Memory devices and memory modules

By using an error detector in the memory device to perform multiple reads and error bit processing, the problem of resource waste caused by memory cell defects is solved, and the yield and reliability of the memory device are improved.

CN122369550APending Publication Date: 2026-07-10SAMSUNG ELECTRONICS CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SAMSUNG ELECTRONICS CO LTD
Filing Date
2026-01-09
Publication Date
2026-07-10

AI Technical Summary

Technical Problem

In the prior art, the scaling down of semiconductor memory devices leads to an increase in memory cell defects. When using redundancy repair technology to replace defective cells, the size of the memory chip increases and resources are wasted. Existing ECC error correction technology cannot effectively solve this problem.

Method used

By employing an error detector to perform multiple read operations in the memory device, extracting and comparing error location information, and combining addition operations, it is determined whether the error bit is correctable, and uncorrectable error bits are processed, thereby improving the yield of the memory device.

Benefits of technology

This effectively improves the yield of memory devices, reduces the waste of redundant resources, and ensures the effectiveness and reliability of memory chips.

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Abstract

A memory device and a memory module are provided. The memory device can include a memory cell array including a normal cell region storing data, and an error detector configured to detect an error of the data, the error detector can include an error location information extractor configured to extract first error location information of a first error bit in first data read from the normal cell region in a first read operation, and extract second error location information of a second error bit in the first data read from the normal cell region in a second read operation, and an error location comparator configured to compare the first error location information with the second error location information, and output a signal based on a comparison result of the first error location information and the second error location information.
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