A detachable ion source housing couples to a mass spectrometer inlet using sealing means and a release mechanism.
Laser desorption ionization with soft Lewis acids prevents molecular fragmentation, enabling accurate formula assignment of heavy hydrocarbon compounds.
Time-varying electric fields guide ions from atmospheric desorption to vacuum ionization, reducing interface losses.
Organic acid electrolytes increase analyte signal amplitude by two to ten times while preventing gas phase breakdown in mass spectrometry.
An axial magnetic field ion source generates coaxial electron and ion beams using a magnet assembly and lens system.
Feedback control of the ion source chamber temperature stabilizes the ion cluster ratio and prevents current degradation during shallow ion implantation.
An automated tuning system determines optimal laser parameters for ion imaging samples using a sacrificial test area.
Radial fins on a coiled induction device dissipate heat and control magnetic fields, extending operational life.
A MEMS ion beam generator uses segmented electrodes to create a voltage gradient that directs ions toward the outlet zone.
Voltage switching cleans the corona discharge point, reducing operating voltage requirements and preventing instability in portable IMS systems.
A detachable cooling trap member intercepts aluminum fluoride byproducts to prevent clogging and maintain stable ion beam current.
Argon gas dark discharge ionizes samples via a hyperboloid needle electrode for mass spectrometry.
A tandem ionizer mass spectrometer source uses electrospray nebulization and heating to vaporize mobile phase and ionize analytes.
A desorption atmospheric pressure chemical ionization system directs high-speed solvent vapor ions toward a substrate surface.
Sequential pin activation eliminates electric field interference, extending service life and improving sensitivity.
Super-strong ionization generates multiple charge states to distinguish isobaric ions and eliminate molecular interference.
Parallel capillary alignment with a roughened tip enables fine mist generation from high solid content samples without plugging.
A mass spectrometry system analyzes whole blood samples to determine analyte concentrations using ion detection.
Sub-micron ionization chamber chip reduces source dimensions to achieve high brightness proton beam writing.
Segmenting the continuous matrix spray into discrete droplets prevents molecular diffusion and reduces sample depletion, ensuring reliable mass data.
A small orifice in the partition wall allows detachable capillary tube installation without breaching vacuum.
A cold cathode ion source element uses a grid electrode spaced less than the electron mean free path to control field emission.
Dynamic parameter adjustment enables continuous analysis of high-matrix samples without dilution.
Capillary features in the reservoir apparatus feed liquid metal into the arc chamber, eliminating insulating compound deposition on electrodes.
A hollow conduit delivers reagent molecules to a reaction zone via electric discharge ionization.
A mass spectrometer uses dielectric barrier discharge to ionize samples under reduced pressure for high sensitivity.
Supercharged analyte ions undergo charge transfer at atmospheric pressure to dissociate into daughter ions.
Segmented chambers and a perforated impaction plate prevent counterflow dilution, maintaining high ionization efficiency for trace species detection.
Integrates rare alkali metal tracers into diagnostic coatings to enable precise dried composition determination via ICP-MS without matrix effects.
Evacuated space within hollow member blocks heat from gas conduit, preventing sample degradation while maintaining compact design.
Evaporation source generates calibration gas within the ionization region of a mass spectrometer.
An automated startup routine uses an internal ion source to verify mass spectrometer operational state, resolving inexperienced user difficulties.
An ion source assembly uses a spacer held at an intermediate potential to segment the electric field between the high-voltage source and ground.
An ion source integrates a funnel with multiple ionization devices to capture analyte ions efficiently.
Corona discharge treatment homogenizes probe surfaces, eliminating insulating films that cause unstable ionization efficiency and varying peak intensities.
Adjusting laser pulse energy maintains constant total ion count in MALDI mass spectra for precise quantitative analysis.
Heated gas stream vaporizes solid or neat liquid samples into the ionization region, allowing efficient detection of volatile and less polar compounds.
A touch screen interface translates user inputs into coordinated motion stage movements for optical devices.
A high-velocity gas flow generates charged particles to ionize analytes on a surface without lasers or matrix materials.
Radial gas flow through a flared passage reduces turbulence and stagnation zones, stabilizing sample sprays and improving mass spectrometer sensitivity.
Non-invasive electrical signal classification compensates for aerosol propagation delays to align mass spectrometry data with electrocautery tool location.
Angled emitters spaced at least 3 mm apart minimize interference while a heater aids desolvation to improve ion signal magnitude.
An ion detector monitors unintended ions within the vacuum vessel to prevent extraction of contaminants that degrade beam purity.
A filter electrode sets a higher electric potential than the target to transmit polyvalent positive ions while blocking cluster impurities.
Photo-fragmentation apparatus uses photon sources to generate prompt ion fragmentation, resolving metastable interference in mass spectrometry.
Ligand compound ions stabilize analyte ionization, resolving inconsistent efficiency caused by variable ligand forming substance partial pressures.
Small laser spot size reduces cluster ion interference during in-source decay.
Segmented chambers isolate the ion generation space from the target supply unit to preserve vacuum conditions while enabling continuous operation.
Carbon monoxide and xenon-hydrogen gases suppress metal oxide formation, extending system lifetime during semiconductor implantation.