Assembly for a measuring device, and method for measuring electric parameters of test objects

Abstract

The invention relates to an assembly (1) for a measuring device (100). The assembly (1) comprises a first sub-assembly (10) with a contact pin (11), which extends along a longitudinal axis (12), and a second sub-assembly (20) with a contact element (21), which has a contact surface (22). A measuring region (30), which extends along a measuring plane (31), is formed between the contact pin (11) and the contact surface (22). The contact surface (22) runs diagonally relative to the measuring plane (31), and the contact pin (11) and the contact surface (22) can be moved relative to each other in order to thus allow the contact pin (11) to approach the contact surface (22) of the contact element (21) along the longitudinal axis (12) of the contact pin (11) and in order to push a test object (200) section positioned in the measuring region (30) against the contact surface (22) by means of the contact pin (11). The contact pin (11) and the contact surface (22) can be rotated relative to each other.

Description

[0001] Assembly for a measuring device and method for measuring electrical parameters of measurement objects

[0002] Field of the invention

[0003] The present invention relates to an assembly for testing a device under test and a corresponding measuring method. In particular, the invention relates to an assembly for a measuring device, a measuring device comprising such an assembly, and a method for measuring electrical parameters of devices under test.

[0004] Background of the invention

[0005] When testing battery cells, such as monocells, the electrical parameters of the respective battery cell under test are typically measured. The battery cell's electrodes are briefly connected to electrical connection points to measure the battery element's electrical parameters, such as a potential test of the battery element. Since a new contact is made between the battery element's electrode and the electrical connection point for each battery element, for example, via a so-called measuring pin, a certain amount of material wear can occur over time on the contact surfaces of the measuring device, particularly on the measuring pin.

[0006] Description

[0007] It is an object of the present invention to increase the service life of an assembly for a measuring device. This object is achieved by the subject matter of the independent claims.

[0008] Exemplary embodiments emerge from the dependent claims and the following description.

[0009] According to one aspect, an assembly for a measuring device is provided. The assembly comprises a first subassembly with a contact pin extending along a longitudinal axis, and a second subassembly with a contact element having a contact surface. A measuring region is formed between a first end of the contact pin and the contact surface of the contact element, which extends along a measuring plane, which is preferably arranged perpendicular to the longitudinal axis of the contact pin. The contact surface of the contact element extends obliquely, i.e., at an angle, relative to the measuring plane.The contact pin and / or the contact surface of the contact element are movable relative to one another, thus allowing the contact pin to approach the contact surface of the contact element along the longitudinal axis of the contact pin and, by means of the contact pin, to press a section of a measurement object positioned in the measuring area, in particular in the measuring plane, against the contact surface. The measurement object can be a flat measurement object that initially extends along the measuring plane and is then pressed against the inclined contact surface by the contact pin. The contact pin and the contact surface of the contact element are rotatable relative to one another.

[0010] With the assembly according to the invention, wear on the contact pin, which can function as a measuring pin, can be significantly reduced. This is because the relative rotational capability between the contact surface and the contact pin, together with the inclination of the contact surface relative to the measuring plane, means that during successive contacts, the contact pin is pressed against the measurement object or against the section of the measurement object positioned in the measuring area at different points on the contact pin. In other words, a smaller rotation of the contact pin can be achieved with each measuring feed of the contact pin, so that the contact pin is not pressed against the measurement object with the same contact point during two consecutive contacts. A combined approach and rotation of the contact pin relative to the contact surface of the contact element can occur, similar to a ballpoint pen mechanism.This can increase the service life of the assembly, especially the service life of the contact pin.

[0011] The assembly is designed for integration into a measuring device. For example, the assembly can be formed as part of an insulation resistance measuring device. The assembly comprises the first subassembly and the second subassembly, wherein both assemblies can be controlled separately and / or both assemblies are coupled to one another via a connecting mechanism in order to bring about a relative movement between components of the first subassembly and components of the second subassembly. In particular, the contact pin of the first subassembly is arranged to be movable relative to the contact surface of the second subassembly. The contact pin can be moved towards the contact surface, i.e., brought closer to it. In addition, a rotational movement can be brought about between the contact pin and the contact surface. The approach and the rotational movement can occur simultaneously or sequentially.

[0012] The contact pin, which is also referred to herein as a measuring pin, can face the contact surface of the contact element in its longitudinal direction, so that the contact pin can be moved towards the contact surface of the contact element, i.e. can be brought closer to it, by means of an actuator, in particular by means of a mechanism or pneumatics of the assembly. The contact surface can form a contact support over which the section of the measurement object is arranged, wherein the section of the measurement object is arranged between the contact pin and the contact surface. As the contact pin approaches the contact surface along its longitudinal axis, the section of the measurement object can be pressed at least in places against the contact surface located underneath, whereby contact is made between the contact pin and the measurement object.The section of the measurement object can extend in the measurement plane, which is arranged, for example, perpendicular to the longitudinal axis of the contact pin. At least one contact pin can be provided. However, it is also possible to provide multiple contact pins that have the same functional and structural properties as the contact pin explained here. For example, two contact pins can be provided in the assembly, which interact with two additional contact pins of another identical assembly to enable four-pole measurements.

[0013] However, since the contact surface is diagonal to the measuring plane and thus the longitudinal axis of the contact pin and the contact surface are not perpendicular to each other, the contact pin does not hit the section of the measuring object exactly in the center with its first end when it is pressed against the contact surface, but rather at a point on the first end of the contact pin that is slightly offset laterally from the longitudinal axis. During a further rotation between two consecutive contacts of the measuring pin with a respective section of a measuring object, the contact pin again does not hit the section of the measuring object exactly in the center with its first end, but again at another point on the first end of the contact pin that is slightly offset laterally from the longitudinal axis.In this way, several contact points on the first end of the contact pin can be passed through before a point is exposed to contact again. Wear and tear on the first end of the contact pin can be significantly reduced because not only a single point on the first end of the contact pin repeatedly makes contact with a measurement object, but different points on the first end of the contact pin can be used for successive contacts. The angled arrangement of the contact surface can also prevent any contamination of the contact pin because the force is applied at an angle and not along the contact pin. Any contamination is therefore not pressed onto the pin, but rather pushed away.

[0014] In one example, the contact surface can be a flat contact surface that runs at an angle to the measuring plane. For example, the contact surface can be arranged at an acute angle to the measuring plane. For example, an angle between the contact surface and the measuring plane is 5° to 30°, 5° to 20°, 5° to 15°, or 5° to 10°. However, other angles are possible. The longitudinal axis of the contact pin can essentially be arranged perpendicular to the measuring plane, i.e., apart from any manufacturing tolerances or system-related tolerances, the longitudinal axis of the contact pin can also be arranged at an angle to the measuring plane. However, the basic principle that the contact pin hits the test object in the measuring range at a different point each time can still be realized.

[0015] The terms "contact element" and / or "contact surface" should be understood to mean that they do not provide electrical contact, but merely form a contact component for a mechanical contact. Accordingly, the contact element and / or the contact surface can be made of an electrically non-conductive material. The contact pin, on the other hand, can provide both electrical and mechanical contact with the portion of the measurement object pressed against the contact element. Accordingly, the contact pin can be made of an electrically conductive material.

[0016] According to one embodiment, the contact pin and / or the contact surface is rotatable about the longitudinal axis of the contact pin.

[0017] For example, the contact pin can be rotated about its longitudinal axis, while the contact element with the contact surface maintains its rotational position relative to the longitudinal axis of the contact pin. However, it can also be provided that the contact surface is rotated about the longitudinal axis of the contact pin, while the contact pin maintains its rotational position relative to the longitudinal axis. However, it is also possible for the contact surface, on the one hand, and the contact pin, on the other, to each be rotated about the longitudinal axis of the contact pin, for example, in opposite directions of rotation.

[0018] According to one embodiment, the contact pin and / or the contact surface is rotatable about the longitudinal axis such that the contact pin can be rotated at least between a first rotation angle position with respect to the contact surface and a second

[0019] Rotation angle position is rotatable with respect to the contact surface.

[0020] It can be provided that the contact pin is pressed against a section of a measurement object currently positioned there, in particular a battery element or fuel cell element, and thus also against the contact surface of the contact element in each of the first and second rotational angle positions. For example, in the first rotational angle position, the contact pin is pressed with its first end against a section of a first measurement object, which is then pressed against the contact surface. The contact pin is then removed from the contact surface, whereupon the contact pin, in the second rotational angle position, is again pressed with its first end against a section of a second measurement object, which is then pressed against the contact surface.

[0021] To detect any contamination or wear on the contact pin or contact surface, measurements without a test object can also be included in a measurement cycle. The contact pin and the contact surface can be in direct contact, for example, to perform resistance measurements or similar.

[0022] Furthermore, it is possible to carry out measurements repeatedly on the same measuring object in order to determine measurement inaccuracies or measurement parameters, etc.

[0023] According to one embodiment, the contact pin and the contact surface are movable relative to one another in order to enable a section of a measurement object positioned in the measuring area to be pressed against the contact surface by means of the contact pin in the first rotational angle position, wherein the contact pin and the contact surface are movable relative to one another in order to enable a section of a (further) measurement object positioned in the measuring area to be pressed against the contact surface by means of the contact pin in the second rotational angle position.

[0024] The measuring object that is pressed against the contact surface at the first rotation angle position and the measuring object that is pressed against the contact surface at the second rotation angle position can be the same measuring object or two different measuring objects.

[0025] It can therefore be provided that during the relative rotational movement of the contact pin and the contact surface between the two rotational angle positions, the contact pin is moved toward or closer to the contact surface. The coupled approach movement and rotational movement during the transition from the first to the second rotational angle position can be generated by means of a ballpoint pen mechanism.

[0026] According to one embodiment, the contact pin and the contact surface are movable relative to each other in order to enable removal of the contact pin from the contact surface of the contact element during a transition from the first rotational angle position to the second rotational angle position.

[0027] Analogous to the approach movement explained above, it can be provided that during a relative rotational movement of the contact pin and the contact surface between the two rotational angle positions, the contact pin is removed or pulled away from the contact surface. The coupled removal movement and rotational movement during the transition from the first to the second rotational angle position can be generated by means of a ballpoint pen mechanism.

[0028] In one example, in a first movement section, starting from the first rotation angle position, the contact pin is moved away from the contact surface and in a second movement section following the first movement section, the contact pin is moved closer to the contact surface until the contact pin has reached the second rotation angle position.

[0029] According to one embodiment, the first subassembly is coupled to the second subassembly via a coupling, wherein the coupling enables a movement of the contact pin depending on a movement of the contact surface of the contact element.

[0030] In this way, the movement of the contact pin can be precisely coordinated with the movement of the contact surface. The coupling can be, for example, a mechanical and / or motor-driven coupling. The relative rotational movement between the contact pin and the contact surface can be generated, for example, via a transmission mechanism, a gear mechanism, or a gear mechanism. Likewise, the relative approach or separation movement between the contact pin and the contact surface can be generated via a transmission mechanism, a gear mechanism, or a gear mechanism. This will be explained in more detail in the description of the figures.

[0031] According to one embodiment, the contact surface of the contact element and the longitudinal axis of the contact pin enclose an angle of less than 90°.

[0032] The angle between the contact surface and the longitudinal axis of the contact pin can be, for example, 60° to 85°, 70° to 85°, or 80° to 85°. Other angles are possible. However, the angle between the contact surface and the longitudinal axis is preferably not perpendicular.

[0033] According to one embodiment, an angle between the contact surface of the contact element and the longitudinal axis of the contact pin is adjustable.

[0034] In this way, even more contact points or contact options can be provided for the contact pin, allowing the contact pin to be pressed against a measurement object from even more different locations. For example, several rotation angle positions can be passed through, as described above, while maintaining the same angle between the contact surface and the longitudinal axis of the contact pin. The angle between the contact surface and the longitudinal axis of the contact pin can then be slightly changed, and all rotation angle positions can be passed through again, as described above. This effectively further increases the number of contact points of the contact pin with which it is pressed against a measurement object positioned in the measuring range.

[0035] According to one aspect, a measuring device is provided with the assembly according to the invention described herein.

[0036] The measuring device can in particular be a resistance measuring device, an impedance measuring device or a potential measuring device.

[0037] In one example, the assembly according to the invention described herein is used to measure the potential of a battery element or fuel cell element. In particular, the assembly can be used for a potential test (HiPot) of a battery element.

[0038] According to one aspect, a method is provided for measuring electrical parameters of measurement objects, for example battery elements or fuel cell elements. In one step, a first measurement object, in particular a battery element or fuel cell element, is positioned in a measuring region between a contact pin extending along a longitudinal axis and a contact element having a contact surface, wherein the measuring region comprises a measuring plane in which a section of the first measurement object extends and which is arranged obliquely with respect to the contact surface. In a further step, the contact pin is brought closer to the contact surface of the contact element along the longitudinal axis of the contact pin in order to press a section of the first measurement object positioned in the measuring region against the contact surface by means of the contact pin.In a further step, the contact pin is removed from the contact surface of the contact element along the longitudinal axis of the contact pin. In a further step, the contact pin and / or the contact surface are rotated relative to one another. In a further step, the contact pin is brought closer to the contact surface of the contact element along the longitudinal axis of the contact pin in order to press the section of the first measurement object positioned in the measuring area or a section of a second measurement object positioned in the measuring area against the contact surface by means of the contact pin. If the first measurement object is measured again, this can be done with an offset.

[0039] The procedure can be carried out using the measuring device or assembly described above.

[0040] The process steps can be performed in the specified order. Some of the process steps can also be performed in a superimposed manner.

[0041] Short description of the characters

[0042] Fig. 1 shows a perspective view of an assembly for a measuring device.

[0043] Fig. 2 shows a perspective detailed view of the assembly from Fig. 1 together with a measuring object arranged therein.

[0044] Fig. 3 shows a sectional view of the assembly from Fig. 1.

[0045] Fig. 4 shows a detailed view of a measuring area of ​​the assembly from Fig. 1.

[0046] Fig. 5 shows a schematic representation of exemplary

[0047] Rotation angle positions for the assembly from Fig. 1.

[0048] Fig. 6 shows a flowchart for a method for measuring electrical parameters of devices under test. Detailed description of exemplary embodiments

[0049] The representations in the figures are schematic and not to scale. Where the same reference symbols are used in different figures in the following description, they refer to identical or similar elements. Identical or similar elements may also be designated by different reference symbols.

[0050] Fig. 1 shows a perspective view of an assembly 1 for a measuring device 100. The assembly 1 comprises a first subassembly 10 with a contact pin 11 that extends along a longitudinal axis 12, and a second subassembly 20 with a contact element 21 that has a contact surface 22. Between a first end 13 of the contact pin 11 and the contact surface 22 of the contact element 21, a measuring region 30 is formed, which extends along a measuring plane described in more detail with reference to Figures 3 and 4. The measuring plane can be aligned perpendicular to the longitudinal axis 12. A measuring object or a section of a measuring object can be positioned in the measuring region 30 such that the measuring object or the section of the measuring object extends in the measuring plane. The contact surface 22 of the contact element 21 runs obliquely relative to the measuring plane. This will be explained in more detail with reference to Figure 4.

[0051] The contact pin 11 and / or the contact surface 22 of the contact element 21 are movable relative to one another in order to enable the contact pin 11 to approach the contact surface 22 of the contact element 21 along the longitudinal axis 12 of the contact pin 11 and to press a section of the measurement object positioned in the measuring area 30 against the contact surface 22 by means of the contact pin 11. The contact pin 11 can be guided by means of a guide element 41. In addition, the contact surface 22 of the contact element 21 is rotatable relative to the contact pin 11. It can therefore be provided that the contact element 21 is rotatably mounted within the second subassembly 20. The contact element 21 can be rotatable about the longitudinal axis 12 of the contact pin 11. Alternatively or additionally, it can be provided that the contact pin 11 is rotatably mounted within the first subassembly 10.The contact pin 11 can be rotatable relative to the contact surface 22 about the longitudinal axis 12.

[0052] The contact pin 11 and / or the contact surface 22 can be rotatable about the longitudinal axis 12 such that the contact pin 11 is rotatable at least between a first rotational angle position relative to the contact surface 22 and a second rotational angle position relative to the contact surface 22. For example, the first rotational angle position is approximately 30° from an initial rotational angle position, and the second rotational angle position is approximately 60° from the initial rotational angle position. In the same way, further rotational angle positions can be provided until the contact pin 11 has rotated completely once, i.e., by 360° relative to the contact surface 22, about the longitudinal axis 12.

[0053] The contact pin 11 and the contact surface 22 can be movable relative to one another in order to enable, in the first rotational angle position, the contact pin 11 to press a section of a measurement object positioned in the measuring area 30 against the contact surface 22. Analogously, the contact pin 11 and the contact surface 22 can be movable relative to one another in order to enable, in the second rotational angle position, the contact pin 11 to press a section of a (further) measurement object positioned in the measuring area 30 against the contact surface 22. This means that contact between the contact pin 11 and the measurement object currently arranged in the measuring area 30 only occurs at the aforementioned rotational angle positions.Between the rotation angle positions mentioned, however, the contact pin 11 can be removed from the measuring object in order to be pressed against this further measuring object when another measuring object is positioned in the measuring area 30.

[0054] In other words, the contact pin 11 and the contact surface 22 can be movable relative to one another to enable the contact pin 11 to be moved away from the contact surface 22 or from the measurement object during a transition from the first rotational angle position to the second rotational angle position. Analogously, the contact pin 11 and the contact surface 22 can be movable relative to one another to enable the contact pin 11 to approach the contact surface 22 or the measurement object during a transition from the first rotational angle position to the second rotational angle position, for example, after the contact pin 11 has been moved away from the contact surface 22 or from the measurement object. The corresponding movements of the contact pin 11 and / or the contact element 21, including the contact surface 22, can be accomplished by a ballpoint pen mechanism.This means that the rotational movement of the contact element 21 and / or the contact pin 11 about the longitudinal axis 12 can be combined with the displacement movement of the contact element 21 and / or the contact pin 11 along the longitudinal axis 12, so that an alternating approach and removal of the contact pin 11 from the contact element 21 takes place during the rotational movement.

[0055] In this example, the first subassembly 10 is coupled to the second subassembly 20 via a mechanical coupling 40, wherein the mechanical coupling 40 enables a movement of the contact pin 11 depending on a movement of the contact surface 22 of the contact element 21. In the example shown in Fig. 1, the mechanical coupling 40 has a first toothed linear element 42, which is coupled to the contact pin 11 and / or the guide element 41 of the contact pin 11. The contact pin 11 can be rotatable about the longitudinal axis 12 in the first subassembly 10 and can also be movable along the longitudinal axis 12. The first toothed linear element 42 engages with a first gear 43, which in turn engages with a second gear 44. The second gear 44 engages with a second toothed linear element 45, which in turn is coupled to the contact element 21. The contact element 21 can, as shown in Fig.1, be designed in the form of a link which is rotatable about the longitudinal axis 12 and / or movable along the longitudinal axis 12. The contact element 21 is connected to the second toothed linear element 45, for example, via the shaft 46. The contact element 21 can have projections on its circumference which interact with an internal engagement structure of a sleeve surrounding the contact element 21 in such a way that a ballpoint pen mechanism 47 is provided which combines the rotational movement about the longitudinal axis 12 with the displacement movement of the contact element 21 along the longitudinal axis 12. In a further example, not shown, the subassemblies can.

[0056] 10 and 20 can be operated independently of each other via their own actuator.

[0057] The contact element 21 and the contact pin 11 can be moved towards each other along the directions of movement 14 and 24 indicated by arrows in Fig. 1 and can also be rotated relative to each other, for example as shown by the rotation arrow 29 in Fig. 1. In particular, in the example shown, the contact element 21 is rotated by rotating the shaft 46, whereas the contact pin

[0058] 11 is not rotated.

[0059] In an example not shown in the figures, it can be provided that the contact pin 11 is rotated in addition to the contact element 21. In such a case, the direction of rotation of the contact pin 11 and the direction of rotation of the contact element 21 can be the same or opposite, whereby with the same directions of rotation, the rotation speeds of the contact element 21 and the contact pin 11 can be different. In a further example not shown in the figures, it can be provided that only the contact pin 11, but not the contact element 21, is rotated within the assembly 1.

[0060] Fig. 2 shows a perspective detailed view of the assembly from Fig. 1 together with a measurement object 200 arranged therein, for example a battery element. A section 210 of the measurement object 200 extends in the measuring area 30 between the first end 13 of the contact pin 11 and the contact surface 22 of the contact element 21. The section 210 can be an electrode of a battery element. In this case, another electrode of the battery element can be arranged in the same way within an assembly that is identical to assembly 1. For example, the anode of the battery element can be arranged on assembly 1 and the cathode of the battery element can be arranged on another assembly that is identical to assembly 1. The two assemblies 1 can together form the measuring device.

[0061] Fig. 3 now shows a sectional view of assembly 1 from Fig. 1. Regarding the individual components already explained, reference is made to the above explanations for Fig. 1. However, Fig. 3 now shows the measuring plane 31 of the measuring area 30 already described above, in particular the vertical orientation of the measuring plane 31 with respect to the longitudinal axis 12 of the contact pin 11.

[0062] Fig. 4 shows a detailed view of the measuring area 30 of the assembly 1 from Fig. 1.

[0063] In particular, Fig. 4 shows an enlarged section of the measuring area 30 shown in Fig. 3. The contact surface 22 of the contact element 21 and the longitudinal axis 12 of the contact pin 11 enclose an angle a of less than 90°. In particular, the longitudinal axis 12 of the contact pin 11 and the flat contact surface 22 are not arranged perpendicular to one another. A measurement object located in the measuring area 30 can extend in the measuring plane 31, wherein the measuring plane 31 is arranged perpendicular to the longitudinal axis 12 of the contact pin 12. If the contact pin 11 is now placed on the

[0064] As the contact surface 22 is moved toward the contact pin 11, it is pressed against the measurement object or a section thereof, which in turn is pressed against the contact surface 22. However, since the contact surface 22 is now oriented obliquely to the measurement plane 31 and / or not perpendicular to the longitudinal axis 12, the contact pin 11 is not pressed exactly centrally against the measurement object or a section thereof when approaching the contact surface 22, but rather offset laterally. The inclination 23 of the contact surface 22 relative to the measurement plane 31 is clearly visible in Fig. 4.

[0065] Rotating the contact pin 11 about the longitudinal axis 12 and / or rotating the contact element 21 including the contact surface 22 about the longitudinal axis 12 can result in the contact pin 11 coming into contact with a measurement object located in the measuring range 30 via a different point on the contact pin 11 each time it approaches the contact surface 22. The contact pin 11 can be rotated about the longitudinal axis 12 relative to the contact surface 22 and can only be pressed against a measurement object located in the measuring range 30 at specific rotation angle positions. Several such rotation angle positions can be provided before the contact pin 11 has been rotated completely once, i.e., by 360°, relative to the contact surface 22. This will now be explained in more detail with reference to Fig. 5, where exemplary rotation angle positions are shown.

[0066] Fig. 5 illustrates the principle described above that the number of contacts between contact pin 11 and measurement object can be reduced without the same point on contact pin 11 being used for each contact. The rotation angle positions shown in Fig. 5 relate in particular to a relative rotation between contact pin 11 and contact surface 22, specifically about longitudinal axis 12 (cf. Fig. 4 again). Starting from a zero rotation angle position, contact pin 11 is rotated relative to contact surface 22 by rotation angle αi about longitudinal axis 12. Contact pin 11 can be moved closer to contact surface 22 until contact pin 11 reaches first rotation angle position 32 and presses a first measurement object located between contact pin 11 and contact surface 22, or a section thereof, against contact surface 22.During this contact, a measurement process can take place for the first measurement object.

[0067] Subsequently, starting from the first rotation angle position 32, the contact pin 11 is rotated further about the longitudinal axis 12 relative to the contact surface 22 by the rotation angle θ2, wherein the contact pin 11 is initially removed from the contact surface 22 or from the section of the measurement object. However, during the rotation by the rotation angle θ2, for example after removal, the contact pin 11 can also approach the contact surface 22 again. In this case, the contact pin 11 can be approached to the contact surface 22 until the contact pin 11, upon reaching the second rotation angle position 33, presses a second measurement object located between the contact pin 11 and the contact surface 22, or a section thereof, against the contact surface 22. During this contact, a measurement process for the second measurement object can take place.

[0068] The rotation angle θi and / or the rotation angle θ2 can be 30°, 60°, 90°, 120°, or 180°, or anywhere between these example angles. Preferably, the respective rotation angle θ is a prime number such as 13° or 17°, allowing a large number of measurements to be taken before a previously used measuring point is used again. It can be provided that angles θ that are not a divisor of 360° are generated via an additional actuator. However, angles θ that are a divisor of 360° can be enabled via a corresponding mechanism.

[0069] The rotation angles Δi and Δ2 are preferably the same size, but can also be different. Fig. 5 also shows a superimposed representation of the contact pin 11 and the contact surface 22, viewed along the longitudinal axis 12. Due to the relationships described above, the respective contact points between the measurement object and the contact pin 11 are not located centrally on the contact pin 11, but rather on a concentric circle 35 at the end of the contact pin 11. This lateral offset of the contact points at the tip of the contact pin 11 results from the inclined position 23 of the contact surface 22 with respect to the measuring plane 31 or from the non-perpendicular orientation of the contact surface 22 with respect to the longitudinal axis 12 of the contact pin 11 (cf. Fig. 4).

[0070] In this way, it can be avoided that the same point on the contact pin 11 comes into contact with the respective measurement object for each contact or during each measurement process. This is particularly advantageous because the contact pin 11 can be used for resistance measurements and can therefore be made predominantly from brass with a gold coating at the contact point. Contact pins 11 manufactured in this way can achieve a service life of approximately 50,000 cycles. In order to increase this number of cycles, the assembly 1 according to the invention can be used to vary the contact point on the contact pin 11. The contact counterpart, which is formed by the flat contact surface 22, can be designed slightly angled for this purpose. Since either the contact surface 22 or the contact pin 11 is rotated after each measurement process, the contact point on the contact pin 11 varies. The number of rotations per 360° thus corresponds to the factor of the cycle extension.In one example, a complete relative rotation between contact pin 11 and contact surface 22 can be divided into twelve partial rotation angles of 30° each, resulting in a cycle count of 50,000 cycles to 600,000 cycles (=12 x 50,000 cycles). The rotation can be generated, as described above, using a ballpoint pen mechanism.

[0071] Due to the inclination 23 and the ballpoint pen principle, i.e. the rotation of the contact pin 11, the contacts can be distributed, so to speak, on a concentric circle 35 around the longitudinal axis 12 of the contact pin 11. Where exactly the respective circle 35 is created can depend on the inclination 23 of the contact surface 22. It can be provided that the angle of the inclination 23 can be varied. In this way, further concentric circles can be created which are larger or smaller than the concentric circle 35 shown in Fig. 5. The number of contacts can thus be multiplied again. The change in the inclination 23 does not necessarily have to be mechanical, but can also be achieved by active adjustment using a control system.Such control can be achieved by counting the contacting processes on the first concentric circle 35, so that when a threshold value of the contacting processes on the first concentric circle 35 is reached, the inclination 23 is varied, thus causing the contacting processes to take place on another concentric circle. Likewise, a measurement of the contact quality can be used as a control parameter for the inclination 23.

[0072] Fig. 6 shows a flowchart for a method for measuring electrical parameters of measurement objects, for example, battery cells. In particular, the method can be carried out with the assembly 1 explained in Figures 1 to 4. In a step S100, a first measurement object 200 is positioned in a measuring area 30 between a contact pin 11, which extends along a longitudinal axis 12, and a contact element 21, which has a contact surface 22. The measuring area 30 comprises a measuring plane 31, in which a portion of the first measurement object 200 extends and which is arranged obliquely with respect to the contact surface 22.In a further step S200, the contact pin 11 is approached to the contact surface 22 of the contact element 21 along the longitudinal axis 12 of the contact pin 11, in order to press a section of the first measurement object 200 positioned in the measuring area 30 against the contact surface 22 by means of the contact pin 11. In a further step S300, the contact pin 11 is removed from the contact surface 22 of the contact element 21 along the longitudinal axis 12 of the contact pin 11. In a further step S400, the contact pin 11 and / or the contact surface 22 are rotated relative to one another.In a further step S500, the contact pin 11 is again approached to the contact surface 22 of the contact element 21 along the longitudinal axis 12 of the contact pin 11, in order to press the section of the first measurement object 200 positioned in the measuring area 30 or a section of a second measurement object positioned in the measuring area 30 against the contact surface 22 by means of the contact pin 11. A repeated measurement of the first measurement object 200 can be performed in an offset manner.

[0073] The aforementioned method steps can be performed in the specified order. It can be provided that steps S300 and S400 overlap at least partially in time. Alternatively, it can be provided that steps S400 and S500 overlap at least partially in time.

[0074] It can be provided that the assembly shown in Figures 1 to 3 is only capable of executing a superimposed approach and rotation movement and / or a superimposed distance and rotation movement. This can mean that the contact surface 22 is rotated in a mechanically coupled manner during each contact. A separate movement sequence can be enabled via separate drive elements for the contact pin 11 and the contact element 21. This would have the advantage that an angle 0 that is not a divisor of 360° could be used, thus allowing a significantly higher number of cycles to be achieved.

Claims

P a t e n t a n s p r ü c h e 1. An assembly (1) for a measuring device (100), comprising: a first subassembly (10) with a contact pin (11) extending along a longitudinal axis (12); a second subassembly (20) with a contact element (21) having a contact surface (22); wherein a measuring region (30) is formed between a first end (13) of the contact pin (11) and the contact surface (22) of the contact element (21), said measuring region extending along a measuring plane (31); wherein the contact surface (22) of the contact element (21) extends obliquely relative to the measuring plane (31);wherein the contact pin (11) and the contact surface (22) of the contact element (21) are movable relative to one another, thus enabling the contact pin (11) to approach the contact surface (22) of the contact element (21) along the longitudinal axis (12) of the contact pin (11) and to press a section of a measurement object (200) positioned in the measurement area (30) against the contact surface (22) by means of the contact pin (11); and wherein the contact pin (11) and the contact surface (22) of the contact element (21) are rotatable relative to one another.

2. Assembly (1) according to claim 1, wherein the contact pin (11) and / or the contact surface (22) is rotatable about the longitudinal axis (12) of the contact pin (11).

3. Assembly (1) according to one of the preceding claims, wherein the contact pin (11) and / or the contact surface (22) is rotatable about the longitudinal axis (12) such that the contact pin (11) can be rotated at least between a first rotation angle position (32) with respect to the contact surface (22) and a second rotation angle position (33) relative to the contact surface (22).

4. The assembly (1) according to claim 3, wherein the contact pin (11) and the contact surface (22) are movable relative to one another in order to enable, in the first rotational angle position (32), pressing of a portion of a measurement object (200) positioned in the measuring area (30) against the contact surface (22) by means of the contact pin (11); wherein the contact pin (11) and the contact surface (22) are movable relative to one another in order to enable, in the second rotational angle position (33), pressing of a portion of a measurement object (200) positioned in the measuring area (30) against the contact surface (22) by means of the contact pin (11).

5. Assembly (1) according to one of claims 3 or 4, wherein the contact pin (11) and the contact surface (22) are movable relative to one another in order to enable removal of the contact pin (11) from the contact surface (33) of the contact element (21) during a transition from the first rotation angle position (32) to the second rotation angle position (33).

6. The assembly (1) according to one of the preceding claims, wherein the first subassembly (10) is coupled to the second subassembly (20) via a coupling (40); wherein the coupling (40) enables movement of the contact pin (11) in dependence on a movement of the contact surface (22) of the contact element (21).

7. Assembly (1) according to one of the preceding claims, wherein the contact surface (22) of the contact element (21) and the longitudinal axis (12) of the contact pin (11) enclose an angle (a) of less than 90°.

8. Assembly (1) according to one of the preceding claims, wherein an angle (a) between the contact surface (22) of the contact element (21) and the longitudinal axis (12) of the contact pin (11) is adjustable.

9. Measuring device (100) with an assembly (1) according to one of the preceding claims.

10. A method for measuring electrical parameters of measurement objects (200), comprising: Positioning a first measurement object (200) in a measurement area (30) between a contact pin (11) extending along a longitudinal axis (12) and a contact element (21) having a contact surface (22), wherein the measurement area (30) comprises a measurement plane (31) in which a portion of the first measurement object (200) extends and which is arranged obliquely with respect to the contact surface (22) (S100); Bringing the contact pin (11) closer to the contact surface (22) of the contact element (21) along the longitudinal axis (12) of the contact pin (11) in order to press the section of the first measurement object (200) positioned in the measuring area (30) against the contact surface (22) by means of the contact pin (11) (S200); Removing the contact pin (11) from the contact surface (22) of the contact element (21) along the longitudinal axis (12) of the contact pin (11, S300); Rotating the contact pin (11) and / or the contact surface (22) relative to each other (S400); bringing the contact pin (11) closer to the contact surface (22) of the contact element (21) along the longitudinal axis (12) of the contact pin (11) in order to thereby measure the section of the contact element (21) positioned in the measuring area (30) by means of the contact pin (11). first measurement object (200) or a section of a second measurement object positioned in the measurement area (30) against the contact surface (22) (S500).

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