Specimen inspection automation system and method for predicting available time slot in specimen inspection automation system

Abstract

The purpose of the present invention is to provide a specimen inspection automation system capable of executing maintenance processing in an operation state. A specimen inspection automation system according to the present invention comprises: a storage unit that stores specimen data relating to a specimen to be inspected; and a control unit. The control unit predicts an available time slot in which the load of the control unit falls below a predetermined level on the basis of at least one of information relating to inspection of the specimen and a used capacity history of the storage unit (see FIG. 2).

Description

Sample testing automation system and method for predicting free time slots in the sample testing automation system

[0001] The present invention relates to a sample testing automation system and a method for predicting free time periods in a sample testing automation system, for example, one having an automatic sample data deletion function.

[0002] In a data processing device for instrumental analysis that performs chemical or physical analysis, there is a technique for avoiding memory leaks and continuously performing stable and highly reliable analysis. Such a technique is described, for example, in Patent Document 1.

[0003] Patent Document 1 states that "when a data processing device for instrumental analysis that performs chemical or physical analysis detects that the available memory capacity has decreased and outputs a restart request, it collects analysis schedule information for the analysis devices, grasps the analysis status of each analysis device, and performs a forced release operation of unused memory areas in the storage device during periods when analysis is not being performed."

[0004] Japanese Patent Application Laid-Open No. 2007-010357

[0005] However, with conventional technology, it was necessary to shut down the equipment to perform maintenance. For example, performing maintenance during a time when the equipment is under heavy load could cause problems with operation, so shutting down the equipment was necessary to ensure that the equipment's operation was not affected.

[0006] The data processing device for equipment analysis described in Patent Document 1 also needs to be restarted when forcibly releasing an unreleased storage area during an idle time slot, which poses a problem in that the device needs to be switched from an operating state to a stopped state in order to perform the forcible release operation (maintenance process).

[0007] SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems of the prior art and to provide a system that can perform maintenance processing while the system is in operation.

[0008] An example of a sample testing automation system according to the present invention comprises: a memory unit that stores sample data relating to samples to be tested; and a control unit, wherein the control unit predicts an idle time period when the load on the control unit will be less than a predetermined amount based on at least one of: - information relating to the testing of samples; and - a usage history of the memory unit.

[0009] In one example of the method for predicting available time slots in a specimen testing automation system according to the present invention, the specimen testing automation system has a memory unit that stores specimen data relating to specimens to be tested, and a control unit, and in the method, the control unit predicts available time slots in which the load on the control unit will be less than a predetermined amount based on at least one of: - information relating to specimen testing; and - a usage history of the storage unit.

[0010] According to the present invention, since the available time slots can be predicted, the maintenance process can be scheduled in the available time slots, thereby making it possible to perform the maintenance process while the equipment is in operation.

[0011] Problems, configurations, and effects other than those described above will become apparent from the following description of the embodiments.

[0012] FIG. 1 is a schematic diagram of a sample testing automation system according to Example 1 of the present invention. FIG. 2 is a flowchart for determining a recommended time period for deleting sample data based on an available time period when the load on the control unit is less than a predetermined amount in Example 1. FIG. 3 is a prediction example of an available time period based on information related to sample testing in Example 1. FIG. 4 is a prediction example of an available time period based on information related to sample testing in Example 1. FIG. 5 is an example of a screen display in Example 1. FIG. 6 is an example of a calculation of a predicted transition of load based on the usage capacity history of a storage unit in Example 2 of the present invention. FIG. 7 is an example of a screen display when setting a designated time in Example 3 of the present invention.

[0013] The present invention will be described in detail with reference to the accompanying drawings. In the following examples, the components (including element steps) are not necessarily essential unless otherwise specified or considered to be obviously essential in principle.

[0014] First Embodiment A first embodiment of the present invention will be described below with reference to FIGS. 1, 2, 3A, 3B, and 4. FIG.

[0015] 1 is a schematic diagram of a specimen testing automation system 1 according to Example 1. The specimen testing automation system 1 is a system for automating tests in hospitals, testing facilities, etc., and the schematic configuration thereof will be described. The specimen testing automation system 1 includes a test information system 2, a system unit 3, a control unit 4, a storage unit 5, and a display unit 6.

[0016] The test information system 2 (which may be called a Laboratory Information System and may be abbreviated as LIS in the drawings) is a system that manages sample data and is connected to the control unit 4 via a communication line 7. For example, when a sample 8 is to be processed in the system unit 3, the test information system 2 transmits a processing request for testing the sample, and the control unit 4 receives the processing request and issues a processing instruction to the system unit 3.

[0017] The system unit 3 performs processing related to the testing of the sample based on the processing instructions. The system unit 3 also sends the processed results to the control unit 4, and the testing information system 2 receives the processed results via the control unit 4.

[0018] The system unit 3 prepares the specimen 8 so that it can be tested by an analyzer (not shown). The specimen testing automation system 1 or the system unit 3 may further include this analyzer. The system unit 3 includes a transport module, a centrifugation module, an open / close valve module, a dispensing module, a barcode affixing module, a transfer module, and a storage module, and each module performs processing to prepare the specimen 8 for analysis. For example, if the specimen 8 is blood, the centrifugation module performs processing to centrifuge the specimen 8 and separate it into serum and blood cells. The dispensing module performs processing to divide and dispense one specimen 8 into smaller portions so that it can be analyzed by multiple analyzers. The system unit 3 may also perform testing of the specimen 8.

[0019] The control unit 4 has a hardware configuration as a known computer, and includes, for example, a calculation means and a storage means. The calculation means includes, for example, a processor, and the storage means includes, for example, a storage medium such as a semiconductor memory device or a magnetic disk device. Some or all of the storage medium may be non-transitory storage media.

[0020] The storage means may store a program, and the processor may execute the program, causing the control unit 4 to perform the functions described in this embodiment.

[0021] The control unit 4 is connected to the system unit 3 via a communication line 7. Based on a processing request from the testing information system 2, the control unit 4 issues processing instructions to the system unit 3 and controls the operation of the system unit 3. The control unit 4 also acquires specimen testing information 9 related to the testing of specimens 8 from the storage unit 5, and based on this, can predict free time periods for the control unit 4 (for example, time periods when the load on the control unit 4 is less than a predetermined amount).

[0022] The storage unit 5 stores sample testing information 9 of the sample testing automation system 1. The sample testing information 9 includes sample data related to samples to be tested. The sample data includes, for example, a sample ID and a patient name for each sample to be tested. The sample data also includes, for each sample that has been tested, the concentration of each component and the date of testing.

[0023] The control unit 4 and the storage unit 5 may be integrated. For example, the storage means of the control unit 4 may constitute the storage unit 5.

[0024] The specimen testing information 9 may include other information. For example, it may include a processing history for each time period. The processing history for each time period may include, for example, the number of specimens 8 processed by the system unit 3 (the number of processings), the number of processing requests sent from the testing information system 2, the number of operations of the control unit 4 by the user, etc.

[0025] The number of processed specimens 8 represents, for example, the number of processed specimens 8 per time period. The number of processing requests transmitted from the testing information system 2 represents, for example, the number of transmissions of information related to processing requests (which may be limited to information requesting the processing of specimens 8) transmitted from the testing information system 2 to the system unit 3 via the control unit 4 per time period.

[0026] The number of times the user operates the control unit 4 represents the number of times the user operates the control unit 4 to input instructions to the system unit 3 for each time period, and includes, as specific examples, the number of times a specified button is clicked in a specified GUI and / or the number of times a value is entered via a specified field in a specified GUI.

[0027] Each time period has a length of, for example, one hour, ie, one day consists of 24 time periods.

[0028] The display unit 6 displays a GUI that can be operated by the user. The GUI accepts operations for controlling the system unit 3 and / or displays information regarding instructions and guidance to the user. For example, the control unit 4 can display, as the analysis result 10, the predicted transitions (graphs and / or numerical values) of the available time slots and loads predicted by the control unit 4.

[0029] 2 is a flowchart for the case where the specimen testing automation system 1 determines a time period for recommending data deletion based on the available time period of the control unit 4. The operation based on the flowchart of FIG. 2 is as follows.

[0030] (S21) The control unit 4 reads past sample test information 9 (for example, up to the most recently executed test process) from the memory unit 5. The control unit 4 also reads the usage capacity history of the memory unit 5 from the memory unit 5. The usage capacity history of the memory unit 5 indicates, for example, the amount or percentage of used space in the memory unit 5 for each time period.

[0031] (S22) The control unit 4 may analyze the input specimen testing information 9 and predict a time period when the load on the control unit 4 will be less than a predetermined amount (hereinafter referred to as an "unavailable time period"). A specific method for predicting an unavailable time period will be described later, but the control unit 4 can predict an unavailable time period based on at least a part of the specimen testing information 9. Furthermore, information relating to multiple items included in the specimen testing information 9 may be combined to improve the accuracy of predicting an unavailable time period.

[0032] The control unit 4 may also analyze the usage history of the storage unit 5 to predict the available time slots.

[0033] In this way, the control unit 4 predicts the available time slots based on at least one of the sample testing information 9 and the usage capacity history of the storage unit 5.

[0034] In this way, time periods during which the load on the control unit 4 is low are calculated. For example, these include time periods during which the specimens 8 are not processed even though the apparatus is in operation, time periods during which the number of times processing requests are sent and received from the testing information system 2 is low, time periods during which the user does not operate the control unit 4, time periods during which the capacity of the memory unit 5 is low, etc.

[0035] The daily system operation hours and available time slots vary depending on the facility (hospital, testing facility, etc.) that uses the sample testing automation system 1. This configuration makes it possible to clarify the operation status of the sample testing automation system 1 in the hospital or testing facility.

[0036] 3A and 3B are examples of predictions of available time slots based on the specimen testing information 9. The horizontal axis represents time, and the vertical axis represents the load on the control unit 4. The load on the control unit 4 indicates, for example, one of the number of processed specimens, the number of processing requests from the testing information system 2, or the number of operations on the control unit 4 by the user. In a modified example, the load on the control unit 4 may indicate the used capacity of the memory unit 5.

[0037] The graphs in Figures 3A and 3B show the trends of data over multiple days, divided by time period, included in the specimen testing information 9. The example in Figure 3A shows three days' worth of data, with each of the three curves corresponding to one day's worth of data. The example in Figure 3B shows the average value of the three days' worth of data.

[0038] If the value on the vertical axis in a certain time period is equal to or less than a predetermined threshold value TH, that time period is determined to be a time period with low load, i.e., an unoccupied time period. For example, in the example of FIG. 3A, if the values ​​on the vertical axis for all days in a certain time period are equal to or less than the threshold value TH, that time period is determined to be an unoccupied time period. FIG. 3A shows unoccupied time periods 31a and 31b. On the other hand, if the value on the vertical axis for any day exceeds the predetermined threshold value TH, the control unit 4 is under high load during that time period, and that time period is determined not to be an unoccupied time period.

[0039] 3B, if the value (average value) on the vertical axis in a certain time period is equal to or less than the threshold value TH, the time period is determined to be an unoccupied time period. Figure 3B shows unoccupied time periods 32a and 32b. On the other hand, if the value on the vertical axis exceeds the predetermined threshold value TH, the control unit 4 is under high load during that time period, and the time period is determined not to be an unoccupied time period.

[0040] As a modified example, the free time slot may be predicted using multiple items among the number of samples to be processed, the number of processing requests from the testing information system 2, the number of operations performed by the user on the control unit 4, and the capacity used in the storage unit 5. For example, a threshold value may be set for each item, and a time slot in which the values ​​of all items are equal to or less than the threshold value may be calculated as the free time slot.

[0041] Since it can be assumed that vacant time slots occur in the same pattern on all days, including past and future, at the same facility, it can be predicted that time slots corresponding to vacant time slots 32a and 32b on past days will also be vacant time slots on future days.

[0042] (S23) The free time slots predicted by the control unit 4 and the load transitions as shown in Figures 3A and 3B are displayed on the display unit 6 as the analysis result 10. In other words, the display unit 6 displays the free time slots and the load transitions.

[0043] 4A and 4B are examples of screen displays. Fig. 4A shows an example of a display screen 41 for the analysis results 10. The display screen 41 displays each predicted free time slot and the load value for each free time slot (for example, the average value for that time slot) as the analysis results 10. This configuration allows the analysis results to be visualized for the user.

[0044] Although FIG. 4A only shows the load values ​​for each free time slot, the display unit 6 can display the load transitions using graphs such as those shown in FIGS. 3A and 3B.

[0045] (S24) The control unit 4 outputs the predicted free time slot as a recommended time slot for data deletion. That is, it is recommended that the control unit 4 delete at least a portion of the data stored in the control unit 4 or the storage unit 5 during the recommended time slot.

[0046] 4(b) is an example of a screen display (output example) on the display unit 6 in S24. A recommended time period screen 42 for data deletion is displayed. In FIG. 4(b), the data content to be deleted is specimen data relating to specimens that have already been tested, but the data to be deleted can be, for example, one or more of the following: - specimen data relating to specimens that have already been tested (for example, data for which testing was completed within 48 hours prior to the time of deletion) - processing requests from the testing information system 2 (for example, data received by the control unit 4 within 48 hours prior to the time of deletion)

[0047] In this way, the control unit 4 recommends deleting at least a portion of the sample data that has been tested and at least a portion of the processing requests for testing samples during the available time slots. By performing such a recommendation process, the available time slots can be effectively used for the deletion process.

[0048] As a modified example, it may be recommended to delete data other than the above.

[0049] (S25) When the recommended time slot screen 42 is displayed, the user can select one or more recommended time slots from the screen. In particular, when the display unit 6 displays multiple predicted available time slots, as in Figures 4(a) and 4(b), the user can appropriately select the available time slot that is most desirable. In the example of Figure 4(b), three recommended time slots are displayed on the recommended time slot screen 42, and it is shown that the user is selecting "21:00 to 23:00" from among them.

[0050] A plurality of available time slots may be selected. In this manner, the control unit 4 receives an input for selecting at least one of the available time slots.

[0051] In S25, if the user selects one or more available time slots (for example, if the "OK" button is operated in the state of FIG. 4(b)), S26 is executed.

[0052] (S26) The control unit 4 determines that the data to be deleted will be automatically deleted during the selected time period, and schedules the data deletion process for the selected time period. The control unit 4 may also schedule a maintenance process, which will be described later. Figure 4(c) is an example of a confirmation screen 44 for the recommended time period. This example shows that the user has selected "21:00 to 23:00."

[0053] If the user does not select any available time slots in S25 (for example, if the "Cancel" button is pressed in the state shown in FIG. 4(b)), the control unit 4 determines not to automatically delete the data to be deleted in any time slots, and omits the execution of S26 and S27.

[0054] (S27) The control unit 4 automatically deletes the data to be deleted during the selected free time slot. For example, the control unit 4 automatically deletes at least a portion of the sample data related to tested samples during the free time slot. With this configuration, the data deletion process can be scheduled during the free time slot, making it possible to execute the data deletion process while the control unit 4 is operating without having to worry about the load on the control unit 4.

[0055] In addition, the control unit 4 may display an implementation information screen 43, as shown in Figure 4 (b), which includes a data deletion implementation history (e.g., the time period when data deletion was last performed) and a data deletion implementation schedule (e.g., the time period when data deletion is scheduled to be performed next).

[0056] The control unit 4 may also execute processes other than data deletion during the selected free time slot. For example, it may execute a predetermined maintenance process. The maintenance process may include, for example, automatic replenishment of consumables. Furthermore, it may also include actual setting change processing when a setting change of the sample testing automation system 1 is planned (for example, when setting parameters have been changed but have not yet been reflected in actual operation).

[0057] With this configuration, maintenance processing can be scheduled during off-peak hours, making it possible to perform maintenance processing in an operating state without worrying about the load on the control unit 4. For example, maintenance processing such as changing system operating conditions, which previously required a transition to a stopped state, can now be performed in an operating state.

[0058] The selection process by the user (S25) may be omitted. In this case, the control unit 4 can automatically execute the data deletion process or maintenance process during any available time slot.

[0059] The above-described configuration allows automatic data deletion and / or maintenance processing to be performed during a predicted idle time period, making it possible to delete data and perform maintenance processing while the system is in operation. This allows, for example, 24-hour operation without the need to shut down the sample testing automation system 1. It also prevents sample data from becoming bloated, maintaining the performance of the control unit 4.

[0060] Furthermore, because automatic deletion is performed during an idle time period, even if the load on the control unit 4 increases due to the deletion process, the maximum load can be kept small.

[0061] [Example 2] In this example, a predicted transition in the capacity used in the storage unit 5 is calculated in S22 based on the capacity used history of the storage unit 5 read in S21 of Example 1. The configuration other than S21 and S22 can be the same as in Example 1. Hereinafter, explanations of parts common to Example 1 may be omitted.

[0062] 5 shows an example of calculation of predicted load transition based on the usage capacity history of the storage unit 5. A calculation method different from that of Example 1 will be described. The horizontal axis indicates time, and the vertical axis indicates the usage capacity rate of the storage unit 5.

[0063] The control unit 4 periodically obtains the history of the capacity used in the storage unit 5 as the capacity used history 51 from the storage unit 5. The control unit 4 predicts the transition of the capacity used based on the capacity used history 51. The prediction can be made, for example, by linearly approximating the capacity used history 51. The linear approximation can be performed using, for example, the least squares method. However, the specific prediction method is not limited to this.

[0064] In this way, the control unit 4 predicts the transition of the usage capacity history 51 of the storage unit 5 and calculates the predicted transition 54. The control unit 4 may display the predicted free time slots and the predicted transition 54 (for example, a graph or numerical values). With this configuration, the user can easily understand the transition of the free capacity of the storage unit 5.

[0065] The control unit 4 calculates a predicted area 52 where the predicted transition 54, i.e., the predicted value of the used capacity, exceeds a predetermined threshold (e.g., 60%). The control unit 4 recommends to the user a time period corresponding to the predicted area 52 as a recommended time period 53 for data deletion.

[0066] Third Embodiment A third embodiment of the present invention will now be described with reference to Fig. 6. Hereinafter, the description of parts common to the first and second embodiments may be omitted.

[0067] The sample testing automation system 1 according to this embodiment is configured so that the user can determine and manually input the deletion time period for sample data.

[0068] 6A and 6B are examples of screen displays for inputting a deletion time period. FIG. 6A shows an example of a display screen for setting a deletion time period. After starting the control unit 4, the user selects a specified time selection field 61 and can input a time period for executing data deletion. In a deletion time period input field 62, the start time 63, stop time 64, and frequency 65 (e.g., execution interval, such as n times a day, daily, weekly, monthly, etc.) of the deletion time period can be input.

[0069] 6B shows an example of a confirmation screen displayed when the settings are complete. Automatic deletion of data is set for the entered time period, and a confirmation message 66 is displayed.

[0070] In this way, the control unit 4 accepts input of a time period for deleting data (for example, at least a portion of the sample data that has been tested and at least a portion of the processing request for testing the sample).

[0071] The above-described configuration allows the user to arbitrarily set the desired data deletion time period. This allows the user to determine the deletion time period so as to avoid the time period during which the user plans to work, thereby providing a specimen testing automation system 1 that does not interfere with the user's work. When the user inputs the deletion time period, the user can refer to the recommended time period (see Example 1) output by the control unit 4, allowing the user to appropriately determine the deletion time period.

[0072] 1...Sample testing automation system 2...Testing information system 3...System section 4...Control section 5...Memory section 6...Display section 7...Communication line 8...Sample 9...Sample testing information (sample data) 10...Analysis results 31a, 31b, 32a, 32b...Available time slots 41...Display screen 42...Recommended time slot screen 43...Implementation information screen 44...Confirmation screen 51...Used capacity history 52...Prediction area 53...Recommended time slot 54...Prediction progress 61...Specified time selection field 62...Deletion time slot input field 63...Start time 64...Stop time 65...Frequency 66...Confirmation message TH...Threshold

Claims

1. A sample testing automation system comprising: a memory unit that stores sample data relating to samples to be tested; and a control unit, wherein the control unit predicts an idle time period during which the load on the control unit will be less than a predetermined amount based on at least one of: - information relating to sample testing; and - a usage history of the memory unit.

2. A specimen testing automation system as described in claim 1, characterized in that the control unit recommends deleting at least a portion of the tested specimen data and at least a portion of the processing requests for specimen testing during the available time slot.

3. A specimen testing automation system as described in claim 1, characterized in that the specimen testing automation system has a display unit that displays the available time periods, the control unit predicts the trend of the usage volume history of the memory unit, and the display unit displays the predicted available time periods and the predicted trend of the usage volume history.

4. A specimen testing automation system according to claim 1, characterized in that said specimen testing automation system has a display unit which displays a plurality of said available time slots.

5. A specimen testing automation system as described in claim 1, characterized in that the control unit automatically deletes at least a portion of the specimen data relating to specimens that have already been tested during the unoccupied time period.

6. A specimen testing automation system as claimed in claim 1, wherein the control unit executes a predetermined maintenance process during the idle time period.

7. A specimen testing automation system as described in claim 4, wherein the control unit receives an input selecting at least one of the plurality of available time slots, and automatically deletes at least a portion of the tested specimen data and at least a portion of the processing requests for specimen testing during the selected available time slot.

8. A specimen testing automation system as described in claim 1, characterized in that the control unit accepts input of a time period for deleting at least a portion of the specimen data that has been tested and at least a portion of the processing requests for specimen testing.

9. A method for predicting an available time slot in a specimen testing automation system, the specimen testing automation system having a memory unit that stores specimen data relating to specimens to be tested, and a control unit, the method being characterized in that the control unit predicts an available time slot during which the load on the control unit will be less than a predetermined amount based on at least one of the following: - information related to specimen testing; and - a usage history of the memory unit.

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