Double-sided high-temperature superconducting tape critical current testing device, testing system and testing method

Abstract

A double-sided high-temperature superconducting tape critical current testing device, comprising: a low-temperature box body (1) having an accommodating space, wherein an unwinding roller (101) and a winding roller (102) are provided in the accommodating space, the unwinding roller (101) and the winding roller (102) are respectively adapted to wind a double-sided high-temperature superconducting tape (5) to be tested, and said double-sided high-temperature superconducting tape (5) has a first surface (501) and a second surface (502) which are arranged correspondingly; a first measurement assembly (2), the first measurement assembly (2) being adapted to measure the critical current and voltage of the first surface (501) of said double-sided high-temperature superconducting tape (5); and a second measurement assembly (3), the second measurement assembly (3) being adapted to measure the critical current and voltage of the second surface (502) of said double-sided high-temperature superconducting tape (5). The device solves the problem that during the measurement of a double-sided superconducting tape, before the quench of a YBCO1 superconducting layer, a current does not pass through a resistor layer and thus cannot reach a YBCO2 superconducting layer, and the quench will not be detected by means of a voltage, thereby causing a critical current measurement error.

Description

Test apparatus, test system and test method for critical current of double-sided high-temperature superconducting tape

[0001] Cross-reference to related applications

[0002] This application claims priority to Chinese Patent Application No. 202411584225.6, filed on November 7, 2024, entitled "Critical Current Testing Device, Testing System and Testing Method for Double-Sided High-Temperature Superconducting Strips", the entire contents of which are incorporated herein by reference. Technical Field

[0003] This application relates to the field of critical current testing technology for superconducting tapes, specifically to a critical current testing device, testing system, and testing method for double-sided high-temperature superconducting tapes. Background Technology

[0004] In a single-layer superconducting tape structure, only the YBCO (YBa2Cu3O7-δ) layer possesses superconductivity. Both the upper and lower surfaces of this superconducting layer exhibit resistance. To eliminate measurement errors caused by this resistance, the four-lead method is used. In this method, the current supplied by the current source is Is, the voltage measurement signal current is Ig (which is negligible), and the current entering the superconducting layer is Is - Ig. This four-lead method effectively eliminates measurement errors caused by the surface resistance R1 to R4 of the tape. The current applied by the current source and the voltage sampled are located at the same YBCO layer.

[0005] The double-sided superconducting tape has two superconducting layers (YBCO1 and YBCO2) with a resistive layer between them, and the surface encapsulation layer also contains resistance. When the current source's input current (Is) travels through the YBCO1 superconducting layer, the voltage measurement signal current travels through the YBCO2 superconducting layer. Since the currents from the current source and voltage source are not at the same location, this causes errors in the numerical measurement methods of voltage and current, thus affecting the accuracy of the test results. If the current before the YBCO1 superconducting layer loses quench cannot pass through the resistive layer between the two superconducting layers and thus cannot reach the YBCO2 superconducting layer, the voltage will not detect quench, leading to errors in the critical current measurement. Summary of the Invention

[0006] In view of this, this application provides a critical current testing device, testing system and testing method for bifacial high-temperature superconducting tapes to solve the problem that when measuring bifacial superconducting tapes, the pre-quench current of the YBCO1 superconducting layer cannot pass through the resistive layer and reach the YBCO2 superconducting layer, and the voltage will not detect the quench, thus causing the critical current measurement error.

[0007] In a first aspect, this application provides a critical current testing device for double-sided high-temperature superconducting tapes, comprising:

[0008] The low-temperature chamber has a receiving space, and the receiving space is provided with an unwinding roller and a winding roller, which are respectively adapted to wind the double-sided high-temperature superconducting tape to be tested;

[0009] A first measuring component is disposed inside the cryogenic chamber. The first measuring component is adapted to measure the current and voltage on the first surface of the double-sided high-temperature superconducting tape to be tested.

[0010] The second measuring component is located inside the cryogenic chamber and is adapted to measure the current and voltage on the second surface of the double-sided high-temperature superconducting tape to be tested.

[0011] By setting a first measuring component on the first surface and a second measuring component on the second surface of the double-sided high-temperature superconducting tape to be tested, the critical current and voltage of the first surface and the critical current and voltage of the second surface are measured respectively. The values ​​of the two surfaces are mutually verified to ensure that the measured critical current does not prematurely exceed the limit, thus preventing false judgments of exceeding the limit.

[0012] In some embodiments, the first measuring component includes a first current source electrode wheel and a second current source electrode wheel, the first current source electrode wheel and the second current source electrode wheel being adapted to contact the first surface of the double-sided high-temperature superconducting tape to be measured, respectively, and the first current source electrode wheel and the second current source electrode wheel being connected to an ammeter via circuits.

[0013] In some embodiments, the first measuring component includes a first voltage measuring electrode wheel and a second voltage measuring electrode wheel, the first voltage measuring electrode wheel and the second voltage measuring electrode wheel being adapted to contact the first surface of the double-sided high-temperature superconducting tape to be tested, respectively, and the first voltage measuring electrode wheel and the second voltage measuring electrode wheel being connected to a voltmeter via lines.

[0014] In some embodiments, a first voltage measuring electrode wheel and a second voltage measuring electrode wheel are respectively provided between the first current source electrode wheel and the second current source electrode wheel, and the first current source electrode wheel, the second current source electrode wheel, the first voltage measuring electrode wheel, and the second voltage measuring electrode wheel are all set at the same height.

[0015] In some embodiments, the second measuring component includes a third current source electrode wheel and a fourth current source electrode wheel, the third current source electrode wheel and the fourth current source electrode wheel being adapted to contact the second surface of the double-sided high-temperature superconducting tape to be measured, the third current source electrode wheel and the fourth current source electrode wheel being connected to an ammeter via circuits, the third current source electrode wheel being disposed between the first current source electrode wheel and the first voltage measuring electrode wheel, the fourth current source electrode wheel being disposed between the second voltage measuring electrode wheel and the second current source electrode wheel, and the height of the third current source electrode wheel and the fourth current source electrode wheel being higher than that of the first current source electrode wheel.

[0016] In some embodiments, the second measuring component includes a third voltage measuring electrode wheel and a fourth voltage measuring electrode wheel, the third voltage measuring electrode wheel and the fourth voltage measuring electrode wheel being adapted to contact the second surface of the double-sided high-temperature superconducting tape to be tested, the third voltage measuring electrode wheel and the fourth voltage measuring electrode wheel being connected to a voltmeter via circuits, the third voltage measuring electrode wheel and the fourth voltage measuring electrode wheel being disposed between the first voltage measuring electrode wheel and the second voltage measuring electrode wheel, and the height of the third voltage measuring electrode wheel and the fourth voltage measuring electrode wheel being higher than that of the first voltage measuring electrode wheel.

[0017] Secondly, this application also provides a critical current testing system for double-sided high-temperature superconducting tapes, including the aforementioned critical current testing device for double-sided high-temperature superconducting tapes.

[0018] In some embodiments, a cooling device is also included, which includes a cooling pipeline, a cryogenic fan, a liquid nitrogen heat exchanger, and a refrigeration heat exchanger. The cooling pipeline is provided with a cryogenic fan, a liquid nitrogen heat exchanger, and a refrigeration heat exchanger, and the refrigeration inlet and refrigeration outlet of the cooling pipeline are respectively located on both sides of the cryogenic chamber.

[0019] In some embodiments, the cooling pipe is adapted to have helium flowing inside, the cryogenic fan provides power for the helium, the refrigeration heat exchanger is provided with a cryogenic chiller and a refrigeration box, the cryogenic chiller is connected to the refrigeration column of the refrigeration box, and a heating wire is provided at the cold air outlet of the refrigeration box.

[0020] Thirdly, this application also provides a testing method for a critical current testing device for double-sided high-temperature superconducting tape. The double-sided high-temperature superconducting tape to be tested moves from the unwinding roller toward the winding roller. A first measuring component measures the critical current and voltage of the first surface, and a second measuring component measures the critical current and voltage of the second surface. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0022] Figure 1 is a schematic diagram of the critical current testing system for double-sided high-temperature superconducting tape according to an embodiment of this application;

[0023] Figure 2 is a schematic diagram of the positions of the first temperature measuring component, the second temperature measuring component, the double-sided high-temperature superconducting tape to be tested, and the guide wheel inside the cryogenic chamber according to an embodiment of this application;

[0024] Figure 3 is a schematic diagram of a liquid nitrogen heat exchanger according to an embodiment of this application;

[0025] Figure 4 is a schematic diagram of a refrigeration heat exchanger according to an embodiment of this application;

[0026] Figure 5 is a schematic diagram of the testing principle of the double-sided high-temperature superconducting tape under test according to an embodiment of this application;

[0027] Figure 6 is a schematic diagram showing the connection between the first current source electrode wheel, the second current source electrode wheel, the third current source electrode wheel, the fourth current source electrode wheel and the data acquisition device in an embodiment of this application;

[0028] Figure 7 is a schematic diagram showing the connection between the first voltage measuring electrode wheel, the second voltage measuring electrode wheel, the third voltage measuring electrode wheel, the fourth voltage measuring electrode wheel, and the data acquisition device in an embodiment of this application.

[0029] Explanation of reference numerals in the attached drawings: 1. Low-temperature chamber; 101. Unwinding roller; 102. Rewinding roller; 103. Current and voltage display screen; 104. Guide wheel; 105. Meter counter wheel; 106. Length display screen; 107. Data acquisition unit; 108. Vacuum port; 109. Auxiliary wheel; 2. First measuring component; 201. First current source electrode wheel; 202. Second current source electrode wheel; 203. First voltage measuring electrode wheel; 204. Second voltage measuring electrode wheel; 3. Second measuring component; 301. Third current source electrode wheel; 302. Fourth current source electrode wheel; 303. Third voltage measuring electrode wheel; 304. Fourth voltage measuring electrode wheel; 4. Cooling device; 401. Cooling pipeline; 402. Cryogenic fan; 403. Liquid nitrogen heat exchanger; 4031. Liquid nitrogen heat exchange shell; 4032. Liquid nitrogen outlet; 4033. Liquid nitrogen inlet; 404. Refrigeration heat exchanger; 4041. Cryogenic chiller; 4042. Refrigeration box; 4043. Refrigeration column; 4044. Heating wire; 4045. Cold air outlet; 5. Double-sided high-temperature superconducting tape to be tested; 501. First surface; 502. Second surface; 503. First encapsulation layer; 504. Second encapsulation layer; 505. First superconducting layer; 506. Second superconducting layer; 507. Baseband layer; 6. Ammeter; 7. Voltmeter; 8. Switch. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0031] As shown in Figures 1 to 6, the critical current testing device for double-sided high-temperature superconducting tape provided in this embodiment mainly includes a cryogenic chamber 1, and a first measuring component 2 and a second measuring component 3 disposed inside the cryogenic chamber 1.

[0032] Specifically, the cryogenic chamber 1 has a receiving space, within which an unwinding roller 101 and a winding roller 102 are provided. The unwinding roller 101 and the winding roller 102 are respectively adapted to wind the double-sided high-temperature superconducting tape 5 to be tested. The double-sided high-temperature superconducting tape 5 to be tested has a correspondingly provided first surface 501 and second surface 502. A first measuring component 2 is provided inside the cryogenic chamber 1 and is adapted to measure the critical current and voltage of the first surface 501 of the double-sided high-temperature superconducting tape 5 to be tested. A second measuring component 3 is provided inside the cryogenic chamber 1 and is adapted to measure the critical current and voltage of the second surface 502 of the double-sided high-temperature superconducting tape 5 to be tested.

[0033] In this embodiment, a first measuring component 2 is set on the first surface 501 of the double-sided high-temperature superconducting tape 5 to be tested, and a second measuring component 3 is set on the second surface 502. The critical current and voltage of the first surface 501 and the critical current and voltage of the second surface 502 are measured respectively. The values ​​of the two surfaces are mutually verified to ensure that the measured critical current does not prematurely exceed the quench limit, thus avoiding false quenching. Even if the current before the YBCO1 superconducting layer exceeds the quench limit does not pass through the resistive layer and cannot reach the YBCO2 superconducting layer, the value obtained by measuring the first surface 501 and the second surface 502 is compared to avoid the problem of incorrect critical current measurement.

[0034] As shown in Figure 5, the double-sided high-temperature superconducting tape 5 to be tested in this application is configured sequentially from top to bottom along the height direction as a first encapsulation layer 503, a first superconducting layer 505, a base layer 507, a second superconducting layer 506, and a second encapsulation layer 504. The first encapsulation layer 503 has a first surface 501, and the second encapsulation layer 504 has a second surface 502. All three layers—the first encapsulation layer 503, the base layer 507, and the second encapsulation layer 504—have resistance. Specifically, the first surface 501 is the upper surface, the second surface 502 is the lower surface, and the base layer 507 has a relatively high resistance.

[0035] As shown in Figures 1, 2 and 5, in some embodiments, the first measuring component 2 includes a first current source electrode wheel 201 and a second current source electrode wheel 202. The first current source electrode wheel 201 and the second current source electrode wheel 202 are adapted to contact the first surface 501 of the double-sided high-temperature superconducting strip 5 to be measured, respectively. The first current source electrode wheel 201 and the second current source electrode wheel 202 are respectively connected to the ammeter 6 through lines.

[0036] In this embodiment, the first current source electrode wheel 201 and the second current source electrode wheel 202 serve as the positive and negative electrodes of the current source in contact with the first surface 501 of the double-sided high-temperature superconducting tape 5 under test. They are then connected to the ammeter 6 through a circuit to form a measurement circuit as shown in Figure 5 to measure the current value of the first surface 501.

[0037] As shown in Figures 1, 2 and 5, in some embodiments, the first measuring component 2 includes a first voltage measuring electrode wheel 203 and a second voltage measuring electrode wheel 204. The first voltage measuring electrode wheel 203 and the second voltage measuring electrode wheel 204 are adapted to contact the first surface 501 of the double-sided high-temperature superconducting tape 5 to be measured, respectively. The first voltage measuring electrode wheel 203 and the second voltage measuring electrode wheel 204 are respectively connected to the voltmeter 7 through lines.

[0038] In this embodiment, the first voltage measuring electrode wheel 203 and the second voltage measuring electrode wheel 204 serve as the positive and negative terminals of the power supply that the first surface 501 of the double-sided high-temperature superconducting tape 5 under test contacts. They are then connected to the voltmeter 7 through a circuit to form the measurement circuit shown in FIG5 to measure the voltage value of the first surface 501.

[0039] As shown in Figures 1 and 2, in some embodiments, a first voltage measuring electrode wheel 203 and a second voltage measuring electrode wheel 204 are respectively provided between the first current source electrode wheel 201 and the second current source electrode wheel 202, and the first current source electrode wheel 201, the second current source electrode wheel 202, the first voltage measuring electrode wheel 203, and the second voltage measuring electrode wheel 204 are all set at the same height.

[0040] In this embodiment, the positions of the current source electrode wheel and the voltage measuring electrode wheel are set to form a circuit for measuring current and voltage. The first current source electrode wheel 201, the second current source electrode wheel 202, the first voltage measuring electrode wheel 203, and the second voltage measuring electrode wheel 204 are all set at the same height to ensure that the electrode wheels of the first measuring component 2 are all in contact with the first surface 501 of the double-sided high-temperature superconducting tape 5 to be measured.

[0041] As shown in Figures 1, 2, and 5, in some embodiments, the second measuring component 3 includes a third current source electrode wheel 301 and a fourth current source electrode wheel 302. The third current source electrode wheel 301 and the fourth current source electrode wheel 302 are adapted to contact the second surface 502 of the double-sided high-temperature superconducting tape 5 to be measured, respectively. The third current source electrode wheel 301 and the fourth current source electrode wheel 302 are respectively connected to the ammeter 6 through lines. The third current source electrode wheel 301 is disposed between the first current source electrode wheel 201 and the first voltage measuring electrode wheel 203, and the fourth current source electrode wheel 302 is disposed between the second voltage measuring electrode wheel and the second current source electrode wheel 202. The height of both the third current source electrode wheel 301 and the fourth current source electrode wheel 302 is higher than that of the first current source electrode wheel 201.

[0042] In this embodiment, the third current source electrode wheel 301 and the fourth current source electrode wheel 302 serve as the positive and negative electrodes of the current source in contact with the second surface 502 of the double-sided high-temperature superconducting tape 5 under test. They are then connected to an ammeter 6 via a circuit to form the measurement circuit shown in Figure 5, used to measure the current value on the second surface 502. The heights of the third current source electrode wheel 301 and the fourth current source electrode wheel 302 are both higher than the first current source electrode wheel 201, ensuring that the third current source electrode wheel 301 and the fourth current source electrode wheel 302 contact the second surface 502 of the double-sided high-temperature superconducting tape 5 under test.

[0043] As shown in Figures 1, 2, and 5, in some embodiments, the second measuring component 3 includes a third voltage measuring electrode wheel 303 and a fourth voltage measuring electrode wheel 304. The third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304 are adapted to contact the second surface 502 of the double-sided high-temperature superconducting tape 5 to be measured, respectively. The third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304 are respectively connected to the voltmeter 7 through lines. The third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304 are both disposed between the first voltage measuring electrode wheel 203 and the second voltage measuring electrode wheel 204. The height of the third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304 is higher than that of the first voltage measuring electrode wheel 203.

[0044] In this embodiment, the third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304 serve as the positive and negative terminals of the power supply that contacts the second surface 502 of the double-sided high-temperature superconducting tape 5 under test. They are then connected to a voltmeter 7 via a circuit, forming the measurement circuit shown in Figure 5 to measure the voltage value of the second surface 502. The heights of both the third and fourth voltage measuring electrode wheels 303 and 304 are higher than the first voltage measuring electrode wheel 203 to ensure contact with the second surface 502. In this application, each line in the connection circuit between the measuring electrode wheels and the ammeter 6 or voltmeter 7 is equipped with a switch 8 to control the opening and closing of the line.

[0045] As shown in Figures 1 and 2, in some embodiments, a guide wheel 104 is also included. The guide wheel 104 is disposed between the third voltage measuring electrode wheel 303 and the fourth voltage measuring electrode wheel 304, and the height of the guide wheel 104 is set at the same height as the height of the first current source electrode wheel 201. The guide wheel 104 plays a guiding role. It should be noted that the third current source electrode wheel 301, the fourth current source electrode wheel 302, the third voltage measuring electrode wheel 303, and the fourth voltage measuring electrode wheel 304 are set at the same height. As shown in Figures 1 and 2, the system also includes a measuring wheel 105 and an auxiliary wheel 109. The measuring wheel 105 is used to calculate the length of the double-sided high-temperature superconducting tape 5 to be tested. The double-sided high-temperature superconducting tape 5 extending from the unwinding roller 101 passes through the measuring wheel 105 and then contacts the first current source electrode wheel 201. The double-sided high-temperature superconducting tape 5 extending from the second current source electrode wheel 202 passes through the auxiliary wheel 109 and then reaches the take-up roller 102. The direction of movement of the double-sided high-temperature superconducting tape to be tested is from the unwinding roller 101 toward the take-up roller 102, and passes sequentially through the first current source electrode wheel 201, the third current source electrode wheel 301, the first voltage measuring electrode wheel 203, the third voltage measuring electrode wheel 303, the guide wheel 104, the fourth voltage measuring electrode wheel 304, the second voltage measuring electrode wheel 204, the fourth current source electrode wheel 302, and the second current source electrode wheel 202.

[0046] As shown in Figures 1, 6, and 7, in some embodiments, the cryogenic chamber 1 is further equipped with a current and voltage display screen 103, a length display screen 106, and a data acquisition device 107. The data acquisition device 107 collects the values ​​from the ammeter 6 and voltmeter 7, respectively, and displays them on the current and voltage display screen 103. The measuring wheel 105 displays the measured length of the double-sided high-temperature superconducting strip 5 on the length display screen 106. As shown in Figure 1, the side of the cryogenic chamber 1 is also equipped with a vacuum port 108, which is connected to a vacuum pump. A power component is also included to drive the winding roller 102 to rotate. In this application, only pure helium can be used in the measurement environment. If air is mixed in, the air will condense into frost at low temperatures, thus affecting the measurement accuracy. Before the double-sided high-temperature superconducting tape 5 to be tested is cooled, a vacuum pump needs to be used to evacuate the cryogenic chamber 1 through the vacuum port 108, and then pure helium is injected.

[0047] According to an embodiment of this application, another aspect provides a critical current testing system for double-sided high-temperature superconducting tape, including the above-mentioned critical current testing device for double-sided high-temperature superconducting tape, and further including a cooling device 4.

[0048] As shown in Figure 1, the cooling device 4 includes a cooling pipe 401, a cryogenic fan 402, a liquid nitrogen heat exchanger 403, and a refrigeration heat exchanger 404. The cooling pipe 401 is equipped with a cryogenic fan 402, a liquid nitrogen heat exchanger 403, and a refrigeration heat exchanger 404. The refrigeration inlet and refrigeration outlet of the cooling pipe 401 are respectively located on both sides of the cryogenic chamber 1.

[0049] In this embodiment, the liquid nitrogen heat exchanger 403 cools the gas in the cooling pipe 401, and the refrigerator heat exchanger 404 further controls the temperature of the gas in the cooling pipe 401, so that the temperature of the gas flowing from the refrigerator heat exchanger 404 into the cryogenic chamber 1 remains stable. The refrigeration inlet and refrigeration outlet of the cooling pipe 401 are respectively located on both sides of the cryogenic chamber 1, so that the cooling gas in the cooling pipe 401 fills the entire cryogenic chamber 1.

[0050] As shown in Figures 1 and 4, the cooling pipe 401 is suitable for the flow of helium gas, the low-temperature fan 402 provides power for the flow of helium gas, the refrigeration heat exchanger 404 is equipped with a low-temperature chiller 4041 and a refrigeration box 4042, the low-temperature chiller 4041 is connected to the refrigeration column 4043 of the refrigeration box 4042, and a heating wire 4044 is provided at the cold air outlet 4045 of the refrigeration box 4042.

[0051] In this embodiment, helium is an inert gas, ensuring the safety of the entire cooling pipeline 401 and the cryogenic chamber 1. The cryogenic chiller 4041 and the cooling column 4043 of the refrigeration chamber 4042 are connected. Through the cooperation of the cooling column 4043 and the heating wire 4044, the temperature at the cold air outlet 4045 of the refrigeration chamber 4042 can be adjusted, thereby ensuring that the gas temperature entering the cryogenic chamber 1 remains stable.

[0052] As shown in Figure 3, the liquid nitrogen heat exchanger 403 is provided with a liquid nitrogen heat exchange shell 4031. The cooling pipe 401 is located inside the liquid nitrogen heat exchange shell 4031 and is arranged in a serpentine manner. The side wall of the liquid nitrogen heat exchange shell 4031 is provided with a liquid nitrogen inlet 4033 and a liquid nitrogen outlet 4032. Liquid nitrogen is suitable for being introduced into the liquid nitrogen inlet 4033 to exchange heat with the cooling gas in the cooling pipe 401 and reduce the temperature of the cooling gas.

[0053] To achieve automatic control, a controller is also included, which is connected to the power unit, meter wheel 105, data acquisition unit 107, length display screen 106, current and voltage display screen 103, low temperature fan 402, low temperature chiller 4041 and other circuits.

[0054] A testing method for a critical current testing device for double-sided high-temperature superconducting tapes includes the following steps:

[0055] 1) The vacuum pump extracts the air from the low-temperature chamber 1 through the vacuum port 108. After the vacuum is completed, pure helium is injected into the low-temperature chamber 1. The low-temperature fan 402 rotates to drive the helium in the cooling pipe 401 to circulate, so that the temperature inside the low-temperature chamber 1 is higher than or equal to 77K.

[0056] 2) When the temperature inside the cryogenic chamber 1 needs to be lower than 77K, liquid nitrogen is introduced into the liquid nitrogen inlet 4033 so that the temperature of the helium flowing out of the liquid nitrogen heat exchanger 403 from the cooling pipe 401 is a certain temperature (lower than 77K). When it is necessary to further cool the helium entering the refrigeration heat exchanger 404, the cryogenic chiller 4041 is started so that the refrigeration column 4043 further cools the helium in the refrigeration chamber 4042.

[0057] 3) When it is necessary to raise the temperature of the helium gas entering the heat exchanger 404 of the refrigerator, the temperature of the helium gas at the cold air outlet 4045 is raised by the heating wire 4044, so that the temperature of the helium gas at the cold air outlet 4045 is located in a certain temperature range of "20K-77K", thereby measuring the critical current value of the superconducting tape in the low temperature chamber 1 at that temperature.

[0058] 4) The above steps ensure that the temperature inside the low-temperature chamber 1 reaches the test temperature. During the measurement process, the power unit is activated, and the take-up roller 102 begins to wind up the double-sided high-temperature superconducting tape 5 to be tested. The tape moves from the unwinding roller 101 toward the take-up roller 102, passing sequentially through the meter counter 105, the first current source electrode roller 201, the third current source electrode roller 301, the first voltage measuring electrode roller 203, the third voltage measuring electrode roller 303, the guide roller 104, the fourth voltage measuring electrode roller 304, the second voltage measuring electrode roller 204, the fourth current source electrode roller 302, the second current source electrode roller 202, and the auxiliary roller 109, finally reaching the take-up roller. Simultaneously, the meter counter 105 feeds back a signal to the controller, which then displays it on the length display screen 106. After the take-up roller 102 stops rotating a certain distance, the critical voltage and critical current at a certain temperature are measured. When it is necessary to test the first... When measuring the current and voltage of surface 501, turn on switch 8 on the first surface 501 circuit connected to ammeter 6 and voltmeter 7, and turn off switch 8 on the second surface 502 circuit connected to ammeter 6 and voltmeter 7 to perform the test. When testing the current and voltage of the second surface 502, turn on switch 8 on the second surface 502 circuit connected to ammeter 6 and voltmeter 7, and turn off switch 8 on the first surface 501 circuit connected to ammeter 6 and voltmeter 7 to perform the test. After the test is completed, the take-up roller 102 rotates a certain distance to start the next measurement. Ammeter 6 and voltmeter 7 transmit signals to data acquisition unit 107, which feeds back the signals to the controller. The controller then displays the data on the current and voltage display screen 103, allowing on-site personnel to observe the data of the first measuring component 2 and the second measuring component 3, and facilitating cross-validation of the data.

[0059] It should be noted that the measured temperature in step 4) refers to any temperature value within the range of "20K-77K".

[0060] The critical current testing device, testing system and testing method for double-sided high-temperature superconducting tape provided in this application have the following advantages: (1) By setting the first measuring component 2 and the second measuring component 3, the critical current and voltage of the first surface 501 and the critical current and voltage of the second surface 502 are measured respectively. The values ​​of the two surfaces are mutually verified to ensure that the measured critical current does not fail prematurely and cause false judgment of failure; (2) The temperature inside the low-temperature chamber 1 can be located at any temperature value in the range of "20K-77K", which can realize the measurement of the critical current of double-sided high-temperature superconducting tape at any temperature value of "20K-77K", and the measurement range is wider.

[0061] Although embodiments of this application have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of this application, and all such modifications and variations fall within the scope defined by the appended claims.

Claims

1. A critical current testing device for double-sided high-temperature superconducting tapes, characterized in that, include: The low-temperature chamber (1) has a receiving space, and the receiving space is provided with an unwinding roller (101) and a winding roller (102). The unwinding roller (101) and the winding roller (102) are respectively adapted to wind the double-sided high-temperature superconducting tape (5) to be tested. The double-sided high-temperature superconducting tape (5) to be tested has a first surface (501) and a second surface (502) respectively. The first measuring component (2) is located inside the low-temperature chamber (1). The first measuring component (2) is adapted to measure the critical current and voltage of the first surface (501) of the double-sided high-temperature superconducting tape (5) to be tested. The second measuring component (3) is located inside the low-temperature chamber (1). The second measuring component (3) is adapted to measure the critical current and voltage of the second surface (502) of the double-sided high-temperature superconducting tape (5) to be tested.

2. The critical current testing device for double-sided high-temperature superconducting tapes according to claim 1, characterized in that, The first measuring component (2) includes a first current source electrode wheel (201) and a second current source electrode wheel (202). The first current source electrode wheel (201) and the second current source electrode wheel (202) are adapted to contact the first surface (501) of the double-sided high-temperature superconducting tape (5) to be tested, respectively. The first current source electrode wheel (201) and the second current source electrode wheel (202) are respectively connected to the ammeter (6) through lines.

3. The critical current testing device for double-sided high-temperature superconducting tapes according to claim 2, characterized in that, The first measuring component (2) includes a first voltage measuring electrode wheel (203) and a second voltage measuring electrode wheel (204). The first voltage measuring electrode wheel (203) and the second voltage measuring electrode wheel (204) are adapted to contact the first surface (501) of the double-sided high-temperature superconducting tape (5) to be tested, respectively. The first voltage measuring electrode wheel (203) and the second voltage measuring electrode wheel (204) are respectively connected to a voltmeter (7) through a line.

4. The critical current testing device for double-sided high-temperature superconducting tapes according to claim 3, characterized in that, The first voltage measuring electrode wheel (203) and the second voltage measuring electrode wheel (204) are respectively provided between the first current source electrode wheel (201) and the second current source electrode wheel (202). The first current source electrode wheel (201), the second current source electrode wheel (202), the first voltage measuring electrode wheel (203), and the second voltage measuring electrode wheel (204) are all set at the same height.

5. The critical current testing device for double-sided high-temperature superconducting tapes according to claim 3, characterized in that, The second measuring component (3) includes a third current source electrode wheel (301) and a fourth current source electrode wheel (302). The third current source electrode wheel (301) and the fourth current source electrode wheel (302) are adapted to contact the second surface (502) of the double-sided high-temperature superconducting tape (5) to be tested, respectively. The third current source electrode wheel (301) and the fourth current source electrode wheel (302) are respectively connected to the ammeter (6) through lines. The third current source electrode wheel (301) is located between the first current source electrode wheel (201) and the first voltage measuring electrode wheel (203). The fourth current source electrode wheel (302) is located between the second voltage measuring electrode wheel and the second current source electrode wheel (202). The height of the third current source electrode wheel (301) and the fourth current source electrode wheel (302) is higher than that of the first current source electrode wheel (201).

6. The critical current testing device for double-sided high-temperature superconducting tapes according to claim 5, characterized in that, The second measuring component (3) includes a third voltage measuring electrode wheel (303) and a fourth voltage measuring electrode wheel (304). The third voltage measuring electrode wheel (303) and the fourth voltage measuring electrode wheel (304) are adapted to contact the second surface (502) of the double-sided high-temperature superconducting tape (5) to be tested, respectively. The third voltage measuring electrode wheel (303) and the fourth voltage measuring electrode wheel (304) are respectively connected to a voltmeter (7) through a line. The third voltage measuring electrode wheel (303) and the fourth voltage measuring electrode wheel (304) are both located between the first voltage measuring electrode wheel (203) and the second voltage measuring electrode wheel (204). The height of the third voltage measuring electrode wheel (303) and the fourth voltage measuring electrode wheel (304) is higher than that of the first voltage measuring electrode wheel (203).

7. A critical current testing system for double-sided high-temperature superconducting tapes, characterized in that, The critical current testing device for double-sided high-temperature superconducting tapes, as described in any one of claims 1-6.

8. The critical current testing system for double-sided high-temperature superconducting tapes according to claim 7, characterized in that, It also includes a cooling device (4), which includes a cooling pipe (401), a low-temperature fan (402), a liquid nitrogen heat exchanger (403), and a refrigerator heat exchanger (404). The cooling pipe (401) is equipped with a low-temperature fan (402), a liquid nitrogen heat exchanger (403), and a refrigerator heat exchanger (404). The refrigeration inlet and refrigeration outlet of the cooling pipe (401) are respectively located on both sides of the low-temperature chamber (1).

9. The critical current testing system for double-sided high-temperature superconducting tapes according to claim 8, characterized in that, The cooling pipe (401) is suitable for the flow of helium gas, the low-temperature fan (402) provides power for the helium gas, the refrigeration heat exchanger (404) is equipped with a low-temperature chiller (4041) and a refrigeration box (4042), the low-temperature chiller (4041) is connected to the refrigeration column (4043) of the refrigeration box (4042), and a heating wire (4044) is provided at the cold air outlet (4045) of the refrigeration box (4042).

10. A testing method for a critical current testing device for double-sided high-temperature superconducting tapes, using the critical current testing device for double-sided high-temperature superconducting tapes as described in claim 1, characterized in that... The double-sided high-temperature superconducting tape (5) under test moves from the unwinding roller (101) toward the winding roller (102). The first measuring component (2) measures the critical current and voltage of the first surface (501), and the second measuring component (3) measures the critical current and voltage of the second surface (502).

Images