Processing diagnosis device, learning device, inference device, processing diagnosis method, processing diagnosis program, and machine tool system

JPWO2026004116A5Active Publication Date: 2026-06-09MITSUBISHI ELECTRIC CORP +1
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
MITSUBISHI ELECTRIC CORP
Filing Date
2024-06-28
Publication Date
2026-06-09

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Abstract

The machining diagnosis device (1) includes a data acquisition unit (11) that acquires a physical quantity related to the operating state of a machining machine (90) that machines a workpiece, and the machining conditions when the physical quantity is obtained, a feature quantity calculation unit (12) that calculates, for each machining condition, a statistical feature quantity of the physical quantity obtained during machining under the same machining conditions based on the physical quantity and the machining conditions, and an inference unit (16) that performs machining diagnosis based on the statistical feature quantity for each machining condition.
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