MEMS-type probe card having upper and lower stoppers
The MEMS-type probe card with upper and lower stoppers addresses probe detachment and shaking issues, ensuring stable electrical signal transmission and reducing labor costs by preventing probe separation and shaking.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- SDA CO LTD
- Filing Date
- 2025-06-20
- Publication Date
- 2026-07-02
AI Technical Summary
Conventional MEMS-type probe cards face issues with probe detachment and shaking due to gravity, leading to re-insertion needs and degraded signal transmission, especially with smaller connection terminals and narrower pitch spacing in semiconductor devices.
A MEMS-type probe card equipped with upper and lower stoppers that prevent probe separation and shaking by using protruding stoppers on the probe's outer surface, ensuring stable coupling and reducing re-insertion requirements.
The design enhances probe stability, preventing detachment and shaking, thereby maintaining accurate electrical signal transmission and reducing labor costs associated with frequent replacements.
Smart Images

Figure KR2025008616_02072026_PF_FP_ABST