Beam management air interface OTA test method, system and apparatus, devices and medium

Abstract

The present application belongs to the technical field of communications. Disclosed are a beam management air interface OTA test method, system and apparatus, devices, and a medium. The beam management air interface OTA test method in the embodiments of the present application comprises: a first device groups M configured beams to obtain N groups of beams, M and N being positive integers, and M being greater than or equal to N; and, on the basis of the N groups of beams, the first device executes an OTA test to obtain a test result.

Description

Beam-managed over-the-air (OTA) testing methods, systems, devices, equipment, and media

[0001] Cross-reference to related applications

[0002] This application claims priority to Chinese Patent Application No. 202410923643.7, filed on July 10, 2024, the entire contents of which are incorporated herein by reference. Technical Field

[0003] This application belongs to the field of communication technology, specifically relating to a beam-managed over-the-air (OTA) testing method, system, device, equipment, and medium. Background Technology

[0004] Testing technology is an indispensable part of the research, development, production, and acceptance of mobile communication equipment.

[0005] In related technologies, current beam management OTA testing methods can only simulate a limited number of base station beams. Simulating a larger number of base station beams still faces many challenges. For example, it may require a large number of OTA probes and more expensive testing instruments to simulate more accurate beam management performance in the test area. With the introduction of more complex communication use cases and the use of larger-scale MIMO arrays in the future, accurately simulating a large number of base station beams in the test system is particularly important. The accuracy, cost, and complexity of constructing the test system are the core issues to be addressed. Summary of the Invention

[0006] This application provides a beam-managed over-the-air (OTA) testing method, system, apparatus, equipment, and medium that can save testing costs and reduce the complexity of the testing system.

[0007] In a first aspect, an over-the-air (OTA) testing method for beam management is provided. The method includes: a first device grouping M configured beams into N groups of beams, where M and N are positive integers, and M is greater than or equal to N; and the first device performing OTA testing based on the N groups of beams to obtain test results.

[0008] Secondly, a beam-managed over-the-air (OTA) test system is provided. This system includes an anechoic chamber, a channel simulator, and a base station simulator. The anechoic chamber contains at least one probe and a device under test (DUT). The DUT transmits signals to the at least one probe via radiation. Each probe is connected to the channel simulator via an RF wire, and the channel simulator is connected to the base station simulator. The base station simulator transmits test signals on a target beam from N groups of beams based on beam configuration information. The N groups of beams are obtained by grouping M configured beams. The channel simulator receives the test signals from the base station simulator and processes them based on a preset channel model to simulate a target test environment. At least one probe receives the processed test signals from the channel simulator and transmits them to the target test environment. The DUT receives the test signals in the target test environment, processes them, and obtains test results. These test results are used to evaluate the performance of the DUT under specific channel conditions.

[0009] Thirdly, a beam-managed over-the-air (OTA) testing device is provided, comprising: a processing module; the processing module is used to group M configured beams into N groups of beams, where M and N are positive integers, and M is greater than or equal to N; the processing module is also used to perform OTA testing based on the N groups of beams and obtain test results.

[0010] Fourthly, a communication device is provided, the communication device including a processor and a memory, the memory storing a program or instructions executable on the processor, the program or instructions, when executed by the processor, implementing the steps of the method as described in the first aspect.

[0011] Fifthly, a communication device is provided, including a processor and a communication interface, wherein the processor is used to group M configured beams into N groups of beams, where M and N are positive integers, and M is greater than or equal to N; and to perform OTA testing based on the N groups of beams to obtain test results.

[0012] In a sixth aspect, a readable storage medium is provided, on which a program or instructions are stored, which, when executed by a processor, implement the steps of the method described in the first aspect.

[0013] In a seventh aspect, a chip is provided, the chip including a processor and a communication interface, the communication interface being coupled to the processor, the processor being used to run programs or instructions to implement the method as described in the first aspect.

[0014] Eighthly, a computer program / program product is provided, which is stored in a storage medium and executed by at least one processor to implement the steps of the beam-managed over-the-air (OTA) testing method as described in the first aspect.

[0015] In this embodiment, the first device groups the configured M beams into N groups, where M and N are positive integers, and M is greater than or equal to N. Over-the-air (OTA) testing is then performed on the N groups of beams to obtain the test results. This method, by grouping the beams and then performing OTA testing on the grouped beams, allows OTA testing to be performed on a beam-by-beam basis, simplifying the testing process. Furthermore, it allows for the rational allocation of test resources across beam groups, thereby saving testing costs and reducing the complexity of the testing system. Attached Figure Description

[0016] Figure 1 is a block diagram of a wireless communication system provided in an embodiment of this application;

[0017] Figure 2 is a flowchart illustrating the beam management OTA testing method provided in an embodiment of this application;

[0018] Figure 3 is a schematic diagram of the beam group after beam grouping provided in the embodiment of this application;

[0019] Figure 4 is one of the architectural diagrams of the beam-managed OTA testing system provided in the embodiments of this application;

[0020] Figure 5 is a second schematic diagram of the architecture of the beam-managed OTA testing system provided in the embodiments of this application;

[0021] Figure 6 is a schematic diagram of the architecture of the beam-managed OTA testing system provided in the embodiments of this application (third one).

[0022] Figure 7 is a schematic diagram of the beam-managed OTA testing device provided in an embodiment of this application;

[0023] Figure 8 is a schematic diagram of the structure of the communication device provided in an embodiment of this application;

[0024] Figure 9 is a schematic diagram of the hardware structure of the terminal provided in the embodiment of this application;

[0025] Figure 10 is a schematic diagram of the hardware structure of the network-side device provided in an embodiment of this application. Detailed Implementation

[0026] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0027] The terms "first," "second," etc., used in this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such terms can be used interchangeably where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first" and "second" are generally of the same class, not limited in number; for example, the first object can be one or more. Furthermore, "or" in this application indicates at least one of the connected objects. For example, the scope of protection for "A or B" covers at least three scenarios: Scenario 1: including A but not B; Scenario 2: including B but not A; Scenario 3: including both A and B. In addition, the terms "A and / or B," "at least one of A and B," and "at least one of A or B" also cover at least the above three scenarios. The character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0028] The term "instruction" in this application can be either a direct instruction (or explicit instruction) or an indirect instruction (or implicit instruction). A direct instruction can be understood as one in which the sender explicitly informs the receiver of specific information, the operation to be performed, or the requested result, etc., in the instruction sent. An indirect instruction can be understood as one in which the receiver determines the corresponding information based on the instruction sent by the sender, or makes a judgment and determines the operation to be performed or the requested result, etc., based on the judgment result.

[0029] It is worth noting that the technologies described in this application are not limited to Long Term Evolution (LTE) / LTE-Advanced (LTE-A) systems, but can also be used in other wireless communication systems, such as Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Frequency Division Multiple Access (FDMA), Orthogonal Frequency Division Multiple Access (OFDMA), Single-carrier Frequency-Division Multiple Access (SC-FDMA), or other systems. The terms "system" and "network" in this application are often used interchangeably, and the described technologies can be used with the systems and radio technologies mentioned above, as well as with other systems and radio technologies. The following description describes New Radio (NR) systems for illustrative purposes, and the term NR is used in most of the following description; however, these technologies can also be applied to systems other than NR systems, such as 6th generation (6G) radio systems. th Generation 6G communication system.

[0030] Figure 1 shows a block diagram of a wireless communication system applicable to an embodiment of this application. The wireless communication system includes a terminal 11 and a network-side device 12. The terminal 11 can be a mobile phone, tablet computer, laptop computer, notebook computer, personal digital assistant (PDA), handheld computer, netbook, ultra-mobile personal computer (UMPC), mobile internet device (MID), augmented reality (AR), virtual reality (VR) device, robot, wearable device, flight vehicle, vehicle user equipment (VUE), shipboard equipment, pedestrian user equipment (PUE), smart home (home devices with wireless communication capabilities, such as refrigerators, televisions, washing machines, or furniture), game console, personal computer (PC), ATM, or self-service machine, etc. Wearable devices include: smartwatches, smart bracelets, smart headphones, smart glasses, smart jewelry (smart bracelets, smart chains, smart rings, smart necklaces, smart anklets, smart anklets, etc.), smart wristbands, smart clothing, etc. Among these, in-vehicle devices can also be referred to as in-vehicle terminals, in-vehicle controllers, in-vehicle modules, in-vehicle components, in-vehicle chips, or in-vehicle units, etc. It should be noted that the specific type of terminal 11 is not limited in this application embodiment. Network-side equipment 12 may include access network equipment or core network equipment, wherein access network equipment may also be referred to as Radio Access Network (RAN) equipment, radio access network function, or radio access network unit. Access network equipment may include base stations, Wireless Local Area Network (WLAN) access points (AS), or Wireless Fidelity (WiFi) nodes, etc.The term "base station" can be referred to as Node B (NB), Evolved Node B (eNB), Next Generation Node B (gNB), New Radio Node B (NR Node B), Access Point, Relay Base Station (RBS), Serving Base Station (SBS), Base Transceiver Station (BTS), Radio Base Station, Radio Transceiver, Basic Service Set (BSS), Extended Service Set (ESS), Home Node B (HNB), Home Evolved Node B, Transmit / Receive Point (TRP), or any other suitable term in the relevant field, as long as the same technical effect is achieved. The term "base station" is not limited to any specific technical terminology. It should be noted that this application embodiment only uses a base station in an NR system as an example for description and does not limit the specific type of base station.

[0031] Core network equipment, also known as core network nodes, core network functions, or core network elements, includes, but is not limited to, at least one of the following: Mobility Management Entity (MME), Access and Mobility Management Function (AMF), Session Management Function (SMF), User Plane Function (UPF), Policy Control Function (PCF), Policy and Charging Rules Function (PCRF), Edge Application Server Discovery Function (EASDF), Unified Data Management (UDM), Unified Data Repository (UDR), Home Subscriber Server (HSS), Centralized network configuration (CNC), Network Repository Function (NRF), Network Exposure Function (NEF), Local NEF (or L-NEF), and Binding Support. The core network functions include: BSF (Block Network Function), Application Function (AF), Location Management Function (LMF), Gateway Mobile Location Centre (GMLC), and Network Data Analytics Function (NWDAF). It should be noted that this application embodiment only uses core network equipment in the NR system as an example and does not limit the specific type of core network equipment. If the name of the core network equipment mentioned in this application embodiment changes in subsequent protocol versions (e.g., 6G), it will still be within the scope of protection of this application.

[0032] Optionally, the core network equipment can be implemented by one or more functional modules in a single device, or by multiple devices working together; this application does not specifically limit this. It is understood that the aforementioned functional modules can be network elements in hardware devices, software functional modules running on dedicated hardware, or virtualized functional modules instantiated on a platform (e.g., a cloud platform).

[0033] The following explains the terminology and background technology involved in this application.

[0034] (1) Mobile communication testing

[0035] In the research, development, production, and acceptance of mobile communication equipment, testing technology is an indispensable component. Test objects include base station equipment, terminal equipment, chips, and other communication devices. Mobile communication equipment testing can be divided into three stages based on its different lifecycles and testing objectives: certification testing, R&D testing, and production testing. Certification testing must be conducted by qualified certification organizations. Generally, testing specifications are based on test cases and minimum requirements established by organizations such as 3GPP and GCF. This testing has high requirements for the environment, equipment, and compliance standards, primarily focusing on conformance testing. R&D testing focuses more on whether certain problems arise during the product development process and does not necessarily require verification according to standard test cases. Production testing is automated testing conducted during mass production, focusing more on testing efficiency. Therefore, for wireless communication equipment, testing systems are often costly, complex, and have strict pass requirements and test cases, making it one of the most crucial stages before a product enters the market. Developing a standardized testing process that conforms to specifications is one of the goals that many standards organizations are currently striving for. Currently, 3GPP has discussed and formulated a series of test specifications related to radio frequency conducted tests, radio frequency over-the-air (OTA) tests, and corresponding performance tests. The indicators of concern include radio frequency indicators such as total radiated power, equivalent isotropic sensitivity (EIS), error vector magnitude (EVM), adjacent channel leakage ratio (ACLR), and throughput. Test methods include reflector surface test (CATR), reverberation chamber test (RC), two-stage test (RTS), multi-probe anechoic chamber test (MPAC), etc. 3GPP has also established specifications and standards for baseband-related Radio Resource Management (RRM) and demodulation testing. For different use cases, 3GPP specifies many RRM metrics that need to be tested (TS 38.133). For example, in positioning scenarios, User Equipment (UE) needs to pass test cases under certain conditions and meet specified RSTD, minimum time requirement for UE Rx-Tx time difference, and minimum power requirement for RSRP / RSRPP. For beam prediction use cases, RRM measurement requirements for L1-RSRP are specified.3GPP also specifies the baseband demodulation performance requirements for equipment (TS 38.101-4). For CSI reporting, it specifies the reporting requirements for Channel Quality Indicator (CQI), Precoding Matrix Indicator (PMI), and Rank Indicator (RI) under certain test conditions. Throughout the communication process, baseband testing needs to meet corresponding core requirements, such as interruption and delay requirements.

[0036] (2) OTA testing

[0037] Over-the-air (OTA) testing is a crucial aspect of wireless communication. OTA performance testing, in particular, evaluates the performance of mobile devices in real-world wireless communication environments to ensure a stable and reliable communication experience during actual use.

[0038] Currently, 3GPP has discussed and defined many aspects of AI / ML-based air interface technologies, and the RAN4 working group has discussed test methods and performance requirements for various AI / ML use cases. However, for AI-based beam management use cases, there is currently no clear test method to verify its true performance. Previous test methods are inadequate for AI-based beam management testing, mainly for the following reasons: 1. Previous beam management tests primarily focused on testing in channel environments without spatial characteristics, typically using AWGN or TDL channels. However, such flat channels cannot verify the performance of AI beam management based on spatial characteristics. 2. Current test systems capable of simulating channels with spatial characteristics, such as multi-probe anechoic chamber MPAC systems, would require a large number of probes and higher-specification test instruments for AI beam management testing, leading to greater cost and complexity. Furthermore, the feasibility of such test systems is still unclear.

[0039] The proposed OTA testing method for beam management groups the beams and then performs OTA testing on the grouped beams. This allows for OTA testing on a beam-group basis, simplifying the testing process and enabling the rational allocation of test resources to the beam groups. This saves testing costs and reduces the complexity of the test system. Furthermore, it effectively constructs realistic channel conditions in the test area, thus reasonably and accurately verifying the beam management performance of the device under test while ensuring reduced test system costs and complexity.

[0040] The beam management OTA testing method provided in this application will be described in detail below with reference to the accompanying drawings and through some embodiments and application scenarios.

[0041] In some possible implementations, Figure 2 illustrates an OTA testing method for beam management provided in an embodiment of this application. As shown in Figure 2, the OTA testing method for beam management may include the following steps 201 and 202:

[0042] Step 201: The first device groups the configured M beams into N groups of beams.

[0043] Where M and N are positive integers, and M is greater than or equal to N.

[0044] In some embodiments of this application, the first device can group M beams to obtain N beam groups, and each beam group includes at least one beam.

[0045] It should be noted that each of the N beam groups is a beam group, which can be represented as a beam group.

[0046] In some embodiments of this application, the first device includes, but is not limited to, any one of the following: a test device, a base station, a base station simulator, and a device under test. For example, taking the first device as a test device, the test device can group the configured M beams to obtain N groups of beams.

[0047] In some embodiments of this application, the device under test can be a terminal device or a network-side device.

[0048] In some embodiments of this application, the M beams described above may be beams configured for a second device.

[0049] In some embodiments of this application, the second device described above includes, but is not limited to, any one of the following: a base station, a base station simulator, a comprehensive tester, and a signal source.

[0050] It should be noted that the first device and the second device can be the same device or different devices.

[0051] In some possible implementations, each of the N groups of beams mentioned above corresponds to a set of probe configurations.

[0052] The probe configuration mentioned above includes at least one of the following: number of probes, probe position, and probe power weight.

[0053] For example, a set of probes is configured to correspond to a set of probes, and a set of probes includes at least two probes. Each beam may correspond to a set of probes. A set of probes is used to transmit signals to the device under test in a radiating manner.

[0054] For example, suppose a set of probes includes 10 probes, each of which has its own probe configuration (such as probe position and probe power weight). The probe configuration of the above 10 probes is a set of probe configurations.

[0055] For example, the combined effect of the environment between the probe and the device under test can be used to simulate the wireless environment in which the device under test is located, thereby enabling the device under test to be in a simulated real environment.

[0056] In some embodiments of this application, the spatial characteristics of the target test environment described above are quantified and described by power angular spectrum (PAS) or spatial correlation.

[0057] In some embodiments of this application, the number of probes and the probe positions corresponding to each beam in each of the above-mentioned beam groups are the same.

[0058] For example, for beam group 1 in N beam groups, the active probes selected in beam group 1 are {probe 1, probe 2, ..., probe K}, which correspond to appropriate positions {position 1, position 2, ..., position K} respectively. Each beam in beam group 1 has a corresponding set of probe power weights. The goal is to synthesize the target channel spatial environment, including power angle spectrum or spatial correlation, in the test area where the device under test is located.

[0059] It should be noted that beam group 1 can be represented as beam group 1.

[0060] In some other possible implementations, each of the N groups of beams corresponds to a probe configuration, and the probe configuration includes at least one of the following: probe position and probe power weight.

[0061] For example, one probe configuration corresponds to one probe. Each beam group can correspond to one probe, which is used to transmit signals to the device under test in a radiating manner.

[0062] In some embodiments of this application, the spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, which includes the Layer 1 Reference Signal Received Power (L1-RSRP) of the reference signal corresponding to the transmitted beam.

[0063] In some embodiments of this application, the probe positions corresponding to each beam in each of the above-mentioned beam groups are the same.

[0064] For example, for beam group 1 in N beam groups, the selected active probe is probe 1, i.e., probe 1. Further, the device under test measures the power transmitted by probe 1. The position corresponding to probe 1 is the direction of the angle of arrival of the maximum power on the receiving side in the channel at this time, or the direction of the angle of arrival of the maximum power cluster on the receiving side. Each beam in group 1 corresponds to a power mapping on probe 1.

[0065] Step 202: The first device performs an OTA test based on N sets of beams and obtains the test results.

[0066] In some embodiments of this application, the first device can perform an OTA test on a target beam from N groups of beams and obtain test results. Exemplarily, the target beam can be at least one group of beams from N groups of beams, or at least one beam from N groups of beams.

[0067] In some embodiments of this application, the first device can perform OTA testing on the device under test based on the aforementioned N sets of beams. For example, taking the first device as the test device and the device under test as the terminal, after the test device sends the target beam from the N sets of beams, the terminal receives the target beam, processes the target beam, obtains the test result, and then sends the test result back to the test device.

[0068] In some embodiments of this application, the first device can perform OTA beam measurement or OTA beam prediction on the target beam to obtain test results.

[0069] In some embodiments of this application, the above test results include at least one of the following:

[0070] Identification of the target prediction beam;

[0071] L1-RSRP of the target prediction beam;

[0072] L1-RSRP of the target measurement beam;

[0073] The identifier of the transmit beam selected after beam management is performed;

[0074] L1-RSRP of the transmit beam selected after beam management is performed;

[0075] The identifier of the transmit / receive beam pair selected after beam management is performed;

[0076] Throughput;

[0077] Block Error Rate (BLER);

[0078] Bit error rate (BER);

[0079] Delay;

[0080] Performance information of the device under test;

[0081] Wherein, the number of target predicted beams is greater than or equal to 1 and less than or equal to M, the number of target measured beams is greater than or equal to 1 and less than or equal to M, the number of transmit beams selected after beam management is greater than or equal to 1 and less than or equal to M, and the number of transmit / receive beam pairs selected after beam management is greater than or equal to 1 and less than or equal to M * number of receive beams.

[0082] In some embodiments of this application, the aforementioned target predicted beam is a predicted beam determined after performing OTA beam prediction on the target beam. Further, the aforementioned target predicted beam can be a predicted beam determined based on the measurement results of the target beam.

[0083] In some embodiments of this application, the target measurement beam is the predicted beam obtained after performing OTA beam measurement on the target beam.

[0084] In some embodiments of this application, the transmit beam selected after beam management can be the transmit beam determined after beam management based on the measurement or prediction results of the target beam.

[0085] In some embodiments of this application, the transmit / receive beam pair selected after beam management can be the transmit / receive beam pair determined after beam management based on the measurement or prediction results of the target beam.

[0086] In this embodiment of the application, by performing OTA testing on the target beam in the beam group, the identification of the target predicted beam, the target measurement beam, and the transmit beam selected after beam management are obtained, as well as beam-related information such as the L1-RSRP of the beam. System performance information such as throughput, block error rate, bit error rate, and latency are also obtained. Thus, the effectiveness of beamforming technology and the transmission quality of signals under different beams can be accurately reflected through this information, and the performance of the wireless communication system can be comprehensively evaluated.

[0087] The over-the-air (OTA) testing method for beam management provided in this application involves a first device grouping M configured beams into N groups, where M and N are positive integers, and M is greater than or equal to N. OTA testing is then performed on the N groups of beams to obtain the test results. This method, by grouping beams and then performing OTA testing on the grouped beams, simplifies the testing process by allowing OTA testing to be performed on a beam-by-beam basis. Furthermore, it enables the rational allocation of test resources across beam groups, thereby saving testing costs and reducing the complexity of the testing system.

[0088] In some other possible implementations, the beam management air interface testing method provided in this application embodiment may include the following step 301:

[0089] Step 301: The first device performs an OTA test based on N sets of beams and obtains the test results.

[0090] In some embodiments of this application, the above-mentioned N groups of beams include any one of the following: pre-configured N groups of beams, N groups of beams agreed upon by a protocol, and N groups of beams obtained by the first device grouping the configured M beams.

[0091] The beam management over-the-air (OTA) testing method provided in this application embodiment allows a first device to perform OTA testing based on N beam groups and obtain test results. This method enables OTA testing on a beam-group basis, simplifying the testing process and allowing for the rational allocation of test resources across beam groups, thereby saving testing costs and reducing the complexity of the testing system.

[0092] In some embodiments of this application, step 201 can be implemented by any one of steps 201a to 201d.

[0093] Step 201a: The first device groups the configured M beams according to the degree of correlation between the M beams.

[0094] Step 201b: The first device groups the configured M beams according to the first instruction, the first instruction being a beam grouping instruction from the second device or the device manufacturer, the second device including at least one of the following: test equipment, terminal equipment, network-side equipment.

[0095] Step 201c: The first device groups the configured M beams based on the beam configuration information to obtain N groups of beams. The beam configuration information includes at least one of the following: number of beams, beam identifier, beam direction, number of beam groups, beam group identifier, corresponding transmit beam in each beam group, channel model, number of probes, and probe position.

[0096] Step 201d: The first device groups the configured M beams according to the protocol.

[0097] In some embodiments of this application, the aforementioned equipment manufacturers include, but are not limited to, at least one of the following: network equipment manufacturers and terminal equipment manufacturers.

[0098] In this embodiment of the application, the first device can group the M beams according to the degree of correlation between beams, the first indication, beam configuration information and relevant protocol specifications, so as to be able to make flexible configuration and adjustment according to the actual situation.

[0099] In some embodiments of this application, step 201a can be implemented by step 201a1.

[0100] Step 201a1: If X beams out of M beams satisfy the first condition, the first device will divide the X beams into a group.

[0101] Among them, the beams in each of the N groups of beams satisfy the first condition.

[0102] In some embodiments of this application, the X beams satisfying the first condition includes: after the X beams pass through the channel model, the correlation between the corresponding received signals satisfies at least one of the following:

[0103] The angle of arrival of the received signals is in the same direction;

[0104] The difference between the directions of the angle of arrival of the received signal is within a preset range;

[0105] The angle of arrival of the highest power received signal is in the same direction;

[0106] The difference between the direction of the angle of arrival of the maximum power received signal in the received signal is within a preset range;

[0107] The second highest power received signals in the received signal have the same angle of arrival direction;

[0108] The difference between the directions of the angle of arrival of the second highest power received signal in the received signal is within a preset range;

[0109] After sorting the received signals by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, where Y is greater than 2 and less than or equal to Z, and Z is the number of received signals.

[0110] The distance between the correlation matrices of the received signals is less than or equal to the first threshold.

[0111] The collinearity value of the correlation matrix of the received signal is greater than or equal to the second threshold;

[0112] The geodesic distance of the correlation matrix of the received signal is less than or equal to the third threshold;

[0113] The aforementioned angle of arrival includes at least one of the following: horizontal angle of arrival or azimuth angle, vertical angle of arrival or zenith angle of arrival, solid angle, and the angle of arrival of the received signal is the angle of arrival of the cluster or path at the channel receiver after the beam passes through the channel.

[0114] In some embodiments of this application, the received signal corresponding to the beam is the signal that is transmitted through the beam and then reaches the receiving end via the channel.

[0115] In some embodiments of this application, for each of the M beams, the direction of arrival of the corresponding received signal can be calculated separately. Then, at least one beam among the M beams whose corresponding received signal direction is the same or whose difference between the directions of arrival of the received signals is within a preset range is determined as a group of beams, i.e., a beam group.

[0116] For example, assuming that the received signals corresponding to beam 1, beam 2, and beam 3 in the M beams have the same angle of arrival, or the difference in the angle of arrival of the received signals is within a preset range, then beam 1, beam 2, and beam 3 are divided into a group of beams.

[0117] In some embodiments of this application, for each of the M beams, the direction of arrival of the receiving signal with the highest power in its corresponding received signal can be calculated, and then at least one beam among the M beams whose corresponding receiving signals with the highest power have the same direction of arrival or whose direction of arrival differs within a preset range is determined as a group of beams.

[0118] For example, assuming that the maximum power received signal of beam 3 and the maximum power received signal of beam 4 in the M beams have the same angle of arrival, or the difference in the angle of arrival is within a preset range, then beam 3 and beam 4 are grouped together.

[0119] It is understandable that wireless signals are affected by various factors during propagation, such as path loss, attenuation, and multipath effects. These factors cause the signal power to decrease when it reaches the receiver. Since each beam follows a different path in space, the propagation loss it experiences will also vary, resulting in different received signal power. In other words, the received signal corresponding to a single beam will include received signals of varying power.

[0120] It should be noted that the distance between the correlation matrices of the received signals is used to characterize the degree of similarity between the received signals. In other words, the first condition mentioned above includes an evaluation index for the degree of correlation between the received signals.

[0121] It is understandable that for at least one beam among M beams whose corresponding received signals have a similarity greater than a similarity threshold, they can be grouped into a group of beams. For example, if the received signals corresponding to beam 1, beam 2, and beam 5 among the M beams have a high degree of similarity, then beam 1, beam 2, and beam 5 are grouped into a group of beams.

[0122] In some embodiments of this application, the received signal includes any one of the following:

[0123] Received signals affected by the properties of the receiving antenna;

[0124] Received signals that are not affected by the antenna properties at the receiving end;

[0125] Among them, the antenna attributes of the receiving end include at least one:

[0126] Radiation pattern;

[0127] Receiver gain;

[0128] Beamforming;

[0129] Antenna aperture;

[0130] Antenna category;

[0131] Antenna directivity and resolution;

[0132] Antenna array configuration;

[0133] Antenna insertion loss;

[0134] Antenna return loss;

[0135] The beam efficiency of the antenna;

[0136] The antenna's half-power beamwidth.

[0137] For example, the received signal can be a receiver-side signal without receiver antenna gain, such as when the signal reception reference point is in front of the antenna element; or, the received signal can be a receiver-side signal including receiver antenna gain, such as when the signal is beamformed by the receiver antenna and the reference point is in the RF link.

[0138] In some embodiments of this application, the process of step 202 or step 301 described above may include the following step 202a:

[0139] Step 202a: In the target test environment, measure the received signal of the target beam in N beams after passing through the channel model to obtain the test results.

[0140] In some embodiments of this application, the above test results include at least one of the following:

[0141] Beam prediction results obtained by beam prediction based on the measurement results of the received signal;

[0142] Measurement results of the received signal;

[0143] Information about the transmit beam selected after beam management is performed;

[0144] Information on the transmit / receive beam pair selected after beam management is performed;

[0145] Performance information of the device under test;

[0146] The aforementioned target test environment is a test environment with preset spatial or temporal characteristics synthesized in the target test area using the MPAC system.

[0147] In some embodiments of this application, the target test environment has spatial / temporal characteristics corresponding to the target beam test environment. The target test environment can be a test environment synthesized in the test area using more than one probe, or a test environment synthesized in the test area using one probe.

[0148] In other words, more than one probe can be used to synthesize the spatial / temporal characteristics of the target transmitted beam corresponding to the test environment in the test area, or a single probe can be used to synthesize the spatial / temporal characteristics of the target transmitted beam corresponding to the test environment in the test area.

[0149] For example, the target beam can be a target transmit beam or a target send beam.

[0150] It should be noted that the explanation of the target beam can be found in the description of the above embodiments, and will not be repeated here.

[0151] In some embodiments of this application, the device under test can receive a target beam transmitted by a transmitter, and then measure the received signal corresponding to the target beam after passing through the channel model in a synthesized target test environment to obtain the test result.

[0152] It is understood that the steps included in step 202 above can also be applied to step 301, and will not be repeated here.

[0153] In some embodiments of this application, the beam-managed OTA testing method provided in this application may further include steps 203 and 204:

[0154] Step 203: The first device compares the test results with the expected target results.

[0155] Step 204: If the test results match the expected target results, the first device determines that the OTA test has passed.

[0156] It should be noted that steps 203 and 204 can be performed after step 202 above.

[0157] It is understandable that steps 203 and 204 can also be performed after step 301 above.

[0158] In some embodiments of this application, the above-mentioned expected target results include at least one of the following:

[0159] The target predicted beam information obtained by the device under test in advance includes at least one of the following: L1-RSRP, beam identifier;

[0160] The target prediction beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0161] The target measurement beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0162] Predefined target prediction beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0163] Predefined target measurement beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0164] Predefined throughput thresholds;

[0165] Predefined BLER threshold or BER threshold;

[0166] Predefined delay;

[0167] A predefined beam prediction accuracy requirement, which includes the ratio of the number of correctly predicted beams to the total number of required predicted beams;

[0168] Predefined L1-RSRP measurement accuracy requirements;

[0169] Predefined L1-RSRP prediction accuracy requirements;

[0170] The predefined target beam management information includes at least one of the following: the L1-RSRP of the transmit beam selected after beam management is performed, the identifier of the transmit beam selected after beam management is performed, the identifier of the transmit beam selected after beam management is performed, the identifier of the receive beam selected after beam management is performed, the identifier of the beam pair selected after beam management is performed, and the gain of the receive beam selected after beam management is performed.

[0171] In some possible implementations, after obtaining the test results, the first device can compare the test results with the expected target results to determine whether the OTA test has passed.

[0172] For example, taking the first device as the device under test, the device under test can compare the test results with the expected target results after obtaining the test results, and determine that the OTA test has passed if the test results match the expected target results.

[0173] In another possible implementation, after obtaining the test results, the first device sends the test results to the third device, which then compares the test results with the expected target results to determine whether the OTA test has passed.

[0174] For example, taking the first device as the device under test, the device under test can send the test results to the testing device after obtaining the test results. The testing device will compare the test results with the expected target results, and if the test results match the expected target results, it will determine that the OTA test has passed.

[0175] The following explains the basic process for judging whether a test has passed:

[0176] First, a target test environment is synthesized (built) in the target test area. The device under test (DUT) is tested in the target test environment, and the test results are reported. Second, the performance is verified by comparing the test results against pass / fail criteria. The pass / fail criteria and the comparison indicators include one or more of the following:

[0177] Pass / Fail Criterion 1: Compare the target predicted beam information with the information obtained from the prior measurement feedback of the device under test.

[0178] For example, a pass is achieved when the difference between the predicted beam L1-RSRP and the L1-RSRP of the target predicted beam obtained from the prior measurement feedback of the device under test (DUT) meets the accuracy requirements, or when the predicted beam ID matches the ID of the target predicted beam obtained from the prior measurement feedback of the DUT, or both conditions are met; otherwise, a fail is achieved. When there are multiple beams, all beams must pass, or a specific proportion of beams must pass, to meet the pass criterion; otherwise, the pass fails.

[0179] Pass / Fail Criterion 2: Compare the L1-RSRP of the target predicted beam obtained in advance by the reference measurement antenna plus a predefined margin.

[0180] For example, a pass is achieved when the difference between the predicted beam L1-RSRP and the L1-RSRP of the target predicted beam measured in advance by the reference measurement antenna plus a predefined margin meets the accuracy requirements; otherwise, it fails. When there are multiple beams, all beams must pass, or a specific proportion of beams must pass, to meet the pass criterion; otherwise, it fails.

[0181] Pass / Fail Criterion 3: Compare with the information of the target predicted beam predefined in the test equipment or relevant standard specifications.

[0182] For example, a pass is achieved when the difference between the predicted beam L1-RSRP and the L1-RSRP of the target predicted beam predefined in the test equipment or relevant standard specifications meets the accuracy requirements, or when the predicted beam ID matches the ID of the target predicted beam predefined in the test equipment or relevant standard specifications, or both conditions are met; otherwise, a fail is achieved. When there are multiple beams, all beams must pass, or a specific proportion of beams must pass, to meet the pass criterion; otherwise, the pass fails.

[0183] Pass / Fail Criterion 4: Compare with a predefined throughput threshold.

[0184] For example, if the difference between the throughput reported by the device under test and a predefined throughput threshold meets the requirements, the test passes; otherwise, it fails.

[0185] Pass / Fail Criterion 5: Compare with predefined latency requirements.

[0186] For example, if the latency reported by the device under test meets the predefined latency requirements, the test passes; otherwise, it fails.

[0187] Pass / Fail Criterion 6: Compare the L1-RSRP of the target measurement beam obtained in advance by the reference measurement antenna with a predefined margin.

[0188] For example, a pass is achieved when the difference between the measured transmit beam L1-RSRP and the target measurement beam L1-RSRP measured in advance by the reference measurement antenna plus a predefined margin meets the accuracy requirements; otherwise, it fails. When there are multiple beams, all beams must pass, or a specific proportion of beams must pass, to meet the pass criterion; otherwise, it fails.

[0189] Pass / Fail Criterion 7: Compare with information from the target measurement beam predefined in the test equipment or relevant standards and specifications.

[0190] For example, a pass is achieved when the difference between the measured L1-RSRP of the transmitted beam and the L1-RSRP of the target measurement beam predefined in the test equipment or relevant standard specifications meets the accuracy requirements, or when the measured transmitted beam ID matches the ID of the target measurement beam predefined in the test equipment or relevant standard specifications, or both conditions are met; otherwise, a fail is achieved. When there are multiple beams, all beams must pass, or a specific proportion of beams must pass, to meet the pass criterion; otherwise, the pass fails.

[0191] It should be noted that the comparison in the pass / fail criteria of the test can also include comparison with the same type of indicators in another type of test. When the performance of the target test type is greater than or equal to that of the other type of test, the test passes; otherwise, it fails. For example, when comparing the results of AI-based beam management test with those of traditional beam management test, based on the above 1-5 indicators, when the performance of AI beam management is stronger than that of traditional beam management test, the AI ​​beam management test passes.

[0192] The following explains the basic procedure for over-the-air (OTA) testing of transmitted beam measurement:

[0193] Step 11: Determine the test configuration, including one or more of the following: determine the target test environment, determine the beam to be transmitted, determine the beam grouping, determine the signal and TE configuration, and determine the orientation of the DUT and the probe configuration during the test. Perform a pre-test or calibration process to ensure that the test environment synthesized by the test system meets the specified requirements;

[0194] Step 12: Send the target transmit beam and obtain the test results fed back by the DUT after measurement under the specified environment / configuration, including one or more of the following: target transmit beam ID, target transmit beam L1-RSRP, throughput, and latency;

[0195] Step 13: Execute tests under other scenarios / configurations of the DUT and obtain the feedback test results;

[0196] It should be noted that whether to perform tests under other scenarios / configurations of the DUT is optional. For example, if tests under other scenarios / configurations of the DUT exist, these tests can be performed; otherwise, this step can be omitted.

[0197] Step 14: Compare the valid feedback test results with the pass / fail criteria to determine whether the DUT passes the test.

[0198] The following explains the basic procedure for over-the-air (OTA) testing of transmit beam prediction:

[0199] Step 21: Determine the test configuration, including one or more of the following: determine the target test environment, determine the information of the beam to be transmitted and the beam to be predicted, determine the beam grouping, determine the signal and TE configuration, and determine the orientation of the DUT and the probe configuration during the test. Perform a pre-test or calibration process to ensure that the beam measurement capability of the DUT meets the specified requirements and that the test environment synthesized by the test system meets the specified requirements;

[0200] Step 22: Send the target transmit beam and obtain the test results fed back by the DUT after prediction under the specified environment / configuration, including one or more of the following: target predicted beam ID, target predicted beam L1-RSRP, throughput, and latency;

[0201] Step 23: Execute tests under other scenarios / configurations of the DUT and obtain the test results;

[0202] It should be noted that whether to perform tests under other scenarios / configurations of the DUT is optional. For example, if tests under other scenarios / configurations of the DUT exist, these tests can be performed; otherwise, this step can be omitted.

[0203] Step 24: Compare the valid feedback test results with the pass / fail criteria to determine whether the DUT passes the test.

[0204] The beam grouping process will be explained below through specific examples.

[0205] Example 1:

[0206] The M beams to be tested are grouped into N groups, where N≤M.

[0207] For example, the M beams are grouped to obtain N groups of beams, including group 1 to group N, as shown in Figure 3.

[0208] It should be noted that Figure 3 is only a schematic diagram of the beam groups obtained after beam grouping. The number of beams in each beam group can be configured according to actual needs, and this application embodiment does not limit this.

[0209] For example, the grouping principle is that if the correlation between beam i and beam j in the full set of transmitted beams meets a certain condition, then beam i and beam j can be grouped into one group (1≤i<j≤M).

[0210] For example, the evaluation criteria for the degree of association include, but are not limited to, at least one of the following:

[0211] Condition 1: After the transmitted signals corresponding to beams i and j pass through the channel model, the directions of the maximum power angles of arrival at the receiving side are consistent, or the directions of the maximum power clusters at the receiving side are consistent, for example... Then beam i and beam j can be grouped together.

[0212] It should be noted that the above consistency can also refer to a certain limited range, for example...

[0213] It should be noted that the direction of the maximum power angle of arrival on the receiving side refers to the direction of the angle of arrival of the maximum power received signal on the receiving side.

[0214] Condition 2: After the transmitted signals corresponding to beams i and j pass through the channel model, the direction of arrival of the second highest power at the receiving side is consistent, or the direction of arrival of the second highest power cluster at the receiving side is consistent.

[0215] Condition 3: After the transmitted signals corresponding to beams i and j pass through the channel model, and the received signals are sorted by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, where Y is greater than 2 and less than or equal to Z. For example, after the transmitted signals corresponding to beams i and j pass through the channel model, the received signals with power at position three have the same angle of arrival direction.

[0216] It should be noted that the received signal with the third highest power can be referred to as the third highest power received signal.

[0217] Condition 4: After the transmitted signals corresponding to beams i and j pass through the channel model, the received signal at the receiving end passes through the channel model H and includes the transmit beam gain G. tx,i signal S i =G tx,i H and transmit beam gain G tx,j signal S j =G tx,j The correlation matrix R between H i and R j If the collinearity between beams i and j is less than or equal to a certain threshold, it indicates that the correlation between beams i and j is greater than a certain range, and beams i and j can be grouped together. Collinearity can be expressed as the correlation matrix distance, as shown in the following expression:

[0218] Where tr() represents the trace of the matrix, |·| f Let f be the Frobenius norm of the matrix.

[0219] Condition 5: After the transmitted signals corresponding to beams i and j pass through the channel model, the signal S received by the receiver is the signal that has passed through the channel model H and includes the transmitted beam gain and the estimated received beam gain. i =G tx,i ·H·G rx and S j =G tx,j ·H·G′ rx The correlation matrix R between them i and R jIf the collinearity between beams i and j is less than or equal to a certain threshold, it indicates that the correlation between beams i and j is greater than a certain range, and they can be grouped together. The estimated received beam gain includes, but is not limited to, the defined / measured received beam pattern, codebook, or antenna arrays with defined receiving positions to estimate beamforming gain.

[0220] Condition 6: Assuming the receiver is a configured antenna array, calculate the correlation matrix R, which is the spatial correlation between the antenna array elements after the transmitted signals corresponding to beams i and j pass through the channel model and include the transmit beam gain, and is the result of the received signals passing through the channel model. i and R j If the correlation matrix R i and R j If the collinearity between beams is less than or equal to a certain threshold, then the correlation between beams i and j is greater than a certain range, and they can be grouped together.

[0221] Figure 4 is a schematic diagram of a beam-managed OTA testing system provided in an embodiment of this application. This beam-managed OTA testing system can execute the aforementioned beam-managed OTA testing method. As shown in Figure 4, the beam-managed OTA testing system may include: a base station simulator 401, a channel simulator 402, and an anechoic chamber 403. The anechoic chamber includes at least one probe and a device under test (DUT) 404. The DUT 404 transmits signals to the at least one probe via radiation. Each probe is connected to the channel simulator via an RF wire, and the channel simulator is connected to the base station simulator. The at least one probe may include R probes, from probe 1 to probe R, where R is an integer greater than or equal to 1.

[0222] It should be noted that the number of probes can be set according to actual needs, and this application embodiment does not limit this.

[0223] The base station simulator is used to send test signals on the target beam in N groups of beams based on beam configuration information. The N groups of beams are obtained by grouping the configured M beams.

[0224] The channel simulator is used to receive test signals from the base station simulator and process the test signals based on a preset channel model to simulate the target test environment.

[0225] At least one probe is used to receive test signals processed by a channel simulator and to send the test signals to a target test environment.

[0226] The device under test (DUT) is used to receive a target beam in a target test environment and process the target beam to obtain test results. These test results are used to evaluate the performance of the DUT under specific channel conditions.

[0227] In some possible implementations, each of the N beam groups corresponds to a set of probe configurations.

[0228] The probe configuration includes at least one of the following: the number of probes, the probe position, and the probe power weight.

[0229] In some embodiments of this application, the spatial characteristics of the target test environment are quantified and described by PAS or spatial correlation.

[0230] In some embodiments of this application, the number of probes and the probe positions are the same for each beam in each group of beams.

[0231] In some other possible implementations, each of the N beam groups corresponds to a probe configuration, which includes at least one of the following: probe position and probe power weight.

[0232] In some embodiments of this application, the spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, the power of which includes the L1-RSRP of the reference signal corresponding to the transmitted beam.

[0233] In some embodiments of this application, the probe positions corresponding to each of the N groups of beams are the same.

[0234] It should be noted that the explanation of this embodiment can be found in the description of the above method-side embodiment, and will not be repeated here.

[0235] In some embodiments of this application, for spatial beam prediction, in the above-described test system, during testing, a subset of Y beams from the complete set of M beams in the spatial domain are selected as the transmitting beams. The device under test measures the corresponding transmitted signals when the Y beams are transmitted and feeds back the results after AI beam management to the test device. The feedback results are compared with the reference values ​​of the target beam subset or the complete set in the M beams.

[0236] In some embodiments of this application, for time-domain beam prediction, in the above-described test system, during testing, Y beams within the time period T1 of the complete set of time periods T are selected as the transmitting beams. The device under test (DUT) tests the corresponding transmitted signals when N beams are transmitted and provides feedback on the results after AI beam management. The feedback results are compared with a subset or the complete set of M target beams in the time period T2, where T2 is later than T1, or the time period T2 is within the time period T1.

[0237] The beam management OTA testing system provided in this application embodiment can use a multi-probe anechoic chamber to synthesize the target environment after the transmitted beam passes through a specified channel model in the test area, and perform OTA testing on the beam performance of the device under test. Furthermore, by grouping the transmitted beam, the number of probes required for testing is effectively reduced, thereby reducing testing costs and complexity.

[0238] The following specific embodiments illustrate the testing system provided in this application.

[0239] Example 2:

[0240] Figure 5 is a schematic diagram of the architecture of a test system provided in an embodiment of this application. As shown in Figure 5, the test system includes a base station simulator (BS Emulator), a channel simulator (CE), a switch matrix, and an anechoic chamber. At least one probe and a device under test (DUT) are installed in the anechoic chamber. The base station simulator can group M beams into L groups of beams, where the L groups of beams can include groups 1 to L. At least one probe is represented in Figure 5 as probe 1, probe 2, probe j, probe i, probe K, and probe Q.

[0241] For example, the base station simulator sends a test signal on the target beam, the channel simulator receives the test signal and sends the test signal to the switch matrix, the switch matrix activates K probes 1 to K from Q switches for selection, probes 1 to K receive the test signal and send the test signal to the device under test, the device under test receives the test signal and measures the test signal.

[0242] For example, the channel simulator has K available ports. The switch matrix can activate K probes 1 to K from Q switches. When Q = K, the switch matrix is ​​not needed. A total of Q probes are arranged on a sector, all equidistant from the center of the DUT's test location.

[0243] It should be noted that when considering a dual-polarized probe, the number of ports of the channel simulator should be twice the number of dual-polarized probes. The number of available ports K mentioned here refers to the number of ports corresponding to single polarization.

[0244] For example, when configuring the test system, for beam group 1 in group L, the selected active probes are the probes {probe 1, probe 2, ..., probe K} in the figure, which correspond to appropriate positions {position 1, position 2, ..., position K} respectively. Each beam in group 1 has a corresponding set of probe power weights, the goal of which is to synthesize the target channel spatial environment in the test area where the DUT is located, including the power angular spectrum (PAS) or spatial correlation.

[0245] For example, when the beam polls to beam group 2 within beam group L, the active probes switch to another group of K probes, each corresponding to a suitable position. Each beam in beam group 2 has a corresponding set of probe power weights. Similarly, when switching to beam group L, other active probe groups are selected. Here, the p-th probe belongs to beam group l (1≤l≤L). l The probe weights corresponding to each beam are: 1≤p l ≤P l P l This represents the total number of beams in beam group l.

[0246] It should be noted that the total set formed by the K probes corresponding to the L groups mentioned above is the Q probes mentioned above. The power weights mentioned above can be obtained based on optimization algorithms, etc., and the objective function is PAS or spatial correlation.

[0247] It should be noted that the above-mentioned test system can be referred to as test system A.

[0248] The following explains the test environment configuration for test system A:

[0249] Total number of supported beams: M, {beam 1, beam 2, ..., beam m, ..., beam M} (e.g., 128), where the direction of beam m is {AOD m, ZOD m};

[0250] Supported number of beam groups: L, {group 1, group 2, ... group l, ..., group L} (e.g., 12);

[0251] Supported channel models: CDL (e.g., CDL-A);

[0252] Total number of probes supported: L (e.g., 16);

[0253] Supported number of probes active simultaneously: K (e.g., 8);

[0254] The probe and beamgroup configuration is as follows:

[0255] In the CDL channel 1 scenario:

[0256] Probe 1 is located at {AOA 1, ZOA 1}; Probe 2 is located at {AOA 1, ZOA 1}, ..., Probe q is located at {AOA q, ZOA q}, ..., Probe Q is located at {AOA Q, ZOA Q};

[0257] Group 1 consists of {beam 1, ..., beam m1, ..., beam M1}, Group 2 consists of {beam 2, ..., beam m2, ..., beam M2}, ..., Group 1 consists of {beam M... l-1+1 ,…,beam m l ,…,beam M l Group L is {beam M}, ..., Group L is {beam M} L-1+1 ,…,beam m L ,…,beam M}

[0258] Wherein, the K probes that can be activated simultaneously corresponding to Group l are {Probe l1,…,Probe l}. K}, 1≤l1<…<l K ≤Q.

[0259] It should be noted that the configuration principles for CDL channel 2 are consistent with those for channel 1. Furthermore, there can be more than one of the above configuration combinations.

[0260] Example 3:

[0261] Figure 6 is a schematic diagram of another architecture of the test system provided in the embodiment of this application. As shown in Figure 6, the test system includes a base station simulator, a channel simulator, and an anechoic chamber. At least one probe and a device under test are installed in the anechoic chamber. The base station simulator can group M beams to obtain L groups of beams. The L groups of beams can include group 1 to group L. At least one probe can be represented as probe 1, probe 2, ..., probe L.

[0262] For example, the channel simulator has L available ports, and a total of L probes are arranged on one sector, all of which are equidistant from the center of the test location of the DUT.

[0263] It should be noted that when considering a dual-polarized probe, the number of ports in the channel simulator is twice the number of dual-polarized probes, and the number of available ports L is the number of ports corresponding to single-polarization.

[0264] For example, when configuring the test system, for beam group 1 in group L, the selected active probe is probe 1 (marked in the figure), while other probes are turned off. Each beam in beam group 1 has a corresponding probe power weight, the goal of which is to synthesize the target channel spatial environment, including the power angular spectrum or spatial correlation, in the test area where the DUT is located. The device under test measures the power transmitted by probe 1. The position corresponding to probe 1 is the direction of the angle of arrival of the maximum power on the receiving side or the angle of arrival of the maximum power cluster on the receiving side in the channel at this time. Each beam in group 1 corresponds to a power mapping on probe 1.

[0265] For example, when the beam polls to beam group 2, the active probe switches to probe 2, and the other probes are turned off. The DUT measures the power transmitted by probe 2. The position corresponding to probe 2 is the direction of the angle of arrival of the maximum power on the receiving side in the channel at this time or the direction of the angle of arrival of the maximum power cluster on the receiving side. Each beam in group 2 corresponds to a power mapping on probe 2.

[0266] Similarly, when the beam polling reaches beam group L, the activated probe switches to probe L.

[0267] For example, the probe weight corresponding to the p-th beam in beam group l (1≤l≤L) is: 1≤p l ≤P l P l This represents the total number of beams in beam group l.

[0268] It should be noted that the above-mentioned test system can be referred to as Test System B.

[0269] The following explains the test environment configuration for test system B:

[0270] Total number of supported beams: M, {beam 1, beam 2, ..., beam m, ..., beam M} (e.g., 128), where the direction of beam m is {AOD m, ZOD m}.

[0271] Supported beam groups: L, {group 1, group 2, ..., group l, ..., group L} (e.g., 12)

[0272] Supported channel models: CDL (e.g., CDL-A)

[0273] Total number of supported probes: L (same as the number of supported beam groups)

[0274] The probe and beamgroup configuration is as follows:

[0275] In the CDL channel 1 scenario:

[0276] Probe 1 is located at {AOA 1, ZOA 1}; Probe 2 is located at {AOA 1, ZOA 1}, ..., Probe l is located at {AOA l, ZOA l}, ..., Probe L is located at {AOA L, ZOA L};

[0277] Group 1 consists of {beam 1, ..., beam m1, ..., beam M1}, Group 2 consists of {beam 2, ..., beam m2, ..., beam M2}, ..., Group 1 consists of {beam M... l-1+1 ,…,beam m l ,…,beam M l Group L is {beam M}, ..., Group L is {beam M} L-1+1 ,…,beam m L ,…,beam M};

[0278] The probe corresponding to Group l is Probe l, where 1≤l≤L.

[0279] It should be noted that the configuration principles for CDL channel 2 scenario are consistent with those for channel 1 scenario.

[0280] In addition, there may be more than one of the above configuration combinations.

[0281] It should be noted that in the configurations of test systems A and B described above, only the channel model and probe configuration may be specified, without specifying the beam or beam grouping configuration; the specific grouping is then implemented by the test equipment. In the configurations of test systems A and B described above, the power weighting of the probes is implemented by the test equipment.

[0282] It should be noted that the testing method in this application can be used for time-domain prediction and spatial-domain prediction, as well as for any combination of two or all of the spatial / time / frequency prediction methods; and it is not only applicable to AI BM, but any type of beam management can be configured to test the system using the above method.

[0283] The beam-managed OTA testing method provided in this application can be executed by a beam-managed OTA testing device. This application uses an example of a beam-managed OTA testing device executing the beam-managed OTA testing method to illustrate the beam-managed OTA testing device provided in this application.

[0284] This application provides a beam-managed OTA testing device. As an example, the beam-managed OTA testing device can be a communication device or a component within a communication device, such as a chip. The communication device can be a terminal, a network-side device, or a server, etc. Exemplarily, the terminal can be, but is not limited to, the type of terminal 11 listed above, and the network-side device can be, but is not limited to, the type of network-side device 12 listed above. This application does not impose specific limitations.

[0285] The beam-managed OTA testing device includes a processing module. This processing module can be implemented in software or hardware. When implemented in hardware, the processing module can be implemented by a processor. For example, the processor can include general-purpose processors, special-purpose processors, such as a Central Processing Unit (CPU), microprocessor, Digital Signal Processor (DSP), Artificial Intelligence (AI) processor, Graphics Processing Unit (GPU), Application Specific Integrated Circuit (ASIC), Network Processor (NP), Field Programmable Gate Array (FPGA), or other programmable logic devices, gate circuits, transistors, discrete hardware components, etc. The receiving and transmitting modules can be implemented by a communication interface, which can include one or more of the following: transceiver, pins, circuits, bus, radio frequency unit, etc.

[0286] Specifically, referring to Figure 7, when the beam-managed OTA measurement device is a terminal or a component in a terminal, or when the beam-managed OTA measurement device is a network-side device or a component in a network-side device, the beam-managed OTA measurement device 700 includes a processing module 701, which is used to group the configured M beams to obtain N groups of beams, where M and N are positive integers, and M is greater than or equal to N; the processing module 701 is also used to perform OTA testing according to the N groups of beams to obtain test results.

[0287] In some embodiments of this application, the above-mentioned processing module is specifically used to: group the configured M beams according to the degree of correlation between the M beams; or, group the configured M beams according to a first instruction, wherein the first instruction is a beam grouping instruction from a second device or a device manufacturer, and the second device includes at least one of the following: a test device, a terminal device, or a network-side device; or, group the configured M beams based on beam configuration information to obtain N groups of beams, wherein the beam configuration information includes at least one of the following: the number of beams, beam identifier, beam direction, number of beam groups, beam group identifier, corresponding transmit beam in each beam group, channel model, number of probes, and probe position; or, group the configured M beams according to a protocol agreement.

[0288] In some embodiments of this application, the above-mentioned processing module is specifically used to: if X beams out of M beams satisfy the first condition, then divide the X beams into a group, and the beams in each of the N groups of beams satisfy the first condition.

[0289] In some embodiments of this application, the X beams satisfying the first condition include:

[0290] After X beams pass through the channel model, the correlation between the corresponding received signals satisfies at least one of the following:

[0291] The angle of arrival of the received signals is in the same direction;

[0292] The difference between the directions of the angle of arrival of the received signal is within a preset range;

[0293] The angle of arrival of the highest power received signal is in the same direction;

[0294] The difference between the direction of the angle of arrival of the maximum power received signal in the received signal is within a preset range;

[0295] The second highest power received signals in the received signal have the same angle of arrival direction;

[0296] The difference between the directions of the angle of arrival of the second highest power received signal in the received signal is within a preset range;

[0297] After sorting the received signals by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, Y is greater than 2 and less than Z, where Z is the number of received signals;

[0298] The distance between the correlation matrices of the received signals is less than or equal to the first threshold.

[0299] The collinearity value of the correlation matrix of the received signal is greater than or equal to the second threshold;

[0300] The geodesic distance of the correlation matrix of the received signal is less than or equal to the third threshold;

[0301] The angle of arrival includes at least one of the following: horizontal angle of arrival or azimuth angle, vertical angle of arrival or zenith angle, solid angle, and the angle of arrival of the received signal is the angle of arrival of the cluster or the radius of the channel receiver after the beam passes through the channel.

[0302] In some embodiments of this application, the received signal includes any one of the following:

[0303] Received signals affected by the properties of the receiving antenna;

[0304] Received signals that are not affected by the antenna properties at the receiving end;

[0305] Among them, the antenna attributes of the receiving end include at least one:

[0306] Radiation pattern;

[0307] Receiver gain;

[0308] Beamforming;

[0309] Antenna aperture;

[0310] Antenna category;

[0311] Antenna directivity and resolution;

[0312] Antenna array configuration;

[0313] Antenna insertion loss;

[0314] Antenna return loss;

[0315] The beam efficiency of the antenna;

[0316] The antenna's half-power beamwidth.

[0317] In some embodiments of this application, the above-mentioned processing module is specifically used to: measure the received signal corresponding to the target beam after passing through the channel model in the target test environment, and obtain the test result;

[0318] The target test environment is a test environment with preset spatial or temporal characteristics synthesized in the target test area using a multi-probe anechoic chamber MPAC system.

[0319] In some embodiments of this application, each of the N groups of beams corresponds to a set of probe configurations, and a set of probe configurations corresponds to a set of probes, with a set of probes including at least two probes; wherein, the probe configuration includes at least one of the following: the number of probes, the position of the probes, and the power weight of the probes.

[0320] In some embodiments of this application, the spatial characteristics of the target test environment described above are quantified and described by power angle spectrum (PAS) or spatial correlation.

[0321] In some embodiments of this application, the number of probes and the probe positions corresponding to each beam in each of the above-mentioned beam groups are the same.

[0322] In some embodiments of this application, each of the N groups of beams corresponds to a probe configuration, and each probe configuration corresponds to a probe. The probe configuration includes at least one of the following: probe position and probe power weight.

[0323] In some embodiments of this application, the spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, and the power of the transmitted beam includes the layer-1 reference signal transmission power L1-RSRP of the reference signal corresponding to the transmitted beam.

[0324] In some embodiments of this application, the probe positions corresponding to each of the N groups of beams are the same.

[0325] In some embodiments of this application, the above test results include at least one of the following:

[0326] The target predicted beam is identified as the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams.

[0327] L1-RSRP of the target prediction beam;

[0328] The L1-RSRP of the target measurement beam, the target measurement beam is the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams;

[0329] The identifier of the transmit beam selected after beam management is performed;

[0330] L1-RSRP of the transmit beam selected after beam management is performed;

[0331] The identifier of the transmit / receive beam pair selected after beam management is performed;

[0332] Throughput;

[0333] Block Error Rate (BLER);

[0334] Bit error rate (BER);

[0335] Delay;

[0336] Among them, the number of target predicted beams is greater than or equal to 1 and less than or equal to M, the number of target measured beams is greater than or equal to 1 and less than or equal to M, the number of transmit beams selected after beam management is greater than or equal to 1 and less than or equal to M, and the number of transmit / receive beam pairs selected after beam management is greater than or equal to 1 and less than or equal to M * number of receive beams.

[0337] In some embodiments of this application, the above-mentioned processing module is further configured to perform OTA testing according to N groups of beams, and after obtaining the test results, compare the test results with the expected target results; the processing module is further configured to determine that the OTA test is passed if the test results match the expected target results.

[0338] In some embodiments of this application, the above-mentioned expected target results include at least one of the following:

[0339] The target predicted beam information obtained by the device under test in advance includes at least one of the following: L1-RSRP, beam identifier;

[0340] The target prediction beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0341] The target measurement beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0342] Predefined target prediction beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0343] Predefined target measurement beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0344] Predefined throughput thresholds;

[0345] Predefined BLER threshold or BER threshold;

[0346] Predefined delay;

[0347] The predefined beam prediction accuracy requirement includes the number of correctly predicted beams and the ratio of the total number of required predicted beams.

[0348] Predefined L1-RSRP measurement accuracy requirements;

[0349] Predefined L1-RSRP prediction accuracy requirements;

[0350] The predefined target beam management information includes at least one of the following: the L1-RSRP of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the receive beam selected after beam management, the identifier of the beam pair selected after beam management, and the gain of the receive beam selected after beam management.

[0351] The beam management OTA testing device provided in this application groupes M configured beams into N groups, where M and N are positive integers, and M is greater than or equal to N. OTA testing is then performed on the N groups of beams to obtain the test results. This method, by grouping beams and then performing OTA testing on the grouped beams, allows for OTA testing on a beam-group basis, simplifying the testing process. Furthermore, it enables the rational allocation of test resources among beam groups, thereby saving testing costs and reducing the complexity of the testing system.

[0352] The beam-managed OTA testing device provided in this application embodiment can implement the various processes implemented in the method embodiments of Figures 1 to 6 and achieve the same technical effect. To avoid repetition, it will not be described again here.

[0353] As shown in Figure 8, this application embodiment also provides a communication device 800, including a processor 801 and a memory 802. The memory 802 stores a program or instructions that can run on the processor 801. For example, when the communication device 800 is a terminal, the program or instructions executed by the processor 801 implement the various steps of the above-described beam management OTA testing method embodiment and achieve the same technical effect. When the communication device 800 is a network-side device, the program or instructions executed by the processor 801 implement the various steps of the above-described beam management OTA testing method embodiment and achieve the same technical effect. To avoid repetition, this will not be described again here.

[0354] It should be noted that the communication device in this application embodiment can be a terminal or a network-side device. The following uses a terminal and a network-side device as examples to explain the hardware structure of the communication device provided in this application embodiment.

[0355] This application also provides a terminal, including a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the steps in the method embodiment shown in FIG2. This terminal embodiment corresponds to the above-described terminal-side method embodiment, and all implementation processes and methods of the above-described method embodiments can be applied to this terminal embodiment and can achieve the same technical effect. The terminal can be the beam-managed OTA testing device shown in FIG7. Specifically, FIG9 is a schematic diagram of the hardware structure of a terminal implementing an embodiment of this application.

[0356] The terminal 100 includes, but is not limited to, at least some of the following components: radio frequency unit 101, network module 102, audio output unit 103, input unit 104, sensor 105, display unit 106, user input unit 107, interface unit 108, memory 109, and processor 110.

[0357] Those skilled in the art will understand that terminal 100 may also include a power supply (such as a battery) for powering various components. The power supply can be logically connected to processor 110 through a power management system, thereby enabling functions such as charging, discharging, and power consumption management through the power management system. The terminal structure shown in Figure 9 does not constitute a limitation on the terminal. The terminal may include more or fewer components than shown, or combine certain components, or have different component arrangements, which will not be elaborated here.

[0358] It should be understood that, in this embodiment, the input unit 104 may include a graphics processor 1041 and a microphone 1042. The graphics processor 1041 processes image data of still images or videos obtained by an image capture device (such as a camera) in video capture mode or image capture mode. The display unit 106 may include a display panel 1061, which may be configured in the form of a liquid crystal display, an organic light-emitting diode, or the like. The user input unit 107 includes at least one of a touch panel 1071 and other input devices 1072. The touch panel 1071 is also called a touch screen. The touch panel 1071 may include a touch detection device and a touch controller. Other input devices 1072 may include, but are not limited to, physical keyboards, function keys (such as volume control buttons, power buttons, etc.), trackballs, mice, and joysticks, which will not be described in detail here.

[0359] In this embodiment, after receiving downlink data from the network-side device, the radio frequency unit 101 can transmit it to the processor 110 for processing; in addition, the radio frequency unit 101 can send uplink data to the network-side device. Typically, the radio frequency unit 101 includes, but is not limited to, antennas, amplifiers, transceivers, couplers, low-noise amplifiers, duplexers, etc.

[0360] The memory 109 can be used to store software programs or instructions, as well as various data. The memory 109 may primarily include a first storage area for storing programs or instructions and a second storage area for storing data. The first storage area may store the operating system, application programs or instructions required for at least one function (such as sound playback, image playback, etc.). Furthermore, the memory 109 may include volatile memory or non-volatile memory. The non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory can be random access memory (RAM), static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDRSDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous linked dynamic random access memory (SLDRAM), and direct memory bus RAM (DRRAM). The memory 109 in the embodiments of this application includes, but is not limited to, these and any other suitable types of memory.

[0361] Processor 110 may include one or more processing units; optionally, processor 110 integrates an application processor and a modem processor, wherein the application processor mainly handles operations involving the operating system, user interface, and applications, and the modem processor mainly handles wireless communication signals, such as a baseband processor. It is understood that the aforementioned modem processor may also not be integrated into processor 110.

[0362] The processor 110 is used to group the configured M beams into N groups of beams, where M and N are positive integers and M is greater than or equal to N; the processor 110 is also used to perform OTA tests based on the N groups of beams and obtain test results.

[0363] In some embodiments of this application, the processor 110 is specifically configured to: group the configured M beams according to the degree of correlation between the M beams; or, group the configured M beams according to a first instruction, wherein the first instruction is a beam grouping instruction from a second device or a device manufacturer, the second device including at least one of the following: a test device, a terminal device, or a network-side device; or, group the configured M beams based on beam configuration information to obtain N groups of beams, wherein the beam configuration information includes at least one of the following: the number of beams, beam identifier, beam direction, number of beam groups, beam group identifier, corresponding transmit beam in each beam group, channel model, number of probes, and probe position; or, group the configured M beams according to a protocol agreement.

[0364] In some embodiments of this application, the processor 110 is specifically used to: if X beams out of M beams satisfy a first condition, then divide the X beams into a group, and the beams in each of the N groups of beams satisfy the first condition.

[0365] In some embodiments of this application, the X beams satisfying the first condition include:

[0366] After X beams pass through the channel model, the correlation between the corresponding received signals satisfies at least one of the following:

[0367] The angle of arrival of the received signals is in the same direction;

[0368] The difference between the directions of the angle of arrival of the received signal is within a preset range;

[0369] The angle of arrival of the highest power received signal is in the same direction;

[0370] The difference between the direction of the angle of arrival of the maximum power received signal in the received signal is within a preset range;

[0371] The second highest power received signals in the received signal have the same angle of arrival direction;

[0372] The difference between the directions of the angle of arrival of the second highest power received signal in the received signal is within a preset range;

[0373] After sorting the received signals by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, Y is greater than 2 and less than Z, where Z is the number of received signals;

[0374] The distance between the correlation matrices of the received signals is less than or equal to the first threshold.

[0375] The collinearity value of the correlation matrix of the received signal is greater than or equal to the second threshold;

[0376] The geodesic distance of the correlation matrix of the received signal is less than or equal to the third threshold;

[0377] The angle of arrival includes at least one of the following: horizontal angle of arrival or azimuth angle, vertical angle of arrival or zenith angle, solid angle, and the angle of arrival of the received signal is the angle of arrival of the cluster or the radius of the channel receiver after the beam passes through the channel.

[0378] In some embodiments of this application, the received signal includes any one of the following:

[0379] Received signals affected by the properties of the receiving antenna;

[0380] Received signals that are not affected by the antenna properties at the receiving end;

[0381] Among them, the antenna attributes of the receiving end include at least one:

[0382] Radiation pattern;

[0383] Receiver gain;

[0384] Beamforming;

[0385] Antenna aperture;

[0386] Antenna category;

[0387] Antenna directivity and resolution;

[0388] Antenna array configuration;

[0389] Antenna insertion loss;

[0390] Antenna return loss;

[0391] The beam efficiency of the antenna;

[0392] The antenna's half-power beamwidth.

[0393] In some embodiments of this application, the processor 110 is specifically used to: measure the received signal corresponding to the target beam after passing through the channel model in a target test environment, and obtain test results;

[0394] The target test environment is a test environment with preset spatial or temporal characteristics synthesized in the target test area using a multi-probe anechoic chamber MPAC system.

[0395] In some embodiments of this application, each of the N groups of beams corresponds to a set of probe configurations, and a set of probe configurations corresponds to a set of probes, with a set of probes including at least two probes; wherein, the probe configuration includes at least one of the following: the number of probes, the position of the probes, and the power weight of the probes.

[0396] In some embodiments of this application, the spatial characteristics of the target test environment described above are quantified and described by power angle spectrum (PAS) or spatial correlation.

[0397] In some embodiments of this application, the number of probes and the probe positions corresponding to each beam in each of the above-mentioned beam groups are the same.

[0398] In some embodiments of this application, each of the N groups of beams corresponds to a probe configuration, and each probe configuration corresponds to a probe. The probe configuration includes at least one of the following: probe position and probe power weight.

[0399] In some embodiments of this application, the spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, and the power of the transmitted beam includes the layer-1 reference signal transmission power L1-RSRP of the reference signal corresponding to the transmitted beam.

[0400] In some embodiments of this application, the probe positions corresponding to each of the N groups of beams are the same.

[0401] In some embodiments of this application, the above test results include at least one of the following:

[0402] The target predicted beam is identified as the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams.

[0403] L1-RSRP of the target prediction beam;

[0404] The L1-RSRP of the target measurement beam, the target measurement beam is the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams;

[0405] The identifier of the transmit beam selected after beam management is performed;

[0406] L1-RSRP of the transmit beam selected after beam management is performed;

[0407] The identifier of the transmit / receive beam pair selected after beam management is performed;

[0408] Throughput;

[0409] Block Error Rate (BLER);

[0410] Bit error rate (BER);

[0411] Delay;

[0412] Among them, the number of target predicted beams is greater than or equal to 1 and less than or equal to M, the number of target measured beams is greater than or equal to 1 and less than or equal to M, the number of transmit beams selected after beam management is greater than or equal to 1 and less than or equal to M, and the number of transmit / receive beam pairs selected after beam management is greater than or equal to 1 and less than or equal to M * number of receive beams.

[0413] In some embodiments of this application, the processor 110 is further configured to perform OTA testing based on N sets of beams, and after obtaining the test results, compare the test results with the expected target results; the processor 110 is further configured to determine that the OTA test is passed if the test results match the expected target results.

[0414] In some embodiments of this application, the above-mentioned expected target results include at least one of the following:

[0415] The target predicted beam information obtained by the device under test in advance includes at least one of the following: L1-RSRP, beam identifier;

[0416] The target prediction beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0417] The target measurement beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and the predefined margin, and the beam identifier;

[0418] Predefined target prediction beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0419] Predefined target measurement beam information, which includes at least one of the following: L1-RSRP, beam identifier;

[0420] Predefined throughput thresholds;

[0421] Predefined BLER threshold or BER threshold;

[0422] Predefined delay;

[0423] The predefined beam prediction accuracy requirement includes the number of correctly predicted beams and the ratio of the total number of required predicted beams.

[0424] Predefined L1-RSRP measurement accuracy requirements;

[0425] Predefined L1-RSRP prediction accuracy requirements;

[0426] The predefined target beam management information includes at least one of the following: the L1-RSRP of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the receive beam selected after beam management, the identifier of the beam pair selected after beam management, and the gain of the receive beam selected after beam management.

[0427] The terminal provided in this application embodiment groups M configured beams into N groups, where M and N are positive integers, and M is greater than or equal to N. Over-the-air (OTA) testing is then performed on the N groups of beams to obtain test results. This method, by grouping the beams and then performing OTA testing on the grouped beams, allows OTA testing to be performed on a beam-by-beam basis, simplifying the testing process. Furthermore, it enables the rational allocation of test resources across beam groups, thereby saving testing costs and reducing the complexity of the testing system.

[0428] This application also provides a network-side device, including a processor and a communication interface. The communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the steps of the above-described method embodiments. This network-side device embodiment corresponds to the above-described network-side device method embodiments. All implementation processes and methods of the above-described method embodiments can be applied to this network-side device embodiment and achieve the same technical effects.

[0429] Specifically, this application embodiment also provides a network-side device, which can be the beam-managed OTA device shown in FIG. 7. As shown in FIG. 10, the network-side device 300 includes: an antenna 31, a radio frequency device 32, a baseband device 33, a processor 34, and a memory 35. The antenna 31 is connected to the radio frequency device 32. In the uplink direction, the radio frequency device 32 receives information through the antenna 31 and sends the received information to the baseband device 33 for processing. In the downlink direction, the baseband device 33 processes the information to be transmitted and sends it to the radio frequency device 32. The radio frequency device 32 processes the received information and transmits it through the antenna 31.

[0430] The method executed by the network-side device in the above embodiments can be implemented in the baseband device 33, which includes a baseband processor.

[0431] The baseband device 33 may include at least one baseband board, on which multiple chips are disposed, as shown in FIG3. One of the chips is, for example, a baseband processor, which is connected to the memory 35 via a bus interface to call the program in the memory 35 and execute the network device operation shown in the above method embodiment.

[0432] The network-side device may also include a network interface 36, such as a Common Public Radio Interface (CPRI).

[0433] Specifically, the network-side device 300 in this application embodiment further includes: instructions or programs stored in memory 35 and executable on processor y4. The processor 34 calls the instructions or programs in memory 35 to execute the methods executed by each module shown in FIG7 and achieve the same technical effect. To avoid repetition, it will not be described in detail here.

[0434] This application also provides a readable storage medium storing a program or instructions. When the program or instructions are executed by a processor, they implement the various processes of the above-described beam management OTA method embodiments and achieve the same technical effects. To avoid repetition, they will not be described again here.

[0435] The processor mentioned above is the processor in the terminal described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk. In some examples, the readable storage medium may be a non-transient readable storage medium.

[0436] This application embodiment also provides a chip, which includes a processor and a communication interface. The communication interface is coupled to the processor. The processor is used to run programs or instructions to implement the various processes of the above-described beam management OTA method embodiment and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0437] It should be understood that the chip mentioned in the embodiments of this application may also be referred to as a system-on-a-chip, system chip, chip system, or system-on-a-chip, etc.

[0438] This application also provides a computer program / program product, which is stored in a storage medium and executed by at least one processor to implement the various processes of the above-described beam management OTA method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0439] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0440] From the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of computer software products plus necessary general-purpose hardware platforms, and of course, they can also be implemented by hardware. The computer software product is stored in a storage medium (such as ROM, RAM, magnetic disk, optical disk, etc.) and includes several instructions to cause the terminal or network-side device to execute the methods described in the various embodiments of this application.

[0441] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other implementations under the guidance of this application without departing from the spirit and scope of the claims. All of these implementations are within the protection scope of this application.

Claims

1. A beam-managed over-the-air (OTA) testing method, the method comprising: The first device groups the configured M beams into N groups, where M and N are positive integers, and M is greater than or equal to N. The first device performs an OTA test based on the N groups of beams and obtains the test results.

2. The method according to claim 1, wherein, The first device groups the configured M beams, including: The first device groups the configured M beams according to the degree of correlation between the M beams; Alternatively, the first device may group the configured M beams according to a first instruction, wherein the first instruction is a beam grouping instruction from a second device or a device manufacturer, and the second device includes at least one of the following: a test device, a terminal device, or a network-side device; Alternatively, the first device may group the configured M beams into N groups based on the beam configuration information, wherein the beam configuration information includes at least one of the following: number of beams, beam identifier, beam direction, number of beam groups, beam group identifier, corresponding transmit beam in each beam group, channel model, number of probes, and probe position. Alternatively, the first device may group the configured M beams according to the protocol.

3. The method according to claim 2, wherein, The first device groups the configured M beams according to the degree of correlation between them, including: If X of the M beams satisfy the first condition, the first device divides the X beams into a group, and the beams in each of the N groups satisfy the first condition.

4. The method according to claim 3, wherein, The X beams satisfying the first condition include: After the X beams pass through the channel model, the correlation between the corresponding received signals satisfies at least one of the following: The angle of arrival of the received signals is in the same direction; The difference between the directions of the angle of arrival of the received signal is within a preset range; The angle of arrival of the highest power received signal is in the same direction; The difference between the direction of the angle of arrival of the maximum power received signal in the received signal is within a preset range; The second highest power received signals in the received signal have the same angle of arrival direction; The difference between the directions of the angle of arrival of the second highest power received signal in the received signal is within a preset range; After sorting the received signals by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, where Y is greater than 2 and less than Z, and Z is the number of received signals. The distance between the correlation matrices of the received signals is less than or equal to the first threshold. The collinearity value of the correlation matrix of the received signal is greater than or equal to the second threshold; The geodesic distance of the correlation matrix of the received signal is less than or equal to the third threshold; The angle of arrival includes at least one of the following: horizontal angle of arrival or azimuth angle, vertical angle of arrival or zenith angle, solid angle, and the angle of arrival of the received signal is the angle of arrival of the cluster or the radius of the channel receiver after the beam passes through the channel.

5. The method according to claim 4, wherein, The received signal includes any of the following: Received signals affected by the properties of the receiving antenna; Received signals that are not affected by the antenna properties at the receiving end; The receiver antenna attribute includes at least one of the following: Radiation pattern; Receiver gain; Beamforming; Antenna aperture; Antenna category; Antenna directivity and resolution; Antenna array configuration; Antenna insertion loss; Antenna return loss; The beam efficiency of the antenna; The antenna's half-power beamwidth.

6. The method according to any one of claims 1 to 5, wherein, The first device performs an OTA test based on the N groups of beams and obtains the test results, including: In the target test environment, the received signal of the target beam in the N groups of beams after passing through the channel model is measured to obtain the test results. The target test environment is a test environment with preset spatial or temporal characteristics synthesized in the target test area using a multi-probe anechoic chamber MPAC system.

7. The method according to any one of claims 1 to 6, wherein, Each of the N groups of beams corresponds to a set of probes, and each set of probes includes at least two probes. The probe configuration includes at least one of the following: the number of probes, the probe position, and the probe power weight.

8. The method according to claim 7, wherein, The spatial characteristics of the target test environment are quantified and described by power angle spectrum (PAS) or spatial correlation.

9. The method according to claim 7 or 8, wherein, The number and position of probes corresponding to each beam in each group of beams are the same.

10. The method according to any one of claims 1 to 7, wherein, Each of the N groups of beams corresponds to a probe configuration, and each probe configuration corresponds to a probe. The probe configuration includes at least one of the following: probe position and probe power weight.

11. The method according to claim 10, wherein, The spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, which includes the layer-1 reference signal transmission power L1-RSRP of the reference signal corresponding to the transmitted beam.

12. The method according to claim 10 or 11, wherein, The probe position corresponding to each beam in each group of beams is the same.

13. The method according to any one of claims 1 to 12, wherein, The test results include at least one of the following: The target predicted beam is identified as the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams. L1-RSRP of the target prediction beam; The L1-RSRP of the target measurement beam, wherein the target measurement beam is the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams; The identifier of the transmit beam selected after beam management is performed; L1-RSRP of the transmit beam selected after beam management is performed; The identifier of the transmit / receive beam pair selected after beam management is performed; Throughput; Block Error Rate (BLER); Bit error rate (BER); Delay; Performance information of the device under test; Wherein, the number of target predicted beams is greater than or equal to 1 and less than or equal to M, the number of target measured beams is greater than or equal to 1 and less than or equal to M, the number of transmit beams selected after beam management is greater than or equal to 1 and less than or equal to M, and the number of transmit / receive beam pairs selected after beam management is greater than or equal to 1 and less than or equal to M * number of receive beams.

14. The method according to any one of claims 1 to 13, wherein, After the first device performs an OTA test based on the N groups of beams and obtains the test results, the method further includes: The first device compares the test results with the expected target results; If the test result matches the expected target result, the first device determines that the OTA test has passed.

15. The method according to claim 14, wherein, The expected target result includes at least one of the following: The target predicted beam information obtained by the device under test in advance includes at least one of the following: L1-RSRP, beam identifier; The target predicted beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and a predefined margin, and the beam identifier; The target measurement beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and a predefined margin, and the beam identifier; Predefined target prediction beam information, which includes at least one of the following: L1-RSRP, beam identifier; Predefined target measurement beam information, which includes at least one of the following: L1-RSRP, beam identifier; Predefined throughput thresholds; Predefined BLER threshold or BER threshold; Predefined delay; A predefined beam prediction accuracy requirement, which includes the ratio of the number of correctly predicted beams to the total number of required predicted beams; Predefined L1-RSRP measurement accuracy requirements; Predefined L1-RSRP prediction accuracy requirements; The predefined target beam management information includes at least one of the following: the L1-RSRP of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the receive beam selected after beam management, the identifier of the beam pair selected after beam management, and the gain of the receive beam selected after beam management.

16. A testing system, the system comprising: An anechoic chamber, a channel simulator, and a base station simulator are provided. The anechoic chamber includes at least one probe and a device under test (DUT). The DUT transmits signals to the at least one probe via radiation. Each probe is connected to the channel simulator via a radio frequency wire. The channel simulator is connected to the base station simulator. The base station simulator is used to send test signals on the target beam in N groups of beams based on beam configuration information. The N groups of beams are obtained by grouping the configured M beams. The channel simulator is used to receive test signals from the base station simulator and process the test signals based on a preset channel model to simulate the target test environment. The at least one probe is used to receive the test signal processed by the channel simulator and send the test signal to the target test environment; The device under test (DUT) is configured to receive the test signal in the target test environment and process the test signal to obtain a test result, which is used to evaluate the performance of the DUT under specific channel conditions.

17. The system according to claim 16, wherein, Each of the N groups of beams corresponds to a set of probe configurations. The probe configuration includes at least one of the following: the number of probes, the probe position, and the probe power weight.

18. The system according to claim 16 or 17, wherein, The spatial characteristics of the target test environment are quantified and described using PAS or spatial correlation.

19. The system according to claim 17 or 18, wherein, The number and position of probes corresponding to each beam in each group of beams are the same.

20. The system according to claim 16, wherein, Each of the N beam groups corresponds to a probe configuration, and the probe configuration includes at least one of the following: probe position and probe power weight.

21. The system according to claim 20, wherein, The spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, the power of which includes the L1-RSRP of the reference signal corresponding to the transmitted beam.

22. The system according to claim 20 or 21, wherein, The probe positions corresponding to each of the N groups of beams are the same.

23. A beam-managed over-the-air (OTA) testing device, the device comprising: Processing module; The processing module is used to group the configured M beams into N groups of beams, where M and N are positive integers, and M is greater than or equal to N. The processing module is also used to perform OTA testing based on the N groups of beams and obtain test results.

24. The apparatus according to claim 23, wherein, The processing module is specifically used for: The first device groups the configured M beams according to the degree of correlation between the M beams; Alternatively, the first device may group the configured M beams according to a first instruction, wherein the first instruction is a beam grouping instruction from a second device or a device manufacturer, and the second device includes at least one of the following: a test device, a terminal device, or a network-side device; Alternatively, the first device may group the configured M beams into N groups based on the beam configuration information, wherein the beam configuration information includes at least one of the following: number of beams, beam identifier, beam direction, number of beam groups, beam group identifier, corresponding transmit beam in each beam group, channel model, number of probes, and probe position. Alternatively, the first device may group the configured M beams according to the protocol.

25. The apparatus according to claim 24, wherein, The processing module is specifically used to: if X beams out of the M beams meet the first condition, the first device divides the X beams into a group, and the beams in each of the N groups of beams meet the first condition.

26. The apparatus according to claim 25, wherein, The X beams satisfying the first condition include: After the X beams pass through the channel model, the correlation between the corresponding received signals satisfies at least one of the following: The angle of arrival of the received signals is in the same direction; The difference between the directions of the angle of arrival of the received signal is within a preset range; The angle of arrival of the highest power received signal is in the same direction; The difference between the direction of the angle of arrival of the maximum power received signal in the received signal is within a preset range; The second highest power received signals in the received signal have the same angle of arrival direction; The difference between the directions of the angle of arrival of the second highest power received signal in the received signal is within a preset range; After sorting the received signals by power from largest to smallest, the received signals with power at position Y have the same angle of arrival direction, where Y is greater than 2 and less than Z, and Z is the number of received signals. The distance between the correlation matrices of the received signals is less than or equal to the first threshold. The collinearity value of the correlation matrix of the received signal is greater than or equal to the second threshold; The geodesic distance of the correlation matrix of the received signal is less than or equal to the third threshold; The angle of arrival includes at least one of the following: horizontal angle of arrival or azimuth angle, vertical angle of arrival or zenith angle, solid angle, and the angle of arrival of the received signal is the angle of arrival of the cluster or the radius of the channel receiver after the beam passes through the channel.

27. The apparatus according to claim 26, wherein, The received signal includes any of the following: Received signals affected by the properties of the receiving antenna; Received signals that are not affected by the antenna properties at the receiving end; The receiver antenna attribute includes at least one of the following: Radiation pattern; Receiver gain; Beamforming; Antenna aperture; Antenna category; Antenna directivity and resolution; Antenna array configuration; Antenna insertion loss; Antenna return loss; The beam efficiency of the antenna; The antenna's half-power beamwidth.

28. The apparatus according to any one of claims 23 to 27, wherein, The processing module is specifically used for: In the target test environment, the received signal of the target beam in the N groups of beams after passing through the channel model is measured to obtain the test results. The target test environment is a test environment with preset spatial or temporal characteristics synthesized in the target test area using a multi-probe anechoic chamber MPAC system.

29. The apparatus according to any one of claims 23 to 28, wherein, Each of the N groups of beams corresponds to a set of probes, and each set of probes includes at least two probes. The probe configuration includes at least one of the following: the number of probes, the probe position, and the probe power weight.

30. The apparatus according to claim 29, wherein, The spatial characteristics of the target test environment are quantified and described by power angle spectrum (PAS) or spatial correlation.

31. The apparatus according to claim 29 or 30, wherein, The number and position of probes corresponding to each beam in each group of beams are the same.

32. The apparatus according to any one of claims 23 to 29, wherein, Each of the N groups of beams corresponds to a probe configuration, and each probe configuration corresponds to a probe. The probe configuration includes at least one of the following: probe position and probe power weight.

33. The apparatus according to claim 32, wherein, The spatial characteristics of the target test environment are quantized and described by the power of the transmitted beam, which includes the layer-1 reference signal transmission power L1-RSRP of the reference signal corresponding to the transmitted beam.

34. The apparatus according to claim 32 or 33, wherein, The probe positions corresponding to each of the N groups of beams are the same.

35. The apparatus according to any one of claims 23 to 34, wherein, The test results include at least one of the following: The target predicted beam is identified as the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams. L1-RSRP of the target prediction beam; The L1-RSRP of the target measurement beam, wherein the target measurement beam is the predicted beam determined after performing OTA beam measurement on the target beam in the N groups of beams; The identifier of the transmit beam selected after beam management is performed; L1-RSRP of the transmit beam selected after beam management is performed; The identifier of the transmit / receive beam pair selected after beam management is performed; Throughput; Block Error Rate (BLER); Bit error rate (BER); Delay; Wherein, the number of target predicted beams is greater than or equal to 1 and less than or equal to M, the number of target measured beams is greater than or equal to 1 and less than or equal to M, the number of transmit beams selected after beam management is greater than or equal to 1 and less than or equal to M, and the number of transmit / receive beam pairs selected after beam management is greater than or equal to 1 and less than or equal to M * number of receive beams.

36. The apparatus according to any one of claims 23 to 35, wherein, The processing module is also used to perform OTA testing based on the N groups of beams, and after obtaining the test results, compare the test results with the expected target results; The processing module is further configured to determine that the OTA test has passed if the test result matches the expected target result.

37. The apparatus according to claim 36, wherein, The expected target result includes at least one of the following: The target predicted beam information obtained by the device under test in advance includes at least one of the following: L1-RSRP, beam identifier; The target predicted beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and a predefined margin, and the beam identifier; The target measurement beam information obtained in advance by the reference measurement antenna includes at least one of the following: the sum of L1-RSRP measured by the reference antenna and a predefined margin, and the beam identifier; Predefined target prediction beam information, which includes at least one of the following: L1-RSRP, beam identifier; Predefined target measurement beam information, which includes at least one of the following: L1-RSRP, beam identifier; Predefined throughput thresholds; Predefined BLER threshold or BER threshold; Predefined delay; A predefined beam prediction accuracy requirement, which includes the ratio of the number of correctly predicted beams to the total number of required predicted beams; Predefined L1-RSRP measurement accuracy requirements; Predefined L1-RSRP prediction accuracy requirements; The predefined target beam management information includes at least one of the following: the L1-RSRP of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the transmit beam selected after beam management, the identifier of the receive beam selected after beam management, the identifier of the beam pair selected after beam management, and the gain of the receive beam selected after beam management.

38. A communication device comprising a processor and a memory, the memory storing a program or instructions executable on the processor, the program or instructions, when executed by the processor, implementing the steps of the beam management OTA testing method as claimed in any one of claims 1 to 15.

39. A readable storage medium storing a program or instructions that, when executed by a processor, implement the steps of the beam-managed OTA testing method as described in any one of claims 1-15.

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