Self-adhesion test device for wires

Abstract

A self-adhesion test device for wires, the self-adhesion test device comprising a supporting base frame (1), a test box (2), and a temperature regulation structure, wherein the test box (2) is fixedly connected to the upper end surface of the supporting base frame (1), a placement cavity (12) is provided at the lower portion of the test box (2), and a sealed cavity with a sealing door is provided at the upper portion of the test box (2), with the sealed cavity being divided by partition boards (3) into a high-temperature chamber (4), a normal-temperature chamber (5) and a low-temperature chamber (6) in sequence from left to right; a fixing assembly (13) and an adhesive plate (15) are provided in each of the high-temperature chamber (4), the normal-temperature chamber (5) and the low-temperature chamber (6), and the adhesive plate (15) is located at the lower end of the fixing assembly (13) and is elastically and slidably connected to the inner wall of the test box (2); connecting side plates (16) are symmetrically connected to both left and right sides of the bottom of each adhesive plate (15), the connecting side plates (16) extend through the bottom wall of the sealed cavity and extend into the placement cavity (12), and the ends of the connecting side plates (16) that extend into the placement cavity (12) are connected to a placement seat (17) inside the placement cavity (12), the placement seat (17) being provided with placement slots (18) for placing weights; and the temperature regulation structure is mounted on the upper end surface of the test box (2) and is configured to regulate the temperatures in the high-temperature chamber (4) and the low-temperature chamber (6).

Description

Experimental apparatus for self-adhesion of wires Technical Field

[0001] This application relates to the field of wire self-adhesion testing technology, and for example to a wire self-adhesion testing apparatus. Background Technology

[0002] In the electrical field, the performance of wires is crucial. With the continuous development of technology, the requirements for wires are also increasing. Among them, the self-adhesion of wires has become an important characteristic indicator. Its self-adhesion directly affects the connection reliability, installation convenience, and stability of wires in specific environments. For example, in some complex wiring scenarios, wires with good self-adhesion can be better fixed in specific positions, reducing the risk of loosening and displacement, thereby improving the safety and reliability of electrical systems.

[0003] In related technologies, the self-adhesion test of conductors is generally conducted using simple and crude methods such as manual pulling and visual inspection. The force of manual pulling is difficult to control precisely, and different operators apply different pulling forces, resulting in large differences in the results. Visual inspection relies entirely on human subjective judgment and lacks objective quantitative standards, resulting in low accuracy of the test results. In addition, it is impossible to simulate and evaluate the self-adhesion of conductors under different temperature environmental conditions.

[0004] Summary of the Invention

[0005] This application provides a test apparatus for the self-adhesion of wires to address the shortcomings of related technologies.

[0006] This application provides a test apparatus for the self-adhesion of wires, including a supporting base frame;

[0007] The test chamber is fixedly connected to the upper surface of the supporting base. The lower part of the test chamber has a placement cavity, and the upper part of the test chamber is a sealed cavity with a sealing door. The sealed cavity is divided into a high-temperature cavity, a normal-temperature cavity, and a low-temperature cavity from left to right by a partition. The high-temperature cavity, the normal-temperature cavity, and the low-temperature cavity are respectively provided with a fixing component and an adhesive plate. The adhesive plate is located at the lower end of the fixing component and is configured to be elastically slidably connected to the inner wall of the test chamber. The bottom left and right sides of the adhesive plate are symmetrically connected with connecting side plates. The connecting side plates penetrate the bottom wall of the sealed cavity and extend into the interior of the placement cavity. One end of the connecting side plate extending into the interior of the placement cavity is connected to a placement seat inside the placement cavity. The placement seat has a placement groove for placing weights.

[0008] A temperature regulating structure is installed on the upper surface of the test chamber and is configured to regulate the temperature inside the high-temperature chamber and the low-temperature chamber.

[0009] Optionally, the fixing component includes a fixing seat, a locking block, a block groove, a movable block, and a threaded rod;

[0010] The fixed base is fixedly connected to the inner wall of the test chamber. The front end of the fixed base is provided with a locking block. A movable block is fixedly connected to one side of the outer wall of the locking block. The movable block is located in the slot opened in the inner wall of the fixed base. One end of the threaded rod facing the inner wall of the test chamber passes through the slot and the movable block and is threadedly connected to the movable block. The other end of the threaded rod away from the inner wall of the test chamber is connected to a protrusion to abut against the fixed base.

[0011] Optionally, the fixing component further includes a limiting block fixedly connected to the other side of the outer wall of the card block, and the inner side wall of the fixing seat corresponding to the limiting block is provided with a limiting groove adapted to the limiting block.

[0012] Optionally, the temperature regulation structure includes a hot air blower and a cold air blower. The outlet of the hot air blower is connected to a hot air pipe that communicates with the interior of the high-temperature chamber, and the outlet of the cold air blower is connected to a cold air pipe that communicates with the interior of the low-temperature chamber. Temperature sensors are installed inside the high-temperature chamber and the low-temperature chamber, respectively.

[0013] Optionally, a first exhaust pipe and a second exhaust pipe are respectively connected to the outer wall of the test chamber. The first exhaust pipe passes through the test chamber and extends into the interior of the high-temperature chamber, and the second exhaust pipe passes through the test chamber and extends into the interior of the low-temperature chamber. Switch valves are respectively installed on the first exhaust pipe and the second exhaust pipe.

[0014] Optionally, the high-temperature chamber, the room-temperature chamber, and the low-temperature chamber are each provided with a support structure. The support structure is located between the fixing component and the adhesive plate, and the support structure includes a fixing plate fixedly connected to the inner wall of the test chamber. Two first support rods symmetrically connected to the upper part of the fixing plate are fixedly connected to the upper part of the fixing plate, and a first sliding roller is connected between the two first support rods.

[0015] Optionally, the support structure further includes two second support rods symmetrically fixedly connected to the lower part of the fixed plate and located at the lower ends of the two first support rods, with a second sliding roller connected between the two second support rods. Attached Figure Description

[0016] The accompanying drawings used in the embodiments will be briefly described below.

[0017] Figure 1 is one of the overall structural schematic diagrams of the wire self-adhesion experimental device provided in the embodiment of this application;

[0018] Figure 2 is a second schematic diagram of the overall structure of the wire self-adhesion experimental device provided in the embodiment of this application;

[0019] Figure 3 is a cross-sectional schematic diagram of the test chamber provided in an embodiment of this application;

[0020] Figure 4 is a schematic diagram of the support structure provided in an embodiment of this application;

[0021] Figure 5 is a cross-sectional schematic diagram of the fixing seat provided in the embodiment of this application.

[0022] Explanation of reference numerals in the attached figures:

[0023] 1. Support frame; 2. Test chamber; 3. Partition; 4. High-temperature chamber; 5. Normal-temperature chamber; 6. Low-temperature chamber; 7. Hot air blower; 8. Hot air duct; 9. Cold air blower; 10. Cold air duct;

[0024] 11. Temperature sensor; 12. Placement cavity; 13. Fixing assembly; 131. Fixing base; 132. Locking block; 133. Block groove; 134. Movable block; 135. Threaded rod; 136. Protrusion; 137. Limiting groove; 138. Limiting block; 14. Support structure; 141. Fixing plate; 142. First support rod; 143. First sliding roller; 144. Second support rod; 145. Second sliding roller; 15. Adhesive plate; 16. Connecting side plate; 17. Placement base; 18. Placement groove; 19. Sliding groove;

[0025] 20. Slider; 21. First exhaust pipe; 22. Second exhaust pipe. Detailed Implementation

[0026] This application will now be described in conjunction with the accompanying drawings.

[0027] This application provides a test apparatus for the self-adhesion of a wire, as shown in Figures 1-3, comprising:

[0028] A support frame 1 is provided, and a test chamber 2 with a hinged, sealed door is fixedly connected to the upper surface of the support frame 1. The upper part of the test chamber 2 is a sealed cavity with a sealed door. A partition 3 is fixedly connected inside the test chamber 2. The sealed cavity is divided into a high-temperature cavity 4, a normal-temperature cavity 5, and a low-temperature cavity 6 from left to right by the partition 3. A placement cavity 12 is provided at the lower end of the test chamber 2. Fixing components 13 are respectively provided inside the high-temperature cavity 4, the normal-temperature cavity 5, and the low-temperature cavity 6. An adhesive plate 15 is provided at the lower end of the fixing component 13. The adhesive plate 15 can be slidably connected to the test chamber 2. The inner wall of the adhesive plate 15 has connecting side plates 16 symmetrically connected to the bottom left and right sides. The connecting side plates 16 penetrate the bottom wall of the sealed cavity and extend into the interior of the placement cavity 12. One end of the connecting side plates 16 extending into the interior of the placement cavity 12 is connected to the placement seat 17 inside the placement cavity 12. The inner surface wall of the placement cavity 12 is provided with a sliding groove 19. A slider 20 that slides in the sliding groove 19 is inserted inside the sliding groove 19. The end of the slider 20 away from the sliding groove 19 is fixedly connected to the placement seat 17. The placement seat 17 is provided with a placement groove 18 for placing weights.

[0029] Referring to Figure 5, the fixing assembly 13 includes a fixing seat 131 fixedly connected to the inner wall of the test chamber 2. The front end of the fixing seat 131 is provided with a locking block 132. A movable block 134 is fixedly connected to one side of the outer wall of the locking block 132. The movable block 134 is located in a block groove 133 opened in the inner side wall of the fixing seat 131. A threaded rod 135 is connected inside the block groove 133. One end of the threaded rod 135 facing the inner wall of the test chamber 2 passes through the block groove 133 and the movable block 134 and is threadedly connected to the movable block 134. The other end of the threaded rod 135 away from the inner wall of the test chamber 2 is connected to a protrusion 136 to abut against the fixing seat 131.

[0030] The fixing component 13 also includes a limiting block 138 fixedly connected to the other side of the outer wall of the card block 132, and the inner side wall of the fixing seat 131 corresponding to the limiting block 138 is provided with a limiting groove 137 adapted to the limiting block 138.

[0031] During the test, one end of the wire is inserted into the fixed base 131. Then, a flathead tool is taken and one end is inserted into the flathead groove on the protrusion 136. Then, the flathead tool is turned to drive the threaded rod 135 to rotate. At this time, the movable block 134 is threadedly engaged with the threaded rod 135. The movable block 134 moves in the block groove 133, and the limiting block 138 moves in the limiting groove 137, which drives the locking block 132 to lock onto the surface of the wire, firmly fixing one end of the wire. Then, the other end of the wire is attached to the adhesive groove of the adhesive plate 15 (the adhesive plate 15 can be a metal plate, plastic plate, etc.). Weights are placed into the placement groove 18 in the placement base 17 one by one. The weight is recorded each time the weights are placed until the wire begins to detach from the adhesive plate 15. When the placement base 17 is observed to move downward, the total weight at this time is recorded, and the maximum self-adhesive force of the wire can be obtained.

[0032] Referring to Figures 1-3, the test chamber 2 is equipped with a temperature regulation structure, which includes a hot air blower 7 and a cold air blower 9 installed on the upper surface of the test chamber 2. The air outlet of the hot air blower 7 is connected to a hot air pipe 8 that connects to the inside of the high-temperature chamber 4, and the air outlet of the cold air blower 9 is connected to a cold air pipe 10 that connects to the inside of the low-temperature chamber 6. Temperature sensors 11 are installed inside the high-temperature chamber 4 and the low-temperature chamber 6 respectively.

[0033] Through the above technical solution:

[0034] In use, turn on the hot air blower 7 and the cold air blower 9. The hot air and cold air enter the high-temperature chamber 4 and the low-temperature chamber 6 through the hot air pipe 8 and the cold air pipe 10, respectively. The temperature in the high and low temperature chambers is monitored by the temperature sensor 11. During the test, take three test leads and put them into the high-temperature chamber 4, the room temperature chamber 5 and the low-temperature chamber 6 in sequence. This allows the self-adhesion test of the leads to be performed on the leads under different temperature conditions at the same time. This can effectively avoid the time consumption of testing under each temperature condition and improve the experimental efficiency. (When conducting the test at the same time, three operators can place the weights at the same time. When one operator is operating, a timer is set to test the leads under different temperature conditions in sequence. Record the time period from the start of the test to the descent of the placement seat 17. The self-adhesion performance of the leads under different temperature conditions can be evaluated by the time record.)

[0035] Referring to Figures 1 and 2, the outer walls of the test chamber 2 are respectively connected to a first exhaust pipe 21 and a second exhaust pipe 22. The first exhaust pipe 21 passes through the test chamber 2 and extends into the interior of the high-temperature chamber 4, and the second exhaust pipe 22 passes through the test chamber 2 and extends into the interior of the low-temperature chamber 6. Switch valves are respectively installed on the first exhaust pipe 21 and the second exhaust pipe 22.

[0036] After the experiment, the first exhaust pipe 21 and the second exhaust pipe 22 were opened in sequence, so that the heat in the high-temperature chamber 4 was discharged through the first exhaust pipe 21 and the cold air in the low-temperature chamber 6 was discharged through the second exhaust pipe 22, thus avoiding the discomfort caused by heat and cold air when the operator opened the sealed door to take the wire.

[0037] This application provides a wire self-adhesion test device as shown in Figures 3 and 4. The test chamber 2 is provided with a support structure 14 inside. For example, the high temperature chamber 4, the normal temperature chamber 5 and the low temperature chamber 6 are respectively provided with support structures 14. The support structure 14 is located between the fixing component 13 and the adhesive plate 15. The support structure 14 includes a fixing plate 141 fixedly connected to the inner wall of the test chamber 2. Two first support rods 142 are fixedly connected to the upper part of the fixing plate 141. A first sliding roller 143 is connected between the two first support rods 142.

[0038] The support structure 14 also includes two second support rods 144 that are symmetrically fixed to the lower part of the fixed plate 141 and located at the lower ends of the two first support rods 142, and a second sliding roller 145 is connected between the two second support rods 144.

[0039] Through the above technical solution:

[0040] After one end of the wire is fixed to the fixing component 13, the other end of the wire is then wound around the first sliding roller 143 and the second sliding roller 145 in sequence. This operation can support the wire segment between the fixing component 13 and the adhesive plate 15, ensuring that the wire maintains a constant tension during the experiment. This avoids inaccurate test results due to the wire being in a slack state. In addition, constant tension can also reduce the deformation or displacement of the wire during the experiment, effectively reducing test errors and improving the accuracy and reliability of the experiment.

[0041] In summary:

[0042] 1. By setting up test components, three different test chambers, and a temperature control structure, the traditional manual pulling and visual inspection testing methods are improved into semi-mechanized testing. During the experiment, there is no need to use manual pulling and visual inspection. The force applied to the wire can be precisely controlled, avoiding the situation where inconsistent force during manual pulling leads to large differences in test results. It also does not rely on visual judgment, reducing the subjectivity of human judgment and improving the accuracy of test results. In addition, the three different test chambers are high temperature, room temperature, and low temperature environments, respectively. They can conduct self-adhesion tests on the wire under different temperature conditions at the same time, which can effectively avoid the time consumption of testing under each temperature condition and improve experimental efficiency.

[0043] 2. By setting up a support structure, the experimental device can support the test lead wire. During the experiment, it can support the lead wire segment between the fixed component and the adhesive plate, ensuring that the lead wire maintains a constant tension during the experiment. This avoids inaccurate test results due to the lead wire being in a slack state. In addition, the constant tension can also reduce the deformation or displacement of the lead wire during the experiment, effectively reducing test errors and improving the accuracy and reliability of the experiment.

[0044] The foregoing has only described certain exemplary embodiments of this application by way of illustration. Those skilled in the art can modify the described embodiments in many different ways without departing from the spirit and scope of this application. Therefore, the foregoing drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of this application.

Claims

1. A test apparatus for the self-adhesion of wires, comprising: Support frame (1); The test chamber (2) is fixedly connected to the upper end face of the support base (1). The lower part of the test chamber (2) is provided with a placement cavity (12). The upper part of the test chamber (2) is a sealed cavity with a sealing door. The sealed cavity is divided into a high temperature cavity (4), a normal temperature cavity (5) and a low temperature cavity (6) from left to right by a partition (3). The high temperature cavity (4), the normal temperature cavity (5) and the low temperature cavity (6) are respectively provided with a fixing component (13) and an adhesive plate (15). The adhesive plate (15) is located on the fixing component. (13) is located at the lower end and is configured to be elastically slidably connected to the inner wall of the test chamber (2); the bottom left and right sides of the adhesive plate (15) are symmetrically connected with connecting side plates (16), the connecting side plates (16) penetrate the bottom wall of the sealing cavity and extend into the interior of the placement cavity (12), one end of the connecting side plates (16) extending into the interior of the placement cavity (12) is connected to the placement seat (17) inside the placement cavity (12), and the placement seat (17) is provided with a placement groove (18) for placing weights; A temperature regulating structure is installed on the upper surface of the test chamber (2) and is configured to regulate the temperature inside the high-temperature chamber (4) and the low-temperature chamber (6).

2. The experimental apparatus for testing the self-adhesion of a conductor according to claim 1, wherein, The temperature regulation structure includes a hot air blower (7) and a cold air blower (9). The outlet of the hot air blower (7) is connected to a hot air pipe (8) that connects to the inside of the high-temperature chamber (4). The outlet of the cold air blower (9) is connected to a cold air pipe (10) that connects to the inside of the low-temperature chamber (6). Temperature sensors (11) are installed inside the high-temperature chamber (4) and the low-temperature chamber (6), respectively.

3. The experimental apparatus for the self-adhesion of wires according to claim 1, wherein, The high-temperature chamber (4), the normal-temperature chamber (5) and the low-temperature chamber (6) are respectively provided with a support structure (14). The support structure (14) is located between the fixing component (13) and the adhesive plate (15). The support structure (14) includes a fixing plate (141) fixedly connected to the inner wall of the test chamber (2). Two first support rods (142) are fixedly connected to the upper part of the fixing plate (141) and are symmetrically connected. A first sliding roller (143) is connected between the two first support rods (142).

4. The experimental apparatus for the self-adhesion of wires according to claim 3, wherein, The support structure (14) further includes two second support rods (144) symmetrically fixedly connected to the lower part of the fixed plate (141) and located at the lower end of the two first support rods (142), and a second sliding roller (145) is connected between the two second support rods (144).

5. The experimental apparatus for the self-adhesion of wires according to claim 1, wherein, The fixing component (13) includes a fixing base (131), a locking block (132), a block groove (133), a movable block (134), and a threaded rod (135); The fixing seat (131) is fixedly connected to the inner wall of the test chamber (2). The front end is provided with a locking block (132), and a movable block (134) is fixedly connected to one side of the outer wall of the locking block (132). The movable block (134) is located in the block groove (133) opened on the inner side wall of the fixed seat (131). One end of the threaded rod (135) facing the inner surface wall of the test chamber (2) passes through the block groove (133) and the movable block (134), and is threadedly connected to the movable block (134). The other end of the threaded rod (135) away from the inner surface wall of the test chamber (2) is connected to a protrusion (136) to abut against the fixed seat (131).

6. The experimental apparatus for the self-adhesion of wires according to claim 5, wherein, The fixing component (13) further includes a limiting block (138) fixedly connected to the other side of the outer wall of the card block (132), and the inner side wall of the fixing seat (131) corresponding to the limiting block (138) is provided with a limiting groove (137) adapted to the limiting block (138).

7. The experimental apparatus for the self-adhesion of wires according to claim 1, wherein, The inner wall of the placement cavity (12) is provided with a groove (19), and a slider (20) is inserted inside the groove (19) to slide within the groove (19). The end of the slider (20) away from the groove (19) is fixedly connected to the placement seat (17).

8. The experimental apparatus for the self-adhesion of wires according to claim 1, wherein, The outer walls of the test chamber (2) are respectively connected to a first exhaust pipe (21) and a second exhaust pipe (22). The first exhaust pipe (21) passes through the test chamber (2) and extends into the interior of the high-temperature chamber (4). The second exhaust pipe (22) passes through the test chamber (2) and extends into the interior of the low-temperature chamber (6). Switch valves are respectively installed on the first exhaust pipe (21) and the second exhaust pipe (22).

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