Jig and method for adjusting position and / or angle of illumination device

Abstract

A jig (50) has an outer shape simulating the outer shape of an inspection object (10) imaged by using a line scan camera (30) and an illumination device (40). The jig (50) includes the outer circumferential surface (51), a light reflection part (52), a first band-shaped section (54), and a second band-shaped section (55). The light reflection part (52) is included in the outer circumferential surface (51). The first band-shaped section (54) is included in the light reflection part (52). The first band-shaped section (54) is used for adjusting the position and / or the angle of the illumination device (40). The second band-shaped section (55) is positioned inside the first band-shaped section (54). The second band-shaped section (55) is used for adjusting the position and / or the angle of the line scan camera (30).

Description

Fixture and Method for Adjusting Position and / or Angle of Lighting Device

[0001] The present disclosure relates to a fixture and a method for adjusting the position and / or angle of a lighting device.

[0002] An inspection target is imaged using a lighting device and an imaging device, and the obtained image is used for inspecting the inspection target. In Patent Document 1, it is described that unevenness and dirt on a workpiece are inspected using an image.

[0003] Japanese Patent Application Laid-Open No. 2013-242256

[0004] The present disclosure provides a technique useful for adjusting the position and / or angle of a lighting device that illuminates an inspection target when imaging the inspection target with a line scan camera.

[0005] The present disclosure provides a fixture having an outer shape simulating the outer shape of an inspection target imaged using a line scan camera and a lighting device, including an outer peripheral surface, a light reflecting portion included in the outer peripheral surface, a first strip portion included in the light reflecting portion and used for adjusting the position and / or angle of the lighting device, and a second strip portion located inside the first strip portion and used for adjusting the position and / or angle of the line scan camera.

[0006] The technique according to the present disclosure is useful for adjusting the position and / or angle of a lighting device that illuminates an inspection target when imaging the inspection target with a line scan camera.

[0007] FIG. 1 is a schematic configuration diagram of an inspection system according to Embodiment 1. FIG. 2 is a perspective view showing the imaging position of a line scan camera. FIG. 3 is an arrangement diagram of a line scan camera, a lighting device, and a fixture according to Embodiment 1. FIG. 4 is a schematic configuration diagram for explaining a method of adjusting the position and / or angle of a lighting device using a fixture according to Embodiment 1. FIG. 5 is an arrangement diagram of a line scan camera, a lighting device, and a fixture according to Embodiment 2.

[0008] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. The present disclosure is not limited to the following embodiments.

[0009] (Embodiment 1) <1. Configuration of Inspection System 200> Figure 1 is a schematic configuration diagram of the inspection system 200 according to Embodiment 1. The inspection system 200 inspects the object to be inspected 10. For example, dirt, scratches, etc. on the object to be inspected 10 are inspected. In this embodiment, the object to be inspected 10 is a battery, specifically a cylindrical battery. The inspection system 200 includes a transport path 20, a line scan camera 30, and a lighting device 40.

[0010] The transport route 20 transports the object to be inspected 10. The transport route 20 includes a conveyor 21 and a rotor 22. Specifically, the conveyor 21 is a belt conveyor. The rotor 22 is a magnetic rotor. The line scan camera 30 and the lighting device 40 are positioned at fixed locations.

[0011] The line scan camera 30 captures images of the inspection object 10 as it is transported along the transport path 20. The illumination device 40 illuminates the inspection object 10 with light at a predetermined angle θ relative to the direction of imaging by the line scan camera 30. Specifically, when the inspection object 10 is transported by the conveyor 21 and reaches the inspection position Pi, it is rotated by the rotor 22. During this rotation, the inspection object 10 is imaged using the line scan camera 30 and the illumination device 40.

[0012] Figure 2 is a perspective view showing the imaging position 15 of the line scan camera 30. The imaging position 15 is located on the outer circumferential surface 11 of the object to be inspected 10. With the line scan camera 30 and illumination device 40 stationary, the object to be inspected 10 rotates around the rotation axis O by the rotor 22. During this rotation, light is shone from the illumination device 40 toward the object to be inspected 10 and reflected from the illuminated area of ​​the object to be inspected 10 toward the line scan camera 30. Also during this rotation, the line scan camera 30 images the imaging position 15 within the illuminated area of ​​the object to be inspected 10. As a result, the entire outer circumferential surface 11 of the object to be inspected is imaged. Based on the image obtained from the imaging, dirt, scratches, etc. on the outer circumferential surface 11 are inspected.

[0013] <2. Adjustment of the position and / or angle of the illumination device 40 of the inspection system 200> A jig 50 is used when constructing the inspection system 200. The position and / or angle of the illumination device 40 is adjusted by irradiating light from the illumination device 40 toward the jig 50.

[0014] In this embodiment, the jig 50 has an external shape and external dimensions that simulate the external shape and external dimensions of the object to be inspected 10. Specifically, the jig 50 has the same external shape and external dimensions as the object to be inspected 10, except for the area of ​​one or more recesses on the outer peripheral surface 51. In this embodiment, the external shape of the object to be inspected 10 and the external shape of the jig 50 are cylindrical. The diameter and height of the cylindrical shape of the object to be inspected 10 are the same as the diameter and height of the cylindrical shape of the jig 50.

[0015] Figure 3 is an arrangement diagram of the line scan camera 30, lighting device 40, and jig 50 according to Embodiment 1. As shown in Figure 3, in Embodiment 1, the lighting device 40 emits highly directional light. Figure 3 shows a cylindrical cross-section of the jig 50 perpendicular to the height direction. Figure 4 is a schematic configuration diagram illustrating a method for adjusting the position and / or angle of the lighting device 40 using the jig 50 according to Embodiment 1. In the callout in Figure 4, the outer surface 51 of the jig 50 is depicted in an enlarged view.

[0016] The jig 50 includes an outer circumferential surface 51, a light-reflecting portion 52, a first strip-shaped portion 54, and a second strip-shaped portion 55. The outer circumferential surface 51 includes the light-reflecting portion 52, the first strip-shaped portion 54, and the second strip-shaped portion 55. The light-reflecting portion 52 includes the first strip-shaped portion 54 and the second strip-shaped portion 55. With respect to the width direction of the first strip-shaped portion 54, the second strip-shaped portion 55 is located inside the ends of the first strip-shaped portion 54.

[0017] The first strip-shaped section 54 is used to adjust the position and / or angle of the illumination device 40. The second strip-shaped section 55 is used to adjust the position and / or angle of the line scan camera 30. This configuration is useful for adjusting the position and / or angle of the illumination device 40 that illuminates the inspection target 10 when the inspection target 10 is imaged by the line scan camera 30.

[0018] The position and / or angle of the lighting device 40 can be adjusted based on the change in the appearance of the light-reflecting portion 52 caused by irradiating the first strip-shaped portion 54 with light from the lighting device 40, and the width of the first strip-shaped portion 54. In this embodiment, the width of the first strip-shaped portion 54 defines the width of the illumination range 41 in the jig 50 of the lighting device 40. Specifically, the width of the first strip-shaped portion 54 is the same as the width that the illumination range 41 in the jig 50 of the lighting device 40 should have. The position and / or angle of the lighting device 40 can be adjusted so that the width of the first strip-shaped portion 54 matches the width of the part of the light-reflecting portion 52 where a change in appearance is observed (i.e., the illumination range 41 in the jig 50 of the lighting device 40). These descriptions regarding the appearance of the light-reflecting portion 52, the width of the first strip-shaped portion 54, and the width of the illumination range 41 are, for example, descriptions as viewed from the position of the line scan camera 30.

[0019] In this embodiment, the second strip-shaped portion 55 has a narrower width than the first strip-shaped portion 54. The second strip-shaped portion 55 is provided at the imaging position 15 of the line scan camera 30. Specifically, the second strip-shaped portion 55 is provided at a position on the outer circumferential surface 51 of the jig 50 corresponding to the imaging position 15 on the outer circumferential surface 11 of the object to be inspected 10. The position of the second strip-shaped portion 55 defines the direction of the field of view of the line scan camera 30. Specifically, the position of the second strip-shaped portion 55 is the position that the width center 31 of the field of view of the line scan camera 30 on the jig 50 should take. In Figure 3, the width center 31 extends in a direction perpendicular to the plane of the paper.

[0020] In this embodiment, the outer circumferential surface 51 is made of metal. In the jig 50, the light-reflecting portion 52 is a part of the outer circumferential surface 51. The outer circumferential surface 51 includes the light-reflecting portion 52 and the low-reflecting portion 53. In Figure 3, the regions on the outer circumferential surface 51 where the light-reflecting portion 52 and the low-reflecting portion 53 extend are schematically shown by a dashed-dotted line and a dashed-dotted line, respectively.

[0021] In this embodiment, the surface roughness Ra of the light-reflecting portion 52 is lower than the surface roughness Ra of the low-reflecting portion 53. Specifically, the light-reflecting portion 52 is a mirror surface, and the reflection of light at the light-reflecting portion 52 is specular reflection.

[0022] In this embodiment, the light-reflecting portion 52 is at least a part of the cylindrical surface, specifically a part of the cylindrical surface. Here, the cylindrical surface refers to the side surface of the cylinder. The first strip-shaped portion 54 is located inward of both ends of the light-reflecting portion 52 with respect to the rotational direction of the cylindrical surface. The second strip-shaped portion 55 is located inward of both ends of the first strip-shaped portion 54 with respect to the rotational direction of the cylindrical surface. The longitudinal direction of the first strip-shaped portion 54 and the longitudinal direction of the second strip-shaped portion 55 are parallel to the height direction of the cylindrical shape of the jig 50. The first strip-shaped portion 54 is a strip-shaped recess. The second strip-shaped portion 55 is a strip-shaped recess. A two-stage recess is formed by providing the recess constituting the second strip-shaped portion 55 within the recess constituting the first strip-shaped portion 54.

[0023] In adjusting the position and / or angle of the lighting device 40 in this embodiment, the jig 50 is positioned such that the longitudinal direction of the first strip-shaped portion 54 and the longitudinal direction of the second strip-shaped portion 55 are parallel to the axis of rotation O, and the direction from the lighting device 40 toward the jig 50 and the direction from the line scan camera toward the jig 50 are perpendicular to the axis of rotation O.

[0024] In this embodiment, when adjusting the position and / or angle of the illumination device 40, the jig 50 is positioned at the inspection position Pi in the transport path 20. The jig 50 is designed so that the following first and second states appear when the position and / or angle of the line scan camera 30 and the position and / or angle of the illumination device 40 are in the desired relationship with respect to the jig 50. The first state is when, as viewed from the position of the line scan camera 30, the longitudinal direction of the illumination range 41 of the illumination device 40 in the jig 50 is parallel to the longitudinal direction of the first strip-shaped portion 54, and the width of the illumination range 41 of the illumination device 40 in the jig 50 matches the width of the first strip-shaped portion 54. The second state is when the width center 31 of the field of view of the line scan camera 30 in the jig 50 is aligned with the second strip-shaped portion 55 so that it extends parallel to the longitudinal direction of the second strip-shaped portion 55. In Figure 3, the light hatching 46 indicates the propagation path of light emitted by the illumination device 40. The dark hatching 36 indicates the area within the field of view of the line scan camera 30.

[0025] In this embodiment, the position and / or angle of the line scan camera 30 and the position and / or angle of the illumination device 40 relative to the jig 50 are adjusted using the jig 50 to obtain the first and second states. The first strip-shaped portion 54 is visible, and the portion of the light-reflecting portion 52 that actually reflects light appears white to the naked eye. On the other hand, when the width center 31 is aligned with the second strip-shaped portion 55, an image corresponding to the second strip-shaped portion 55 is obtained by imaging with the line scan camera 30. For these reasons, the first and second states can be obtained by adjusting the position and / or angle of the line scan camera 30 and the illumination device 40 relative to the jig 50, thereby realizing the relationship described above. Therefore, the technology according to this embodiment is useful for adjusting the position and / or angle of the illumination device 40 that illuminates the inspection target 10 when imaging the inspection target 10 with the line scan camera 30.

[0026] In this embodiment, the first strip-shaped portion 54 is a recess. Therefore, the way light is reflected can change in stages at both ends of the first strip-shaped portion 54 in the width direction. This makes it easy to visually recognize both ends and to adjust the position and / or angle of the illumination device 40 to obtain the first state. The second strip-shaped portion 55 is also a recess. Therefore, even when light is irradiated onto the first strip-shaped portion 54, if the width center 31 is aligned with the second strip-shaped portion 55, the amount of light at the width center 31 is limited due to the recess. Therefore, a black image corresponding to the second strip-shaped portion 55 is obtained by imaging with the line scan camera 30.

[0027] In this embodiment, the first, second, and third steps are performed in this order. In the first step, the jig 50 is placed at the inspection position Pi. In the second step, the position and / or angle of the illumination device 40 is adjusted so that the first state is obtained. In the third step, the position and / or angle of the line scan camera 30 is adjusted so that the second state is obtained. Specifically, before the second step, the illumination device 40 is temporarily placed near the target position and / or near the target angle. Before the third step, the line scan camera 30 is temporarily placed near the target position and / or near the target angle. The second step may be performed after the third step, or it may be performed simultaneously with the third step.

[0028] Suppose the jig has an external shape that is completely different from the external shape of the object to be inspected 10, and also has external dimensions that are completely different from the external dimensions of the object to be inspected 10. In this case, the jig occupies a different area from the area that the object to be inspected 10 should occupy when the line scan camera 30 is imaging. Therefore, even if the layout of the structures of the inspection system 200 (not shown) does not hinder the transport of the object to be inspected 10, it becomes necessary to design the jig while considering the area that the jig can occupy in relation to the said layout.

[0029] In contrast, in this embodiment, the jig 50 has an external shape and external dimensions that simulate the external shape and external dimensions of the object to be inspected 10. Because there is commonality in the external shape and external dimensions between the jig 50 and the object to be inspected 10, the jig 50 can be positioned to occupy the area that the object to be inspected 10 should occupy when imaging with the line scan camera 30. If the above layout does not hinder the transport of the object to be inspected 10, the above considerations are unnecessary in the design of the jig 50. This embodiment is advantageous in this respect. Furthermore, this embodiment is also advantageous in that there is no need to prepare a power supply for powering the jig 50 when adjusting the position and / or angle of the lighting device 40 using the jig 50.

[0030] Other embodiments will be described below. In the following, elements common to embodiments already described and those described later will be given the same reference numerals, and their descriptions may be omitted.

[0031] (Embodiment 2) Figure 5 is an arrangement diagram of the line scan camera 30, illumination device 45, and jig 50 according to Embodiment 2. In Embodiment 2, the illumination device 45 emits light with low directivity (hereinafter referred to as diffuse light). The diffuse light is reflected by the outer surface 51 of the jig 50, generating reflected light. In Figure 5, the portion of the diffuse light between the pair of dashed lines 47, 47 is the portion of the diffuse light that has a higher illuminance than the portion outside of that portion (hereinafter referred to as the first high-illuminance portion). The portion of the reflected light between the pair of double-dashed lines 48, 48 is the portion of the reflected light that has a higher illuminance than the portion outside of that portion (hereinafter referred to as the second high-illuminance portion). The first high-illuminance portion is reflected by the outer surface 51, becoming the second high-illuminance portion. Hereinafter, the area of ​​the illumination range 41 of the illumination device 40 that has a high illuminance corresponding to the first high-illuminance portion or the second high-illuminance portion will be referred to as the effective illumination range 49.

[0032] Similar to Embodiment 1, in Embodiment 2, the position and / or angle of the lighting device 40 can be adjusted based on the change in the appearance of the light-reflecting portion 52 caused by irradiating the first strip-shaped portion 54 with light from the lighting device 40, and the width of the first strip-shaped portion 54. In Embodiment 2, the width of the first strip-shaped portion 54 defines the width of the effective illumination range 49 in the fixture 50 of the lighting device 40. Specifically, the width of the first strip-shaped portion 54 is the same as the width that the effective illumination range 49 in the fixture 50 of the lighting device 40 should have. The position and / or angle of the lighting device 40 can be adjusted so that the width of the first strip-shaped portion 54 matches the width of the part of the light-reflecting portion 52 where the change in appearance is clear (i.e., the effective illumination range 49 in the fixture 50 of the lighting device 40). These descriptions regarding the appearance of the light-reflecting portion 52, the width of the first strip-shaped portion 54, and the width of the effective illumination range 49 are, for example, descriptions as viewed from the position of the line scan camera 30.

[0033] In Embodiment 2, the first state of Embodiment 1 is read as the third state. The third state is a state in which, as viewed from the position of the line scan camera 30, the effective illumination range 49 of the jig 50 of the lighting device 40 is aligned with the first strip-shaped portion 54 such that the longitudinal direction of the effective illumination range 49 of the jig 50 of the lighting device 40 is parallel to the longitudinal direction of the first strip-shaped portion 54 and the width of the effective illumination range 49 of the jig 50 of the lighting device 40 matches the width of the first strip-shaped portion 54.

[0034] In Embodiment 2, unlike Embodiment 1, there is unevenness in illuminance between the center and the edges of the diffused light emitted by the lighting device 45. Therefore, the effective illumination range 49 is utilized. The effective illumination range 49 is aligned with the first strip-shaped portion 54 so that its width matches the width of the first strip-shaped portion 54. Since the effective illumination range 49 is brighter than its surroundings, it is possible to visually distinguish the effective illumination range 49 from its surroundings, and thus the third state can be obtained. Also, typically, the illuminance of the effective illumination range 49 is stable. This makes it easier to obtain the third state.

[0035] Various modifications can be applied to the techniques described in Embodiment 1 and Embodiment 2.

[0036] The object to be inspected 10 may be a capacitor, a motor, a beverage can, or a canned food item. The external shape of the object to be inspected 10 and the jig 50 may be an elliptical prism or a rectangular prism.

[0037] For example, the jig 50 may be manufactured by machining the object to be inspected 10, which has been manufactured before the position and / or angle of the lighting device 40 or 45 has been adjusted. The jig 50 may also be manufactured separately from the object to be inspected 10.

[0038] The outer circumferential surface 51 may be made of a material other than metal, such as resin. The light-reflecting portion 52 may constitute the entire outer circumferential surface 51. The light-reflecting portion 52 may be a cylindrical surface.

[0039] It is not necessary for the first strip-shaped portion 54 to be a recess. The first strip-shaped portion 54 may be, for example, a visible area to which ink is applied. Two lines may be drawn on the light-reflecting portion 52, and the area between the two lines may be treated as the first strip-shaped portion 54. The lines may be solid lines or dotted lines.

[0040] It is not essential that the second strip portion 55 is a concave portion. The first strip portion 54 and the second strip portion 55 can be configured in any manner so that there is a difference in the way of reflecting light between them. In this way, there is a difference in the appearance of the reflected light from the first strip portion 54 and the appearance of the reflected light from the second strip portion 55 as viewed from the position of the line scan camera 30. Therefore, an image corresponding to the second strip portion 55 can be obtained by imaging with the line scan camera 30. The first strip portion 54 may be included in the light reflecting portion 52, and the second strip portion 55 may be included in the rough surface portion rather than the light reflecting portion 52. The rough surface portion can be a portion having a higher surface roughness Ra than the light reflecting portion 52. A configuration may be adopted in which light is specularly reflected by the first strip portion 54 while light is not specularly reflected by the light reflecting portion 52. The second strip portion 55 may be a visible region coated with ink.

[0041] (Supplementary Note) The following techniques are disclosed by the present disclosure.

[0042] (Technique 1) A jig having an outer shape simulating the outer shape of an inspection object imaged using a line scan camera and a lighting device, an outer peripheral surface, a light reflecting portion included in the outer peripheral surface, a first strip portion included in the light reflecting portion and used for adjusting the position and / or angle of the lighting device, and a second strip portion located inside the first strip portion and used for adjusting the position and / or angle of the line scan camera.

[0043] (Technique 2) The jig according to Technique 1, wherein the light reflecting portion is at least a part of a cylindrical surface.

[0044] (Technique 3) The jig according to Technique 1 or 2, wherein the first strip portion is a strip-shaped concave portion.

[0045] (Technique 4) The jig according to any one of Techniques 1 to 3, wherein the second strip portion is a strip-shaped concave portion.

[0046] (Technique 5) The jig according to any one of Techniques 1 to 4, wherein the outer shape of the jig is a cylindrical shape, and the longitudinal directions of the first strip portion and the second strip portion are the height direction of the cylindrical shape.

[0047] (Technique 6) A method for adjusting the position and / or angle of the illumination device in an inspection system including a line scan camera that images an inspection object conveyed along a conveyance path and an illumination device that irradiates light onto the inspection object, the method including: disposing the jig described in Technique 1 on the conveyance path; and irradiating light from the illumination device toward the jig to adjust the position and / or angle of the illumination device.

[0048] (Technique 7) The method according to Technique 6, wherein the position and / or angle of the illumination device is adjusted based on a change in the appearance of the light reflection part generated by irradiating the light onto the first strip part from the illumination device and the width of the first strip part.

[0049] (Technique 8) The method according to Technique 6 or 7, wherein the conveyance path includes a rotor that rotates the inspection object about a rotation axis, and the jig is disposed such that the longitudinal directions of the first strip part and the second strip part are parallel to the rotation axis, and the directions from the illumination device and the line scan camera toward the jig are orthogonal to the rotation axis.

[0050] The technique according to the present disclosure is useful, for example, in constructing an inspection system.

Claims

1. A jig having an external shape that simulates the external shape of an object to be inspected, which is imaged using a line scan camera and an illumination device, comprising: an outer surface; a light-reflecting portion included in the outer surface; a first strip-shaped portion included in the light-reflecting portion and used for adjusting the position and / or angle of the illumination device; and a second strip-shaped portion located inside the first strip-shaped portion and used for adjusting the position and / or angle of the line scan camera.

2. The jig according to claim 1, wherein the light-reflecting portion is at least a part of a cylindrical surface.

3. The jig according to claim 1, wherein the first strip-shaped portion is a strip-shaped recess.

4. The jig according to claim 1, wherein the second strip-shaped portion is a strip-shaped recess.

5. The jig according to claim 1, wherein the external shape of the jig is cylindrical, and the longitudinal direction of the first strip portion and the longitudinal direction of the second strip portion are the height direction of the cylindrical shape.

6. A method for adjusting the position and / or angle of an illumination device in an inspection system comprising a line scan camera for imaging an object to be inspected being transported along a transport path, and an illumination device for irradiating the object to be inspected with light, the method comprising: placing the jig described in claim 1 on the transport path; and adjusting the position and / or angle of the illumination device by irradiating light from the illumination device toward the jig.

7. The method according to claim 6, wherein the position and / or angle of the lighting device is adjusted based on the change in the appearance of the light reflecting portion caused by irradiating the first strip-shaped portion with light from the lighting device and the width of the first strip-shaped portion.

8. The method according to claim 6, wherein the transport path includes a rotor that rotates the object to be inspected around a rotation axis, and the jig is arranged such that the longitudinal direction of the first strip portion and the longitudinal direction of the second strip portion are parallel to the rotation axis, and the direction from the lighting device toward the jig and the direction from the line scan camera toward the jig are perpendicular to the rotation axis.

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