Abnormality detection method and device, electronic equipment and storage medium
By receiving product parameters and using the abnormal cause estimation model to determine the estimated abnormal cause, combined with incremental training to update the model and threshold range, the existing industrial abnormality detection methods are solved, and efficient and accurate automated abnormality detection is achieved.
Patent Information
- Application Number
- CN202510053480.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-13
- Publication Date
- 2025-05-09
AI Technical Summary
The existing industrial anomaly detection methods mainly rely on manual inspection, which are inefficient, costly, and are difficult to adapt to changes in different process flows and production batches.
Provide an abnormality detection method, by receiving product parameters, using the abnormal cause estimation model to determine the estimated cause of the abnormality, and present product parameters and abnormal cause. At the same time, incremental training is carried out based on the actual abnormality cause, and the abnormality cause estimation model and threshold range are updated to adapt to changes in different process stages and production batches.
It realizes automated abnormality detection, improves detection efficiency and accuracy, is highly adaptable, can be widely used in various industrial scenarios, and reduces production costs.