Resistance measurement device and resistance measurement method

Abstract

A resistance measurement device and a resistance measurement method. The resistance measurement device comprises: a first main probe (41), a power supply (7), an ammeter (1), and a second main probe (42) which are sequentially connected in series to form a first circuit (91); the first main probe (41), a first switch (81), a voltmeter (2), a second switch (82), and the second main probe (42) which are sequentially connected in series to form a second circuit (92); and a first branch probe group (51), a third switch (83), the voltmeter (2), a fourth switch (84), and a second branch probe group (52) which are sequentially connected in series to form a third circuit (93). The resistance measurement device can measure the resistance of each layer of a multi-layer material (such as a composite current collector or battery electrode sheet), so that whether the multi-layer material is qualified can be determined on the basis of the resistance of each layer of the multi-layer material.

Description

Resistance detection device and detection method thereof Technical Field

[0001] The present application relates to the field of resistance detection technology, and specifically to a resistance detection device and a detection method thereof. Background Art

[0002] A lithium battery is an electrochemical energy storage device whose positive electrode material is lithium metal or a lithium alloy, and whose negative electrode material is typically graphite. A non-aqueous electrolyte solution is used as a medium. Compared to other types of batteries, lithium batteries offer advantages such as high energy density, high voltage, and low self-discharge, making them widely used in various electronic devices such as mobile phones, tablets, and laptops. The lithium battery production process requires the manufacture of composite current collectors and battery electrodes, both of which have multi-layer structures. For example, a composite current collector is a novel composite foil material with a sandwich structure consisting of a "metal conductive layer - PET / PP polymer support layer - metal conductive layer" using an organic polymer material such as PET / PP as a support layer, with metal (copper or aluminum, i.e., cathode material layer 62 or anode material layer 63) deposited on both the top and bottom surfaces. As shown in Figure 1, a battery electrode uses a composite current collector as a support layer 61, with a cathode material layer 62 coated on the top and an anode material layer 63 coated on the bottom. To verify the quality of the composite current collector and battery electrode, the resistance of the composite current collector and battery electrode is tested. In the prior art, only the resistance of the composite current collector and the battery pole piece as a whole can be tested during the production process, but the resistance of the cathode material layer 62 and the anode material layer 63 coated on the surface thereof cannot be tested to verify whether the material coating is qualified. Summary of the Invention

[0003] The purpose of the present application is to provide a resistance detection device and a detection method thereof, so as to solve the problem that the prior art cannot detect each layer of a multi-layer material.

[0004] To achieve the above objectives, this application provides the following technical solutions:

[0005] In a first aspect, the present application proposes a resistance detection device, which includes: a first main probe, a power supply, an ammeter, and a second main probe connected in series to form a first circuit; a first main probe, a first switch, a voltmeter, a second switch, and a second main probe connected in series to form a second circuit; and a first sub-probe group, a third switch, the voltmeter, a fourth switch, and a second sub-probe group connected in series to form a third circuit.

[0006] As a preferred embodiment of the present technical solution, the power supply is arranged inside the ammeter.

[0007] As a preferred embodiment of the present invention, the first sub-probe group and the first main probe form a probe structure; the second sub-probe group and the second main probe form a probe structure; and each of the first sub-probe group and the second sub-probe group has at least one sub-probe.

[0008] As a preferred embodiment of the present technical solution, the probe structure includes: a probe fixing device; a main probe arranged on the probe fixing device; and at least one sub-probe arranged on the probe fixing device, wherein the axis of each sub-probe is parallel to the axis of the main probe.

[0009] As a preferred embodiment of the present technical solution, the sub-probes are evenly distributed around the axis of the main probe; or the sub-probes are connected in parallel to form a ring probe, the main probe is located inside the ring probe, and the ring probe coincides with the axis of the main probe; or the main probe is a ring probe, the sub-probes are located inside the main probe, and the sub-probes are evenly distributed around the axis of the main probe.

[0010] As a preferred embodiment of the present technical solution, the contact area formed by the first main probe with the object to be tested is a first contact area, the contact area formed by the first sub-probe group with the object to be tested is a second contact area, and the ratio of the first contact area to the second contact area is greater than or equal to 1; the contact area formed by the second main probe with the object to be tested is a third contact area, and the contact area formed by the second sub-probe group with the object to be tested is a fourth contact area; the ratio of the third contact area to the fourth contact area is greater than or equal to 1.

[0011] As a preferred embodiment of the present technical solution, one end of the main probe used for contacting the object to be detected is flush with one end of the sub-probe used for contacting the object to be detected.

[0012] As a preferred embodiment of the present technical solution, the main probe and / or the sub-probes can be extended and retracted along a first direction, and the first direction is parallel to the axis of the main probe.

[0013] In second aspect, the present application proposes a resistance detection method, which includes: obtaining a first resistance based on a first circuit and a second circuit, wherein the first resistance is the total resistance of the object to be measured; obtaining a second resistance and a third resistance based on the first circuit, the second circuit and the third circuit, wherein the second resistance is the resistance of the support body and the cathode material layer; the third resistance is the resistance of the support body and the anode material layer; and obtaining the resistance of the support body, the cathode material layer and the anode material layer based on the first resistance, the second resistance and the third resistance.

[0014] As a preferred embodiment of the present technical solution, the obtaining of the first resistance based on the first circuit and the second circuit, wherein the first resistance is the total resistance of the object to be measured, includes: connecting the first main probe to the cathode material layer; connecting the second main probe to the anode material layer; closing the first switch and the second switch;

[0015] The obtaining of the second resistance based on the first circuit, the second circuit, and the third circuit includes: connecting the first main probe and the first sub-probe group to the cathode material layer; connecting the second main probe and the second sub-probe group to the anode material layer; closing the first switch and the fourth switch;

[0016] The obtaining of the third resistance based on the first circuit, the second circuit and the third circuit includes: connecting the first main probe and the first sub-probe group to the cathode material layer; connecting the second main probe and the second sub-probe group to the anode material layer; and closing the second switch and the third switch.

[0017] Compared with the prior art, the present invention has the following advantages:

[0018] The resistance of each layer in a multilayer material (e.g., a composite current collector or a battery electrode) can be detected, so that the quality of the multilayer material can be determined based on the resistance of each layer in the multilayer material. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] FIG1 is a schematic diagram of the structure of a multilayer material proposed in an embodiment of the present application;

[0020] FIG2 is a schematic structural diagram of a resistance detection device proposed in an embodiment of the present application;

[0021] FIG3 is a schematic diagram of a circuit connection for testing a first resistor according to an embodiment of the present application;

[0022] FIG4 is a schematic diagram of a circuit connection for testing a second resistor according to an embodiment of the present application;

[0023] FIG5 is a schematic diagram of a circuit connection for testing a third resistor according to an embodiment of the present application;

[0024] FIG6 is a schematic diagram of a probe structure proposed in an embodiment of the present application;

[0025] FIG7 is a schematic diagram of another probe structure proposed in an embodiment of the present application;

[0026] FIG8 is a schematic diagram of another probe structure proposed in an embodiment of the present application;

[0027] FIG9 is a flow chart of a resistance detection method proposed in an embodiment of the present application.

[0028] In the figure: 1. ammeter; 2. voltmeter; 3. probe fixing device; 4. main probe; 41. first main probe; 42. second main probe; 5. sub-probe; 51. first sub-probe group; 52. second sub-probe group; 6. object to be measured; 61. support; 62. cathode material layer; 63. anode material layer; 64. current-carrying area; 641. first contact surface; 642. second contact surface; 643. cathode contact surface equipotential area; 644. anode contact surface equipotential area; 65. no-current area; 7. power supply; 81. first switch; 82. second switch; 83. third switch; 84. fourth switch; 91. first circuit; 92. second circuit; 93. third circuit. Implementation Method

[0029] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0030] It should be noted that, in the description of this application, the terms "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as a limitation on this application.

[0031] Furthermore, it should be understood that for ease of description, the sizes of the various components shown in the drawings are not drawn according to actual proportions. For example, the thickness or width of certain layers may be exaggerated relative to other layers.

[0032] It should be noted that like numbers and letters represent similar items in the following figures, so once an item is defined or described in one figure, it will not need to be further discussed and described in detail in the description of the subsequent figures.

[0033] Before understanding the technical solution of this application, it is important to understand that the basic principle of resistance testing is to apply power to the object under test 6, measure the current flowing through the object under test 6 and the voltage across the object under test 6, and then determine the resistance based on the current and voltage. Common resistance testing devices in the prior art include multimeters and resistance testers. However, these devices can only measure the total resistance of the object under test 6. If the object under test 6 is a multilayer material (such as the current collector or battery electrode discussed in the background art), these existing devices cannot measure the resistance of each layer separately.

[0034] As shown in FIG1 , the object to be tested proposed in this application includes a support 61, a cathode material layer 62, and an anode material layer 63, wherein the cathode material layer 62 covers one side of the support 61, and the anode material layer 63 covers the other side of the support 61. The first contact surface 641 is the surface where the first main probe 41 contacts the cathode material layer 62. The second contact surface 642 is the surface where the second main probe 42 contacts the anode material layer 63.

[0035] To address the aforementioned technical issues, as shown in FIG2 , an embodiment of the present application provides a resistance detection device, comprising: a first main probe 41, a power supply 7, an ammeter 1, and a second main probe 42, which are sequentially connected in series to form a first circuit 91; a first main probe 41, a first switch 81, a voltmeter 2, a second switch 82, and a second main probe 42, which are sequentially connected in series to form a second circuit 92; and a first sub-probe group 51, a third switch 83, a voltmeter 2, a fourth switch 84, and a second sub-probe group 52, which are sequentially connected in series to form a third circuit 93. The power supply 7 is primarily used to provide current, the ammeter 1 is primarily used to measure current flowing through the device under test 6, and the voltmeter 2 is primarily used to measure voltage.

[0036] Specifically, as shown in FIG2 , if the resistance of the object under test 6 needs to be tested, the first switch 81 and the second switch 82 are closed. After the first switch 81 and the second switch 82 are closed, the circuit formed by the entire resistance detection device is shown in FIG3 , wherein the data measured by the ammeter 1 is the current flowing through the object under test 6, and the data measured by the voltmeter 2 is the voltage of the object under test 6. Based on the above voltage and current, the total resistance of the object under test 6 can be obtained, which we will call the first resistance.

[0037] As shown in Figure 2, if the resistance of the anode material layer 63 is to be tested, the first switch 81 and the fourth switch 84 are closed. After closing the first switch 81 and the fourth switch 84, the circuit formed by the entire resistance detection device is shown in Figure 4, wherein the data tested by the ammeter 1 is the current flowing through the object to be tested 6. It should be understood that, as shown in Figure 1, during the test process, since current flows through the areas where the object to be tested 6 contacts the two main probes 4 (i.e., the first contact surface 641 and the second contact surface 642), the current decays around to form a current region 64, within which there is a cathode contact surface equipotential zone 643 with the same potential as the contact surface of the support body 61 and the cathode material layer 62, and an anode contact surface equipotential zone 644 with the same potential as the contact surface of the support body 61 and the anode material layer 63. The current further decays to form a current-free region 65. That is, as shown in Figure 4 , the second sub-probe group 52 contacts the equipotential zone 644 of the anode contact surface of the object to be tested 6 , and the data measured by the voltmeter 2 is the total voltage between the support 61 and the cathode material layer 62 . Based on this voltage and current, the total resistance of the support 61 and the cathode material layer 62 is obtained. This resistance is referred to as the second resistance, and the resistance of the anode material layer 63 is the first resistance minus the second resistance. As shown in Figure 2 , to test the resistance of the cathode material layer 62 , the second switch 82 and the third switch 83 are closed. After closing the second switch 82 and the third switch 83 , the entire resistance detection device forms a circuit as shown in Figure 5 , where the data measured by the ammeter 1 is the current flowing through the object to be tested 6 . For similar reasons as described above, the data measured by the voltmeter is the total voltage between the support 61 and the anode material layer 63 . Based on this current and voltage, the total resistance of the support 61 and the anode material layer 63 can be obtained. This resistance is referred to as the third resistance, and the resistance of the cathode material layer 62 is the first resistance minus the third resistance.

[0038] It can be seen from this that the resistance detection device proposed in this application can detect the resistance of each layer in a multilayer material (for example, a composite current collector or a battery electrode), and thus can determine whether the multilayer material is qualified based on the resistance of each layer in the multilayer material.

[0039] It should be clear that when only the resistance of the cathode material layer 62 and the anode material layer 63 needs to be detected and the resistance of the support layer 61 is ignored, the second sub-probe group 52 can also be brought into contact with the current-free area of ​​the object to be tested 6 to detect the total resistance of the cathode material layer 62 and part of the support layer 61. Similarly, the total resistance of the anode material 63 and part of the support layer 61 can also be detected.

[0040] It should be clear that in the embodiments of the present application, the power supply 7 can be in any form. For example, if the ammeter 1 has a power supply inside, there is no need to configure the power supply 7 additionally. If the ammeter 1 does not have a power supply inside or the voltage of the power supply of the ammeter is inconsistent with the voltage required for detection, the power supply can be configured outside the ammeter 1.

[0041] It should be noted that in the embodiments of the present application, to ensure accuracy during testing, each of the first sub-probe group 51 and the second sub-probe group 52 includes at least one sub-probe 5. During the test, the first main probe 41, the second main probe 42, and each sub-probe 5 are sequentially placed against the surface of the object under test 6 before measuring the resistance of each object. To facilitate the use of the resistance detection device, in one embodiment of the present application, the first sub-probe group 51 and the first main probe 41 can form a probe structure, and the second sub-probe group 52 and the second main probe 42 can form a probe structure.

[0042] Specifically, in the embodiment of the present application, the purpose of forming the probe structure with the first sub-probe group 51 and the first main probe 41, and the second sub-probe group 52 and the second main probe 42 is to facilitate the formation of a close contact between the formed probe structure and the surface of the object to be tested 6. It is easy to understand that in the embodiment of the present application, the probe structure can be any structure.

[0043] As shown in Figures 6 to 8 , in the embodiment of the present application, the probe structure includes: a probe fixture 3; a main probe 4 (i.e., a first main probe 41 or a second main probe 42) disposed on the probe fixture 3; and at least one sub-probe 5 disposed on the probe fixture 3, with the axis of each sub-probe 5 parallel to the axis of the main probe 4. It will be readily understood that the main probe 4 and each sub-probe 5 are brought together by the probe fixture 3, and that pressing the probe fixture 3 allows the main probe 4 and each sub-probe 5 to form close contact with the surface of the object to be measured 6.

[0044] Specifically, in the embodiments of the present application, the probe fixture 3 primarily serves as a carrier for securing the main probe 4 and the individual sub-probes 5. Therefore, there are no restrictions on its shape or construction. For example, as shown in Figures 6 to 8 , the probe fixture 3 may be a circular block structure. Of course, in other embodiments of the present application, the probe fixture 3 may be a square block structure or a spherical structure. It will be readily understood that the main probe 4 and the individual sub-probes 5 are both made of conductive materials. To prevent electrical connection between the main probe 4 and the individual sub-probes 5, the probe fixture 3 is made of insulating material.

[0045] In an embodiment of the present application, the main probe 4 and each sub-probe 5 can be distributed on the probe fixture 3 in any form. In order for both the main probe 4 and the sub-probe 5 to be able to stably contact the surface of the object to be tested 6, as shown in Figure 6, if there are multiple sub-probes 5, each sub-probe 5 can be evenly distributed around the axis of the main probe 4. As shown in Figure 7, if there are multiple sub-probes 5, each sub-probe 5 is connected in parallel to form a ring probe, the main probe 4 is located inside the ring probe, and the axis of the ring probe coincides with the axis of the main probe 4. If there is only one or more sub-probes 5, each sub-probe 5 can also be located inside the main probe 4, and each sub-probe 5 is evenly distributed around the axis of the main probe 4. It should be understood that if there is only one sub-probe 5, as shown in Figure 8, the even distribution of each sub-probe 5 around the axis of the main probe 4 means that the axis of the sub-probe 5 coincides with the axis of the main probe 4.

[0046] It should be noted that to avoid a situation where the main probe 4 forms a small contact area with the object under test 6 (which can be understood as excessive resistance) while the sub-probe 5 forms a larger contact area with the object under test 6, current may flow through the sub-probe 5 and affect the detection results. In one embodiment of the present application, the contact area formed by the first main probe 41 with the object under test 6 is a first contact area, and the contact area formed by the first sub-probe group 51 with the object under test 6 is a second contact area. The ratio of the first contact area to the second contact area is greater than or equal to 1. Specifically, this ratio can be any value among 1, 2, 3, 4, 5, 6, 7, 8, 9, and 10, or any value between two adjacent values ​​mentioned above. For the same reason as above, in an embodiment of the present application, the contact area formed by the second main probe 42 with the object under test 6 is a third contact area, and the contact area formed by the second sub-probe group 52 with the object under test 6 is a fourth contact area. The ratio of the third contact area to the fourth contact area is greater than or equal to 1. Specifically, the ratio can be any one of 1, 2, 3, 4, 5, 6, 7, 8, 9 and 10, or any two adjacent values ​​mentioned above.

[0047] It should be noted that in the embodiments of the present application, poor contact between the main probe 4 or the sub-probe 5 and the object under test 6 can affect the test results. In one embodiment of the present application, to improve the accuracy of the test results, the end of the main probe 4 that contacts the object under test 6 is aligned with the end of the sub-probe 5 that contacts the object under test 6. In other words, while the main probe 4 is in contact with the surface of the object under test 6, the sub-probe 5 can also be in contact with the surface of the object under test 6.

[0048] It should be noted that, in actual production and use, it is quite difficult to maintain the end of the main probe 4 that contacts the object to be tested 6 flush with the end of the sub-probe 5 that contacts the object to be tested 6. To ensure that the main probe 4 or the sub-probe 5 can maintain close contact with the object to be tested 6, in one embodiment of the present application, the main probe 4 and the sub-probe 5 can be designed to be retractable along a first direction, the first direction being parallel to the axis of the main probe 4.

[0049] Of course, in other embodiments of the present application, only the main probe 4 may be designed to be extendable and retractable along the first direction. It should be noted that, at the same time, it is necessary to ensure that the surface of the main probe 4 in contact with the object to be measured 6 is closer to the surface of the object to be measured 6 (relative to the surface of the sub-probe 5 in contact with the object to be measured 6); or only the sub-probe 5 may be designed to be extendable and retractable along the first direction. It should be noted that, at the same time, it is necessary to ensure that the surface of the sub-probe 5 in contact with the object to be measured 6 is closer to the surface of the object to be measured 6 (relative to the surface of the main probe 4 in contact with the object to be measured 6).

[0050] The resistance detection device proposed in the embodiment of the present application can detect the resistance of each layer in a multilayer material (for example, a composite current collector or a battery electrode), thereby determining whether the multilayer material is qualified based on the resistance of each layer in the multilayer material.

[0051] After introducing all the embodiments of the resistance detection device proposed in this application, an embodiment of a resistance detection method proposed in this application is introduced below.

[0052] Specifically, as shown in FIG9 , the resistance detection method includes:

[0053] Step S100 : Based on the first circuit 91 and the second circuit 92 , a first resistance is obtained, where the first resistance is the total resistance of the object under test 6 .

[0054] Specifically, in the embodiment of the present application, step S100: obtaining a first resistance based on the first circuit 91 and the second circuit 92, where the first resistance is the total resistance of the object under test 6, includes:

[0055] Step S110 : connecting the first main probe 41 to the cathode material layer 62 .

[0056] As can be seen from the foregoing, connecting the first main probe 41 with the cathode material layer 62 means closely fitting the test surface of the first main probe 41 with the test surface of the cathode material layer 62 .

[0057] Step S120 : connecting the second main probe 42 to the anode material layer 63 .

[0058] As can be seen from the foregoing, connecting the second main probe 42 to the anode material layer 63 means closely fitting the testing surface of the second main probe 42 to the testing surface of the anode material layer 63 .

[0059] Step S130 : Close the first switch 81 and the second switch 82 .

[0060] As can be seen from the foregoing, after closing the first switch 81 and the second switch 82, the closed loop formed by the resistance detection device is shown in FIG3 . Based on the readings of the ammeter 1 and the voltmeter 2 , the first resistance can be calculated.

[0061] Step S200 : Based on the first circuit 91 , the second circuit 92 and the third circuit 93 , a second resistance and a third resistance are obtained, where the second resistance is the resistance of the support 61 and the cathode material layer 62 ; the third resistance is the resistance of the support 61 and the anode material layer 63 .

[0062] Specifically, in the embodiment of the present application, obtaining the second resistance based on the first circuit 91 , the second circuit 92 , and the third circuit 93 in step S200 includes:

[0063] Step S210 : connecting the first main probe 41 and the first sub-probe group 51 to the cathode material layer 62 .

[0064] As can be seen from the foregoing, connecting the first sub-probe group 51 with the cathode material layer 62 means closely fitting the testing surface of each sub-probe 5 of the first sub-probe group 51 to the testing surface of the cathode material layer 62 .

[0065] Step S220 : connecting the second main probe 42 and the second sub-probe group 52 to the anode material layer 63 .

[0066] As can be seen from the foregoing, connecting the second sub-probe group 52 with the anode material layer 63 means closely fitting the testing surface of each sub-probe 5 of the second sub-probe group 52 to the testing surface of the anode material layer 63 .

[0067] Step S230 : Close the first switch 81 and the fourth switch 84 .

[0068] As can be seen from the foregoing, after closing the first switch 81 and the fourth switch 84 , the closed loop formed by the resistance detection device is shown in FIG4 . Based on the readings of the ammeter 1 and the voltmeter 2 , the second resistance can be calculated.

[0069] Specifically, in the embodiment of the present application, in step S200, based on the first circuit 91, the second circuit 92, and the third circuit 93, obtaining the third resistance includes:

[0070] Step S240 : connecting the first main probe 41 and the first sub-probe group 51 to the cathode material layer 62 .

[0071] As can be seen from the foregoing, connecting the first sub-probe group 51 with the cathode material layer 62 means closely fitting the testing surface of each sub-probe 5 of the first sub-probe group 51 to the testing surface of the cathode material layer 62 .

[0072] Step S250 : connecting the second main probe 42 and the second sub-probe group 52 to the anode material layer 63 .

[0073] As can be seen from the foregoing, connecting the second sub-probe group 52 with the anode material layer 63 means closely fitting the testing surface of each sub-probe 5 of the second sub-probe group 52 to the testing surface of the anode material layer 63 .

[0074] Step S260: Close the second switch 82 and the third switch 83.

[0075] As can be seen from the foregoing, after closing the second switch 82 and the third switch 83, the closed loop formed by the resistance detection device is shown in FIG5 . Based on the readings of the ammeter 1 and the voltmeter 2 , the third resistance can be calculated.

[0076] Step S300 : obtaining the resistances of the support 61 , the cathode material layer 62 and the anode material layer 63 based on the first resistance, the second resistance and the third resistance.

[0077] As can be seen from the foregoing, the resistance of the cathode material layer 62 is equal to the first resistance minus the third resistance; the resistance of the anode material layer 63 is equal to the first resistance minus the second resistance; and the resistance of the support body 61 is equal to 3*the first resistance minus the second resistance and the third resistance.

[0078] It should be clear that in the embodiments of the present application, the serial numbers of the steps do not represent the order in which the steps are executed. They are only used to distinguish the steps. For example, during execution, step S100 can be executed first and then step S200, or step S200 can be executed first and then step S100. There is no restriction on this and it can be designed according to needs.

[0079] Although the embodiments of the present application have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A resistance detection device, characterized in that: include: A first main probe (41), a power supply (7), an ammeter (1), and a second main probe (42) are sequentially connected in series to form a first circuit (91); A first main probe (41), a first switch (81), a voltmeter (2), a second switch (82) and a second main probe (42) are sequentially connected in series to form a second circuit (92); The first sub-probe group (51), the third switch (83), the voltmeter (2), the fourth switch (84) and the second sub-probe group (52) are sequentially connected in series to form a third circuit (93).

2. The resistance detection device according to claim 1, characterized in that: The power supply (7) is arranged inside the ammeter (1).

3. The resistance detection device according to claim 1, characterized in that: The first sub-probe group (51) and the first main probe (41) form a probe structure; the second sub-probe group (52) and the second main probe (42) form a probe structure; the first sub-probe group (51) and the second sub-probe group (52) each have at least one sub-probe (5).

4. The resistance detection device according to claim 3, characterized in that: The probe structure comprises: Probe fixing device (3); A main probe (4) arranged on the probe fixing device (3); At least one sub-probe (5) is arranged on the probe fixing device (3), and the axis center line of each sub-probe (5) is parallel to the axis center line of the main probe (4).

5. The resistance detection device according to claim 4, characterized in that: The sub-probes (5) are evenly distributed around the axis of the main probe (4); or the sub-probes (5) are connected in parallel to form a ring probe, the main probe (4) is located inside the ring probe, and the axis of the ring probe coincides with the axis of the main probe (4); or the main probe (4) is a ring probe, the sub-probes (5) are located inside the main probe (4), and the sub-probes (5) are evenly distributed around the axis of the main probe (4).

6. The resistance detection device according to any one of claims 1 to 5, characterized in that: The contact area formed by the first main probe (41) and the object to be tested (6) is a first contact area, the contact area formed by the first sub-probe group (51) and the object to be tested (6) is a second contact area, and the ratio of the first contact area to the second contact area is greater than or equal to 1; the contact area formed by the second main probe (42) and the object to be tested (6) is a third contact area, the contact area formed by the second sub-probe group (52) and the object to be tested (6) is a fourth contact area, and the ratio of the third contact area to the fourth contact area is greater than or equal to 1.

7. The resistance detection device according to claim 4 or 5, characterized in that: One end of the main probe (4) used for contacting the object to be tested (6) is flush with one end of the sub-probe (5) used for contacting the object to be tested (6).

8. The resistance detection device according to claim 4 or 5, characterized in that: The main probe (4) and / or the sub-probe (5) are capable of being extended and retracted along a first direction, wherein the first direction is parallel to the axis of the main probe (4).

9. A resistance detection method, characterized in that: The method comprises: Based on the first circuit (91) and the second circuit (92), a first resistance is obtained, wherein the first resistance is the total resistance of the object to be measured (6); Based on the first circuit (91), the second circuit (92) and the third circuit (93), a second resistance and a third resistance are obtained, wherein the second resistance is the resistance of the support body (61) and the cathode material layer (62); and the third resistance is the resistance of the support body (61) and the anode material layer (63); Based on the first resistance, the second resistance and the third resistance, the resistances of the support (61), the cathode material layer (62) and the anode material layer (63) are obtained.

10. The resistance detection method according to claim 9, characterized in that: The step of obtaining a first resistance based on the first circuit (91) and the second circuit (92), wherein the first resistance is the total resistance of the object to be measured (6) comprises: Connecting the first main probe (41) to the cathode material layer (62); Connecting the second main probe (42) to the anode material layer (63); Closing the first switch (81) and the second switch (82); The step of obtaining the second resistance based on the first circuit (91), the second circuit (92) and the third circuit (93) comprises: Connecting a first main probe (41) and a first sub-probe group (51) to a cathode material layer (62); Connecting the second main probe (42) and the second sub-probe group (52) to the anode material layer (63); Closing the first switch (81) and the fourth switch (84); The step of obtaining the third resistance based on the first circuit (91), the second circuit (92) and the third circuit (93) comprises: Connecting a first main probe (41) and a first sub-probe group (51) to a cathode material layer (62); Connecting the second main probe (42) and the second sub-probe group (52) to the anode material layer (63); The second switch (82) and the third switch (83) are closed.

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