Digital Circuit Testing TRIZ Cases
- Multi-FPGA Timing Analysis via Graph Segmentation
Graph segmentation reduces computational power requirements by analyzing individual FPGA timing separately, enabling precise synchronization delay detection.
- Integrated Circuit Timing Correction for Aging Signal Delays
A correcting circuit adjusts clock delays based on margin sensing feedback to extend integrated circuit lifespan and prevent catastrophic failures.
- On-Chip Error Rate Meter for Semiconductor Die Testing
An on-chip error rate meter eliminates external hardware by synchronizing digital bit streams with reference signals to compute performance metrics directly.
- Automatic Fault Detection in Inter-Power Domain Timing Analysis
Graph-based filtering identifies faulty inter-power domain paths, resolving the trade-off between measurement precision and analysis speed.
- Telemetry Modeling for Electronic Stress Testing
Machine learning models predict future telemetry values to reduce physical stress testing duration and cost.
- Single Decision Function for Cost-Optimized Device Testing
A single decision function predicts device test results using correlated measurement subsets.
- Multi-bit Test Control Circuit Using Delayed Single Source Signal
A multi-bit test control circuit generates pulse signals by combining a single source signal with delayed versions for bank interleaving operations.
- Ring Topology Bus Monitoring Modules for Real-Time SoC Debugging
Series-connected ring topology monitoring modules acquire test information from subsystems to locate errors in real time without continuous data recording.
- On-Chip Clock Controller for Memory Interface Testing
An on-chip clock controller provides mutually exclusive signals during scan capture to test memory interfaces efficiently.
- Power Module Semiconductor Connection Monitoring via PWM Segmentation
A power module device monitors semiconductor connections using pulse width modulation to isolate and measure individual component states.
- Integrated Circuit Test Counter for Operational Speed Fault Detection
Counter circuit bridges ATE and functional clocks, eliminating glitches during mode switching while enabling accurate detection of slow-to-rise faults.