High-resolution fiber optic image transmission element for x-ray detection, preparation method therefor and use thereof
By forming a microporous structure in the core of the optical fiber imaging element and filling it with perovskite quantum dot glass powder, the problems of insufficient detection efficiency and resolution of X-ray detectors were solved, and efficient and stable X-ray detection effects were achieved.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- CHINA BUILDING MATERIALS ACADEMY CO LTD
- Filing Date
- 2025-05-19
- Publication Date
- 2026-05-21
AI Technical Summary
The detection efficiency and resolution of existing X-ray detectors need to be improved, making it difficult to meet the needs of national defense, civilian use, and scientific research.
A fiber optic imaging element was fabricated using an acid-etchable material. A microporous structure was formed in the fiber core by acid etching and filled with perovskite quantum dot glass powder. Combined with a protective layer, a high-resolution X-ray detection fiber optic imaging element was formed.
This improved the detection efficiency and resolution of the X-ray detector, achieved high luminous intensity and long-term stability, and enhanced the detector's resolution and lifespan.
Smart Images
Figure CN2025095656_21052026_PF_FP_ABST
Abstract
Description
A high-resolution X-ray detection fiber optic imaging element, its fabrication method and application
[0001] Cross-reference to related applications
[0002] This application claims priority to Chinese Patent Application No. 202411624585.4, filed on November 14, 2024, entitled "A fiber optic imaging element for high-resolution X-ray detection and its preparation method and application", the entire contents of which are incorporated herein by reference. Technical Field
[0003] This application relates to the field of X-ray detection technology, and in particular to a high-resolution X-ray detection fiber optic imaging element, its fabrication method, and its application. Background Technology
[0004] X-rays are electromagnetic waves with short wavelengths, ranging from 0.01 nm to 10 nm, and energies from 100 eV to 10 MeV. Based on their penetrating power, differential absorption, photosensitive properties, and fluorescence, X-rays are widely used in environmental monitoring, geophysical exploration, radiotherapy, and medical diagnosis. The rapid development of X-ray applications has also placed higher demands on X-ray detection technology.
[0005] Currently, the detection efficiency and resolution of X-ray detectors still need improvement. Therefore, improving the detection efficiency and resolution of X-ray detectors is of great significance for national defense, civilian applications, and scientific research. Summary of the Invention
[0006] The main objective of this application is to provide a fiber optic imaging element for high-resolution X-ray detection, its fabrication method, and its application. The technical problem to be solved is how to improve the detection efficiency and resolution of X-ray detectors, thereby making them more suitable for practical use.
[0007] The objective of this application and the technical problem it solves are achieved through the following technical solution. A method for fabricating a high-resolution X-ray detection fiber optic imaging element according to this application includes the following steps:
[0008] Acid-washing is performed on the cross-section of one end of the optical fiber imaging element to form a microporous structure at the cross-section. The depth of the microporous structure is 100-500 μm, thus obtaining an acid-washed optical fiber imaging element. The core of the optical fiber imaging element is made of an acid-electrifiable material, and the cladding is made of an acid-resistant material.
[0009] Perovskite quantum dot glass powder is filled into the aforementioned microporous structure to obtain a filled optical fiber imaging element; and,
[0010] A protective layer is provided at the filling surface of the aforementioned fiber optic imaging element to obtain a high-resolution X-ray detection fiber optic imaging element.
[0011] The purpose of this application and the technical problems to be solved can also be further achieved by the following technical measures.
[0012] In some embodiments, according to the aforementioned method for preparing a fiber optic imaging element for high-resolution X-ray detection, the aforementioned perovskite quantum dot glass powder is CsPbX3 perovskite quantum dot glass powder; wherein X is at least one of Cl, Br and I.
[0013] In some embodiments, according to the aforementioned method for fabricating a fiber optic imaging element for high-resolution X-ray detection, the composition of the aforementioned CsPbX3 perovskite quantum dot glass powder, based on the mass percentage of oxides, includes: SiO2: 30-40%; H3BO3: 20-30%; ZnO: 15-20%; Cs2CO3: 10-15%; PbX2: 5-10%; and NaX: 5-10%.
[0014] In some embodiments, according to the aforementioned method for fabricating a high-resolution X-ray detection fiber optic imaging element, the aforementioned method for preparing CsPbX3 perovskite quantum dot glass powder includes the following steps:
[0015] Prepare glass raw materials by melting the aforementioned glass raw materials at 1000-1100°C to obtain glass melt;
[0016] The aforementioned glass melt is poured into a mold to obtain the precursor glass;
[0017] The aforementioned precursor glass was annealed at 350–450°C for 2–3 hours to obtain CsPbX3 perovskite quantum dot glass; and,
[0018] The aforementioned CsPbX3 perovskite quantum dot glass was ground into powder to obtain the aforementioned CsPbX3 perovskite quantum dot glass powder.
[0019] In some embodiments, according to the aforementioned method for fabricating a high-resolution X-ray detection fiber optic imaging element, the method for filling the aforementioned perovskite quantum dot glass powder into the aforementioned microporous structure includes the following steps:
[0020] a. Disperse the aforementioned perovskite quantum dot glass powder in an organic solvent to obtain a quantum dot dispersion;
[0021] b. Immerse the aforementioned microporous structure of the aforementioned acid-washed optical fiber imaging element in the aforementioned quantum dot dispersion, sonicate it, then remove the aforementioned acid-washed optical fiber imaging element, scrape off the aforementioned quantum dot dispersion from the non-porous areas of the surface, and dry it.
[0022] Repeat step b multiple times until the aforementioned perovskite quantum dot glass powder fills the aforementioned microporous structure to obtain the aforementioned filled optical fiber imaging element.
[0023] In some embodiments, according to the aforementioned method for preparing a fiber optic imaging element for high-resolution X-ray detection, the size of the aforementioned perovskite quantum dot glass powder is 100–200 nm.
[0024] In some embodiments, according to the aforementioned method for fabricating a high-resolution X-ray detection fiber optic imaging element, the aforementioned protective layer includes a quartz window, the thickness of which is 2 to 3 mm.
[0025] In some embodiments, according to the aforementioned method for fabricating a high-resolution X-ray detection fiber optic imaging element, the aforementioned protective layer includes an antireflective coating.
[0026] The objective of this application and the technical problem it solves are further achieved by the following technical solution. A high-resolution X-ray detection fiber optic imaging element according to this application includes:
[0027] The fiber optic image transmission element has a core made of an acid-easily etchable material and a cladding made of an acid-resistant material. The core of the fiber optic image transmission element is recessed at one end of the cross-section, forming a microporous structure with a depth of 100 to 500 μm at the cross-section.
[0028] Perovskite quantum dot glass powder, wherein the aforementioned perovskite quantum dot glass powder is filled in the aforementioned microporous structure; and,
[0029] The protective layer is disposed on the cross-section of the aforementioned fiber optic imaging element filled with the aforementioned perovskite quantum dot glass powder.
[0030] The purpose of this application and the solution to its technical problem are also achieved by the following technical solution. According to this application, an application of the aforementioned high-resolution X-ray detection fiber optic imaging element in the field of X-ray detection is proposed.
[0031] Through the above technical solution, the fiber optic imaging element for high-resolution X-ray detection, its fabrication method, and its application, as described in this application, have at least the following advantages:
[0032] This application proposes a method for fabricating a high-resolution X-ray detection fiber optic imaging element. The element uses an acid-etchable core and an acid-resistant cladding. Based on an acid etching method, a high-precision, highly uniform, and regularly arranged microporous structure is achieved on the cross-section of the fiber optic imaging element. The depth of the microporous structure is controlled to be 100–500 μm, and perovskite quantum dot glass powder is used to fill the microporous structure. Perovskite quantum dot glass powder possesses high photoluminescence quantum yield, excellent color purity, and a tunable bandgap. By controlling its filling thickness to 100–500 μm, it acts as an X-ray absorbing photosensitive material, achieving high luminescence intensity and long-term stability, thus improving detection efficiency and lifetime. Simultaneously, filling with perovskite quantum dot glass powder enables efficient light emission from a single fiber, effectively improving detection resolution. The light converted from X-ray irradiation by the quantum dot material within the microporous structure is transmitted through the corresponding fiber, with each fiber acting as an independent imaging unit. Compared to the diffuse reflection light from stimulated emission of traditional quantum dot materials, the resolution is significantly improved. The high-resolution X-ray detection fiber optic imaging element prepared in this application has the advantages of high brightness and high resolution, effectively improving the detection efficiency and resolution of X-ray detectors, and is of great significance to the fields of national defense, civilian use and scientific research.
[0033] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, the preferred embodiments of this application are described in detail below with reference to the accompanying drawings. Attached Figure Description
[0034] Figure 1 is a schematic diagram of the structure of the fiber optic imaging element for high-resolution X-ray detection disclosed in Embodiment 1 of this application;
[0035] Figure 2 is a schematic diagram of the structure of the fiber optic imaging element for high-resolution X-ray detection disclosed in Embodiment 2 of this application;
[0036] Figure 3 is a schematic diagram of the structure of the fiber optic imaging element for high-resolution X-ray detection disclosed in Embodiment 3 of this application;
[0037] Figure 4 is an X-ray emission spectrum of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in Embodiment 1 of this application.
[0038] Figure 5 is an X-ray emission spectrum of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in Embodiment 2 of this application.
[0039] Figure 6 is an X-ray emission spectrum of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in Embodiment 3 of this application.
[0040] Figure 7 is an X-ray emission spectrum of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in Embodiment 4 of this application.
[0041] Figure 8 is an X-ray emission spectrum of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in Embodiment 5 of this application.
[0042] Figure 9 is an X-ray diffraction test pattern of CsPbBr3 quantum dots in Example 1 of this application.
[0043] Explanation of reference numerals in the attached diagram: 1. Quartz window; 2. Alumina and hafnium oxide composite film; 3. CsPbBr3 perovskite quantum dot glass powder; 4. Acid-washed fiber optic panel; 5. Acid-washed fiber optic taper; 6. Acid-washed fiber optic image reverser. Detailed Implementation
[0044] To further illustrate the technical means and effects adopted by this application to achieve its intended purpose, the following, in conjunction with the accompanying drawings and preferred embodiments, provides a detailed description of the specific implementation methods, structures, features, and effects of a high-resolution X-ray detection fiber optic imaging element, its fabrication method, and its application. In the following description, different "embodiments" or "embodiments" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics in one or more embodiments can be combined in any suitable manner.
[0045] These embodiments are provided to make the application thorough and complete, and to fully express the scope of the application to those skilled in the art. It should be noted that, unless otherwise specifically stated, the relative arrangement of components and steps, material composition, numerical expressions, and values illustrated in these embodiments should be interpreted as merely exemplary and not as limiting.
[0046] This application proposes a method for fabricating a fiber optic imaging element for high-resolution X-ray detection, as shown in Figures 1-3, the steps of which include:
[0047] Acid-washing is performed on the cross-section of one end of the optical fiber imaging element to form a microporous structure at the cross-section. The depth of the microporous structure is 100-500 μm, thus obtaining an acid-washed optical fiber imaging element. The core of the optical fiber imaging element is made of an acid-electrifiable material, and the cladding is made of an acid-resistant material.
[0048] Perovskite quantum dot glass powder is filled into the aforementioned microporous structure to obtain a filled optical fiber imaging element; and,
[0049] A protective layer is provided at the filling surface of the aforementioned fiber optic imaging element to obtain a high-resolution X-ray detection fiber optic imaging element.
[0050] Specifically, fiber optic imaging elements can be fiber optic panels, fiber optic tapers, or fiber optic image inverters. Based on the acid resistance of the fiber core and cladding, the acid solution used for pickling can be at least one of the following: 0.1–3.0 mol / L hydrochloric acid, nitric acid, citric acid, and sulfuric acid. The pickling method can prepare a regularly arranged microporous structure with pores only appearing in the fiber core. This method can precisely prepare micropores in the fiber core without damaging the cladding structure and causing optical crosstalk. Furthermore, the diameter of the micropores can be controlled by adjusting the fiber core diameter, and the depth of the micropores can be controlled by adjusting the acid concentration and immersion time, achieving a high-precision, highly uniform, and regularly arranged microporous structure with adjustable diameter and depth.
[0051] Perovskite quantum dot glass powder possesses high photoluminescence quantum yield, excellent color purity, and tunable bandgap. By controlling the depth and filling thickness of the micropore structure to 100–500 μm, it can be used as an X-ray absorbing photosensitive material, achieving high luminescence intensity and long-term stability, thus improving detection efficiency and lifetime. Simultaneously, filling the micropores with perovskite quantum dot glass powder enables efficient light emission from a single optical fiber, effectively improving detection resolution. The light converted from X-ray irradiation by the perovskite quantum dot glass powder within the micropore structure is transmitted through corresponding optical fibers, with each fiber acting as an independent imaging unit. Compared to the diffuse reflection light from stimulated emission of traditional quantum dot materials, the resolution is significantly improved. The perovskite quantum dot glass powder can be any material conventional in the field, using either inorganic or organic perovskite quantum dot glass. Inorganic perovskite quantum dot glass is preferred; compared to organic perovskite quantum dot glass, inorganic perovskite quantum dot glass offers better stability and is suitable for a wider range of environments. Optionally, the size of the perovskite quantum dot glass is 100–200 nm. The perovskite quantum dot glass powder can be filled by physical deposition or direct filling, etc., without limitation.
[0052] The protective layer protects the filled perovskite quantum dot glass powder from contamination and shedding, isolates it from water and oxygen, extends its service life, and broadens its application range. The protective layer can be made of transparent materials such as quartz, plexiglass, and resin.
[0053] The high-resolution X-ray detection fiber imaging element prepared by the method of this application has the advantages of high brightness and high resolution, which effectively improves the detection efficiency and detection resolution of X-ray detectors and is of great significance to the fields of national defense, civilian use and scientific research.
[0054] In some embodiments, the aforementioned perovskite quantum dot glass powder is CsPbX3 perovskite quantum dot glass powder; wherein X is at least one of Cl, Br and I.
[0055] Specifically, CsPbX3 perovskite quantum dot glass exhibits high hardness, good stability, and high transmittance, resulting in brighter optical fiber imaging elements suitable for a wider range of environments. Furthermore, by combining Cl, Br, and I ions, perovskite quantum dot materials emitting visible light of any wavelength can be fabricated.
[0056] In some embodiments, the aforementioned CsPbX3 perovskite quantum dot glass powder comprises, by mass percentage of oxides: SiO2: 30-40%; H3BO3: 20-30%; ZnO: 15-20%; Cs2CO3: 10-15%; PbX2: 5-10%; and NaX: 5-10%.
[0057] In some embodiments, the preparation method of the aforementioned CsPbX3 perovskite quantum dot glass powder includes the following steps:
[0058] Prepare glass raw materials by melting the aforementioned glass raw materials at 1000-1100°C to obtain glass melt;
[0059] The aforementioned glass melt is poured into a mold to obtain the precursor glass;
[0060] The aforementioned precursor glass was annealed at 350–450°C for 2–3 hours to obtain CsPbX3 perovskite quantum dot glass; and,
[0061] The aforementioned CsPbX3 perovskite quantum dot glass was ground into powder to obtain the aforementioned CsPbX3 perovskite quantum dot glass powder.
[0062] Specifically, the CsPbX3 perovskite quantum dot glass prepared using the method proposed in this application has each perovskite grain encapsulated by an amorphous glass component, effectively preventing contact with water and oxygen and improving the long-term stability of the perovskite quantum dots. Annealing the precursor glass at 350–450°C for 2–3 hours can induce in-situ growth of CsPbX3 within the glass matrix. The CsPbX3 perovskite quantum dot glass can be ground using techniques conventional in the art. For example, placing the CsPbX3 perovskite quantum dot glass in a ball mill and adjusting the rotation speed to 400–500 rpm for 5–6 hours yields CsPbX3 perovskite quantum dot glass powder with a size of 100–200 nm.
[0063] In some embodiments, the method of filling the aforementioned perovskite quantum dot glass powder into the aforementioned microporous structure includes the following steps:
[0064] a. Disperse the aforementioned perovskite quantum dot glass powder in an organic solvent to obtain a quantum dot dispersion;
[0065] b. Immerse the aforementioned microporous structure of the aforementioned acid-washed optical fiber imaging element in the aforementioned quantum dot dispersion, sonicate it, then remove the aforementioned acid-washed optical fiber imaging element, scrape off the aforementioned quantum dot dispersion from the non-porous areas of the surface, and dry it.
[0066] Repeat step b multiple times until the aforementioned perovskite quantum dot glass powder fills the aforementioned microporous structure to obtain the aforementioned filled optical fiber imaging element.
[0067] Specifically, this method of filling perovskite quantum dot glass powder is convenient to operate, and the powder is uniformly and compactly filled, making it less prone to falling off. Volatile and low-toxicity organic solvents can be selected, such as acetone, anhydrous ethanol, or isopropanol. The powder can be dispersed in the organic solvent using mechanical stirring, shaking, or ultrasonication. For example, perovskite quantum dot glass powder can be ultrasonically dispersed in acetone for 30-50 minutes. An acid-washed optical fiber imaging element is then immersed in the quantum dot dispersion and ultrasonically treated for 30-50 minutes. Subsequently, the acid-washed optical fiber imaging element is pulled out of the quantum dot dispersion at a speed of 1-3 mm / s. The quantum dot dispersion on the non-porous areas of the surface is scraped off with a scraper, and then dried in an oven at 50-70°C for 10-20 minutes. This allows the quantum dot glass powder to fill the microporous structure. This process is repeated multiple times until the perovskite quantum dot glass powder completely fills the microporous structure.
[0068] In some embodiments, the size of the aforementioned perovskite quantum dot glass powder is 100–200 nm.
[0069] Specifically, if the size of the perovskite quantum dot glass powder is less than 100 nm, too many perovskite grains will be exposed, affecting the long-term stability of the perovskite quantum dots; if the size of the perovskite quantum dot glass powder is greater than 200 nm, it will affect the resolution. Therefore, the size of the perovskite quantum dot glass powder is controlled within 100–200 nm.
[0070] In some embodiments, the aforementioned protective layer includes an antireflective film.
[0071] Specifically, the antireflection coating can further increase the brightness of the fiber optic imaging element. The antireflection coating can be an alumina and hafnium oxide composite film 2. The alumina and hafnium oxide composite film 2 has the advantages of high hardness and high transmittance. For example, the film structure and thickness of each layer of the alumina and hafnium oxide composite film 2 are: HfO2 (115–118 nm) - Al2O3 (70–72 nm) - HfO2 (120–122 nm) - Al2O3 (40–42 nm) - HfO2 (72–74 nm) - Al2O3 (80–82 nm) - filling the fiber optic imaging element.
[0072] In some embodiments, the aforementioned protective layer includes a quartz window 1, the thickness of which is 2 to 3 mm.
[0073] Specifically, when the protective layer includes both an antireflective coating and a quartz window 1, the installation method of the protective layer is as follows: An antireflective coating is deposited on the filling surface of the fiber optic imaging element; then, the surfaces of the antireflective coating and the quartz window 1 are polished to control the roughness to 5–10 nm; subsequently, the quartz window 1 is placed on the surface of the antireflective coating, and the layer is heated to increase the activation energy of the molecules and atoms on the surfaces of the aforementioned antireflective coating and the aforementioned protective layer, causing them to bond together as a whole. Optionally, the aforementioned heating temperature is 200–250 °C.
[0074] This application discloses a fiber optic imaging element for high-resolution X-ray detection, comprising:
[0075] The fiber optic image transmission element has a core made of an acid-easily etchable material and a cladding made of an acid-resistant material. The core of the fiber optic image transmission element is recessed at one end of the cross-section, forming a microporous structure with a depth of 100 to 500 μm at the cross-section.
[0076] Perovskite quantum dot glass powder, wherein the aforementioned perovskite quantum dot glass powder is filled in the aforementioned microporous structure; and,
[0077] The protective layer is disposed on the cross-section of the aforementioned fiber optic imaging element filled with the aforementioned perovskite quantum dot glass powder.
[0078] This application discloses an application of the aforementioned high-resolution X-ray detection fiber optic imaging element in the field of X-ray detection. For example, the high-resolution X-ray detection fiber optic imaging element disclosed in this application can be installed on an X-ray detector.
[0079] The present application will be further described below with reference to specific embodiments, but this should not be construed as a limitation on the scope of protection of the present application. Some non-essential improvements and adjustments made by those skilled in the art based on the above content of the present application are still within the scope of protection of the present application.
[0080] Unless otherwise specified, all materials and reagents mentioned below are commercially available products well known to those skilled in the art; unless otherwise specified, all methods described are methods known in the art. Unless otherwise defined, the technical or scientific terms used should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains.
[0081] In the following embodiments, the fiber core of the optical fiber imaging element is made of an acid-etchable material. The core composition, by molar percentage of oxides, includes: SiO2: 30.3–36.4%; B2O3: 18.9–20.2%; La2O3: 5.9–6.1%; the total content of BaO and CaO is 33.7–39.4%; Al2O3: 1.6–2.3%; TiO2: 2.0–2.9%; and the cladding of the optical fiber imaging element... Using acid-resistant materials, the cladding composition, based on the molar percentage of oxides, includes: SiO2: 70.5–74.5%; PbO: 12.0–12.5%; Bi2O3: 0–2.0%; the total content of Na2O, K2O, Rb2O, and Cs2O is 5.8–7.7%; the total content of BaO and MgO is 4.6–6.7%; Al2O3: 1.1–3.0%; and TiO2: 0–2.0%.
[0082] Example 1:
[0083] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection and its fabrication method, the schematic diagram of which is shown in Figure 1.
[0084] In this embodiment, the fiber optic imaging element uses a fiber optic panel with a core diameter of 10 μm and a thickness of 10 mm. The cross-section of the fiber optic panel is immersed in a 1 L volume of 0.5 mol / L nitric acid solution for 48 hours to form a regularly arranged micropore structure with a micropore diameter of 10 μm and a depth of 100 μm, resulting in the acid-washed fiber optic panel 4.
[0085] In this embodiment, the perovskite quantum dot glass powder is CsPbBr3 perovskite quantum dot glass powder with a yellow fluorescence color. The CsPbBr3 perovskite quantum dot glass composition, by oxide mass percentage, is 30% SiO2; 30% H3BO3; 20% ZnO; 10% Cs2CO3; 5% PbBr2; and 5% NaBr. Approximately 10g of high-purity raw materials are thoroughly mixed and melted in air at 1050°C for 12 minutes to produce a homogeneous glass melt. The melt is then poured into a brass mold to obtain the precursor glass. Finally, the precursor glass is annealed at 400°C for 2 hours to induce in-situ growth of CsPbBr3 within the glass matrix, yielding the CsPbBr3 perovskite quantum dot glass. CsPbBr3 perovskite quantum dot glass was placed in a ball mill, the speed was adjusted to 500 rpm, and the time was 5 hours to obtain CsPbBr3 perovskite quantum dot glass powder with a size of 150 nm.
[0086] CsPbBr3 perovskite quantum dot glass powder 3 was added to acetone solvent and sonicated for 30 min to achieve uniform dispersion, thus obtaining a quantum dot dispersion. An acid-washed optical fiber panel 4 was immersed in the quantum dot dispersion and sonicated for 30 min. The optical fiber panel was then pulled out of the solution at a speed of 1 mm / s. The quantum dot dispersion was scraped off from the non-porous areas of the surface using a scraper. The panel was then placed in an oven at 50°C for 10 min to allow the CsPbBr3 perovskite quantum dot glass powder 3 to fill the micropores. This process was repeated multiple times until the quantum dot glass powder completely filled the micropores, resulting in a filled optical fiber panel.
[0087] An alumina and hafnium oxide composite film 2 is deposited on the filling surface of the fiber optic panel. Then, a 2mm thick quartz window 1 is placed on the surface of the antireflection film. A temperature of 230℃ is applied to activate the molecules and atoms on the surface of the quartz window 1 and the antireflection film, causing them to bond together as a whole, thus obtaining a fiber optic imaging element for high-resolution X-ray detection. The film structure of the alumina and hafnium oxide composite film 2 and the thickness of each layer are as follows:
[0088] Quartz window 1-HfO2 (115~118nm)-Al2O3 (70~72nm)-HfO2 (120~122nm)-Al2O3 (40~42nm)-HfO2 (72~74nm)-Al2O3 (80~82nm)-filled fiber panel.
[0089] 0.4 ml of the aforementioned quantum dot dispersion was dropped onto the surface of a quartz substrate with a thickness of 12 mm. The spin coating method was used with a rotation speed of 500 rpm and a time of 60 s. After spin coating, the substrate was heated at 60 °C for 30 min in an oven. This process was repeated 3 times to form a quantum dot glass film with a thickness of 100 μm on the surface of the quartz substrate, thus obtaining a quantum dot glass film quartz plate.
[0090] X-ray diffraction (XRD) was performed on the prepared CsPbBr3 quantum dot glass, and the results are shown in Figure 9. It can be seen that the peak values correspond one-to-one with the PDF standard comparison card, proving that high-purity CsPbBr3 quantum dots were successfully synthesized.
[0091] The X-ray emission spectra of the quantum dot glass film quartz plate and the high-resolution X-ray detection fiber optic imaging element in this embodiment were tested using X-ray emission spectra with parameters of 50 kV and 10 μA. The test results are shown in Figure 4, where A is the emission intensity curve of the quantum dot glass film quartz plate and B is the emission intensity curve of the high-resolution X-ray detection fiber optic imaging element. The peak position of the quantum dot glass film quartz plate is at 530 nm and the peak shape is sharp, with a relative emission intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element is at 530 nm and the peak shape is sharp, indicating that the emission purity of the sample is high; the relative emission intensity is 80%, and the emission intensity loss is only 20%, indicating that the emission intensity of the sample is high. Using X-ray light as a light source, the resolution of the fiber optic panel in this embodiment is 50.8 lp / mm, and the resolution of the high-resolution X-ray detection fiber optic imaging element is 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder did not result in a loss of resolution.
[0092] Example 2:
[0093] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection, and its structural schematic diagram is shown in Figure 2.
[0094] The difference between this embodiment and Embodiment 1 is that the fiber optic imaging element uses a fiber taper with a core diameter of 10μm and a thickness of 10mm. Furthermore, the acid-washed fiber panel 4 in Embodiment 1 is an acid-washed fiber taper 5 in this embodiment; the filled fiber panel in Embodiment 1 is a filled fiber taper in this embodiment.
[0095] The X-ray emission spectra of the quantum dot glass film quartz plate and the high-resolution X-ray detection fiber optic imaging element in this embodiment were tested using X-rays with parameters of 50 kV and 10 μA. The test results are shown in Figure 5, where A is the emission intensity curve of the quantum dot glass film quartz plate and B is the emission intensity curve of the high-resolution X-ray detection fiber optic imaging element. The peak position of the quantum dot glass film quartz plate is at 530 nm and the peak shape is sharp, with a relative emission intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element is at 530 nm and the peak shape is sharp, indicating that the emission purity of the sample is high; the relative emission intensity is 75%, and the emission intensity loss is only 25%, indicating that the emission intensity of the sample is high. Using X-ray light as a light source, the resolution of the fiber optic cone and the high-resolution X-ray detection fiber optic imaging element in this embodiment is 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder does not result in a loss of resolution.
[0096] Example 3:
[0097] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection, and its structural schematic diagram is shown in Figure 3.
[0098] The difference between this embodiment and Embodiment 1 is that the fiber optic image transmission element uses a fiber optic image inverter with a core diameter of 10μm and a thickness of 10mm. Furthermore, the acid-washed fiber optic panel 4 in Embodiment 1 is an acid-washed fiber optic image inverter 6 in this embodiment; the filled fiber optic panel in Embodiment 1 is a filled fiber optic image inverter in this embodiment.
[0099] The X-ray emission spectra of the quantum dot glass film quartz plate and the high-resolution X-ray detection fiber optic imaging element in this embodiment were tested using X-rays with parameters of 50 kV and 10 μA. The test results are shown in Figure 6, where A is the emission intensity curve of the quantum dot glass film quartz plate and B is the emission intensity curve of the high-resolution X-ray detection fiber optic imaging element. The peak position of the quantum dot glass film quartz plate is at 530 nm and the peak shape is sharp, with a relative emission intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element is at 530 nm and the peak shape is sharp, indicating that the emission purity of the sample is high; the relative emission intensity is 62%, and the emission intensity loss is only 38%, indicating that the emission intensity of the sample is high. Using X-ray light as a light source, the resolution of the fiber optic image inverter in this embodiment is tested to be 50.8 lp / mm, and the resolution of the high-resolution X-ray detection fiber optic imaging element is also 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder did not result in a loss of resolution.
[0100] Example 4:
[0101] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection and its fabrication method.
[0102] The difference between this embodiment and Embodiment 1 is that the perovskite quantum dot glass in this embodiment is a CsPbCl3 perovskite quantum dot glass with blue fluorescence. The CsPbCl3 perovskite quantum dot glass has the following composition by oxide mass percentage: 30% SiO2; 30% H3BO3; 20% ZnO; 10% Cs2CO3; 5% PbCl2; and 5% NaCl. 10g of high-purity raw materials were thoroughly mixed and melted in air at 1050°C for 12 minutes to produce a homogeneous glass melt. The glass melt was then poured into a brass mold to obtain the precursor glass. Finally, the precursor glass was annealed at 400°C for 2 hours to induce in-situ growth of CsPbCl3 within the glass matrix, thus obtaining the CsPbCl3 perovskite quantum dot glass.
[0103] The X-ray emission spectra of the quantum dot glass film quartz plate and the high-resolution X-ray detection fiber optic imaging element in this embodiment were tested using X-ray emission spectra with parameters of 50 kV and 10 μA. The test results are shown in Figure 7, where A is the emission intensity curve of the quantum dot glass film quartz plate and B is the emission intensity curve of the high-resolution X-ray detection fiber optic imaging element. The peak position of the quantum dot glass film quartz plate is at 450 nm and the peak shape is sharp, with a relative emission intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element is at 450 nm and the peak shape is sharp, indicating that the emission purity of the sample is high; the relative emission intensity is 80.2%, and the emission intensity loss is only 19.8%, indicating that the emission intensity of the sample is high. Using X-ray light as a light source, the resolution of the fiber optic image inverter in this embodiment is tested to be 50.8 lp / mm, and the resolution of the high-resolution X-ray detection fiber optic imaging element is also 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder did not result in a loss of resolution.
[0104] Example 5:
[0105] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection and its fabrication method.
[0106] The difference between this embodiment and Embodiment 1 is that the perovskite quantum dot glass in this embodiment is a CsPbI3 perovskite quantum dot glass with red fluorescence. The CsPbI3 perovskite quantum dot glass has the following composition by oxide mass percentage: 30% SiO2; 30% H3BO3; 20% ZnO; 10% Cs2CO3; 5% PbI2; 5% NaI. 10g of high-purity raw materials are thoroughly mixed and melted in air at 1050°C for 12 minutes to produce a homogeneous glass melt. The glass melt is then poured into a brass mold to obtain the precursor glass. Finally, the precursor glass is annealed at 400°C for 2 hours to induce in-situ growth of CsPbI3 within the glass matrix, thus obtaining the CsPbI3 perovskite quantum dot glass.
[0107] The X-ray emission spectra of the quantum dot glass film quartz plate and the high-resolution X-ray detection fiber optic imaging element in this embodiment were tested using X-rays with parameters of 50 kV and 10 μA. The test results are shown in Figure 8, where A is the emission intensity curve of the quantum dot glass film quartz plate and B is the emission intensity curve of the high-resolution X-ray detection fiber optic imaging element. The peak position of the quantum dot glass film quartz plate is at 630 nm and the peak shape is sharp, with a relative emission intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element is at 630 nm and the peak shape is sharp, indicating that the emission purity of the sample is high; the relative emission intensity is 79.7%, and the emission intensity loss is only 20.3%, indicating that the emission intensity of the sample is high. Using X-ray light as a light source, the resolution of the fiber optic image inverter in this embodiment is tested to be 50.8 lp / mm, and the resolution of the high-resolution X-ray detection fiber optic imaging element is also 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder did not result in a loss of resolution.
[0108] Example 6
[0109] This embodiment provides a fiber optic imaging element for high-resolution X-ray detection and its fabrication method.
[0110] The difference between this embodiment and Embodiment 1 is that in the high-resolution X-ray detection fiber optic imaging element of this embodiment, the alumina and hafnium oxide composite film 2 is not deposited on the filling surface of the filling fiber panel.
[0111] The fluorescence spectra of the quantum dot glass film quartz plate and the fiber optic imaging element for high-resolution X-ray detection in this embodiment were tested using a fluorescence spectrometer. The quantum dot glass film quartz plate showed a sharp peak at 530 nm, with a relative luminescence intensity of 100%. The fiber optic imaging element for high-resolution X-ray detection also showed a sharp peak at 530 nm, indicating high luminescence purity; its relative luminescence intensity was 70%, with only a 30% loss, indicating high luminescence intensity. Using ultraviolet light as a light source, the resolution of both the fiber optic panel and the fiber optic imaging element for high-resolution X-ray detection in this embodiment was 50.8 lp / mm, indicating that filling the microporous structure with quantum dot glass powder did not result in a loss of resolution.
[0112] Example 7
[0113] The difference between this embodiment and Embodiment 1 is that, in the preparation of the quantum dot glass thin film quartz plate and the fiber optic imaging element for high-resolution X-ray detection, the CsPbBr3 perovskite quantum dot glass powder is replaced with CdSe perovskite quantum dot glass powder.
[0114] The fluorescence spectra of the high-resolution X-ray detection fiber optic imaging element in Example 1 and the high-resolution X-ray detection fiber optic imaging element in this example were tested using a fluorescence spectrometer. The peak position of the high-resolution X-ray detection fiber optic imaging element in Example 1 was at 530 nm, and the peak shape was sharp, with a relative luminous intensity of 100%. The peak position of the high-resolution X-ray detection fiber optic imaging element in this example was also at 530 nm, but the full width at half maximum (FWHM) of the peak was larger than that of the former.
[0115] Comparative Example 1:
[0116] Using the fiber optic panel from Example 1 as a substrate, a 100 μm thick perovskite quantum dot glass film was prepared on its surface to obtain a quantum dot glass film fiber optic imaging element. Specifically, the perovskite quantum dot glass powder from Example 1 was dispersed in anhydrous ethanol to prepare a quantum dot dispersion. 0.4 ml of the quantum dot dispersion was dropped onto the surface of the fiber optic panel. A spin-coating method was used, with the spin speed controlled at 500 rpm for 60 s. After spin-coating, the film was heated in an oven at 60°C for 30 min. This process was repeated three times to form a 100 μm thick quantum dot glass film on the substrate surface.
[0117] The resolution of the aforementioned quantum dot glass thin-film fiber optic imaging element was tested using X-ray light as a light source, and the result was 15 lp / mm. Compared with the high-resolution X-ray detection fiber optic imaging element in Example 1, its resolution is lower, indicating that filling the fiber optic panel with perovskite quantum dot glass powder can effectively improve the resolution.
[0118] The technical features in the claims and / or specification of this application can be combined, and the combination is not limited to the combinations obtained through reference in the claims. Technical solutions obtained by combining the technical features in the claims and / or specification are also within the scope of protection of this application.
[0119] The above description is merely a preferred embodiment of this application and is not intended to limit this application in any way. Any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of this application shall still fall within the scope of the technical solution of this application.
Claims
1. A method for producing an optical fiber image-conducting element for high-resolution X-ray detection, characterized by, The steps include: Acid-washing is performed on the cross-section of one end of the optical fiber imaging element to form a microporous structure at the cross-section. The depth of the microporous structure is 100-500 μm, thus obtaining an acid-washed optical fiber imaging element. The core of the optical fiber imaging element is made of an acid-electrifiable material, and the cladding is made of an acid-resistant material. Perovskite quantum dot glass powder is filled into the microporous structure to obtain a filled optical fiber imaging element; and... A protective layer is provided at the filling surface of the filled fiber imaging element to obtain a high-resolution X-ray detection fiber imaging element.
2. The production method according to claim 1, characterized by, The perovskite quantum dot glass powder is CsPbX3 perovskite quantum dot glass powder; wherein X is at least one of Cl, Br and I.
3. The production method according to claim 2, characterized by, The CsPbX3 perovskite quantum dot glass powder comprises, by mass percentage of oxides: SiO2: 30-40%; H3BO3: 20-30%; ZnO: 15-20%; Cs2CO3: 10-15%; PbX2: 5-10%; and NaX: 5-10%.
4. The production method according to claim 3, characterized by, The preparation method of the CsPbX3 perovskite quantum dot glass powder includes the following steps: Prepare glass raw materials, and melt the glass raw materials at 1000-1100°C to obtain glass melt; The glass melt is poured into a mold to obtain the precursor glass; The precursor glass is annealed at 350–450°C for 2–3 hours to obtain CsPbX3 perovskite quantum dot glass; and... The CsPbX3 perovskite quantum dot glass was ground into powder to obtain the CsPbX3 perovskite quantum dot glass powder.
5. The preparation method according to claim 1, characterized in that, The method for filling the perovskite quantum dot glass powder into the microporous structure includes the following steps: a. Disperse the perovskite quantum dot glass powder in an organic solvent to obtain a quantum dot dispersion; b. Immerse the microporous structure of the acid-washed optical fiber imaging element in the quantum dot dispersion, sonicate it, then remove the acid-washed optical fiber imaging element, scrape off the quantum dot dispersion from the non-porous parts of the surface, and dry it. Repeat step b multiple times until the perovskite quantum dot glass powder fills the microporous structure to obtain the filled optical fiber imaging element.
6. The preparation method according to claim 1, characterized in that, The size of the perovskite quantum dot glass powder is 100–200 nm.
7. The preparation method according to claim 1, characterized in that, The protective layer includes an antireflective coating.
8. The method of claim 1, wherein, The protective layer includes a quartz window, the thickness of which is 2-3 mm.
9. An optical fiber image-conducting element for high-resolution X-ray detection, characterized by It includes: The fiber optic image transmission element has a core made of an acid-easily etchable material and a cladding made of an acid-resistant material. The core of the fiber optic image transmission element is recessed at one end of the cross-section, forming a microporous structure with a depth of 100 to 500 μm at the cross-section. Perovskite quantum dot glass powder, wherein the perovskite quantum dot glass powder fills the microporous structure; and... A protective layer is disposed on the cross section of the optical fiber imaging element filled with the perovskite quantum dot glass powder.
10. The application of the fiber optic imaging element for high-resolution X-ray detection as described in claim 9 in the field of X-ray detection.