Storage device, electronic equipment, and storage device control method
The storage device with a voltage-controlled magnetoresistive element and control circuit addresses the challenge of precise voltage control in VC-MRAM, reducing write error rates by using magnetic layers with different anisotropy effects and a spacer layer to manage voltage application time.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- SONY SEMICON SOLUTIONS CORP
- Filing Date
- 2025-12-17
- Publication Date
- 2026-07-02
AI Technical Summary
Existing voltage-controlled magnetic random access memory (VC-MRAM) technologies face challenges in controlling the voltage application time with high precision due to parasitic resistance and capacitance, leading to increased write error rates as memory size increases.
A storage device with a voltage-controlled magnetoresistive element and a first control circuit that attenuates voltage or current, comprising a first and second magnetic layer with different voltage-controlled magnetic anisotropy effects and a spacer layer, is used to control the voltage application time.
This configuration reduces write error rates by accurately controlling the voltage application time, improving the reliability of data storage in VC-MRAM.
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