Battery diagnosis apparatus and battery diagnosis method
The battery diagnostic device and method effectively address the challenge of diagnosing battery cells with multiphase characteristics by using comparison profiles to determine diagnostic factors, ensuring accurate diagnosis and improved battery safety and lifespan.
Patent Information
- Application Number
- PCT/KR2024/018651
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-12-14
- Filing Date
- 2024-11-22
- Publication Date
- 2025-06-19
Smart Images

Figure KR2024018651_19062025_PF_FP_ABST
Abstract
Description
Battery diagnostic device and battery diagnostic method
[0001] The present invention relates to a technique for diagnosing the condition of a battery in a non-destructive manner.
[0002] This application claims priority to Korean Patent Application No. 10-2023-0182338, filed on December 14, 2023, and all contents disclosed in the specification and drawings of that application are incorporated herein by reference.
[0003] Recently, as the demand for portable electronic products such as laptops, video cameras, and mobile phones has rapidly increased, and the development of electric vehicles, energy storage batteries, robots, and satellites has been in full swing, research into high-performance batteries capable of repeated charging and discharging is actively being conducted.
[0004] Currently commercialized batteries include nickel-cadmium batteries, nickel-hydrogen batteries, nickel-zinc batteries, and lithium batteries. Among these, lithium batteries are receiving attention for their advantages of being able to charge and discharge freely, having a very low self-discharge rate, and having a high energy density, as they have almost no memory effect compared to nickel-based batteries.
[0005] While extensive research is being conducted on these batteries to improve capacity and density, improving lifespan and safety is also crucial. To improve battery safety, the current condition of the battery must be accurately diagnosed.
[0006] Accurately diagnosing the internal condition of a battery cell is essential for safety and extended lifespan. To diagnose the internal condition of a battery cell without disassembly, relationship data (called a full-cell profile) that indicates the correspondence between full-cell capacity and full-cell voltage is primarily utilized.
[0007] Traditionally, battery cell relationship data was analyzed to diagnose the deterioration status of each electrode within a battery cell. This conventional diagnostic method is effective only if the overall profile of each electrode within the battery cell remains nearly identical to its initial state, even if the battery cell deteriorates upon shipment.
[0008] However, for some types of battery cells that include positive and / or negative electrodes with multiphase characteristics, in which at least two phases are expressed in a mixed manner, the multiphase characteristics change as the cells deteriorate, and as a result, the overall shape of the electrodes with multiphase characteristics may be significantly distorted from when they were shipped. Therefore, if conventional diagnostic methods are applied to battery cells with multiphase characteristics, the accuracy of diagnosing the deterioration status of each electrode may be significantly reduced.
[0009] The present invention has been made to solve the above problems, and its purpose is to provide a battery diagnostic device and a battery diagnostic method capable of determining at least one diagnostic factor associated with the deterioration state of a battery cell including an active material having multi-phase characteristics in at least one of a positive electrode and a negative electrode.
[0010] Other objects and advantages of the present invention can be understood through the following description and will be more clearly understood through the embodiments of the present invention. Furthermore, it will be readily apparent that the objects and advantages of the present invention can be realized by the means and combinations thereof set forth in the claims.
[0011] A battery diagnostic device according to one aspect of the present invention includes a data acquisition unit for acquiring a first profile representing a capacity-voltage relationship of a battery cell including an active material having multi-phase characteristics, and a processor for generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map. The processor is configured to compare each of the plurality of comparison profiles with the first profile, select one of the plurality of comparison profiles as a second profile, and determine an anode involvement start point as a diagnostic factor representing a deterioration state of the battery cell based on the second profile.
[0012] The electrode profile map may include a plurality of reference anode profiles associated with a plurality of deterioration states of the anode of the battery cell. The active material having the multi-phase characteristics may be included in the anode of the battery cell. Each of at least two reference anode profiles among the plurality of reference anode profiles may be a deterioration anode profile representing the capacity-voltage relationship of the anode half-cell.
[0013] The processor may be configured to determine a comparison value based on the at least two reference bipolar profiles. The comparison value may be greater than a threshold value.
[0014] The electrode profile map may include a plurality of reference negative electrode profiles associated with a plurality of deterioration states of the negative electrode of the battery cell. The active material having the multi-phase characteristics may be included in the negative electrode of the battery cell.
[0015] At least two of the above reference cathode profiles may each be a deteriorated cathode profile representing a capacity-voltage relationship of the cathode half-cell.
[0016] The processor may be configured to determine a comparison value based on the at least two reference cathode profiles. The comparison value may be greater than a threshold value.
[0017] The processor may be configured to perform an adjustment operation for each of the plurality of electrode profiles according to a plurality of adjustment levels to generate the plurality of comparison profiles.
[0018] The above adjustment operation may include at least one of a scaling operation or a shifting operation based on the capacity relationship values of the battery cells.
[0019] The processor may be configured to compare each of the plurality of comparison profiles with the first profile to determine a plurality of comparison values. The second profile may be associated with the minimum comparison value among the plurality of comparison values.
[0020] The processor may be configured to generate profile adjustment data associated with the second profile. The profile adjustment data may include at least one of anode status data based on the adjusted anode profile and cathode status data based on the adjusted cathode profile. The adjusted anode profile and the adjusted cathode profile may be generated by adjusting two electrode profiles among the plurality of electrode profiles. The adjusted anode profile and the adjusted cathode profile may be used to generate the second profile.
[0021] The processor may generate the second profile based on voltage difference data representing a voltage difference between the adjusted positive profile and the adjusted negative profile.
[0022] The above bipolar state data may include the bipolar participation start point and may further include at least one of the bipolar participation end point, the bipolar scale factor, and the bipolar loading amount.
[0023] The above cathode state data may include at least one of a cathode engagement start point, a cathode engagement end point, a cathode scale factor, and a cathode loading amount.
[0024] The processor may be configured to limit at least one of a voltage range and a State Of Charge (SOC) range for the battery cell based on the diagnostic factor.
[0025] A battery pack according to another aspect of the present invention includes the battery diagnostic device.
[0026] A battery system according to another aspect of the present invention includes the battery pack.
[0027] A remote diagnostic server according to another aspect of the present invention includes the battery diagnostic device.
[0028] According to another aspect of the present invention, a battery diagnosis method includes the steps of obtaining a first profile representing a capacity-voltage relationship of a battery cell including an active material having multi-phase characteristics, generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map, selecting one comparison profile from among the plurality of comparison profiles as a second profile based on a comparison value for the first profile of each of the plurality of comparison profiles, and determining a positive electrode involvement start point as a diagnostic factor representing a deterioration state of the battery cell based on the second profile.
[0029] According to another aspect of the present invention, a computer-readable medium stores instructions for diagnosing a battery cell. When executed by a processor, the instructions cause the processor to perform the following operations: obtaining a first profile representing a capacity-voltage relationship of the battery cell including an active material having multi-phase characteristics; generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map; selecting one of the plurality of comparison profiles as a second profile based on a comparison value for the first profile of each of the plurality of comparison profiles; and determining a positive electrode involvement start point as a diagnostic factor representing a deterioration state of the battery cell based on the second profile.
[0030] According to at least one of the embodiments of the present invention, at least one diagnostic factor associated with the deterioration state of a battery cell including an active material having multi-phase characteristics can be precisely determined.
[0031] Additionally, according to at least one of the embodiments of the present invention, at least one degradation parameter indicating a degradation state of the positive electrode, negative electrode and / or available lithium of the battery cell can be determined based on at least one diagnostic factor.
[0032] In addition, according to at least one of the embodiments of the present invention, based on the diagnosis result for the battery cell, the allowable usage conditions (e.g., voltage range, SOC range, current, etc.) for the battery cell can be adjusted (limited), thereby promoting the safety and extending the lifespan of the battery cell.
[0033] The effects of the present invention are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the description of the claims.
[0034] The following drawings attached to this specification illustrate preferred embodiments of the present invention, and together with the detailed description of the invention described below, serve to further understand the technical idea of the present invention, and therefore, the present invention should not be interpreted as being limited to matters described in such drawings.
[0035] FIG. 1 is a drawing exemplarily showing the configuration of a battery diagnostic device, a battery system, and a charging station according to one embodiment of the present invention.
[0036] Figures 2 and 3 are drawings for reference in explaining the capacity-voltage relationship of an electrode without multi-phase characteristics.
[0037] Figures 4 and 5 are drawings for reference in explaining the capacity-voltage relationship of an electrode having multi-phase characteristics.
[0038] FIGS. 6 to 9 are drawings used as reference to explain electrode profile maps utilized in the diagnosis of battery cells having multi-phase characteristics.
[0039] Figure 10 is a graph for reference in explaining an example of each of a reference anode profile and a reference cathode profile.
[0040] Figures 11 and 12 are graphs for reference to exemplarily explain the measured full cell profile.
[0041] FIGS. 13 to 15 are drawings for reference in explaining an example of a procedure for generating profile adjustment data using profile adjustment logic.
[0042] FIGS. 16 to 18 are drawings for reference in explaining another example of a procedure for generating profile adjustment data using profile adjustment logic.
[0043] FIG. 19 is a flowchart for reference in schematically explaining a battery diagnosis method according to another embodiment of the present invention.
[0044] FIG. 20 is a drawing referenced to explain the OCV estimation procedure that can be performed in FIG. 19.
[0045] The subject matter of this disclosure will now be more fully described hereinafter with reference to the accompanying drawings, which form a part hereof and illustrate certain exemplary embodiments. Any embodiment or implementation described as "exemplary" should not be construed as preferred or advantageous over, for example, other embodiments or implementations, but rather to reflect or indicate that the embodiment(s) are "exemplary" embodiments. The subject matter may be embodied in many different forms, and therefore the subject matter claimed or applied should not be construed as limited to any of the exemplary embodiments set forth herein. The exemplary embodiments are provided for illustrative purposes only. Likewise, a reasonably wide scope of the claimed or encompassed subject matter is intended. For example, among other things, the subject matter may be embodied as a method, device, component, or system. Accordingly, embodiments may take the form of, for example, hardware, software, firmware, or any combination thereof (excluding software itself). Therefore, the following detailed description is not intended to be taken in a limiting sense.
[0046] Throughout the specification and claims, terms may have meanings that are not explicitly stated, but are implied or suggested by the context. Similarly, the phrase "in one embodiment" as used herein does not necessarily refer to the same embodiment, and the phrase "in another embodiment" as used herein does not necessarily refer to a different embodiment. For example, the claimed subject matter is intended to encompass combinations of the exemplary embodiments, in whole or in part.
[0047] The terms used below are to be interpreted in the broadest and most reasonable manner, even when used in conjunction with detailed descriptions of specific examples of the present disclosure. Indeed, while certain terms may be emphasized below, any terms intended to be interpreted in a limited manner are clearly and specifically defined in this detailed description. The foregoing general description and the following detailed description are intended to be exemplary and explanatory only and are not intended to limit the claimed features.
[0048] As used herein, the term "based on" means "based at least in part on." Terms including ordinal numbers such as "first," "second," etc. may be used to distinguish one component from another among various components, but are not intended to be limiting of the components. The singular forms "a," "an," and "the" include plurals unless the context clearly dictates otherwise. The term "exemplary" is used in the sense of "example" rather than "ideal." The term "or" is inclusive and means any, some, or all of the listed items. The terms "comprises," "comprising," "includes," "including," or variations thereof are intended to encompass a non-exclusive inclusion so that a process, method, or article comprising a list of components does not necessarily include only those elements, but that other elements not expressly listed or implied in the process, method, article, or apparatus may be included therein. Relative terms such as "substantially" and "typically" are used to indicate a possibility of variation of ±5% from the stated or understood value.
[0049] Additionally, throughout the specification, when it is described that a part is "connected" or "coupled" to another part, it is not limited to "directly connected" or "directly coupled," but also includes cases where one or more elements are arranged therebetween so that they are "indirectly connected" or "indirectly coupled."
[0050] Additionally, terms such as <unit> described in the specification mean a unit that processes at least one function or operation, and may be implemented by hardware, software, or a combination of hardware and software.
[0051] FIG. 1 is a drawing exemplarily showing the configuration of a battery diagnostic device and an electric vehicle battery system and charging station according to one embodiment of the present invention.
[0052] Referring to Fig. 1, a battery system (1) includes a system controller (2), a battery pack (10), an inverter (30), and an electric motor (40). The charge / discharge terminals (P+, P-) of the battery pack (10) can be electrically coupled to a charging station (300) via a charging cable or the like. The battery system (1) is not particularly limited as long as it is an electric system in which a battery is used as a power source, such as an electric vehicle.
[0053] The system controller (2) (e.g., ECU: Electronic Control Unit) is configured to transmit a key-on signal to the battery management system (100) in response to a start button (not shown) provided in the battery system (1) being turned to the ON position by a user. The system controller (2) is configured to transmit a key-off signal to the battery management system (100) in response to a start button being turned to the OFF position by a user. The charging station (300) can communicate with the system controller (2) and supply charging power selected from among constant power, constant current, and constant voltage through the charge / discharge terminals (P+, P-) of the battery pack (10).
[0054] The battery pack (10) includes a battery (11), a relay (20), and a battery management system (100).
[0055] The battery (11) includes at least one battery cell (BC). In Fig. 1, the battery (11) includes a plurality of battery cells (BC1 to BC) connected in series. N , N is a natural number greater than or equal to 2) is illustrated as an example. Multiple battery cells (BC1 to BC N ) may be provided to have the same electrochemical specifications. Hereinafter, a plurality of battery cells (BC1 to BC N ), the symbol 'BC' is assigned to the battery cell. The charging station (300) can execute the charge / discharge cycle required to diagnose the battery cell (BC) through collaboration with an inverter (30) having a discharge function.
[0056] A battery cell (BC) includes a positive electrode and a negative electrode. It may include at least one unit cell as an electrochemical device capable of repeated charging and discharging. The battery cell (BC) is subject to diagnosis by a battery diagnostic device (302).
[0057] The relay (20) is electrically connected in series to the battery (11) via a power path connecting the battery (11) and the inverter (30). In Fig. 1, the relay (20) is illustrated as being connected between the positive terminal of the battery (11) and the charge / discharge terminal (P+). The relay (20) is turned on and off in response to a switching signal from the battery management system (100). The relay (20) may be a mechanical contactor that is turned on and off by the magnetic force of a coil, or a semiconductor switch such as a MOSFET (Metal Oxide Semiconductor Field Effect transistor).
[0058] An inverter (30) is provided to convert direct current from a battery (11) included in a battery pack (10) into alternating current in response to a command from a battery management system (100) or a system controller (2). An electric motor (40) is driven using alternating current power from the inverter (30). For example, a three-phase alternating current motor can be used as the electric motor (40). Components within the battery system (1) that receive discharge power from the battery (11), including the inverter (30) and the electric motor (40), can be collectively referred to as an electric load.
[0059] The battery management system (100) includes a sensing unit (110) and a control circuit (130). The battery management system (100) may further include a communication circuit (150).
[0060] The sensing unit (110) includes a voltage sensor (111). The sensing unit (110) may further include a current sensor (112). The sensing unit (110) may generate voltage measurement information and current measurement information, which will be described later.
[0061] A voltage sensor (111) is connected to the positive and negative terminals of a battery cell (BC), and is configured to detect a voltage across both ends of the battery cell (BC) (which may be referred to as a 'full cell voltage') and generate a voltage signal representing a detected value of the detected voltage. The voltage sensor (111) may be implemented as one or a combination of two or more of known voltage detection elements, such as a voltage measurement IC.
[0062] The current sensor (112) is connected in series to the battery (11) through a current path between the battery (11) and the inverter (30). The current sensor (112) is configured to detect a current flowing through the battery (11) (which may be referred to as a 'charge / discharge current') and generate a current signal representing the detected current. A plurality of battery cells (BC1 to BC) N) are connected in series, the current flowing in the battery (11) is the same as the current flowing in the battery cell (BC). The current sensor (112) can be implemented with one or a combination of two or more of known current detection elements such as a shunt resistor, a Hall effect element, etc.
[0063] The communication circuit (150) is configured to support wired or wireless communication between the control circuit (130) and the system controller (2). The wired communication may be, for example, CAN (control area network) communication, and the wireless communication may be, for example, Zigbee or Bluetooth communication. Of course, as long as it supports wired or wireless communication between the control circuit (130) and the system controller (2), the type of communication protocol is not particularly limited. The communication circuit (150) may include an output device (e.g., a display, a speaker) that provides information received from the control circuit (130) and / or the system controller (2) in a form recognizable to a user (driver).
[0064] The control circuit (130) is operably coupled to a relay (20), a voltage sensor (111), and a communication circuit (150). The fact that the two components are operably coupled means that the two components are directly or indirectly connected so as to be capable of transmitting and receiving signals in one or both directions.
[0065] The control circuit (130) can collect a voltage signal from the voltage sensor (111) and a current signal from the current sensor (112). In this specification, the detection signal may refer only to the voltage signal, or may be a term that collectively refers to both the voltage signal and the current signal. That is, the control circuit (130) can convert and record each analog signal collected from the sensors (111, 112) into a digital value using an ADC (Analog to Digital Converter) provided therein. Alternatively, each of the voltage sensor (111) and the current sensor (112) may include an ADC therein and transmit the digital value to the control circuit (130).
[0066] The control circuit (130) may be referred to as a 'battery controller' and may be implemented in hardware using at least one of application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), microprocessors, and other electrical units for performing functions.
[0067] The memory (131) may include at least one type of storage medium among, for example, a flash memory type, a hard disk type, an SSD (Solid State Disk type), an SDD (Silicon Disk Drive type), a multimedia card micro type, a random access memory (RAM), a static random access memory (SRAM), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), and a programmable read-only memory (PROM). The memory (131) may store data and a program required for an operation by the control circuit (130). The memory (131) may store data indicating a result of an operation by the control circuit (130).
[0068] When the relay (20) is turned on, the battery (11) enters the charging mode or the discharging mode. When the relay (20) is turned off while the battery (11) is in use in the charging mode or the discharging mode, the battery (11) switches to the idle mode.
[0069] The control circuit (130) can turn on the relay (20) in response to a key-on signal. The control circuit (130) can turn off the relay (20) in response to a key-off signal. The key-on signal is a signal requesting a transition from idle to charging or discharging. The key-off signal is a signal requesting a transition from charging or discharging to idle. Alternatively, the on / off control of the relay (20) may be handled by the system controller (2) instead of the control circuit (130).
[0070] In this specification, measurement information (e.g., time series data) of a parameter represents the temporal change history of that parameter. In addition, a profile (or curve) representing the correspondence between two parameters obtained at the same timing during the same period may be a mapping of two measurement pieces of two parameters so that they can be expressed in the form of a two-dimensional graph, or a polynomial equation obtained by applying a predetermined curve fitting logic to a set of two mapped measurement pieces. Here, the degree of the highest term of the polynomial equation may be predetermined.
[0071] The battery diagnostic device (302) includes a data acquisition unit (310), a processor (320), and a memory unit (330).
[0072] The charging station (300) may include a stimulus application device (301) and a battery diagnosis device (302). Alternatively, the battery diagnosis device (302) may be a configuration independent from the charging station (300). For example, the battery diagnosis device (302) may be provided in a form included in a remote diagnosis server (not shown), a battery pack (10), or a battery system (1). The remote diagnosis server may be located remotely from the charging station (300). When the battery diagnosis device (302) is included in the remote diagnosis server, the data acquisition unit (310) of the battery diagnosis device (302) may perform diagnostic procedures on the battery cell (BC) through remote communication with the stimulus application device (301) and / or the battery system (1).
[0073] If the battery diagnostic device (302) is included in the battery pack (10) instead of the charging station (300) or remote diagnostic server, the battery management system (100) may be omitted from the battery pack (10). That is, the processor (320) may be responsible for all functions of the control circuit (130) of the battery management system (100). For example, the data acquisition unit (310) may be included as a sub-component of the processor (320) and may be responsible for all functions of the communication circuit (150) of the battery management system (100). In addition, the data acquisition unit (310) may collect voltage measurement information and current measurement information from the sensing unit (110).
[0074] The stimulation application device (301) may include a charger that provides charging power for normal charging of the battery pack (10). The stimulation application device (301), either alone or in cooperation with an inverter (30), may apply various electrical stimuli to the battery cell (BC) for diagnosis of the battery cell (BC).
[0075] The data acquisition unit (310) is configured to support wired or wireless communication between the processor (320) and the system controller (2). The data acquisition unit (310) can transmit the results of the diagnosis of the battery cell (BC) performed by the processor (320) to the battery system (1).
[0076] The processor (320) may be implemented in hardware using at least one of application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), microprocessors, and other electrical units for performing functions.
[0077] The device (300) and system (1) and various elements thereof disclosed in connection with the embodiments of FIGS. 1 to 20 that enable implementation of the methods and processes according to the present disclosure may be implemented by a processor (320) using a plurality of microprocessors executing software or firmware, or may be implemented using one or more application-specific integrated circuits (ASICs) and associated software. In another example, the device (300) or system (1) and various elements included therein that enable implementation of the methods and processes according to the embodiments of FIGS. 1 to 20 may be implemented using a combination of ASICs, individual electronic components (e.g., transistors), and microprocessors. In some embodiments, components depicted as separate may be replaced by a single component. Furthermore, some of the components depicted may be additional or may be replaced by other components.
[0078] The memory unit (330) may include at least one type of storage medium among, for example, a flash memory type, a hard disk type, an SSD (Solid State Disk type), an SDD (Silicon Disk Drive type), a multimedia card micro type, a random access memory (RAM), a static random access memory (SRAM), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), and a programmable read-only memory (PROM). The memory unit (330) may store data representing the result of an operation by the processor (320). The memory unit (330) may store data sets and software used to diagnose the deterioration state of the battery cell (BC).
[0079] In one embodiment, the memory unit (330) may store a set of instructions that may be executed to cause the processor (320) to perform any one or more of the methods or processes described herein based on the functionality disclosed herein. The memory unit (330) may communicate via one or more wires or buses. Similarly, although not explicitly depicted, the components depicted in FIG. 1 may be interconnected via one or more wires and buses in any suitable manner known to those skilled in the art to facilitate signal or data communication and operation of the device (300) or system (1) according to the present disclosure. The memory unit (330) may be main memory, static memory, or dynamic memory. The memory unit (330) may include, but is not limited to, volatile and nonvolatile storage media, and may include, but are not limited to, random access memory, read-only memory, programmable read-only memory, electrically programmable read-only memory, electrically erasable read-only memory, flash memory, and the like. In one implementation, the memory unit (330) may include a cache or random access memory for the processor (320). The memory unit (330) may be the processor's cache memory, system memory, or other memory. The memory unit (330) may be operable to store instructions executable by the processor (320). The functions, actions, or tasks depicted in the drawings or described herein may be performed by the processor (320) executing the instructions stored in the memory unit (330). The functions, actions, or tasks are independent of any particular type of instruction set, storage medium, processor, or processing strategy and may be performed by software, hardware, integrated circuits, firmware, microcode, or the like, operating alone or in combination. Similarly, the processing strategy may include multiprocessing, multitasking, and the like.The computer-readable storage medium described in connection with the memory unit (330) according to the present disclosure may be non-transitory or tangible.
[0080] A computer-readable medium having instructions stored thereon configured to cause one or more computers to perform any of the methods described herein is described. The computer-readable medium may include volatile or nonvolatile, removable or non-removable media implemented in any method or technology capable of storing information such as computer-readable instructions, data structures, program modules, or other data. Typically, the functionality of the computing devices described herein is implemented in C, C++, COBOL, JAVA, TM , PHP, Perl, Python, Ruby, HTML, CSS, JavaScript, VBScript, ASPX, C# and other Microsoft .NET TM The computing logic may be implemented as hardware or software instructions that can be written in a programming language, such as a language and / or the like. The computing logic may be written in an interpreted programming language or compiled into an executable program. In general, the functionality described herein may be implemented as logic modules that can be duplicated, merged with other modules, or split into sub-modules to provide greater processing power. The computing logic may be stored in any type of computer-readable medium (e.g., a non-transitory medium such as a memory or storage medium) or computer storage device, and may be stored and executed on one or more general-purpose or special-purpose processors, thereby creating a special-purpose computing device configured to provide the functionality described herein.
[0081] The applications and functions disclosed in the above-described and following embodiments can be achieved by programming the device (300) according to the description provided with respect to the system (1) illustrated in FIG. 1, for example. That is, the device (300) or the system (1) of the above-described and following embodiments can utilize a computer-readable medium having stored thereon instructions configured to cause one or more computers or processors to perform any of the methods described herein, for example.
[0082] In the present invention, the target cell, which is a battery cell (BC) to be diagnosed, includes at least one active material having multiphase characteristics. Specifically, the target cell (BC) includes a positive electrode and a negative electrode, and at least one of the positive electrode active material of the positive electrode and the negative electrode active material of the negative electrode has multiphase characteristics.
[0083] The absence of multiphase characteristics in the positive electrode may mean that its positive electrode active material does not have multiphase characteristics. The absence of multiphase characteristics in the negative electrode may mean that its negative electrode active material does not have multiphase characteristics. In other words, the absence of multiphase characteristics in the positive electrode may mean that the positive electrode contains only a single positive electrode active material without multiphase characteristics. Similarly, the absence of multiphase characteristics in the negative electrode may mean that the negative electrode contains only a single negative electrode active material without multiphase characteristics. Multiphase characteristics will be described later.
[0084] In this specification, the "new product" state is synonymous with the "Beginning of Life" (BOL) state. For example, the BOL state can be defined as the period from the time of manufacturing completion until the cumulative charge / discharge capacity reaches a predetermined set capacity, and the MOL (Middle of Life) state can be defined as the period after the cumulative charge / discharge capacity reaches the set capacity.
[0085] Figures 2 and 3 are drawings for reference in explaining the capacity-voltage relationship of an electrode without multi-phase characteristics.
[0086] First, in Fig. 2, the curve indicated by the symbol BOL is an anode profile showing the correspondence between the anode voltage and the anode capacity for a given voltage range (V1 to V2) when the anode without multiphase characteristics is in the BOL state. Symbol Q P_BOL Indicates the total anode capacity in the BOL state of the anode without multiphase characteristics. In Fig. 2, the curve indicated by the symbol MOL is an anode profile showing the correspondence between the anode voltage and the anode capacity for a given voltage range (V1~V2) when the anode without multiphase characteristics is in the MOL (Middle Of Life) state. The MOL state is a state deteriorated from the BOL state. Therefore, the anode capacity when the anode voltage of the anode profile (MOL) reaches V2 is Q P_BOL It is less than.
[0087] Next, in Fig. 3, the curve indicated by the symbol BOL is identical to the anode profile (BOL) illustrated in Fig. 2. In addition, the curve indicated by the symbol MOL' is the result of the anode profile (MOL) illustrated in Fig. 2 being expanded along the horizontal axis so as to have a capacity range that matches the capacity range of the anode profile (BOL).
[0088] It is noteworthy that the anode profile (MOL') closely matches the anode profile (BOL). Specifically, over the entire capacity range (0 to Q P_BOL ), the voltage difference between the anode profile (MOL') and the anode profile (BOL) remains close to 0. That is, for anodes without multiphase characteristics, the overall shape of the anode profile in the MOL state is almost unchanged compared to the BOL state. Therefore, V P_BOL (Q) represents the polynomial corresponding to the bipolar profile in the BOL state, and V P_MOL When (Q) represents a polynomial corresponding to the bipolar profile in the MOL state, it can be treated as satisfying the following two relationships.
[0089] [Relationship 1] V P_MOL (Q) = V P_BOL (Q × Q P_BOL / Q P_MOL )
[0090] [Relationship 2] V P_BOL (Q) = V P_MOL (Q × Q P_MOL / Q P_BOL )
[0091] V P_MOL (Q) represents the anode voltage of the anode profile (MOL) corresponding to the anode capacity Q. V P_BOL (Q) represents the anode voltage of the anode profile (BOL) corresponding to the anode capacity Q. Q P_MOL represents the anode capacity when the anode voltage of the positive electrode profile (MOL) is V2, i.e., the total anode capacity in the MOL state.
[0092] Figures 4 and 5 are drawings for reference in explaining the capacity-voltage relationship of an electrode having multi-phase characteristics.
[0093] First, in Fig. 4, the curve indicated by the symbol BOL is an anode profile showing the correspondence between the anode voltage and the anode capacity for a given voltage range (V1 to V2) when the anode with multi-phase characteristics is in the BOL state. Symbol Q P_BOL Indicates the total anode capacity in the BOL state of the anode having multiphase characteristics. In Fig. 4, the curve indicated by the symbol MOL is an anode profile showing the correspondence between the anode voltage and the anode capacity for a given voltage range (V1 to V2) when the anode having multiphase characteristics is in the MOL (Middle Of Life) state.
[0094] Next, in Fig. 5, the curve indicated by the symbol BOL is identical to the anode profile (BOL) illustrated in Fig. 4. In addition, the curve indicated by the symbol MOL' is the result of the anode profile (MOL) illustrated in Fig. 4 being enlarged along the horizontal axis so as to have a capacity range that matches the capacity range of the anode profile (BOL) illustrated in Fig. 4.
[0095] In contrast to Fig. 3, in Fig. 5, there is a significant difference in the anode profile (MOL') compared to the anode profile (BOL). Specifically, there is a section where the voltage difference between the anode profile (MOL') and the anode profile (BOL) is so large that it cannot be ignored over the entire capacity range (0 to Q P_BOL ) are widely distributed within the cathode. That is, when the cathode includes at least one cathode active material having multiphase characteristics, the overall shape of the cathode profile in the MOL state changes significantly compared to the BOL state. Therefore, the two relationships described above are not valid for cathodes having multiphase characteristics.
[0096] Meanwhile, the contents of the anode described with reference to FIGS. 2 to 5 are also common to the cathode.
[0097] From now on, we will explain the multi-phase characteristics of electrode active materials that can be common to both positive and negative electrodes.
[0098] Multiphase characteristics refer to the phase transitions of a specific type of electrode active material during charge / discharge cycles. For example, among various types of electrode active materials, the so-called manganese-rich (also known as "high manganese") type is a representative positive electrode active material exhibiting multiphase characteristics.
[0099] Manganese-rich lithium transition metal oxide, LiNi, a ternary cathode material a Co b Mn cIt can be a cathode active material in which the specific gravity (c) of manganese in O2(a, b, c≥0; a + b + c=1) is increased to a certain value (e.g., 0.5) or higher.
[0100] Based on the manganese-rich material, the multiphase characteristics of the cathode active material will be described. During charge / discharge, at least a portion of the manganese-rich material undergoes a phase transition between a first phase with a layered structure and a second phase with a spinel-like structure. The primary reaction in the first phase may be Ni-redox, i.e., a redox reaction of nickel. The primary reaction in the second phase may be M / O redox, i.e., a redox reaction of manganese and oxygen.
[0101] The modification of the anode profile of a manganese-rich anode can be determined by the first phase-dependent capacity-voltage characteristics and the second phase-dependent capacity-voltage characteristics. When a manganese-rich anode deteriorates from a BO state and becomes a MOL state, the phase transition characteristics between the first and second phases change significantly from the phase transition characteristics in the BOL state, and as a result, the modification difference of the anode profile in the MOL state (e.g., the MOL' curve in Fig. 5) becomes evident compared to the anode profile in the BOL state (e.g., the BOL curve in Fig. 5).
[0102] Examples of negative active materials with multiphase characteristics include silicon-based active materials (e.g., Pure Si, SiO, SiC, etc.). In the case of silicon-based active materials, a phase transition occurs between a first phase with a crystalline structure and a second phase with an amorphous structure during charge / discharge in the balance-of-charge (BOL) state. In addition, some of the crystalline structures of the silicon-based active material may be irreversibly amorphized by charge / discharge. Therefore, as an anode including a silicon-based active material as an anode active material deteriorates, the ratio of the first phase to the second phase may gradually increase. As described above for the positive active material, since the capacity-voltage characteristics of each phase of the anode active material also gradually change as the anode deteriorates, the shape of the anode profile differs significantly from the balance-of-charge (BOL) state.
[0103] Figures 6 to 9 are drawings for reference in explaining an electrode profile map used for diagnosing a battery cell.
[0104] An electrode profile map may include multiple electrode profiles. Each electrode profile of the electrode profile map may be associated with an anode or cathode of a target cell (BC).
[0105] Referring to FIGS. 8 and 9, m reference anode profiles (Rp[1] to Rp[m]) and n reference cathode profiles (Rn[1] to Rn[n]) can be identified, which may be electrode profiles included in an electrode profile map. m and n are each natural numbers greater than or equal to 2. Rp[1] may be a reference anode profile representing the capacity-voltage characteristics of the anode in a BOL state. Rn[1] may be a reference cathode profile representing the capacity-voltage characteristics of the cathode in a BOL state.
[0106] The electrode profile map may be pre-stored in the memory unit (330) or may be received from the outside through a communication channel by the data acquisition unit (310).
[0107] Figure 6 shows a deteriorated anode profile (Rp _D_1 ~Rp _D_a ) is an example. a is a natural number greater than or equal to 2 and less than or equal to m. When the positive electrode of the target cell (BC) contains an active material having multi-phase characteristics, the deteriorated positive electrode profile (Rp _D_1 ~Rp _D_a ) is associated with multiple deterioration states of the anode of the target cell (BC).
[0108] Degraded anode profile (Rp _D_1 ~Rp _D_a ) can be obtained in advance based on the results of pre-conducted tests on reference cell(s). The reference cell may be manufactured to have the same level of positive and negative performance as a new battery cell that has been verified as good. A new battery cell refers to a battery cell in a new condition.
[0109] In detail, the deterioration anode profile (Rp _D_1 ~Rp _D_a ) may be prepared in advance based on measurement information indicating the capacity-voltage relationship of a positive electrode half-cell that has been forcibly degraded from a BOL state by various cycling tests. The positive electrode half-cell may be the positive electrode of a reference cell manufactured to have the same electrochemical specifications as the target cell (BC).
[0110] Each cycling test may differ from other cycling tests in at least one of temperature conditions, charge / discharge voltage range conditions, and charge / discharge current rate conditions. For example, the first deteriorated anode profile (Rp _D_1 ) may be based on the capacity-voltage measurement information of the positive electrode half-cell obtained by disassembling a reference cell that has undergone a predetermined number of charge-discharge cycles with temperature conditions, charge-discharge voltage range conditions, and charge-discharge current rate conditions set to 25[℃], 4.6~2.0[V], and 2[C], respectively. As another example, the a deteriorated positive electrode profile (Rp _D_a) may be based on capacity-voltage measurement information of a positive half-cell obtained by disassembling another reference cell in which a predetermined number of charge-discharge cycles were performed under temperature conditions, charge-discharge voltage range conditions, and charge-discharge current rate conditions of 35[℃], 4.5~2.0[V], and 1[C], respectively.
[0111] When the positive electrode of the target cell (BC) contains an active material having multi-phase characteristics, the deteriorated positive electrode profile (Rp _D_1 ~Rp _D_a ) at least two (e.g. Rp _D_1 , Rp _D_a ) can each be included in the electrode profile map as a reference anode profile. For example, Rp _D_1 = Rp[2], Rp _D_a = Rp[m].
[0112] Referring to Figure 7, when c is a natural number less than a, the two degradation bipolar profiles (Rp _D_c , Rp _D_c+1 ) has a non-small voltage difference across the entire capacity range. The two degradation anode profiles (Rp _D_c , Rp _D_c+1 ) may exceed a predetermined threshold, which may be due to the multi-phase characteristics of the positive electrode active material. The comparison value between any two profiles may also be referred to as a 'profile error'.
[0113] At least one of the reference anode profiles (Rp[1] to Rp[m]) may be a simulation anode profile. The simulation anode profile may be a deteriorated anode profile (Rp _D_1 ~Rp _D_a ) may be synthesized at least two deteriorated anode profiles at a predetermined ratio. For example, in Fig. 7, when d is a natural number less than or equal to b, the simulation anode profile (Rp _S_d ) are two deteriorated bipolar profiles (Rp _D_c , Rp _D_c+1 ) is a new bipolar profile synthesized in a ratio of 0.5:0.5.
[0114] Of course, the two degradation bipolar profiles (Rp _D_c , Rp _D_c+1 ) are synthesized in various ratios such as 0.1:0.9, 0.2:0.8, etc., thereby producing a deteriorated anode profile (Rp _D_c , Rp _D_c+1 ) can be generated. For example, two deteriorated anode profiles (Rp _D_c , Rp _D_c+1 ) are individually synthesized in multiple ratios, so that two deteriorated anode profiles (Rp _D_c , Rp _D_c+1 ) can be generated with a predetermined number of simulation bipolar profiles spaced equally between them.
[0115] Degraded anode profile (Rp _D_c , Rp _D_c+1 ) are associated with different degradation states, so each simulation anode profile is also a degradation anode profile (Rp _D_c , Rp _D_c+1 ) is associated with a different deterioration state of the polarity.
[0116] Each simulated anode profile may already be included in the electrode profile map. Alternatively, the processor (320) may generate at least one simulated anode profile based on two deteriorated anode profiles included in the electrode profile map, and add each generated simulated anode profile to the electrode profile map.
[0117] Figure 8 shows a deteriorated anode profile (Rp _D_1 ~Rp _D_a ) and b simulated bipolar profiles (Rp _S_1 ~Rp _S_b ) is an example of a set of m reference bipolar profiles (Rp[1]~Rp[m]). In this case, m = a+b.
[0118] When the negative electrode of the target cell (BC) includes an active material having multi-phase characteristics, the reference negative electrode profiles (Rn[1] to Rn[n]) shown in FIG. 9 may be prepared in advance by commonly applying the method described above for obtaining the reference positive electrode profiles (Rp[1] to Rp[m]) to the negative electrode of the reference cell. For example, at least two of the reference negative electrode profiles (Rn[1] to Rn[n]) may be degraded negative electrode profiles prepared in advance based on measurement information indicating the capacity-voltage relationship of a negative electrode half-cell that has been forcibly degraded from a BOL state by various cycling tests. The negative electrode half-cell may be the negative electrode of the reference cell. In FIG. 9, Q N_BOL It indicates the total cathode capacity in the BOL state of the cathode with multi-phase characteristics.
[0119] Similar to the reference positive electrode profile (Rp[1] to Rp[m]), the reference negative electrode profile (Rn[1] to Rn[n]) is associated with multiple degradation states of the negative electrode. In addition, the comparison value between at least two of the reference negative electrode profiles (Rn[1] to Rn[n]) may exceed the threshold due to the multiphase characteristics of the negative electrode active material included in the negative electrode half-cell.
[0120] The threshold value serves as a criterion for determining the presence or absence of a multiphase characteristic. As described above, an electrode including an active material having a multiphase characteristic has significantly different capacitance-voltage relationships between its multiple degradation states. Accordingly, the deformation of the electrode profile in a certain degradation state is significantly different from the deformation of the electrode profile in another degradation state, and the comparative value is a quantified value representing the degree of deformation difference between these two profiles. Therefore, a comparative value between any two reference positive electrode profiles included in the electrode profile map that is greater than or equal to the threshold value indicates that the positive electrode of the target cell (BC) includes an active material having a multiphase characteristic. Similarly, a comparative value between any two reference negative electrode profiles included in the electrode profile map that is greater than or equal to the threshold value indicates that the negative electrode of the target cell (BC) includes an active material having a multiphase characteristic.
[0121] When the target cell (BC) includes an active material having multi-phase characteristics at the anode, the processor (320) can determine a comparison value between at least two of m reference anode profiles (Rp[1] to Rp[m]).
[0122] When the cathode of the target cell (BC) contains an active material having multi-phase characteristics, the processor (320) can determine a comparison value between at least two of the reference cathode profiles (Rn[1] to Rn[n]).
[0123] Meanwhile, the target cell (BC) is not necessarily a diagnostic target according to the present invention only if both its positive and negative electrodes contain active materials having multiphase characteristics, and either one of the positive and negative electrodes may contain active materials having multiphase characteristics. Accordingly, if only the positive electrode of the target cell (BC) has multiphase characteristics and the negative electrode does not have multiphase characteristics, n may be 1, in which case only a single reference negative electrode profile (e.g., Rn[1]) representing the capacity-voltage characteristics of the negative electrode in the BOL state may be prepared. Similarly, if only the negative electrode of the target cell (BC) has multiphase characteristics and the positive electrode does not have multiphase characteristics, m may be 1, in which case only a single reference positive electrode profile (e.g., Rp[1]) representing the capacity-voltage characteristics of the positive electrode in the BOL state may be prepared.
[0124] For reference, the voltage change due to capacity change increases as the anode or cathode deteriorates. Considering this, each of the reference anode profiles (Rp[1]~Rp[m]) is in the anode capacity range (0~Q) of the anode profile in the BOL state. P_BOL ) may be standardized to have the same anode capacity range as the reference cathode profile (Rn[1] to Rn[n]). In addition, each of the reference cathode profiles (Rn[1] to Rn[n]) has a cathode capacity range (0 to Q) of the cathode profile in the BOL state. N_BOL ) may be standardized to have the same cathode capacity range. This can be confirmed from the fact that both end points of each of the reference anode profiles (Rp[1] to Rp[m]) in Fig. 8 are identical, and both end points of each of the reference cathode profiles (Rn[1] to Rn[n]) in Fig. 9 are identical.
[0125] Although not illustrated in Fig. 9, the electrode profile map may include multiple reference full-cell profiles. Each reference full-cell profile is a profile synthesized from any one of m reference positive electrode profiles (Rp[1] to Rp[m]) and any one of n reference negative electrode profiles (Rn[1] to Rn[n]), and represents a correspondence between the full-cell capacity and the full-cell voltage when the reference cell is in a specific degradation state.
[0126] For example, capacity-voltage measurement information of a reference cell that has been forcibly degraded by a specific cycling test may be acquired, and then capacity-voltage measurement information of each of the positive and negative electrodes may be acquired by disassembling the reference cell. After the specific cycling test is completed, a reference full-cell profile determined from the capacity-voltage measurement information of the reference cell, a reference positive electrode profile determined based on the capacity-voltage measurement information of the positive electrode of the reference cell, and a reference negative electrode profile determined based on the capacity-voltage measurement information of the negative electrode of the reference cell may each be included in an electrode profile map.
[0127]
[0128] Fig. 10 is a graph used as a reference for explaining an example of a reference positive electrode profile and a reference negative electrode profile, respectively. In the graph of Fig. 10, the horizontal axis (X-axis) represents capacity (Ah) and the vertical axis (Y-axis) represents voltage. For convenience of explanation, in the graphs of Fig. 10 and Figs. 12 to 18, it is assumed that the numbers marked on the horizontal axis (X-axis) represent the full cell capacity during the charging process.
[0129] Referring to FIG. 10, the memory unit (330) can store a reference positive profile (Rp[i]) and a reference negative profile (Rn[j]).
[0130] When i is a natural number less than or equal to m, the reference anode profile (Rp[i]) is one of the m reference anode profiles (Rp[1] to Rp[m]) illustrated in Fig. 8. When j is a natural number less than or equal to n, the reference cathode profile (Rn[j]) is one of the n reference cathode profiles (Rn[1] to Rn[n]) illustrated in Fig. 9.
[0131] When m reference anode profiles (Rp[1] to Rp[m]) and n reference cathode profiles (Rn[1] to Rn[n]) are combined, a total of m×n pairs exist, which are referred to as the first to m×n-th electrode profile pairs. For example, when m=20 and n=10, the first to 200-th electrode profile pairs can be determined from the electrode profile map.
[0132] The reference anode profile (Rp[i]) and the reference cathode profile (Rn[j]) may be two electrode profiles included in the kth electrode profile pair among the first to m×nth profile pairs. k may be a natural number less than or equal to m×n, and may be equal to ij. For example, when i=3 and j=2, k=6. As another example, when i=2 and j=1, k=2.
[0133] The reference anode profile (Rp[i]) may be a profile representing the correspondence between the anode voltage and anode capacity of a reference cell. The anode voltage of the reference cell refers to the potential difference between the potential of a reference electrode (not shown) and the potential of the anode of the reference cell. The anode profile may also be referred to as an anode half-cell profile.
[0134] The reference cathode profile (Rn[j]) may be a profile representing the correspondence between the cathode voltage and cathode capacity of a reference cell. The cathode voltage of the reference cell refers to the potential difference between the potential of the reference electrode and the potential of the cathode of the reference cell. The cathode profile may also be referred to as a cathode half-cell profile.
[0135] The potential of the reference electrode (not shown) may be, for example, the redox potential of lithium. The anode voltage may be simply referred to as the anode potential, and the cathode voltage may be simply referred to as the cathode potential.
[0136] Each of the positive voltage and negative voltage can be an open circuit voltage (OCV) or a closed circuit voltage (CCV).
[0137] In this specification, a first electrical stimulus refers to an electrical stimulus that causes a difference between the OCV and CCV of a battery cell that is lower than a reference value, and a second electrical stimulus refers to an electrical stimulus that causes a difference between the OCV and CCV of a battery cell that is higher than a reference value. For example, the first electrical stimulus may be a charge using a first current rate, and the second electrical stimulus may be a charge using a second current rate that is higher than the first current rate. For another example, the first electrical stimulus may be a discharge using the first current rate, and the second electrical stimulus may be a discharge using a second current rate that is higher than the first current rate.
[0138] At least one of the reference positive electrode profile (Rp[i]) and the reference negative electrode profile (Rn[j]) can be aligned along the horizontal axis so that the result of synthesizing a portion of the common capacity range (5 to 50 Ah in FIG. 10) of the two profiles (Rp[i], Rn[j]) matches the reference full-cell profile (R[k]). FIG. 10 illustrates a case where the reference negative electrode profile (Rn[j]) is aligned by shifting to the right, with the starting point (the point corresponding to capacity 0), which is one of the two end points of the reference positive electrode profile (Rp[i]), as the reference point.
[0139] It can be confirmed from Fig. 10 that the ends of the reference anode profile (Rp[i]) and the reference cathode profile (Rn[j]) are misaligned. That is, the capacity range of the reference anode profile (Rp[i]) and the capacity range of the reference cathode profile (Rn[j]) do not match and only partially overlap. Therefore, the reference full-cell profile (R[k]) represents the full-cell voltage of the reference cell in a portion of the capacity range common to the reference anode profile (Rp[i]) and the reference cathode profile (Rn[j]). That is, the reference full-cell profile (R[k]) is an example of a full-cell voltage profile obtained by directly subtracting a portion of the reference cathode profile (Rn[j]) from a portion of the reference anode profile (Rp[i]).
[0140] The reference full-cell profile (R[k]) can represent the correspondence between the full-cell capacity and the full-cell voltage when a new battery cell verified as good is forcibly degraded under arbitrary cycling conditions.
[0141] The reference full-cell profile (R[k]) can represent the correspondence between the voltage and capacity of the reference cell over at least a voltage range of interest (e.g., 3.0 to 4.0 V). The lower and upper limits of the voltage range of interest can be a first set voltage (3.0 V in FIG. 10 ) and a second set voltage (4.0 V in FIG. 10 ).
[0142] The SOC may be set to 0% when the full-cell voltage of any battery cell, including the reference cell, is equal to the first set voltage. The SOC may be set to 100% when the full-cell voltage of any battery cell, including the reference cell, is equal to the second set voltage. According to Fig. 10, the reference cell can reach a fully charged state (SOC 100%) from a fully discharged state (SOC 0%) with a charge capacity of 45 Ah.
[0143] In the present specification, the positive electrode participation start point on the positive electrode profile of any battery cell represents the positive electrode voltage and positive electrode capacity (or positive electrode SOC) when the full cell voltage of the battery cell matches the first set voltage. In addition, the negative electrode participation start point on the negative electrode profile of the battery cell represents the negative electrode voltage and negative electrode capacity (or negative electrode SOC) when the full cell voltage of the battery cell matches the first set voltage. Therefore, the voltage difference between the positive electrode participation start point and the negative electrode participation start point may be equal to the first set voltage.
[0144] Additionally, the positive engagement endpoint on the positive profile of any battery cell represents the positive voltage and positive capacity (or positive SOC) when the full-cell voltage of the battery cell matches the second set voltage. Additionally, the negative engagement endpoint on the negative profile of the battery cell represents the negative voltage and negative capacity (or negative SOC) when the full-cell voltage of the battery cell matches the second set voltage. Therefore, the voltage difference between the positive engagement endpoint and the negative engagement endpoint may be equal to the second set voltage.
[0145] In the present specification, at least one of the positive electrode participation start point and the positive electrode participation end point may be simply referred to as the positive electrode point, and at least one of the negative electrode participation start point and the negative electrode participation end point may be simply referred to as the negative electrode point. In addition, the positive electrode capacity (capacity value) of a specific point on the positive electrode profile of any battery cell may mean the capacity difference between any one of the two end points of the positive electrode profile and the specific point. The positive electrode SOC of a specific point on the positive electrode profile of any battery cell may mean the ratio of the capacity difference between any one of the two end points of the positive electrode profile (e.g., a low-capacity point) and the specific point to the capacity difference between the two end points of the positive electrode profile. The capacity difference between the two end points of the positive electrode profile may be referred to as the total positive electrode capacity.
[0146] Similarly, the negative capacity (capacity value) of a specific point on the negative profile of any battery cell may mean the capacity difference between either one of the two end points of the negative profile (or the positive profile) and the specific point. The negative SOC of a specific point on the negative profile of any battery cell may mean the ratio of the capacity difference between either one of the two end points of the negative profile (e.g., a low-capacity point) and the specific point to the capacity difference between either one of the two end points of the negative profile (or the positive profile). The capacity difference between the two end points of the negative profile may be referred to as the total negative capacity.
[0147] The memory unit (330) may have information indicating voltages of each of a reference positive participation start point (pi0), a reference positive participation end point (pf0), a reference negative participation start point (ni0), and a reference negative participation end point (nf0) recorded in advance. The reference positive participation start point (pi0) and the reference positive participation end point (pf0) are the positive participation start point and the positive participation end point on the reference positive profile (Rp[i]), respectively. The reference negative participation start point (ni0) and the reference negative participation end point (nf0) are the negative participation start point and the negative participation end point on the reference negative profile (Rn[j]), respectively.
[0148] The voltage difference between the reference positive engagement start point (pi0) and the reference negative engagement start point (ni0) may be equal to a first set voltage (e.g., 3.0 V). The voltage difference between the reference positive engagement end point (pf0) and the reference negative engagement end point (nf0) may be equal to a second set voltage (e.g., 4.0 V).
[0149] Figures 11 and 12 are graphs that are referenced to exemplarily explain the process of obtaining a measurement full cell profile of a battery cell.
[0150] The graph illustrated in Figure 11 illustrates an example of the variation in full-cell voltage over time of a target cell due to the intermittent application of a second electrical stimulus. The target cell is a battery cell that is being diagnosed by a battery diagnostic device. The target cell may be a new battery cell that requires verification of whether it is a good product or a battery cell that has deteriorated after being verified as a good product and is no longer a new product.
[0151] Referring to FIG. 11, the processor (320) can control the stimulus application device (301) to intermittently apply a second electrical stimulus to the target cell (BC).
[0152] The procedure for controlling the stimulation application device (301) for diagnosis of the target cell (BC) can be performed during a state change period until the electrical state (e.g., full cell voltage) of the target cell (BC) changes from an initial state (e.g., first set voltage) to a target state (e.g., second set voltage).
[0153] Referring to the graph in Fig. 11, the full-cell voltage of the target cell (BC) shows an upward trend as the sawtooth-shaped deformation is repeated. Each sawtooth-shaped voltage rising segment is generated by the application of the second electrical stimulus, and the voltage falling segment is generated by the cessation of the second electrical stimulus. In other words, each voltage falling segment represents the change in the full-cell voltage of the target cell (BC) over each rest period within the state change period. During each rest period, the target cell (BC) is in a no-load state with neither charging nor discharging.
[0154] During a state change period, the processor (320) may repeatedly record measurements of the current of the target cell (BC) to generate current measurement information. Since the capacity of the target cell (BC) is based on ampere counting of the current measurement, the current measurement information may refer to capacity measurement information.
[0155] The processor (320) may control the stimulation application device (301) to initiate a pause period of the second electrical stimulation whenever a predetermined pause condition is satisfied within the state change period. That is, the procedure for applying the second electrical stimulation may be temporarily suspended when the pause condition is satisfied. For example, at least one of (i) the current integration value changing by a threshold integration value, (ii) the SOC changing by a threshold SOC, and (iii) the time during which the second electrical stimulation is applied reaching a threshold time may be preset as a pause condition. For example, if the total current integration value during the state change period is 40 Ah and the threshold integration value is 2 Ah, a total of 20 pause periods may be provided during the state change period.
[0156] The processor (320) may determine at least one of a critical integration value, a critical SOC, and a critical time based on the buffer capacity, SOH, or the previous diagnosis result of the target cell (BC). At least one of the critical integration value, the critical SOC, and the critical time may have a predetermined positive (or negative) correspondence to the buffer capacity, the SOH, or the previous diagnosis result, and relationship data (data table for idle period control) defining such correspondence may be stored in advance in the memory unit (330). By the predetermined positive (or negative) correspondence, as the buffer capacity, the SOH, or the previous diagnosis result decreases, at least one of the critical integration value, the critical SOC, and the critical time decreases. Consequently, as the target cell (BC) deteriorates over time, the idle periods are provided at shorter time intervals within the state change period, thereby preventing a decrease in the number of data points included in the voltage measurement information representing the temporal change history of the full-cell voltage in the idle periods of the state change period.
[0157] The processor (320) can obtain at least one of a buffer capacity, a SOH, or a critical integration value mapped to a previous diagnosis result, a critical SOC, and a critical time from a data table for rest period control. The processor (320) can control an intermittent application procedure of a second electrical stimulus over a state change period using at least one of a critical integration value, a critical SOC, and a critical time obtained from the data table for rest period control.
[0158] The processor (320) can control the stimulation application device (301) to resume application of the second electrical stimulation when a reference time has elapsed from the start of the pause period of the second electrical stimulation. The reference time may be predetermined to a length of time that allows the polarization caused by the second electrical stimulation to be sufficiently resolved. For example, the reference time, which is the length of the pause period, may be the time required for the polarization to be reduced to 10% or less of the polarization at the start of the pause period.
[0159] In each pause period of the second electrical stimulation, the full-cell voltage of the target cell (BC) is measured at least once. For example, the processor (320) may record the measurement of the full-cell voltage at the end of each pause period of the second electrical stimulation as the OCV of the target cell (BC). In another example, the full-cell voltage may be measured at least three times in each pause period of the second electrical stimulation, and the processor (320) may estimate the OCV of the target cell (BC) for each pause period based on the measurements of the three full-cell voltages for each pause period.
[0160] Accordingly, voltage measurement information can be generated by recording OCV multiple times with a time difference during the state change period. Each OCV point (D) marked in Fig. 11 OCV ) is an example of a data point representing the OCV measurement value of voltage measurement information.
[0161] The inventor of the present invention has recognized through numerous experiments that the voltage measurement information generated in the above-described manner using the second electrical stimulus has a high degree of consistency with the voltage measurement information generated when the first electrical stimulus is actually applied to the target cell (BC).
[0162] From now on, we will explain the advantages of a diagnostic method based on intermittent application of a second electrical stimulus instead of continuous application of a first electrical stimulus.
[0163] Let us assume that the conditions related to the diagnosis of the target cell (BC) are as follows.
[0164] (i) First electrical stimulus = 0.05 C charge
[0165] (ii) Second electrical stimulation = 3.0 C charge
[0166] (iii) Length of rest period of second electrical stimulation = 12 minutes
[0167] (iv) Total capacity change during the state change period = 80% of the buffer capacity (FCC: Full Charge Capacity) of the target cell (BC).
[0168] (v) Critical accumulation value = 3% of the buffer capacity of the target cell (BC)
[0169] Then, the time required for the target cell (BC) to change from the initial state to the target state by continuous application of the first electrical stimulus is 1 / 0.05*80% = 16 hours.
[0170] In comparison, the time required for the target cell (BC) to increase its charge capacity by the critical integration value due to the second electrical stimulation is 0.03 / 3*80% = 0.008 hours. In addition, since a rest period is provided for every 3% increase in charge capacity, a total of 26 rest periods are provided during the state change period. Therefore, the time required for the target cell (BC) to change from the initial state to the target state by intermittent application of the second electrical stimulation is (0.008 hours + 0.2 hours)*26 = 5.4 hours.
[0171] That is, compared to the continuous application method of the first electrical stimulus, the intermittent application method of the second electrical stimulus is advantageous in shortening the acquisition time of the full-cell profile.
[0172] In the graph of Fig. 12, the horizontal axis (X-axis) represents capacity (Ah) and the vertical axis (Y-axis) represents voltage.
[0173] Referring to FIG. 12, the processor (320) can generate a measurement full-cell profile (M) indicating a correspondence between the capacity and voltage (which may be referred to as a 'full-cell voltage') of the target cell (BC) based on the capacity measurement information and voltage measurement information of the target cell (BC). The measurement full-cell profile (M) may be referred to as a QV profile or a Q-OCV profile. The measurement full-cell profile (M) can be used as the 'first profile' of the claims.
[0174] Here, the full-cell voltage is the voltage across both ends of the target cell (BC), and is distinct from the anode voltage and cathode voltage described above. In other words, the full-cell voltage of the target cell (BC) can be said to be the difference between the anode voltage and cathode voltage of the target cell (BC).
[0175] To generate a measurement full cell profile (M), the current measurement information and the voltage measurement information mapped to the state change period can be used.
[0176] In detail, each data point of the current measurement information and the voltage measurement information is indexed in chronological order. Therefore, the processor (320) can generate capacity measurement information by sequentially accumulating the data points of the current measurement information. In addition, the processor (320) can generate a measured full-cell profile (M) by applying a curve fitting algorithm to a set of a plurality of Q-OCV pairs included in the capacity-voltage measurement information, which is a data set in which the capacity measurement information and the voltage measurement information are mapped. The reference full-cell profile (R[k]), the reference positive electrode profile (Rp[i]), the reference negative electrode profile (Rn[j]), and the measured full-cell profile (M) may be polynomials in which the order of the highest order term is predetermined.
[0177] Similar to the reference full-cell profile (R[k]), the measured full-cell profile (M) can represent the correspondence between the capacity and full-cell voltage (e.g., OCV) of the target cell (BC) at least over the voltage range of interest (e.g., 3.0 to 4.0 V).
[0178] As illustrated in Fig. 12, there is a certain degree of difference between the measured full-cell profile (M) and the reference full-cell profile (R[k]). If the reference full-cell profile (R[k]) is appropriately adjusted, the difference with the measured full-cell profile (M) can be reduced.
[0179] Meanwhile, in the graphs of FIGS. 10 and 12, Ah is used as the unit of the horizontal axis, but this unit may be expressed in other forms. For example, instead of Ah, a percentage % indicating SOC (State Of Charge) may be used as the unit of the horizontal axis.
[0180] The processor (320) can generate a plurality of comparison profiles based on a plurality of electrode profiles included in the electrode profile map. Specifically, the processor (320) can generate a plurality of comparison profiles by performing an adjustment operation (which may be referred to as 'profile adjustment logic') for each of the plurality of electrode profiles included in the electrode profile map according to a plurality of adjustment levels.
[0181] The profile adjustment logic may include at least one of a scaling operation and a shifting operation. When the profile adjustment logic is executed, the processor (320) may repeat the adjustment procedure and the synthesis procedure for each of the two electrode profiles (Rp[i], Rn[j]) of the k-th electrode profile pair according to a plurality of adjustment levels to generate a plurality of comparison profiles. The comparison profiles may also be referred to as 'comparative full-cell profiles'. Here, each comparison profile generated from the k-th electrode profile pair may be a full-cell profile synthesized (combined) of two adjusted electrode profiles as adjustment results for each of the reference positive profile (Rp[i]) and the reference negative profile (Rn[j]). That is, when the reference positive profile (R[k]) is a result of subtracting a portion of the reference negative profile (Rn[j]) from a portion of the reference positive profile (Rp[i]), the comparison profile may be a result of subtracting a portion of the adjusted negative profile from a portion of the adjusted positive profile. Each comparison profile may also be referred to as an 'adjusted reference full-cell profile'.
[0182] The processor (320) may be configured to compare each of a plurality of comparison profiles generated from the k-th electrode profile pair with the measured full cell profile (M) to generate k-th profile adjustment data.
[0183]
[0184] The processor (320) may select a comparison profile having a minimum comparison value with the measurement full-cell profile (M) from among a plurality of comparison profiles generated from the kth electrode profile pair (Rp[i], Rn[j]). The processor (320) may determine a comparison value for each of the plurality of comparison profiles with respect to the measurement full-cell profile (M), and determine the kth comparison value to be equal to the minimum value among the plurality of comparison values.
[0185] In this regard, various methods known at the time of filing of the present invention may be employed to determine a comparison value between two profiles. For example, the absolute value integral of the area between the two profiles, MSE (Mean Square Error), or RMSE (Root Mean Square Error) may be used as the comparison value.
[0186] The processor (320) may generate k-th profile adjustment data associated with the k-th electrode profile pair (Rp[i], Rn[j]). The k-th profile adjustment data may include information indicating at least one of the k-th comparison value, the k-th representative profile, the k-th adjusted anode profile, and the k-th adjusted cathode profile. The k-th representative profile is one comparison profile mapped to the minimum comparison value among the plurality of comparison profiles generated from the k-th electrode profile pair (Rp[i], Rn[j]).
[0187] The k-adjusted anode profile and the k-adjusted cathode profile are two adjusted electrode profiles utilized in the synthesis of the k-representative profile. The information representing the k-adjusted anode profile includes the k-adjusted anode profile itself and / or at least one diagnostic factor identifiable from the k-adjusted anode profile. The information representing the k-adjusted cathode profile includes the k-adjusted cathode profile itself and / or at least one diagnostic factor identifiable from the k-adjusted cathode profile.
[0188] When each natural number from 1 to m×n is set to k and the above-described procedures are performed a total of m×n times, first to m×n-th profile adjustment data are generated. Any one of the first to m×n-th profile adjustment data can be selected by the processor (320) as information that most closely represents the current charge / discharge performance (current deterioration state) of the target cell (BC). If the k-th comparison value among the first to m×n-th comparison values is the minimum, the k-th representative profile among the first to m×n-th representative profiles can be used as the 'second profile' in the claims.
[0189] According to this configuration of the present invention, information on the anode profile and cathode profile of the target cell (BC) can be individually and precisely estimated even without disassembling the target cell (BC) or manufacturing it in the form of a three-electrode battery.
[0190] If the target cell (BC) is a new battery cell, the adjusted positive profile and the adjusted negative profile can be analyzed to more easily diagnose whether a defect has occurred in the target cell (BC) and, if so, what type of defect it is.
[0191] If the target cell (BC) is a battery cell in use after being verified as good, the degree to which the target cell (BC) has deteriorated can be determined for each diagnostic item indicating the deterioration status through the adjusted positive profile and the adjusted negative profile.
[0192] Hereinafter, with reference to FIGS. 13 to 18, a profile adjustment logic executed to estimate one of the parameters (diagnostic factors) involved in the current charge / discharge performance of a target cell (BC) will be described.
[0193] FIGS. 13 to 15 are drawings for reference in explaining an example of a procedure for generating a comparison profile used for comparison with a measured full cell profile (M) from a pair of k electrode profiles (Rp[i], Rn[j]).
[0194] The profile adjustment logic to be described with reference to FIGS. 13 to 15 proceeds in the following order: a first routine (see FIG. 13) for setting four points (positive engagement start point, positive engagement end point, negative engagement start point, negative engagement end point) to correspond to a voltage range of interest, a second routine (see FIG. 14) for performing a shifting operation, and a third routine (see FIG. 15) for performing a scaling operation. That is, the profile adjustment logic according to one embodiment of the present invention includes the first to third routines.
[0195] First, referring to Fig. 13, the reference anode profile (Rp[i]) and the reference cathode profile (Rn[j]) are the same as those shown in Fig. 10.
[0196] The processor (320) determines the positive engagement start point (pi), the positive engagement end point (pf), the negative engagement start point (ni), and the negative engagement end point (nf) on the reference positive profile (Rp[i]) and the reference negative profile (Rn[j]).
[0197] Either the positive engagement start point (pi) or the negative engagement start point (ni) depends on the other. For example, the processor (320) may divide the positive voltage range from the start point to the end point (or the second set voltage) which are the two end points of the reference positive profile (Rp[i]) into a plurality of micro-voltage sections, and then set the boundary points of two adjacent micro-voltage sections among the plurality of micro-voltage sections as the positive engagement start points (pi). Each micro-voltage section may have a predetermined size (e.g., 0.01 V). Then, the processor (320) may set the point on the reference negative profile (Rn[j]) that is smaller by the first set voltage (e.g., 3 V) than the positive engagement start point (pi) as the negative engagement start point (ni). As another example, the processor (320) may divide the negative voltage range from the start point to the end point of the reference negative profile (Rn[j]) into a plurality of micro-voltage sections of a predetermined size, and then set the boundary points of two adjacent micro-voltage sections among the plurality of micro-voltage sections as negative engagement start points (ni). Then, the processor (320) may search for a point that is greater than the negative engagement start point (ni) by a first set voltage from the reference positive profile (Rp[i]), and set the searched point as the positive engagement start point (pi).
[0198] Either the positive participation end point (pf) or the negative participation end point (nf) depends on the other. For example, the processor (320) may divide the voltage range from the second set voltage to the end point of the reference positive profile (Rp[i]) into a plurality of micro-voltage sections of a predetermined size, and then set the boundary point of two adjacent micro-voltage sections among the plurality of micro-voltage sections as the positive participation end point (pf). Then, the processor (320) may set the point on the reference negative profile (Rn[j]) that is smaller by the second set voltage (e.g., 4 V) than the positive participation end point (pf) as the negative participation end point (nf). As another example, the processor (320) may divide the negative voltage range from the start point to the end point of the reference negative profile (Rn[j]) into a plurality of micro-voltage sections of a predetermined size, and then set the boundary point of two adjacent micro-voltage sections among the plurality of micro-voltage sections as the negative participation end point (nf). Next, the processor (320) can search for a point that is greater than the negative engagement end point (nf) by a second set voltage from the reference positive profile (Rp[i]) and set the searched point as the positive engagement end point (pf).
[0199] Once the determination of the positive engagement start point (pi), the positive engagement end point (pf), the negative engagement start point (ni), and the negative engagement end point (nf) is completed, the processor (320) shifts at least one of the reference positive profile (Rp[i]) and the reference negative profile (Rn[j]) to the left or right along the horizontal axis.
[0200] Referring to FIG. 14, the processor (320) may shift the reference positive electrode profile (Rp[i]) to the left (low capacity side), shift the reference negative electrode profile (Rn[j]) to the right (high capacity side), or perform both, so that the capacity values on the horizontal axis of the positive electrode participation start point (pi) and the negative electrode participation start point (ni) are identical.
[0201] Alternatively, the processor (320) may shift the reference positive profile (Rp[i]) to the left, shift the reference negative profile (Rn[j]) to the right, or both, so that the capacitance values on the horizontal axis of the positive engagement end point (pf) and the negative engagement end point (nf) match.
[0202] Compared with Fig. 13, Fig. 14 illustrates a situation in which only the reference anode profile (Rp[i]) is shifted to the left to generate an adjusted anode profile (Rp[i]'), and as a result, the capacitance value of the anode participation start point (pi') matches the capacitance value of the cathode participation start point (ni). The adjusted anode profile (Rp[i]') is the result of applying an adjustment procedure for shifting to the left by the voltage difference between the anode participation start point (pi) and the cathode participation start point (ni) to the reference anode profile (Rp[i]). Therefore, the two points (pi, pi') differ only in the capacitance value, and have the same voltage. The two points (pf, pf') also differ only in the capacitance value, and have the same voltage.
[0203] When the adjustment result profiles (Rp[i]', Rn) in which at least one of the reference positive profile (Rp[i]) and the reference negative profile (Rn[j]) is shifted are secured, the processor (320) scales the capacity range of at least one of the adjustment result profiles (Rp[i]', Rn).
[0204] According to the example illustrated in FIG. 14, the processor (320) performs an additional adjustment procedure to contract or expand at least one of the adjusted positive profile (Rp[i]') and the reference negative profile (Rn[j]) along the horizontal axis.
[0205] Referring to FIG. 15, the processor (320) may generate an adjusted bipolar profile (Rp[i]') by shrinking or expanding the adjusted bipolar profile (Rp[i]') so that the size of the capacity range between two points (pi', pf') of the adjusted bipolar profile (Rp[i]') matches the size of the capacity range of the measured full-cell profile (M). At this time, one of the two points (pi', pf') may be fixed. Accordingly, the capacity difference between the two points (pi', pf'') of the adjusted bipolar profile (Rp[i]'') may match the capacity range of the measured full-cell profile (M).
[0206] In addition, the processor (320) may generate an adjusted cathode profile (Rn[j]') by shrinking or expanding the reference cathode profile (Rn[j]) so that the size of the capacity range between two points (ni, nf) of the reference cathode profile (Rn[j]) matches the size of the capacity range of the measured full-cell profile (M). At this time, one of the two points (ni, nf) may be fixed. Accordingly, the capacity difference between the two points (ni, nf') of the adjusted cathode profile (Rn[j]') may match the capacity range of the measured full-cell profile (M).
[0207] In Fig. 15, the adjusted anode profile (Rp[i]'') is a result of shrinking the adjusted anode profile (Rp[i]') shown in Fig. 14, and the adjusted cathode profile (Rn[j]') is a result of expanding the reference cathode profile (Rn[j]) shown in Fig. 14.
[0208] The positive participation endpoint (pf'') on the adjusted positive profile (Rp[i]'') corresponds to the positive participation endpoint (pf) on the adjusted positive profile (Rp[i]'). The negative participation endpoint (nf') on the adjusted negative profile (Rn[j]') corresponds to the negative participation endpoint (nf) on the reference negative profile (Rn[j]).
[0209] The capacity difference between the positive engagement start point (pi') and the positive engagement end point (pf'') of the adjusted positive profile (Rp[i]'') corresponds to the size of the capacity range of the measured full-cell profile (M). Similarly, the capacity difference between the negative engagement start point (ni) and the negative engagement end point (nf') of the adjusted negative profile (Rn[j]') corresponds to the size of the capacity range of the measured full-cell profile (M).
[0210] Additionally, the capacity range by two points (pi', pf'') of the adjusted anode profile (Rp[i]'') matches the capacity range by two points (ni, nf') of the adjusted cathode profile (Rn[j]').
[0211] The processor (320) can generate a comparison profile (S) using the adjusted positive profile (Rp[i]'') and the adjusted negative profile (Rn[j]'). The processor (320) can generate the comparison profile (S) based on voltage difference data between the adjusted positive profile (Rp[i]'') and the adjusted negative profile (Rn[j]'). The voltage difference data can represent a capacity-voltage difference relationship in a common capacity range of the two profiles (Rp[i]'', Rn[j]'). That is, the processor (320) can generate the comparison profile (S) by subtracting a profile between two points (pi, pf') of the adjusted positive profile (Rp[i]'') from a profile between two points (ni, nf') of the adjusted negative profile (Rn[j]').
[0212] The processor (320) can calculate a comparison value between the comparison profile (S) and the measurement full cell profile (M).
[0213] The processor (320) can map at least two of the adjusted positive profile (Rp[i]''), the adjusted negative profile (Rn[j]'), the positive participation start point (pi'), the positive participation end point (pf''), the negative participation start point (ni), the negative participation end point (nf'), the positive scale factor, the negative scale factor, the comparison profile (S), and the comparison value to each other and record them in the memory unit (330).
[0214] The anode scale factor can represent the ratio of the capacity difference between the two ends of the adjusted anode profile (Rp[i]'') to the capacity difference between the two ends of the reference anode profile (Rp[i]). The anode scale factor can represent the ratio of the capacity difference between the two points (pi', pf'') to the capacity difference between the two points (pi0, pf0). Alternatively, the anode scale factor can represent the ratio of the anode capacity difference between the two points (pi', pf'') to the anode capacity difference between the two points (pi0, pf0). Alternatively, the anode scale factor can represent the ratio of the anode SOC difference between the two points (pi', pf'') to the anode SOC difference between the two points (pi0, pf0).
[0215] The cathode scale factor can represent the ratio of the capacity difference between the two ends of the adjusted cathode profile (Rn[j]') to the capacity difference between the two ends of the reference cathode profile (Rn[j]). Alternatively, the cathode scale factor can represent the ratio of the capacity difference between two points (ni, nf') to the capacity difference between two points (ni0, nf0). Alternatively, the cathode scale factor can represent the ratio of the cathode capacity difference between two points (ni, nf') to the cathode capacity difference between two points (ni0, nf0). Alternatively, the cathode scale factor can represent the ratio of the cathode SOC difference between two points (ni, nf') to the cathode SOC difference between two points (ni0, nf0).
[0216] Meanwhile, as described above, when the anode voltage range of the reference anode profile (Rp[i]) is divided into a plurality of micro-voltage sections, the boundary points of two adjacent micro-voltage sections among the plurality of micro-voltage sections can be set as the anode participation start point (pi).
[0217] For example, if the anode voltage range of the reference anode profile (Rp[i]) is divided into 100 microvoltage ranges, there may be 100 boundary points that can be set as anode participation start points (pi). In addition, if the voltage range that is higher than the second set voltage in the reference anode profile (Rp[i]) is divided into 40 microvoltage ranges, there may be 40 boundary points that can be set as anode participation end points (pf). In this case, at least 4000 different comparison profiles can be generated from the kth electrode profile pair (Rp[i], Rn[j]).
[0218] Of course, those skilled in the art will easily understand that as the size of the micro-voltage section decreases, the maximum number of comparison profiles that can be generated increases, and conversely, as the size of the micro-voltage section increases, the maximum number of comparison profiles that can be generated decreases.
[0219] The processor (320) can generate kth profile adjustment data associated with the kth representative profile having the kth comparison value, which is the minimum among the comparison values of the plurality of comparison profiles generated based on the kth electrode profile pair (Rp[i], Rn[j]) as described above. The kth profile adjustment data can be recorded in the memory unit (330).
[0220] FIGS. 16 to 18 are diagrams for reference in explaining another example of a procedure for generating a comparison profile used for comparison with a measured full-cell profile (M) from a pair of k-th electrode profiles (Rp[i], Rn[j]). Note that the embodiments according to FIGS. 16 to 18 are independent from the embodiments according to FIGS. 13 to 15. Therefore, terms or symbols commonly described in describing the embodiments according to FIGS. 13 to 15 and the embodiments according to FIGS. 16 to 18 should be understood as being limited to each embodiment.
[0221] Another example of the profile adjustment logic to be described with reference to FIGS. 16 to 18 proceeds in the order of a fourth routine (see FIG. 16) for performing a scaling operation, a fifth routine (see FIG. 17) for setting four points (positive participation start point, positive participation end point, negative participation start point, negative participation end point), and a sixth routine (see FIG. 18) for performing a shifting operation. That is, the profile adjustment logic according to another embodiment of the present invention includes the fourth to sixth routines.
[0222] Referring to FIG. 16, the processor (320) applies a positive scale factor and a negative scale factor selected from a scaling value range to a reference positive profile (Rp[i]) and a reference negative profile (Rn[j]), respectively, to generate an adjusted positive profile (Rp[i]') and an adjusted negative profile (Rn[j]').
[0223] The scaling value range may be predetermined or may vary depending on the ratio of the size of the capacity range of the measured full-cell profile (M) to the size of the capacity range of the reference full-cell profile (R[k]). For example, when values spaced by 0.1% of the scaling value range (e.g., 90-99%) (i.e., 90%, 90.1%, 90.2%, ... 98.9%, 99%) can be selected as the positive scale factor and the negative scale factor, 91 values can be selected as the positive scale factor and the negative scale factor, respectively. In this case, up to 8,281 adjusted profile pairs can be generated from the kth electrode profile pair (Rp[i], Rn[j]) according to 91 × 91 = 8,281 adjustment levels (combinations of positive scale factors and negative scale factors). A tuned profile pair means a combination of a tuned positive profile and a tuned negative profile.
[0224] Referring to FIG. 16, the adjusted anode profile (Rp[i]') and the adjusted cathode profile (Rn[j]') illustrate the results of applying the anode scale factor and the cathode scale factor as one of multiple adjustment levels to the reference anode profile (Rp[i]) and the reference cathode profile (Rn[j]), respectively.
[0225] When the positive scale factor and negative scale factor are less than 100%, the adjusted positive profile (Rp[i]') is the reference positive profile (Rp[i]) shrunk along the horizontal axis, and the adjusted negative profile (Rn[j]') is also the reference negative profile (Rn[j]) shrunk along the horizontal axis. To facilitate understanding, the starting points of the reference positive profile (Rp[i]) and the reference negative profile (Rn[j]) are fixed, and only the remaining portions are shrunk to the left along the horizontal axis.
[0226] Referring to FIG. 17, the processor (320) determines a positive engagement start point (pi'), a positive engagement end point (pf'), a negative engagement start point (ni'), and a negative engagement end point (nf') on the adjusted positive profile (Rp[i]') and the adjusted negative profile (Rp[i]').
[0227] Either the positive engagement start point (pi') or the negative engagement start point (ni') may depend on the other. Furthermore, either the positive engagement end point (pf') or the negative engagement end point (nf') may depend on the other. Furthermore, either the positive engagement start point (pi') or the positive engagement end point (pf') may be set based on the other.
[0228] That is, when any one of the positive engagement start point (pi'), positive engagement end point (pf'), negative engagement start point (ni') and negative engagement end point (nf') is set, the remaining three points can be automatically set by the size of the capacity range of the first set voltage, the second set voltage and / or the measured full cell profile (M) (e.g., 45 Ah - 5 Ah = 40 Ah in FIG. 12).
[0229] For example, the processor (320) may divide the positive voltage range from the starting point to the ending point (or the second set voltage) of the adjusted positive profile (Rp[i]') into a plurality of micro-voltage sections, and then set the boundary points of two adjacent micro-voltage sections among the plurality of micro-voltage sections as positive engagement start points (pi'). Then, the processor (320) may set a point on the adjusted negative profile (Rn[j]) that is smaller by the first set voltage (e.g., 3 V) than the positive engagement start point (pi') as the negative engagement start point (ni').
[0230] As another example, the processor (320) may divide the negative voltage range from the start point to the end point of the adjusted negative profile (Rn[j]') into a plurality of micro-voltage sections of a predetermined size, and then set the boundary points of two adjacent micro-voltage sections among the plurality of micro-voltage sections as negative engagement start points (ni'). Then, the processor (320) may search for a point that is larger than the negative engagement start point (ni') by a first set voltage from the reference positive profile (Rp[i]), and set the searched point as the positive engagement start point (pi').
[0231] As another example, the processor (320) may divide the voltage range from the second set voltage to the end point of the adjusted positive profile (Rp[i]') into a plurality of micro-voltage sections of a predetermined size, and then set the boundary point of two adjacent micro-voltage sections among the plurality of micro-voltage sections as a positive participation end point (pf'). Then, the processor (320) may search for a point in the adjusted negative profile (Rn[j]') that is smaller than the positive participation end point (pf') by the second set voltage (e.g., 4 V), and set the searched point as a negative participation end point (nf').
[0232] As another example, the processor (320) may divide the negative voltage range from the start point to the end point of the adjusted negative profile (Rn[j]') into a plurality of micro-voltage sections of a predetermined size, and then set the boundary point of two adjacent micro-voltage sections among the plurality of micro-voltage sections as a negative participation end point (nf'). Then, the processor (320) may search for a point that is larger than the negative participation end point (nf') by a second set voltage from the adjusted positive profile (Rp[i]'), and set the searched point as the positive participation end point (pf').
[0233] The processor (320) can additionally determine the remaining three points based on the determined point when any one of the positive participation start point (pi'), the positive participation end point (pf'), the negative participation start point (ni'), and the negative participation end point (nf') is determined.
[0234] For example, when the positive participation start point (pi') is first determined, the processor (320) may set a point on the adjusted positive profile (Rp[i]') that has a capacity value that is greater than the capacity value of the positive participation start point (pi') by the size of the capacity range of the measured full-cell profile (M) as the positive participation end point (pf'). In addition, the processor (320) may search for a point that is lower than the positive participation start point (pi') by a first set voltage from the adjusted negative profile (Rn[j]') and set the searched point as the negative participation start point (ni'). In addition, the processor (320) may set a point on the adjusted negative profile (Rn[j]') that has a capacity value that is greater than the capacity value of the negative participation start point (ni') by the size of the capacity range of the measured full-cell profile (M) as the negative participation end point (nf').
[0235] As another example, when the positive participation end point (pf') is first determined, the processor (320) may set a point on the adjusted positive profile (Rp[i]') that has a capacity value that is smaller by the size of the capacity range of the measured full-cell profile (M) than the capacity value of the positive participation end point (pf') as the positive participation start point (pi'). In addition, the processor (320) may search for a point that is lower by a second set voltage than the positive participation end point (pf') from the adjusted negative profile (Rn[j]') and set the searched point as the negative participation end point (nf'). In addition, the processor (320) may set a point on the adjusted negative profile (Rn[j]') that has a capacity value that is smaller by the size of the capacity range of the measured full-cell profile (M) than the capacity value of the negative participation end point (nf') as the negative participation start point (ni').
[0236] As another example, when the negative participation start point (ni') is determined, the processor (320) may set a point on the adjusted negative profile (Rn[j]') that has a capacity value that is greater than the capacity value of the negative participation start point (ni') by the size of the capacity range of the measured full-cell profile (M) as the negative participation end point (nf'). In addition, the processor (320) may search for a point higher than the negative participation start point (ni') by a first set voltage from the adjusted positive profile (Rp[i]') and set the searched point as the positive participation start point (pi'). In addition, the processor (320) may set a point on the adjusted positive profile (Rp[i]') that has a capacity value that is greater than the capacity value of the positive participation start point (pi') by the size of the capacity range of the measured full-cell profile (M) as the positive participation end point (pf').
[0237] As another example, when the negative participation end point (nf') is determined, the processor (320) may set a point on the adjusted negative profile (Rn[j]') that has a capacity value that is smaller by the size of the capacity range of the measured full-cell profile (M) than the capacity value of the negative participation end point (nf') as the negative participation start point (ni'). In addition, the processor (320) may search for a point higher by a second set voltage than the negative participation end point (nf') from the adjusted positive profile (Rp[i]') and set the searched point as the positive participation end point (pf'). In addition, the processor (320) may set a point on the adjusted positive profile (Rp[i]') that has a capacity value that is smaller by the size of the capacity range of the measured full-cell profile (M) than the capacity value of the positive participation end point (pf') as the positive participation start point (pi').
[0238]
[0239] When the determination of the positive engagement start point (pi'), the positive engagement end point (pf'), the negative engagement start point (ni') and the negative engagement end point (nf') is completed based on the pair of positive scale factors and negative scale factors, the processor (320) may shift at least one of the adjusted positive profile (Rp[i]') and the adjusted negative profile (Rn[j]') to the left or right along the horizontal axis so that the capacity values of the positive engagement start point (pi') and the negative engagement start point (ni') match or so that the capacity values of the positive engagement start point (pf') and the negative engagement start point (nf') match.
[0240] The adjusted cathode profile (Rn[j]'') illustrated in Fig. 18 is only the adjusted cathode profile (Rn[j]') illustrated in Fig. 17 shifted to the right. Accordingly, the capacitance values of the positive engagement start point (pi') and the negative engagement start point (ni'') are matched with each other on the horizontal axis. In this regard, the capacity difference between the positive engagement start point (pi') and the positive engagement end point (pf') is the same as the capacity difference between the negative engagement start point (ni') and the negative engagement end point (nf'). Therefore, when the capacitance values of the positive engagement start point (pi') and the negative engagement start point (ni'') are matched with each other, the capacitance values of the positive engagement end point (pf') and the negative engagement end point (nf') also become matched with each other on the horizontal axis.
[0241] Referring to FIG. 18, the processor (320) can generate a comparison profile (U) using the adjusted positive profile (Rp[i]') and the adjusted negative profile (Rn[j]''). The processor (320) can generate the comparison profile (U) based on voltage difference data between the adjusted positive profile (Rp[i]') and the adjusted negative profile (Rn[j]''). The voltage difference data can represent a capacity-voltage difference relationship in a common capacity range of the two profiles (Rp[i]', Rn[j]''). That is, the processor (320) can generate the comparison profile (U) by subtracting a profile between two points (pi', pf') of the adjusted positive profile (Rp[i]') from a profile between two points (ni'', nf'') of the adjusted negative profile (Rn[j]''). The processor (320) can generate a comparison profile (U) by subtracting a profile between two points (pi', pf') of the adjusted positive profile (Rp[i]') from a profile between two points (ni'', nf'') of the adjusted negative profile (Rn[j]'').
[0242] The processor (320) can calculate a comparison value between the comparison profile (U) and the measured full cell profile (M).
[0243] The processor (320) can map at least two of the adjusted positive profile (Rp[i]'), the adjusted negative profile (Rn[j]'), the positive engagement start point (pi'), the positive engagement end point (pf'), the negative engagement start point (ni''), the negative engagement end point (nf''), the positive scale factor, the negative scale factor, the comparison profile (U), and the comparison value to each other and record them in the memory unit (330).
[0244] As described above, the processor (320) can generate a corresponding comparison profile for each pair of positive and negative scale factors selected from a range of scaling values. Since there are multiple pairs of positive and negative scale factors, it is obvious that multiple comparison profiles will also be generated.
[0245] The processor (320) can generate kth profile adjustment data associated with the kth representative profile having the kth comparison value, which is the minimum among the comparison values of a plurality of comparison profiles generated based on the kth electrode profile pair (Rp[i], Rn[j]). The kth profile adjustment data can be recorded in the memory unit (330).
[0246]
[0247] The processor (320) can obtain at least one diagnostic factor from any one of the first to m×n profile adjustment data (associated with the second profile) mapped to the minimum comparison value.
[0248] In detail, the profile adjustment data associated with the second profile includes at least one of positive state data and negative state data.
[0249] The bipolar state data is based on the adjusted bipolar profile used to generate the second profile. For example, when the comparison profile (S) illustrated in FIG. 15 is determined as the second profile, at least one of the bipolar point (pi'), bipolar point (pf'), bipolar scale factor, and bipolar loading of the adjusted bipolar profile (Rp[i]'') may be included in the bipolar state data as a diagnostic factor. As another example, when the comparison profile (U) illustrated in FIG. 18 is determined as the second profile, at least one of the bipolar point (pi'), bipolar point (pf'), bipolar scale factor, and bipolar loading of the adjusted bipolar profile (Rp[i]') may be included in the bipolar state data as a diagnostic factor.
[0250] The cathode state data is based on the adjusted cathode profile used to generate the second profile. For example, when the comparison profile (S) illustrated in FIG. 15 is determined as the second profile, at least one of the cathode point (ni), the cathode point (nf'), the cathode scale factor, and the cathode loading of the adjusted cathode profile (Rn[i]') may be included in the cathode state data as a diagnostic factor. As another example, when the comparison profile (U) illustrated in FIG. 18 is determined as the second profile, at least one of the cathode point (ni''), the cathode point (nf''), the cathode scale factor, and the cathode loading of the adjusted cathode profile (Rn[j]'') may be included in the cathode state data as a diagnostic factor.
[0251] For reference, when the target cell (BC) is in a new state, the aforementioned profile adjustment logic is executed, so that the values of at least one of the positive engagement start point, positive engagement end point, negative engagement start point, negative engagement end point, positive scale factor, and negative scale factor in the BOL state may already be recorded in the memory unit (330).
[0252] Fig. 19 is a flowchart schematically illustrating a battery management method according to another embodiment of the present invention. The method according to Fig. 19 may be executable by a battery diagnostic device (302).
[0253] In step S1910, the processor (320) acquires, through the data acquisition unit (310), a first profile (see symbol M in FIG. 12) representing a capacity-voltage relationship of a target cell (BC) including an active material having multi-phase characteristics.
[0254] For example, a first profile (M) may be generated in a battery system (1) and then transmitted to a battery diagnostic device (302), and a data acquisition unit (310) may receive the first profile (M) through a communication channel. Alternatively, the data acquisition unit (310) may process capacity-voltage measurement information of a target cell (BC) collected from the battery system (1) to generate the first profile (M).
[0255] In step S1920, the processor (320) generates a plurality of comparison profiles based on a plurality of electrode profiles included in the electrode profile map. That is, as described above with reference to FIGS. 1 to 18, the processor (320) generates a plurality of comparison profiles from each of the first to m×n-th electrode profile pairs by combination of m reference anode profiles (Rp[1] to Rp[m]) and n reference cathode profiles (Rn[1] to Rn[n]). Therefore, the number of comparison profiles generated in step S1920 may be at least twice m×n.
[0256] In step S1930, the processor (320) compares each of the plurality of comparison profiles generated in step S1920 with the first profile, and selects one of the plurality of comparison profiles as the second profile.
[0257] Specifically, the processor (320) generates first to m×n-th profile adjustment data from the first to m×n-th electrode profile pairs (see FIGS. 13 to 15 and / or FIGS. 16 to 18). Then, the processor (320) can select, as a second profile, any one comparison profile having a minimum comparison value among the first to m×n-th comparison values indicated by the first to m×n-th profile adjustment data.
[0258] In step S1940, the processor (320) determines at least one diagnostic factor indicating a deterioration state of the target cell (BC) based on the second profile. In step S1940, the bipolar involvement start point is determined as a diagnostic factor, and other diagnostic factors may be additionally determined.
[0259] Specifically, the processor (320) can determine at least one diagnostic factor indicating the current deterioration state of the target cell (BC) from the profile adjustment data associated with the second profile. For example, if the comparison profile (S) illustrated in FIG. 15 has a minimum comparison value with respect to the first profile (M), then in step S1940, pi' illustrated in FIG. 15 is determined as the diagnostic factor, and pf', ni, or nf', etc., can be determined as additional diagnostic factors. As another example, if the comparison profile (U) illustrated in FIG. 18 has a minimum comparison value with respect to the first profile (M), then pi' illustrated in FIG. 18 is determined as the diagnostic factor, and pf', ni', or nf', etc., can be determined as additional diagnostic factors.
[0260] In step S1950, the processor (320) estimates at least one degradation parameter based on at least one diagnostic factor determined in step S1940. Note that at least one degradation parameter may be included in the profile adjustment data as a diagnostic factor.
[0261] In step S1960, the processor (320) limits at least one of the allowable voltage range and SOC range for the target cell (BC) based on at least one diagnostic factor determined in step S1940. Alternatively or alternatively, the allowable current for the target cell (BC) may also be limited (e.g., adjusted downward).
[0262] The memory unit (330) may store in advance relationship data indicating a predetermined positive or negative correlation between a change level (e.g., increase amount, decrease amount, increase rate, decrease rate) of at least one diagnostic factor from a BOL state and a limit level. That is, as the change level of at least one diagnostic factor increases, at least one of the allowable voltage range and SOC range for the target cell (BC) may be gradually reduced. The reduction in any range means at least one of an increase in the lower limit and a decrease in the upper limit of the range. For example, when the anode capacity (or anode SOC) of the anode participation end point decreases from the value in the BOL state, the upper limit of the voltage range and / or SOC range allowed for the target cell (BC) may be limited to a certain level.
[0263] In step S1970, the processor (320) may transmit the diagnosis result of the target cell (BC) to the battery system (1) using the data acquisition unit (310). The diagnosis result includes at least one diagnostic factor acquired in step S1940, at least one degradation parameter estimated in step S1950, and at least one of the limited voltage range and SOC range in step S1960. The diagnosis result may be output to the user through the battery system (1) as visual and / or auditory information.
[0264] At least one of steps S1950, S1960 and S1970 may be omitted from the method according to FIG. 19.
[0265] A computer-readable medium according to the present invention may store instructions for the diagnostic procedures described with reference to FIGS. 1 to 19. The instructions of the computer-readable medium, when executed by the processor (320), cause the processor (320) to perform at least one of the diagnostic procedures.
[0266] FIG. 20 is a drawing that is referenced to explain the OCV estimation procedure that can be performed in FIG. 19. Referring to FIG. 11 together with FIG. 20, the processor (320) can estimate the OCV for each voltage drop segment based on voltage measurement information for the state change period.
[0267] The symbol 2000 of FIG. 20 is an enlarged example of one of the voltage drop segments illustrated in FIG. 11. The voltage measurement information in a specific voltage drop segment corresponding to a specific rest period includes measurements of full-cell voltages measured three or more times during the specific rest period. One of the measurements of full-cell voltages measured three or more times is D OCV It could be t R t indicates the point in time when the reference time has elapsed from the start of the rest period. R The part up to is a solid line, t R The subsequent parts are separated by dotted lines.
[0268] The processor (320) applies OCV estimation logic to the measurements of the full cell voltage for each idle period, and D for each idle period. OCV It is possible to determine an OCV estimate of a different target cell (BC). Therefore, if a total of X pauses are given during the state change period and the full cell voltage is measured 3 times for each pause, it will be readily understood by those skilled in the art that the voltage measurement information obtained in step S1910 includes 3X full cell voltage measurements, from which X OCV estimates can be determined.
[0269] During the idle period, the full-cell voltage of the target cell (BC) gradually converges toward the OCV corresponding to the SOC of the target cell (BC). The behavior of the full-cell voltage of the target cell (BC) during a specific idle period can be equivalent to the voltage response of a first-order RC circuit as shown in Equation 1 below.
[0270] <Formula 1>
[0271]
[0272] In Equation 1, t is the elapsed time from the start of a particular rest period, V full (t) is the full cell voltage at t, V OCV is the actual OCV, V S is the full cell voltage at the start of a specific rest period, and τ is a time constant determined by the internal resistance and capacitance of the target cell (BC).
[0273] In Equation 1, V full (t) is measurable, so V OCV , V S and τ are unknowns. Since there are three unknowns, V measured at three different timings of a particular rest period full OCV can be estimated based on (t). Equation 2 below can be used to estimate OCV by resting period.
[0274] <Formula 2>
[0275]
[0276] In Equation 2, t1, t2, and t3 are sequential measurement timings of the full cell voltage. The time difference between t1 and t2 may be the same as the time difference between t2 and t3. Meanwhile, in Fig. 20, t R Although t3 is shown as different, t R = t3 may be. In this case, V full (t3) = D OCV .
[0277] The processor (320) calculates V using Equation 2 OCV Same as D OCV_C can be decided.
[0278] The processor (320) measures three full cell voltages (V) per idle period. full (t1), V full (t2), V full (t3)) as a single OCV value (D OCV_C ) can be repeated for all pauses to determine X OCV estimates.
[0279] For reference, D OCV is a measurement of the full-cell voltage at the end of the resting period (before polarization is completely released), whereas D OCV_C is the full cell voltage (i.e., V) when the polarization is completely released. OCV ) is an estimate. Therefore, D OCV_C Go D OCV It can be said to be closer to the actual OCV of the target cell (BC).
[0280] In step S1910, the processor (320) extracts voltage measurement information from the capacity-voltage measurement information, and then calculates the D for each idle period indicated by the voltage measurement information. OCV to D OCV_C The corrected voltage measurement information can be generated by changing (correcting) the X OCV estimates (i.e., D) included in the corrected voltage measurement information. The processor (320) OCV_C ) and a curve fitting logic can be applied to data points based on capacity measurement information to generate a measured full cell profile (M).
[0281] From now on, the deterioration parameters that can be estimated in step S1950 of Fig. 19 will be described. Table 1 below summarizes the deterioration parameters and the formulas that can be used to determine each deterioration parameter.
[0282] Table 1
[0283]
[0284] Each of the variables listed in Table 1 is a diagnostic factor that can be acquired in step S1940. The definitions of the deterioration parameters and variables in Table 1 may be as follows.
[0285] <Deterioration parameters>
[0286] P SOH : The anode SOH (State Of Health) of the target cell (BC)
[0287] N SOH : Cathode SOH of the target cell (BC)
[0288] L SOH : Available lithium SOH of target cell (BC)
[0289] F SOH : Full-cell SOH of the target cell (BC)
[0290] P LOSS : Anode loss rate of target cell (BC)
[0291] N LOSS : Cathode loss rate of target cell (BC)
[0292] L LOSS : Available lithium loss rate of target cell (BC)
[0293] F LOSS : Full cell loss rate of target cell (BC)
[0294] P loading_MOL : Anode loading of the target cell (BC)
[0295] N loading_MOL : Cathode loading of target cell (BC)
[0296]
[0297] As any battery cell deteriorates, at least one of the total positive electrode capacity, total negative electrode capacity, available lithium content, and total full cell capacity of the battery cell may gradually decrease from the value when the battery cell was in the BOL state. The total full cell capacity may represent the capacity difference between the two end points of the full cell profile. For example, the total full cell capacity may mean the full charge capacity (FCC). The available lithium content may represent the total amount of lithium that can contribute to charging and discharging the battery cell. P SOH can represent the retention rate of the total anode capacity. N SOH can represent the retention rate of the total cathode capacity. L SOH can represent the retention rate of available lithium. F SOH can represent the retention rate of the total full cell capacity.
[0298] P SOH and P LOSS The sum of, NSOH and N LOSS The sum of L SOH and L LOSS The sum of, F SOH and F LOSS The sum of each of F can be equal to 1. LOSS is P LOSS and L LOSS may be equal to the sum of
[0299] The positive electrode loading of a battery cell refers to the amount of positive electrode active material per unit area of the positive electrode of the battery cell. The negative electrode loading of a battery cell refers to the amount of negative electrode active material per unit area of the negative electrode of the battery cell. The unit of loading is mAh / cm 2 or mg / cm 2 It can be. In Table 1, P loading_ref represents the standard anode loading, and N loading_ref represents the reference negative electrode loading amount. The reference positive electrode loading amount is predetermined to represent the positive electrode loading amount of a normal battery cell at the time of shipment. The reference negative electrode loading amount is predetermined to represent the negative electrode loading amount of a normal battery cell at the time of shipment.
[0300]
[0301] <variables>
[0302] pi BOL : Anode capacity at the start of anode participation when the target cell (BC) was in BOL state (anode SOC)
[0303] pi MOL : The anode capacity (anode SOC) of the current anode participation starting point of the target cell (BC) (e.g., pi' shown in Fig. 15).
[0304] pf BOL : Anode capacity (anode SOC) at the anode participation end point when the target cell (BC) was in BOL state
[0305] pf MOL : The anode capacity (anode SOC) of the current anode participation end point (e.g., pf'' shown in Fig. 15) of the target cell (BC).
[0306] ni BOL : Cathode capacity (cathode SOC) at the start of cathode participation when the target cell (BC) was in BOL state
[0307] ni MOL : The cathode capacity (cathode SOC) of the current cathode participation starting point of the target cell (BC) (e.g., ni as shown in Fig. 15).
[0308] nf BOL : Cathode capacity (cathode SOC) at the end point of cathode participation when the target cell (BC) was in BOL state
[0309] nf MOL : The negative electrode capacity (negative electrode SOC) of the current negative electrode participation end point (e.g., nf' shown in Fig. 15) of the target cell (BC).
[0310] ps BOL : Bipolar scale factor when the target cell (BC) was in BOL state
[0311] ps MOL : Current bipolar scale factor of the target cell (BC)
[0312] ns BOL : Cathode scale factor when the target cell (BC) was in BOL state
[0313] ns MOL : Current cathode scale factor of the target cell (BC)
[0314]
[0315] The process of determining diagnostic factors using the aforementioned profile adjustment logic can be repeated periodically or aperiodically throughout the life of the target cell (BC). Therefore, when the target cell (BC) is in the MOL state, the diagnostic factors (pi) when it was in the BOL state are BOL , pf BOL , ni BOL , nf BOL , ps BOL , ns BOL ) and at least one of the degradation parameters (P SOH , N SOH , L SOH , FSOH , P LOSS , N LOSS , L LOSS , F LOSS , P loading , N loading ) may already be recorded in the memory unit (330), etc. For example, diagnostic factors (pi BOL , pf BOL , ni BOL , nf BOL , ps BOL , ns BOL ) may be values at the time of shipment of the target cell (BC). In addition, the processor (320) may be configured to determine diagnostic factors (pi) during the entire life of the target cell (BC). MOL , pf MOL , ni MOL , nf MOL , ps MOL , ns MOL ) and / or at least one of the degradation parameters (P SOH , N SOH , L SOH , F SOH , P LOSS , N LOSS , L LOSS , F LOSS , P loading_MOL , N loading_MOL ) can record at least one change history in the memory unit (330).
[0316] ps MOL P proportional to loading_MOL may be included in the profile adjustment data associated with the second profile as a diagnostic factor rather than as a degradation parameter. Similarly, ns MOL N proportional to loading_MOL may be included in the profile adjustment data associated with the second profile as a diagnostic factor rather than as a degradation parameter.
[0317] We will further explain the degradation characteristics by diagnostic factor based on a battery cell containing a cathode active material with multi-phase characteristics, such as manganese-rich.
[0318] P LOSS As the pf increases, the oxygen redox reaction increases, resulting in an increase in the pf MOL This pf BOL can be reduced from pf MOL The decrease of can promote an increase in the anode voltage at the anode participation end point, thereby further increasing the redox reaction of oxygen. Accordingly, the processor (320) is identified by the method of FIG. 19. MOL Based on the decrease of P of the target cell (BC) LOSS It can be diagnosed that the number of pf MOL By reducing the upper limit of the voltage range acceptable to the target cell (BC) in response to the decrease in the anode voltage, the increase in the anode voltage at the anode participation end point can be suppressed, and as a result, the redox reaction of oxygen can be slowed down.
[0319] In the early stage of the BOL state, the manganese redox reaction (Mn-redox) may increase, so that the available lithium amount may increase compared to the time of shipment, and the positive electrode capacity (or positive electrode SOC) at the positive electrode participation start point and the negative electrode capacity (or negative electrode SOC) at the negative electrode participation start point may each decrease compared to the time of shipment. The increase in the available lithium amount may lead to an increase in the total full cell capacity. After the early stage of the BOL state, the increase in the available lithium amount stops. After that, the positive electrode capacity (or positive electrode SOC) at the positive electrode participation start point and the negative electrode capacity (or negative electrode SOC) at the negative electrode participation start point each gradually increase, which is a deterioration indicator that the available lithium amount is decreasing. Therefore, the processor (320) is identified by the method of FIG. 19. MOL increase in and / or ni MOL Based on the increase of L of the target cell (BC) LOSS and N LOSS It can be diagnosed that at least one of them is increasing. In addition, the processor (320) pi MOL increase in and / or niMOL In response to the increase, the upper limit of the voltage range acceptable to the target cell (BC) can be reduced.
[0320] The oxygen-redox and manganese-redox reactions tend to increase together, and thus pi MOL and pf MOL The gap between the liver and kidneys narrows, and P LOSS As it gets bigger, ps MOL and / or P loading_MOL can be reduced. The processor (320) is identified by the method of FIG. 19. MOL and / or P loading_MOL Based on the decrease of P of the target cell (BC) LOSS It can be diagnosed that the number of ps is increasing. In addition, the processor (320) MOL and / or P loading_MOL In response to the decrease in , the upper limit of the voltage range and / or SOC range allowed to the target cell (BC) may be reduced.
[0321] When the negative electrode is exposed to a low potential range by charge and discharge of the target cell (BC), the crystal structure of the negative electrode changes, and the products of side reactions (e.g., solid electrolyte interphase) accumulate on the negative electrode surface, resulting in a decrease in the negative electrode reactivity. That is, N LOSS is decreasing, and thus nf MOL is decreasing. ni MOL The increase of and nf MOL The decrease of ns MOL and / or N loading_MOL It means a decrease in the processor (320). The processor (320) is identified by the method of FIG. 19. MOL , ns MOL and / or N loading_MOL Based on the reduction of N of the target cell (BC) LOSS It can be diagnosed that the number of users is increasing. In addition, the processor (320) is nf MOL , ns MOL and / or N loading_MOLIn response to the decrease in , the upper limit of the voltage range and / or SOC range allowed to the target cell (BC) may be reduced.
[0322] The embodiments of the present invention described above are not implemented only through devices and methods, but may also be implemented through a program that realizes a function corresponding to the configuration of the embodiments of the present invention or a recording medium on which the program is recorded, and such implementation can be easily implemented by an expert in the technical field to which the present invention belongs based on the description of the embodiments described above.
[0323] Although the present invention has been described above with reference to limited embodiments and drawings, the present invention is not limited thereto, and it is obvious that various modifications and variations are possible within the scope of the technical idea of the present invention and the equivalent scope of the patent claims to be described below by a person having ordinary skill in the art to which the present invention pertains.
[0324] In addition, the present invention described above is not limited to the above-described embodiments and the attached drawings, and all or part of each embodiment may be selectively combined and configured so that various modifications can be made, as those skilled in the art can make various substitutions, modifications, and changes within the scope of the technical idea of the present invention.
Claims
1. A data acquisition unit for acquiring a first profile representing a capacity-voltage relationship of a battery cell including an active material having multi-phase characteristics; and A processor for generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map, The above processor, By comparing each of the plurality of comparison profiles with the first profile, one of the plurality of comparison profiles is selected as the second profile, A battery diagnostic device configured to determine a cathode involvement initiation point as a diagnostic factor indicating a deterioration state of the battery cell based on the second profile.
2. In paragraph 1, The electrode profile map includes a plurality of reference anode profiles associated with a plurality of degradation states of the anode of the battery cell, A battery diagnostic device, wherein the active material having the above multi-phase characteristics is included in the positive electrode of the battery cell.
3. In paragraph 2, A battery diagnostic device, wherein at least two of the above-described reference anode profiles are each a deteriorated anode profile representing a capacity-voltage relationship of the anode half-cell.
4. In paragraph 3, The above processor, Determine the comparison value based on at least two reference bipolar profiles above, A battery diagnostic device wherein the above comparison value is greater than the threshold value.
5. In paragraph 1, The above electrode profile map includes a plurality of reference cathode profiles associated with a plurality of degradation states of the cathode of the battery cell, A battery diagnostic device, wherein the active material having the above multi-phase characteristics is included in the negative electrode of the battery cell.
6. In paragraph 5, A battery diagnostic device, wherein at least two of the above-described reference cathode profiles are each a deteriorated cathode profile representing a capacity-voltage relationship of the cathode half-cell.
7. In paragraph 6, The above processor, Determine the comparison value based on at least two reference cathode profiles above, The above comparison value is greater than the threshold value, a battery diagnostic device.
8. In paragraph 1, The above processor, A battery diagnostic device that generates the plurality of comparison profiles by performing adjustment operations for each of the plurality of electrode profiles according to a plurality of adjustment levels.
9. In paragraph 8, The above adjustment operation is, A battery diagnostic device comprising at least one of a scaling operation or a shifting operation based on capacity relationship values of the battery cells.
10. In paragraph 8, The above processor, By comparing each of the above plurality of comparison profiles with the first profile, a plurality of comparison values are determined, A battery diagnostic device, wherein the second profile is associated with the minimum comparison value among the plurality of comparison values.
11. In paragraph 10, The above processor, Generate profile adjustment data associated with the second profile, The above profile adjustment data includes at least one of anode state data based on the adjusted anode profile and cathode state data based on the adjusted cathode profile, The above-mentioned adjusted anode profile and the above-mentioned adjusted cathode profile are generated by adjusting two electrode profiles among the plurality of electrode profiles, A battery diagnostic device, wherein the adjusted positive electrode profile and the adjusted negative electrode profile are used to generate the second profile.
12. In paragraph 11, The above processor, A battery diagnostic device that generates the second profile based on voltage difference data representing the voltage difference between the adjusted positive profile and the adjusted negative profile.
13. In paragraph 11, The above bipolar state data is, A battery diagnostic device comprising: a positive electrode participation start point; and further comprising at least one of a positive electrode participation end point, a positive electrode scale factor, and a positive electrode loading amount.
14. In paragraph 11, The above negative state data is, A battery diagnostic device comprising at least one of a negative electrode participation start point, a negative electrode participation end point, a negative electrode scale factor, and a negative electrode loading amount.
15. In paragraph 1, The above processor, A battery diagnostic device configured to limit at least one of a voltage range and a SOC (State Of Charge) range for the battery cell based on the diagnostic factor.
16. A battery pack comprising a battery diagnostic device according to any one of claims 1 to 15.
17. A battery system including a battery diagnostic device according to any one of claims 1 to 15.
18. A remote diagnostic server including a battery diagnostic device according to any one of claims 1 to 15.
19. A step of obtaining a first profile representing a capacity-voltage relationship of a battery cell including an active material having multi-phase characteristics; A step of generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map; A step of selecting one comparison profile from among the plurality of comparison profiles as the second profile based on the comparison value for the first profile of each of the plurality of comparison profiles; and A battery diagnosis method comprising the step of determining a cathode involvement initiation point as a diagnostic factor indicating a deterioration state of the battery cell based on the second profile.
20. In a computer-readable medium storing commands for diagnosing a battery cell, The above instructions, when executed by the processor, perform the following actions: An operation of obtaining a first profile representing a capacity-voltage relationship of the battery cell including an active material having multi-phase characteristics; An operation of generating a plurality of comparison profiles based on a plurality of electrode profiles included in an electrode profile map; An operation of selecting one comparison profile from among the plurality of comparison profiles as a second profile based on a comparison value for each of the first profiles of the plurality of comparison profiles; and An operation of determining a cathode involvement initiation point as a diagnostic factor indicating a deterioration state of the battery cell based on the second profile; A computer-readable medium that causes the processor to perform the above.
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