Polymer sag resistance evaluation method and apparatus, storage medium, and processor
By establishing a three-dimensional model and simulating the temperature field and shear rate distribution, combined with viscosity and storage modulus data, the accuracy problem of traditional polymer melt sag performance testing under static conditions is solved, enabling accurate evaluation under dynamic conditions and supporting polymer formulation and process optimization.
WO2026108465A1PCT designated stage Publication Date: 2026-05-28PETROCHINA SHANGHAI ADVANCED MATERIALS RESEARCH INSTITUTE CO LTD +1
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- PETROCHINA SHANGHAI ADVANCED MATERIALS RESEARCH INSTITUTE CO LTD
- Filing Date
- 2025-10-14
- Publication Date
- 2026-05-28
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Figure CN2025127678_28052026_PF_FP_ABST
Abstract
The present application relates to the field of polymer processing, and discloses a polymer sag resistance evaluation method and apparatus, a storage medium, and a processor. The method comprises: simulating an extrusion molding process of a polymer to obtain temperature field distribution and shear rate distribution of the polymer in the extrusion molding process; determining viscosity data of the polymer under the temperature field distribution and the shear rate distribution, and determining storage modulus data of the polymer under the temperature field distribution; and on the basis of the viscosity data and the storage modulus data, evaluating the sag resistance of the polymer. In the present solution, the viscosity and storage modulus which have a stronger correlation with the sag resistance of the polymer are used as physical parameters for evaluating the sag resistance of the polymer, and testing is performed under actual extrusion conditions, so that the performance of the polymer in a real processing environment can be reflected, and the sag resistance of the polymer in an actual extrusion process can be more accurately evaluated.
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Citation Information
Patent Citations
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