Testing system and testing method for display panel

Abstract

A testing system and testing method for a display panel. The testing system comprises: a driving signal generator (110), a photodetector (120, 220, 320), and a processing assembly (130). The driving signal generator (110) is electrically connected to a panel (100, 200, 300) to be tested, the driving signal generator (110) provides a light-emitting driving signal to said panel (100, 200, 300), and the light-emitting driving signal drives said panel (100, 200, 300) to perform picture refreshing. Said panel (100, 200, 300) which receives the light-emitting driving signal inputs light rays into the photodetector (120, 220, 320), the photodetector (120, 220, 320) receives the light rays generated by said panel (100, 200, 300) to generate a refresh signal, and the refresh signal reflects a change in the luminous intensity of said panel (100, 200, 300) over time. The photodetector (120, 220, 320) is electrically connected to the processing assembly (130), and the photodetector (120, 220, 320) outputs the refresh signal to the processing assembly (130). The processing assembly (130) receives the refresh signal, and obtains display parameters of said panel (100, 200, 300) on the basis of the refresh signal.

Description

Display panel testing system and testing method

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on February 27, 2024, with application number 2024102190659 and invention name “Testing system and testing method for display panel”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present invention relates to the field of display panel manufacturing, and in particular to a display panel testing system and testing method. Background Art

[0003] Light-emitting diode (LED) display panels can display text, images, animations, and videos, and the displayed image can change at any time. The display parameters (including refresh rate and response time) and whether the display panel flickers are important factors in evaluating the quality of the display panel.

[0004] The higher the refresh rate of a display panel, the smoother and more stable the image displayed by the display panel. The shorter the response time of the display panel, the faster the pixel switching speed of the display panel, and the higher the clarity of the image displayed by the display panel. The less screen flickering occurs on the display panel, the higher the quality of the image displayed by the display panel. A display panel with a higher refresh rate and shorter response time can effectively avoid image retention or blurring on the display screen. Less screen flickering on the display panel can effectively improve the quality of the image displayed by the display panel.

[0005] How to obtain the display parameters of the display panel and how to obtain the occurrence of the screen flicker phenomenon of the display panel are urgent problems to be solved in detecting the quality of the light emitting diode display panel.

[0006] Summary of the Invention

[0007] The problem solved by the present invention is how to obtain display parameters of a display panel.

[0008] To solve the above problems, the present invention provides a test system for a display panel, comprising: a drive signal generator, a light detector and a processing component; the drive signal generator is electrically connected to the panel to be tested, and the drive signal generator provides a light-emitting drive signal to the panel to be tested, and the light-emitting drive signal drives the panel to be tested to refresh the screen; the panel to be tested, which receives the light-emitting drive signal, inputs light to the light detector, and the light detector receives the light generated by the panel to be tested and generates a refresh signal, and the refresh signal reflects the change of the light intensity of the panel to be tested over time; the light detector is electrically connected to the processing component, and the light detector outputs the refresh signal to the processing component; the processing component receives the refresh signal and obtains the display parameters of the panel to be tested based on the refresh signal.

[0009] Correspondingly, the present invention also provides a method for testing a display panel, comprising: providing a panel to be tested; providing a light-emitting drive signal to the panel to be tested, wherein the light-emitting drive signal drives the panel to be tested to refresh the screen; receiving light generated by the panel to be tested and generating a refresh signal, wherein the refresh signal reflects the change of the light-emitting intensity of the panel to be tested over time; and obtaining the display parameters of the panel to be tested according to the refresh signal.

[0010] Compared with the prior art, the technical solution of the present invention has the following advantages:

[0011] In the technical solution of the present invention, a display panel testing system includes: a drive signal generator, a light detector, and a processing component. Driven by the light drive signal generated by the drive signal generator, the panel under test refreshes its image. The light detector receives light generated by the panel under test and generates a refresh signal. The processing component obtains the display parameters of the panel under test based on the refresh signal. The light signal emitted by the display panel is converted by the light detector into a current signal, which is analyzed by the processing component to obtain the display parameters. The display parameters of the panel under test can be directly obtained based on the processing component's analysis of the refresh signal.

[0012] In an optional solution of the present invention, a light-emitting positioning assembly can be used to locate a predetermined position to be tested, with the light detector receiving light generated by the position to be tested. The configuration of the light-emitting positioning assembly can determine the refresh rate and response time of a specific position on the panel to be tested, which can provide guidance for subsequent repair of the panel to be tested.

[0013] In an optional embodiment of the present invention, the data processor of the processing component may further obtain an energy spectrum based on at least one of the current signal and voltage signal obtained from the panel under test; and obtain a flicker index of the panel under test based on the energy spectrum to determine the luminous quality of the panel under test. Based on analysis of at least one of the current signal and voltage signal, the processing component determines whether flickering occurs and determines the luminous quality of the panel under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0015] FIG1 is a schematic structural diagram of a first embodiment of a display panel testing system according to the present invention;

[0016] FIG2 shows a functional block diagram of a data processor in the embodiment of the test system for the display panel shown in FIG1 ;

[0017] FIG3 shows a schematic structural diagram of a second embodiment of a display panel testing system according to the present invention;

[0018] FIG4 shows a schematic structural diagram of a third embodiment of a display panel testing system according to the present invention;

[0019] FIG5 is a schematic structural diagram of a fourth embodiment of a display panel testing system according to the present invention;

[0020] FIG6 is a schematic flow chart showing a first embodiment of a method for testing a display panel according to the present invention;

[0021] FIG7 is a schematic flow chart showing the steps of judging the luminous quality of the display panel to be tested in the embodiment of the display panel testing method shown in FIG6 ;

[0022] FIG8 is a schematic flow chart showing the steps of obtaining the position to be tested on the panel to be tested in another embodiment of the method for testing a display panel of the present invention. DETAILED DESCRIPTION

[0023] As can be seen from the background art, the existing technology has the problem of difficulty in obtaining the refresh rate and response time of the display panel.

[0024] To solve the above technical problems, the present invention provides a test system for a display panel, comprising: a drive signal generator, a light detector and a processing component; the drive signal generator is electrically connected to the panel to be tested, and the drive signal generator provides a light-emitting drive signal to the panel to be tested, and the light-emitting drive signal drives the panel to be tested to refresh the screen; the panel to be tested, which receives the light-emitting drive signal, inputs light to the light detector, and the light detector receives the light generated by the panel to be tested and generates a refresh signal, and the refresh signal reflects the change of the light-emitting intensity of the panel to be tested over time; the light detector is electrically connected to the processing component, and the light detector outputs the refresh signal to the processing component; the processing component receives the refresh signal and obtains the display parameters of the panel to be tested according to the refresh signal.

[0025] The technical solution of the present invention converts the light signal emitted by the display panel into a current signal through a light detector, and analyzes it through a processing component to obtain the refresh rate and response time; based on the analysis of the refresh signal by the processing component, the display parameters of the panel to be tested can be directly obtained.

[0026] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0027] 1 , there is shown a schematic structural diagram of a first embodiment of a display panel testing system according to the present invention.

[0028] The display panel test system includes: a drive signal generator 110, a light detector 120, and a processing component 130; the drive signal generator 110 is electrically connected to the panel to be tested and can provide a light-emitting drive signal to the panel to be tested, and the light-emitting drive signal can drive the panel to be tested to refresh the screen; the panel to be tested, which receives the light-emitting drive signal, inputs light to the light detector 120, and the light detector 120 can receive the light generated by the panel to be tested and generate a refresh signal, which can reflect the change of the light intensity of the panel to be tested over time; the light detector 120 is electrically connected to the processing component 130, and the light detector 120 outputs the refresh signal to the processing component 130; the processing component 130 receives the refresh signal and can obtain the display parameters of the panel to be tested based on the refresh signal.

[0029] The specific technical solution of the display panel testing system embodiment will be described in detail below with reference to the accompanying drawings.

[0030] The driving signal generator 110 can generate a light-emitting driving signal, and the panel under test 100 emits light under the driving of the light-emitting driving signal.

[0031] In some embodiments of the present invention, the panel to be tested 100 may be a MicroLED panel. In other embodiments of the present invention, the panel to be tested 100 may be one of an LED panel, an OLED panel, an AMOLED panel, and a MiniLED panel.

[0032] For example, the panel to be tested 100 includes a light-emitting chip (not shown) and a circuit board (not shown), one end of the circuit board is electrically connected to the light-emitting chip, and the other end is electrically connected to the driving signal generator 110. The circuit board can be a flexible circuit board, a rigid circuit board, or a combination of a flexible and rigid circuit board.

[0033] In some embodiments, as shown in FIG1 , the drive signal generator 110 is connected to the panel under test 100 via an optical fiber, providing the light-emitting drive signal to the panel under test 100. The light-emitting drive signal has a preset waveform, and the entire panel under test 100 is driven by the light-emitting drive signal to refresh its image, i.e., to flash and emit light. The waveform of the light-emitting drive signal is related to the intensity and frequency of the flashing light of the panel under test 100. By designing the waveform of the light-emitting drive signal, the flashing frequency and illumination of the panel under test 100 can be controlled.

[0034] It should be noted that the entire panel to be tested 100 drives the light-emitting signal driving line to refresh the screen, that is, flashing light means that when the panel to be tested 100 is powered, and voltage or current is provided to the panel to be tested 100, the entire screen of the panel to be tested 100 is illuminated; when the panel to be tested 100 is not powered, and no voltage or current is provided to the panel to be tested 100, the entire screen of the panel to be tested 100 is off (that is, no light).

[0035] The light detector 120 can receive the light generated by the panel to be tested 100 and perform photoelectric conversion on the light to generate the refresh signal.

[0036] In some embodiments, the light detector 120 may include a photodiode. In other embodiments of the present invention, the light detector may also be other devices capable of converting light signals into electrical signals.

[0037] In some embodiments, the spectral response range of the light detector 120 is adapted to the wavelength range of the light generated by the panel to be tested 100. For example, the wavelength range of the light generated by the panel to be tested 100 is 400nm to 1100nm;

[0038] In some embodiments of the present invention, the testing system may further include: a light-emitting positioning component, which may include: a light collector 141, which may be located in the optical path between the panel to be tested and the light detector 120, and the light collector 141 may transmit the light generated by the position to be tested on the panel to be tested to the light detector 120.

[0039] The light emitting positioning component can locate the light emitting position of the light collected by the light detector 120.

[0040] For example, the light detector 141 of the light emitting positioning assembly is disposed in the light path of the panel under test 100, specifically in the light path between the panel under test 100 and the light detector 120. Light generated by the flashing light of the panel under test 100 is transmitted through the light detector 140 to the light detector 120 and received by the light detector 120.

[0041] The imaging area of ​​the light finder 141 is limited, and the light finder 141 can only transmit the light generated at a preset position on the panel 100 to be tested. The relative position of the light finder 141 and the panel 100 to be tested can reflect the position where the light received by the light detector 120 is emitted.

[0042] In some embodiments, the light finder 141 includes an optical lens, and the light finder 141 images a small area of ​​the panel to be tested at the test position. In other embodiments of the present invention, the light finder can also be other optical components that limit the range of light received by the light detector, such as an aperture.

[0043] As shown in Figure 1, the optical lens of the light finder 141 is located directly above the panel under test at the test position. The optical lens parameters include: focal length FL: 18.00 mm; protruding thread length: 34.30 mm; maximum diameter: 24 mm; mounting thread: RMS / 20.32 mm × 36 TPI; depth of field: 4.40 μm; weight: 80.1 g; parfocal length: 45 mm; depth of focus: 440 μm; field of view: 2.2 mm; magnification: 10X; numerical aperture (NA): 0.25; compatible tube lens: focal length: 180 mm; resolving power: 1.34 μm; working distance: 10.6 mm; field number: 22 mm.

[0044] For example, as shown in FIG1 , the light finder 141 is located directly above the light emitting surface of the panel to be tested 100 , and the projection position of the light finder 141 on the light emitting surface of the panel to be tested 100 is the preset position.

[0045] The processing component 130 may obtain the display parameters of the panel to be tested 100 according to the refresh signal.

[0046] In some embodiments of the present invention, the display parameter includes at least one of a refresh rate and a response time. For example, the display parameter includes the refresh rate and the response time. In other embodiments, the display parameter may also include one of the refresh rate and the response time.

[0047] In some embodiments of the present disclosure, the relative position of the light finder 141 of the optical positioning component in the test system and the panel to be tested 100 corresponds to a preset position; the processing component 130 is electrically connected to the light finder 141, and the processing component 130 can also obtain the position to be tested based on the position of the light finder 141, and the processing component 130 obtains the refresh rate and response time of the position to be tested in the panel to be tested based on the refresh signal.

[0048] In some embodiments, the processing component 130 includes: a signal processor 131, the signal processor 131 is electrically connected to the light detector 120, the light detector 120 inputs the refresh signal to the signal processor 131, and the signal processor 131 can receive the refresh signal and obtain the refresh rate and response time according to the refresh signal.

[0049] For example, as shown in FIG1 , the signal processor 131 is electrically connected to the photodetector 120 and receives a refresh signal generated by the photodetector 120. The signal processor 131 converts the refresh signal into waveform data. The signal processor 131 can also analyze the converted waveform data to obtain the refresh rate and response time of the panel under test 100. For example, the signal processor 131 can be an oscilloscope.

[0050] In some embodiments, the processing component 130 has pre-stored judgment thresholds, which include: a refresh threshold and a time threshold; after obtaining the refresh rate and response time, the processing component 130 also judges the luminous quality of the display panel 100 based on the judgment thresholds.

[0051] For example, the processing component 130 compares the relative sizes of the refresh threshold and the refresh rate. When the refresh rate is greater than the refresh threshold, the processing component 130 determines that the display panel has excellent luminescence; the processing component 130 compares the relative sizes of the time threshold and the response time. When the response time is less than the time threshold, the processing component 130 determines that the display panel has excellent luminescence.

[0052] In a test of the panel 100 in the embodiment shown in FIG1 , the signal processor 131 obtained, based on the converted waveform data, a response time of 20.73 nm for the refresh signal's rising edge and a response time of 24.44 nm for its falling edge. The rising response time is the time it takes for the intensity of the refresh signal's waveform data to rise from 10% to 90%, while the falling response time is the time it takes for the intensity of the refresh signal's waveform data to fall from 90% to 10%.

[0053] In other embodiments of the present invention, after the signal processor 131 converts the refresh signal into waveform data, the response time of the panel to be tested can be directly obtained; in addition, the processing component 130 may further include: an analysis processor, the analysis processor being electrically connected to the signal processor 131 and receiving the waveform data converted by the signal processor 131; the analysis processor analyzing the waveform data and drawing a refresh rate curve; the analysis processor generating a refresh rate curve based on F c =1 / T, and obtain the refresh rate of the panel to be tested, where F c is the refresh rate, in Hz; T is the waveform period of the refresh rate curve, in s.

[0054] It should be noted that in some embodiments of the present invention, the processing component 130 further includes a control processor 133, which is electrically connected to the drive signal generator 110 to control the drive signal generator 110 to generate a light-emitting drive signal. The control processor 133 can change the light-emitting drive signal generated by the drive signal generator 110 to control the light emission of the panel under test 100.

[0055] In addition, in some embodiments of the present invention, the signal processor 131 can also obtain the current signal and voltage signal of the panel to be tested 100, wherein the current signal is suitable for reflecting the relationship between the driving current and time of the panel to be tested, and the voltage signal is suitable for reflecting the relationship between the driving voltage and time of the panel to be tested; the processing component 130 also includes: a data processor 132, the data processor 132 is electrically connected to the signal processor 131, and the signal processor 131 inputs at least one of the obtained current signal and voltage signal of the panel to be tested to the data processor 132, and the data processor 132 judges the luminous quality of the panel to be tested based on at least one of the current signal and voltage signal of the panel to be tested.

[0056] As shown in FIG1 , the drive signal generator 110 and the panel under test 100 are connected via an optical fiber. The signal processor 131 includes a current probe 136, one end of which is electrically connected to the signal processor 131 and the other end of which is coupled to the optical fiber between the drive signal generator 110 and the panel under test 100. The current probe 136 can obtain the current signal generated when the drive signal generator 110 sends the light-emitting drive signal to the panel under test 100, and transmit the current signal to the signal processor 131. In some embodiments, the signal processor 131 is an oscilloscope and can also display the current signal.

[0057] The data processor 132 of the processing component 130 receives one of the current signal and the voltage signal to determine the luminous quality of the panel 100 to be tested.

[0058] In some embodiments of the present invention, the data processor 132 includes: a spectrum element 1321, an index element 1322, and a judgment element 1323; the spectrum element 1321 is electrically connected to the signal processor 131, and obtains an energy spectrum based on one of the current signal and the voltage signal of the panel to be tested; the index element 1322 is electrically connected to the spectrum element 1321, and obtains a flicker index of the panel to be tested based on the energy spectrum; the judgment element 1323 is electrically connected to the index element 1322, and judges the luminous quality of the panel to be tested based on the flicker index and a preset judgment threshold.

[0059] With reference to FIG2 , the spectrum component 1321 is electrically connected to the signal processor 131, receives the current signal provided by the signal processor 131, converts the current signal into a digital signal, and obtains the energy spectrum of the current signal. The index component 1322 is electrically connected to the spectrum component 1321, receives the energy spectrum obtained by the spectrum component 1321, and obtains the flicker index of the panel under test 100 based on the total spectral energy and low-frequency spectral energy in the energy spectrum. The determination component 1323 has a preset flicker threshold. The determination component 1323 compares the flicker index with the flicker threshold to determine the luminous quality of the display panel under test.

[0060] 3 , there is shown a schematic structural diagram of a second embodiment of a display panel testing system according to the present invention.

[0061] The present invention will not be further elaborated on the similarities with the above embodiments. The difference from the above embodiments is that, in some embodiments of the present invention, the light-emitting positioning assembly further includes: an image acquisition mechanism 242, which can capture an image of the panel 200 to be tested, and the image acquisition mechanism 242 is electrically connected to the processing component; the processing component obtains the position to be tested based on the image captured by the image acquisition mechanism 242.

[0062] In order to improve the accuracy of the position to be measured, the image acquisition mechanism 242 captures an image of the panel to be measured 200 to obtain the position to be measured each time during testing.

[0063] The image acquisition mechanism 242 is disposed in the light path of the panel 200 and downstream of the light detector 241 . An image of the position to be tested of the panel 200 is transmitted to the image acquisition mechanism 242 via the light detector 241 .

[0064] For example, as shown in FIG3 , the image acquisition mechanism 242 is an industrial lens, which is a CCD camera or a CMOS camera.

[0065] Furthermore, the image acquisition mechanism 242 is fixed to a lens holder. The lens holder allows adjustment of the height, angle, and other aspects of the image acquisition mechanism 242 relative to the panel under test 200. The light finder 241 is located directly above the panel under test 200; the image acquisition mechanism 242 is located on the side of the light finder 241 away from the panel under test 200.

[0066] In some embodiments of the present invention, the light-emitting positioning component also includes: a first spectroscopic element 243, which is located in the optical path downstream of the light collector 241, and the first spectroscopic element 243 receives the light transmitted by the light collector 241 and divides the received light into two parts, which are respectively transmitted to the light detector 220 and the image acquisition mechanism 242.

[0067] The light collector 241 needs to transmit the image of the position to be measured to the image acquisition mechanism 242, and also needs to transmit the light generated by the position to be measured to the light detector 220; the first spectrometer element 243 can perform spectrometry in the optical path downstream of the light collector 241, so that the optical path downstream of the light collector 241 is divided into two branches respectively heading towards the light detector 220 and the image acquisition mechanism 242, so that the light collector 241 can coaxially transmit the image of the position to be measured and the light generated by the position to be measured.

[0068] For example, as shown in FIG3 , the first beam splitter element 243 includes a beam splitter film. The beam splitter film has a preset beam splitting ratio. The first beam splitter element 243 is a semi-transparent, semi-reflective mirror, meaning that the beam splitter film in the first beam splitter element 243 has a beam splitting ratio of 1:1. The image acquisition mechanism 242 is located in the transmission light path of the first beam splitter element 243, and the light detector 220 is located in the reflection light path of the first beam splitter element 243.

[0069] In some embodiments of the present invention, the light emitting positioning assembly further includes: an illumination light source 244, which provides illumination light to the panel to be tested 200 to illuminate the panel to be tested 200; after the illumination light source 244 is turned on, the image acquisition mechanism 242 takes an image of the panel to be tested 200.

[0070] To reduce environmental interference and improve test accuracy, the test system is set in a darkroom, and the panel 200 is driven to emit light in the darkroom. The illumination light source 244 can illuminate the panel 200 before the panel 200 is driven to emit light, so as to ensure that the image acquisition mechanism 242 can capture the image.

[0071] For example, as shown in FIG3 , the illumination light source 244 can be located on one side of the panel to be tested 200. The illumination light source 244 is disposed close to the panel to be tested 200. The light generated by the illumination light source 244 is directly projected onto the light-emitting surface of the panel to be tested 200 to illuminate the light-emitting surface of the panel to be tested 200.

[0072] It should be noted that, in order to ensure the accuracy of the test, after the image acquisition mechanism 242 takes an image of the panel to be tested 200, the illumination light source 244 is turned off to restore the test environment of the dark room; after the test environment of the dark room is restored, the image acquisition mechanism 242 continues to take images while the display panel 200 is driven to emit light to determine whether the panel to be tested 200 is flickering.

[0073] 4 , there is shown a schematic structural diagram of a third embodiment of a display panel testing system according to the present invention.

[0074] The present invention will not be further elaborated on the similarities with the above embodiments. The difference from the above embodiments is that, in some embodiments of the present invention, the light-emitting positioning assembly further includes an illumination deflection structure, which is located in the light path between the illumination light source 344 and the panel to be tested 300, and can transmit the illumination light so that the illumination light illuminates the panel to be tested.

[0075] The illumination deflection structure deflects the illumination light so that the illumination light can smoothly illuminate the panel to be tested, thereby improving the flexibility of the optical path setting of the test system. The illumination deflection structure can deflect the illumination light toward the light-emitting surface of the panel to be tested 300 to illuminate it.

[0076] In some embodiments, the illumination deflection structure includes: a second beam splitter element 345 , which can receive the illumination light and project at least a portion of the illumination light onto the panel to be tested.

[0077] For example, the second beam splitter 345 is located in the optical path between the illumination light source 344 and the panel to be tested 300, and the second beam splitter 345 reflects part of the illumination light toward the panel to be tested 300. In some embodiments as shown in FIG4 , the second beam splitter 345 is located in the optical path between the first beam splitter 343 and the light extractor 341.

[0078] It should be noted that, in other embodiments of the present invention, the second light splitting element may also be located in the optical path between the light collector and the panel to be tested.

[0079] The second beam splitter element 345 has a beam splitter film. The beam splitter film has a preset beam splitting ratio. The second beam splitter element 345 is a semi-transparent and semi-reflective mirror, that is, the beam splitting ratio of the beam splitter film in the second beam splitter element 345 is 1:1. The panel to be tested 300 is located in the reflective light path of the second beam splitter element 345.

[0080] It should be noted that, in some embodiments shown in FIG. 4 , the second beam splitter element 345 is located between the first beam splitter element 343 and the panel to be tested 300. The illumination light generated by the illumination light source 344 is transmitted through the second beam splitter element 345 and partially reflected toward the panel to be tested 300. An image of the position to be tested on the panel to be tested 300 is transmitted through the light finder 341, sequentially passing through the second beam splitter element 345 and the first beam splitter element 343, and is received by the image acquisition mechanism 342 for image capture. Light generated by the panel to be tested 300, after being driven, is transmitted through the light finder 341. A portion of the light that passes through the second beam splitter element 345 is reflected by the first beam splitter element 343 toward the light detector 320 to obtain display parameters.

[0081] It should be noted that, in some embodiments as shown in Figure 5, the illumination deflection structure also includes: a deflection element 446, which is located in the light path between the illumination light source 444 and the second beam splitter element 445, and the deflection element 446 receives the illumination light and projects the illumination light onto the second beam splitter element 445.

[0082] The provision of the deflection element 446 can further improve the flexibility of the optical path provision of the test system and can make it easier to set the position of the illumination light source. For example, the deflection element 446 includes: at least one of an optical fiber and a reflector. In some embodiments shown in FIG5 , the deflection element 446 is a reflector. The reflective surface of the deflection element 446 has a reflective film, which can improve the reflectivity of the deflection element 446. Specifically, the deflection element 446 can be a plane reflector or a turning prism. In other embodiments, the deflection element can also be an optical fiber. The optical fiber transmits the illumination light generated by the illumination light source to illuminate the panel to be tested.

[0083] In addition, as shown in FIG5 , in some embodiments, the testing system further includes a support housing 490, to which the image acquisition mechanism 442, the light finder 441, the first beam splitter 443, the illumination light source 444, and the illumination deflection structure 446 are all fixed. Fixing multiple components to the same support housing 490 enables integration of multiple components, facilitating system integration.

[0084] The support housing 490 includes a movable platform 491, and the panel to be tested 400 is fixed on the surface of the platform 491. The platform 491 can fix the panel to be tested 400 and can move relative to the light detector 441 to adjust the relative position of the light detector and the panel to be tested 400.

[0085] Correspondingly, the present invention also provides a method for testing a display panel.

[0086] 6 , there is shown a flow chart of an embodiment of a method for testing a display panel according to the present invention.

[0087] The testing method includes: executing step S110 to provide a panel to be tested; executing step S120 to provide a light-emitting drive signal to the panel to be tested, wherein the light-emitting drive signal drives the panel to be tested to refresh the screen; executing step S130 to receive light generated by the panel to be tested and generate a refresh signal, wherein the refresh signal reflects the change in the light-emitting intensity of the panel to be tested over time; and executing step S140 to obtain display parameters of the panel to be tested based on the refresh signal.

[0088] In some embodiments of the present invention, the testing method can be performed by the testing system of the present invention. For the specific technical solutions of the testing method, reference can be made to the embodiments of the testing system of the present invention. In other embodiments of the present invention, the steps of the testing method can also be performed by other testing systems. The technical solutions of the testing method of the present invention are not limited to the testing system in which they are performed.

[0089] The specific technical solution of an embodiment of a method for testing a display panel of the present invention will be described in detail below with reference to the accompanying drawings.

[0090] With reference to FIG. 1 , step S110 is first performed to provide a panel 100 to be tested.

[0091] In some embodiments of the present invention, the panel to be tested 100 may be a MicroLED panel. In other embodiments of the present invention, the panel to be tested 100 may be one of an LED panel, an OLED panel, an AMOLED panel, and a MiniLED panel.

[0092] In some embodiments of the present invention, the step of providing a panel to be tested 100 includes placing the panel to be tested 100 on a movable platform. For example, the panel to be tested 100 includes a light-emitting chip (not shown) and a circuit board (not shown). One end of the circuit board is electrically connected to the light-emitting chip, and the other end is electrically connected to the drive signal generator 110. The circuit board can be a flexible circuit board, a rigid circuit board, or a combination of a flexible and rigid circuit board.

[0093] In some embodiments as shown in FIG. 6 , after providing a panel to be tested 100 , step S101 is performed to obtain a position to be tested on the panel to be tested 100 .

[0094] As shown in FIG1 , in the testing method, light generated at a position to be tested on the panel 100 to be tested is transmitted to the light detector 120 via a light finder 141. The imaging area of ​​the light finder 141 is limited, and the light finder 141 can only transmit light generated at a preset position on the panel 100 to be tested. The relative position of the light finder 141 between the panels 100 to be tested can reflect the position at which the light received by the light detector 120 is emitted.

[0095] In step S101 , in the step of obtaining the position to be measured on the panel to be measured 100 , the position to be measured on the panel to be measured 100 is obtained according to the relative position of the light finder 141 between the panels to be measured 100 .

[0096] For example, as shown in FIG1 , the light finder 141 is located directly above the light emitting surface of the panel to be tested 100 . In the step of obtaining the position to be tested on the panel to be tested 100 , the projection position of the light finder 141 on the light emitting surface of the panel to be tested 100 is the preset position.

[0097] In some embodiments, the panel to be tested is set on a table of a movable carrier; the step of capturing the image of the panel to be tested includes: adjusting the position of the carrier on which the panel to be tested is set on the table, changing the relative position of the light detector 141 between the panels to be tested 100, and thus obtaining the position to be tested on the panel to be tested 100.

[0098] In addition, the step of obtaining the position to be measured on the panel to be measured includes: marking the position to be measured on the panel to be measured. Marking the position to be measured can effectively improve the efficiency of adjusting the position of the stage and facilitate rapid positioning of the position to be measured.

[0099] In some embodiments, in the step of obtaining the positions to be measured on the panel to be measured, the number of the positions to be measured is at least 2. In the step of marking the positions to be measured on the panel to be measured, at least 2 positions to be measured are marked on the panel to be measured.

[0100] 6 , after obtaining the position to be tested on the panel to be tested 100 , step S120 is executed to provide a light-emitting driving signal to the panel to be tested, where the light-emitting driving signal drives the panel to be tested to emit light.

[0101] In some embodiments, as shown in FIG1 , the light-emitting drive signal is provided to the panel under test 100 by a drive signal generator 100 connected to the panel under test 100 via an optical fiber. The light-emitting drive signal has a preset waveform, and the entire panel under test 100 is driven by the light-emitting drive signal to refresh its image, i.e., to flash. The waveform of the light-emitting drive signal is related to the intensity and frequency of the flashing light of the panel under test 100. By designing the waveform of the light-emitting drive signal, the flashing frequency and light emission characteristics of the panel under test 100 can be controlled.

[0102] Then, step S130 is executed to receive the light generated by the panel to be tested and generate a refresh signal. The refresh signal reflects the change of the luminous intensity of the panel to be tested over time.

[0103] As shown in FIG1 , in some embodiments, a light detector 120 receives light generated by the panel under test 100 to generate a refresh signal. The light detector 120 may include a photodiode. In other embodiments of the present invention, the light detector may also be other devices capable of converting optical signals into electrical signals.

[0104] It should be noted that, as shown in FIG. 1 , the light generated by the panel to be tested 100 is transmitted to the light detector 120 via the light collector 141 .

[0105] Then, step S140 is executed to obtain display parameters of the panel to be tested according to the refresh signal.

[0106] In some embodiments of the present invention, in the step of obtaining display parameters of the panel under test, the display parameters include at least one of a refresh rate and a response time. For example, the display parameters include the refresh rate and the response time. In other embodiments, the display parameters may also include one of the refresh rate and the response time.

[0107] As shown in FIG1 , in the step of obtaining the display parameters of the panel under test, the display parameters of the panel under test are obtained by the processing component 130. Specifically, the step of obtaining the refresh rate and response time of the panel under test includes: receiving a refresh signal generated by the light detector 120; converting the refresh signal into waveform data; and analyzing the converted waveform data to obtain the refresh rate and response time of the panel under test 100.

[0108] For example, the refresh signal may be received by an oscilloscope and converted into waveform data, and then the converted waveform data may be analyzed to obtain the refresh rate and response time of the panel to be tested 100 .

[0109] In some embodiments, the step of obtaining the refresh rate and response time of the panel to be tested further includes: judging the luminous quality of the panel to be tested 100 according to a judgment threshold, wherein the judgment threshold includes a refresh threshold and a time threshold.

[0110] For example, the steps of judging the luminous quality of the panel to be tested 100 include: comparing the relative sizes of the refresh threshold and the refresh rate, and when the refresh rate is greater than the refresh threshold, the processing component 130 judges that the display panel has excellent luminescence; comparing the relative sizes of the time threshold and the response time, and when the response time is less than the time threshold, judging that the display panel has excellent luminescence.

[0111] In the embodiment shown in FIG1 , during a test of the panel 100 under test, in the step of obtaining the refresh rate and response time of the panel under test, based on the converted waveform data, the response time during the rising phase of the refresh signal is 20.73 nm, and the response time during the falling phase is 24.44 nm. The rising phase response time is the time it takes for the intensity of the refresh signal waveform data to rise from 10% to 90%, and the falling phase response time is the time it takes for the intensity of the refresh signal waveform data to fall from 90% to 10%.

[0112] In other embodiments of the present invention, in the step of obtaining the refresh rate and response time of the panel to be tested, the response time of the panel to be tested can be directly obtained after being converted into waveform data; in addition, the step of obtaining the refresh rate and response time of the panel to be tested can also include: after converting the waveform data, analyzing the waveform data and drawing a refresh rate curve; c =1 / T, and obtain the refresh rate of the panel to be tested, where F c is the refresh rate, in Hz; T is the waveform period of the refresh rate curve, in s.

[0113] Continuing with reference to Figure 6, in some embodiments of the present invention, the test method of the display panel further includes: after providing a luminous driving signal to the panel to be tested, executing step S150 to obtain at least one of the current signal and the voltage signal of the panel to be tested, wherein the current signal is suitable for reflecting the relationship between the driving current and time of the panel to be tested, and the voltage signal is suitable for reflecting the relationship between the driving voltage and time of the panel to be tested; executing step S160 to judge the luminous quality of the panel to be tested based on at least one of the current signal and the voltage signal of the panel to be tested.

[0114] As shown in FIG1 , the driving signal generator 110 and the panel to be tested 100 are connected via an optical fiber; in the step of obtaining at least one of a current signal and a voltage signal of the panel to be tested, a current probe 136 having an optical fiber coupled at one end between the driving signal generator 110 and the panel to be tested 100 is used to obtain the current signal during the process of the driving signal generator 110 sending the light-emitting driving signal to the panel to be tested 100.

[0115] With reference to Figure 7, in some embodiments, executing step S160 to determine the luminous quality of the panel to be tested includes: executing step S61 to obtain an energy spectrum based on the current signal of the panel to be tested and one of the voltage signals; executing step S62 to obtain a flicker index of the panel to be tested based on the energy spectrum; and executing step S63 to determine the luminous quality of the panel to be tested based on the flicker index and a preset judgment threshold.

[0116] In some embodiments as shown in FIG7 , a current signal obtained by the current probe 136 is received and converted into a digital signal to obtain an energy spectrum of the current signal; a flicker index of the panel to be tested 100 is obtained based on the total spectrum energy and low-frequency spectrum energy in the energy spectrum; and the relative sizes of the flicker index and the flicker threshold are compared to determine the luminous quality of the display panel to be tested.

[0117] Continuing with reference to FIG6 and in combination with reference to FIG8 , in some embodiments of the present invention, executing step S101 to obtain the position to be measured on the panel to be measured includes: executing step S11 to provide illumination light to illuminate the display panel; executing step S12 to illuminate the panel to be measured and then capture an image of the panel to be measured to obtain the position to be measured on the panel to be measured.

[0118] In order to improve the accuracy of the obtained position to be tested, step S12 is executed during each test to obtain the position to be tested by imaging the panel to be tested 200. In addition, in order to reduce environmental interference and improve test accuracy, the steps of the testing method are performed in a darkroom. Therefore, before imaging the panel to be tested 200, step S11 is executed to provide illumination light to illuminate the display panel.

[0119] As shown in FIG5 , in some embodiments, the panel to be tested is placed on a movable table; and the step of capturing an image of the panel to be tested includes adjusting the position of the table on which the panel to be tested is placed to obtain a position of the panel to be tested.

[0120] The platform is movable. By moving the platform, the position of the panel to be tested can be changed. By moving the platform, the position of the panel to be tested can be adjusted, and the relative position between the panel to be tested and the light detector can be changed, thereby obtaining the position of the panel to be tested.

[0121] To ensure test accuracy, after obtaining the test position on the panel to be tested and before providing the light driving signal to the panel to be tested, a darkroom test environment is provided. For example, after capturing an image of the panel to be tested 200, the illumination light source is turned off to restore the darkroom test environment.

[0122] In some embodiments of the present invention, the testing method further includes: after providing a darkroom test environment, continuously capturing images to determine whether the panel under test exhibits screen flicker. Specifically, after turning off the illumination light source to restore the darkroom test environment, the imaging is continuously captured; and based on the imaging results of the continuous capturing, determining whether the panel under test exhibits screen flicker.

[0123] In summary, the display panel testing system includes: a drive signal generator, a light detector, and a processing component. Driven by a light drive signal generated by the drive signal generator, the panel under test emits light. The light detector receives the light generated by the panel under test and generates a refresh signal. The processing component obtains the refresh rate and response time of the panel under test based on the refresh signal. The light signal emitted by the display panel is converted by the light detector into a current signal, which is analyzed by the processing component to obtain the refresh rate and response time. The processing component's analysis of the refresh signal directly determines the response time and refresh rate of the panel under test.

[0124] Furthermore, a preset position to be tested can be located using a light-emitting positioning assembly, with the light detector receiving the light generated by the position to be tested. The configuration of the light-emitting positioning assembly enables the refresh rate and response time of a specific position in the panel to be tested to be determined, which is helpful in providing guidance for the subsequent repair of the panel to be tested. It should be noted that the display panel described above is a microdisplay panel. The microdisplay panel has a very small volume, with length and width dimensions ranging from 500μm to 50,000μm. The light-emitting area of ​​the microdisplay panel is very small, such as 1mm×1mm, 2.64mm×2.02mm, 3mm×5mm, etc. The light-emitting area of ​​the microdisplay panel includes multiple micro-LED pixels arranged in an array. The specific pixel arrangement can be one of 320×240, 640×480, 1600×1200, 1920×1080, or 2560×1440. The size of a single micro-LED pixel ranges from 100nm to 100 microns. In some embodiments, the size of a single micro-LED pixel is between 150 nm and 15 microns. In some embodiments, the size of a single micro-LED pixel can be less than 10 microns.

[0125] A driver backplane is provided on the backside of the micro-LED pixel array. The driver backplane is electrically connected to the micro-LEDs in the micro-LED pixel array. The driver backplane can obtain signals such as image data from the outside world and can control the corresponding micro-LEDs to emit light or not. The driver backplane is a TFT (Thin Film Transistor) board or an IC (Integrated Circuit) board. For example, the driver backplane of the above-mentioned micro-display panel integrates a frame buffer, a column driver circuit, and a row driver circuit. The frame buffer includes a first pixel storage area, and the micro-LED pixel array includes a second pixel storage area. A complete frame of pixel grayscale data from the outside world can first enter the first pixel storage area of ​​the frame buffer. The column driver circuit can load the pixel grayscale data in the first pixel storage area of ​​the frame buffer into the second pixel storage area of ​​the micro-LED pixel array. The row driver circuit can scan the pixel grayscale data in the second pixel storage area and generate a pulse modulation signal to achieve the purpose of displaying different grayscales. When driving multiple micro-LED pixels in the micro-LED pixel array, either a single pixel can be driven independently or multiple pixel units can be driven independently. The specific driving method should not constitute a limitation of this application.

[0126] It should also be noted that the application of the above-mentioned display panel should not constitute a limitation on the application of the technical solution of the present invention.

[0127] It should be noted that relational terms in this document, such as "first" and "second", are used only to distinguish an entity or operation from another entity or operation, and do not require or imply any actual relationship or order between these entities or operations. In addition, the words "include", "have" and "include" and other similar forms are intended to be equivalent in meaning and are open-ended, and one or more items following any of these words are not intended to be an exhaustive list of such one or more items, or to be limited to the listed one or more items.

[0128] As used herein, unless expressly stated otherwise, the term "or" encompasses all possible combinations unless not feasible. For example, if a component is stated to include either A or B, then unless expressly stated otherwise or not feasible, the component may include A, or B, or A and B. As a second example, if a component is stated to include either A, B, or C, then unless expressly stated otherwise or not feasible, the component may include A, or B, or C, or A and B, or A and C, or B and C, or A, B, and C.

[0129] In the foregoing description, embodiments have been described with reference to many specific details, which may vary depending on the implementation. Certain changes and modifications may be made to the described embodiments. Other embodiments will be clear to those skilled in the art in view of the description and practice of the present application disclosed herein. The description and examples are intended to be regarded as merely exemplary, and the true scope and spirit of the present application are indicated by the following claims. The order of steps shown in the accompanying drawings is also intended to be for illustrative purposes only and is not intended to be limited to any particular order of steps. Therefore, it will be understood by those skilled in the art that these steps can be performed in different orders while implementing the same method.

[0130] In the drawings and the specification, exemplary embodiments have been disclosed. However, many variations and modifications may be made to these embodiments. Therefore, although specific terms are employed, they are used in a general and descriptive sense only and not for the purpose of limitation.

[0131] Although the present invention is disclosed as above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be based on the scope defined by the claims.

Claims

1. A display panel testing system, characterized in that: include: driving signal generators, light detectors, and processing components; The driving signal generator is electrically connected to the panel to be tested, and provides a light-emitting driving signal to the panel to be tested, wherein the light-emitting driving signal drives the panel to be tested to refresh the screen; The panel under test that receives the luminous drive signal inputs light to the light detector. The light detector receives the light generated by the panel under test and generates a refresh signal. The refresh signal reflects the change of the luminous intensity of the panel under test over time. The light detector is electrically connected to the processing component and outputs the refresh signal to the processing component. The processing component receives the refresh signal and obtains display parameters of the panel to be tested according to the refresh signal.

2. The display panel testing system according to claim 1, wherein: The display parameters include at least one of a refresh rate and a response time.

3. The display panel testing system according to claim 1, wherein: The light detector includes a photodiode.

4. The display panel testing system according to claim 1, wherein: The processing component includes: a signal processor, the signal processor is electrically connected to the light detector, the light detector inputs the refresh signal to the signal processor, the signal processor receives the refresh signal, and obtains a refresh rate and a response time according to the refresh signal.

5. The display panel testing system according to claim 4, wherein: The signal processor further obtains at least one of a current signal and a voltage signal of the panel to be tested, wherein the current signal is suitable for reflecting the relationship between the driving current and time of the panel to be tested, and the voltage signal is suitable for reflecting the relationship between the driving voltage and time of the panel to be tested; The processing component also includes: a data processor, which is electrically connected to the signal processor, and the signal processor inputs at least one of the current signal and voltage signal of the panel to be tested obtained to the data processor, and the data processor judges the luminous quality of the panel to be tested based on at least one of the current signal and voltage signal of the panel to be tested.

6. The display panel testing system according to claim 5, wherein: The data processor includes: a spectrum element, an index element and a judgment element; The spectrum component is electrically connected to the signal processor, and the spectrum component obtains an energy spectrum according to one of the current signal and the voltage signal of the panel to be tested; The index element is electrically connected to the spectrum element, and the index element obtains the flicker index of the panel to be tested according to the energy spectrum; The judging element is electrically connected to the index element, and the judging element judges the luminous quality of the panel to be tested according to the flicker index and a preset judging threshold.

7. The display panel testing system according to claim 1, wherein: Also includes: A light emitting positioning assembly, the light emitting positioning assembly comprising: a light finder, the light finder being located in the optical path between the panel to be tested and the light detector, the light finder transmitting light generated by the position to be tested on the panel to be tested to the light detector; The processing component is electrically connected to the light finder, and the processing component also obtains the position to be measured according to the position of the light finder.

8. The display panel testing system according to claim 7, wherein: The light finder includes an optical lens.

9. The display panel testing system according to claim 7, wherein: The light emitting positioning component further includes: an image acquisition mechanism, the image acquisition mechanism is configured to capture an image of the panel to be tested, and the image acquisition mechanism is electrically connected to the processing component; The processing component obtains the position to be measured according to the imaging result of the image acquisition mechanism.

10. The display panel testing system according to claim 9, wherein: The light emitting positioning component also includes: a first spectroscopic element, which is located in the optical path downstream of the light collector, and receives the light transmitted by the light collector and divides the received light into two parts, which are respectively transmitted to the light detector and the image acquisition mechanism.

11. The display panel testing system according to claim 9, wherein: The display panel testing system is set in a dark room; The light emitting positioning assembly further includes: an illumination light source, the illumination light source providing illumination light to the panel to be tested so as to illuminate the panel to be tested; After the illumination light source is turned on, the image acquisition mechanism takes an image of the panel to be tested.

12. The display panel testing system according to claim 11, wherein: The light-emitting positioning assembly further includes an illumination deflection structure, which is located in the light path between the illumination light source and the panel to be tested, and transmits the illumination light so that the illumination light illuminates the panel to be tested.

13. The display panel testing system according to claim 12, wherein: The illumination deflection element includes a second beam splitter element, which receives the illumination light and projects at least a portion of the illumination light onto the panel to be tested.

14. The display panel testing system according to claim 13, wherein: The illumination deflection element further includes a deflection element, which is located in the light path between the illumination light source and the second beam splitter element, and receives the illumination light and projects the illumination light onto the second beam splitter element.

15. The display panel testing system according to claim 14, wherein: The deflection element includes at least one of an optical fiber and a reflector.

16. The display panel testing system according to claim 12, wherein: Also includes: The image acquisition mechanism, the light finder, the first light splitting element, the illumination light source and the illumination deflection structure are all fixed to the bracket shell.

17. The display panel testing system according to claim 16, wherein: The support housing includes a movable platform, and the panel to be tested is fixed on the surface of the platform.

18. The display panel testing system according to claim 1, wherein: The panel to be tested includes: at least one of: an LED panel, an OLED panel, an AMOLED panel, a MiniLED panel and a MicroLED panel.

19. The display panel testing system according to claim 8, wherein: The parameters of the optical lens include: focal length: 18.00 mm; maximum diameter: 24 mm; depth of field: 4.40 μm; parfocal distance: 45 mm; depth of focus: 440 μm; field of view: 2.2 mm; magnification: 10X; numerical aperture: 0.25; compatible tube lens: focal length: 180 mm; resolving power: 1.34 μm; working distance: 10.6 mm; field of view number: 22 mm.

20. A method for testing a display panel, characterized in that: include: Provide the panel to be tested; Providing a light-emitting driving signal to the panel to be tested, wherein the light-emitting driving signal drives the panel to be tested to refresh an image; receiving light generated by the panel to be tested and generating a refresh signal, wherein the refresh signal reflects the change of the luminous intensity of the panel to be tested over time; The display parameters of the panel to be tested are obtained according to the refresh signal.

21. The display panel testing method according to claim 20, wherein: In the step of obtaining display parameters of the panel to be tested, the display parameters include at least one of a refresh rate and a response time.

22. The display panel testing method according to claim 20, wherein: Also includes: After providing a panel to be tested and before providing a light-emitting driving signal to the panel to be tested, a position to be tested on the panel to be tested is obtained.

23. The display panel testing method according to claim 22, wherein: The step of obtaining the position to be measured on the panel to be measured includes: providing illumination light to illuminate the panel to be measured; after illuminating the panel to be measured, capturing an image of the panel to be measured to obtain the position to be measured on the panel to be measured.

24. The display panel testing method according to claim 23, wherein: The step of providing a panel to be tested includes: placing the panel to be tested on a table of a movable carrier; The step of capturing an image of the panel to be tested includes adjusting the position of a stage on which the panel to be tested is placed, so as to obtain a position of the panel to be tested.

25. The display panel testing method according to claim 22, wherein: The step of obtaining the position to be measured on the panel to be measured includes: marking the position to be measured on the panel to be measured.

26. The display panel testing method according to claim 23, wherein: Also includes: After obtaining the position to be tested on the panel to be tested and before providing the light-emitting driving signal to the panel to be tested, a darkroom test environment is provided.

27. The display panel testing method according to claim 26, wherein: Also includes: After providing a darkroom test environment, images are continuously taken to determine whether the panel to be tested has screen flicker.

28. The display panel testing method according to claim 20, wherein: Also includes: After providing a light-emitting drive signal to the panel to be tested, obtaining at least one of a current signal and a voltage signal of the panel to be tested, wherein the current signal is suitable for reflecting the relationship between the driving current of the panel to be tested and time, and the voltage signal is suitable for reflecting the relationship between the driving voltage of the panel to be tested and time; The luminous quality of the panel to be tested is judged according to at least one of the current signal and the voltage signal of the panel to be tested.

29. The display panel testing method according to claim 28, wherein: The step of determining the luminous quality of the panel to be tested includes: obtaining an energy spectrum according to one of a current signal and a voltage signal of the panel to be tested; Obtaining a flicker index of the panel to be tested according to the energy spectrum; The luminous quality of the panel to be tested is judged according to the flicker index and a preset judgment threshold.

Images