active Publication Date: 2026-06-09MITSUBISHI ELECTRIC CORP +1
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- MITSUBISHI ELECTRIC CORP
- Filing Date
- 2024-06-28
- Publication Date
- 2026-06-09
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Abstract
The machining diagnosis device (1) includes a data acquisition unit (11) that acquires a physical quantity related to the operating state of a machining machine (90) that machines a workpiece, and the machining conditions when the physical quantity is obtained, a feature quantity calculation unit (12) that calculates, for each machining condition, a statistical feature quantity of the physical quantity obtained during machining under the same machining conditions based on the physical quantity and the machining conditions, and an inference unit (16) that performs machining diagnosis based on the statistical feature quantity for each machining condition.
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