Microtome system and corresponding method

Abstract

The present invention relates generally to a microtome system (100) for cutting sections from a sample block, wherein the microtome system (100) includes: a sample holder; a blade (110) having a cutting edge (112), wherein the blade (110) includes a fine cutting edge (114.1) and a rough cutting edge (116.1), wherein the cutting edge (112) is at least partially formed by the fine cutting edge (114.1); a blade holder (120); an illumination source (130); and a detector (140); wherein the illumination source (130) is configured to illuminate the gap (136) between the front surface (128) of the sample block (126) and the cutting edge (112), such that the fine cutting edge (114.1) and at least a portion of the rough cutting edge (116.1) are illuminated. The light reflected by the sample block (126) is reflected by the front surface (128) of the sample block (126) to the detector (140), thereby creating an illuminated region, wherein at least a portion of the blade (112) and at least a portion of the image of the blade mirrored by the front surface (128, 428) of the sample block (126) form the boundary of the illuminated region, and wherein the light reflected by the fine blade (114.1) and the light reflected by at least that portion of the rough blade (116.1) have at least the same average illumination intensity, and wherein the slicer system (100) is configured to image the illuminated region by means of the detector (140) and determine the geometric features of the illuminated region based on the imaged illuminated region.

Description

Technical Field

[0001] This invention relates to a slicer system for cutting slices from a sample block, and a corresponding method. Background Technology

[0002] A microtome or microtome system is used to cut sections from a sample or sample block, such as a biological or histological sample. Such a microtome system typically includes a blade and a sample holder for the sample block, which are guided relative to and along each other to cut thin sections from the sample block. To produce uniform sections or slices, the blade must typically be aligned with the sample block or sample holder. For example, such a microtome system is described in EP 4 269 983 A1. Summary of the Invention

[0003] In view of the above, there is a need to improve the slicer system. According to embodiments of the present invention, a slicer system and method having the features of the independent claims are proposed. Advantageous further developments form the subject matter of the dependent claims and the following description.

[0004] One embodiment of the present invention relates to a microtome system for cutting sections from a sample block. For example, such a microtome system may include or be configured as an ultramicrotome (a microtome for cutting very thin or ultrathin sections from a sample block). The microtome system includes: a sample holder configured to hold the sample block, a blade having an edge configured to cut sections from the sample block, and a blade holder for holding or being configured to hold the blade. The blade includes a fine cutting edge and a coarse cutting edge, wherein the cutting edge is at least partially formed by the fine cutting edge. The microtome system also includes an illumination source and a detector.

[0005] The illumination source is configured to illuminate the gap between the front surface of the sample block and the cutting edge when the sample block is held in the sample holder, such that the fine cutting edge and at least a portion of the rough cutting edge are illuminated, and the light reflected by them (i.e., at least a portion of the fine and rough cutting edges) is reflected from the front surface of the sample block to the detector. This results in a perceptible illumination area (also referred to as a light gap), wherein at least a portion of the cutting edge and at least a portion of the image of the cutting edge mirrored by the front surface of the sample block form the boundary of the illumination area. For a more detailed illustration and description of how the illumination area is generated, see the accompanying drawings and corresponding description.

[0006] The light reflected by the fine blade and the light reflected by at least that portion of the rough blade have at least the same, on average, illumination intensity. Furthermore, the slicer system is configured to image the illuminated area by means of a detector and determine the geometric features of the illuminated area based on the imaged area. Such geometric features can then be used, for example, for the automatic alignment of the scalpel and the sample block.

[0007] Alignment of the blade and sample block is often a crucial step in producing thin sections. Such alignment is typically performed by experienced users, as they can easily manage this operation. Automated alignment provides support in this process and also makes it easier for new or less experienced users to operate.

[0008] For manual alignment, the illuminated area is typically observed using a stereomicroscope or similar instrument to properly assess spatial conditions and identify light diffraction effects (used as alignment indicators). During alignment, the blade and sample block can be brought closer together, for example, to a distance of less than 1 μm, to take advantage of light diffraction at the gap between the blade edge and the front surface of the sample block. Because of the small distance between the sample block and the blade, the risk of damaging the sample block or the blade, or both, through incorrect manipulation techniques increases.

[0009] It is possible to determine the geometric features of the illuminated area by using a detector, such as automated alignment based on computer analysis. It has been shown that, in order to determine such geometric features, the distance between the blade and the front surface of the sample block can be larger; this may even be necessary to allow for the determination of precise geometric features.

[0010] While this greater distance is advantageous in terms of preventing damage, it raises another problem. As mentioned above, blades used in slicing machines typically have both fine and coarse cutting edges. When the distance is very small, only the light reflected from the fine cutting edge creates the illuminated area; when the distance is larger, the light reflected from the coarse cutting edge also creates part of the illuminated area. Due to the typical way blades with both fine and coarse cutting edges are manufactured, this results in a lower illumination intensity for the portion produced by the coarse cutting edge compared to the portion produced by the fine cutting edge. This can make determining the geometry difficult or even impossible.

[0011] Since the illuminated areas of both fine and rough cutting edges have at least substantially the same illumination intensity, the (automatic) determination of geometric features is easier and better.

[0012] In one embodiment, the illumination intensity of light reflected by the fine cutting edge and the illumination intensity of light reflected by at least that portion of the rough cutting edge differ from each other by less than 50%, less than 20%, or less than 10%. In this way, the two illumination intensities are at least substantially the same. The two illumination intensities can also be identical. In one embodiment, the illumination intensity of the illuminated area (including light reflected by both the fine and rough cutting edges) is at least substantially and at least on average uniform. This further improves the (automatic) determination of geometric features.

[0013] In one implementation, the fine and rough cutting edges are formed at an angle of less than 1° to each other. Conventional blades used in microtome slicers have such an angle, with a value of approximately 3°. However, this results in poor illumination intensity for the portion produced by the rough cutting edge. This is because at an angle of approximately 3°, the light reflected from the rough cutting edge is not guided to the detector via the front surface of the sample block, or the light reaching the rough cutting edge does not originate directly from the illumination source. Results show that the situation is significantly improved when the angle is less than 1°, because the light reflected from the rough cutting edge can be guided to the detector just as effectively as the light reflected from the fine cutting edge.

[0014] In one embodiment, the illumination source is configured to illuminate the gap between the front surface of the sample block and the cutting edge when the sample block is held in the sample holder, such that at least a portion of the rough cutting edge (and preferably also the fine cutting edge) is directly illuminated, and wherein light originating from the direct illumination and reflected by at least that portion of the rough cutting edge (and preferably the fine cutting edge) is reflected by the front surface of the sample block to the detector. This further increases the illumination intensity of both portions and thus improves the (automatic) determination of geometric features.

[0015] In one implementation, the width of the illuminated area, viewed from the blade edge to the front surface of the sample block, is greater than 10 μm, 20 μm, or 50 μm. This distance can even be greater than 100 μm. This large distance allows for easy and efficient (automatic) determination of geometric features, provided that the illumination intensities of the two portions are sufficiently similar.

[0016] In one embodiment, the illumination source is configured to illuminate the gap between the front surface of the sample block and the cutting edge when the sample block is held in the sample holder, such that at least that portion of the rough cutting edge is indirectly illuminated by the holder, and wherein light originating from the indirect illumination and reflected by at least that portion of the rough cutting edge is reflected by the front surface of the sample block to the detector. In other words, the light reaching the rough cutting edge does not necessarily have to originate directly from the illumination source, as long as the illumination intensities of the two portions are sufficiently similar.

[0017] In one embodiment, the tool holder has a reflective, diffuse, or partially diffuse surface, wherein at least that portion of the rough cutting edge is indirectly illuminated via the surface of the tool holder. Due to this particular surface of the tool holder, the illumination intensity of the two portions can still be sufficiently similar even without direct illumination of the rough cutting edge.

[0018] In one embodiment, the tool holder includes a reflector or a separate element having a reflective, diffuse, or partially diffuse reflective surface, wherein at least that portion of the rough cutting edge is indirectly illuminated via the surface of the reflector or the separate element. Due to the reflector or specific element on the tool holder, the illumination intensity of the two portions can still be sufficiently similar even without direct illumination of the rough cutting edge.

[0019] In one embodiment, the lighting source includes a first light source and a second light source, wherein the first light source is configured to illuminate the fine cutting edge, and

[0020] The second light source is configured to illuminate at least that portion of the rough cutting edge. In this way, the two light sources can be individually pointed at their respective cutting edges, allowing for optimal illumination of the cutting edge.

[0021] In one embodiment, the microtome system further includes an actuator, and the blade holder and sample holder are configured to be movable relative to each other. For example, the blade holder or sample holder is rotatably mounted about an axis. The actuator is configured to cause movement of the blade holder or sample, for example, rotation of the blade holder about an axis. The microtome system is configured to: a) automatically align the blade with the front surface of the sample block by controlling the actuator based on the geometry of the illuminated area. Alternatively or additionally, the microtome system is configured to: b) provide the user with instructions on how to manually control the actuator to align the blade with the front surface of the sample block based on the detected geometry of the illuminated area.

[0022] In addition to the axis of rotation, there may be other axes of rotation or other ways to move the tool holder or sample holder. Furthermore, additional actuators may be provided to achieve this movement or rotation.

[0023] Such geometric features detected by the detector can be used to automate the alignment process. Such automation can include fully automated alignment, such as that described in alternative a), and can also include partially automated alignment by automatically providing helpful instructions or directives to the user, such as that described in alternative b). Depending on the alternative used, the actuators can be motorized and / or manually operated. The detected geometric features can be analyzed, for example, by means of image or video processing. This automation also allows inexperienced users to easily and efficiently align the blade or cutting edge of the slicer system with the sample. Incorrect settings that could lead to damage can be avoided or at least reduced.

[0024] In one embodiment, the slicer system is configured to control the action to arrange the blades parallel to the front surface of the sample block, such that the geometry of the detected illuminated area includes a constant width along the length of the illuminated area.

[0025] In one embodiment, the tool holder and sample holder are configured to be movable relative to each other in the cutting direction, and the slicer system is configured to image illumination areas of the tool holder and sample holder at at least two different positions relative to each other in the cutting direction using a detector. Specifically, the illumination areas are always fully illuminated during the movement of the sample holder and tool holder relative to each other. This helps improve the determination of geometric features due to the two (or even more) distinct instances of the image and the illumination areas.

[0026] Another embodiment of the invention relates to a method of aligning the blade of a knife with the front surface of a sample block to cut a slice from the sample block. The sample block is held by a sample holder, and the knife is held by a knife holder. The knife includes a fine cutting edge and a coarse cutting edge, wherein the cutting edge is at least partially formed by the fine cutting edge. The method includes illuminating a gap between the front surface of the sample block and the blade, such that the fine cutting edge and at least a portion of the coarse cutting edge are illuminated, and the light reflected from them is reflected by the front surface of the sample block to a detector, thereby creating a perceptible illuminated area. At least a portion of the blade and at least a portion of an image of the blade mirrored by the front surface of the sample block form the boundary of the illuminated area, and the light reflected by the fine cutting edge and the light reflected by at least that portion of the coarse cutting edge have at least, on average, substantially the same illumination intensity. The illuminated area is then imaged by means of the detector, and the geometric features of the illuminated area are determined based on the imaged illuminated area. Furthermore, the blade is aligned with the front surface of the sample block based on the geometric features.

[0027] Regarding the advantages of this method and other implementations, refer to the above description of the implementations, features, and advantages of the slicer system, which also applies here.

[0028] Other advantages and embodiments of the invention will become apparent from the description and accompanying drawings.

[0029] It should be noted that, without departing from the scope of the invention, the features mentioned above and the features described below can be used not only in the combinations indicated respectively, but also in other combinations or individually. Attached Figure Description

[0030] Figure 1a A slicer system according to one embodiment is illustrated schematically;

[0031] Figure 1b A more detailed view is shown schematically. Figure 1a Part of a slicer system;

[0032] Figure 2a The schematic diagram illustrates the lighting area to be generated according to one implementation scheme;

[0033] Figure 2b The schematic illustration shows the lighting area to be generated according to another embodiment;

[0034] Figure 3a A slicer system according to another embodiment is schematically shown;

[0035] Figure 3b Suggested schematically in another view Figure 3a Part of a slicer system;

[0036] Figure 4a , Figure 4b , Figure 4c , Figure 4d The lighting areas used to explain the different implementation schemes are schematically shown;

[0037] Figure 5 A slicer system according to another embodiment is schematically shown;

[0038] Figure 6 A slicer system according to another embodiment is schematically shown; and

[0039] Figure 7 A flowchart schematically illustrates a method according to one implementation scheme. Detailed Implementation

[0040] Figure 1a A slicer system 100 according to one embodiment is schematically illustrated. The slicer system 100 is preferably an ultramicrotome system or includes an ultramicrotome, and is intended for cutting sections or slices from a sample block. It should be noted that... Figure 1a The diagram shows only components and elements used to illustrate at least a portion of embodiments of the invention. For another view showing additional components of the slicer system, refer to... Figure 3a , Figure 3b .

[0041] The slicer system 100 includes a blade holder 120, which is configured to... Figure 1a The blade 110 is held in the case shown. For example, the blade holder 120 includes a base element 122 and a mounting device 124, wherein the blade 110 is mounted to the base element 122 by means of the mounting device 124.

[0042] Furthermore, the slicer system 100 includes a sample holder configured to hold sample blocks 128. In Figure 1, only sample blocks 126 are shown, and the sample holder is not shown. Sample blocks 126 include a front surface 128 from which slices or sheets are cut.

[0043] The knife 110 has a cutting edge 112, in Figure 1a , Figure 1b In the middle, the cutting edge is located to the upper right of the blade 110. The cutting edge 112 is configured to cut slices from the sample block 126 when the cutting edge and the front surface 128 of the sample block are properly aligned and when the blade and the sample block move relative to each other.

[0044] The knife 110 includes a fine cutting edge 114.1 and a rough cutting edge 116.1; this is in Figure 1bThe fine cutting edge 114.1 and the rough cutting edge 116.1 are arranged, for example, adjacent to each other; however, it should be noted that an intermediate section may be provided between the fine cutting edge 114.1 and the rough cutting edge 116.1. Both the fine cutting edge 114.1 and the rough cutting edge 116.1 may be, for example, ground cutting edges, i.e., these surfaces can be obtained by grinding the blade surface. Other methods of manufacturing or machining the blade surface are also possible. The fine cutting edge 114.1 generally has a smoother surface than the rough cutting edge 116.1 in order to obtain thin and smooth cuts.

[0045] from Figure 1b As can be seen, the blade 110 includes another fine cutting edge 114.2 and another coarse cutting edge 116.2, which may be similar to cutting edge 114.1 and coarse cutting edge 116.1, but located on the opposite side of the blade 110. The cutting edge 112 is at least partially formed by the fine cutting edge 114.1. Figure 1b In the example, the cutting edge 112 is also formed at least partially by another fine cutting edge 114.2.

[0046] The fine cutting edge 114.1 and the rough cutting edge 116.1 are formed relative to each other at an angle 118. In one embodiment, this angle 118 is less than 1°, for example, approximately 0.75°. It should be noted that in... Figure 1b In the diagram, the angle is exaggerated.

[0047] The slicer system 100 also includes a light source 130, and

[0048] Detector 140; Detector 140 may be, for example, or include a camera. In one embodiment, illumination source 130 may include LEDs or other light sources and diffuser elements or filters to provide uniform illumination. Note that illumination source 130 may also include multiple light sources.

[0049] from Figure 1a As can be seen, a gap 136 exists between the front surface 128 of the sample block 126 and the cutting edge 112. Before cutting a slice from the sample block, the cutting edge 112 and the front surface 128 must be aligned with each other, specifically with the cutting edge 112 oriented parallel to the front surface 128. This gap 136 is illuminated to generate an illuminated area (light gap) detected by the detector 140.

[0050] To achieve this, the illumination source 130 is configured to illuminate the gap 136 when the sample block 126 is held in the sample holder, such that the fine cutting edge 114.1 and at least a portion of the rough cutting edge 116.1 are illuminated, and the light reflected by them is reflected by the front surface 128 of the sample block 126 to the detector 140, thereby creating a perceptible illuminated area.

[0051] At least a portion of the blade edge 11 and at least a portion of the image of the blade edge mirrored by the front surface 128 form the boundary of the illuminated area. This is in Figure 2a , Figure 2b It is shown in the figure and explained below.

[0052] For illustrative purposes, Figure 1a The diagram shows a first light beam 132 and a second light beam 134, both originating from illumination source 130. As can be seen from the diagram, the first illumination beam 132 is directed toward the fine cutting edge 114.1, i.e., the fine cutting edge 114.1 is directly illuminated by illumination source 130. The first light beam 132 is then reflected by the fine cutting edge 114.1 toward the front surface 128. At or through the front surface 128, the first light beam 132 is reflected again and then directed toward and into detector 140.

[0053] It can also be seen that the second illumination beam 134 is guided toward the tool holder 120 or its mounting device 122, and is reflected by the tool holder 120 toward the rough cutting surface 116.1, that is, the rough cutting surface is indirectly illuminated by the illumination source 130. Then, the second beam 134 is reflected by the rough cutting surface 116.1 toward the front surface 128. At or through the front surface 128, the second beam 134 is reflected again, and then guided toward and into the detector 140.

[0054] Depending on the angle 188 formed between the fine cutting edge 114.1 and the rough cutting edge 116.1, light directly illuminating the rough cutting edge 116.1 from the illumination source 130 will be guided to the detector 140 via the front surface 128 or will not be guided to that detector. In the case of a large angle 118, such as... Figure 1a As shown, such light from direct illumination of the roughened cutting edge 116.1 will not reach the detector 140. Instead, such light will be reflected by the roughened cutting edge 116.1 and the front surface 128, and then pass through the detector 140. However, if the angle 118 is small enough, i.e., less than 1°, such light will be reflected by the roughened cutting edge 116.1 and the front surface 128, and then strike the detector 140.

[0055] For a larger angle 118, only when the light reflected by the rough cutting edge 116.1 and the front surface 128 is not from direct illumination of the rough cutting edge 116.1 but from indirect illumination (such as...) Figure 1aWhen the second beam 134 (as shown in the diagram) strikes the detector 140, the light will strike the detector. Typically, this indirect illumination results in a relatively low intensity of light reflected from the rough cutting surface 116.1 or at least a portion thereof. This is because the tool holder 120 or its mounting device 122 has a poorer reflectivity compared to the tool surface. Therefore, the light reflected from the fine cutting surface 114.1 has a much higher intensity of illumination than the light reflected from the rough cutting surface 116.1.

[0056] However, if the angle 118 is small and the rough cutting edge 116.1 can be directly illuminated, such that the light reflected from the rough cutting edge can strike the detector, then the illumination intensity of the light reflected from the rough cutting edge 116.1 or at least a portion thereof is much higher, particularly similar to the illumination intensity of the light reflected from the fine cutting edge 114.1. In this way, the light reflected from the fine cutting edge 114.1 and the light reflected from at least that portion of the rough cutting edge 116.1 can at least on average have substantially the same illumination intensity.

[0057] Therefore, in one embodiment, the angle 118 formed by the fine cutting edge 114.1 and the rough cutting edge 116.1 is less than 1°.

[0058] In one embodiment, the tool holder 120 has a reflective, diffuse, or partially diffuse reflective surface. Alternatively, a mirror or other reflective element may be provided at the tool holder 120. In this way, the rough cutting surface 116.1 can be indirectly illuminated via this surface or mirror or element, i.e., as... Figure 1a The second beam 134 in the image still achieves a high illumination intensity of light reflected by the rough cutting surface 116.1 or at least a portion thereof, particularly similar to the illumination intensity of light reflected by the fine cutting surface 114.1. In this way, the light reflected by the fine cutting surface 114.1 and the light reflected by at least that portion of the rough cutting surface 116.1 can also have substantially the same illumination intensity, at least on average.

[0059] Furthermore, the slicer system 110 is configured to image the illumination area by means of a detector 140, and to determine the geometric features of the illumination area based on the imaged illumination area. Such geometric features will be described below. In this way, based on such geometric features, the cutting edge 112 and the front surface 128 can be aligned with each other, for example, such that the cutting edge 112 is oriented parallel to the front surface 128.

[0060] Figure 2a The front surface 228 and the cutting edge 212 of the sample block are schematically illustrated. For example, both are shown as shown from... Figure 1a As seen in the detector shown. Between the front surface 228 and the blade edge 212, there exists a gap 216, also as per [the description of the detector]. Figure 1a As described.

[0061] In addition, Figure 2a The illumination region 238a is shown. As mentioned above, the illumination illuminates both the fine cutting edge and at least a portion of the rough cutting edge, and the light reflected from them is reflected by the front surface 228 of the sample block to the detector, thus creating a perceptible illumination region 238a. At least a portion of the cutting edge 212 and at least a portion of an image of the cutting edge mirrored by the front surface 228 of the sample block form the boundary of the illumination region 238a. This can be seen from... Figure 2a As can be clearly seen, the upper and lower edges of the illumination area 238a are these boundaries. The width of the illumination area 238a, as seen from the blade edge 212 to the front surface 228 of the sample block, is indicated by the reference numeral W. As mentioned above, this width W can be greater than 10 μm or greater than 20 μm.

[0062] The illumination area 238a includes a first portion 238.1 and a second portion 238.2. As mentioned above, there is light reflected from the fine cutting surface and light reflected from the rough cutting surface. Figure 2a In the image, the first part 238.1 corresponds to light reflected by a fine cutting edge, and the second part 238.2 corresponds to light reflected by a rough cutting edge.

[0063] exist Figure 2a In the diagram, the first part 238.1 and the second part 238.2 have different shading, indicating that their illumination intensities are (slightly) different, at least on average. In one respect, this is to illustrate that the two illumination intensities can vary greatly when there is no small angle between the fine and rough cutting surfaces and no proper reflection at the tool holder. For example, with the second part 238.2 having very low illumination intensity, automatic detection of geometric features such as the edges of the illuminated area can be very difficult. This is, for example, because automatic analysis typically only detects high-intensity sections, and the small first part 238.1 does not allow for sufficiently precise determination to make proper alignment possible.

[0064] When the illumination intensity of the second part 238.2 differs from that of the first part 238.1 by an average of less than 50% or is even substantially the same, the entire width of the illumination area 238a can be used for automatic analysis of geometric features.

[0065] Figure 2b It schematically shows the relationship with Figure 2a Similarly, however, the illumination area 238b does not include both parts. This is, for example, because the illumination intensity of the light is the same or nearly the same at the fine and rough cutting surfaces, making it impossible to distinguish between the illuminated areas detected by the detector. In other words, the gap 236 is (at least substantially) uniformly or homogeneously illuminated.

[0066] Figure 3a , Figure 3b A slicer system 300 according to one embodiment is illustrated schematically in different views; different parts or components are shown in different figures, some of which are shown only in some figures. Figure 3a A side view or sectional view is shown. Figure 3b A perspective view is shown. These will be described together below. Figure 3a , Figure 3b It should be noted that the slicer system 300 can basically correspond to Figure 1a , Figure 1b The slicer system 100, however, shows the moving parts.

[0067] The microtome system 300 includes a blade holder 320 for holding a blade 310 and a sample holder 350 for holding a sample block 326, the sample block having a front surface 328. The microtome system 300 also includes an illumination source 330, and...

[0068] Detector 240; Detector 240 may be, for example, a camera or includes a camera.

[0069] The microtome system 300 includes a housing 302 in which desired components can be arranged. In one embodiment, the microtome system 300 also includes a microscope 352 disposed at the housing 302 and configured to allow a user to observe (and inspect) an area of ​​the sample block 326 and a blade 310 with a cutting edge 312. For example, the user may use this method to inspect the cutting motion and / or the quality of the cutting edge 314. The microtome system 300 also includes, for example, a controller 362.

[0070] The illumination area created by illumination 330 through illuminating the (physical) gap between sample block 326 (or its front surface 328) and blade 310 (or its blade edge 312) is detected by detector 340, as also regarding Figure 1a , Figure 1b As described. This may require proper arrangement and / or orientation of detector 340.

[0071] Furthermore, the microscope 352 may be arranged and / or oriented such that the illuminated area is visible by means of the microscope 352. Moreover, the microscope 352 need not be an optical microscope, but a detector 340 may be used to provide an image of the area on an integrated display. In one embodiment, the detector 340 may also be integrated into the microscope 352.

[0072] In one embodiment, the slicer system 300 also includes a display 354 on which information about the cutting process and / or an indication 356 aligning the blade 312 with the front surface 328 of the sample block 326 can be shown to a user. In one embodiment, the slicer system 300 is also configured to present a user interface or graphical user interface, particularly through the display 354. Additionally, input devices such as switches, buttons, keyboards, and computer mice may be used. Furthermore, the display 354 may include a touchscreen. For example, the slicer system 300 includes a receiver 358, which may be disposed, for example, at or on the blade 310.

[0073] Generally, the operating mechanism of the slicer system 300 is such that, when the sample block is correctly aligned with the cutting edge, the sample 326 moves relative to the cutting edge 312 along the cutting direction c. The cutting edge 312 is configured to cut slices (or sheets) from the sample block 326. For example, the slices cut from the sample block 326 can be collected in a collection box 356. To provide such movement, the blade holder 320 and the sample holder 350 are configured to move relative to each other, particularly in the cutting direction c. Basically, either or both of the blade holder 320 and the sample holder 350 can be configured to move along the cutting direction c. In one embodiment, (only) the sample holder 350 is configured to move in the cutting direction c (in two ways, up and down). Additionally, the blade holder 320 and the sample holder 350 can be configured to move relative to each other in the feed direction b so that the cutting edge 312 contacts the sample block 326, and specifically, after slices or sheets have been cut from the sample block 326, the sample block 326 is fed.

[0074] In one embodiment, the tool holder 320 and therefore the tool 310 are configured to be movable in the feed direction b, i.e., toward (and also away from) the sample block 326 or the sample holder 350. However, essentially, the sample holder 350 may also be configured to be movable toward the tool 310 in the feed direction b (or against the feed direction b).

[0075] As mentioned earlier, in order to generate appropriate and accurate slices from the sample, the blade 310 or blade edge 312 and the sample block 326 or sample holder 350 must be aligned before cutting.

[0076] This may require the tool holder 320 or sample holder 350 to be mounted as movable, for example, rotatable about at least one axis. Figure 3b For illustrative purposes, four axes are shown: a first axis z', a second axis x, a third axis y, and another axis z. Rotating the tool holder 320 and / or the sample holder 350 about one or more of these axes allows the blade 312 to be aligned with the front surface 328 of the sample block 326, as will be described in more detail later.

[0077] from Figure 3b As can be seen, typically, the sample holder 350 may be configured to be rotatable, for example, about each of three different axes: x, y, and z. Similarly, the blade holder 320 may be configured to be rotatable about each of three different axes, for example, where only axis z' is shown (similarly, axes x' and y' could be used). Note that the axes shown are oriented according to a Cartesian coordinate system, which is typical for such slicer systems; however, this is for illustrative purposes only, and other ways of defining such axes are possible. Rotating both the blade holder 320 and the sample holder 350 about three different axes allows for many degrees of freedom in aligning the blade edge 312 and the sample front surface 328. However, the total of three different axes for both the blade holder 320 and the sample holder 350 is sufficient to provide alignment in a sufficient number of ways.

[0078] In one embodiment, the tool holder 320 is rotatably mounted about a first axis z', which is parallel to the cutting direction c. The sample holder 350 is mounted to be rotatable about a second axis x and a third axis y. The third axis y is parallel to the feed direction b. Figure 3b It can be seen that the equivalent operation of the tool holder 320 being rotatably mounted about the first axis z is that the sample holder 350 is rotatably mounted about the axis z. In both alternatives, the cutting edge 312 can rotate relative to the sample block 326 or its front surface 328 in the same or equivalent manner. Similarly, the tool holder 320 may rotate about another x' axis and / or y' axis ( Figure 3a (Not shown in the diagram), which is equivalent to the sample holder being able to rotate about the x-axis and / or y-axis. The choice of which component of the blade holder and sample holder will be able to rotate about which axes may depend on the preferred embodiment of the particular slicer system.

[0079] Furthermore, it should be noted that, essentially, only one or two axes around which one of the tool holder and sample holder can rotate are sufficient to align the blade edge 312 and the front surface 328 of the sample. It should be noted that an actuating element can be provided to the tool holder 320 and / or the sample holder 350 to facilitate the desired rotation about the respective axes.

[0080] The controller 362 may be electrically and / or communicatively coupled to the detector 340 to receive data or information detected or acquired by the detector 340. In one embodiment, the controller 362 may also be electrically and / or communicatively coupled to the lighting source 330.

[0081] For example, the slicer system 300 includes three actuators: a first actuator 360.1, a second actuator 360.2, and a third actuator 360.3, such as... Figure 3aAs shown. Note that if only the tool holder 320 and / or sample holder 350 are used around one or two rotatably mounted axes, one or two actuators will be sufficient.

[0082] The first actuator 360.1 is configured to rotate the tool holder 320 about a first axis z'. Note that rotation of the tool holder 320 results in a corresponding rotation of the tool 310 about axis z'. The second actuator 360.1 is configured to rotate the sample holder 350 about a second axis x; such rotation corresponds to tilting of the sample holder 350, and therefore to tilting of the sample block 326. The third actuator 360.3 is configured to rotate the sample holder 350 about a third axis y. Each of the first actuator 260.1, the second actuator 260.2, and the third actuator 260.3 may be motorized. The controller 362 may be electrically and / or communicatively coupled to each of the first, second, and third actuators 260.1, 260.2, 260.3 to operate them, thereby causing the aforementioned rotations about the respective axes.

[0083] In one embodiment, one, two, or all three of the first, second, and third actions 360.1, 360.2, and 360.3 may also be non-motorized but configured for manual actuation or operation, such as a handwheel, to induce the aforementioned rotation. Alternatively, one or more of the first, second, and third actions 360.1, 360.2, and 360.3 may be motorized but configured for manual operation, such as requiring a user to actuate an operating element such as a switch to activate the action.

[0084] In one embodiment, the slicer system 300 includes a handwheel or actuation wheel 364, such as Figure 3a As shown. Handwheel 364 is configured (specifically, by means of a device not shown here) to induce a cutting motion, causing the sample holder 350 to move up and down in the cutting direction c, in order to cut slices from the sample block. Handwheel 364 can also be configured to induce a feed motion (e.g., of the tool holder 320) in the feed direction b. The cutting motion and the feed motion can be coupled, making it possible to efficiently cut several slices. Handwheel 364 can be motorized and / or configured for manual operation. When the handwheel is motorized, automatic cutting motion is possible, allowing the handwheel to be used only for additional and / or corrective movements.

[0085] Additionally, lateral movement in the direction of the second axis x may be possible to move the sample block after the slice or sheet has been cut, so as to cut another slice or sheet immediately adjacent to the first slice or sheet. The handwheel 364 can also be configured to provide such lateral movement. Furthermore, such lateral movement can be achieved in another manner, for example, by an additional (mechanized) handwheel.

[0086] As mentioned above, the slicer system 300 is configured to image the illumination area by means of the detector 340 and determine the geometric features of the illumination area based on the imaged illumination area.

[0087] In one embodiment, the slicer system 300 is configured to image illuminated areas of the blade holder 320 and sample holder 350 at at least two different positions relative to each other in the cutting direction c, using a detector. This also means that the blade holder 320 and sample holder 350 will move relative to each other in the cutting direction c to determine geometric features. For example, geometric features can be determined at each of the at least two different positions, and the average value is then determined as the value of the geometric feature to be used.

[0088] In one embodiment, the slicer system 300 is further configured to: a) automatically align the blade 312 with the front surface of the sample block 326 via a control actuator based on the geometric features of the illumination area, and / or

[0089] b) Based on the detected geometric features of the illuminated area, provide the user with instructions on how to manually control the actuator to align the blade 312 with the front surface of the sample block 326. As mentioned above, such instructions can be provided at the display 354, for example, in the form of instruction 356.

[0090] The actuator to be controlled for alignment can be a first actuator 360.1, a second actuator 360.2, or a third actuator 360.3. Furthermore, two or all of these actuators can be controlled for alignment. The geometry of the illumination area (light gap) can be of different types.

[0091] Figure 4a , Figure 4b , Figure 4c , Figure 4d An example of an illuminated area is illustrated to explain the different types of geometric features that can be determined and used for alignment as mentioned above. It should be noted that multiple such (different) geometric features can also be determined, where different features are used to align the cutting edge with the front surface of the sample block in different ways (e.g., by rotation about different axes mentioned above). Furthermore, three axes x, y, z' and the cutting direction c are also shown (see [reference]). Figure 3b (This is for reference only.)

[0092] Figure 4a The front surface 428 and the cutting edge 412 of the sample block are schematically illustrated. For example, both are shown as shown from... Figure 1a As seen in the detector shown. Between the front surface 228 and the blade edge 212, there exists a gap 436, also as per the description of... Figure 1a As described. Additionally, in Figure 4a The image shows an illumination area 438, which has a first (or upper) boundary 438.1 and a second (or lower) boundary 438.2. Figure 4a The situation shown is similar to Figure 2a , Figure 2b The situation in the middle.

[0093] Furthermore, the width W of the illumination area 438 (i.e., the distance between the first boundary 438.1 and the second boundary 438.2) and the length L of the illumination area 438 along the axis x are shown. For example, geometric features may include the width W of the illumination area or the width W along the length L of the illumination area. Figure 4a As shown, if the tool holder or the tool rotates about axis z', the width W along length L will change. Specifically, when the tool rotates clockwise (in... Figure 4a In the middle), the width W at the left end of the lighting area 438 will decrease, while the width W at the right end will increase.

[0094] Therefore, defining the width W along the length L of the illumination area as a geometric feature allows for alignment of the blade and the front surface, for example, because the tool holder and the blade rotate about axis z, making the width W constant along the length L.

[0095] Therefore, in one implementation, the slicer system can be configured to control

[0096] The first actuator acts as an actuator for arranging the cutting edge parallel to the front surface of the sample, such that the geometry of the detected illumination area includes a constant width along the length of the illumination area. This may include, for example, an axis z' parallel to the cutting direction c.

[0097] While in one implementation, such alignment can be performed automatically, in another implementation, an indication can be generated from geometric features and provided to the user, as mentioned above. If the value of width W is, for example, at the left end of length L (in... Figure 4a If the length L is smaller at the right end compared to the middle, such an instruction may include a command for the user to operate the first action, causing the tool holder (and therefore the tool and cutting edge 412) to rotate about the first axis z' in a specific direction (e.g., clockwise). Furthermore, such instructions may include a measurement of how much or how far the tool holder must rotate about the first axis z'.

[0098] When the cutting edge is aligned with the front surface so that it is parallel to the front surface, slices or thin sheets of constant or uniform thickness can be cut from the sample block.

[0099] Figure 4b An example is shown in the cross-section along line AA at two different positions relative to each other in the cutting direction c of the tool holder (and tool 412) and the sample holder (and sample block 428). Figure 4a The situation. In Figure 4a On the left side, the tool and cutting edge 412 are positioned lower along the cutting direction c than on the right side of the figure. Figure 4a On the right side, the sample block and its front surface 428 remain in the same position along the cutting direction c. It should be noted that this is for illustrative purposes only; as mentioned above, the sample block typically moves along the cutting direction c, but this results in the same relative position.

[0100] In the attached diagram, reference numeral d refers to the distance between the cutting edge 412 and the front surface 428. This distance can be seen along a line orthogonal to the front surface 428 and extends to the cutting edge 412. The distance d is related to the width W, as shown in the diagram. Figure 4a This can be seen from the data. The smaller the distance d, the smaller the width W; and the larger the distance d, the larger the width W.

[0101] For example, the geometry may include the width W of the illumination area for at least two different positions of the tool holder and sample holder relative to each other in the cutting direction c. Such geometry may also include, for example, the illumination width W remaining constant during movement of the tool holder and sample holder relative to each other in the cutting direction c.

[0102] As from Figure 4b As can be seen, if the sample holder and sample block rotate about axis x, the distance d and therefore the width W will change depending on the position of the cutting edge relative to the front surface along the cutting direction c. Specifically, when the sample block rotates clockwise about axis x (in... Figure 4b When rotating, the distance d and therefore the width W in the position shown on the left will decrease, while the distance d and therefore the width W in the position shown on the right will increase.

[0103] Therefore, the width W is determined at these two different locations, for example, as a geometric feature that allows the front surface to be aligned parallel to the cutting direction; this is also the alignment of the cutting edge with the front face.

[0104] Therefore, in one implementation, the slicer system can be configured to control

[0105] The second action serves as an action for arranging the cutting edge parallel to the front surface of the sample, such that the geometry of the detected illumination area includes a constant width at at least two different positions of the tool holder and the sample holder relative to each other in the cutting direction.

[0106] While in one implementation, such alignment can be performed automatically, in another implementation, instructions can be generated from geometric features and provided to the user, as mentioned above. If the value of the width W is, for example, at the lower position of the blade ( Figure 4b The left side of the middle is higher than the upper part of the blade. Figure 4b If the sample holder (and therefore the sample and its front surface 428) is smaller on the right side of the second axis x, then such an instruction may include a command for the user to operate the second action such that the sample holder (and therefore the sample and its front surface 428) rotates about the second axis x in a certain direction (e.g., counterclockwise). Alternatively, such a command may include a measurement of how much or how far the sample holder must rotate about the second axis x.

[0107] When the cutting edge is aligned with the front surface so that it is parallel to the front surface, slices or thin sheets of constant or uniform thickness can be cut from the sample block.

[0108] When the current surface is aligned parallel to the cutting direction, slices or sheets with constant or uniform thickness can be cut from the sample block.

[0109] Figure 4c An example is shown in cross-section. Figure 4a The situation is as follows. There are two different relative positions between the upper edge 428.1 of the front surface 428 and the shown cutting edge 412, one relative position is on the left and the other relative position is on the right.

[0110] On the left, the relative position between the sample block and the cutting edge 412 is such that (when viewed in the cutting direction c) the upper edge 428.1 is above the cutting edge 412. On the right, the relative position between the sample block and the cutting edge 412 is such that, when viewed in the cutting direction c, the upper edge 428.1 is approximately at or slightly below the cutting edge 412.

[0111] The illuminated area detected by the detector is only visible (in the form of a slit or a rectangle with sharp edges) when the entire upper edge 428.1 of the current surface 428 is completely above the cutting edge 412 when viewed in the cutting direction c. Figure 1a This situation is illustrated in the diagram. This means that when the upper edge 428.1 is parallel to the cutting edge 412 and the sample block moves downwards in the cutting direction c, the optical gap will narrow and disappear once the upper edge 428.1 has moved sufficiently below the cutting edge 412. This is similar to the lower edge of the front surface 124 being sufficiently close to or above the cutting edge 412 when viewed in the cutting direction c, or moving upwards sufficiently close to or above the cutting edge.

[0112] If the upper edge 428.1 is not parallel to the cutting edge 412, then... Figure 4cThe situation where the relative positions on the left and right sides exist simultaneously. For example, the relative position on the left can correspond to, for example, the relative position on the right side. Figure 4a The view shown is along AA, and the relative position on the right can correspond to, for example... Figure 4a The view shown is along BB. In other words, the upper edge 428.1 (and therefore the sample block) is rotated around the third axis y.

[0113] exist Figure 4c In the case shown, when the sample block moves downwards in the cutting direction c, the illumination area will only narrow (relative to width W) at the portion where the upper edge 428.1 reaches or moves below the cutting edge 412. The narrowing of the illumination area is determined according to... Figure 4b Starting on the right and moving to the left, the actual illuminated area becomes smaller and smaller until it disappears. During this movement, the illuminated area may appear wedge-shaped. This is in Figure 4d The example is illustrated in which the cutting edge 412 and the front surface 428 are on the lower side when viewed along the axis y, and the wedge-shaped illumination area 438 is on the upper side (as the illumination area when viewed along the cutting direction c).

[0114] In other words, the width W of the light gap changes (decreases) along the length L as the sample block moves downward in the cutting direction. The further the sample block moves downward, the further the decreasing width moves toward the end of the length L. This change occurs over a certain distance in the cutting direction c, where the distance depends on how far the upper edge 428.1 rotates away from its position parallel to the cutting edge. Afterward, the illuminated area becomes wedge-shaped, shrinks, and eventually disappears.

[0115] The reason why the width W of the light beam narrows as the upper edge 428.1 moves downward below the cutting edge 412 is that the light beam or ray reflected from the upper edge of the cutting surface near the cutting edge 412 will no longer be reflected from the front. Therefore, the light beam can no longer contribute to the illumination area, thus causing the illumination area to narrow.

[0116] Therefore, in one implementation, the slicer system can be configured to control

[0117] The third actuator acts as an actuator such that the upper edge and / or lower edge of the front surface of the sample block are arranged parallel to the cutting edge, such that when held by the sample holder, during the relative movement in the cutting direction between the cutting edge and the sample block, the geometric features include dimensions (e.g., width W) that remain constant along the length L of the illumination area in a predetermined upper region up to the upper edge of the front surface, and then decrease uniformly along the length of the illumination area, and / or remain constant in a predetermined lower region up to the lower edge of the front surface, and then decrease uniformly along the length of the illumination area.

[0118] While in one implementation such alignment or arrangement can be performed automatically, in another implementation, instructions can be generated from geometric features and provided to the user, as mentioned above.

[0119] EP 4 269 983 A1 (which is explicitly cited and incorporated herein by reference) also explains in more detail the relevant information. Figures 4a to 4d Different geometric features are explained.

[0120] Each of these geometric features of the illuminated area (light gap) can be determined particularly well from the illuminated area detected (including analyzed) by the detector in the following cases:

[0121] When the illumination intensity of light reflected from a fine cutting edge and the illumination intensity of light reflected from at least that portion of a rough cutting edge differ from each other by less than 50%, less than 20%, less than 10%, or even are substantially equal, the reason is that the illumination area has a sufficiently high width to allow for automatic analysis.

[0122] Figure 5 A slicer system 500 in one embodiment is illustrated. For example, the slicer system 500 may substantially correspond to Figure 1a The slicer system 100; the same parts and components are indicated by the same reference numerals. Note that, for ease of understanding, only some parts and components are shown, and reference numerals are used for reference.

[0123] However, unlike the slicer system 100, the illumination source 530 of the slicer system 500 includes, for example, a first light source 530.1 and a second light source 530.2. The first light source 530.1 is configured to illuminate the fine cutting edge 514.1 (see beam 532), and the second light source 530.2 is configured to illuminate at least a portion of the rough cutting edge 516.1 (see beam 534); in particular, both cutting edges are directly illuminated by their respective light sources. Because two light sources are provided, the illumination of the cutting edges can be improved, and therefore the intensity of the light reflected from the cutting edges can be improved.

[0124] It should be noted that instead of two explicit light sources, light can be specifically directed from a single illumination source to a corresponding location using, for example, optical fibers, which also results in an additional light source.

[0125] Figure 6 A slicer system 600 in one embodiment is illustrated. For example, the slicer system 600 may substantially correspond to... Figure 1a The slicer system 100; the same parts and components are indicated by the same reference numerals. Note that, for ease of understanding, only some parts and components are shown, and reference numerals are used for reference.

[0126] However, unlike the slicer system 100, the illumination source 530 or its blade holder 620 of the slicer system 500 includes, for example, a reflector 670. The rough cutting edge 616.1 is indirectly illuminated via the reflector 570, that is, light from the illumination source 630 reaching the reflector 670 (see beam 634) is reflected by the reflector 670 onto the rough cutting edge 616.1. In this way, light reflection at the blade holder 620 is improved. Therefore, the illumination of the cutting edge can be improved, and thus the illumination intensity of the light reflected from the cutting edge can be improved.

[0127] It should be noted that, instead of such a mirror, another element with a reflective, diffuse, or partially diffuse reflective surface can be used. Furthermore, the tool holder 620 can have a reflective, diffuse, or partially diffuse reflective surface to achieve the same or similar effect.

[0128] Figure 7 A method according to another embodiment of the invention is illustrated by a flowchart. This method can, for example, use... Figure 1a , Figure 1b , Figure 3a , Figure 3b , Figure 5 and Figure 6 The slicer system 100, 300, 500 or 600 shown and described above shall be used to perform the operation.

[0129] In step 700, the blade may be positioned at or within the blade holder 110, and the sample block may be positioned at or within the sample holder. In step 702, the gap between the front surface of the sample block and the blade edge is illuminated, such that the fine cutting edge and at least a portion of the rough cutting edge are illuminated, and the light reflected from them is reflected by the front surface of the sample block to the detector. This creates a perceptible illuminated area, wherein at least a portion of the blade edge and at least a portion of an image of the blade edge mirrored by the front surface of the sample block form the boundary of the illuminated area, such as... Figure 2a , Figure 2b As shown. The light reflected by the fine cutting edge and the light reflected by at least that portion of the rough cutting edge have at least the same, on average, illumination intensity.

[0130] In step 704, the illumination area is imaged by the detector, and in step 706, the geometric features of the illumination area are determined based on the imaged illumination area. In step 708, the blade edge of the knife is aligned with the front surface of the sample block based on the geometric features. This can include automatic alignment and / or manual alignment. Furthermore, this can include different geometric features and corresponding alignments to be performed, for example, as per [reference to...]. Figures 4a to 4d As described.

[0131] It should be noted that, for example, steps 702 to 708 can be executed by means of a controller, or by processing the data therein, or by controlling the corresponding components through the controller to execute the corresponding steps.

[0132] As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items and may be abbreviated as “ / ”.

[0133] Although some aspects are described in the context of the device, it is clear that these aspects also represent a description of the corresponding method, where a block or device corresponds to a method step or a feature of a method step. Similarly, aspects described in the context of a method step also represent a description of a corresponding block or item or feature of the corresponding device.

[0134] Some implementation schemes involve a method including, as shown in Figures 1 to 12. Figure 6 The slicer system is a controller described in one or more figures in Figures 1 to 12. Alternatively, the slicer may be a slicer combined with the controller described in Figures 1 to 12. Figure 6 One or more figures in the diagram are part of or connected to the system described herein. Figure 3 shows a schematic diagram of a slicer system 300 configured to perform the methods described herein. The slicer system 300 includes a detector 340 and a computer system or controller 362. The detector 340 is configured to capture images and is connected to the computer system 362. The computer system 362 is configured to perform at least a portion of the methods described herein. The computer system 362 may be configured to execute machine learning algorithms. The computer system 350 and the detector 340 may be separate entities, but may also be integrated together in a common housing. The computer system 362 may be part of the central processing system of the detector 340 and / or the computer system 362 may be part of a sub-component of the detector 340, such as a sensor, actuator, camera, or illumination unit of the detector 340, etc.

[0135] Computer system 362 may be a local computer device (e.g., a personal computer, laptop computer, tablet computer, or mobile phone) having one or more processors and one or more storage devices, or it may be a distributed computer system (e.g., a cloud computing system having one or more processors and one or more storage devices distributed across various locations (e.g., distributed across local clients and / or one or more remote server farms and / or data centers)). Computer system 362 may include any circuitry or combination of circuitry. In one embodiment, computer system 362 may include one or more processors of any type. As used herein, a processor may mean any type of computing circuitry, such as, but not limited to, a microscope or microscope component (e.g., a camera), such as, but not limited to, a microprocessor, microcontroller, complex instruction set computing (CISC) microprocessor, reduced instruction set computing (RISC) microprocessor, very long instruction word (VLIW) microprocessor, graphics processor, digital signal processor (DSP), multi-core processor, field-programmable gate array (FPGA), or any other type of processor or processing circuitry. Other types of circuitry that may be included in computer system 362 may be custom circuitry, application-specific integrated circuits (ASICs), etc., such as one or more circuits (e.g., communication circuits) used in wireless devices such as mobile phones, tablet computers, laptop computers, two-way radio components, and similar electronic systems. Computer system 362 may include one or more storage devices, which may include one or more memory elements suitable for a particular application, such as main memory in the form of random access memory (RAM), one or more hard disk drives, and / or one or more drives for disposing of removable media (such as optical discs (CDs), flash memory cards, digital video discs (DVDs), etc.). Computer system 25 may also include a display device, one or more speakers, and a keyboard and / or controller, which may include a mouse, trackball, touchscreen, voice recognition device, or any other device that allows a system user to input information into and receive information from computer system 362.

[0136] Some or all of the method steps may be performed by (or using) hardware devices (such as processors, microprocessors, programmable computers, or electronic circuits). In some embodiments, one or more of the most important method steps may be performed by such devices.

[0137] Depending on certain specific implementation requirements, embodiments of the present invention can be implemented in hardware or software. This implementation can be executed using a non-transitory storage medium (such as a digital storage medium, e.g., floppy disk, DVD, Blu-ray, CD, ROM, PROM, EPROM, EEPROM, or FLASH memory) that stores electronically readable control signals thereon, which cooperate with (or are capable of cooperating with) a programmable computer system to cause the corresponding method to be executed. Therefore, the digital storage medium can be computer-readable.

[0138] Some embodiments of the invention include a data carrier having electronically readable control signals that are capable of cooperating with a programmable computer system to enable the execution of one of the methods described herein.

[0139] Generally, embodiments of the present invention can be implemented as a computer program product having program code that, when run on a computer, is operable to perform one of the methods. The program code may, for example, be stored on a machine-readable medium.

[0140] Other implementations include a computer program stored on a machine-readable medium for performing one of the methods described herein.

[0141] Therefore, in other words, an embodiment of the present invention is a computer program having program code for performing one of the methods described herein when the computer program is run on a computer.

[0142] Therefore, a further embodiment of the invention is a storage medium (or data carrier, or computer-readable medium) including a computer program stored thereon for performing one of the methods described herein when executed by a processor. Data carriers, digital storage media, or recording media are generally tangible and / or non-transitory. A further embodiment of the invention is an apparatus as described herein, including a processor and a storage medium.

[0143] Therefore, a further embodiment of the invention is a data stream or signal sequence representing a computer program for performing one of the methods described herein. The data stream or signal sequence may, for example, be configured to be transmitted via a data communication connection (e.g., via the Internet).

[0144] Further embodiments include a processing element (e.g., a computer or programmable logic device) configured or adapted to perform one of the methods described herein.

[0145] A further embodiment includes a computer on which a computer program is installed for performing one of the methods described herein.

[0146] A further embodiment of the invention includes an apparatus or system configured to transmit, for example, electronically or optically to a receiver, a computer program for performing one of the methods described herein. The receiver may be, for example, a computer, a mobile device, a memory device, etc. The apparatus or system may include, for example, a file server for transmitting the computer program to the receiver.

[0147] In some embodiments, a programmable logic device (e.g., a field-programmable gate array) may be used to perform some or all of the functions of the methods described herein. In some embodiments, the field-programmable gate array may cooperate with a microprocessor to perform one of the methods described herein. Generally, these methods are preferably performed by any hardware device.

[0148] List of reference numerals

[0149] 100, 300, 500, 600 slicer systems

[0150] 110, 310, 510, 610 knives

[0151] 112, 212, 312, 412, 512, 612 cutting edges

[0152] 114.1, 514.1, 614.1 fine cutting edge

[0153] 114.2 Other fine cutting surfaces

[0154] Rough cutting edges of 116.1, 516.1, and 616.1

[0155] 116.2 Other rough cutting surfaces

[0156] 118 degrees

[0157] 120, 320, 520, 620 tool holders

[0158] 122 base components

[0159] 124 Installation Device

[0160] Sample blocks 126 and 326

[0161] 128, 228, 328, 428, 528, 628 front surfaces

[0162] 130, 330, 530, 630 light sources

[0163] 132, 134, 532, 534, 634, 634 beams

[0164] Gap between 136 and 236

[0165] 140, 340, 540, 640 detectors

[0166] Lighting zones 238, 238a, 238b, and 438

[0167] 238.1 The first part of the lighting area

[0168] 238.2 The second part of the lighting area

[0169] 302 housing

[0170] 350 sample racks

[0171] 352 microscope

[0172] 354 monitor

[0173] 356 instruction

[0174] 358 Collection Box

[0175] 360.1, 360.2, 360.3 Actuators

[0176] 362 controller

[0177] 364 handwheel

[0178] 438.1 First Boundary

[0179] 438.2 Second Boundary

[0180] 530.1 First Light Source

[0181] 530.2 Second Light Source

[0182] 670 reflector

[0183] Method steps from 700 to 708

[0184] x, y, z, z' axis

[0185] b Feeding direction

[0186] c Cutting direction

[0187] d gap width

[0188] Width of W lighting area

[0189] Length of the L-shaped lighting area

Claims

1. A microtome system (100, 300, 500, 600) for cutting slices from a sample block, wherein the microtome system (100) comprises: - Sample rack (350), which is configured to hold sample blocks (126). - A blade (110) having cutting edges (112, 212, 412) configured to cut slices from the sample block (126, 426), wherein the blade (110) includes a fine cutting edge (114.1) and a rough cutting edge (116.1), wherein the cutting edges (112, 212, 412) are at least partially formed by the fine cutting edge (114.1). - Tool holder (120), which is configured to hold the tool (110). -Lighting sources (130, 330), and - Detectors (140, 240, 340) The illumination sources (130, 330) are configured to illuminate the gap (136, 236) between the front surface (128, 228) of the sample block (126) and the cutting edge (112, 212) when the sample block (126) is held in the sample holder, such that the fine cutting edge (114.1) and at least a portion of the rough cutting edge (116.1) are illuminated, and the light reflected from them is directed to the front surface (128, 228) of the sample block (126). 8) Reflected onto the detectors (140, 240, 340), such that a perceptible illumination area (238a, 238b, 438) is generated, wherein at least a portion of the blade edge (112, 212, 412) and at least a portion of an image of the blade edge mirrored by the front surface (128, 428) of the sample block (126) form the boundary (438.1, 438.2) of the illumination area (238a, 238b, 438), and The light reflected by the fine cutting edge (114.1) and the light reflected by at least the portion of the rough cutting edge (116.1) have at least the same, substantially equal, illumination intensity. The slicer system (100, 300, 500, 600) is configured to image the illumination area (238a, 238b, 438) by means of the detector (140, 240, 340) and determine the geometric features of the illumination area based on the imaged illumination area (238a, 238b, 438).

2. The slicing system (100, 300, 500, 600) as claimed in claim 1, wherein the illumination intensity of the light reflected by the fine cutting edge (114.1) and the illumination intensity of the light reflected by at least the portion of the rough cutting edge (116.1) differ from each other by less than 50%, less than 20%, or less than 10%.

3. The slicer system (100, 300, 500, 600) as claimed in claim 1 or 2, wherein the fine cutting edge (114.1) and the rough cutting edge (116.1) are formed at an angle (118) of less than 1° relative to each other.

4. The slicer system (500) of any of the preceding claims, wherein the illumination source (130) is configured to illuminate the gap (136, 236) between the front surface (128, 228) of the sample block and the cutting edge (112, 212) when the sample block is held in the sample holder, such that at least said portion of the rough cutting edge (116.1) is directly illuminated, and wherein light originating from the direct illumination and reflected by at least said portion of the rough cutting edge is reflected by the front surface (128) of the sample block (126) to the detector (140).

5. The slicer system (100, 300, 500, 600) as claimed in any of the preceding claims, wherein when viewed from the blade (112, 212) to the front side (128, 228) of the sample block, the illuminated area (238a, 238b) has a width (W) greater than 10 μm or greater than 20 μm.

6. The slicer system (100, 300, 600) as claimed in any of the preceding claims, wherein the illumination source (130) is configured to illuminate the gap (136, 236) between the front surface (128, 228) of the sample block and the cutting edge (112, 212) when the sample block is held in the sample holder, such that at least said portion of the rough cutting edge (116.1) is indirectly illuminated via the blade holder (120), and wherein light originating from the indirect illumination and reflected by at least said portion of the rough cutting edge is reflected by the front surface (128) of the sample block (126) to the detector (140).

7. The slicer system (100, 300, 600) of claim 6, wherein the blade holder (120) has a reflective, diffuse, or partially diffuse surface, and wherein at least said portion of said rough cutting edge (116.1) is indirectly illuminated via said surface of said blade holder (120).

8. The slicer system (100, 300, 600) of claim 6 or 7, wherein the blade holder (120) includes a mirror (670) or a separate element having a reflective, diffuse, or partially diffuse reflective surface, and wherein at least said portion of said rough blade surface (116.1) is indirectly illuminated via said mirror or said surface of said separate element.

9. The slicer system (500) as claimed in any of the preceding claims, wherein the illumination source (130) comprises a first light source (530.1) and a second light source (530.2). The first light source is configured to illuminate the fine cutting surfaces (114.1, 514.1), and The second light source is configured to illuminate at least a portion of the roughened blade surfaces (116.1, 516.2).

10. The slicer system (100, 300, 500, 600) as claimed in any of the preceding claims, wherein the slicer system further comprises an action (360.1, 360.2, 360.3). The tool holder (120) and the sample holder are configured to move relative to each other. The actuating element is configured to cause movement of the tool holder (120) or the sample holder about the axis, and The slicer system (100) is configured as follows: a) Based on the geometric features of the illumination areas (238a, 238b), the blade edges (112, 212) are automatically aligned with the front surfaces (128, 228) of the sample block by controlling the actuator, and / or b) Based on the detected geometric features of the illuminated areas (238a, 238b), provide the user with instructions on how to manually control the actuator to align the blades (112, 212) with the front surfaces (128, 228) of the sample block.

11. The slicer system (100, 300, 500, 600) of claim 10, wherein the slicer system is configured to control the actuator to arrange the blade (112, 212) parallel to the front surface (128, 228) of the sample block, such that the geometry of the detected illumination region includes a constant width along the length of the illumination region.

12. The slicer system (100, 300, 500, 600) as claimed in any of the preceding claims, wherein the blade holder (120) and the sample holder are configured to be movable relative to each other in the cutting direction (c), and The slicer system (100, 300, 500, 600) is configured to image the illumination area (238a, 238b) at at least two different positions relative to each other in the cutting direction by means of the detector (140) of the blade holder (120) and the sample holder.

13. A method for aligning the cutting edges (112, 212) of a blade (110) with the front surfaces (128, 228) of a sample block (126) to cut slices from said sample block, The sample block (126) is held by a sample holder. The blade (110) is held by a blade holder (120), the blade (110) includes a fine cutting edge (114.1) and a rough cutting edge (116.1), and the cutting edge (112, 212) is at least partially formed by the fine cutting edge (114.1). The method includes: The gap (136, 236) between the front surface (128, 228) and the cutting edge (112, 212) of the sample block (126) is illuminated such that the fine cutting edge (114.1) and at least a portion of the rough cutting edge (116.2) are illuminated, and the light reflected from them is reflected by the front surface (128) of the sample block (126) to the detector (140), thereby creating a perceptible illumination area (238a, 238b), wherein at least a portion of the cutting edge (112, 212) and at least a portion of the image of the cutting edge mirrored by the front surface (128) of the sample block (126) form the boundary of the illumination area, and wherein the light reflected by the fine cutting edge (114.1) and the light reflected by at least the portion of the rough cutting edge (116.1) have at least, on average, substantially the same illumination intensity; The illuminated areas (238a, 238b) are imaged using a detector. The geometric features of the illumination region are determined based on the imaged illumination region (238a, 238b), and Align the cutting edge (112, 212) of the knife with the front surface (128, 228) of the sample block based on the geometric features.

14. The method of claim 13, using a slicer system (100, 300, 500, 600) as described in any one of claims 1 to 12.

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