Measuring device for x-ray emission spectrochemical analysis
WO244172SActive Publication Date: 2025-02-21RIGAKU CORP
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Patent Information
- Application Number
- WO244172
- Authority / Receiving Office
- WO · WO
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2024-06-25
- Filing Date
- 2024-11-27
- Publication Date
- 2025-02-21
- Estimated Expiration
- 2049-11-27
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Abstract
The ornamental design for a measuring device for x-ray emission spectrochemical analysis, as shown and described; in a front perspective view, the thin lines shown on the edges in the reproduction are not lines that represent a pattern, but lines that represent the shape of a three-dimensional surface; in reference view 1.12 showing a transparent part, the part colored with lightblack has transparency; in reference view 1.13 showing a translucent part, the part colored with light black has translucency; 1.5: enlarged cross-sectional view taken along the B-B line in the top plan view for the portion defined by the A-A line in the front view and the E-E line in the top plan view; 1.6: enlarged cross-sectional view taken along the C-C line in the top plan view for theportion defined by the A-A line in the front view and the E-E line in the top plan view; 1.7: enlarged cross-sectional view taken along the A-A line in the front view and the F-F line in the top plan view; 1.14 is a reference view showing that a glove can be attached to the hole provided in the transparent part when using the measuring device for x-ray emission spectrochemical analysis that is this article, and forms no part of the claimed design.
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