Current-based magnetic field radiation emission limit value cutting method and device and electronic equipment

Abstract

The invention relates to the technical field of electromagnetic compatibility testing, and provides a current-based magnetic field radiation emission limit value cutting method and device and electronic equipment. Comprising the steps of obtaining working current parameters of tested equipment; determining a basic limit value of magnetic field radiation emission, obtaining a working current of the tested equipment when the magnetic field radiation is the basic limit value, and taking the working current as a reference current threshold value; when the working current parameter is greater than the reference current threshold value, calculating the clipping amount of the magnetic field radiation emission limit value based on the ratio of the working current parameter to the reference current threshold value; and cutting the basic limit value according to the cutting amount to obtain the magnetic field radiation emission limit value of the tested equipment. The limit value is compatible with the existing electromagnetic compatibility national military standard magnetic field radiation emission limit value, so that the electromagnetic compatibility test assessment of the large-current equipment can be evaluated more reasonably and accurately, and the method has high engineering application value.

Description

Technical Field

[0001] The present invention relates to the field of electromagnetic compatibility testing technology, and in particular to a method, device and electronic equipment for cutting magnetic field radiation emission limits based on current. Background Art

[0002] Electromagnetic compatibility is an important performance indicator of equipment, and has been used throughout the entire process of equipment demonstration, development, testing and finalization. In the GJB151 series of electromagnetic compatibility standards, the magnetic field radiation emission project is almost one of the necessary assessment items for the electromagnetic compatibility of various types of equipment and subsystems. It is used to control the magnetic field radiation of the shell and cable interface of the equipment under test (EUT) in the frequency band of 25Hz to 100kHz to protect equipment sensitive to low-frequency magnetic fields. According to electromagnetic field theory, the magnetic field radiation of the EUT is linearly related to the current passing through the EUT. The increase in current naturally causes the magnetic field radiation level near the EUT to increase. On the other hand, in the GJB151 series of standards, the magnetic field radiation emission limit is independent of the current of the EUT, that is, the same magnetic field radiation limit is used for high-current equipment and low-current equipment. The GJB151 series of standards adopts a fixed limit for magnetic field radiation emission, which is determined based on the expected maximum magnetic field radiation of most well-designed EUTs.

[0003] However, with the application of high-current equipment, such as power generation and transformation equipment with currents of up to several thousand amperes, the current level is much higher than the EUT characteristics used to determine the magnetic field radiation emission limit in the standards at the time. As a result, these high-current devices cannot be accurately evaluated in actual magnetic field radiation emission tests, and exceeding the standard is relatively common. Moreover, due to their inherent high-current characteristics, it is often difficult to make adequate corrections, affecting the development progress of the equipment.

[0004] Therefore, there is an urgent need for a reasonable and easy-to-operate limit tailoring method to achieve a correct evaluation of the magnetic field radiation emission interference of high current equipment. Summary of the invention

[0005] In view of this, the embodiments of the present application provide a method, device, electronic device and storage medium for tailoring magnetic field radiation emission limits to solve the problem that it is difficult to reasonably evaluate high current equipment when performing emission tests based on the fixed limits used for magnetic field radiation emissions in the GJB151 series standards.

[0006] A first aspect of an embodiment of the present application provides a method for tailoring a magnetic field radiation emission limit, comprising:

[0007] Obtain the working current parameters of the equipment under test;

[0008] Determine the basic limit value of magnetic field radiation emission, obtain the working current of the equipment under test when the magnetic field radiation is the basic limit value, and use it as a reference current threshold;

[0009] When the operating current parameter is greater than the reference current threshold, calculating a trimming amount of the magnetic field radiation emission limit based on a ratio of the operating current parameter to the reference current threshold;

[0010] The basic limit is trimmed according to the trimming amount to obtain the magnetic field radiation emission limit of the equipment under test.

[0011] A second aspect of an embodiment of the present application provides a magnetic field radiation emission limit tailoring device, comprising:

[0012] A working current acquisition module is used to obtain working current parameters of the device under test;

[0013] A reference current threshold determination module is used to determine a basic limit value of magnetic field radiation emission, obtain the working current of the device under test when the magnetic field radiation is the basic limit value, and use it as a reference current threshold value;

[0014] a trimming amount calculation module, configured to calculate a trimming amount of a magnetic field radiation emission limit value based on a ratio of the operating current parameter to the reference current threshold when the operating current parameter is greater than the reference current threshold;

[0015] A trimming module is used to trim the basic limit value according to the trimming amount to obtain the magnetic field radiation emission limit value of the device under test.

[0016] A third aspect of an embodiment of the present application provides an electronic device, comprising a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device implements the method for trimming magnetic field radiation emission limits as provided in the first aspect of an embodiment of the present application.

[0017] A fourth aspect of the embodiments of the present application provides a computer program product, including a computer program. When the computer program is executed, the method according to the first aspect of the embodiments of the present application is executed.

[0018] The first aspect of the embodiment of the present application provides a method for cutting the limit of magnetic field radiation emission, by obtaining the working current parameter of the device under test; determining the basic limit of magnetic field radiation emission, obtaining the working current of the device under test when the magnetic field radiation is the basic limit, and using it as the reference current threshold; when the working current parameter is greater than the reference current threshold, the cutting amount of the magnetic field radiation emission limit is calculated based on the ratio of the working current parameter to the reference current threshold; cutting the basic limit according to the cutting amount to obtain the magnetic field radiation emission limit of the device under test. It breaks through the limitations of traditional static limits, dynamically adjusts the limit through current parameters, makes the test standard adapt to the actual working conditions of the equipment in real time, and the dynamic cutting mechanism of overall cutting of the full frequency band limit of 25Hz to 100kHz solves the limit "jump" phenomenon caused by frequency band operation. This limit is compatible with the current electromagnetic compatibility national military standard magnetic field radiation emission limit, so that the electromagnetic compatibility test assessment of large current equipment can be more accurately evaluated, and has strong engineering application value. The computer program of the tailoring method is simple to implement and can be easily integrated into the testing equipment of various testing units, with low engineering implementation cost.

[0019] It can be understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 This is a flow chart of a method for tailoring magnetic field radiation emission limits provided in one embodiment of the present application;

[0022] Figure 2 This is a schematic diagram of the magnetic field radiation emission limit values ​​applicable to the army's high current equipment obtained based on this method;

[0023] Figure 3 This is a schematic diagram of the magnetic field radiation emission limit values ​​applicable to naval high current equipment obtained based on this method;

[0024] Figure 4 This is a schematic diagram of the limit values ​​of the magnetic field radiation emission of the power line of a certain AC high current equipment after trimming;

[0025] Figure 5 It is a schematic diagram of the structure of a magnetic field radiation emission limit tailoring device provided in an embodiment of the present application;

[0026] Figure 6 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0027] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0028] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0029] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0030] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0031] like Figure 1 As shown, the method for tailoring the magnetic field radiation emission limit provided in the embodiment of the present application includes the following steps S101 to S104:

[0032] Step S101: Obtain operating current parameters of the device under test.

[0033] Step S102: determine the basic limit value of magnetic field radiation emission, obtain the working current of the equipment under test when the magnetic field radiation is the basic limit value, and use it as a reference current threshold.

[0034] Step S103: when the operating current parameter is greater than the reference current threshold, a trimming amount of the magnetic field radiation emission limit is calculated based on a ratio of the operating current parameter to the reference current threshold.

[0035] Step S104: trim the basic limit value according to the trimming amount to obtain the magnetic field radiation emission limit value of the equipment under test.

[0036] The embodiment of the present application obtains the working current parameter of the device under test; determines the basic limit of magnetic field radiation emission, obtains the working current of the device under test when the magnetic field radiation is the basic limit, and uses it as the reference current threshold; when the working current parameter is greater than the reference current threshold, the trimming amount of the magnetic field radiation emission limit is calculated based on the ratio of the working current parameter to the reference current threshold; the basic limit is trimmed according to the trimming amount to obtain the magnetic field radiation emission limit of the device under test. It breaks through the limitations of traditional static limits, dynamically adjusts the limit through current parameters, and makes the test standard adapt to the actual working conditions of the equipment in real time. The dynamic trimming mechanism of overall trimming of the full frequency band limit of 25Hz to 100kHz solves the limit "jump" phenomenon caused by frequency band operation. This limit is compatible with the current electromagnetic compatibility national military standard magnetic field radiation emission limit, so that the electromagnetic compatibility test assessment of large current equipment can be more accurately evaluated, and has strong engineering application value. The computer program of this trimming method is simple to implement, easy to integrate into the detection equipment of each test unit, and the engineering implementation cost is low.

[0037] In one embodiment, the trimming operation is based on the basic limit of magnetic field radiation emission to achieve overall adjustment of the limit of the 25Hz to 100kHz frequency band. 0 Adopt the RE101 limit in GJB 151B. Determine the basic limit of magnetic field radiation emission, including:

[0038] When the equipment under test is an Army platform, the basic limit is calculated according to the following formula:

[0039] Limit 0 =-20lg 10 (f) +210, 25 ≤ f ≤ 100 k;

[0040] Among them, Limit 0 is the basic limit and f is the frequency.

[0041] In the application, the type of the device under test can be actively input by the user or determined by the sensor. 0 The unit of is dBpT, and the unit of frequency f is Hz.

[0042] In one embodiment, determining a basic limit value for magnetic field radiation emission includes:

[0043] When the equipment under test belongs to a naval platform, the basic limit is calculated according to the following formula:

[0044]

[0045] Among them, Limit 0 is the basic limit and f is the frequency.

[0046] In one embodiment, it further includes:

[0047] When the operating current parameter is not greater than the reference current threshold, the trimming amount is 0.

[0048] In the application, the system can configure a current parameter comparison unit to compare the real-time collected working current parameters with the preset reference current threshold. When the working current parameter is not greater than the reference current threshold, the zero clipping logic is triggered, for example:

[0049] 1) Send a disable clipping command, that is, when I EUT ≤I ref When dB =0dB, where I EUT Indicates the working current parameter in ampere (A), I ref is the reference current threshold;

[0050] 2) Record the original current data and judgment timestamp. The threshold judgment process uses a sliding window average algorithm to sample the current data 20 times with a period of 1 second, remove the maximum and minimum values ​​and take the average to avoid misjudgment caused by instantaneous impact current. For working conditions with fluctuations exceeding ±15%, the sampling period is automatically extended to 3 seconds and spectrum analysis is started to confirm the steady-state current.

[0051] In the embodiment of the present application, EUT When it is not greater than the reference current, it degenerates into the current standard magnetic field radiation emission limit and has strong engineering applicability.

[0052] In one embodiment, the trimming amount of the magnetic field radiation emission limit is calculated based on the ratio of the working current parameter to the reference current threshold, including:

[0053] According to the formula Calculate the trimming amount for magnetic field radiated emission limits;

[0054] Among them, Δ dB is the trimming amount, I EUT is the working current parameter, I ref is the reference current threshold.

[0055] In the application, when the operating current parameter is greater than the reference current threshold, the logic for calculating the trimming amount of the magnetic field radiation emission limit is triggered, for example:

[0056] 1) Sending an enable signal to the trimming amount calculation module;

[0057] 2) Refer to the CE101 limit trimming method of the GJB151B-2013 conducted emission test item. The trimming amount calculation module is based on the formula Calculate the trimming amount for magnetic field radiated emission limits;

[0058] 3) Output the calculated trimming amount to the trimming module.

[0059] In one embodiment, the magnetic field radiation emission limit of the equipment under test is calculated according to the following formula:

[0060] Limit 1 =Limit 0 +Δ dB ;

[0061] Among them, Limit 1 is the magnetic field radiation emission limit of the equipment under test, Limit 0 is the basic limit, Δ dB For cutting amount.

[0062] In the application, the basic limit value Limit 0 and trimming amount Δ dB The final limit value is synthesized by the adder 1 =Limit 0 +Δ dB .

[0063] In one embodiment, obtaining the operating current parameter of the device under test includes:

[0064] When the device under test is a DC device, the load current of the device under test is obtained as the working current parameter;

[0065] When the device under test is an AC device, the fundamental wave current of the device under test is obtained as the working current parameter.

[0066] In applications, DC devices can obtain load current through series sampling resistors, and AC devices can use digital phase-locked technology to extract fundamental components. The system can automatically identify the device type and switch the acquisition mode.

[0067] In one embodiment, when the working current of the equipment under test (EUT) is DC, I ref =185A;

[0068] When the EUT working current is AC, the reference current threshold is determined by the relationship between the straight wire current and the magnetic induction intensity. The calculation method is as follows:

[0069]

[0070] Among them I ref is the reference current threshold, in ampere (A), μ0 =4π×10 -7 T·m / A is the vacuum magnetic permeability. Considering that the Army limit in GJB 151B is generally higher than the Navy limit, it represents more serious magnetic field radiation interference. Therefore, B takes the Army RE101 limit, in Tesla (T). d represents the test distance corresponding to limit B, where d = 0.07m, and f is the frequency corresponding to the reference current threshold, in Hz.

[0071] In application, after cutting by the above method, the magnetic field radiation emission limits suitable for army and navy high current equipment are obtained, as follows: Figure 2 and Figure 3 shown.

[0072] The following uses the magnetic field radiation emission test assessment of the power line of a certain equipment of the Army and Navy as an example to further explain the limit value trimming algorithm of magnetic field radiation emission.

[0073] Example 1: The power cable of a certain DC high current equipment in the Army, the load current I EUT is 150A. According to the above cutting method, since I EUT ref , trimming amount Δ dB =0, so the magnetic field radiation emission limit of the device is the basic limit, Limit 0 =-20lg 10 (f)+210, the frequency range is 25≤f≤100k, that is, Figure 2 The "Basic Limits for Magnetic Field Radiated Emissions" line in.

[0074] Example 2: The power cable of a certain AC high current equipment in the Navy. Assume that the power frequency of the equipment is 50Hz and the fundamental current is 1000A. At this time, the EUT working current I EUT =1000A, calculate the reference current threshold I ref =2π×0.07×3.16×10 -5 / μ 0 =220.8A, calculate the trimming amount According to Limit 1 =Limit 0 +Δ dB The magnetic field radiation emission limit after trimming is obtained as follows Figure 4 Take any frequency point in the magnetic field radiation emission test frequency band as an example, for example, f = 450Hz, the magnetic field radiation emission limit in GJB151B-2013 is 114dBpT, for this AC high current equipment, if the magnetic field radiation emission test data at f = 450Hz is not greater than 127.1dBpT, then the magnetic field radiation emission test result of this frequency point is considered qualified, otherwise it is unqualified, thus realizing the assessment of magnetic field radiation emission of high current equipment.​

[0075] Each step of the embodiment of the present application is implemented based on the physical laws of electromagnetic fields and electronic measurement technology. Its essence is to dynamically adjust the magnetic field radiation emission limit through technical means (sensing, calculation, adjustment). The implementation of the scheme relies on measurable physical parameters (working current, frequency) and executable calculation processes (logarithmic operations, limit synthesis), among which: the working current parameter is directly obtained through electrical connection, and needs to be implemented with the help of physical devices such as current sensors and signal conditioning circuits; the frequency parameter is derived from the actual working state of the equipment and needs to be extracted through physical devices such as measurement receivers or digital signal processors; the formula calculation process is completed by an embedded processor, and the calculation result directly controls the threshold setting module of the test equipment. This technical solution solves the technical problem that the current electromagnetic compatibility standard requirements are not applicable to large current equipment, and large current equipment cannot obtain reasonable limit relaxation. This effect can be reproduced and verified by standard instruments such as measurement receivers and current probes.

[0076] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0077] The present application also provides a magnetic field radiation emission limit trimming device, which is used to perform the steps in the above magnetic field radiation emission limit trimming method embodiment. The magnetic field radiation emission limit trimming device can be a virtual appliance in an electronic device, which is run by a processor of the electronic device, or it can be the electronic device itself.

[0078] like Figure 5 As shown, the magnetic field radiation emission limit tailoring device 100 provided in the embodiment of the present application includes:

[0079] The working current acquisition module 101 is used to obtain working current parameters of the device under test;

[0080] A reference current threshold determination module 102 determines a basic limit value of magnetic field radiation emission, obtains an operating current of the device under test when the magnetic field radiation is the basic limit value, and uses the operating current as a reference current threshold value;

[0081] A trimming amount calculation module 103, used to calculate a trimming amount of a magnetic field radiation emission limit value based on a ratio of the working current parameter to the reference current threshold when the working current parameter is greater than a reference current threshold;

[0082] The trimming module 104 is used to trim the basic limit value according to the trimming amount to obtain the magnetic field radiation emission limit value of the device under test.

[0083] In application, each module in the magnetic field radiation emission limit tailoring device may be a software program module, or may be implemented by different logic circuits integrated in a processor, or may be implemented by multiple distributed processors.

[0084] like Figure 6 As shown, the embodiment of the present application further provides an electronic device 200, including: at least one processor 201 ( Figure 6 Only one processor is shown in the figure), a memory 202, and a computer program 203 stored in the memory 202 and executable on at least one processor 201, wherein the processor 201 implements the steps in the above-mentioned various method embodiments when executing the computer program 203.

[0085] In applications, electronic devices may include, but are not limited to, processors and memories. Those skilled in the art will appreciate that Figure 6 The electronic device is merely an example and does not limit the electronic device, and may include more or less components than those shown in the figure, or may combine certain components, or may include different components.

[0086] In applications, the processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or the processor may be any conventional processor, etc.

[0087] In application, the memory may be an internal storage unit of an electronic device in some embodiments, such as a hard disk or memory of the electronic device. The memory may also be an external storage device of the electronic device in other embodiments, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device. Further, the memory may also include both an internal storage unit of the electronic device and an external storage device. The memory is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as program code of a computer program, etc. The memory may also be used to temporarily store data that has been output or is to be output.

[0088] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0089] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0090] The embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0091] An embodiment of the present application provides a computer program product, including a computer program. When the computer program product runs on an electronic device, the electronic device can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0092] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device that can carry the computer program code to the device / electronic device, a recording medium, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electric carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0093] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0094] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0095] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0096] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0097] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A method for tailoring magnetic field radiation emission limits based on current, characterized in that: include: Obtain the working current parameters of the equipment under test; Determine the basic limit value of magnetic field radiation emission, obtain the working current of the equipment under test when the magnetic field radiation is the basic limit value, and use it as a reference current threshold; When the operating current parameter is greater than the reference current threshold, calculating a trimming amount of the magnetic field radiation emission limit based on a ratio of the operating current parameter to the reference current threshold; The basic limit is trimmed according to the trimming amount to obtain the magnetic field radiation emission limit of the equipment under test.

2. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: The determination of the basic limit value of magnetic field radiation emission includes: When the equipment under test belongs to an Army platform, the basic limit is calculated according to the following formula: Limit0=-20lg 10 (f)+210,25≤f≤100k; Among them, Limit0 is the basic limit and f is the frequency.

3. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: The determination of the basic limit value of magnetic field radiation emission includes: When the equipment under test belongs to a naval platform, the basic limit is calculated according to the following formula: Among them, Limit0 is the basic limit and f is the frequency.

4. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: When the working current of the device under test is AC, the reference current threshold is determined by referring to the relationship between the straight wire current and the magnetic induction intensity, and the calculation method is as follows: Among them, I ref is the reference current threshold, μ0 is the vacuum magnetic permeability, B is the basic limit of the Army platform, d represents the test distance corresponding to B, and f is the frequency corresponding to the reference current threshold.

5. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: When the operating current of the device under test is direct current, the reference current threshold is 185A.

6. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: The calculating the trimming amount of the magnetic field radiation emission limit based on the ratio of the working current parameter to the reference current threshold value comprises: When the operating current parameter is greater than the reference current threshold, according to the formula Calculate the trim amount for the magnetic field radiated emission limit; where Δ dB is the trimming amount, I EUT is the working current parameter.

7. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: Also includes: When the operating current parameter is not greater than the reference current threshold, the trimming amount is 0.

8. The method for tailoring the magnetic field radiation emission limit based on current according to claim 1, characterized in that: The magnetic field radiation emission limit of the equipment under test is calculated according to the following formula: Limit1=Limit0+Δ dB ; Among them, Limit1 is the magnetic field radiation emission limit of the equipment under test, Limit0 is the basic limit, Δ dB For cutting amount.

9. A device for tailoring magnetic field radiation emission limits based on current, characterized in that: include: A working current acquisition module is used to obtain working current parameters of the device under test; A reference current threshold determination module is used to determine a basic limit value of magnetic field radiation emission, obtain an operating current of the device under test, and use it as a reference current threshold value; a trimming amount calculation module, configured to calculate a trimming amount of a magnetic field radiation emission limit value based on a ratio of the operating current parameter to the reference current threshold when the operating current parameter is greater than the reference current threshold; A trimming module is used to trim the basic limit value according to the trimming amount to obtain the magnetic field radiation emission limit value of the device under test.

10. An electronic device, characterized in that: The electronic device comprises a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device implements the method as claimed in any one of claims 1 to 8.

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