System and method for high-precision measurement of biaxial tilt from vertical

Abstract

The subject of the application is a precision dual-axis vertical inclination sensor comprising a single-piece housing (1) and three electromechanical accelerometers (4x, 4y, 4z) mounted on a printed circuit board, mounted so that their sensitivity axes are substantially perpendicular to each other. The invention also provides a method for precisely determining the dual-axis vertical inclination, performed using a sensor as defined above, comprising appropriately preparing the disclosed sensor, mounting it on a target device, and then performing measurements.

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