Method and device for eliminating abnormal value in VTEC, equipment and medium
By generating a global ionosphere grid model and processing the statistical values of abnormal grid points based on peripheral data, the spherical harmonic coefficient is solved by iterating the problem of outliers in the global ionosphere model, and efficient outlier processing without external measured data and empirical models is achieved.
Patent Information
- Application Number
- CN202311396977.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-10-25
- Publication Date
- 2025-04-25
AI Technical Summary
When the existing technology uses spherical harmonic functions to establish a global ionosphere model, there is a problem that some grid points are outliers, especially in areas where observation stations are lacking. Traditional technology needs to rely on a large amount of measured data and selecting empirical models with appropriate weights, resulting in the compensation effect depends on the accumulated amount of measured data and the weight accuracy of empirical model.
By generating a global ionosphere grid model based on the global ionosphere VTEC model, the abnormal grid points are determined, and statistical values are generated based on the peripheral data of the abnormal grid points, and the spherical harmonic coefficient of the VTEC model is solved iteratively until there is no outlier value for VTEC at all grid points.
There is no need to introduce a large amount of external measured data and select empirical models, and rely solely on the original data and parameter estimation methods to simplify data processing and solve the problem that the effect of outlier compensation depends on measured data and empirical model accuracy.